JP5267161B2 - Microscope equipment - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To enable a microscope device to reliably perform external phase contrast observation. <P>SOLUTION: A phase contrast ring is disposed in the image-side pupil conjugate face F3 conjugate to the pupil face of an objective lens 14, and a parallel flat glass 41 is disposed in the optical path of light from the objective lens 14 so as to be insertable or retractable. The parallel flat glass 41 disposed on an optical axis L1 moves the image-side pupil conjugate face F3 along the optical axis L3 of the optical path. In addition, the position where a phase contrast ring is disposed is adjustable in the direction of the optical axis L3 in a predetermined adjustment range. The present invention is applied in, for example, a microscope device used for phase contrast observation. <P>COPYRIGHT: (C)2010,JPO&amp;INPIT

Description

  The present invention relates to a microscope apparatus.

  Conventionally, in an observation with a microscope, an optical element is arranged on the pupil plane of an objective lens, and a specimen that is difficult to visualize by normal observation can be visualized by the effect of the optical element, and the specimen can be observed. For example, Patent Document 1 discloses a microscope in which a phase difference ring is installed on a slider that can be inserted into and removed from an optical path, and a phase difference ring suitable for an observation condition is arranged in the optical path.

  On the other hand, in the case of so-called external phase contrast observation in which an optical element such as a phase plate or a phase difference ring is placed on the pupil conjugate surface on the image plane side of the objective lens for observation, the pupil position differs depending on the objective lens. Accordingly, it is necessary to adjust the position of the optical element arranged on the pupil conjugate plane on the optical axis.

Japanese Examined Patent Publication No. 6-97304

  By the way, as described above, when an optical element that is a phase plate is arranged on the pupil conjugate plane on the image plane side of the objective lens and phase difference observation is performed, the position of the pupil conjugate plane is optical depending on the type of objective lens. It may be outside the adjustment range of the element position. In observation using such an objective lens, the effect of the optical element cannot be obtained sufficiently, and it may be difficult to reliably perform external phase difference observation.

  The present invention has been made in view of such a situation, and makes it possible to reliably perform external phase difference observation.

The microscope apparatus of the present invention includes an objective lens, an observation optical element disposed on an image-side pupil conjugate plane conjugate with the pupil plane of the objective lens, and light from the objective lens when illuminating a sample with illumination light. The image block pupil conjugate plane is moved along the optical axis of the optical path between the objective lens and the observation optical element, and the filter block switching device in which the filter block that is detachably arranged in the optical path is mounted An optical element for moving the pupil plane, and the optical element for moving the pupil plane is mounted on the filter block switching device using a mounting portion for mounting the filter block on the filter block switching device. Features.

In the microscope apparatus of the present invention, the observation optical element is arranged on the image side pupil conjugate plane conjugate with the pupil plane of the objective lens, and is inserted into and removed from the optical path of the light from the objective lens when illuminating the sample with illumination light. A filter block that can be arranged is mounted on the filter block switching device, and the optical element for moving the pupil plane moves along the optical axis of the optical path between the objective lens and the optical element for observation. Let me. Then, the pupil plane moving optical element is mounted on the filter block switching device by using a mounting portion that mounts the filter block on the filter block switching device.

  According to the microscope apparatus of the present invention, external phase difference observation can be reliably performed.

  Hereinafter, specific embodiments to which the present invention is applied will be described in detail with reference to the drawings.

  FIG. 1 is a perspective view showing an embodiment of a microscope to which the present invention is applied.

  The microscope 11 shown in FIG. 1 is a so-called inverted microscope in which a specimen 12 to be observed is placed on a stage 13 and the specimen 12 is observed from below through an objective lens 14 disposed below the stage 13. It is of a kind called.

  The stage 13 is disposed substantially at the center of the microscope 11 so that the upper surface is horizontal, and a part of the center of the stage 13 is made of a transparent member that can transmit observation light. In addition, the stage 13 is configured to be movable along a plane perpendicular to the optical axis L1 extending in the vertical direction, and a specimen placed on the upper surface thereof according to a user operation on an operation unit (not shown). 12 can be moved.

  The objective lens 14 converges the observation light from the sample 12 (for example, the diffracted light or direct light of the sample 12 or fluorescence excited by the sample 12), and forms a light beam parallel to the optical axis L1 as a main part. 15 is introduced into the optical path (see FIG. 2) toward the lens barrel 16 via 15. The observation light introduced into the optical path by the objective lens 14 is imaged at a predetermined position in the lens barrel 16 via the optical path, and the user can observe the observation image in the lens barrel 16 via the eyepieces 17L and 17R. Can be observed directly.

  Hereinafter, in the microscope 11, the direction in which the eyepieces 17L and 17R face is referred to as the front side (right side in FIG. 1), and the opposite side is referred to as the back side. As will be described later with reference to FIG. 2, the observation light traveling downward in the vertical direction along the optical axis L <b> 1 is forward along the optical axis L <b> 2 substantially orthogonal to the optical axis L <b> 1 inside the main body 15. Then, the light is reflected upward in the vertical direction along the optical axis L3 substantially orthogonal to the optical axis L2, and enters the lens barrel 16.

  A mirror, a lens, and the like (see FIG. 2) constituting an optical system that transmits observation light are housed inside the main body 15, and a lens barrel base unit 18 is disposed on the front side of the upper surface of the main body 15. A filter block turret 19 is attached to the center of the upper surface of the main body 15. A camera port 21 to which the camera 20 can be attached and detached is disposed on the left side surface of the main body 15, and an observation image of the specimen 12 can be taken by the camera 20.

  The lens barrel base unit 18 has a lens barrel 16 mounted on the upper surface thereof, and for inserting and removing various optical elements such as a phase difference ring on the optical axis L3 from the main body portion 15 toward the lens barrel 16. The external phase difference turret 22 is accommodated. In addition, a camera port 24 to which the camera 23 can be attached and detached is disposed on the left side surface of the lens barrel base unit 18. For example, the observation light can be transmitted by inserting a mirror (not shown) on the optical axis L3. The observation image of the specimen 12 can be taken by the camera 23 after being reflected and introduced into the camera port 24.

  In the present embodiment, the lens barrel base unit 18 can be detached from the lens barrel 16 and the main body 15, and the lens barrel base unit 18 can be attached as necessary. Of course, the present invention can also be applied to a configuration in which the lens barrel base unit 18 is not removable.

  The external phase difference turret 22 is configured to be rotatable around a rotation axis parallel to the optical axis L3. In addition, as will be described later with reference to FIG. 6, the external phase difference turret 22 is provided with three types of phase difference rings (observation optical elements) and an opening for allowing observation light to pass therethrough. The phase difference ring or opening disposed on the optical axis L3 is switched by rotating the external phase difference turret 22 around the rotation axis.

  An operation unit 22a is provided on a side surface of the external phase difference turret 22, and the position of the phase difference ring in the optical axis L3 direction is adjusted by operating (rotating) the operation unit 22a by the user. For example, the phase difference ring is housed in a cylindrical member, and the cylindrical member is supported to be slidable along the optical axis L3 direction with respect to the external phase difference turret 22. The operation portion 22a is connected to a shaft having a crank shape on the tip side, and a cylindrical member in which a phase difference ring is housed is connected to the tip portion of the shaft. When the user rotates the operation unit 22a, the phase difference ring is slid (moved up and down) in the direction of the optical axis L3 via the shaft connected to the operation unit 22a. With such a mechanism, the phase difference ring can be adjusted in position in the optical axis L3 direction within a predetermined adjustment range (a range in which the phase difference ring can be slid by the shaft).

  The filter block turret 19 is configured to be rotatable about a rotation axis parallel to the optical axis L1, and by rotating about the rotation axis, the filter block turret 19 is described later with reference to FIG. Various blocks to be mounted on are arranged on the optical axis L1.

  An adjustment member 25 whose height can be adjusted along the optical axis L1 is mounted on the back side of the filter block turret 19 on the upper surface of the main body 15, and the objective lens 14 is mounted on the upper surface of the adjustment member 25. The arm part 27 which supports the revolver 26 to which is attached is attached. By adjusting the height of the adjustment member 25, the revolver 26 attached to the tip of the arm portion 27 moves up and down along the optical axis L1, thereby adjusting the position of the objective lens 14 in the optical axis L1 direction. Thus, the focal position inside the sample 12 is adjusted. In addition to the objective lens 14, the revolver 26 can be mounted with a plurality of types of objective lenses (not shown). When the revolver 26 rotates, the objective lens disposed on the optical axis L1 is switched, and a plurality of types of objective lenses are switched. Observation using an objective lens is performed.

  A base member 29 to which an epi-illumination device 28 for epi-fluorescence is attached is mounted on the back side of the adjustment member 25 on the upper surface of the main body 15, and the illumination light emitted from the epi-illumination device 28 for epi-fluorescence The light enters the filter block turret 19 through the member 29 and the adjustment member 25.

  On the upper surface of the base member 29, a support member 30 that supports the end on the back side of the stage 13 is disposed, and on the upper surface of the support member 30, a support column 31 is disposed. The front end of the stage 13 is supported by the lens barrel base unit 18.

  A transillumination illumination device 32 is attached to the upper end of the support post 31, and the illumination light emitted from the transmission illumination illumination device 32 is within the arm portion 33 that extends from the transmission illumination device 32 toward the front side. The mirror (not shown) irradiates downward along the optical axis L1.

  A support arm 36 that supports a condenser turret 35 to which a condenser lens 34 disposed on the optical axis L1 is attached is attached in the middle of the column 31. The support arm 36 can move up and down along the column 31 and adjusts the positions of the condenser lens 34 and the condenser turret 35 in the direction of the optical axis L1. In addition to the condenser lens 34, the condenser turret 35 is configured such that, for example, an observation cassette (not shown) in which a ring diaphragm or the like is set can be mounted. The condenser turret 35 rotates on the optical axis L1. The ring diaphragm arranged in is switched.

  As described above, the microscope 11 is configured, and in the phase difference observation, the external phase difference turret 22 can be rotated to switch the phase difference ring inserted in the pupil conjugate plane conjugate with the pupil plane of the objective lens 14. . Further, in the microscope 11, when the revolver 26 is rotated and the objective lens 14 is switched, when the position of the pupil conjugate plane moves along the optical axis L3, the operation unit 22a is operated to perform a predetermined operation. By adjusting the position of the phase difference ring in the optical axis L3 direction within the adjustment range, the phase difference ring can be arranged on the pupil conjugate plane corresponding to the objective lens 14.

  By the way, depending on the type of the objective lens 14, the position of the pupil conjugate plane may be outside the adjustment range by the operation unit 22a. In this case, the microscope 11 uses a parallel plane glass (an optical element for moving the pupil plane), which is an optical element that can change the position of the pupil conjugate plane, to place the pupil conjugate plane within the adjustment range of the phase difference ring. Can be moved.

  Next, the movement of the pupil conjugate plane by inserting parallel plane glass into the optical system of the microscope 11 will be described with reference to FIG.

  FIG. 2A shows the optical system in a state where the parallel plane glass 41 is not inserted, and FIG. 2B shows the optical system in a state where the parallel plane glass 41 is inserted. In FIG. 2, the imaging light ray of the observation image is represented by a solid line, and the imaging light ray of the pupil is represented by a broken line.

  Observation light from the object plane F1 enters the mirror 43 through the objective lens 14 and the imaging lens 42 along the optical axis L1, and is reflected along the optical axis L2 by the mirror 43, and then passes through the field lens 44. Through the mirror 45 and reflected by the mirror 45 along the optical axis L3. Then, the light is reflected by the mirror 48 via the relay lenses 46 and 47, imaged at a predetermined position in the lens barrel 16 in FIG. 1, and observed through the eyepieces 17L and 17R. Also, the illumination light from the epifluorescent illumination device 28 is irradiated along the optical axis L4, and is reflected along the optical axis L1 by a dichroic mirror (not shown) (see FIG. 4).

  As shown in FIG. 2A, a pupil plane F2 is formed between the objective lens 14 and the imaging lens 42, and a pupil conjugate plane F3 is formed between the relay lenses 46 and 47. Further, the imaging light beam of the observation image is a parallel light beam between the objective lens 14 and the imaging lens 42.

  Therefore, as shown in FIG. 2B, the parallel plane glass 41 that corrects the pupil conjugate position of the pupil of the objective lens 14 is inserted between the objective lens 14 and the imaging lens 42 to obtain a parallel luminous flux. It is possible to move the pupil conjugate plane F3 shown in FIG. 2A to the position of the pupil conjugate plane F3 ′ by refracting the pupil imaging ray without changing the imaging ray of the image.

  For example, the parallel flat glass 41 is attached to a block that can be attached to the filter block turret 19, and the filter block turret 19 to which the block is attached is rotated, so that the optical axis L1 between the objective lens 14 and the imaging lens 42 is rotated. The parallel flat glass 41 can be inserted and removed.

  Next, the filter block turret 19 will be described with reference to FIG. FIG. 3A shows a plan view of the filter block turret 19 as viewed from above along the optical axis L1 in FIG. 1, and FIG. 3B shows a perspective view of the filter block turret 19.

  The filter block turret 19 is a disk-shaped member, is configured to be rotatable about the center of the disk as a rotation axis, and a plurality of (six in the example of FIG. 3) blocks can be mounted. .

  In FIG. 3, four filter blocks 51 a to 51 d are attached to the filter block turret 19. The microscope 11 can be attached to the filter block turret 19 with the same configuration as the filter blocks 51a to 51d, and the optical element block 52 including the parallel flat glass 41 described with reference to FIG. 2 is the filter block turret. 19 is attached.

  That is, the filter block turret 19 can be attached and detached by sliding the filter blocks 51a to 51d in the radial direction, and the optical element block 52 is moved in the arrow direction shown in FIG. By sliding, the optical element block 52 is mounted on the filter block turret 19. Note that the filter blocks 51a to 51d are configured in the same manner. Hereinafter, the filter blocks 51a to 51d will be referred to as filter blocks 51 when it is not necessary to distinguish the filter blocks 51a to 51d as appropriate.

  In addition, the filter block turret 19 is provided with six mounting portions 53 to which the filter block 51 or the optical element block 52 can be attached at six locations equally in the circumferential direction of the filter block turret 19. In FIG. 3, reference numerals are given only to the mounting portions 53 to which the optical element block 52 is mounted.

  A circular opening 54 is formed on the bottom surface of the mounting portion 53, and notches 55 and 56 are formed on both side surfaces of the mounting portion 53. The cutout portions 55 and 56 of the mounting portion 53 can be fitted with fitting portions 57 and 58 formed in a common shape with the filter block 51 and the optical element block 52, respectively.

  The fitting portions 57 and 58 are convex (square ant-shaped) portions that have an inclined surface that expands downward and extend along the sliding direction when the filter block 51 and the optical element block 52 are mounted. . The notches 55 and 56 are concave groove portions corresponding to the convex fitting portions 57 and 58.

  Further, the mounting portion 53 has a click mechanism (not shown), and the filter block 51 and the optical element block 52 are positioned and fixed by the click mechanism.

  Next, FIG. 4 shows a perspective view of the filter block 51 and a schematic cross-sectional view of the filter block 51 in a cross section along the optical axis L1.

  The filter block 51 includes a filter 61 disposed perpendicular to the optical axis L4, a dichroic mirror 62 disposed at the intersection of the optical axes L1 and L4, and a filter 63 disposed perpendicular to the optical axis L1. Composed.

  The filter 61 filters the illumination light emitted from the epifluorescent illumination device 28 and transmits light in a wavelength region that excites a predetermined fluorescent component contained in the sample 12.

  The dichroic mirror 62 reflects light in the wavelength region that has passed through the filter 61 and transmits light outside the wavelength region. In other words, the dichroic mirror 62 reflects the illumination light incident through the filter 61 along the optical axis L4 toward the upper side of the optical axis L1, and transmits the fluorescence emitted from the sample 12 and incident along the optical axis L1. Let

  The filter 63 filters the light transmitted through the dichroic mirror 62 and allows only light in the fluorescent wavelength region emitted from the specimen 12 to pass.

  Next, FIG. 5 shows a perspective view of the optical element block 52 and a schematic cross-sectional view of the optical element block 52 in a cross section along the optical axis L1.

  To the optical element block 52, for example, a cylindrical parallel plane glass 41 formed so that the upper and lower surfaces orthogonal to the optical axis L1 are parallel and flat is fixed.

  The filter block turret 19 to which the optical element block 52 configured as described above is attached is attached to the microscope 11 in FIG. 1, and the filter block turret 19 is rotated so that the parallel plane glass 41 is placed on the optical axis L1. Inserted.

  With this configuration, in the microscope 11, the parallel plane glass 41 is inserted on the optical axis L1, so that the position of the pupil conjugate plane F3 (FIG. 2) deviates from the adjustment range of the phase difference ring. Even if the objective lens 14 is used, the position of the pupil conjugate plane F3 can be changed within the adjustment range. Thereby, since the phase difference ring can be reliably arranged on the pupil conjugate plane F3, the effect of the phase difference ring can be sufficiently obtained, and the phase difference observation can be reliably performed.

  In addition, for example, it may be possible to perform phase difference observation by adopting a mechanism that widens the adjustment range so that the position of the pupil conjugate plane F3 does not deviate from the adjustment range of the phase difference ring. . However, in this case, the mechanism for adjusting the phase difference ring becomes large, and the microscope becomes large. In contrast, the microscope 11 can reliably perform phase difference observation without increasing the size.

  Further, as described with reference to FIG. 2, even if the position of the pupil conjugate plane F3 is changed by the parallel plane glass 41, the influence of the observation image on the imaging light beam is avoided. Thereby, many types of objective lenses can be used for observation.

  Further, in the microscope 11, when the objective lens 14 is selected such that the position of the pupil conjugate plane F3 is out of the adjustment range of the phase difference ring, for example, a detection unit that detects the type of the objective lens 14 is provided and obtained. The filter block turret 19 may be controlled to rotate by a motor so that the parallel plane glass 41 is automatically inserted on the optical axis L1 based on the data, or the filter block turret 19 is manually driven. You may let them.

  Next, control of each unit in the microscope 11 will be described with reference to FIG. FIG. 6 is a block diagram illustrating a configuration example of the microscope 11.

  A control device 71 that controls the microscope 11 includes a microcomputer 72 that controls each unit of the microscope 11, a storage unit 73 that stores programs executed by the microcomputer 72 and various data, and setting information for the microscope 11. A setting information input unit 74 and an operation command switch 75 for instructing an operation on the microscope 11 are provided. The microcomputer 72 is connected to address detecting devices 76a to 76d and motors 77a to 77c.

  The condenser turret 35 is configured so that a ring diaphragm cassette can be mounted at five mounting locations identified by address numbers No11 to No15. In FIG. 6, the ring diaphragm cassette is not mounted at the mounting location of address number No11, and illumination light can be passed (opened) through an opening formed at the mounting location. Thru | or the predetermined | prescribed ring aperture cassette which each has a different opening diameter in the mounting location of No15. The address detection device 76a detects the address number of the mounting location where the ring diaphragm cassette disposed on the optical axis L1 in FIG. The motor 77a rotationally drives the condenser turret 35 so that a ring diaphragm cassette corresponding to a predetermined address number is arranged on the optical axis L1 under the control of the microcomputer 72.

  The revolver 26 is configured such that objective lenses (for example, the objective lens 14 in FIG. 1) having different magnifications can be attached to the six attachment locations identified by the address numbers No21 to No26, respectively. The address detection device 76b detects the address number of the mounting location where the objective lens arranged on the optical axis L1 in FIG. Under the control of the microcomputer 72, the motor 77b drives the revolver 26 so that the objective lens corresponding to the predetermined address number is arranged on the optical axis L1.

  The filter block turret 19 is configured so that blocks having different optical performance can be mounted at six mounting locations identified by address numbers No31 to No36, respectively. In FIG. 6, a block is not mounted at the mounting position of address number No31, and observation light can pass through an opening formed at the mounting position, and mounting positions of address numbers No32 to No35. Each of the filter blocks 51 (FIG. 4) is mounted, and the optical element block 52 (FIG. 3) is mounted at the mounting position of the address number No36. The address detecting device 76c detects the address number of the mounting location where the block arranged on the optical axis L1 in FIG. The motor 77c rotates the filter block turret 19 so that a block corresponding to a predetermined address number is arranged on the optical axis L1 under the control of the microcomputer 72.

  The external phase difference turret 22 is configured so that phase difference rings can be mounted at four mounting locations identified by address numbers No41 to No44. In FIG. 6, the phase difference ring is not attached to the attachment location of the address number No41, and the illumination light can pass through the opening formed in the attachment location, and the address numbers No42 to No44. Predetermined phase difference rings having different optical performances are respectively attached to the attachment locations. The address detection device 76d detects the address number of the mounting location where the phase difference ring disposed on the optical axis L3 in FIG.

  In the microscope 11 configured as described above, when the user inputs the setting information of the ring diaphragm cassette corresponding to the address of each mounting location of the condenser turret 35 using the setting information input unit 74, the address corresponds to those addresses. The address setting table to which the setting information of the ring diaphragm cassette is attached is stored in the storage unit 73.

  Similarly, an address setting table in which objective lens setting information is registered in association with the address of each mounting location of the revolver 26, and block setting information in association with the address of each mounting location of the filter block turret 19 are registered. The address setting table and the address setting table in which the setting information of the phase difference ring is registered in association with the address of each mounting location of the external phase difference turret 22 are stored in the storage unit 73.

  7 to 10 show an example of the address setting table stored in the storage unit 73. FIG.

  FIG. 7 shows an address setting table in which the setting information of the ring diaphragm cassette is registered in association with the address of each mounting location of the capacitor turret 35.

  For example, the setting information “open” indicating that the ring diaphragm cassette is not mounted is associated with the address number No11 at the mounting location identified by the address number No11. Also, address information No. 12 to No. 15 are associated with setting information “PH1” to “PH4” indicating the types of ring diaphragm cassettes mounted at the corresponding mounting locations.

  FIG. 8 shows an address setting table in which setting information of the objective lens is registered in association with the address of each mounting location of the revolver 26.

  For example, setting information “DL 10x” indicating the type of the objective lens attached to the attachment location of the address number No21 is associated with the address number No21, and the attachment location of the address number No22 is associated with the address number No22. Is associated with setting information “DM 20x” indicating the type of the objective lens mounted on the. Similarly, in the address numbers No. 23 to No. 26, setting information “P Fluor 40x”, “P Apo 60xW”, “Apo TIRF 60x” indicating the type of the objective lens mounted at the corresponding mounting location, and “Apo TIRF 100x” is associated.

  FIG. 9 shows an address setting table in which block setting information is registered in association with the address of each mounting location of the filter block turret 19.

  For example, the address number No31 is associated with setting information “open” indicating that no block is attached to the attachment location identified by the address number No31, and the address number No32 is associated with the address number No32. Setting information “UV-1A” indicating the type of block mounted at the mounting location is associated. Similarly, in the address numbers No. 33 to No. 36, setting information “BV-2A”, “B-2A”, “G-2A”, and “B-2A” indicating the types of blocks attached to the corresponding attachment locations, respectively. “Parallel plane glass” is associated. That is, the optical element block 52 including the parallel flat glass 41 of FIG. 3 is mounted at the mounting location identified by the address number No36.

  FIG. 10 shows an address setting table in which phase difference ring setting information is registered in association with the address of each mounting location of the external phase difference turret 22.

  For example, setting information “open” indicating that the phase difference ring is not mounted is associated with the mounting location identified by the address number No 41 in the address number No 41, and the address number No 42 has the address number Setting information “phase difference ring 40xPH3” indicating the type of the phase difference ring attached to the attachment location of No. 42 is associated. Similarly, setting information “phase difference ring 60xPH3” and “phase difference ring 100xPH4” indicating the type of the phase difference ring attached to the corresponding attachment location are associated with address numbers No43 and No44, respectively. Yes.

  In the microscope 11, when the address setting table as shown in FIGS. 7 to 10 is stored in the storage unit 73, a combination when the ring diaphragm cassette, the objective lens, the block, and the phase difference ring are used in combination is set. Is done.

  FIG. 11 shows an interlocking setting table in which combinations are set when the phase difference ring, the objective lens, the ring diaphragm cassette, and the block are used in an interlocking manner.

  For example, in the example of the interlocking setting table shown in FIG. 11, it is shown that the phase difference ring, the ring diaphragm cassette, and the block are simultaneously opened for observation. Further, the phase difference ring “phase difference ring 40xPH3” of address number No. 42, the objective lens “P Fluor 40x” of address number No. 23, the ring diaphragm cassette “PH3” of address number No. 14 and the block “parallel plane glass” of address number No. 36 It is shown that the observation is performed in combination.

  Similarly, the phase difference ring “phase difference ring 60xPH3” of address number No43, the objective lens “P Fluor 60x” of address number No25, the ring diaphragm cassette “PH3” of address number No14, and the block “open” of address number No31 Observing in combination, phase difference ring “phase difference ring 100xPH4” of address number No44, objective lens “P Fluor 100x” of address number No26, ring diaphragm cassette “PH4” of address number No15, and address number No31 It is shown that the observation is performed in combination with the block “open”. In addition, when the block of the filter block turret 19 is “open”, the mounting location where the block of the filter block turret 19 is not mounted is disposed on the optical axis L1, and the observation light passes through the opening 54 (FIG. 3).

  Next, FIG. 12 is a flowchart for explaining processing for registering the address setting table and the linkage setting table.

  For example, when the user operates the setting information input unit 74 of FIG. 6 so as to start the process of registering the address setting table and the interlocking setting table, the process is started, and the microcomputer 72 is set by the user in step S11. The setting information input via the information input unit 74 is acquired. In step S12, the setting information acquired in step S11 is registered in the address setting table (FIGS. 7 to 10) and stored in the storage unit 73.

  For example, the user can input the various setting information shown in FIGS. 7 to 10 by operating the setting information input unit 74 including a keyboard. In addition, for example, setting information of items that can be attached to the capacitor turret 35, the revolver 26, the filter block turret 19, and the external phase difference turret 22 is stored in the storage unit 73, and the microcomputer 72 stores the setting information. The setting information may be input by presenting to the user and selecting the setting information by operating the setting information input unit 74 such as a mouse.

  After the process of step S12, the process proceeds to step S13, and the microcomputer 72 determines whether or not the setting table is completed. For example, the microcomputer 72 determines that the setting table is completed when all the setting information for each setting table shown in FIGS. 7 to 10 is input. For example, the microcomputer 72 performs an operation to the effect that the user has completed the setting information input to the setting information input unit 74, and when the setting information input unit 74 is notified to that effect, the setting table is completed. It is determined that

  If the microcomputer 72 determines in step S13 that the setting table has not been completed, the process returns to step S11, and the same process is repeated thereafter. On the other hand, if the microcomputer 72 determines in step S13 that the setting table has been completed, the process proceeds to step S14.

  In step S14, the microcomputer 72 acquires interlocking information (information indicating a combination as shown in FIG. 11) input by the user via the setting information input unit 74, and the process proceeds to step S15. For example, appropriate combinations are stored in advance in the storage unit 73, and the microcomputer 72 presents these combinations to the user, and the interlocking information is input by the user's selection.

  In step S15, the microcomputer 72 creates the interlocking information table of FIG. 11 based on the interlocking information acquired in step S14 and stores it in the storage unit 73, and the process ends.

  As described above, the address setting table and the interlock setting table are registered, and the microcomputer 72 refers to the interlock setting table and rotates the condenser turret 35, the revolver 26, and the filter block turret 19 via the motors 77a to 77c. To control.

  For example, when the user rotates the external phase difference turret 22 and arranges the phase difference ring “phase difference ring 40xPH3” corresponding to the address number No42 on the optical axis L3, the address detecting device 76d sets the address number No42 to micro. The computer 72 is notified. Thereby, the microcomputer 72 refers to the interlocking information table of FIG. 11 stored in the storage unit 73 and corresponds to the address number No23 of the revolver 26 associated with the address number No42 of the external phase difference turret 22. Observation is performed with a combination of the objective lens “P Fluor 40x”, the ring diaphragm cassette “PH3” corresponding to the address number No. 14 of the condenser turret 35, and the block “parallel plane glass” corresponding to the address number No. 36 of the filter block turret 19 As shown, the condenser turret 35, the revolver 26, and the filter block turret 19 are rotationally driven via the motors 77a to 77c.

  When the phase difference observation is completed and the user rotates the external phase difference turret 22 to release the address number No41, control is performed to open the ring diaphragm cassette and the block in conjunction with this operation. That is, in this case, the address number No11 of the capacitor turret 35 and the address number No31 of the filter block turret 19 are designated and opened, and the normal lens “P Fluor 40x” used in the phase difference observation is used. It becomes a bright field observation state.

  As described above, in the microscope 11, in the phase difference observation, when the user places the phase difference ring on the optical axis L3, the parallel plane glass 41 is automatically inserted into the optical axis L1, and the pupil conjugate plane F3 (FIG. 2). ) Is changed within the adjustment range of the phase difference ring. Thereby, while being able to perform phase difference observation reliably, the effort concerning observation can be abbreviate | omitted and the operativity of the microscope 11 can be improved.

  For example, in the microscope 11, the centering adjustment with respect to the optical axis L1 of the ring diaphragm of the condenser turret 35, the centering adjustment with respect to the optical axis L3 of each phase difference ring of the external phase difference turret 22, and the phase difference on the pupil conjugate plane F3. By performing the adjustment for matching the rings before the observation, the phase difference observation can be performed only by the rotation of the external phase difference turret 22.

  Next, FIG. 13 is a block diagram illustrating a configuration example of another embodiment of the microscope 11.

  In the microscope 11 shown in FIG. 13, blocks that are the same as those in the microscope 11 of FIG. 6 are given the same reference numerals, and description thereof will be omitted below as appropriate.

  13 is different from the microscope 11 in FIG. 6 in that the control device 71 includes an observation mode designation switch 78 and a motor 77d that rotates the external phase difference turret 22. Thus, it is common with the microscope 11 of FIG.

  The observation mode designation switch 78 is operated when designating whether to perform phase difference observation or bright field observation with the microscope 11.

  Further, in the microscope 11 of FIG. 13, an interlocking setting table as shown in FIG. 14 is registered.

  For example, when phase difference observation is designated by the observation mode designation switch 78, observation is performed with a combination of an objective lens, a ring diaphragm cassette, a block, and a phase difference ring as shown in the interlocking setting table of FIG. Controls are performed in conjunction with each other.

  Specifically, when the phase difference observation is designated by the observation mode designation switch 78 when the objective lens “P Fluor 40x” is arranged on the optical axis L1, the objective lens “P” is designated by the address detection device 76b. The address number No 23 of the revolver 26 corresponding to “Fluor 40x” is detected and notified to the microcomputer 72.

  Thereby, the microcomputer 72 refers to the interlock setting table of FIG. 14, and the ring diaphragm cassette “PH3” corresponding to the address number No. 14 of the condenser turret 35 corresponding to the objective lens “P Fluor 40x”, the filter block The motor is so observed that the combination of the block “parallel plane glass” corresponding to the address number No. 36 of the turret 19 and the phase difference ring “phase difference ring 40xPH3” corresponding to the address number No. 42 of the external phase difference turret 22 The condenser turret 35, the filter block turret 19, and the external phase difference turret 22 are rotationally driven through 77a, 77c, and 77d.

  For example, when bright field observation is designated by the observation mode designation switch 78 thereafter, control is performed to open all of the ring diaphragm cassette, block, and phase difference ring. That is, in this case, the address number No11 of the capacitor turret 35, the address number No31 of the filter block turret 19, and the address number No41 of the external phase difference turret 22 are designated and opened, and are used for phase difference observation. Normal bright-field observation with the objective lens “P Fluor 40x”.

  As described above, in the microscope 11, when a predetermined objective lens is selected in the phase difference observation, the parallel plane glass 41 is automatically inserted into the optical axis L1, and the pupil conjugate plane F3 (FIG. 2) is the phase difference ring. It is changed within the adjustment range. Thereby, while being able to perform phase difference observation reliably, the effort concerning observation can be abbreviate | omitted and the operativity of the microscope 11 can be improved.

  In the microscope 11 shown in FIG. 1, the phase difference ring arranged on the optical axis L3 is switched by rotating the external phase difference turret 22 using the external phase difference turret 22, The phase difference ring may be switched using a slider in which the phase difference ring is linearly arranged.

  That is, FIG. 15 is a perspective view of the microscope 11 'that switches the phase difference ring using a slider.

  In the microscope 11 ′ in FIG. 15, blocks that are the same as those in the microscope 11 in FIG. 1 are given the same reference numerals, and description thereof will be omitted below as appropriate.

  That is, the microscope 11 ′ of FIG. 15 is different from the microscope 11 of FIG. 1 in that a slider 81 is provided instead of the external phase difference turret 22 of FIG. 1, and the microscope 11 ′ of FIG. Common.

  In the microscope 11 ′, the phase difference ring arranged on the optical axis L3 is switched by sliding the slider 81 to the left and right, and the operation unit 81a is operated (rotated) to thereby move the phase difference ring in the direction of the optical axis L3. The position of can be adjusted. Further, the motor 77d shown in FIG. 13 slides the slider 81 to perform the interlocked control as described above.

  The program executed by the computer may be a program that is processed in time series in the order described in this specification, or in parallel or at a necessary timing such as when a call is made. It may be a program for processing. Further, the program may be processed by a single CPU, or may be processed in a distributed manner by a plurality of CPUs.

  The program executed by the microcomputer 72 is stored in the storage unit 73 and can be installed and updated in the storage unit 73 via a communication unit or a recording medium (not shown) as necessary.

  Further, the present invention is not only applied to a microscope having a phase difference ring having different performances, for example, in a microscope in which a single phase difference ring is installed on the pupil conjugate plane on the image plane side of the objective lens. Fine adjustment of the position of the pupil conjugate plane may be performed by inserting an optical path length changing member such as a parallel plane glass into the optical path.

  The embodiment of the present invention is not limited to the above-described embodiment, and various modifications can be made without departing from the gist of the present invention. For example, the present invention can be applied to a differential interference observation system. It is.

It is a perspective view which shows one Embodiment of the microscope to which this invention is applied. It is a figure explaining the movement of the pupil conjugate plane by inserting parallel plane glass into the optical system of the microscope. It is a figure explaining the filter block turret 19. FIG. FIG. 6 is a perspective view and a cross-sectional view of the filter block 51. 2 is a perspective view and a cross-sectional view of the optical element block 52. FIG. 3 is a block diagram illustrating a configuration example of a microscope 11. FIG. It is a figure which shows the address setting table in which the setting information of the ring aperture cassette of the capacitor | condenser turret 35 was registered. It is a figure which shows the address setting table in which the setting information of the objective lens of the revolver was registered. It is a figure which shows the address setting table in which the setting information of the block of the filter block turret 19 was registered. It is a figure which shows the address setting table in which the setting information of the phase difference ring of the external phase difference turret 22 was registered. It is a figure which shows a linkage setting table. It is a flowchart explaining the process which registers an address setting table and an interlocking setting table. It is a block diagram which shows the structural example of other embodiment of the microscope 11. FIG. It is a figure which shows a linkage setting table. It is a perspective view of microscope 11 'which switches a phase difference ring using a slider.

  11 microscope, 12 specimens, 13 stage, 14 objective lens, 15 main body, 16 lens barrel, 17L and 17R eyepiece, 18 lens barrel base unit 18, 19 filter block turret, 20 camera, 21 camera port, 22 external phase difference Turret, 22a Operation part 23 Camera, 24 Camera port, 25 Adjustment member, 26 Revolver, 27 Arm part, 28 Epi-illumination device for epi-fluorescence, 29 Base member, 30 Support member, 31 Post, 32 Illumination device for transmitted illumination, 33 Arm , 34 condenser lens, 35 condenser turret, 36 support arm, 41 parallel plane glass, 42 imaging lens, 43 mirror, 44 field lens, 45 mirror, 46 and 47 relay lens, 8 mirrors, 51a to 51d filter block, 52 optical element block, 53 mounting portion, 54 opening, 55 and 56 notch, 57 and 58 fitting portion, 61 filter, 62 dichroic mirror, 63 filter, 71 control device, 72 microcomputer, 73 storage unit, 74 setting information input unit, 75 operation command switch, 76a to 76d address detection device, 77a to 77d motor, 81 slider, 81a operation unit

Claims (4)

An objective lens;
An observation optical element disposed on the image side pupil conjugate plane conjugate with the pupil plane of the objective lens;
A filter block switching device to which a filter block that is detachably arranged in an optical path of light from the objective lens when irradiating the sample with illumination light; and
And a pupil plane moving optical element for moving the image-side pupil conjugate plane along the optical axis between said objective lens said observation optical element,
The microscope apparatus, wherein the pupil plane moving optical element is mounted on the filter block switching device using a mounting portion that mounts the filter block on the filter block switching device. The microscope according to claim 1, wherein the observation optical element is a phase difference ring, and a position where the phase difference ring is arranged can be adjusted in the optical axis direction within a predetermined adjustment range. apparatus. 3. The pupil plane moving optical element is a parallel plane glass in which both surfaces orthogonal to the optical axis of the optical path are formed in parallel and flat when installed in the optical path. Microscope equipment. One or more observation optical elements are mounted, and an observation optical element switching unit that switches the observation optical elements disposed on the image-side pupil conjugate plane;
Pupil plane moving optical element insertion / removal means for inserting / removing the pupil plane moving optical element into / from the optical path;
In accordance with the observation optical element disposed on the image-side pupil conjugate plane by the observation optical element switching unit, the pupil plane movement optical element insertion / removal unit is driven to change the pupil plane movement optical element to the The microscope apparatus according to claim 1, further comprising a control unit arranged in the optical path.

Images