JP6847208B2 - Camera module inspection device - Google Patents

Description

The present invention relates to an inspection device for inspecting the electrical characteristics of an object to be inspected, for example, a camera module.

In recent years, mobile devices such as smartphones, PDAs, and tablet PCs have become widespread. The small camera modules used in these mobile devices include a three-phase (MIPI C-PHY) interface 10. FIG. 1 is a diagram showing a three-phase interface 10, and has a connector shape in which a plurality of terminals 12 to be inspected are arranged side by side in two rows and projected.

The inspection device for inspecting the camera module is such that a large number of signal probes and grounding probes arranged side by side in two rows come into contact with the signal terminal 12 and the grounding terminal 14 of the three-phase interface 10, respectively. Do a test. However, there is a problem that a lot of noise is generated between the signal probes in each row during the high frequency test operation, and the test cannot be performed.

An object of the present invention is to solve the above-mentioned problems, and to provide a camera module inspection device capable of blocking noise between signal probes during high-frequency test operation and improving inspection reliability. It is in.

An inspection device for electrically connecting a terminal to be inspected of an object to be inspected and an inspection terminal of an inspection circuit for solving the above-mentioned problem of the present invention is disclosed. The inspection device includes a signal probe, a grounding probe, a signal probe hole formed so that the signal probe passes in an electrically non-contact state, and the grounding probe in an electrically contact state. It is characterized by including a conductive block having a grounding probe hole formed so as to pass through, and an insulating housing containing the conductive block and supporting both ends of the signal probe. According to this, the noise between the probe trains for signals can be blocked by the conductive block in the grounded state, and a reliable high frequency test can be performed.

The conductive block has a noise shielding portion that projects and extends between the terminals to be inspected through the insulating housing, and more reliable noise shielding is possible.

The inspection device has an inspected body accommodating portion for accommodating the camera module, and a bottom portion provided with a large number of probe passage holes through which one end of the signal probe and one end of the grounding probe pass. An elastically floating insert can be further provided on top of the insulating housing.

The bottom portion may have an opening through which the noise shielding portion passes.

The inspection device may further include a lower cover provided with a large number of second probe passage holes through which the other end of the signal probe and the other end of the grounding probe pass.

The conductive block has a second noise shielding portion that passes through the lower cover and projects and extends toward the inspection terminal, so that a more reliable ground contact state can be maintained.

The second noise shielding portion has a grounding projection that contacts the grounding terminal (pad) of the inspection circuit.

The camera module inspection device of the present invention can effectively shield noise between signal probes in a high frequency test, and can improve the reliability of inspection.

It is a perspective view which shows the three-phase interface of a camera module. It is a perspective view which shows the inspection apparatus which concerns on embodiment of this invention. It is an exploded perspective view which shows the camera module inspection apparatus of FIG. It is a top view which shows the camera module inspection apparatus of FIG. FIG. 5 is a cross-sectional view taken along the line II of the camera module inspection device of FIG. It is sectional drawing which follows the line II-II of the camera module inspection apparatus of FIG.

Hereinafter, an embodiment of the present invention will be described with reference to the accompanying drawings.

The camera module inspection device 100 inspects the electrical characteristics of the object to be inspected, for example, a small camera module for a smartphone. The camera module inspection device 100 inspects the signal probe 110 and the grounding probe 120 by bringing the signal probe 110 and the grounding probe 120 into contact with a large number of terminals of the three-phase interface 10 of the camera module as shown in FIG. The inspection is performed by bringing the 110 into contact and then bringing the grounding probe 120 into contact with the grounding terminal 14.

2 to 5 are a perspective view, an exploded perspective view, a plan view, and a cross-sectional view of the camera module inspection device 100 according to the embodiment of the present invention. As shown in the figure, the camera module inspection device 100 includes a signal probe 110, a grounding probe 120, a conductive block 130 through which the signal probe 110 and the grounding probe 120 pass, and an insulating housing 140 accommodating the conductive block. It includes an insert 150 arranged in a floating state on the insulating housing 140, and a lower cover 160 arranged below the insulating housing 140.

The signal probe 110 and the grounding probe 120 can be embodied by a pogo type pin, a cantilever type pin, a vertical type pin, a MEMS (microelectromechanical systems) pin, or the like. Hereinafter, the signal probe 110 and the grounding probe 120 will be described by taking up the pogo type pin.

The signal probe 110 includes a cylindrical barrel, an upper plunger that is partially inserted and slid on one side of the barrel, a lower plunger that is partially inserted and slid on the other side of the barrel, and the upper and lower plungers. It comprises a spring inserted into the barrel to urge at least one of the plungers. One of the upper plunger and the lower plunger contacts the signal terminal 12, and the other contacts the signal terminal (pad) (not shown) of the inspection circuit. The signal probe 110 is wrapped or insulated with a tube made of an insulating material, such as Teflon®, which is an overall insulating material so that it can pass through the conductive block 130 without electrical contact. The spacer can be attached to the barrel. Further, either one of the upper plunger and the lower plunger may be fixed to the barrel without sliding movement. Further, the signal probe 110 may be provided with an external spring type pogo pin that does not have a barrel and in which the upper plunger and the lower plunger cross-slide in the spring.

The grounding probe 120 has the same basic structure as the signal probe 110, and the description thereof will be omitted. Of course, the grounding probe 120 may have a size different from that of the signal probe 110, and may come into contact with the conductive block 130, so that no insulating tube or insulating spacer is required.

The conductive block 130 can be made of a conductive material such as brass, or can be made by coating or plating a non-conductive block with a conductive substance. The conductive block 130 has a large number of signal probe holes 132 through which a large number of signal probes 110 pass in an electrically non-contact state, and a large number of ground probe holes through which a large number of grounding probes 120 pass in an electrically contact state. 134 are provided in parallel. When the signal probe 110 and the grounding probe 120 are inserted into the conductive block 130, at least a part of both ends of the upper plunger and the lower plunger is exposed. In the embodiment, 15 signal probe holes 132 and 2 ground probe holes 134 are arranged side by side in two rows, respectively. That is, in the first row, the 1st to 5th signal probe holes 132, the 6th ground probe hole 134, the 7th to 11th signal probe holes 132, the 12th ground probe hole 134, and the 13th to 17th signals. The probe holes 132 are arranged, and in the second row, as in the first row, the 1st to 5th signal probe holes 132, the 6th ground probe hole 134, the 7th to 11th signal probe holes 132, and the 12th row. The ground probe hole 134 and the 13th to 17th signal probe holes 132 are arranged. If the signal probe 110 is surrounded by an insulating tube or an insulating spacer, the insulating tube or the insulating spacer comes into contact with the inner wall of the signal probe hole 132. The structures of the signal probe 110 and the grounding probe 120 are merely examples for explanation, and various structures can be applied.

The conductive block 130 includes an upper noise shielding portion 136 protruding upward from between the two rows of probe holes 132 and 134 on the upper surface. The noise shielding unit 136 can more reliably shield noise by shielding between the two rows of terminals 12 and 14 to be inspected at the time of inspection.

The conductive block 130 extends downward from between the signals in the first row and the grounding probe holes 132, 134 and the signals in the second row and the grounding probe holes 132, 134 on the lower surface, and protrudes from the lower noise shielding portion 137. To be equipped. The lower noise shielding portion 137 has an unrestricted form of a grounding projection 138 extending laterally from the two grounding probe holes 134 in the first row toward the two grounding probe holes 134 in the second row, respectively. The pair of grounding protrusions 138 is for contacting the grounding terminal (pad) (not shown) of the inspection circuit with which the grounding probe 120 comes into contact. The number of grounding protrusions 138 may be one or three or more depending on the shape and design of the grounding pad of the inspection circuit, and the shapes may be different from each other.

The insulating housing 140 includes a conductive block accommodating portion 141 accommodating the conductive block 130 and an insert accommodating portion 142 accommodating the insert 150. The conductive block 130 is housed in the insulating housing 140 with the signal probe 110 and the grounding probe 120 inserted. The conductive block accommodating portion 141 is formed on the upper side with an upper plunger passage hole 143 through which the upper plunger of the signal probe 110 and the grounding probe 120 passes, and a shielding portion passing portion through which the noise shielding portion 136 passes. A barrier 145 is provided. The upper plunger passage hole 143 is composed of a large-diameter portion 146 in which the barrel is housed and a small-diameter portion 147 through which the plunger passes. Therefore, the barrel does not pass through the barrier 145 and is supported by the barrier 145. Here, the barrier wall 145 can be coupled to the insulating housing 140 in a state of being separated from the insulating housing 140. The conductive block accommodating portion 141 is opened so that the conductive block 130 itself can be inserted from below. The insert accommodating portion 142 is formed on the upper side at a position corresponding to the blocking wall 145 in which the upper plunger passing hole 143 and the first shielding portion passing portion 144 are formed.

The insert 150 has a bottom portion 155 in which a second upper plunger passage hole 153 and a second shielding portion passage portion 154 are formed at a position corresponding to the barrier wall 145. The insert 150 maintains a floating state with four springs 170 interposed between the bottom 155 of the insert 150 and the barrier 145 of the insulating housing 140. The insert 150 extends vertically on both side surfaces, and a groove portion 159 having a locking step 158 is formed. The insert 150 is restrained by the detachment prevention pin 180 so as not to be detached by the elastic force of the spring 170. That is, the insert 150 elastically moves up and down in the groove portion 159 by the spring 170 in a state where the head of the detachment prevention pin 180 is fitted in the groove portion 159.

The lower cover 160 covers the open lower part of the conductive block accommodating portion 141 of the insulating housing 140. The lower cover 160 is formed with a lower plunger passing hole 163 through which the lower plunger of the signal probe 110 and the grounding probe 120 passes, and a third shielding portion passing portion 164 through which the lower noise shielding portion 137 passes. The lower plunger passage hole 163 is composed of a second large-diameter portion 166 in which the barrel is housed and a second small-diameter portion 167 through which the lower plunger passes. Therefore, the barrel does not pass through the lower cover 160 and is supported by the lower cover 160.

FIG. 6 is a cross-sectional view showing a state of the inspection device 100 at the time of inspection. At the time of inspection, if the object to be inspected inserted into the insert 150, for example, the three-phase interface 10 is pressed, the insert 150 moves downward while compressing the spring 170. Therefore, the noise shielding portion 136 is accommodated in the space between the two rows of terminals of the three-phase interface 10, and it is possible to shield between the rows of the signal terminals 12 among the two rows of terminals. FIG. 6 shows a state in which the signal probe 110 is wrapped in an insulating tube such as Teflon and is in contact with the conductive block 130.

Since the grounding probe 120 makes electrical contact with the conductive block 140, the conductive block 140 maintains an overall grounded state. As a result, an environment for noise shielding can be created between the signal probes 110 that electrically pass through the conductive block 140 in a non-contact state.

According to the above, the inspection device of the present invention can effectively shield noise during high-frequency test operation to the terminals of the object to be inspected, for example, to the three-phase interface 10 of a small camera module used in a mobile device. it can.

Although the present invention has been described above with reference to limited exemplary examples and drawings, the present invention is not limited to the above exemplary examples, and a person having ordinary knowledge in the field to which the present invention belongs. For, various modifications and modifications are possible from the above description.

Therefore, the scope of the present invention should not be limited to the exemplary examples described, but should be defined by the claims and their equivalents described below.

100 Inspection device 110 Signal probe 120 Grounding probe 130 Conductive block 136 Upper noise shield 137 Lower noise shield 138 Grounding protrusion 140 Insulated housing 150 Insert 160 Lower cover

Claims (6)

It is a camera module inspection device
Signal probe and
Grounding probe and
Conductive with a signal probe hole formed so that the signal probe passes in an electrically non-contact state, and a grounding probe hole formed so that the grounding probe passes in an electrically contact state. Sex block and
An insulating housing that houses the conductive block and supports both ends of the signal probe.
Equipped with a,
The conductive block projects upward from the conductive block and projects through the upper plate of the insulating housing so that it is located between the rows of terminals of the camera module when inspecting the camera module . an upper noise shielding portion, a camera module inspection apparatus. It has an object accommodating portion for accommodating the camera module, and a bottom portion provided with a large number of probe passage holes through which the first end portion of the signal probe and the first end portion of the grounding probe pass. the further Ru comprising an elastically floated insert on an insulating housing, a camera module inspection apparatus according to claim 1. Wherein each top plate and a bottom of the insert of the insulating housing, that having a first shielding portion passing portion and the second shielding portion passing portion in which the upper noise shielding portion passes, a camera module inspection apparatus according to claim 2 .. Further Ru comprising a lower cover having a plurality of second probe passage hole which the second end of the second end and the ground probe of the probing signal passes, according to any one of claims 1 to 3 Camera module inspection device. The conductive block has a lower noise shield that projects downward from the conductive block and extends between the rows of multiple signal probes.
The lower cover is that having a third shielding portion passing portion in which the lower the noise shielding portion passes, a camera module inspection apparatus according to claim 4. The lower the noise shielding portion that have a least one grounding protrusion contacts the ground terminal of the test circuit the ground probe contacts, a camera module inspection apparatus according to claim 5.

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