JP5963331B2 - X-ray measuring device - Google Patents

Description

  The present invention relates to an X-ray measurement apparatus in which an X-ray source and X-ray detection means are housed in a portable housing.

  Conventionally, for example, Patent Document 1 discloses a portable X-ray measurement apparatus. In this X-ray measurement apparatus, an X-ray source and X-ray detection means are stored inside a housing. This X-ray measurement apparatus is very convenient because it can be carried to various measurement locations to perform X-ray measurement.

  Such a portable X-ray measurement apparatus may move due to vibration or camera shake during measurement. In particular, when the portable X-ray measurement apparatus is a hand-held type (that is, hand-held type) X-ray measurement apparatus, there is a possibility that the influence of camera shake will be great and accurate data cannot be acquired.

  In the X-ray measuring apparatus disclosed in Patent Document 1, the peripheral portion of the X-ray port for emitting X-rays and taking in the diffracted X-rays emitted from the measurement object is measured via a rubber-like ring member. By pressing against the object, the occurrence of camera shake and position fluctuation in the X-ray measurement apparatus is avoided.

US Patent Application Publication No. US2009 / 0274274

  However, in the X-ray measurement apparatus, X-rays are irradiated to a fixed position of the measurement object during measurement, and the X-ray detector diffracts the diffracted X-rays from the measurement object with stable and accurate diffraction angles. Detecting in the above is a matter required for obtaining highly reliable measurement data, and simply holding the X-ray measuring device using a rubber-like ring member cannot sufficiently satisfy the request. .

  The present invention has been made in view of the above-mentioned problems in the conventional apparatus, and since it is portable, it is an X-ray measuring apparatus that is easily affected by camera shake, vibration, etc. during measurement, but is accurate and stable. An object of the present invention is to provide an X-ray measurement apparatus capable of obtaining measured data with high reliability.

An X-ray measurement apparatus according to the present invention includes an X-ray source that generates X-rays incident on a measurement object, X-ray detection means that detects X-rays emitted from the measurement object, the X-ray source, and the X-ray source In an X-ray measurement apparatus that contains an X-ray detection means and a housing that is separate from the measurement object, a vibration amount detection sensor that detects a vibration amount of the housing, the X-ray source, and the X A line detecting means and a control means for controlling the vibration amount detection sensor , wherein the vibration amount detection sensor includes a distance sensor for detecting a change in distance, a speed sensor for detecting a change in speed, and a change in acceleration. A combination of any two or more of an acceleration sensor that detects a change in angular velocity and an angular velocity sensor that detects a change in angular velocity, and the control means obtains the X-ray intensity by the X-ray detection means at each sampling time. X-ray strength The amount of vibration is detected by the vibration amount detection sensor every sampling time, and the amount of fluctuation (δ (t)) of the position of the housing relative to the measurement object is obtained based on the amount of vibration, and the amount of fluctuation A measurement condition value for compensating for the fluctuation amount based on the measurement condition value, a process for correcting the measurement value obtained using the X-ray detection means is performed based on the measurement condition value, When any one of the values fluctuates so much that it cannot be compensated, the corresponding X-ray intensity is not included in the integration.

  In the X-ray measurement apparatus having the above-described configuration, the housing is a housing that can be carried (that is, portable) or a housing that can be carried by a person (that is, a hand-held type). If the X-ray measuring apparatus is formed as a portable type or a hand-held type as described above, the influence of vibration is more likely to occur than the fixed type X-ray measuring apparatus. However, if the present invention is applied, the influence of the vibration is effective. Can be resolved.

  According to the X-ray measuring apparatus having the above configuration, vibration is detected, and the measurement value is corrected based on the detection result. Therefore, since it is portable, the X-ray measuring apparatus is easily affected by camera shake, vibration, etc. However, accurate, stable and reliable measurement data can be obtained.

In the above configuration, as a process for correcting the measurement value obtained using the X-ray detection means, for example,
(A) The measurement value obtained by the X-ray detection means is corrected in software by appropriate application software,
(A) adjusting the position of the X-ray source and / or X-ray optical element constituting the optical system on the incident side of the X-ray measuring apparatus to adjust the X-rays irradiated to the sample;
(C) Adjusting the position of the X-ray detection means and / or X-ray optical element constituting the optical system on the light-receiving side of the X-ray measurement device to adjust the X-ray state with respect to the X-ray capturing part of the X-ray detection means To do,
Etc. are considered.

In the X-ray measurement apparatus according to the present invention, the amount of variation obtained based on the vibration amount detected by the vibration amount detection sensor is:
(A) A variation amount of a distance between the vibration amount detection sensor and the measurement object,
(B) a fluctuation amount in a plane orthogonal to a line connecting the vibration amount detection sensor and the measurement object; and (c) at least a fluctuation amount of the inclination of the vibration amount detection sensor with respect to the measurement object. It can be one.

In the X-ray measurement apparatus according to the present invention, the vibration amount detection sensor includes a distance sensor that detects a change in distance, a speed sensor that detects a change in speed, an acceleration sensor that detects a change in acceleration, and a change in angular velocity. Any two or more angular velocity sensors can be combined.
As the distance sensor, for example, a sensor that measures a distance based on a time from light emission to light reception of a laser beam can be used. As the angular velocity sensor, for example, a gyro sensor can be used.

  For example, variation data such as vibration and camera shake can be obtained by calculation based on speed data acquired by a speed sensor, and a command signal for correcting vibration or the like can be generated based on the variation data. The vibration of the X-ray measuring apparatus can be corrected based on the correction command signal. Further, for example, it is possible to obtain the shake speed data and the shake amount data by performing Fourier transform on the speed data acquired by the acceleration sensor.

  Further, for example, angular velocity data can be acquired by a gyro sensor, movement direction data can be acquired by an acceleration sensor, and the tilt angle of the X-ray measurement apparatus can be obtained based on the acquired data. Further, for example, angular velocity data can be acquired by a gyro sensor, and the angular velocity data can be integrated to acquire a change in the angle of the X-ray measuring apparatus.

  In the X-ray measurement apparatus according to the present invention, the vibration amount detection sensor can be fixed to the housing. The fixing position may be inside the housing or outside the housing. If the vibration amount detection sensor is fixed to the housing, the sensor can accurately detect the fluctuation amount of the housing.

  In the X-ray measurement apparatus according to the present invention, the process for correcting a measurement value obtained using the X-ray detection unit may be a process for controlling the position of the X-ray detection unit. Control of the position of the X-ray detection means can be performed using, for example, an apparatus that mechanically moves the X-ray detection means, for example, an actuator. Further, the device for controlling the operation of the actuator can be configured by a combination of a CPU (Central Processing Unit) of a computer and program software, for example.

  In the X-ray measurement apparatus according to the present invention, the process of controlling the position of the X-ray detection means can vary the distance between the X-ray detection means and the measurement object. In this way, the X-ray intensity measured by the X-ray detection means can be corrected.

  In the X-ray measurement apparatus according to the present invention, the process of controlling the position of the X-ray detection means includes moving the X-ray detection means in a direction perpendicular to the center line of the X-ray emitted from the measurement object. can do. In this way, the X-ray detection angle measured by the X-ray detection means can be corrected.

  In the X-ray measurement apparatus according to the present invention, the process of controlling the position of the X-ray detection unit may be a process of changing an inclination angle of the X-ray detection unit with respect to the measurement object. By doing this, it is possible to correct the angle for capturing X-rays and the intensity for capturing X-rays in the unit region for capturing X-rays.

  In the X-ray measurement apparatus according to the present invention, the process of controlling the position of the X-ray detection means includes (a) changing the distance between the X-ray detection means and the measurement object; Moving the X-ray detection means in a direction perpendicular to the center line of the X-rays emitted from the measurement object; and (c) varying the tilt angle of the X-ray detection means with respect to the measurement object. Any two combinations or three combinations can be used.

  In the X-ray measurement apparatus according to the present invention, the processing for correcting the measurement value obtained by using the X-ray detection means is performed by measuring X-rays that are emitted from the X-ray source and incident on the measurement object. It can be set as the process for making it enter into the fixed position of a target object.

  Such processing includes, for example, controlling the orientation of the X-ray source with respect to the measurement object and controlling the position of at least one of a plurality of X-ray optical elements constituting the incident optical system. This can be achieved by controlling the traveling direction of X-rays emitted from the source.

  An apparatus for controlling the orientation of the X-ray source or controlling the position of the X-ray optical element is, for example, a device that mechanically or electrically moves the X-ray source, such as an actuator or an X-ray source. A device that changes the traveling direction of the emitted X-rays by an electric field can be used. An apparatus for controlling the operation of an actuator or the like can be configured by, for example, a combination of a CPU (Central Processing Unit) of a computer and program software.

  In the X-ray measurement apparatus according to the present invention, the process for correcting the measurement value obtained by using the X-ray detection means is a process of processing the data obtained by the X-ray detection means by calculation using program software. It can be. An apparatus for performing such processing can be configured by, for example, a combination of a computer CPU (Central Processing Unit) and program software.

  In the X-ray measurement apparatus according to the present invention, the X-ray detection means can be any one of a one-dimensional X-ray detector, a two-dimensional X-ray detector, and a pixel detector. The one-dimensional X-ray detector is an X-ray detector having a position resolution of X-ray intensity on a straight line. The one-dimensional X-ray detector can be formed, for example, by arranging a plurality of minute X-ray light receiving elements capable of detecting X-rays in a straight line.

  The two-dimensional X-ray detector is an X-ray detector having a position resolution of X-ray intensity in a plane. The two-dimensional X-ray detection means can be formed by, for example, a semiconductor X-ray detector in which a plurality of minute X-ray light receiving elements are arranged in a plane. The two-dimensional X-ray detection means can be formed by a detector that can detect X-rays for each pixel and output a signal for each pixel. The two-dimensional X-ray detection means can be configured using, for example, a semiconductor image sensor in which a plurality of semiconductor X-ray light receiving elements are arranged in a plane. As such a semiconductor X-ray light receiving element, for example, a CCD (Charge Coupled Device) and a CMOS (Complementary Metal Oxide Semiconductor) can be applied.

  The two-dimensional X-ray detection means can also be constituted by a photon counting type pixel two-dimensional X-ray detector, that is, a pulse counting type pixel array two-dimensional detector. The photon counting type pixel two-dimensional X-ray detector is an X-ray detector that two-dimensionally arranges a plurality of pixels (pixels) that directly convert photons excited by X-rays into electrical signals and output them. It is a vessel.

  According to the X-ray measuring apparatus of the present invention, the vibration of the housing and the hand shake of the hand holding the housing are detected, and the measured value is corrected based on the detection result. However, it is possible to obtain accurate, stable, and highly reliable measurement data.

It is side surface sectional drawing of one Embodiment of the X-ray measuring apparatus which concerns on this invention. It is a block diagram which shows the specific example of the control part which is the principal part of the X-ray measuring apparatus of FIG. It is a flowchart which shows a part of flow of control performed by the control part of FIG. It is a figure which shows a part of the content of the control performed by the control part of FIG.

  Hereinafter, an X-ray measuring apparatus according to the present invention will be described based on embodiments. Of course, the present invention is not limited to this embodiment. In addition, in the drawings attached to the present specification, components may be shown in different ratios from actual ones in order to show characteristic parts in an easy-to-understand manner.

(First embodiment)
FIG. 1 shows an embodiment of an X-ray measuring apparatus according to the present invention. In this embodiment, the X-ray measuring apparatus 1 is used to inspect whether or not the measurement object 2 has a defect using X-rays in a nondestructive manner. The X-ray measurement apparatus of the present embodiment is a so-called handheld type X-ray measurement apparatus. It is obvious that the present invention can be applied to a portable X-ray measuring apparatus other than the handheld type.

  The X-ray measurement apparatus 1 has a housing, that is, a container 3 formed of a material that does not transmit X-rays. The material that does not transmit X-rays is, for example, a material containing at least one of iron, tungsten, and molybdenum. A handle 4 is fixed to a part of the outer peripheral surface of the container 3. The handle 4 is formed in a columnar shape such as a cylinder or a prism that extends in the outer direction of the housing 3 (that is, in the lateral direction in the figure). The handle 4 is sized so that a human measurer can hold it with one or both hands. Desirably, the handle 4 is subjected to a surface treatment for making the surface of the handle 4 difficult to slip.

  The housing 3 has a length L0 of, for example, 100 mm to 300 mm, a width that is a length in a direction perpendicular to the length L0 (ie, a direction that penetrates the drawing sheet), for example, a width of 100 mm to 250 mm, and a height H0. Is set to 75 mm to 200 mm, for example.

  Inside the housing 3, an X-ray tube 7 as an X-ray generator and a two-dimensional X-ray detector 8 as an X-ray detection means are provided. Inside the X-ray tube 7, for example, a filament (not shown) as a cathode and a target (not shown) as an anti-cathode are provided. The filament generates heat and emits thermoelectrons when energized. The region where the emitted thermoelectrons collide with the target is the X-ray focal point F, and X-rays are generated from this X-ray focal point F. The X-rays generated in this way are emitted to the outside of the X-ray tube 7 as schematically shown by the arrow R1.

  The X-rays emitted from the X-ray tube 7 and irradiated onto the measurement object 2 are continuous X-rays or monochromatic X-rays depending on the type of measurement. When monochromatic X-rays are used, a monochromator, a filter, and the like are provided on the X-ray optical path. The X-ray measurement apparatus 1 of the present embodiment may be an apparatus that performs measurement based on a concentration method, may be an apparatus that performs measurement based on a parallel beam method, or may be a fluorescent X-ray measurement apparatus. There may be.

  When based on the concentration method, X-rays generated and diverged from the X-ray source F are incident on the measurement object 2, and one point on the light receiving surface of the X-ray detector 8 is X-ray diffracted by the measurement object 2. Focus on. In the case of the parallel beam method, an X-ray optical element (for example, a collimator or a solar slit) that collimates a diverging X-ray beam is disposed on the incident side and / or the light receiving side. In the case of fluorescent X-ray measurement, a spectroscopic crystal for selecting and extracting X-rays by wavelength is arranged on the light receiving side.

  An opening 9 for emitting X-rays emitted from the X-ray tube 7 to the outside of the housing 3 is provided on the bottom surface of the housing 3. The opening 9 has a circular shape, a rectangular shape, or a shape close to them as viewed from the direction of the arrow A. In the measurement, the housing 3 is arranged with respect to the measurement object 2 such that the opening 9 faces the measurement object 2. In this way, the X-rays that have passed through the opening 9 are irradiated onto the surface of the measurement object 2.

  In the present embodiment, the two-dimensional X-ray detector 8 is formed by a semiconductor X-ray detector in which a plurality of minute X-ray light receiving elements are arranged in a plane. The two-dimensional X-ray detector 8 is a detector that can detect X-rays for each pixel and output a signal for each pixel. The two-dimensional X-ray detector 8 can be configured using, for example, a semiconductor image sensor in which a plurality of semiconductor X-ray light receiving elements are arranged in a plane. As such a semiconductor X-ray light receiving element, for example, a CCD or a CMOS can be applied.

  The two-dimensional X-ray detector 8 can also be constituted by a photon counting type pixel two-dimensional X-ray detector, that is, a pulse counting type pixel array two-dimensional detector. The photon counting type pixel two-dimensional X-ray detector is an X-ray detector that two-dimensionally arranges a plurality of pixels (pixels) that directly convert photons excited by X-rays into electrical signals and output them. It is a vessel.

  Further, a one-dimensional X-ray detector can be used instead of the two-dimensional X-ray detector 8. The one-dimensional X-ray detector can be configured, for example, using a semiconductor image sensor in which a plurality of semiconductor X-ray light receiving elements are arranged in a straight line. As such a semiconductor X-ray light receiving element, for example, a CCD or a CMOS can be applied.

  In FIG. 1, a vibration amount detection sensor 12 and a control unit 13 are provided inside the housing 3. The vibration amount detection sensor 12 includes a distance sensor that detects a distance using laser light, a speed sensor that detects a change in speed, an acceleration sensor that detects acceleration, and a gyro sensor as an angular speed sensor that detects angular speed. Has a sensor. Note that one, two, or three of the respective sensors can be used in combination as necessary.

An actuator 10 </ b> A is connected to the X-ray tube 7. The actuator 10A can perform the following operations.
(1) The X-ray tube 7 can be rotated and swung as indicated by an arrow C around the X-ray irradiation point B for position adjustment. Thereby, the direction of the X-rays emitted from the X-ray tube 7 can thereby be changed.
(2) The X-ray tube 7 can be translated relative to the housing 3 in the lateral direction (Xs), the front-rear direction (Ys), and the height direction (Zs) for position adjustment.

  By the operations (1) and / or (2) described above, the incident position of the X-rays that exit from the X-ray source F and enter the measurement object 2 can be adjusted. By adjusting the X-ray incident position, for example, even when hand shake occurs in the hand holding the housing 3, the position of the X-ray incident on the measurement object 2 can be maintained at a fixed position.

An actuator 10 </ b> B is connected to the X-ray detector 8. The actuator 10B can perform the following operations.
(1) The X-ray detector 8 can be rotated and swung as indicated by an arrow D around the X-ray irradiation point B for position adjustment.
(2) The X-ray detector 8 can be translated in a direction (arrow E direction) toward or away from the X-ray irradiation point B for position adjustment.
(3) In order to adjust the position of the X-ray detector 8, the X-ray detector 8 can be translated in a direction perpendicular to the center line of the X-ray R2 emitted from the measurement object 2 (the G direction and the direction perpendicular thereto). .

  The actuators 10A and 10B can be configured by a combination of an arbitrary rotation / oscillation mechanism and an arbitrary translation mechanism.

  As shown in FIG. 2, for example, the control unit 13 includes a central processing unit (CPU) 14 that is an arithmetic control unit, a memory 15 as a storage medium, and a communication unit 16. The communication unit 16 performs data communication with an external communication device 18. The devices such as the CPU 14, the memory 15, and the communication unit 16 are connected by a bus 17 that is a data transmission path. In the present embodiment, a personal computer is used as the external communication device 18. The distance sensor 12 in FIG. 1 is connected to the CPU 14 via the input / output interface 19 in FIG.

  The memory 15 is configured by a mechanical memory such as a hard disk, a semiconductor memory, or any other storage medium. In the storage area of the memory 15, an X-ray measurement program 22, which is a program for realizing an X-ray measurement operation using the various devices shown in FIG. 1, is installed. In the storage area of the memory 15, a measurement data file 23, which is an area for storing measurement result data, is set.

  In FIG. 1, a power supply 24 is installed outside the housing 3. Electric power can be supplied from the power source 24 through the cable 25 to various types of electric equipment provided inside the housing 3. The power source 24 may be installed inside the housing 3.

  When performing X-ray measurement on the measurement object 2 using the X-ray measurement apparatus 1 of the present embodiment, first, the measurer holds the handle 4 with his hand and measures the entire X-ray measurement apparatus 1. Carry to the object 2 and place the opening 9 of the housing 3 on the desired measurement point of the object 2 to be measured. Next, when a start switch (not shown) is turned ON, the X-ray measurement program 22 shown in FIG. 2 is started to realize the functions described below.

  That is, in FIG. 1, first, X-ray R1 is emitted from the X-ray tube 7. If the incident angle θi of the X-ray R1 with respect to the measurement object 2 coincides with an angle satisfying a predetermined diffraction condition with respect to the crystal lattice plane of the measurement object 2, a diffraction X-ray R2 is generated from the measurement object 2. At this time, the diffraction angle 2θ of the diffracted X-ray R2 is twice the incident angle θi. The diffracted X-ray R2 diffracted at the diffraction angle 2θ is read by the light receiving surface of the two-dimensional X-ray detector 8 arranged at the prospective angle θd with respect to the measurement object 2. Reading of the diffraction line by the X-ray detector 8 is performed every predetermined sampling time (for example, several microseconds (μs)). The prospective angle θd of the X-ray detector 8 is an angle equal to the X-ray incident angle θi.

  The light receiving surface of the two-dimensional X-ray detector 8 is a plane having a predetermined area, and the position in the plane can be specified by (x, y) coordinates. Therefore, which pixel (pixel) in the light receiving surface of the X-ray detector 8 receives the X-ray can be specified by the (x, y) coordinates. The X-ray detector 8 transmits the measured X-ray intensity to the control unit 13 in the form of an electric signal. The control unit 13 creates diffraction pattern data, which is a two-dimensional pattern, based on the transmitted X-ray intensity data. If this diffraction pattern is displayed as an image on the display of the computer 18 in FIG. 2 and observed by a measurer, it can be immediately determined whether or not the measurement object 2 has a defect.

  The X-ray measurement program 22 in the memory 15 in FIG. 2 realizes the X-ray measurement work as described above. The realization process includes an X-ray intensity acquisition process as shown in FIG. It is. Hereinafter, this process will be described.

  First, in step S1, the CPU 14 in FIG. 2 synchronizes with a sampling time of several microseconds (μs), that is, in real time for X-ray measurement, using the sensor 12 in FIG. The position fluctuation amount δ (t) with respect to is detected. (T) indicates that the fluctuation amount is obtained for each sampling time.

  The fluctuation amount δ (t) is orthogonal to the fluctuation amount relating to the distance (D0) between the vibration amount detection sensor 12 and the measurement object 2 and the line connecting the vibration amount detection sensor 12 and the measurement object 2. The amount of variation of the variation amount in the plane to be measured and the amount of variation related to the inclination of the vibration amount detection sensor 12 with respect to the measurement object 2 are included.

  Next, based on the obtained fluctuation amount δ (t), the CPU 14 calculates various measurement condition values for compensating for the fluctuation amount δ (t) in step S2. Specifically, the X-ray incident angle θi, the in-plane rotation angle φi, the parallel movement amounts Xs, Ys, Zs with respect to the X-ray tube 7, the expected angle θd with respect to the measurement object 2 of the X-ray detector 8, and the X-ray detection Each value of the distance Rd with respect to the measuring object 2 of the vessel 8 is obtained by calculation in consideration of the fluctuation amount δ (t).

  For example, as shown in FIG. The values of θi, φi, Xs, Ys, Zs, θd, and Rd are obtained by calculation based on the fluctuation amount δ (t) for four sampling times of 1 to 4. Next, the CPU 14 operates the actuator 10A and the actuator 10B of FIG. 1 based on the obtained condition values to make the values of θi, φi, Xs, Ys, Zs, θd, and Rd coincide with the calculation result. (Step S3). As a result, the measurement value obtained by the X-ray detector 8 is compensated.

  Next, the CPU 14 X-ray measurement is performed at regular sampling times 1 to 4 (step S4). Specifically, X-rays are emitted from the X-ray tube 7 in FIG. 1 and irradiated to the X-ray irradiation point B of the measurement object 2. When diffracted X-rays are generated from the measurement object 2, the diffracted X-rays are detected by the X-ray detector 8. For example, diffracted X-rays such as (a) to (d) shown in the “single shot” column are detected at each sampling time in FIG. The detected data of each diffracted X-ray is data after compensating for the amount of positional fluctuation of the X-ray measuring apparatus 1 caused by vibration, camera shake, etc., and thus is accurate and highly reliable data.

  The CPU 14 integrates the measured single shot data (step S6), and ends the measurement when the integrated value reaches a predetermined value (steps S6, S7, S8). In the case of the measurement shown in FIG. In the present embodiment, Zs = 10 among the condition values in 2 varies so much that compensation by the actuator 10A serving as compensation means cannot be performed. Therefore, this measured value is discarded and not included in the integration (step S9).

  In the X-ray measurement apparatus according to the present embodiment, the positions of the X-ray tube 7 and the two-dimensional X-ray detector 8 in step S3 based on the fluctuation amount of the housing 3 detected by the vibration amount detection sensor 12 in step S1. Therefore, the X-ray measuring apparatus according to the present embodiment is portable and can be easily affected by camera shake, vibration, etc., but accurate and stable reliability. High measurement data can be obtained.

(Second Embodiment)
In said 1st Embodiment, the vibration amount detection sensor 12 was comprised by each sensor of a distance sensor, a speed sensor, an acceleration sensor, and a gyro sensor. Further, the X-ray tube 7 is provided so as to be able to rotate and swing (direction C in FIG. 1) and to be movable in parallel (Xs, Ys, Zs) in order to adjust the position. Further, in order to adjust the position of the two-dimensional X-ray detector 8, the two-dimensional X-ray detector 8 can be rotated and swung (D direction in FIG. 1), can be translated relative to the measurement object 2 (E direction in FIG. 1), and It was provided so as to be able to translate in the direction perpendicular to the center line (G direction in FIG. 1 and the direction perpendicular thereto).

  In the X-ray measurement apparatus according to the second embodiment, the X-ray tube 7 is fixed to the housing 3 so that the X-ray incident angle θi becomes a constant value, and the expected angle θd of the X-ray detector becomes a constant value. In this manner, the two-dimensional X-ray detector 8 is fixed to the housing 3. For this reason, the actuator 10A and the actuator 10B shown in FIG. 1 are not used in this embodiment.

  Furthermore, in the present embodiment, the vibration amount detection sensor 12 is configured only by a distance sensor using laser light. Therefore, the variation amount detected by the sensor 12 is only the variation amount of the distance of the housing 3 with respect to the measurement object 2.

  The control unit 13 does not compensate for the fluctuation amount of the housing 3 by mechanically moving the X-ray tube 7 and the X-ray detector 8, but by predetermined application software installed in the memory 15 of FIG. 2. According to the function to be realized, the measurement data obtained by the two-dimensional X-ray detector 8 is numerically compensated by calculation. Specifically, the fluctuation amount of the housing 3 is divided into two orthogonal components in the plane coordinates of the X-ray receiving surface of the X-ray detector 8, and the position information in the diffraction line data obtained by the measurement is determined by these fluctuation amount components. To compensate.

  Also in the second embodiment, since the measurement information of the two-dimensional X-ray detector 8 is compensated based on the fluctuation amount of the housing 3 detected by the vibration amount detection sensor 12, X according to the present embodiment. Since the X-ray measuring apparatus is portable and can easily be affected by hand shake and vibration during measurement, it can obtain accurate, stable and highly reliable measurement data.

(Modification)
In the second embodiment, the X-ray tube 7 is fixed to the housing 3, the two-dimensional X-ray detector 8 is fixed to the housing 3, and the measurement data obtained by the two-dimensional X-ray detector 8 is used as an application. Compensated numerically by calculation according to the function realized by software. Apart from such a configuration, the position of the X-ray tube 7 can be adjusted by the actuator 10A, the position of the two-dimensional X-ray detector 8 can be adjusted by the actuator 10B, and the two-dimensional X-ray detector 8 can adjust the position. The obtained measurement data can also be configured to be numerically compensated by calculation according to a function realized by application software.

(Other embodiments)
The present invention has been described with reference to the preferred embodiments. However, the present invention is not limited to the embodiments, and various modifications can be made within the scope of the invention described in the claims.

  For example, in the first embodiment described above, in FIG. 1, the vibration amount detection sensor 12 is configured by each of a distance sensor, a speed sensor, an acceleration sensor, and a gyro sensor. Further, the X-ray tube 7 is provided so as to be able to rotate and swing (direction C in FIG. 1) and to be movable in parallel (Xs, Ys, Zs) in order to adjust the position. Further, in order to adjust the position of the two-dimensional X-ray detector 8, the two-dimensional X-ray detector 8 can be rotated and swung (D direction in FIG. 1), can be translated relative to the measurement object 2 (E direction in FIG. 1), and It was provided so as to be movable in a direction perpendicular to the direction (G direction and a direction perpendicular thereto).

  On the other hand, the vibration amount detection sensor 12 is not limited to a configuration including all of the distance sensor, the speed sensor, the acceleration sensor, and the gyro sensor, but includes a distance sensor, a speed sensor, an acceleration sensor, and a gyro sensor. It can be any one, two of them, or a combination of the three. Also, any sensor other than a distance sensor, a speed sensor, an acceleration sensor, and a gyro sensor can be used.

  Furthermore, the present invention is not limited to the case where both the X-ray tube 7 and the two-dimensional X-ray detector 8 are moved for position adjustment, and either one is selectively moved for position adjustment. You can also.

  In the embodiment described above, the traveling direction of the incident X-ray R1 is adjusted by mechanically moving the X-ray tube 7 by the actuator 10A. On the other hand, an electrode can be provided inside or outside the X-ray tube 7 and the traveling direction of the incident X-ray R1 can be adjusted by the action of the electric field formed by this electrode.

  1. 1. X-ray measuring device, 2. measurement object; 3. housing (container); Handle, 7. 8. X-ray tube (X-ray generator), 8. Two-dimensional X-ray detector (X-ray detection means) Opening, 10A, 10B. Actuator, 12. 12. Vibration amount detection sensor; Control unit, 14. CPU, 15. Memory, 16. 17. communication section Bus, 18. Computer (external communication device), 19. I / O interface 25. Cable, B. X-ray irradiation point, C, D.I. Rotation and swinging direction; Direction of translation; X-ray focus (X-ray source), L0. Length, H0. Height, R1. Incident X-rays, R2. X-ray diffraction, X0. Height centerline, θi. Incident angle, θd. Expected angle of X-ray detector, 2θ: diffraction angle, φi. In-plane angle

Claims (6)

An X-ray source for generating X-rays incident on the measurement object;
X-ray detection means for detecting X-rays emitted from the measurement object;
A housing that houses the X-ray source and the X-ray detection means, and is separate from the measurement object ;
In an X-ray measuring apparatus having
A vibration amount detection sensor for detecting a vibration amount of the housing;
Control means for controlling the X-ray source, the X-ray detection means, and the vibration amount detection sensor,
The vibration amount detection sensor includes at least two of a distance sensor that detects a change in distance, a speed sensor that detects a change in speed, an acceleration sensor that detects a change in acceleration, and an angular velocity sensor that detects a change in angular velocity. A combination of
The control means includes
The X-ray intensity is obtained by the X-ray detection means at every sampling time,
Accumulate the calculated X-ray intensity,
The amount of vibration is detected by the vibration amount detection sensor at every sampling time,
A variation amount (δ (t)) of the position of the housing with respect to the measurement object is obtained based on the vibration amount,
Based on the amount of variation, find the measurement condition value to compensate for the amount of variation,
A process for correcting the measurement value obtained using the X-ray detection means is performed based on the measurement condition value,
When any one of the measurement condition values fluctuates so much that it cannot be compensated, the corresponding X-ray intensity is not included in the integration.
An X-ray measuring apparatus characterized by that. The fluctuation amount obtained based on the vibration amount detected by the vibration amount detection sensor is:
(1) A fluctuation amount of a distance between the vibration amount detection sensor and the measurement object,
(2) a fluctuation amount in a plane orthogonal to a line connecting the vibration amount detection sensor and the measurement object; and (3) at least a fluctuation amount of an inclination of the vibration amount detection sensor with respect to the measurement object. The X-ray measuring apparatus according to claim 1, wherein the number is one. The X-ray measurement apparatus according to claim 1 , wherein the vibration amount detection sensor is fixed to the housing. The process for correcting the measurement value obtained using the X-ray detection means is:
Controlling the position of the X-ray source,
Controlling the position of the X-ray detection means,
Processing the data obtained by the X-ray detection means by calculation with program software,
The X-ray measurement apparatus according to any one of claims 1 to 3 , wherein The X-ray detection means
The X-ray measurement apparatus according to any one of claims 1 to 4 , wherein the X-ray measurement apparatus is any one of a one-dimensional X-ray detector, a two-dimensional X-ray detector, and a pixel detector. The housing can be carried by a person, and the measurement is performed with the person holding the housing by hand and the X-ray emission opening of the housing facing the object to be measured. The X-ray measurement apparatus according to claim 5 .

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