JP6829950B2 - 分析方法、分析装置および分析システム - Google Patents
分析方法、分析装置および分析システム Download PDFInfo
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- JP6829950B2 JP6829950B2 JP2016109628A JP2016109628A JP6829950B2 JP 6829950 B2 JP6829950 B2 JP 6829950B2 JP 2016109628 A JP2016109628 A JP 2016109628A JP 2016109628 A JP2016109628 A JP 2016109628A JP 6829950 B2 JP6829950 B2 JP 6829950B2
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Description
図1を参照して、本実施形態による分析装置の概要について説明する。
図2は、分析装置100の一構成例を示す外観図である。分析装置100は、複合体20に含まれる標識の発光に基づいて、検体中の被検物質の存在の有無や、検体中の被検物質の濃度を決定できる。分析装置100は、小型であり、たとえば医師が患者を診察する診察室のデスク上に設置可能なサイズである。図2では、分析装置100のサイズは、たとえば、設置面積で150cm2〜300cm2程度である。分析装置100は、たとえば、検体カートリッジ200が挿入されるスロットを有し、スロットに挿入された検体カートリッジ200が装置内の保持部30にセットされる。分析装置100は、保持部30にセットされた検体カートリッジ200に対して分析処理を行う。
図3は、本実施形態の検体カートリッジ200の具体的な構成例を示す。検体カートリッジ200は、使い捨て可能なカートリッジであってよい。その場合、検体カートリッジ200はパッケージに収納された状態で保管され、パッケージから取り出されて使用される。検体カートリッジ200は、平板状に形成されていてる。
図4〜図6は、検体カートリッジ200を用いる分析装置100の具体的な構成例を示す。
図4〜図6の構成例における撮像部50および磁石部80の移動機構について説明する。図4〜図6の構成例では、分析装置100は、撮像部50および磁石部80の両方を水平方向(XY方向)に移動させる第1移動機構部83をさらに備える。また、分析装置100は、磁石部80を鉛直方向(Z方向)に移動させる第2移動機構部84をさらに備える。図5に示すように、撮像部50は、支持部120に固定されている。具体的には、撮像部50は、支持部120の上部からX方向に延びるアーム121(図4参照)の先端部に取り付けられている。磁石部80は、支持部120に対して上下移動可能に取り付けられている。つまり、支持部120は、磁石部80および撮像部50の両方を平板状の検体カートリッジ200と平行な方向(XY方向)に相対移動可能に支持する。これにより、磁石部80および撮像部50の両方を、水平方向に容易に移動させることができる。支持部120には、第2移動機構部84として、Z軸モータ122と、伝達機構とが設けられている。伝達機構は、図5の構成例では、磁石部80を移動させるZ方向のネジ送り機構123と、ネジ送り機構123にZ軸モータ122の駆動力を伝達するベルト・プーリ機構124との組み合わせにより構成されている。Z軸モータ122の回転により、磁石部80が支持部120に対してZ方向に移動する。
図7は、本実施形態の分析装置100および検体カートリッジ200を用いて、所定のアッセイ法を実施する場合の動作例を示す。動作説明において、検体カートリッジ200の構成については図3を参照するものとする。分析装置100の構成については図4〜図6を参照するものとする。分析装置100の各部の制御は、制御部115が行う。
撮像部50により撮像された画像データに基づいて、磁性粒子を検出する方法について説明する。
図12を参照して、流路中の気泡の検出処理について説明する。
図13を参照して、流路中の磁性粒子の残留検出処理について説明する。
撮像部50により撮像された画像データに基づいて、残留磁性粒子を定量化する方法について説明する。図14を参照して、残留磁性粒子の定量化について説明する。
撮像部50により撮像された画像データに基づいて、磁性粒子の撹拌効率を定量化する方法について説明する。
Claims (16)
- 磁性粒子上に形成された被検物質と前記被検物質に結合する標識物質とを含む複合体を、流路と検出槽とを含む検体カートリッジの前記流路中において磁石部により移動させ、
前記磁性粒子の移動の残留状態または前記磁性粒子を撹拌した場合の撹拌状態を取得するために、前記流路中の前記磁性粒子を撮像し、
前記検出槽中の前記複合体に含まれる前記標識物質の標識を測定する、分析方法。 - 撮像された画像データに基づいて、前記磁性粒子の残留状態または撹拌状態を取得する、請求項1に記載の分析方法。
- 撮像された画像データに基づいて、前記磁性粒子の残留状態として、前記磁性粒子が前記磁石部から所定の距離以上離れた場所に所定量以上残留しているか否か、または、前記磁性粒子の撹拌状態として、前記磁性粒子が正常に撹拌されているか否かを取得する、請求項2に記載の分析方法。
- 撮像された画像データの前記磁性粒子の量の変化に基づいて、前記磁石部により前記磁性粒子が正常に撹拌されているか否かを取得する、請求項2または3に記載の分析方法。
- 撮像された画像データに基づいて、前記検体カートリッジの前記流路への気泡の混入を検出する、請求項2〜4のいずれか1項に記載の分析方法。
- 撮像された画像データの色情報またはコントラスト情報に基づいて、前記磁性粒子を検出する、請求項2〜5のいずれか1項に記載の分析方法。
- 撮像された画像データに基づいて、前記流路を検出し、検出した前記流路内から前記磁性粒子を検出する、請求項2〜6のいずれか1項に記載の分析方法。
- 取得した前記磁性粒子の残留状態または撹拌状態に基づいて、エラーを通知する、請求項2〜7のいずれか1項に記載の分析方法。
- 流路と検出槽とを備える検体カートリッジを用いて検体に含まれる被検物質を分析する分析装置であって、
前記流路中の磁性粒子を移動させる磁石部と、
前記磁性粒子の移動の残留状態または前記磁性粒子を撹拌した場合の撹拌状態を前記分析装置の制御部により取得するために、前記流路中の前記磁性粒子を撮像する撮像部と、
前記検出槽中の前記磁性粒子上に形成された前記被検物質と前記被検物質に結合する標識物質とを含む複合体に含まれる前記標識物質の標識を測定する測定部と、を備える、分析装置。 - 前記検体カートリッジは平板状に形成されており、
前記撮像部は、前記検体カートリッジの平板状の延びる方向と平行な方向において、前記磁石部とともに、前記検体カートリッジに対して相対移動する、請求項9に記載の分析装置。 - 前記磁石部および前記撮像部の両方を前記検体カートリッジに対して移動させる第1移動機構部をさらに備える、請求項10に記載の分析装置。
- 前記第1移動機構部は、前記磁石部および前記撮像部の両方を前記検体カートリッジの平板状の延びる方向と平行な方向に移動可能に支持する支持部を含む、請求項11に記載の分析装置。
- 前記磁石部を前記検体カートリッジの平板状の延びる方向と交差する方向に相対移動させる第2移動機構部をさらに備える、請求項9〜12のいずれか1項に記載の分析装置。
- 前記磁石部は、前記検体カートリッジを挟むように一対設けられており、
前記撮像部は、前記検体カートリッジに対して一方側に配置されており、一対の前記磁石部のうち前記検体カートリッジに対して一方側に配置された前記磁石部とともに、前記検体カートリッジに対して相対移動する、請求項9〜13のいずれか1項に記載の分析装置。 - 前記検体カートリッジは、透明または半透明の材料により形成されており、
前記検体カートリッジに対して前記撮像部と反対側には、前記磁性粒子と識別可能な色の背景部が配置されている、請求項9〜14のいずれか1項に記載の分析装置。 - 流路と検出槽とを含む検体カートリッジと、
前記流路中の磁性粒子を移動させる磁石部と、
前記磁性粒子の移動の残留状態または前記磁性粒子を撹拌した場合の撹拌状態を制御部により取得するために、前記流路中の前記磁性粒子を撮像する撮像部と、
前記検出槽中の前記磁性粒子上に形成された被検物質と前記被検物質に結合する標識物質とを含む複合体に含まれる前記標識物質の標識を測定する測定部と、を備え、
検体に含まれる前記被検物質を分析する、分析システム。
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