JP6223785B2 - Polishing liquid composition for hard and brittle materials - Google Patents

Description

  The present invention relates to a polishing liquid composition for hard and brittle materials and a method for producing hard and brittle materials using the same.

  Hard and brittle materials such as sapphire, gallium nitride, silicon carbide, and lithium tantalate are indispensable as optical materials, electronic materials, and mechanical materials.

  For example, artificial sapphire plates are used as materials for various applications such as integrated circuit boards, infrared detection lenses, watches, and the like. In particular, with the rapid spread of LED lighting, the demand for a sapphire substrate used as the substrate material is rapidly increasing. An LED is manufactured by epitaxially growing a gallium nitride (GaN) layer on a sapphire substrate, and further laminating a light emitting layer, but the surface smoothness of the sapphire substrate greatly affects the performance of the LED.

  In order to satisfy the surface smoothness of hard and brittle materials such as a sapphire substrate, final polishing using a polishing liquid composition containing silica particles is performed. By using silica (Mohs hardness 7) particles having a lower hardness than that of a sapphire (α-alumina, Mohs hardness 9) substrate as abrasive grains, pits and scratches are prevented from occurring on the surface of the sapphire substrate. However, although sapphire is excellent in mechanical, chemical, and thermal stability, there is a problem that the polishing rate is low in finish polishing using silica particles.

  For this problem, for example, Patent Document 1 discloses that the polishing rate is improved by controlling the pH of the polishing composition so that the zeta potentials of the silica particles and the sapphire substrate have opposite signs. Yes. Patent Document 2 discloses that by dissolving a salt compound in a polishing liquid composition having a basic pH, electrostatic repulsion between silica particles and a sapphire substrate is reduced, and the polishing rate is improved. Yes. Patent Document 3 discloses a composition for precisely polishing a hard and brittle material made of a lithium tantalate single crystal material or a lithium niobate single crystal material, not a polishing liquid composition for a sapphire substrate. However, it is disclosed that the polishing rate is improved by combining a plurality of colloidal silicas having different average particle diameters.

JP 2011-2111178 A Special table 2008-531319 gazette JP2007-32159A

  However, in any conventional technique, the polishing rate of hard and brittle materials such as sapphire substrates is insufficient, and the productivity of hard and brittle materials is low.

  The present invention provides a polishing composition for hard and brittle materials, a method for producing hard and brittle materials using the same, and a polishing method for hard and brittle materials, which has a high polishing rate and can improve the productivity of hard and brittle materials. To do.

The polishing composition for hard and brittle materials of the present invention is
A large particle size silica particle (component A) having an average primary particle size of 80 to 500 nm, a small particle size silica particle (component B) having an average primary particle size of 5 to 70 nm, and an aqueous medium (component C). Mixed,
The ratio (D / P) of the pore size (P) between the dry particles of the large particle size silica particles (component A) and the average primary particle size (D) of the small particle size silica particles (component B) is 0.6. ~ 1.4,
The ratio of the mass of the large particle size silica particles to the total mass of the large particle size silica particles and the small particle size silica particles is 55 to 95% by mass.

Moreover, the polishing composition for hard and brittle materials of the present invention comprises:
Centrifugation under centrifugal conditions enabling precipitation of particles having a particle density of 2.2 g / cm ³ and a particle diameter of 80 nm or more dispersed in a dispersion medium having a fluid density of 1.0 g / cm ³ and a fluid viscosity of 1 cps Including precipitated silica particles that precipitate when performed, suspended silica particles that do not precipitate even when centrifuged under the centrifugal conditions, and an aqueous medium,
The ratio (d / p) between the inter-dry particle void diameter (p) of the precipitated silica particles and the dispersed particle diameter (d) of the floating silica particles is 0.50 to 1.05,
The ratio of the mass of the precipitated silica particles to the total mass of the precipitated silica particles and the floating silica particles is 55 to 95% by mass.

  The manufacturing method of the hard-brittle material of this invention includes the process of grind | polishing a to-be-polished hard-brittle material using the polishing liquid composition for hard-brittle materials of this invention.

  The method for polishing a hard and brittle material according to the present invention is a method for producing a hard and brittle material, including a step of polishing a hard and brittle material to be polished using the polishing composition for a hard and brittle material according to the present invention.

  According to the present invention, a polishing composition for a hard and brittle material that has a high polishing rate and can improve the productivity of a hard and brittle material, a method for producing a hard and brittle material using the same, and a polishing method for a hard and brittle material Can provide.

  In the present invention, the large particle size silica particles mean silica particles having an average primary particle size relatively larger than the small particle size silica particles, and the small particle size silica particles mean an average particle size larger than that of the large particle size silica particles. This means silica particles having a relatively small primary particle size.

In the present invention, “a particle having a particle density of 2.2 g / cm ³ and a particle diameter of 80 nm or more dispersed in a dispersion medium having a fluid density of 1.0 g / cm ³ and a fluid viscosity of 1 cps can be precipitated. “Precipitated silica particles that precipitate when centrifugation is performed under centrifugal conditions” means a dispersion medium having a fluid density of 1.0 g / cm ³ and a fluid viscosity of 1 cps, dispersed in the dispersion medium, and having a particle density of 2 In a hypothetical particle dispersion containing 2 g / cm ³ and particles having a particle diameter of 80 nm or more, an aqueous system is used under the same centrifugal conditions as those in which only particles having a particle diameter of 80 nm or more can be precipitated by centrifugation. It means silica particles that precipitate when the hard liquid material polishing slurry composition containing the medium and the silica particles dispersed in the aqueous medium is centrifuged. On the other hand, the floating silica particles mean silica particles that do not precipitate even when the centrifugal separation is performed under the centrifugal conditions.

  A dry aggregate obtained by drying silica particles dispersed in water has a plurality of pores between primary particles constituting the dry aggregate. The “diameter” is the size of the interparticle void in the dry aggregate and means the pore diameter. The value can be obtained by the method described in Examples described later. The polishing liquid composition for hard and brittle material is supplied between the hard brittle material to be polished and the polishing pad, and the polishing pad and / or the hard brittle material to be polished is moved while contacting the hard brittle material to be polished and the polishing pad. Thus, during polishing of the hard brittle material to be polished, a load is applied to the polishing composition for the hard brittle material between the hard brittle material to be polished and the polishing pad, and the silica particle concentration is high. The silica particles in such a state are in a state where adjacent silica particles are in contact with each other like the dry aggregate, and it is assumed that the interparticle void diameter is close to the dry interparticle void diameter. Is done.

The present invention comprises a large particle size silica particle (component A) having an average primary particle size of 80 to 500 nm, a small particle size silica particle (component B) having an average primary particle size of 5 to 70 nm, and an aqueous medium (component). C), and the ratio of the pore size (P) between the dry particles of the large particle size silica particles (component A) to the average primary particle size (D) of the small particle size silica particles (component B) ( D / P) is 0.6 to 1.4, and the ratio of the mass of the large particle size silica particles to the total mass of the large particle size silica particles and the small particle size silica particles is 55 to 95% by mass. This is based on the knowledge that the polishing rate is improved. In addition, the present invention is capable of precipitating particles having a particle density of 2.2 g / cm ³ and a particle diameter of 80 nm or more dispersed in a dispersion medium having a fluid density of 1.0 g / cm ³ and a fluid viscosity of 1 cps. Including precipitated silica particles that precipitate when centrifuged under a centrifuging condition, floating silica particles that do not precipitate even when centrifuged under the centrifuging condition, and an aqueous medium, and a void between the dry particles of the precipitated silica particles The ratio (d / p) of the diameter (p) to the dispersed particle size (d) of the floating silica particles is 0.50 to 1.05, and the total mass of the precipitated silica particles and the floating silica particles It is based on the knowledge that the polishing rate is improved when the ratio of the mass of the precipitated silica particles to 55 to 95 mass%.

  The reason why the polishing rate is improved by mixing two types of silica particles each having a specific structure by a specific amount is not clear, but is presumed as follows.

  In general, by mixing a plurality of types of silica particles having different particle sizes and widening the particle size distribution, the packing rate of the silica particles is improved, and the contact area between the silica particles and the object to be polished is improved, resulting in a higher polishing rate. It is thought to improve. On the other hand, when polishing hard and brittle materials that are harder than silica particles, small particles (floating) of silica particles alone have a low cutting force and a low polishing rate. If the ratio of the diameter silica particles is increased too much, the polishing rate is decreased. That is, in order to improve the polishing rate of the hard and brittle material, it is necessary to mix a small particle size silica particle having a specific structure suitable for the structure of the large particle size silica particle in an optimum amount.

  The ratio (D / P) between the dry interparticle void size (P) of the large particle size silica particles (component A) and the average primary particle size (D) of the small particle size silica particles (component B) is 0.6 to In the case of 1.4, since the small particle size silica particles are efficiently filled in the inter-particle voids of the large particle size silica particles during polishing and the filling rate of the entire silica particles is improved, the silica particles and the coated particles are improved. It is presumed that the total contact area with the object to be polished increased, and as a result, the polishing rate was improved. Further, the closest packing ratio of single spherical particles is theoretically 76%. Therefore, if the ratio of the large particle size silica particles (component A) to the total silica particles is 55 to 95% by mass and the ratio of the small particle size silica particles (component B) to the total silica particles is 5 to 45% by mass, polishing is performed. During the process, the small particle size silica particles are filled in the gap between the large particle size silica particles without excess and deficiency, and the filling rate of the entire silica particles is improved, so the power energy of the polishing machine is efficiently transmitted to the polishing surface. It is speculated that the polishing rate was improved.

  In addition, the dry inter-particle voids (p) of the precipitated silica particles (component X) and the floating silica particles (component X) that precipitate when the polishing composition for hard and brittle materials of the present invention is centrifuged under specific centrifugal conditions. If the ratio (d / p) of the component Y) to the dispersed particle size (d) is 0.50 to 1.05, during the polishing, the floating silica particles are efficiently contained in the interparticle voids of the precipitated silica particles. It is presumed that the polishing rate was improved because it was well packed and the filling rate of the entire silica particles was improved. Further, the closest packing ratio of single spherical particles is theoretically 76%. Therefore, if the ratio of the precipitated silica particles (component X) to the total silica particles is 55 to 95% by mass and the ratio of the floating silica particles (component Y) to the total silica particles is 5 to 45% by mass, during the polishing. It is speculated that the polishing rate was improved because the interstitial voids of the precipitated silica particles were filled with the floating silica particles without excess and deficiency, and the filling rate of the entire silica particles was improved.

  However, the present invention is not limited to these estimations.

<Silica particles>
Large particle size silica particles (component A) and small particle size silica particles (components) contained in the polishing composition for hard and brittle materials of the present invention (hereinafter sometimes abbreviated as “the polishing composition of the present invention”) Both B) are silica particles that act as abrasive grains. Examples of these silica particles include colloidal silica and fumed silica, and colloidal silica is more preferable from the viewpoint of improving the smoothness of the polished object.

  The use form of the silica particles is preferably a slurry from the viewpoint of operability. When the silica particles contained in the polishing composition of the present invention are colloidal silica, from the viewpoint of ease of production and economy, the colloidal silica may be obtained from a hydrolyzate of water glass or alkoxysilane. Preferably, it is obtained from water glass. Silica particles obtained from water glass can be produced by a conventionally known method.

The silica particles may be silica particles whose surface is treated with a silane coupling agent or the like, but silica particles that are not surface-treated are preferable from the viewpoint of improving the polishing rate. The said silica particles, may be contained an inorganic element other than Si, such as Al and Zr, but from the viewpoint of increasing the polishing rate, preferably the major component of the solids is a SiO _2, with no hydroxide terms SiO ₂ is preferably 90% by mass or more, more preferably 95% by mass or more, and further preferably 99% by mass or more.

The concentration of all the silica particles (the total of the large particle size silica particles (component A) and the small particle size silica particles (component B)) in the polishing liquid composition of the present invention is converted to SiO ₂ from the viewpoint of improving the polishing rate. The concentration is preferably 1% by mass or more, more preferably 5% by mass or more, and still more preferably 10% by mass or more. In addition, the concentration of all the silica particles in the polishing composition of the present invention is preferably 40% by mass or less in terms of SiO ₂ from the viewpoint of cost reduction and improvement of storage stability of the polishing composition. More preferably, it is more preferably 25% by mass or less.

  From the viewpoint of improving the polishing rate, the dispersed particle diameter of all the silica particles in the polishing liquid composition of the present invention is preferably 10 nm or more, more preferably 50 nm or more, still more preferably 100 nm or more, and a polished object to be polished. From the viewpoint of improving the smoothness, 500 nm or less is preferable, 300 nm or less is more preferable, and 200 nm or less is still more preferable.

BET specific surface area of the entire silica grain in the polishing composition of the present invention is preferably 10 m ² / g or more from the viewpoint of improving the polishing rate, more preferably at least 20 m ² / g, more preferably not less than 40 m ² / g from the same viewpoint, preferably 200 meters ² / g or less, more preferably ^{100m 2 / g, 60m 2 /} g or less is more preferable.

[Large particle size silica particles (component A)]
The ratio of the mass of the large particle size silica particles to the mass of all the silica particles in the polishing liquid composition of the present invention (the total mass of the large particle size silica particles and the small particle size silica particles) is from the viewpoint of improving the polishing rate. 55 mass% or more, preferably 60 mass% or more, more preferably 70 mass% or more, further preferably 75 mass% or more, and from the same viewpoint, it is 95 mass% or less, and preferably 85 mass% or less.

  From the viewpoint of increasing the filling rate and improving the polishing rate, the pore size (P) between the dry particles of the large particle size silica particles is preferably 5 nm or more, more preferably 10 nm or more, further preferably 15 nm or more, and the same viewpoint. , 100 nm or less is preferable, 80 nm or less is more preferable, 50 nm or less is more preferable, and 30 nm or less is even more preferable. In addition, the space | gap diameter between the dry particles of a large particle size silica particle shows the magnitude | size of the average space | gap part which can be obtained by the mercury intrusion method.

  The average primary particle size of the large particle size silica particles (component A) used in the production of the polishing composition of the present invention is 500 nm or less, preferably 300 nm or less, from the viewpoint of improving the smoothness of the polished substrate surface. 200 nm or less is more preferable, 150 nm or less is more preferable, and from the viewpoint of ensuring a high polishing rate, it is 80 nm or more, and preferably 100 nm or more. In addition, the average primary particle diameter of the large particle diameter silica particles (component A) used in the production of the polishing liquid composition of the present invention is equivalent to a circle equivalent diameter in an electron microscope (TEM) observation image as described in Examples described later. It is the number average of the particle diameter calculated | required as.

The following coefficient of variation of the average primary particle size of the large particle size silica particles is preferably 1 to 50%, more preferably 1 to 30%, from the viewpoint of increasing the filling rate and improving the polishing rate. More preferably, it is 10%.
Coefficient of variation = (standard deviation / average primary particle size)

  The particle shape of the large particle size silica particles (component A) contained in the polishing liquid composition of the present invention may be any of spherical shape, irregular shape such as gold flat sugar type, association type, etc. From the viewpoint of improving the polishing rate, The confetti type is preferred, and the confetti type is more preferred.

[Small particle size silica particles (component B)]
The ratio of the mass of the small particle size silica particles to the mass of the total silica particles in the polishing composition of the present invention (the total mass of the large particle size silica particles and the small particle size silica particles) is from the viewpoint of improving the polishing rate. 5% by mass or more, preferably 15% by mass or more, and from the same viewpoint, it is 45% by mass or less, preferably 40% by mass or less, more preferably 30% by mass or less, and even more preferably 25% by mass or less. .

  The average primary particle size (D) of the small particle size silica particles (component B) used in the production of the polishing composition of the present invention is 5 nm or more from the viewpoint of increasing the filling rate and improving the polishing rate, and is 10 nm. The above is preferable, 15 nm or more is more preferable, 20 nm or more is more preferable, and from the same viewpoint, it is 70 nm or less, 50 nm or less is preferable, 40 nm or less is more preferable, and 30 nm or less is still more preferable. In addition, the average primary particle diameter (D) of the small particle diameter silica particles (component B) used in the production of the polishing liquid composition of the present invention is an electron microscope (TEM) observation image as described in Examples described later. It is the number average of the particle diameter calculated | required as an equivalent circle diameter.

  The coefficient of variation of the average primary particle size (D) of the small particle size silica particles is preferably 1 to 50%, more preferably 1 to 30% from the viewpoint of increasing the filling rate and improving the polishing rate. More preferably, it is 1 to 10%.

  The ratio (D / P) of the pore size (P) between the dry particles of the large particle size silica particles (component A) and the average primary particle size (D) of the small particle size silica particles (component B) is: From the viewpoint of efficiently filling the interparticle voids of the particles with small-diameter silica particles and improving the filling rate of the entire silica particles, it is 0.6 or more and preferably 0.7 or more. From the same viewpoint, (D / P) is 1.4 or less and preferably 1.3 or less.

<Aqueous medium (component C)>
Examples of the aqueous medium (component C) contained in the polishing liquid composition of the present invention include water such as ion-exchanged water and ultrapure water, or a mixed medium of water and a solvent. Examples of the solvent include water and A miscible solvent (for example, an alcohol such as ethanol) is preferred. As the aqueous medium, ion-exchanged water or ultrapure water is more preferable, and ultrapure water is more preferable. When Component C of the present invention is a mixed medium of water and a solvent, the ratio of water to the entire mixed medium as Component C is not particularly limited, but is 95% by mass or more from the viewpoint of economy. Is preferable, 98 mass% or more is more preferable, substantially 100 mass% is still more preferable, and 100 mass% is still more preferable.

  The content of the aqueous medium in the polishing liquid composition of the present invention is not particularly limited, and may be the remainder of Component A, Component B, and optional components described below.

  The pH of the polishing composition of the present invention at 25 ° C. is preferably 8 or more, more preferably 9 or more, and 9.5 or more from the viewpoint of improving the polishing rate by the progress of alkali hydrolysis of the object to be polished. Further preferred. In addition, the pH at 25 ° C. of the polishing composition of the present invention suppresses alkali dissolution of silica particles (component A) and causes the silica particles as abrasive grains to sufficiently act on the object to be polished to improve the polishing rate. From the viewpoint, it is preferably 12 or less, more preferably 11.5 or less, and still more preferably 11 or less.

  The polishing composition of the present invention may further contain conventionally known optional components depending on the intended use. When the polishing liquid composition of the present invention is, for example, a polishing liquid composition for sapphire substrates for electronic components such as semiconductor elements (for example, a polishing liquid composition for sapphire substrates for LEDs), the polishing liquid composition of the present invention. May further contain a surfactant, a rust inhibitor, a dispersant, a pH adjuster and the like.

[Method for preparing polishing liquid composition]
The polishing liquid composition of this invention can be prepared by mixing each component by a well-known method. The polishing composition is usually produced as a concentrated solution from the viewpoint of economy, and it is often diluted at the time of use. The polishing composition may be used as it is, or diluted if it is a concentrated solution. When diluting the concentrate, the dilution ratio is not particularly limited, and can be appropriately determined according to the concentration of each component in the concentrate (abrasive content, etc.), polishing conditions, and the like.

  The constituent components of an example of the polishing liquid composition of the present invention obtained by the above [Method for preparing polishing liquid composition] can also be specified from the polishing liquid composition itself by performing centrifugation under the following centrifugal conditions. .

[Centrifuge conditions]
The centrifugal conditions applied to an example of the polishing composition of the present invention include a dispersion medium having a fluid density of 1.0 g / cm ³ and a fluid viscosity of 1 cps, dispersed in the dispersion medium, and a particle density of 2. Centrifugal force capable of precipitating only particles having a particle size of 80 nm or more in a hypothetical particle dispersion containing 2 g / cm ³ and particles having a particle size of 80 nm (8 × 10 ⁻⁵ cm) or more. And the centrifugation time is adopted. Centrifugal force and centrifugation time depend on the specs of the centrifuge used for centrifugation (maximum centrifugal force, capacity of the centrifuge tube) and the liquid level of the silica particle dispersion in the centrifuge tube. when applying the centrifugal force in the centrifugal separation of the particle dispersion, the Stokes equation below, it is possible to determine the sedimentation rate v _s of the particles, the liquid surface of the silica particle dispersion in a centrifuge tube with the sedimentation velocity v _s high From this, the centrifugation time can be determined.

Ｖ_S：沈降速度[cm/s]
Ｄ_p：粒子径[cm]
ρ_p：粒子密度[g/cm³]
ρ_f：流体密度[g/cm³]
ｇ：重力加速度[cm/s²]
η：流体粘度[Pa・s]

V _S : Sedimentation velocity [cm / s]
D _p : particle diameter [cm]
ρ _p : particle density [g / cm ³ ]
ρ _f : Fluid density [g / cm ³ ]
g: Gravity acceleration [cm / s ² ]
η: Fluid viscosity [Pa · s]

  The particle size (Dp) of 80 nm is equal to the lower limit of the average primary particle size of the large particle size silica particles used in the preparation of the polishing liquid composition of the present invention. And floating silica particles can be separated cleanly.

An example of the polishing composition of the present invention includes precipitated silica particles that precipitate when centrifuged under the following centrifugal conditions, floating silica particles that do not precipitate even when centrifuged under the centrifugal conditions, an aqueous medium, including.
(Centrifuge conditions)
The polishing liquid composition is placed in a centrifuge tube having a capacity of 50 ml until the liquid level reaches 10 cm, and the polishing liquid composition in the centrifuge tube is centrifuged at a centrifugal force of 2150 G (rotation speed: 3500 rpm) for 3 hours. I do.

  Since the precipitated silica particles and the floating silica particles are both silica particles and the density of the particles is the same, the precipitated silica particles have a relatively larger particle size than the floating silica particles, and therefore have a small BET specific surface area. .

From the viewpoint of improving the polishing rate, the concentration of the total silica particles in the polishing liquid composition containing the precipitated silica particles and the floating silica particles is preferably 1% by mass or more, more preferably 5% by mass or more in terms of SiO ₂ conversion. Preferably, 10 mass% or more is more preferable. Further, the concentration of all the silica particles in the polishing liquid composition is preferably 40% by mass or less, and preferably 30% by mass in terms of SiO ₂ , from the viewpoint of cost reduction and improvement in storage stability of the polishing liquid composition. The following is more preferable, and 25 mass% or less is still more preferable.

[Precipitated silica particles]
From the viewpoint of increasing the filling rate and improving the polishing rate, the pore size (p) between the dried silica particles is preferably 5 nm or more, more preferably 10 nm or more, still more preferably 15 nm or more, and from the same viewpoint, 100 nm. The following is preferable, 80 nm or less is more preferable, 50 nm or less is further preferable, and 30 nm or less is still more preferable. The void size (p) between the dry particles of the precipitated silica particles can be measured by the same method as the method for measuring the void size (P) between the dry particles of the large particle size silica particles.

BET specific surface area of precipitated silica particles, from the viewpoint of improving the polishing rate is preferably at least 10 m ² / g, more preferably at least 20 m ² / g, more preferably not less than 30 m ² / g, from the same viewpoint, 100 m ² / the following are preferred g, more preferably not more than ^{80m 2 / g, 50m 2 /} g more preferably less, 40 m ² / g or less is even more preferred.

  The ratio of the mass of the precipitated silica particles to the mass of the total silica particles in the polishing liquid composition containing the precipitated silica particles and the floating silica particles (the total mass of the precipitated silica particles and the floating silica particles) is a viewpoint for improving the polishing rate. Thus, it is 55% by mass or more, preferably 60% by mass or more, more preferably 70% by mass or more, further preferably 75% by mass or more, and 95% by mass or less and 85% by mass or less from the viewpoint of improving the polishing rate. Is preferred.

[Floating silica particles]
The ratio of the mass of the floating silica particles to the mass of the total silica particles in the polishing liquid composition containing the precipitated silica particles and the floating silica particles (the total mass of the precipitated silica particles and the floating silica particles) is a viewpoint for improving the polishing rate. From the same viewpoint, it is 45% by mass or less, preferably 40% by mass or less, more preferably 30% by mass or less, and even more preferably 25% by mass or less. preferable.

  The dispersed particle size (d) of the floating silica particles in the polishing composition containing the precipitated silica particles and the floating silica particles is 70 nm or less, preferably 50 nm or less, from the viewpoint of increasing the filling rate and improving the polishing rate. 40 nm or less, more preferably 30 nm or less, and from the same viewpoint, it is 5 nm or more, preferably 10 nm or more, more preferably 15 nm or more, and further preferably 20 nm or more. In addition, the dispersion | distribution particle diameter of a floating silica particle is a volume conversion average particle diameter measured using the dynamic light-scattering particle size distribution meter as described in the Example mentioned later.

  The ratio (d / p) between the void size (p) between the dry particles of the precipitated silica particles and the dispersed particle size (d) of the suspended silica particles is determined by the ratio of the suspended silica particles to the voids between the precipitated silica particles during polishing. From the viewpoint of efficiently filling and improving the filling rate of the entire silica particles, it is more preferably 0.50 or more, and further preferably 0.87 or more. From the same viewpoint, (d / p) is 1.05 or less and preferably 1.03 or less.

  Next, an example of the manufacturing method of the hard and brittle material of the present invention using the polishing liquid composition of the present invention and an example of the polishing method of the hard and brittle material of the present invention will be described.

[Polished hard and brittle materials]
Examples of the hard brittle material to be polished (the object to be polished) in the hard brittle material manufacturing method of the present invention and the hard brittle material polishing method of the present invention include a sapphire substrate. The shape of the object to be polished is not particularly limited, and for example, it may be a shape having a curved surface portion such as a lens as well as a shape having a flat portion such as a disk shape, a plate shape, a slab shape, or a prism shape. The object to be polished is various, such as an integrated circuit board, an infrared detection lens, a sapphire glass used for a watch, a sapphire substrate for LED, etc. Among them, the polishing liquid composition of the present invention has a high smoothness. Is suitable as a polishing composition used in the polishing step of a method for producing a sapphire substrate for an electronic component such as a semiconductor element or the like, or a sapphire substrate for LED.

  Therefore, an example of the manufacturing method of the hard and brittle material of the present invention is a method of manufacturing a sapphire substrate for electronic parts such as semiconductor elements, and the sapphire substrate to be polished is prepared using the polishing composition for hard and brittle material of the present invention. A step of polishing. An example of the method for polishing a hard and brittle material according to the present invention is a method for polishing a sapphire substrate for electronic parts such as a semiconductor element, and the sapphire substrate to be polished is polished using the polishing composition for a hard and brittle material according to the present invention. The process of carrying out is included.

  The step of polishing the sapphire substrate is a first polishing step (rough polishing step) for planarizing a wafer obtained by slicing a sapphire single crystal ingot into a thin disc shape, and after etching the rough polished wafer. The polishing composition of the present invention can be used in both the first polishing step and the second polishing step, although it is divided into a second polishing step (finish polishing) for mirror-finishing the wafer surface. However, the polishing composition of the present invention is preferably used in the second polishing step from the viewpoint of surface smoothness and productivity of the sapphire substrate.

  An example of a manufacturing method of a hard and brittle material of the present invention (sometimes abbreviated as “an example of a manufacturing method of the present invention”) and an example of a polishing method of a hard and brittle material of the present invention (“an example of a polishing method of the present invention”). Is not particularly limited, and a jig (carrier: made of aramid, etc.) and a polishing cloth (polishing pad) for holding a hard and brittle material to be polished (polished sapphire plate). And any of a double-side polishing apparatus and a single-side polishing apparatus may be used.

  The polishing pad is not particularly limited, and a conventionally known polishing pad can be used. Examples of the material for the polishing pad include organic polymers, and examples of the organic polymer include polyurethane. The shape of the polishing pad is preferably a nonwoven fabric. For example, SUBA800 (manufactured by Nitta Haas) is suitably used as the nonwoven fabric polishing pad.

  In an example of the manufacturing method of the hard and brittle material of the present invention and the example of the polishing method of the hard and brittle material of the present invention using the polishing apparatus, the polished hard and brittle material (for example, the polished sapphire substrate) is held by a carrier and polished. The polishing composition of the present invention is sandwiched between polishing pads with a pad attached thereto, and supplied between a polishing pad and a hard brittle material to be polished (for example, a sapphire substrate to be polished). A step of polishing the hard brittle material to be polished by moving the polishing pad and / or the hard brittle material to be polished (for example, the sapphire substrate to be polished) while bringing the polishing pad into contact with the polishing pad.

One example and a polishing load in the polishing process an example of a manufacturing method of the present invention, from the viewpoint of increasing the polishing rate, 50 g / cm ² or more is preferable, 100 g / cm ² or more, and more preferably from 150 g / cm ² or more, 200 g Even more preferable is / cm ² or more. Further, the polishing load, device, considering the durability of the pad or the like is preferably 400 g / cm ² or less, 350 g / cm ² or less being more preferred. The polishing load can be adjusted by applying air pressure or weight to the surface plate or the substrate. The polishing load means the pressure of the surface plate applied to the polishing surface of the polished sapphire plate during polishing.

  The method of supplying the polishing liquid composition of the present invention is a method of supplying a polishing pad between a polishing pad and a hard and brittle material to be polished with a pump or the like in a state where the constituents of the polishing liquid composition are sufficiently mixed in advance. A method of mixing and supplying the above components in a supply line or the like, and supplying a large particle size silica slurry containing large particle size silica particles and a small particle size silica slurry containing small particle size silica particles separately to the polishing apparatus A method or the like can be used. From the viewpoint of improving the polishing rate and reducing the load on the apparatus, with the components of the polishing liquid composition sufficiently mixed in advance, the polishing liquid composition is pumped between the polishing pad and the hard brittle material to be polished with a pump or the like. The supply method is preferred.

From the viewpoint of cost reduction, the supply rate of the polishing composition is preferably 20 mL / min or less per 1 cm ^{2 of the} hard and brittle material to be polished, more preferably 10 mL / min or less, and even more preferably 5 mL / min or less. The supply rate is preferably 0.01 mL / min or more, more preferably 0.1 mL / min or more, and further preferably 0.5 mL / min or more from 1 cm ^{2 of the} hard brittle material to be polished, from the viewpoint of improving the polishing rate. .

  In one example of the production method of the present invention and one example of the polishing method of the present invention, since the polishing liquid composition of the present invention is used, the polishing speed of the hard brittle material to be polished such as the sapphire plate to be polished is high, and the hard brittle material Can increase productivity.

  The present invention further discloses the following <1> to <25>.

<1> Large particle size silica particles (component A) having an average primary particle size of 80 to 500 nm, small particle size silica particles (component B) having an average primary particle size of 5 to 70 nm, and an aqueous medium (component C) )
The ratio (D / P) of the pore size (P) between the dry particles of the large particle size silica particles (component A) and the average primary particle size (D) of the small particle size silica particles (component B) is 0.6. ~ 1.4,
The polishing liquid composition for hard-brittle materials whose ratio of the mass of the said large particle size silica particle with respect to the sum total of the mass of the said large particle size silica particle and the said small particle size silica particle is 55-95 mass%.
<2> The ratio (D / P) is 0.6 or more, preferably 0.7 or more, more preferably 1.0 or more, still more preferably 1.1 or more, and 1.4 or less, preferably 1 The polishing composition for hard and brittle materials according to <1>, which is .3 or less.
<3> The ratio of the mass of the large particle size silica particles to the total mass of the large particle size silica particles and the small particle size silica particles is 55% by mass or more, preferably 60% by mass or more, more preferably 70% by mass. % Polishing composition for hard and brittle materials according to <1> or <2>, which is 95% by weight or less, preferably 85% by weight or less.
<4> The ratio of the mass of the small particle size silica particles to the total mass of the large particle size silica particles and the small particle size silica particles is 5% by mass or more, preferably 15% by mass or more, and 45% by mass. The polishing composition for hard and brittle materials according to any one of <1> to <3>, preferably 40% by mass or less, more preferably 30% by mass or less, and still more preferably 25% by mass or less.
<5> The polishing composition for hard and brittle materials according to any one of <1> to <4>, wherein the large-diameter silica particles are preferably confetti-type silica particles.
<6> The inter-dry particle void diameter (P) of the large-diameter silica particles is preferably 5 nm or more, more preferably 10 nm or more, still more preferably 15 nm or more, preferably 100 nm or less, more preferably 80 nm or less. The polishing composition for hard and brittle materials according to any one of <1> to <5>, further preferably 50 nm or less, and still more preferably 30 nm or less.
<7> The average primary particle size of the large particle size silica particles (component A) is 500 nm or less, preferably 300 nm or less, more preferably 200 nm or less, still more preferably 150 nm or less, and 80 nm or more, preferably 100 nm or more. The polishing composition for hard and brittle materials according to any one of <1> to <6>.
<8> The coefficient of variation of the average primary particle size of the large particle size silica particles is preferably 1 to 50%, more preferably 1 to 30%, and even more preferably 1 to 10%, according to <7>. Polishing liquid composition for hard and brittle materials.
<9> The average primary particle size (D) of the small particle size silica particles (component B) is 5 nm or more, preferably 10 nm or more, more preferably 15 nm or more, still more preferably 20 nm or more, preferably 70 nm or less, preferably The polishing composition for hard and brittle materials according to any one of <1> to <8>, which is 50 nm or less, more preferably 40 nm or less, and still more preferably 30 nm or less.
<10> The coefficient of variation of the average primary particle size (D) of the small particle size silica particles is preferably 1 to 50%, more preferably 1 to 30%, and even more preferably 1 to 10%. <9> A polishing composition for hard and brittle materials as described in 1.
<11> The pH at 25 ° C. is preferably 8 or more, more preferably 9 or more, still more preferably 9.5 or more, preferably 12 or less, more preferably 11.5 or less, and even more preferably 11 or less. <1>-<10> The polishing liquid composition for hard-brittle materials in any one of.
<12> The concentration of all the silica particles (total of large particle size silica particles and small particle size silica particles) in the polishing composition for hard and brittle materials is a SiO ₂ equivalent concentration, preferably 1% by mass or more, More preferably 5% by mass or more, further preferably 10% by mass or more, preferably 40% by mass or less, more preferably 30% by mass or less, still more preferably 25% by mass or less, <1> to <11>. The polishing liquid composition for hard and brittle materials according to any one of the above.
<13> The dispersed particle diameter of all silica particles in the polishing composition for hard and brittle materials is preferably 10 nm or more, more preferably 50 nm or more, still more preferably 100 nm or more, preferably 500 nm or less, more preferably The polishing composition for hard and brittle materials according to any one of <1> to <12>, which is 300 nm or less, more preferably 200 nm or less.
<14> The BET specific surface area of all silica particles in the polishing composition for hard and brittle materials is preferably 10 m ² / g or more, more preferably 20 m ² / g or more, and further preferably 40 m ² / g or more. The polishing composition for hard and brittle materials according to any one of <1> to <13>, preferably 200 m ² / g or less, more preferably 100 m ² / g or less, and still more preferably 60 m ² / g or less. .
<15> Centrifugal conditions that enable precipitation of particles having a particle density of 2.2 g / cm ³ and a particle diameter of 80 nm or more dispersed in a dispersion medium having a fluid density of 1.0 g / cm ³ and a fluid viscosity of 1 cps Including precipitated silica particles that precipitate when subjected to centrifugal separation, floating silica particles that do not precipitate even when centrifuged under the centrifugal conditions, and an aqueous medium,
The ratio (d / p) between the inter-dry particle void diameter (p) of the precipitated silica particles and the dispersed particle diameter (d) of the floating silica particles is 0.5 to 1.05,
The polishing liquid composition for hard-brittle materials whose ratio of the mass of the said precipitated silica particle with respect to the sum total of the mass of the said precipitated silica particle and the said floating silica particle is 55-95 mass%.
<16> The mass ratio of the precipitated silica particles to the total mass of the precipitated silica particles and the floating silica particles is 55% by mass or more, preferably 60% by mass or more, more preferably 70% by mass or more, and still more preferably. Is 75 mass% or more, 95 mass% or less, Preferably it is 85 mass% or less, Polishing liquid composition for hard-brittle materials as described in <15>.
<17> The ratio of the mass of the floating silica particles Y to the total mass of the precipitated silica particles X and the floating silica particles Y is 5% by mass or more, preferably 15% by mass or more, and 45% by mass or less. The polishing composition for hard and brittle materials according to <15> or <16>, preferably 40% by mass or less, more preferably 30% by mass or less, and still more preferably 25% by mass or less.
<18> The pore size (p) between the dry particles of the precipitated silica particles is preferably 5 nm or more, more preferably 10 nm or more, still more preferably 15 nm or more, preferably 100 nm or less, more preferably 80 nm or less, still more preferably. Is a polishing composition for hard and brittle materials according to any one of <15> to <17>, which is 50 nm or less, more preferably 30 nm or less.
<19> BET specific surface area of the precipitated silica particles are preferably 10 m ² / g or more, more preferably 20 m ² / g or more, still more preferably 30 m ² / g or more, preferably 100 m ² / g or less, more The polishing composition for hard and brittle materials according to any one of <15> to <18>, preferably 80 m ² / g or less, more preferably 50 m ² / g or less, and even more preferably 40 m ² / g or less. .
<20> The dispersion particle size (d) of the floating silica particles is preferably 70 nm or less, more preferably 50 nm or less, still more preferably 40 nm or less, still more preferably 30 nm or less, preferably 5 nm or more, more preferably The polishing composition for hard and brittle materials according to any one of <15> to <19>, which is 10 nm or more, more preferably 15 nm or more, and even more preferably 20 nm or more.
<21> The ratio (d / p) is 0.50 or more, preferably 0.8 or more, more preferably 0.85 or more, further preferably 0.87 or more, 1.05 or less, preferably 1 The polishing composition for hard and brittle materials according to any one of <15> to <20>, which is 0.03 or less.
<22> A method for producing a hard and brittle material, comprising a step of polishing a hard and brittle material to be polished using the polishing composition for hard and brittle material according to any one of <1> to <21>.
<23> The method for producing a hard and brittle material according to <22>, wherein the hard and brittle material is preferably a sapphire substrate for electronic components, and more preferably a sapphire substrate for LED.
<24> A method for polishing a hard and brittle material, comprising a step of polishing a hard and brittle material to be polished using the polishing composition for a hard and brittle material according to any one of <1> to <21>.
<25> The method for polishing a hard and brittle material according to <24>, wherein the hard and brittle material is preferably a sapphire substrate for electronic components, and more preferably a sapphire substrate for LED.

  Hereinafter, an example of the present invention will be described more specifically with reference to examples.

<Example 1>
As a supply source of large particle size silica particles (component A) at room temperature, colloidal silica aqueous dispersion (cataloid CO-80A, SiO ₂ = 40% by mass, average primary particle size 130 nm, coefficient of variation 5%, particle shape confetti, As a supply source of 400 g of JGC Catalysts & Chemicals Co., Ltd., small particle size silica particles (component B), colloidal silica aqueous dispersion (cataloid SI-40W, SiO ₂ = 40% by mass, average primary particle size 23 nm, coefficient of variation 8%, 100 g of spherical particle shape, manufactured by JGC Catalysts & Chemicals, and further diluted with 500 g of water (ultra pure water), the polishing composition (concentration of all silica particles (SiO ₂ equivalent concentration) 20 mass%, pH 10. 3) was produced. The ratio of the large particle diameter silica particles (component A) to the total silica particles was 80 mass%, and the ratio of the small particle diameter silica particles (component B) was 20 mass%.

  The pore size (P) between the dry particles of the large particle size silica particles (component A) is 20 nm, and the ratio (D / P) to the average primary particle size (D) of the small particle size silica particles (component B) is: 1.2.

<Example 2>
Example 1 is the same as Example 1 except that the ratio of the large particle size silica particles (component A) to 90% by mass and the ratio of the small particle size silica particles (component B) to 10% by mass with respect to the total silica particles. In the same manner, a polishing composition (concentration of all silica particles (concentration of SiO ₂ ) 20% by mass, pH 10.5) was produced.

<Example 3>
Example 1 is the same as Example 1 except that the ratio of the large particle size silica particles (component A) to 70% by mass and the ratio of the small particle size silica particles (component B) to 30% by mass with respect to the total silica particles. In the same manner, a polishing liquid composition (concentration of total silica particles (concentration of SiO ₂ ) 20% by mass, pH 10.1) was produced.

<Example 4>
In Example 1, as a supply source of small particle size silica particles (component B), colloidal silica aqueous dispersion (cataloid SI-30W, SiO ₂ = 30% by mass, average primary particle size 16 nm, coefficient of variation 10%, particle shape A polishing liquid composition (concentration of all silica particles (concentration of SiO ₂ ) of 20% by mass, pH 10.4) was produced in the same manner as in Example 1 except that spherical shape and JGC Catalysts & Chemicals were used.

  The ratio (D / P) between the dry interparticle void size (P = 20 nm) of the large particle size silica particles (component A) and the average primary particle size (D = 16 nm) of the small particle size silica particles (component B) is: 0.8.

<Example 5>
Example 1 is the same as Example 1 except that the ratio of the large particle size silica particles (component A) to the total silica particles is 60% by mass and the ratio of the small particle size silica particles (component B) is 40% by mass. In the same manner, a polishing liquid composition (concentration of all silica particles (concentration of SiO ₂ ) 20% by mass, pH 10.0) was produced.

<Comparative Example 1>
In Example 1, the polishing liquid composition (in the same manner as in Example 1) except that the small particle size silica particles (component B) were not mixed and the content of the large particle size silica particles (component A) was increased. A concentration of all silica particles (SiO ₂ equivalent concentration: 20% by mass, pH 10.6) was produced.

<Comparative example 2>
In Example 1, the polishing liquid composition (in the same manner as in Example 1) except that the large particle size silica particles (component A) were not mixed and the content of the small particle size silica particles (component B) was increased. A concentration of all silica particles (SiO ₂ equivalent concentration) 20 mass%, pH 9.4) was produced.

<Comparative Example 3>
In Example 4, the polishing composition (in the same manner as in Example 4) except that the large particle size silica particles (component A) were not mixed and the content of the small particle size silica particles (component B) was increased. A concentration of all silica particles (SiO ₂ equivalent concentration) 20 mass%, pH 9.4) was produced.

<Comparative Example 4>
In Example 1, colloidal silica aqueous dispersion (cataloid SI-22PW, SiO ₂ = 40 mass%, average primary particle diameter 30 nm, variation coefficient 8%, particle shape as a supply source of small particle diameter silica particles (component B) A polishing liquid composition (concentration of all silica particles (concentration of SiO ₂ ) of 20% by mass, pH 10.3) was produced in the same manner as in Example 1 except that spherical shape and JGC Catalysts & Chemicals were used.

  The ratio (D / P) of the void size between the dry particles (P = 20 nm) of the large particle size silica particles (component A) and the average primary particle size (D = 30 nm) of the small particle size silica particles (component B) is: 1.5.

<Comparative Example 5>
In Example 1, colloidal silica aqueous dispersion (cataloid SI-550W, SiO ₂ = 20 mass%, average primary particle diameter 8 nm, coefficient of variation 15%, particle shape as a supply source of small particle diameter silica particles (component B) A polishing liquid composition (concentration of all silica particles (concentration of SiO ₂ ) of 20% by mass, pH 10.7) was produced in the same manner as in Example 1 except that spherical shape and JGC Catalysts & Chemicals were used.

  The ratio (D / P) of the inter-dry particle void size (P = 20 nm) of the large particle size silica particles (component A) and the average primary particle size (D = 8 nm) of the small particle size silica particles (component B) is: 0.4.

<Example 6>
In Example 1, a colloidal silica aqueous dispersion (cataloid SI-80PW, SiO ₂ = 40% by mass, average primary particle size 110 nm, coefficient of variation 5%, particle shape as a source of large particle size silica particles (component A) A polishing composition (concentration of all silica particles (concentration of SiO ₂ ) of 20% by mass, pH 9.8) was produced in the same manner as in Example 1 except that spherical shape and JGC Catalysts & Chemicals were used.

  The ratio (D / P) of the inter-dry particle void size (P = 18 nm) of the large particle size silica particles (component A) and the average primary particle size (D = 23 nm) of the small particle size silica particles (component B) is: 1.3.

<Example 7>
Example 6 is the same as Example 6 except that the ratio of the large particle size silica particles (component A) to 90% by mass and the ratio of the small particle size silica particles (component B) to 10% by mass with respect to the total silica particles. In the same manner, a polishing liquid composition (concentration of all silica particles (concentration of SiO ₂ ) 20% by mass, pH 9.9) was produced.

<Example 8>
Example 6 is the same as Example 6 except that the ratio of the large particle size silica particles (component A) to 70% by mass and the ratio of the small particle size silica particles (component B) to 30% by mass with respect to the total silica particles. In the same manner, a polishing composition (concentration of all silica particles (concentration as SiO ₂ ) of 20% by mass, pH 9.8) was produced.

<Example 9>
Example 6 is the same as Example 6 except that the ratio of the large particle size silica particles (component A) to the total silica particles is 60% by mass and the ratio of the small particle size silica particles (component B) is 40% by mass. In the same manner, a polishing composition (concentration of all silica particles (SiO ₂ equivalent concentration) 20 mass%, pH 9.7) was produced.

<Comparative Example 6>
In Example 6, the polishing liquid composition (in the same manner as in Example 6) except that the small particle size silica particles (component B) were not mixed and the content of the large particle size silica particles (component A) was increased. A concentration of all silica particles (SiO ₂ equivalent concentration: 20% by mass, pH 10.1) was produced.

<Comparative Example 7>
In Example 6, a polishing liquid composition (all the same as in Example 6) except that the small particle size silica particles described in Comparative Example 4 were used as the supply source of the small particle size silica particles (component B). A silica particle concentration (SiO ₂ equivalent concentration) 20 mass%, pH 9.9) was produced.

  The ratio (D / P) between the dry interparticle void size (P = 18 nm) of the large particle size silica particles (component A) and the average primary particle size (D = 30 nm) of the small particle size silica particles (component B) is: 1.7.

<Comparative Example 8>
In Example 6, the polishing liquid composition (all the same as in Example 6) except that the small particle size silica particles described in Comparative Example 5 were used as the supply source of the small particle size silica particles (component B). Silica particle concentration (SiO ₂ equivalent concentration) 20 mass%, pH 10.3) was produced.

  The ratio (D / P) of the inter-dry particle void size (P = 18 nm) of the large particle size silica particles (component A) and the average primary particle size (D = 8 nm) of the small particle size silica particles (component B) is: 0.4.

<Measurement of particle shape and average primary particle size>
In one or a plurality of embodiments, the shape of the silica particles is a classification that can be discriminated by a transmission electron microscope (TEM) observation photograph and analysis using the photograph. “Konpeira type silica particles” refers to silica particles having unique ridge-like projections on the surface of spherical particles. In one or a plurality of embodiments, the confetti type silica particles refer to particles having a shape in which two or more particles different in particle size by 5 times or more are aggregated or fused. “Spherical silica particles” refers to spherical particles (generally commercially available colloidal silica) that are nearly spherical.

  The average primary particle diameter is a number average of particle diameters determined as an equivalent circle diameter measured in an electron microscope (TEM) observation image as described below. Photos of silica particles observed with a transmission electron microscope (TEM) manufactured by JEOL (trade name “JEM-2000FX”, 80 kV, 1 to 50,000 times) are captured as image data with a scanner on a personal computer, and analysis software “WinROOF (Ver .3.6) "(distributor: Mitani Corporation), the particle diameter obtained as the equivalent circle diameter of each silica particle is determined for 1000 to 2000 silica particle data, and the average primary particle diameter and The coefficient of variation was determined.

<Measurement of pore size between dry particles>
The void size between the dry particles of the silica particles was determined by the mercury intrusion method using a pore diameter measuring device (Micromeritic automatic porosimeter Autopore IV9500, manufactured by Shimadzu Corporation) on a powder sample dried at 100 ° C. for 24 hours. A distribution of void diameters between dry particles in a pressure range of 5 to 60000 psi was obtained, and the peak of the distribution was defined as the void diameter between dry particles.

<Measurement of BET specific surface area>
The specific surface area of the silica particles is about 0.1 g of the measurement sample in a measurement cell with a precision of 4 digits after the decimal point and dried in a 200 ° C. atmosphere just before the measurement of the specific surface area. After drying for 30 minutes, the surface area was measured by a nitrogen adsorption method (BET method) using a specific surface area measuring device (Micromeritic automatic specific surface area measuring device Flowsorb III 2305, manufactured by Shimadzu Corporation).

<Measurement of dispersed particle size>
The dispersion particle size of the silica particles in the polishing compositions of Examples 1 to 9 and Comparative Examples 1 to 8 and the dispersion particle size of the floating silica particles in the supernatant liquid were determined by a dynamic light scattering (DLS) particle size distribution meter (Malvern). Zeta Sizer Nano S) manufactured by KK, solvent: water (refractive index 1.333), particles: colloidal silica (refractive index 1.45, attenuation coefficient 0.02), measurement temperature: 25 ° C. The volume-converted average particle size was determined as the dispersed particle size.

<Measurement of pH of polishing composition>
The pH of the polishing composition was measured at 25 ° C. using a pH meter (manufactured by Toa Denpa Kogyo Co., Ltd., HM-30G).

<Analysis by polishing method of polishing composition>
The water-diluted polishing composition (SiO ₂ = 5% by mass) was centrifuged as described below to separate precipitated silica particles and floating silica particles. A centrifuge tube (made by Asahi Glass Co., Ltd., Iwaki 2345-050, volume 50 mL) is filled with a polishing composition (SiO ₂ = 5% by mass) diluted with water to a liquid level height of 10 cm, and after sealing tightly, a desktop centrifuge (manufactured by Kokusan, H -28F, rotor RF-120), and centrifuged at 3500 rpm (2150G) for 3 hours. After separating the precipitate containing the precipitated silica particles (X) and the supernatant liquid containing the floating silica particles (Y) by decantation, each was immediately dried at 80 ° C. for 3 days. After determining the concentration of precipitated silica particles (X) and the concentration of floating silica particles (Y) in the supernatant, precipitation with respect to the total mass of precipitated silica particles (X) and floating silica particles (Y) from the determined concentrations. Table 1 and Table 2 show the mass ratio of the floating silica particles (Y) to the mass ratio of the silica particles (X) and the total mass of the precipitated silica particles (X) and the floating silica particles (Y).

  In addition, the pore size (p) between the dry particles of the precipitated silica particles (X), the BET specific surface area, and the dispersed particle size (d) of the suspended silica particles (Y) in the supernatant liquid are < Measurement>, <measurement of BET specific surface area>, and <measurement of dispersed particle size>, and are shown in Table 1 and Table 2.

<Polishing evaluation>
Circulating polishing was performed for 3 hours on the 2-inch sapphire substrate (c-plane) using the polishing liquid compositions of Examples 1 to 9 and Comparative Examples 1 to 8 under the following polishing conditions. Then, the weight change before and after polishing of the sapphire substrate was determined, and the polishing rate (μm / h) was calculated from the sapphire density (3.98 g / cm ³ ) and the sapphire substrate area (20.3 cm ² ). It was shown to.

(Polishing conditions)
Single-side polishing machine (TR15M-TRK1, made by Technolize, platen diameter 38cm)
Nonwoven polishing pad (Nitta Haas SUBA800)
Polishing load 300g / cm ²
Plate rotation speed 120rpm
Carrier rotation speed 120rpm
Polishing fluid flow rate 80mL / min (circulation)

  As shown in Table 1, it was confirmed that the polishing liquid compositions of Examples 1 to 5 had a higher polishing rate than when the polishing liquid compositions of Comparative Examples 1 to 5 were used. Moreover, as Table 2 showed, it has confirmed that the polishing liquid composition of Examples 6-9 was quicker than the case where the polishing liquid composition of Comparative Examples 6-8 was used. Further, as shown in Tables 1 and 2, it was confirmed that the polishing rate was faster when the squirrel sugar type silica particles were used as the large particle size silica particles than when the spherical silica particles were used.

  As explained above, in the polishing of hard and brittle materials to be polished using the polishing composition of the present invention, the polishing rate is high. Therefore, if the polishing liquid composition of the present invention is used, the productivity of hard and brittle materials such as sapphire substrates for electronic parts is improved.

Claims (7)

A large particle size silica particle (component A) having an average primary particle size of 80 to 500 nm, a small particle size silica particle (component B) having an average primary particle size of 5 to 70 nm, and an aqueous medium (component C). Mixed,
The ratio (D / P) of the pore size (P) between the dry particles of the large particle size silica particles (component A) and the average primary particle size (D) of the small particle size silica particles (component B) is 0.6. ~ 1.4,
The polishing liquid composition for hard-brittle materials whose ratio of the mass of the said large particle size silica particle with respect to the sum total of the mass of the said large particle size silica particle and the said small particle size silica particle is 55-95 mass%.   The polishing composition for hard and brittle materials according to claim 1, wherein the large-diameter silica particles are confetti-type silica particles.   The polishing composition for hard and brittle materials according to claim 1 or 2, wherein the pore size (P) between the dry particles of the large particle size silica particles is 5 to 100 nm.   The polishing composition for hard and brittle materials according to any one of claims 1 to 3, wherein the pH at 25 ° C is 8 to 12. Centrifugation is performed under a centrifugal condition in which only particles having a particle density of 2.2 g / cm ³ and a particle diameter of 80 nm or more dispersed in a dispersion medium having a fluid density of 1.0 g / cm ³ and a fluid viscosity of 1 cps can be precipitated. Including precipitated silica particles that precipitate when separation is performed, floating silica particles that are not precipitated even when centrifuged under the centrifugal conditions, and an aqueous medium,
The ratio (d / p) between the inter-dry particle void diameter (p) of the precipitated silica particles and the dispersed particle diameter (d) of the floating silica particles is 0.50 to 1.05,
The polishing liquid composition for hard-brittle materials whose ratio of the mass of the said precipitated silica particle with respect to the sum total of the mass of the said precipitated silica particle and the said floating silica particle is 55-95 mass%.   The manufacturing method of a hard-brittle material including the process of grind | polishing a to-be-polished hard-brittle material using the polishing liquid composition for hard-brittle materials as described in any one of Claims 1-5.   A method for polishing a hard and brittle material, comprising a step of polishing a hard and brittle material to be polished using the polishing composition for a hard and brittle material according to any one of claims 1 to 5.