JP5816773B2 - Coordinate measuring machine with removable accessories - Google Patents

Description

  The present disclosure relates to a coordinate measuring machine, and more particularly to a portable articulated arm coordinate measuring machine having a connector at the probe end of the coordinate measuring machine, which uses a structured light for non-contact 3D measurement. Enabling accessory devices to be removably connected to the coordinate measuring machine.

  A portable articulated arm coordinate measuring machine (AACMM) is used to manufacture or manufacture parts where there is a need to quickly and accurately confirm the dimensions of the parts during various stages of manufacture or production (eg, machining). Widely used in production. Portable AACMMs, among other things, are known stationary or fixed, costly and relatively easy to use, among the amount of time it takes to perform dimensional measurements on relatively complex parts. Great improvement compared to difficult measuring equipment. Typically, a portable AACMM user simply guides the probe along the surface of the part or object to be measured. The measurement data is then recorded and provided to the user. In some cases, the data is provided to the user in a visual form, such as a three-dimensional (3D) form on a computer screen. In other cases, the data is provided to the user in the form of numbers, for example, when measuring the diameter of a hole, the text “Diameter = 1.0034” is displayed on the computer screen.

  An example of a prior art portable articulated arm CMM is disclosed in US Pat. Patent Document 1 discloses a 3D measurement system including a manually operated joint arm CMM having a support base at one end and a measurement probe at the other end. U.S. Patent No. 6,053,075 to the same applicant discloses a similar articulated arm CMM. In U.S. Patent No. 6,057,051, the articulated arm CMM includes a plurality of features including an additional axis of rotation at the probe end, thereby providing either a 2-2-2 axis configuration or a 2-2-3 axis configuration. An arm is provided (the latter is a 7-axis arm).

  Also, three-dimensional surfaces can be measured using non-contact techniques. One type of non-contact device, sometimes referred to as a laser line probe or laser line scanner, emits laser light either on the spot or along the line. For example, an imaging device such as a charge coupled device (CCD) is positioned adjacent to the laser. A laser is arranged to emit a line of light, which is reflected off the surface. The surface of the object being measured causes diffuse reflection, which is captured by the imaging device. As the distance between the sensor and the surface changes, the image of the reflective line on the sensor will change. By knowing the relationship between the imaging sensor and the laser and the position of the laser image on the sensor, triangulation can be used to measure the three-dimensional coordinates of the point on the surface. One problem that occurs with laser line probes is that the density of measured points can vary depending on the speed at which the laser line probe is moved across the surface of the object. The faster the laser line probe is moved, the greater the distance between points and the lower the point density. With structured light scanners, the point spacing is typically uniform in each of the two dimensions, thereby generally providing a uniform measurement of points on the workpiece surface.

US Pat. No. 5,402,582 US Pat. No. 5,611,147

  Existing CMMs are suitable for their intended purpose, but what is needed is a portable AACMM having the specific features of embodiments of the present invention.

According to one embodiment of the present invention, a portable articulated arm coordinate measuring machine (AACMM) for measuring the three-dimensional coordinates of an object in space is provided. The AACMM includes a base portion. A manually positionable arm portion is provided, having opposing first and second ends, the arm portion being rotatably coupled to the base portion, wherein the arm portion comprises a plurality of arm portions. Connected arm segments, each arm segment including at least one position transducer for producing a position signal. Electronic circuitry is provided that receives position signals from at least one position transducer in each arm segment. The probe end is connected to the first end. The non-contact type three-dimensional measuring device is connected to the probe end, the non-contact type three-dimensional measuring device has a projector and an image sensor, the projector has a light source plane, and the projector has The structured light is structured to emit a structured light pattern encoded on the object, the structured light positioned on the light source plane and including at least three non-collinear pattern elements The image sensor is arranged to receive structured light reflected from the object and to be independently operable when disconnected from the probe end . The processor is electrically coupled to the electronic circuit, and the processor is responsive to receiving the position signal from the position transducer and in response to receiving the structured light by the image sensor. It is configured to determine the three-dimensional coordinates of the point above. The non-contact type three-dimensional measurement device includes a location device that measures the position of the non-contact type three-dimensional measurement device when it is separated from the probe end, and a position that the location device measures and a position that is separated from the probe end. Communication circuitry that communicates the structured light received by the image sensor to a processor or computing device.

According to one embodiment of the present invention, a method is provided for operating a portable articulated arm coordinate measuring machine for measuring the coordinates of an object in space. The method provides a manually positionable arm portion having opposing first and second ends, the method including a plurality of connected arm segments, each arm segment being positioned Including at least one position transducer for producing a signal. A probe end is provided for measuring the object, and the probe end is connected to the first end. The electronic circuit receives a position signal from the transducer. A three-dimensional non-contact measuring device is provided with a controller, the three-dimensional non-contact measuring device has a sensor and a projector, and the projector emits a structured light on the object The projector has a light source plane, and the structured light is positioned on the light source plane and includes at least three non-collinear pattern elements. The structured light is projected from the three-dimensional measuring device onto the object. Further, using a non-contact measuring device, receiving a reflection of the structured light from the object; determining a three-dimensional coordinate of a point on the object from the reflected structured light; and a probe end Separating the non-contact measuring device from the probe, operating the non-contact measuring device away from the probe end, and measuring the position of the non-contact measuring device operating away from the probe end. And receiving a structured light reflection from the object when operating away from the probe end and non-contact measurement from a non-contact measuring device operating away from the probe end. Transmitting the position of the device and the received structured light data.

  Referring now to the drawings, illustrative embodiments are shown, and the illustrative embodiments should not be construed as limiting with respect to the overall scope of the disclosure, and elements are similar in some figures. Are numbered.

1B is a perspective view of a portable articulated arm coordinate measuring machine (AACMM) having embodiments of various aspects of the present invention therein, including FIGS. 1A and 1B. FIG. 1B is a perspective view of a portable articulated arm coordinate measuring machine (AACMM) having embodiments of various aspects of the present invention therein, including FIGS. 1A and 1B. FIG. 2 is a block diagram of an electronic device utilized as part of the AACMM of FIG. 1, according to one embodiment, including FIGS. 2A-2D made together. FIG. 2 is a block diagram of an electronic device utilized as part of the AACMM of FIG. 1, according to one embodiment, including FIGS. 2A-2D made together. FIG. 2 is a block diagram of an electronic device utilized as part of the AACMM of FIG. 1, according to one embodiment, including FIGS. 2A-2D made together. FIG. 2 is a block diagram of an electronic device utilized as part of the AACMM of FIG. 1, according to one embodiment, including FIGS. 2A-2D made together. FIG. 2 is a block diagram of an electronic device utilized as part of the AACMM of FIG. 1, according to one embodiment, including FIGS. 2A-2D made together. FIG. FIG. 3 is a block diagram illustrating detailed features of the electronic data processing system of FIG. 2 according to one embodiment, including FIGS. 3A and 3B made together. FIG. 3 is a block diagram illustrating detailed features of the electronic data processing system of FIG. 2 according to one embodiment, including FIGS. 3A and 3B made together. FIG. 3 is a block diagram illustrating detailed features of the electronic data processing system of FIG. 2 according to one embodiment, including FIGS. 3A and 3B made together. FIG. 2 is an isometric view of the probe end of the AACMM of FIG. 1. FIG. 5 is a side view of the probe end portion of FIG. 4 with a handle coupled thereto. FIG. 5 is a side view of the probe end of FIG. 4 with the handle attached. FIG. 7 is an enlarged partial side view of the interface portion of the probe end of FIG. 6. FIG. 6 is another enlarged partial side view of the interface portion of the probe end of FIG. 5. FIG. 5 is an isometric view of the handle of FIG. 4 partially in section. 2 is an isometric view of the probe end of the AACMM of FIG. 1 with a structured light device to which a single camera is attached. FIG. FIG. 11 is an isometric view of the device of FIG. 10 partially in section. 2 is an isometric view of the probe end of the AACMM of FIG. 1 with another structured light device with a dual camera attached. FIG. 11 is a schematic diagram illustrating the operation of the device of FIG. 10 when attached to the probe end of the AACMM of FIG. 11 is a schematic diagram illustrating the operation of the device of FIG. 10 when attached to the probe end of the AACMM of FIG. FIG. 13 illustrates a sequential projection with an uncoded binary pattern that may be emitted by the structured light device of FIG. 10 or FIG. 12 according to one embodiment of the present invention. FIG. 13 illustrates a sequential projection with an uncoded binary pattern that may be emitted by the structured light device of FIG. 10 or FIG. 12 according to one embodiment of the present invention. FIG. 13 illustrates a sequential projection with an uncoded binary pattern that may be emitted by the structured light device of FIG. 10 or FIG. 12 according to one embodiment of the present invention. FIG. 13 illustrates a sequential projection with an uncoded binary pattern that may be emitted by the structured light device of FIG. 10 or FIG. 12 according to one embodiment of the present invention. FIG. 13 illustrates a sequential projection with an uncoded binary pattern that may be emitted by the structured light device of FIG. 10 or FIG. 12 according to one embodiment of the present invention. FIG. 13 illustrates a sequential projection with an uncoded binary pattern that may be emitted by the structured light device of FIG. 10 or FIG. 12 according to one embodiment of the present invention. FIG. 13 illustrates a sequential projection with an uncoded binary pattern that may be emitted by the structured light device of FIG. 10 or FIG. 12 according to one embodiment of the present invention. FIG. 13 illustrates a spatially varying color coded pattern that can be emitted by the structured light device of FIG. 10 or FIG. 12 according to one embodiment of the present invention. FIG. 13 illustrates a spatially varying color coded pattern that can be emitted by the structured light device of FIG. 10 or FIG. 12 according to one embodiment of the present invention. FIG. 13 illustrates a strip index encoded pattern that may be emitted by the structured light device of FIG. 10 or FIG. 12 according to one embodiment of the present invention. FIG. 13 illustrates a strip index encoded pattern that may be emitted by the structured light device of FIG. 10 or FIG. 12 according to one embodiment of the present invention. FIG. 13 illustrates a strip index encoded pattern that may be emitted by the structured light device of FIG. 10 or FIG. 12 according to one embodiment of the present invention. FIG. 13 illustrates a strip index encoded pattern that may be emitted by the structured light device of FIG. 10 or FIG. 12 according to one embodiment of the present invention. FIG. 13 illustrates a two-dimensional grid pattern that can be emitted by the structured light device of FIG. 10 or 12 according to one embodiment of the present invention. FIG. 13 illustrates a two-dimensional grid pattern that can be emitted by the structured light device of FIG. 10 or 12 according to one embodiment of the present invention. FIG. 13 illustrates a two-dimensional grid pattern that can be emitted by the structured light device of FIG. 10 or 12 according to one embodiment of the present invention. FIG. 13 illustrates a two-dimensional grid pattern that can be emitted by the structured light device of FIG. 10 or 12 according to one embodiment of the present invention. FIG. 13 illustrates a two-dimensional grid pattern that can be emitted by the structured light device of FIG. 10 or 12 according to one embodiment of the present invention. FIG. 13 illustrates a two-dimensional grid pattern that can be emitted by the structured light device of FIG. 10 or 12 according to one embodiment of the present invention. FIG. 13 illustrates a two-dimensional grid pattern that can be emitted by the structured light device of FIG. 10 or 12 according to one embodiment of the present invention. FIG. 13 illustrates a two-dimensional grid pattern that can be emitted by the structured light device of FIG. 10 or 12 according to one embodiment of the present invention. FIG. 13 illustrates a two-dimensional grid pattern that can be emitted by the structured light device of FIG. 10 or 12 according to one embodiment of the present invention. FIG. 13 illustrates a two-dimensional grid pattern that can be emitted by the structured light device of FIG. 10 or 12 according to one embodiment of the present invention. FIG. 13 illustrates a two-dimensional grid pattern that can be emitted by the structured light device of FIG. 10 or 12 according to one embodiment of the present invention. FIG. 13 illustrates a two-dimensional grid pattern that can be emitted by the structured light device of FIG. 10 or 12 according to one embodiment of the present invention. FIG. 13 illustrates a two-dimensional grid pattern that can be emitted by the structured light device of FIG. 10 or 12 according to one embodiment of the present invention. FIG. 13 illustrates a two-dimensional grid pattern that can be emitted by the structured light device of FIG. 10 or 12 according to one embodiment of the present invention. It is a schematic explanatory drawing of the photometry technique for acquiring the pattern of the structured light under a several illumination condition. FIG. 6 is an illustration of a structured light scanner device operable independently of an AACMM according to another embodiment of the invention.

  Portable articulated arm coordinate measuring machines (“AACMM”) are used in a variety of applications to obtain measurements of objects. Embodiments of the present invention allow an operator to easily and quickly connect an accessory device to the probe end of an AACMM that uses a structured light to provide non-contact measurement of a three-dimensional object. Provides advantages in terms of Embodiments of the present invention provide further advantages in providing communication data representing a point cloud measured by a structured light device in an AACMM. Embodiments of the present invention provide advantages in terms of better uniformity of the distribution of measured points, which can provide improved accuracy. Embodiments of the present invention provide an additional advantage in providing power and data communication to removable accessories without having external connections or wiring.

  As used herein, the term “structured light” refers to a two-dimensional pattern of light projected onto a continuous and enclosed area of an object, which is Communicates information that can be used to determine the coordinates of a point on an object. The structured light pattern will contain at least three non-collinear pattern elements disposed in adjacent and enclosed regions. Each of the three non-collinear pattern elements conveys information that can be used to determine point coordinates.

  In general, there are two types of structured lights: coded light patterns and uncoded light patterns. As used herein, a coded light pattern is one in which the three-dimensional coordinates of the illuminated surface of the object can be confirmed by acquisition of a single image. In some cases, the projection device may be moving relative to the object. In other words, for a coded light pattern, there will be a temporal relationship with no significant difference between the projected pattern and the acquired image. Typically, a coded light pattern will contain a set of elements (eg, geometric shapes) that are arranged such that at least three of the elements are not collinear. In some cases, a set of elements can be placed into a collection of lines. Having at least three of the elements not collinear ensures that the pattern is not a simple line pattern, such as would be projected by a laser line scanner, for example. As a result, the pattern elements can be recognized due to the arrangement of the elements.

  In contrast, an uncoded structured light pattern as used herein does not allow measurement with a single pattern when the projector is moving relative to the object. It is a pattern. An example of an uncoded light pattern is one that requires a series of sequential patterns, and thus one that requires acquisition of a series of sequential images. Due to the temporal nature of the projection pattern and image acquisition, there should be no relative movement between the projector and the object.

  It should be appreciated that structured light is different from light projected by a laser line probe or laser line scanner type device that generates a line of light. As long as the laser line probes used with today's articulated arms have irregularities or other aspects that can be considered as features in the generation line, these features are arranged in a collinear arrangement. The Consequently, such features in a single generation line are not considered to make the projected light a structured light.

  1A and 1B illustrate AACMM 100 in perspective, according to various embodiments of the present invention, where the articulated arm is one type of coordinate measuring machine. As shown in FIGS. 1A and 1B, the exemplary AACMM 100 can include a 6-axis or 7-axis articulation device having a probe end 401, the probe end 401 being It includes a measurement probe housing 102 that is connected at its end to the arm portion 104 of the AACMM 100. The arm portion 104 includes a first arm segment 106 that is coupled to a second arm segment 108 by a first group of bearing cartridges 110 (eg, two bearing cartridges). . A second group of bearing cartridges 112 (eg, two bearing cartridges) couples the second arm segment 108 to the measurement probe housing 102. A third group of bearing cartridges 114 (eg, three bearing cartridges) connects the first arm segment 106 to the base portion 116, which is at the other end of the arm portion 104 of the AACMM 100. It is positioned. Each group of bearing cartridges 110, 112, 114 provides multiple axes of articulation. The probe end 401 can also include a measurement probe housing 102 that includes the shaft of the seventh axial portion of the AACMM 100 (eg, the cartridge is a seventh axial measurement device of the AACMM 100 (eg, a probe 118) including an encoder system for determining the movement). In this embodiment, the probe end 401 is rotatable about an axis that extends through the center of the measurement probe housing 102. When using AACMM 100, base portion 116 is typically mounted on a workbench.

  Each bearing cartridge in each bearing cartridge group 110, 112, 114 typically contains an encoder system (eg, an optical angle encoder system). The encoder system (ie, transducer) provides an indication of the position of each arm segment 106, 108 and corresponding bearing cartridge group 110, 112, 114, which together, probe 118 relative to base portion 116. (And thus the position of the object being measured by the AACMM 100 in a particular reference system (eg, local reference system or global reference system)). The arm segments 106, 108 can be made from a suitable rigid material, such as, but not limited to, a carbon composite material. The portable AACMM 100 with 6-axis or 7-axis articulation (ie, degrees of freedom) provides an arm portion 104 that can be easily handled by the operator, while the operator has a 360 ° region around the base 116. An advantage is provided in that it allows the probe 118 to be positioned at a desired location within. However, it will be appreciated that the illustration of arm portion 104 having two arm segments 106, 108 is for illustrative purposes and the claimed invention should not be so limited. It should be. The AACMM 100 can have any number of arm segments (and thus more or less articulations or degrees of freedom than 6 or 7 axes) connected together by a bearing cartridge.

  The probe 118 is detachably attached to the measurement probe housing 102, and the measurement probe housing 102 is connected to the bearing cartridge group 112. The handle 126 is detachable from the measurement probe housing 102 by, for example, a quick connect interface. As will be discussed in more detail below, handle 126 replaces another device that is configured to emit a structured light to provide non-contact measurement of a three-dimensional object. It is possible to provide an advantage in that it allows the operator to perform both contact and non-contact measurements using the same AACMM 100. In the exemplary embodiment, probe housing 102 contains a removable probe 118, which is a contact measurement device and is in physical contact with the object to be measured. Can have different tips 118 (including but not limited to ball type probes, touch sensor type probes, curved type probes, and extension type probes). In other embodiments, the measurement is performed by a non-contact device such as, for example, a coded structured light scanner device. In one embodiment, the handle 126 is replaced with a coded structured light scanner device using a quick connect interface. Other types of measurement devices can replace the removable handle 126 and provide additional functionality. Examples of such measurement devices include, but are not limited to, one or more illumination lights, temperature sensors, thermal scanners, barcode scanners, projectors, paint sprayers, cameras, and the like.

  As shown in FIGS. 1A and 1B, the AACMM 100 includes a removable handle 126 that can be attached or functionalized without removing the measurement probe housing 102 from the bearing cartridge group 112. Offers an advantage in that it is changed. As discussed in more detail below with respect to FIG. 2D, the removable handle 126 can also include an electrical connector, which includes the handle 126 positioned at the probe end 401 and the corresponding electronics. Allows power and data to be exchanged with the device.

  In various embodiments, each group of bearing cartridges 110, 112, 114 allows the arm portion 104 of the AACMM 100 to move about multiple axes of rotation. As stated, each bearing cartridge group 110, 112, 114 includes a corresponding encoder system, such as an optical angle encoder, for example, which corresponds to the arm segments 106, 108, for example. They are arranged coaxially with the rotation axis. The optical encoder system detects, for example, rotational (pivoting) or lateral (hinge) movement of each one of the arm segments 106, 108 about a corresponding axis, and will be described in more detail herein below. Signals are sent to the electronic data processing system in the AACMM 100 as described. Each individual unprocessed encoder count is sent separately to the electronic data processing system as a signal, where the count is further processed into measurement data. There is no need for a position calculator (eg, a serial box) separate from the AACMM 100 itself, as disclosed in commonly assigned US Pat.

  Base portion 116 may include an attachment device or attachment device 120. The mounting device 120 allows the AACMM 100 to be removably mounted at a desired location, such as an examination table, machining center, wall, or floor. In one embodiment, the base portion 116 includes a handle portion 122 that provides a convenient location for an operator to hold the base portion 116 when the AACMM 100 is being moved. In one embodiment, the base portion 116 further includes a movable cover portion 124 that is folded to reveal a user interface, such as a display screen.

  According to one embodiment, the base portion 116 of the portable AACMM 100 contains or houses an electronic circuit having an electronic data processing system, the electronic data processing system being in two main components: the AACMM 100. A base processing system that processes data from various encoder systems and data representing other arm parameters to support three-dimensional (3D) position calculations, and a relatively complete measurement function on an external computer A user interface processing system including an on-board operating system, a touch screen display, and resident application software that can be implemented in the AACMM 100 without the need for a connection to the PC.

  The electronic data processing system in the base portion 116 may be attached to an encoder system, sensors, and other peripheral hardware (eg, a removable handle 126 on the AACMM 100) that is positioned away from the base portion 116. Possible structured light devices). The electronics that support these peripheral hardware devices or features can be located in each of the bearing cartridge groups 110, 112, 114 located in the portable AACMM 100.

  FIG. 2 is a block diagram of electronic equipment utilized in AACMM 100, according to one embodiment. The embodiment shown in FIG. 2A includes an electronic data processing system 210 that includes a base processor board 204, a user interface board 202, and power for implementing the base processing system. A base power supply board 206, a Bluetooth module 232, and a base inclined board 208 are provided. The user interface board 202 includes a computer processor for executing application software to implement the user interface, display, and other functions described herein.

  As shown in FIGS. 2A and 2B, the electronic data processing system 210 is in communication with the multiple encoder systems described above via one or more arm buses 218. In the embodiment shown in FIGS. 2B and 2C, each encoder system generates encoder data, an encoder arm bus interface 214, an encoder digital signal processor (DSP) 216, an encoder readhead interface 234, Temperature sensor 212. Other devices, such as strain sensors, can be attached to the arm bus 218.

  Also shown in FIG. 2D is probe end electronics 230 in communication with armbus 218. The probe end electronics 230 includes a handle / device interface bus 240 that connects to the probe end DSP 228, the temperature sensor 212, and in one embodiment the handle 126 or the coded structured light scanner device 242 via a quick connect interface. And a probe interface 226. The quick connect interface allows access by the handle 126 to the data bus, control lines, and power bus used by the coded structured light scanner device 242 and other accessories. In one embodiment, the probe end electronics 230 is positioned in the measurement probe housing 102 above the AACMM 100. In one embodiment, the handle 126 can be removed from the quick connect interface and the measurement can be performed by a structured light device 242 that communicates with the probe end electronics 230 of the AACMM 100 via the interface bus 240. It is. In one embodiment, the electronic data processing system 210 is positioned in the base portion 116 of the AACMM 100, the probe end electronics 230 is positioned in the measurement probe housing 102 of the AACMM 100, and the encoder system is , Positioned in the bearing cartridge group 110, 112, 114. The probe interface 226 is based on Maxim Integrated Products, Inc., which implements the 1-wire® communication protocol 236. Can be connected to the probe end DSP 228 by any suitable communication protocol, including products commercially available from.

  FIG. 3 is a block diagram illustrating detailed features of 210 of the electronic data processing system of AACMM 100, according to one embodiment. In one embodiment, the electronic data processing system 210 is located in the base portion 116 of the AACMM 100, and includes a base portion processor board 204, a user interface board 202, a base part power board 206, a Bluetooth module 232, A base tilt module 208.

  In one embodiment shown in FIG. 3A, the base processor board 204 includes the various functional blocks shown in the figure. For example, the base processor function 302 is utilized to support the collection of measurement data from the AACMM 100 and is not processed through the arm bus 218 and bus control module function 308 (eg, encoder system data). Receive. The memory function 304 stores a program and static arm configuration data. The base processor board 204 also includes an external hardware option port function 310 for communicating with any external hardware device or accessory, such as a coded structured light scanner device 242. Also included in the functionality of the embodiment of the base processor board 204 shown in FIG. 3A is a real-time clock (RTC) and log 306, a battery pack interface (IF) 316, and a diagnostic port 318. .

  The base processor board 204 also manages all wired and wireless data communications with external (host computer) and internal (display processor 202) devices. Base processor board 204 communicates with the Ethernet network via Ethernet function 320 (eg, using a clock synchronization standard such as the Institute of Electrical and Electronics Engineers (IEEE) 1588) and wireless local via LAN function 322. It has the ability to communicate with a regional network (WLAN) and communicate with a Bluetooth module 232 via a parallel serial communication (PSC) function 314. The base processor board 204 also includes a connection to a universal serial bus (USB) device 312.

  The base processor board 204 is used to process unprocessed measurement data (e.g., an encoder) in order to process the measurement data without requiring any pre-processing as disclosed in the serial box of Patent Document 1 described above. Send and collect system counts, temperature readings). Base processor 204 sends the processed data to display processor 328 on user interface board 202 via RS485 interface (IF) 326. In one embodiment, the base processor 204 sends unprocessed measurement data to an external computer.

  Turning now to the user interface board 202 of FIG. 3B, the angle and position data received by the base processor is executed on the display processor 328 to provide an autonomous measurement system within the AACMM 100. Used by applications that Applications run on display processor 328, including but not limited to feature measurement, guidance and training graphics, remote diagnostics, temperature correction, control of various operating features, connection to various networks, and It is possible to support functions such as the display of measured objects. Along with a display processor 328 and a liquid crystal display (LCD) 338 (eg, touch screen LCD) user interface, the user interface board 202 includes a secure digital (SD) card interface 330, a memory 332, a USB host interface 334, and a diagnostic port 336. And several interface options including a camera port 340, an audio / video interface 342, a dial-up / cell modem 344, and a global positioning system (GPS) port 346.

  The electronic data processing system 210 shown in FIG. 3A also includes a base power supply board 206 that includes an environment recorder 362 for recording environmental data. The base power supply board 206 also provides power to the electronic data processing system 210 using an AC / DC converter 358 and a battery charger control 360. The base power supply board 206 communicates with the base processor board 204 using an inter-integrated circuit (I2C) serial single-ended bus 354 and via a DMA serial peripheral interface (DSPI) 357. To do. The base power supply board 206 is connected to a tilt sensor and radio frequency identification (RFID) module 208 via an input / output (I / O) extension 364 implemented in the base power supply board 206.

  Although shown as separate components, in other embodiments, all or some of the components are physically located at different locations and / or the locations shown in FIGS. 3A and 3B. Functions can be combined in different ways. For example, in one embodiment, base processor board 204 and user interface board 202 are combined into one physical board.

  Referring now to FIGS. 4-9, an exemplary embodiment of the probe end 401 is illustrated, which is a quick connect that allows a removable and replaceable device 400 to be coupled to the AACMM 100. It has a measurement probe housing 102 with mechanical and electrical interfaces. In the exemplary embodiment, device 400 includes an enclosure 402 that includes a handle portion 404 that can be grasped by an operator's hand, for example, in a pistol grip. Sized and shaped. The enclosure 402 is a thin wall structure having a cavity 406 (FIG. 9). Cavity 406 is sized and configured to accept controller 408. The controller 408 can be a digital circuit having a microprocessor, for example, or an analog circuit. In one embodiment, the controller 408 is in asynchronous two-way communication with the electronic data processing system 210 (FIGS. 2 and 3). The communication connection between the controller 408 and the electronic data processing system 210 can be wired (eg, via the controller 420) or can be a direct or indirect wireless connection (eg, Bluetooth ( Registered trademark) or IEEE 802.11), or a combination of wired and wireless connections. In the exemplary embodiment, enclosure 402 is formed of two halves 410, 412 from, for example, an injection molded plastic material. The halves 410 and 412 can be fixed together by a fastener such as a screw 414, for example. In other embodiments, the enclosure halves 410, 412 can be secured together, for example, by adhesive or ultrasonic welding.

  The handle portion 404 also includes buttons or actuators 416, 418 that can be manually actuated by an operator. Actuators 416, 418 are coupled to controller 408, which transmits signals to controller 420 in probe housing 102. In the exemplary embodiment, actuators 416, 418 perform the function of actuators 422, 424 that are positioned on the opposite side of device 400 on probe housing 102. It should be appreciated that the device 400 can have additional switches, buttons, or other actuators that can be used to control the device 400, AACMM 100, and vice versa. It is. The device 400 may also include an indicator such as a light emitting diode (LED), a sound source, a meter, a display, or an instrument. In one embodiment, the device 400 can include a digital voice recorder that allows verbal comments to remain at the same time as the point being measured. In yet another embodiment, the device 400 includes a microphone that allows the operator to send a voice activation command to the electronic data processing system 210.

  In one embodiment, the handle portion 404 can be configured to be used with both hands of the operator or for a specific hand (eg, left or right handed). The handle portion 404 can also be configured to assist a disabled operator (eg, an operator with a finger missing or an operator with a prosthetic limb). In addition, when spatial clearance is limited, the handle portion 404 can be removed and the probe housing 102 can be used alone. Also, as discussed above, the probe end 401 can include the shaft of the seventh axis of the AACMM 100. In this embodiment, the device 400 can be arranged to rotate about the seventh axis of the AACMM.

  The probe end 401 includes a mechanical and electrical interface 426 having a first connector 429 (FIG. 8) on the device 400 that cooperates with a second connector 428 on the probe housing 102. Connectors 428, 429 can include electrical and mechanical features that allow connection of device 400 to probe housing 102. In one embodiment, interface 426 includes a first surface 430 that has a mechanical coupler 432 and an electrical connector 434 thereon. Enclosure 402 also includes a second surface 436 that is positioned adjacent to and offset from first surface 430. In the exemplary embodiment, second surface 436 is a planar surface that is offset from first surface 430 by a distance of approximately 0.5 inches. This offset provides clearance for the operator's fingers when fastening or loosening fasteners such as collar 438 or the like. Interface 426 provides a relatively quick and stable electronic connection between device 400 and probe housing 102 without the need to align connector pins and without the need for separate cables or connectors. I will provide a.

  The electrical connector 434 extends from the first surface 430 and includes one or more connector pins 440, which may be connected to the electronic data processing system 210 (e.g., via one or more arm buses 218). 2 and 3) are electrically coupled for asynchronous two-way communication. The bi-directional communication connection can be wired (eg, via armbus 218), wireless (eg, Bluetooth® or IEEE 802.11), or a combination of wired and wireless connections. In one embodiment, electrical connector 434 is electrically coupled to controller 420. The controller 420 is capable of asynchronous two-way communication with the electronic data processing system 210, such as via one or more arm buses 218, for example. Electrical connector 434 is positioned to provide a relatively quick and stable electronic connection with electrical connector 442 on probe housing 102. Electrical connectors 434, 442 connect to each other when device 400 is attached to probe housing 102. The electrical connectors 434, 442 may each include a metal-covered connector housing that shields from electromagnetic interference as well as connector pins during the process of attaching the device 400 to the probe housing 102. Protection and pin alignment assistance.

  The mechanical coupler 432 provides a relatively strong mechanical connection between the device 400 and the probe housing 102 so that the location of the device 400 on the end of the arm portion 104 of the AACMM 100 does not shift or move. Supporting relatively accurate applications, which is preferred. Any such movement typically can cause an undesirable reduction in the accuracy of the measurement results. These desired results are achieved using various structural features of the mechanical attachment components of the quick connect mechanical and electronic interfaces of embodiments of the present invention.

  In one embodiment, the mechanical coupler 432 includes a first protrusion 444 positioned at one end 448 (the leading edge or “frontmost” portion of the device 400). The first protrusion 444 can include a keyed, notched or beveled interface, which includes a lip extending from the first protrusion 444. 446 is formed. The lip 446 is sized to be received within a slot 450 defined by a protrusion 452 extending from the probe housing 102 (FIG. 8). The first protrusion 444 and the slot 450 form a coupler arrangement with the collar 438 and the device 400 when the slot 450 is attached to the probe housing 102 when the lip 446 is positioned within the slot 450. It should be appreciated that it can be used to limit both longitudinal and lateral movement of the. The rotation of the collar 438 can be used to secure the lip 446 within the slot 450, as will be discussed in more detail below.

  On the opposite side of the first protrusion 444, the mechanical coupler 432 can include a second protrusion 454. The second protrusion 454 can have a keyed, notched lip, or a beveled interface surface 456 (FIG. 5). The second protrusion 454 is positioned to engage a fastener associated with the probe housing 102, such as a collar 438, for example. As will be discussed in more detail below, the mechanical coupler 432 includes a raised surface that protrudes from the surface 430, which is adjacent to or around the electrical connector 434. It provides a pivot point for the interface 426 (FIGS. 7 and 8). This serves as a third of the three mechanical contacts between the device 400 and the probe housing 102 when the device 400 is attached to the probe housing 102.

  The probe housing 102 includes a collar 438 that is coaxially disposed at one end. The collar 438 includes a movable threaded portion that can move between a first position (FIG. 5) and a second position (FIG. 7). By rotating the collar 438, the collar 438 can be used to secure or remove the device 400 without the need for external tools. The rotation of the collar 438 moves the collar 438 along a relatively spaced angular threaded cylinder 474. The use of such relatively large size square screws and contour surfaces allows for very large clamping forces with minimal rotational torque. In addition, the wide pitch of the cylinder 474 threads allows the collar 438 to be tightened or loosened with minimal rotation.

  To connect the device 400 to the probe housing 102, the lip 446 is inserted into the slot 450 and the device moves the second protrusion 454 toward the surface 458, as indicated by the arrow 464. It is pivoted to rotate (FIG. 5). Collar 438 is rotated causing collar 438 to move or translate in the direction indicated by arrow 462 and engage surface 456. Movement of the collar 438 relative to the angled surface 456 drives the mechanical coupler 432 relative to the raised surface 460. This helps to overcome problems that may occur with interface deformations or foreign objects on the surface of the interface that may prevent firm seating of the device 400 on the probe housing 102. Applying force to the second protrusion 454 by the collar 438 moves the mechanical coupler 432 forward and pushes the lip 446 into the seat portion of the probe housing 102. As the collar 438 continues to tighten, the second protrusion 454 is pushed upward toward the probe housing 102 to apply pressure to the pivot point. This provides a seesaw-type arrangement and applies pressure to the second protrusion 454, lip 446, and central pivot point to reduce or eliminate device 400 offset or sway. The pivot point pushes directly on the bottom of the probe housing 102, while the lip 446 applies a downward force to the end of the probe housing 102. FIG. 5 includes arrows 462, 464, indicating the direction of movement of the device 400 and collar 438. FIG. 7 includes arrows 466, 468, 470 and shows the direction of pressure applied in the interface 426 when the collar 438 is tightened. It should be appreciated that the offset distance of the surface 436 of the device 400 provides a gap 472 between the collar 438 and the surface 436 (FIG. 6). The gap 472 allows the operator to hold the collar 438 more securely while reducing the risk of pinching fingers as the collar 438 is rotated. In one embodiment, the probe housing 102 is sufficiently rigid to reduce or prevent deformation when the collar 438 is tightened.

  Embodiments of the interface 426 allow for proper alignment of the mechanical coupler 432 and electrical connector 434 and also protect the electronics interface from applied stress, otherwise the stress is applied to the collar 438, lip 446, and possibly due to the clamping action of surface 456. This provides an advantage in that it reduces or eliminates stress damage to the electrical connectors 434, 442 (which can have soldered terminals) mounted on the circuit board 476. Embodiments also provide an advantage over known approaches in that a tool is not required for a user to connect or disconnect device 400 to probe housing 102 from probe housing 102. This allows the operator to manually connect and disconnect the device 400 from the probe housing 102 relatively easily.

  Due to the relatively large number of shielded electrical connections possible by the interface 426, a relatively large number of functions can be shared between the AACMM 100 and the device 400. For example, a switch, button, or other actuator positioned on the AACMM 100 can be used to control the device 400, or vice versa. Further, commands and data can be transmitted from the electronic data processing system 210 to the device 400. In one embodiment, device 400 transmits recorded image data that will be stored in memory on base processor 204 or displayed on display 328. It is a video camera. In another embodiment, device 400 is an image projector that receives data from electronic data processing system 210. In addition, a temperature sensor located in either AACMM 100 or device 400 can be shared by the other. It will be appreciated that embodiments of the present invention provide an advantage in that it provides a flexible interface that allows a wide variety of accessory devices 400 to be quickly, easily and reliably coupled to AACMM 100. It should be. Further, the ability to share functionality between AACMM 100 and device 400 may allow reducing the size, power consumption, and complexity of AACMM 100 by eliminating duplication.

  In one embodiment, the controller 408 can change the operation or functionality of the probe end 401 of the AACMM 100. For example, the controller 408 emits light of different colors, light of different intensity, or is illuminated when the device 400 is attached and when the probe housing 102 is used alone. It is possible to change the indicator light on the probe housing 102 to either / off. In one embodiment, device 400 includes a distance measurement sensor (not shown) that measures the distance to the object. In this embodiment, the controller 408 can change the indicator light on the probe housing 102 to provide an operator with an indication of how far the object is from the probe tip 118. In another embodiment, the controller 408 can change the color of the indicator light based on the quality of the image acquired by the coded structured light scanner device. This provides an advantage in that it simplifies the requirements of the controller 420 and allows for functionality upgrades or improvements with the addition of accessory devices.

  With reference to FIGS. 10-13, embodiments of the present invention provide advantages for projectors, cameras, signal processing, control, and indicator interfaces with respect to the non-contact 3D measurement device 500. Device 500 includes a pair of optical devices (eg, light projector 508 and camera 510, etc.) that project a structured light pattern and receive a two-dimensional pattern reflected from object 501. The device 500 uses a triangulation-based method based on the known emitted pattern and the acquired image to represent the X, Y, Z coordinate data of the object 501 for each pixel of the received image. Determine the point cloud. In one embodiment, the structured light pattern is coded such that a single image is sufficient to determine the three-dimensional coordinates of the object point. It can also be said that such a coded structured light pattern measures three-dimensional coordinates in a single shot.

  In the exemplary embodiment, projector 508 uses a visible light source that illuminates the pattern generator. The visible light source can be a laser, a high intensity light emitting diode, an incandescent lamp, a light emitting diode (LED), or other light emitting device. In an exemplary embodiment, the pattern generator is a chrome-on-glass slide having a structured light pattern etched onto it. The slide can have a single pattern or multiple patterns that move in and out of the required position. The slide can be mounted in the operating position manually or automatically. In other embodiments, the light source pattern is a digital micromirror device (DMD) such as a digital light projector (DLP) manufactured by Texas Instruments Corporation, a liquid crystal device (LCD), a liquid crystal-on-silicon (LCOS). It can be light that is reflected or transmitted by the device or a similar device that is used in transmission mode rather than reflection mode. The projector 508 can further include a lens system 515 that causes the outgoing light to change to have a desired focus characteristic.

  Device 500 further includes an enclosure 502 with a handle portion 504. In one embodiment, the device 500 can further include an interface 426 at one end, which can interface the device 500 to the probe housing 102, as described herein above. And electrically connect. In other embodiments, the device 500 can be integrated into the probe housing 102. Interface 426 provides an advantage in that device 500 can be quickly and easily coupled to and removed from AACMM 100 without the need for additional tools.

  The camera 510 includes a photosensitive sensor that generates a digital image / display of an area in the field of view of the sensor. The sensor can be, for example, a charge coupled device (CCD) type sensor or a complementary metal oxide semiconductor (CMOS) type sensor having an array of pixels. The camera 510 can further include other components such as, but not limited to, a lens 503 and other optical devices, for example. In the exemplary embodiment, projector 508 and camera 510 are positioned at a predetermined angle so that the sensor can receive light reflected from the surface of object 501. In one embodiment, projector 508 and camera 510 are positioned such that device 500 can be operated with probe tip 118 in place. Further, it should be appreciated that the device 500 is substantially fixed with respect to the probe tip 118 and that forces on the handle portion 504 cannot affect the alignment of the device 500 with respect to the probe tip 118. is there. In one embodiment, the device 500 can have additional actuators (not shown) that allow the operator to switch between acquiring data from the device 500 and from the probe tip 118. It is.

  The projector 508 and the camera 510 are electrically connected to a controller 512 disposed in the enclosure 502. The controller 512 can include one or more microprocessors, digital signal processors, memory, and signal conditioning circuitry. Due to the digital signal processing and large amount of data generated by the device 500, the controller 512 can be placed in the handle portion 504. The controller 512 is electrically connected to the arm bus 218 via the electrical connector 434. The device 500 can further include actuators 514, 516, which can be manually actuated by an operator to initiate operation and data collection by the device 500. In one embodiment, image processing to determine X, Y, Z coordinate data of the point cloud representing the object 501 is performed by the controller 512, and the coordinate data is sent to the electronic data processing system 210 via the bus 240. Sent. In another embodiment, the image is transmitted to the electronic data processing system 210 and the coordinate calculation is performed by the electronic data processing system 210.

  In one embodiment, the controller 512 is configured to communicate with the electronic data processing system 210 and receive a structured light pattern image from the electronic data processing system 210. In yet another embodiment, the pattern emitted on the object can be changed by the electronic data processing system 210 either automatically or in response to input from an operator. This allows for the use of patterns that are easier to decode when conditions are justified, and for more complex patterns where it is desired to achieve the desired level of accuracy or resolution. By enabling use, an advantage can be provided in that it provides a higher accuracy measurement with less processing time.

  In other embodiments of the present invention, device 520 (FIG. 12) includes a pair of cameras 510. The camera 510 is disposed at a predetermined angle with respect to the projector 508, and receives the light reflected from the object 501. The use of multiple cameras 510 can provide advantages in some applications by providing overlapping images and improving measurement accuracy. In yet other embodiments, the overlapping images allow a sequential pattern to be acquired quickly by the device 500 by increasing the acquisition speed of the images by operating the cameras 510 alternately.

  Here, the operation of the structured light device 500 will be described with reference to FIGS. 13A and 13B. The device 500 first emits a structured light pattern 522 onto the surface 524 of the object 501 by the projector 508. The structured light pattern 522 may include a pattern disclosed in an academic paper “DLP-Based Structured Light 3D Imaging Technologies and Applications” published in SPIE bulletin 7932 by Jason Geng. The structured light pattern 522 may further include one of the patterns shown in FIGS. 14 to 32, but is not limited thereto. Light 509 from the projector 508 is reflected from the surface 524, and the reflected light 511 is received by the camera 510. It should be appreciated that changes in the surface 524, such as protrusions 526, for example, cause deformations in the structured pattern when the image of the pattern is captured by the camera 510. Since the pattern is formed by structured light, in some cases, the controller 512 or electronic data processing system 210 may have pixels in the emitted pattern (eg, pixel 513, etc.) and in the pattern being imaged. It is possible to determine a one-to-one correspondence with other pixels (eg, pixel 515, etc.). This allows the triangulation principle to be used to determine the coordinates of each pixel in the pattern to be imaged. The collection of the three-dimensional coordinates of the surface 524 may be referred to as a point cloud. By moving the device 500 over the surface 524, a point cloud of the entire object 501 can be generated. In some embodiments, the position and orientation of the device 500 is known by the electronic data processing system 210 so that the location of the object 501 relative to the AACMM 100 can be ascertained. It should be appreciated that 500 connections provide benefits.

To determine the pixel coordinates, the angle of each projected ray 509 that intersects the object 522 at point 527 is known to correspond to the projected angle phi (Φ), and Φ information is emitted. It is coded into the pattern. In one embodiment, the system is configured to allow a Φ value corresponding to each pixel in the pattern to be imaged to be ascertained. Further, since the baseline distance “D” between the projector 508 and the camera is known, the angle omega (Ω) for each pixel in the camera is known. Thus, the distance “Z” from the camera 510 to where the pixel is imaged uses the following equation:
Thus, three-dimensional coordinates can be calculated for each pixel in the acquired image.

  In general, there are two categories of structured lights: coded structured lights and uncoded structured lights. A common form of uncoded structured light, such as that shown in FIGS. 14-17 and 28-30, is a striped pattern that varies in a periodic fashion along one dimension. Depends on the pattern. These types of patterns are usually applied in a predetermined sequence and provide an approximate distance to the object. Some uncoded pattern embodiments (eg, sinusoidal patterns, etc.) can provide relatively highly accurate measurements. However, in order to make these types of patterns effective, it is usually necessary that the scanner device and the object be held stationary relative to each other. If the scanner device or object is moving (relative to the other), a coded pattern such as that shown in FIGS. 18-27 may be preferred. The encoded pattern allows the image to be analyzed using a single acquired image. Some coded patterns are placed in a specific orientation on the projector pattern (eg, perpendicular to the epipolar line above the projector plane), so that tertiary based on a single image It is possible to simplify the analysis of the original surface coordinates.

  The epipolar line is a mathematical line formed by the intersection between the epipolar plane of FIG. 13B and the light source plane 517 or the image plane 521 (the plane of the camera sensor). The epipolar plane can be any plane that passes through the projector perspective center 519 and the camera perspective center. Epipolar lines on the light source plane 517 and the image plane 521 may be parallel in some cases, but are generally not parallel. An aspect of the epipolar line is that an epipolar line provided on the projector plane 517 has a corresponding epipolar line on the image plane 521. Thus, any particular pattern known on the epipolar line in the projector plane 517 can be immediately observed and evaluated in the image plane 521. For example, if the coded pattern is placed along an epipolar line in the projector plane 517, the spacing between the coded elements in the image plane 521 is the pixel of the camera sensor 510. It can be determined using the value read from. This information can be used to determine the three-dimensional coordinates of the point 527 on the object 501. Furthermore, it is possible to incline the coded pattern at a known angle with respect to the epipolar line and efficiently extract the object surface coordinates. Examples of encoded patterns are shown in FIGS.

  In embodiments having a periodic pattern such as a sinusoidally repeating pattern, the period of the sine wave represents a plurality of pattern elements. Because there is a periodic pattern diversity in two dimensions, the pattern elements are not collinear. In some cases, a striped pattern with stripes of varying width can represent a coded pattern.

  Referring now to FIGS. 14-17, an embodiment of an uncoded structured light pattern is shown. Some of the patterns use simple on-off (or 1, 0) type patterns and are referred to as binary patterns. In some cases, the binary pattern is what is known as having a specific sequence referred to as a Gray code sequence. The term Gray code used in the field of structured light based 3D metrology is the field of electrical engineering (in the field of electrical engineering, the term Gray code is a single bit at a time. Is somewhat different from the terminology used in (which generally means change). This application follows the use of the terminology of gray codes as is customary in the field of three-dimensional metrology (in the field of three-dimensional metrology, a gray code typically represents a sequence of binary black and white values). FIG. 14A shows an example of a binary pattern including a plurality of sequential images 530, 532, 534, each having a different striped pattern thereon. Typically, the stripes alternate between bright (irradiated) striped areas and dark (unirradiated) striped areas. The terms white and black may be used to mean illuminated and not illuminated, respectively. Thus, when the images 530, 532, 534 are sequentially projected onto the surface 524 as shown in FIG. 14B, it shows the composite image 536. It should be noted that the two patterns 535, 537 at the bottom of FIG. 14B are not shown in FIG. 14A for clarity. For each point on the object 501 (represented by camera pixels in the image), the composite pattern 536 is a unique binary value obtained through sequential projection of the patterns 530, 532, 534, 535, 537. Which corresponds to a relatively small range of possible projection angles Φ. By using these projection angles together with a known pixel angle Ω and a known baseline distance D for a given pixel, equation (1) finds the distance Z from the camera to the object point. Can be used. Two-dimensional angles are known for each camera pixel. A two-dimensional angle generally corresponds to a one-dimensional angle omega, which is used in the calculation of the distance Z according to equation (1). However, a line drawn from each camera pixel through the camera perspective center and intersecting the object at a given point defines a two-dimensional angle in space. When combined with the calculated value Z, the two pixel angles provide three-dimensional coordinates corresponding to points on the object surface.

  Similarly, it is possible to use a sequential series of gray patterns having stripes with varying gray scale values rather than binary patterns. When used in this context, grayscale terminology usually refers to a given over the object, from white (maximum light) to various levels of gray (low light) and black (minimum light). Refers to the amount of radiation at a point. This same nomenclature is used even if the projected light has a color such as red, and even if the grayscale value corresponds to the level of red illumination. In one embodiment, the pattern (FIG. 15) comprises stripes with varying light power levels (eg, black, gray, and white) that are used to create a pattern emitted on the object 501. A plurality of images 538, 540, and 542 are provided. Gray scale values are used to determine the possible projection angle Φ within a relatively small range of possible values. As discussed above, equation (1) can then be used to determine the distance Z.

  In another embodiment, the distance Z to the object point can be found by measuring the phase shift observed in the plurality of images. For example, in one embodiment shown in FIG. 16, the gray scale intensities 546, 548, 550 of the projector pattern 552 vary in a sinusoidal manner but have a phase shift between the projected patterns. . For example, in the first projector pattern, the sinusoidal gray scale strength 546 (representing optical power per unit area) can have a zero degree phase at a particular point. In the second projector pattern, the sinusoidal strength 548 has a phase of 120 degrees at the same point. In the third projector pattern, the sinusoidal strength 550 can have a phase of 240 degrees at the same point. This is the same as saying that the sine wave pattern is shifted to the left (or right) by one third of the period of each step. A phase shift method is used to determine the phase of the projected light at each camera pixel, which takes into account information from neighboring pixels, as in the case of a single shot of the coded pattern. Eliminate the need. Many methods can be used to determine the phase of the camera pixel. One method involves performing a multiply-accumulate procedure and then taking the arctangent of the quotient. This method is well known to those skilled in the art and will not be discussed further. In addition, using the phase shift method, the background light is canceled in the phase calculation. For these reasons, the value Z calculated for a given pixel is usually more accurate than the value Z calculated using the coded pattern single shot method. However, a single set of sinusoidal patterns, such as that shown in FIG. 16, changes all of the calculated phases from 0 degrees to 360 degrees. For a particular structured light triangulation system, the angle for each projected stripe is known in advance, so if the “thickness” of the object under test does not change much, these calculated phases are It may be sufficient. However, if the object is too thick, ambiguity can occur during the phase calculated for a particular pixel because the pixel impacts the object at the first location. This is because it may be obtained from the first projection light beam or the second projection light beam that collides with the object at the second position. In other words, for any pixel in the camera array, if there is a possibility that the phase can change more than 2π radians, the phase is not properly decoded and the desired one-to-one correspondence is It may not be realized.

  FIG. 17A illustrates sequences 1-4 of projected Gray code intensity 554 according to one method, which can eliminate ambiguity for distance Z based on the calculated phase. A set of gray code patterns is sequentially projected onto the object. In the example shown, there are four sequential patterns, indicated by 1, 2, 3, 4 to the left of 554 in FIG. 17A. Sequential pattern 1 is dark (black) in the left half of the pattern (elements 0-15) and bright (white) in the right half of the pattern (elements 16-31). Sequential pattern 2 has a dark band towards the center (elements 8-23) and a bright band towards the edges (elements 2-7, 24-31). Sequential pattern 3 has two separate bright bands near the center (elements 4-11, 20-27) and three bright bands (elements 0-3, 12- 19, 28-31). Sequential pattern 4 consists of four separate dark bands (elements 2-5, 10-13, 18-21, 26-29) and five separate bright bands (elements 0-1, 6-9). 14-17, 22-25, 30-31). For any given pixel in the camera, this sequence of patterns is compared to the initial object thickness region where the “object thickness region” of the object corresponds to all elements 0-31. , Which can be improved by a multiple of 16.

  In another method 556 illustrated in FIG. 17C, a phase shift method is implemented, similar to the method of FIG. In the embodiment shown in FIG. 17C, four sine wave periods of pattern 556A are projected onto the object. For the reasons discussed above, using the pattern of FIG. 17C, there may be an ambiguity in the distance Z to the object. One way to reduce or eliminate ambiguity is to project one or more additional sinusoidal patterns 556B, 556C, each pattern having a different fringe period (pitch). is there. Thus, for example, in FIG. 17B, a second sinusoidal pattern 555 having three fringe periods rather than four fringe periods is projected onto the object. In one embodiment, the phase difference for the two patterns 555, 556 can be used to help eliminate the ambiguity of the distance Z to the target.

  Another way to eliminate ambiguity is to use different types of methods, such as the Gray code method of FIG. 17A, for example, and the distance Z ambiguity calculated using the sinusoidal phase shift method. Is to eliminate.

  In applications where the object and device 500 are in relative motion, it may be desirable to use a single pattern, since the camera 510 does not need to project sequential images, and the three-dimensional of the object 501. Allows capturing images that provide sufficient information to measure properties. Referring now to FIGS. 18 and 19, the patterns 558, 566 have a color distribution, which in some cases is a single (coded) image of the object measurement. May be based on In the embodiment of FIG. 18, the pattern 558 uses light having a wavelength of light that varies spatially sequentially, for example, a pattern that changes color sequentially from blue to green, yellow, red, magenta. Is generated. Thus, for each particular spectral wavelength, a one-to-one correspondence can be made between the emitted image and the pattern to be imaged. With the established correspondence, it is possible to determine the three-dimensional coordinates of the object 501 from a single imaged pattern. In one embodiment, the stripes of pattern 558 are oriented perpendicular to the epipolar line above the projector plane. The epipolar line above the projector plane is mapped into the epipolar line above the camera image plane, so that by moving along the direction of the epipolar line in the camera image plane, and the line in each case By paying attention to the color of the image, it is possible to obtain an association between the projector point and the camera point. It should be appreciated that each pixel in the camera image plane corresponds to a two-dimensional angle. Color allows the determination of a one-to-one correspondence between a specific projection angle and a specific camera angle. This correspondence information is combined with the distance between the camera and the projector (baseline distance D) and the angle of the camera and projector with respect to the baseline to enable determination of the distance Z from the camera to the object. It is enough.

  Another embodiment using a color pattern is shown in FIG. In this embodiment, a plurality of colored patterns having varying intensities 560, 562, 564 are combined to produce a color pattern 566. In one embodiment, the plurality of colored pattern intensities 560, 562, 564 are the primary colors, the pattern 560 changes the red intensity, the pattern 562 changes the green intensity, and the pattern 564 The intensity of blue is changed. Since the color ratio is known, the resulting emitted image has a known relationship that can be decoded in the pattern to be imaged. Similar to the embodiment of FIG. 18, once the correspondence is established, the three-dimensional coordinates of the object 501 can be determined. Unlike the pattern of FIG. 18 (in FIG. 18, a single cycle of unique colors is projected), the pattern of FIG. 19 projects three complete cycles of nearly identical colors. With the pattern of FIG. 18, there is little possibility of ambiguity in the measured distance Z (at least for the case where the projection line is perpendicular to the epipolar line) because each camera pixel is This is because a specific color that uniquely corresponds to a specific projection direction is recognized. Since the camera angle and projection angle are known, triangulation is used, and only a single camera image can be used to determine three-dimensional object coordinates at each pixel location. Thus, the method of FIG. 18 can be considered to be a coded single shot method. In contrast, in FIG. 19, there is no possibility of ambiguity of the distance Z to the object point. For example, if the camera looks purple, the projector may have projected any of three different angles. There are three different distances Z possible based on the triangulation geometry. If it is known in advance that the thickness of the object is within a relatively small range of values, then two of the values are eliminated, so that a single shot is three-dimensional It may be possible to obtain coordinates. However, in the general case, it will be necessary to use additional projection patterns and eliminate ambiguity. For example, the spatial period of the colored pattern can be changed and then used to illuminate the object a second time. In this case, this method of projected structured light is considered a sequential method rather than a coded single shot method.

  Referring now to FIGS. 20-23, a coded structured light pattern for a single image acquisition is shown based on a stripe indexing technique. In the embodiment of FIGS. 20 and 21, a pattern having color stripes 568, 570 is emitted by projector 508. This technique takes advantage of the characteristics of the image sensor, where the sensor has three independent color channels, such as red, green, blue or cyan, yellow, magenta, and the like. The combination of values generated by these sensor channels can create a number of colored patterns. As with the embodiment of FIG. 19, the color distribution ratio is known, so it is possible to determine the relationship between the emitted pattern and the imaged pattern, and calculate the three-dimensional coordinates. Is possible. Still other types of colored patterns can be used, such as patterns based on De Bruijn sequences. Stripe indexing techniques and De Bruijn sequences are well known to those skilled in the art and are therefore not discussed further.

  In the embodiment of FIGS. 22 and 23, a colorless stripe indexing technique is used. In the embodiment of FIG. 22, pattern 572 provides a group of stripes having multiple intensity (grayscale) levels and different widths. As a result, a particular group of stripes in the overall image has a unique gray scale pattern. Due to the uniqueness of the group, a one-to-one correspondence can be determined between the emitted pattern and the imaged pattern and the coordinates of the object 501 can be calculated. In the embodiment of FIG. 23, pattern 574 provides a series of stripes having a segmented pattern. Since each line has a unique segment design, a correspondence can be determined between the emitted pattern and the imaged pattern, and the coordinates of the object 501 can be calculated. In FIGS. 20-23, additional advantages can be obtained by orienting projection lines 572, 574 perpendicular to the epipolar line into the camera plane, because This is because it simplifies the determination of the second dimension when finding a one-to-one correspondence between the camera and the projector pattern.

  Referring now to FIGS. 24-27, a coded structured light pattern is shown that uses a two-dimensional spatial grid pattern technique. These types of patterns are arranged so that sub-windows (eg, window 576 above pattern 578) are unique to other sub-windows in the pattern. In the embodiment of FIG. 24, a pseudo-random binary array pattern 578 is used. The pattern 578 uses a grid with elements (eg, circular 579) that form a coded pattern. It should be appreciated that elements having other geometric shapes (eg, but not limited to squares, rectangles, triangles, etc.) can also be used. In the embodiment of FIG. 25, pattern 580 is shown as having a multi-valued pseudo-random array, where each of the numerical values has an assigned shape 582. These shapes 582 form a unique sub-window 584 that allows correspondence between the emitted pattern and the imaged pattern and calculates the coordinates of the object 501. In the embodiment of FIG. 26, grid 586 is a color coded by a stripe perpendicular to the projector plane. Although the pattern of FIG. 26 does not necessarily provide a pattern that can be decoded in a single shot, the color information can help simplify the analysis. In the embodiment of FIG. 27, an array of colored shapes 588 (eg, square or circular, etc.) is used to form the pattern.

  Referring now to FIGS. 28A-28B, an exemplary sine wave pattern 720 is shown. In one embodiment, line 734 is perpendicular to the epipolar line above the projector plane. The sinusoidal pattern 720 is composed of 30 lines 722 that are repeated once to give a total number of 60 lines 722. Each line 722 has a sinusoidal feature 723 that is approximately 180 degrees out of phase with the upper and lower lines. This allows the line 722 to be as close as possible and also allows a greater depth of field because the line will be smeared on the projected surface or acquired image. It is possible but still recognized. Each single line 722 can simply be uniquely decoded using the phase of that line, where the line length must be at least one wavelength of a sine wave.

  As the pattern 720 is repeated, it will generally cause line identification ambiguity. However, this problem is solved in this system by the camera's field of view geometry and depth of field. No two lines with the same phase can be imaged for a single viewpoint of the camera (ie, a column of pixels) in the depth of field where the lines can be optically resolved. For example, the first column of pixels on the camera can only receive light reflected from lines 1-30 of the pattern. On the other hand, going further down the camera sensor, another column would receive only the light reflected from the lines 2 to 31 of the pattern, and so on. In FIG. 28B, the enlarged portion of pattern 720 is shown as having three lines, where the phase between successive lines 722 is approximately 180 degrees. It also shows how the phase of each single line is sufficient to uniquely decode the line.

  Referring now to FIGS. 29A-29B, another pattern 730 having square pattern elements is shown. In one embodiment, line 732 is perpendicular to the epipolar line above the projector plane. Square pattern 730 contains 27 lines 732 before pattern 730 is repeated and has a total number of 59 lines. The code element 734 of the pattern 730 is distinguished by the phase of the rectangular wave from left to right in FIG. 29B. The pattern 730 is coded such that the group of sequential lines 732 is distinguished by the relative phase of its members. In the image, sequential lines are found by scanning in the vertical direction with respect to the lines. In one embodiment, scanning in the vertical direction means scanning along an epipolar line in the camera image plane. Sequential lines in the camera vertical pixel column are paired together and their relative phase is determined. Four sequentially paired lines are required to decode a group of lines and position them in pattern 730. There is also ambiguity in this pattern 730 due to repetition, which is also resolved in the same manner as discussed above for the sinusoidal pattern 720. FIG. 29B shows an enlarged view of four lines 732 in a square pattern. This embodiment shows that because the first and third lines have the same absolute phase, the phase of a single line 732 alone can uniquely decode the line. ing.

  This approach of encoding relative phase and absolute phase provides an advantage in that there is a higher tolerance for the position of the phase. Slight errors in the projector's configuration (which will shift the phase of the line through the camera's depth of field), and errors due to the projector and camera lens make it more difficult to determine the absolute phase. Make it difficult. This can be overcome in the absolute phase method by increasing the period to be large enough to overcome the error in determining the phase.

  With respect to a two-dimensional pattern that projects a coded light pattern, three non-collinear pattern elements are recognizable due to their code, and since they are projected in two dimensions, at least three It should be appreciated that the pattern elements are not collinear. In the case of a periodic pattern such as a sine wave repeating pattern, each sine wave period represents a plurality of pattern elements. Since there is a diversity of two-dimensional periodic patterns, the pattern elements are not collinear. In contrast, for a laser line scanner that emits a line of light, all of the pattern elements are on a straight line. The line has a width, and the tail of the line cross-section may have an optical power that is less than the peak of the signal, but these aspects of the line are used in finding the surface coordinates of the object. It is not evaluated separately and therefore does not represent separate pattern elements. A line can contain a plurality of pattern elements, which are on the same line.

  In addition, various pattern techniques can be combined as shown in FIGS. 30-31 to create a binary (FIG. 30) checkered uncoded pattern 590 or a colored (FIG. 31) checkered pattern. Any of the uncoded patterns 592 can be formed. In yet another embodiment shown in FIG. 32, photometric stereo techniques can be used, in which multiple images 594 are taken over the object 501 and the light source 596 is in multiple locations. Moved to.

  Referring now to FIG. 33, another embodiment of a system 700 for obtaining 3D coordinates of an object 702 is shown. In this embodiment, device 704 can operate independently when disconnected from AACMM 100. Device 704 includes a controller 706 and an optional display 708. Display 708 can be integrated into the housing of device 704 or can be a separate component that is coupled to device 704 when used independently of AACMM 100. In embodiments where the display 708 is separable from the device 704, the display 708 can include a controller (not shown) that provides additional functionality to facilitate independent operation of the device 704. is there. In one embodiment, the controller 706 is disposed in a separable display.

  The controller 706 includes communication circuitry that communicates data (eg, image or coordinate data) to the AACMM 100 via the communication link 712, to a separate computing device 710, or a combination of both. , Configured to transmit wirelessly. The computing device 710 can be, for example, a computer, a laptop computer, a tablet computer, a personal digital assistant (PDA), or a mobile phone, but is not limited thereto. Display 708 may allow an operator to view the acquired image or point cloud of acquired coordinates of object 702. In one embodiment, the controller 706 decodes the pattern in the acquired image and determines the three-dimensional coordinates of the object. In another embodiment, the image is acquired by device 704 and transmitted to either AACMM 100, computing device 710, or a combination of both.

  Device 704 can further include a location device assembly 714. The location device assembly can include one or more of inertial navigation sensors, such as global positioning system (GPS) sensors, gyro sensors, accelerometer sensors, and the like. Such a sensor can be electrically coupled to the controller 706. The gyro sensor and accelerometer sensor can be a single-axis or multi-axis device. The location device assembly 714 is configured to allow the orientation of the device 704 to be measured or maintained when the controller 706 is disconnected from the AACMM 100. The gyroscope in location device assembly 714 can be a MEMS gyro device, a solid state ring laser device, a fiber optic device gyroscope, or other type.

  Once device 704 is removed from articulated arm CMM 100, the method is used to combine images obtained from multiple scans. In one embodiment, each image is obtained by using a coded pattern, and only a single image is needed to obtain the three-dimensional coordinates associated with a particular position and orientation of device 704. It is supposed to be. One way to combine multiple images captured by device 704 is to provide at least some overlap between adjacent images so that point cloud features can be matched. This matching function may be supported by the inertial navigation device described above.

  Another method that can be used to assist in the accurate registration of images collected by device 704 is to use reference markers. In one embodiment, the reference marker is a small marker having an adhesive or sticky backing (eg, a circular marker placed on one or more objects being measured). Especially when registering multiple images with a relatively small number of such markers, if the object being measured has a relatively small number of features for use in registration. It can be useful. In one embodiment, the reference marker can be projected as a light spot on one or more objects under examination. For example, a small portable projector capable of emitting a plurality of small dots can be placed in front of one or more objects to be measured. The advantage of projected dots over sticky dots is that the dots are attached and do not need to be removed later.

In one embodiment, the device can project structured light over adjacent enclosed area 716 and acquire an image over area 716 in the range of 100 mm to 300 mm with an accuracy of 35 microns. In one embodiment, the vertical region 716 of the projection is approximately 150-200 mm ² . The one or more cameras 510 may be digital cameras with 1.2-5.0 megapixel CMOS or CCD sensors.

  With reference to FIGS. 28 and 29, the process of decoding the encoded pattern will be described. The first step in decoding the pattern image is to extract the centroid (cog) 724 (FIG. 28C) of the features of the projected pattern 720 in the Y direction. This is done by calculating a moving average of pixel grayscale values and by moving a single column downward at a time in Y-direction processing. When the pixel value in the image is above the moving average, the starting point for the feature is found. After the starting point is found, the feature width continues to increase until the pixel value is below the moving average. A weighted average is then calculated using the pixel values between the start and end points and their Y positions to give a cog 724 of the pattern feature 723 in the image. Also, the distance between the start point and the end point is recorded for later use.

  The resulting cog 724 is then used to find the pattern line 722. This is done by starting from the first column of the image and moving from left to right (when viewed from the direction shown). For each cog 724 in this column, the next column immediately to the right is searched for cog 724 within a certain distance. If two matching cog 724s are found, then the potential line is determined. As the process moves across the image, newer lines are determined and other previously determined lines are extended to a length such that additional cog 724 is detected within tolerance. Once the entire image has been processed, a filter is applied to the extracted lines to ensure that only the desired length of the line (which is the wavelength of the pattern) is used in the remaining steps. FIG. 28C also shows the detected lines, which are longer than the single wavelength of the pattern. In one embodiment, there is no delta between cogs in adjacent columns, or there is a small delta.

  The next step in the decoding process is to extract pattern features that are projected along lines in the X direction in the form of block centers. Each pattern contains both wide and narrow blocks. In the sine wave pattern 720, it refers to the peak and valley of the wave, and in the square pattern 730, it refers to a wide square and a narrow square. This process proceeds in the same way as extracting features in the Y direction, but the moving average is calculated using the width found in the first stage and the direction of movement is Along. As explained above, features are extracted in regions where the width is above the moving average, but in this process, features are also extracted in regions where the width is below the moving average. The The width and X position are used to calculate the weight average and find the center of block 726 in the X direction. Also, the Y position of cog 724 between moving average intersections is used to calculate the center of block 726 in the Y direction. This is done by taking the average of the cog Y coordinates. Also, the start and end points of each line are modified based on the features extracted in this step to ensure that both points are where the moving average intersection occurs. In one embodiment, only complete blocks are used in later processing steps.

  The lines and blocks are then processed to further ensure that the distance between block centers 726 on each line is within a predetermined tolerance. This is achieved by taking the delta between the X center positions between two neighboring blocks on the line and checking that the delta is below the tolerance. If the delta is greater than or equal to the tolerance, the line is split into smaller lines. If a split is required between the last two blocks on a line, the last block is removed and no additional lines are generated. If a split is required between the first block and the second block on the line, or between the second block and the third block, it is also the block to the left of the split Are discarded and no additional lines are generated. For situations where splitting occurs anywhere else along the line, the line is split in two, a new line is generated, and the appropriate block is converted to it. After this stage of processing, the two patterns require different steps to finish decoding.

  Here, the sine wave pattern 720 can be decoded by one additional processing step using the block center above the line. The coefficients for each block X center and the wavelength of the pattern 720 on line 722 are calculated, and the average of these values gives the phase of line 722. The phase of line 722 is then used to decode the line in pattern 720, which determines the X, Y, Z coordinate position for all cog 724 on that line 722. to enable.

  Before the square pattern 730 is decoded, the first line 732 should be connected vertically before any decoding can occur. This allows a group of lines to be specified and not to be a single line like a sinusoidal pattern. A connection 736 is found between lines 732 using cog contained in block 734 and the block calculated in the first stage of processing. The first cog in each block on line 732 is tested to see if there is another cog directly below it in the same column. If there is no cog underneath, there is no connection to another line at this point, so processing continues. If cog is present below, the Y distance between the two cogs is determined and compared to the desired maximum spacing between the lines. If the distance is less than this value, the two lines are considered connected at that point, the connection 736 is stored, and processing continues with the next block. In one embodiment, line connection 736 is unique so that no two lines will have more than one connection 736 between them.

  The next step in the process for the square pattern 730 is the phase calculation between the connecting lines. Each pair of lines 732 is first processed to determine the length of the overlap between them. In one embodiment, there is at least one wavelength of the overlap between a pair of lines to allow calculation of the relative phase. If the line has the desired overlap, the cog at the center of the overlap region is found. The block 738 containing the center cog and the cog directly below are determined and the relative phase between the block X centers is calculated with respect to the line connection. This process is repeated for all connections between the lines. In one embodiment, the process is repeated only in the downward direction on the Y axis. This is because the cord is based on a connection below the line and / or not reversed. FIG. 29C shows a block 738 that may be used to calculate the relative phase for this set of lines. The relative phases of the embodiment of FIG. 29C are 3, 1, and 2, and these phases will be used in the final stage to decode the top line.

  The next step in decoding the square pattern 730 is to perform a search using the relative phase calculated in the previous step. Each line 732 is processed by finding a line connection 736 until four connection depths are reached. This depth is used because it is the number of phases for decoding the line. At each level of connection, a hash is determined using the relative phase between the lines 732. When the required connection depth is reached, the hash is used to find the line code. If the hash returns a valid code, this is recorded and stored in the voting system. All lines 732 are processed in this way and all connections at the desired depth are used, generating a vote if they are valid phase combinations. The final step is then to find out which code received the most votes on each line 732 and assigned the code on line 732 to this value. If there is a unique code that has received the most votes, the line cannot be assigned a code. Line 732 is identified as being assigned a code, where it is possible to find X, Y, Z coordinate positions for all cogs on that line 732.

  The explanation given above distinguishes between line scanners and area (structured light) scanners based on whether more than two pattern elements are collinear, but the intent of this criterion is It should be noted that is to distinguish between patterns projected as regions and patterns projected as lines. As a result, even though a one-dimensional pattern may be curved, a linearly projected pattern that has only information along a single path is still a line pattern.

  Although the invention has been described with reference to exemplary embodiments, various modifications can be made without departing from the scope of the invention, and equivalents can be substituted for the elements. Will be understood by those skilled in the art. In addition, many modifications may be made to adapt a particular situation or material to the teachings of the invention without departing from the essential scope thereof. Accordingly, the invention should not be limited to the specific embodiments disclosed as the best mode contemplated for practicing the invention, but the invention is all embodiments that fall within the scope of the appended claims. It is intended to include. Moreover, the use of terms such as first, second, etc. does not indicate any order or importance; rather, terms such as first, second, etc. are used to distinguish one element from another. It is used. Moreover, the use of a term such as (a, an) does not indicate a limit on the amount, but rather indicates that there is at least one of the referenced items.

Claims (40)

A portable articulated arm coordinate measuring machine (AACMM) for measuring the three-dimensional coordinates of an object in space,
A base part;
A manually positionable arm portion having first and second opposing ends, wherein the arm portion is rotatably coupled to the base portion, the arm portion comprising a plurality of arm portions Arm portions including connected arm segments, each arm segment including at least one position transducer for producing a position signal;
Electronic circuitry for receiving the position signal from the at least one position transducer in each arm segment;
A probe end coupled to the first end;
A non-contact three-dimensional measuring device connected to the probe end, wherein the non-contact three-dimensional measuring device includes a projector and an image sensor, and the projector includes a light source plane. And the projector is configured to emit a structured light that is a structured light pattern coded on the object , the structured light being emitted from the light source plane and at least three collinear. A non-contact three-dimensional measuring device that includes a non-contact pattern element, wherein the image sensor receives the structured light reflected from the object and is independently operable when disconnected from the probe end When,
A processor electrically coupled to the electronic circuit, wherein the processor is responsive to receiving the position signal from the position transducer and receiving the structured light by the image sensor; in response, the being configured to determine the three-dimensional coordinates of points on the object, viewed contains a processor to,
The non-contact type three-dimensional measurement device includes a location device that measures a position of the non-contact type three-dimensional measurement device when separated from the probe end, a position measured by the location device, and a probe end. A portable articulated arm coordinate measuring machine (AACMM) comprising: a communication circuit that communicates the structured light received by the image sensor to the processor or computing device when disconnected.   The AACMM according to claim 1, wherein the non-contact type three-dimensional measuring device is detachably connected to the probe end. The AACMM of claim 1, wherein the coded structured light pattern includes a graphical element that includes at least one of a square, a rectangle, and a triangle . 4. The AACMM according to claim 3, wherein the coded light pattern is a sine wave pattern including 30 lines, and each line is 180 degrees out of phase with an adjacent line. AACMM characterized by this. 4. The AACMM of claim 3, wherein the coded structured light pattern includes 27 lines and the graphical element is square . 2. The AACMM according to claim 1 , wherein the coded structured light includes a pattern having a plurality of wavelengths, and at least one wavelength has a spatial arrangement different from other wavelengths. AACMM characterized by this. The AACMM of claim 1 , wherein the coded structured light includes a pattern having a plurality of distinguishable colors . The AACMM of claim 1 , wherein the coded structured light includes a segmented line pattern . The AACMM of claim 1 , wherein the coded structured light includes a two-dimensional spatial grid pattern . The AACMM according to claim 9 , wherein the two-dimensional spatial grid pattern includes a pseudo-random binary array . 10. The AACMM of claim 9 , wherein the two-dimensional spatial grid pattern includes a color coded grid . 10. The AACMM according to claim 9 , wherein the two-dimensional spatial grid pattern includes a multi-value pseudorandom array . The AACMM of claim 9 , wherein the two-dimensional spatial grid pattern comprises a two-dimensional array of color-coded geometric shapes . The AACMM according to claim 1 , wherein the structured light pattern is an uncoded structured light pattern . A AACMM according to claim 1 4, structured light pattern that is not the encoded, characterized in that it comprises a sequential projection images AACMM. A AACMM of claim 1 5, wherein the sequential projected image, characterized in that it is a set of binary patterns AACMM. A AACMM of claim 1 5, wherein the sequential projected image, characterized in that it is a set of patterns, including stripes having a level of at least two strength AACMM. A AACMM of claim 1 5, wherein the sequential projected image, characterized in that it is a set of at least three sinusoidal pattern AACMM. A AACMM of claim 1 5, wherein the sequential projected image, characterized in that it is a set of patterns, including stripes having at least two intensity levels, including at least three sinusoidal pattern AACMM . A AACMM according to claim 1 4, structured light pattern that is not the encoded is projecting a sequence of different illumination patterns, each of said sequences of different irradiation patterns, different locations relative to the object AACMM characterized by being projected from . A AACMM according to claim 1 4, structured light pattern that is not the encoded, characterized in that it comprises a gray scale pattern repeated AACMM. The AACMM according to claim 1 , further comprising a contact-type measuring device coupled to the probe end . The AACMM of claim 1 , wherein the processor is positioned in the non-contact three-dimensional measuring device . A method of operating a portable articulated arm coordinate measuring machine for measuring the coordinates of an object in space comprising:
Providing a manually positionable arm portion having opposing first and second ends comprising a plurality of connected arm segments, each arm segment producing a position signal Including at least one position transducer for:
Providing a probe end for measuring the object, wherein the probe end is coupled to the first end; and
Receiving in the electronic circuit the position signal from the transducer;
Providing a three-dimensional non-contact measuring device having a controller, the non-contact measuring device having a sensor and a projector, the projector emitting a structured light on the object The projector has a light source plane, and the structured light includes at least three non-collinear pattern elements emitted from the light source plane;
Projecting a structured light from the non-contact measuring device onto the object;
Receiving a reflection of the structured light from the object using the non-contact measurement device;
Determining, from the reflected structured light, three-dimensional coordinates of a point on the object;
Separating the non-contact measurement device from the probe end;
Operating the non-contact measuring device away from the probe end;
Measuring the position of the non-contact measuring device operating away from the probe end;
Receiving a reflection of the structured light from the object when operating away from the probe end; and
Transmitting the position of the non-contact measurement device and the received structured light data from the non-contact measurement device operating away from the probe end;
A method comprising the steps of: 25. The method of claim 24, wherein the structured light is a coded structured light. 26. The method of claim 25, wherein the coded structured light pattern projected onto the object includes a graphical element that includes at least one of a square, a rectangle, and a triangle. Feature method. 26. The method of claim 25 , wherein the encoded light pattern is a sine wave pattern including 30 lines, each line being 180 degrees out of phase with an adjacent line. wherein that you are. 26. The method of claim 25 , wherein the coded structured light pattern includes 27 lines and the graphical element is square . 26. The method of claim 25 , wherein the coded structured light comprises a pattern having a plurality of wavelengths, wherein at least one wavelength has a spatial arrangement different from other wavelengths. wherein that you are. 30. The method of claim 29, wherein the pattern having a plurality of wavelengths is disposed in a line oriented substantially perpendicular to the light source plane . 26. The method of claim 25 , wherein the coded structured light comprises a single pattern having a plurality of distinguishable colors . 26. The method of claim 25 , wherein the coded structured light includes a segmented line pattern . 26. The method of claim 25 , wherein the coded structured light includes a two-dimensional spatial grid pattern . 34. The method of claim 33, wherein the two-dimensional spatial grid pattern includes a pseudo-random binary array . 34. The method of claim 33 , wherein the two-dimensional spatial grid pattern includes a color coded grid . 34. The method of claim 33 , wherein the two-dimensional spatial grid pattern includes a multi-valued pseudorandom array . 34. The method of claim 33 , wherein the two-dimensional spatial grid pattern includes a two-dimensional array of color-coded geometric shapes . 26. The method of claim 25 , further comprising changing the coded structured light from a first pattern to a second pattern by the electronic circuit . How The method of claim 3 8, wherein the coded structured light, characterized in that is varied in response to operator input. The method of claim 3 8, wherein said coded structured light, in response to changing conditions of the object, characterized in that it is brought automatically changed by the electronic circuit.