JP4993545B2 - Electronic component and method for manufacturing electronic component - Google Patents

Description

  The present invention relates to an electronic component and a method for manufacturing the electronic component, and more particularly to an electronic component having a structure in which an external electrode is formed on the surface of an electronic component main body and a method for manufacturing the electronic component.

  One typical electronic component is, for example, a chip-type multilayer ceramic capacitor as shown in FIG. This multilayer ceramic capacitor has a plurality of internal electrodes 53a, 53b disposed so as to face each other with the ceramic layer 52 interposed therebetween, and both end surfaces of the ceramic element 51 in which one end sides are alternately drawn to different end surfaces. A pair of external electrodes 55a and 55b are provided on the 54a and 54b so as to be electrically connected to the internal electrodes 53a and 53b.

And in such a multilayer ceramic electronic component (multilayer ceramic capacitor), as a multilayer ceramic electronic component provided with an external electrode having a high strength against the deflection of the circuit substrate when mounted on the circuit substrate, and having excellent sealing properties, As shown in FIG. 5, the external electrodes 55a and 55b are provided with first electrode layers 56a and 56b formed on the surface of the ceramic element 51, and a second electrode layer 57a formed on the first electrode layers 56a and 56b. , 57b, and the relationship between the glass frit content G1 in the first electrode layers 56a and 56b and the glass frit content G2 in the second electrode layers 57a and 57b is G1 ≧ G2. The thickness T1 of the first electrode layers 56a and 56b is 20 μm or more, the glass frit content G1 is 5 vol% or more, and the thickness T2 of the second electrode layers 57a and 57b is 50 μm. Lower multilayer ceramic electronic component has been proposed in which the glass frit content G2 than 15 vol% (see Patent Document 1).
In FIG. 5, the parts denoted by the same reference numerals as those in FIG. 4 indicate the same or corresponding parts.

  In this multilayer ceramic electronic component, the sealing performance is ensured by the first electrode layers 56a and 56b having a high glass frit content ratio, and the porous second electrode layers 57a and 57b having a low glass frit content ratio are externally provided. It is possible to relieve the stress from the solder and improve the resistance (flexure strength) to the stress generated when the solder and conductive adhesive harden, and the stress caused by the flexure of the board, etc. The second electrode layers 57a and 57b having the above can improve the bondability with the conductive adhesive, and can be mounted with high reliability even when mounted using the conductive adhesive. Has been.

  However, in the structure of this multilayer ceramic electronic component, if the denseness of the second electrode layers 57a and 57b is lowered, the fixing strength between the first electrode layers 56a and 56b and the second electrode layers 57a and 57b becomes insufficient. In addition, the fixing strength of the external electrodes 55a and 55b with the ceramic element 51 as a whole becomes insufficient, and as a result, a sufficient fixing force cannot be secured when mounted on the mounting board. There is. In addition, when the peeling test of the external electrodes 55a and 55b from the ceramic element 51 is performed, peeling occurs at the interface between the first electrode layers 56a and 56b and the second electrode layers 57a and 57b constituting the external electrodes 55a and 55b. Not only the tip of the second electrode layers 57a and 57b at the tip of the external electrode exceeds the tip of the first electrode layers 56a and 56b, but is joined to the ceramic element 51. It has been confirmed that peeling occurs at the interface between the second electrode layers 57a and 57b.

Moreover, in the multilayer ceramic electronic component (multilayer ceramic capacitor) corresponding to the conductive adhesive configured so that it can be mounted using the conductive adhesive, for example, the dimensions are length: 2.0 mm, width: When mounting large multilayer ceramic capacitors such as 1.25mm and height: 0.85mm on automobile mounting boards, it is important to ensure the adhesion between the mounting board and the multilayer ceramic capacitors from the viewpoint of earthquake resistance. (For example, according to the request of an automobile manufacturer, an adhesion force of 12 N or more is required in an adhesion strength test). Note that if the mounting force between the mounting substrate and the multilayer ceramic capacitor is insufficient, the multilayer ceramic capacitor may fall off the mounting substrate.
JP 2002-203737 A

  The present invention solves the above-described problems, and provides an electronic component having an external electrode having a high bonding strength with an electronic component main body, having a high adhering force to a mounting substrate, and high mounting reliability, and a method for manufacturing the same. For the purpose.

In order to solve the above problems, the electronic component of the present invention (Claim 1) is:
An electronic component comprising an electronic component body and an external electrode formed on the surface of the electronic component body,
The external electrode is
A first sintered electrode layer mainly composed of a base metal;
A second sintered electrode layer mainly composed of a noble metal, which is formed on the first sintered electrode layer so as to cover the entire surface of the first sintered electrode layer;
And a glass layer covering 30 to 99% of the surface of the first sintered electrode layer, which is formed at the interface between the first sintered electrode layer and the second sintered electrode layer. It is characterized by this.

  According to a second aspect of the present invention, there is provided the electronic component according to the first aspect, wherein the material constituting the first sintered electrode layer is mainly composed of Cu, and the second sintered electrode layer Is characterized in that the main component is an Ag—Pd alloy containing Pd in a proportion of 8% by weight or less of Ag.

Moreover, the manufacturing method of the electronic component of the present invention (Claim 3) is as follows:
An electronic component main body; and an external electrode formed on a surface of the electronic component main body, wherein the external electrode includes a first sintered electrode layer mainly composed of a base metal, and the first sintered electrode layer. An electron having a second sintered electrode layer mainly composed of a noble metal and a glass layer formed at an interface between the first sintered electrode layer and the second sintered electrode layer. A method of manufacturing a component,
(a) A method in which a base metal as a main component metal and a first conductive paste containing first glass are immersed on the surface of the electronic component main body in the first conductive paste. and forming the first sintered electrode layer by baking in applying to,
(b) A second conductive paste containing a noble metal as a main component metal and a second glass having a total solid content of 23 to 50% by volume so as to cover the entire surface of the first sintered electrode layer. The electronic component main body is applied and baked by a method of immersing the electronic component main body in the second conductive paste, thereby forming the second sintered electrode layer and being included in the first sintered electrode layer. By precipitating the first glass and the second glass contained in the second sintered electrode layer, at the interface between the first sintered electrode layer and the second sintered electrode layer. And a step of forming the glass layer covering 30 to 99% of the surface of the first sintered electrode layer.

  According to a fourth aspect of the present invention, there is provided a method for manufacturing an electronic component according to the third aspect of the invention, wherein the first conductive paste contains Cu powder as a main conductive component, and the second conductive paste includes The main conductive component is Ag-Pd powder containing Pd in a proportion of 8% by weight or less of Ag.

The electronic component of the present invention (Claim 1) is an electronic component including an electronic component main body and an external electrode formed on the surface of the electronic component main body. A second electrode layer comprising a noble metal as a main component, formed on the first electrode layer, on the first electrode layer, so as to cover the entire surface of the first electrode layer; Since it is set as the structure provided with the glass layer which covers 30 to 99% of the surface of the 1st sintered electrode layer formed in the interface of this sintered electrode layer and the 2nd sintered electrode layer, it is an electronic component. bonding strength between the main body is provided with a large peeling difficulty have external electrodes, bonding strength between the mounting substrate is rather large, it is possible to provide a highly mounting reliability electronic components.
Further, the first sintered electrode layer is formed at the interface between the first sintered electrode layer and the second sintered electrode layer by the glass layer covering 30 to 99% of the surface of the first sintered electrode layer. Adhesive strength between the electrode layer and the second sintered electrode layer is ensured, so that the adhering strength to the mounting substrate, which is suitable for in-vehicle use that requires an adhering force of 12 N or more, for example, is sufficient. It is possible to obtain a large and highly reliable electronic component.

  In addition, as described above, the invention of the present application uses the external electrode as the first sintered electrode layer mainly composed of a base metal, the second sintered electrode layer mainly composed of a noble metal, and the first sintered electrode layer. Since it is set as the structure provided with the glass layer which covers 30 to 99% of the surface of the 1st sintered electrode layer formed in the interface of an electrode layer and a 2nd sintered electrode layer, It is like Claim 2. In addition, the first sintered electrode layer is mainly composed of Cu, and the second sintered electrode layer is mainly composed of an Ag—Pd alloy containing Pd in a proportion of 8% by weight or less of Ag. Even in such a case, it is possible to form an external electrode that has a high bonding strength with the electronic component body and is difficult to peel off, and has a high bonding strength to the mounting substrate, and an electronic component with excellent mounting reliability is obtained. It becomes possible.

  Further, as described above, Cu is used as the main component of the first sintered electrode layer, and Pd in the Ag—Pd alloy that is the constituent material of the second sintered electrode layer is 8% by weight or less of Ag. When the content of expensive Pd is reduced as a small proportion and the cost is reduced, the first diffusion is caused by mutual diffusion of Cu in the first sintered electrode layer and Pd in the second sintered electrode layer. Although the adhesion force between the sintered electrode layer and the second sintered electrode layer is reduced, the glass layer can secure the adhesion between the first sintered electrode layer and the second sintered electrode layer. It is possible to reduce the cost without deteriorating the characteristics of the external electrode.

Moreover, the manufacturing method of the electronic component of the present invention (Claim 3) includes the electronic component main body and an external electrode formed on the surface of the electronic component main body, and the external electrode is a first component mainly composed of a base metal. A sintered electrode layer, a second sintered electrode layer mainly composed of a noble metal formed on the first sintered electrode layer, a first sintered electrode layer, and a second sintered electrode layer; When manufacturing an electronic component having a glass layer formed at the interface of (a) a first conductive paste containing a base metal as a main component metal and a first glass on the surface of the electronic component body Forming the first sintered electrode layer by applying and baking the electronic component body in the first conductive paste, and (b) the surface of the first sintered electrode layer. A precious metal as a main component metal and a second gas having a total solid content of 23 to 50% by volume so as to cover the whole. The second conductive paste containing lath is applied and baked by immersing the electronic component main body in the second conductive paste to form a second sintered electrode layer, and the first By depositing the first glass contained in the sintered electrode layer and the second glass contained in the second sintered electrode layer, the first sintered electrode layer and the second sintered electrode layer And a step of forming a glass layer covering 30 to 99% of the surface of the first sintered electrode layer at the interface, so that the external electrode of the electronic component according to claim 1 is provided. External electrodes, that is, a first sintered electrode layer mainly composed of a base metal, a second sintered electrode layer mainly composed of a noble metal, a first sintered electrode layer and a second sintered electrode And a glass layer covering 30 to 99% of the surface of the first sintered electrode layer formed at the interface with the layer. An electrode, hardly peeled large bonding strength between the electronic component body, and it is possible bonding strength between the mounting substrate to provide an electronic component having excellent large mounting reliability.
As the first glass, B-Si-K-based glass can be used, and as the second glass, B-Si-alkali metal-Ti, Zr-based glass can be used. is there. However, other glass can be used as the first and second glasses.

  In addition, as in the method of manufacturing an electronic component according to claim 4, the first conductive paste having Cu powder as a main conductive component is used, and Pd is 8 wt% or less of Ag as the second conductive paste. By using an Ag—Pd powder containing a main component as a main conductive component, a first sintered electrode layer containing Cu as a main component and Ag— containing Pd in a proportion of 8% by weight or less of Ag. 30 of the surface of the 1st sintered electrode layer formed in the interface of the 2nd sintered electrode layer which has Pd powder as a main component, and the 1st sintered electrode layer and the 2nd sintered electrode layer It becomes possible to efficiently manufacture an electronic component including an external electrode having a configuration including a glass layer covering ˜99%, and the present invention can be more effectively realized.

  The features of the present invention will be described in more detail below with reference to examples of the present invention.

  FIG. 1 is a cross-sectional view showing a configuration of an electronic component (a multilayer ceramic capacitor in this embodiment) manufactured by an electronic component manufacturing method according to an embodiment (Example 1) of the present invention, and FIG. FIG.

  As shown in FIG. 1, the multilayer ceramic capacitor of Example 1 is provided such that a plurality of internal electrodes (for example, Ni electrodes) 2a and 2b face each other with a ceramic layer 3 interposed therebetween, and are alternately reversed. A pair of external electrodes 5a and 5b are disposed in a ceramic element (electronic component main body) 1 drawn out on the side end faces 4a and 4b so as to be electrically connected to the internal electrodes 2a and 2b.

  In the multilayer ceramic capacitor of this embodiment, the external electrodes 5a and 5b are composed of Cu sintered electrode layers 6a and 6b, which are first sintered electrode layers, and Cu baked electrode layer (first sintered electrode layer) 6a. , 6b, Ag-Pd baked electrode layers 7a, 7b as second sintered electrode layers, Cu baked electrode layers (first sintered electrode layers) 6a, 6b, and Ag-Pd baked electrodes. Glass layers 8a and 8b covering 30 to 99% of the surfaces of the Cu-baked electrode layers (first sintered electrode layers) 6a and 6b formed at the interfaces of the layers (second sintered electrode layers) 7a and 7b. And.

Hereinafter, a method for manufacturing the multilayer ceramic capacitor will be described.
(1) First, as a conductive paste for forming the first sintered electrode layer, Cu powder and a glass frit composed mainly of B-Si-K glass having a softening point of about 750 ° C. are mixed. After that, an appropriate amount of an organic vehicle is added, and the resulting mixture is mixed and dispersed with a three roll to produce a conductive paste for the first sintered electrode layer.
In addition, the ratio of the total solid (Cu powder + total amount of glass frit) in the conductive paste is 20% by volume.
In the conductive paste for the first sintered electrode layer, the ratio of the glass frit in the total solid content can be adjusted in the range of 23 to 50% by volume. The ratio of glass frit in the solid content was 30%.

(2) As the conductive paste for forming the second sintered electrode layer, Ag-Pd powder and B-Si-alkali metal-Ti, Zr-based glass having a softening point of about 600 ° C. are mainly used. After mixing the glass frit as a component, an appropriate amount of an organic vehicle is added, and the resulting mixture is mixed and dispersed with a three roll to produce a conductive paste for the second sintered electrode layer.
In this example, Ag-Pd powder having a Pd ratio of 5% by weight was used.
In addition, the ratio of the total solid content (total amount of Ag-Pd powder + glass frit) in the conductive paste for the second sintered electrode layer is 20% by volume.
In Example 1, a plurality of types of conductive pastes were produced in which the ratio of glass frit in the total solid content was changed in the range of 15, 20, 23, 25, 30, 40, 50, 60 volume%. .
In the present invention, the range of the glass frit in the total solid content in the conductive paste for the second sintered electrode layer is 23 to 50% by volume, and the ratio of the glass frit in the above total solid content 15% by volume, will be outside the scope of the invention that a 20 vol% and 60 vol%.

  (3) Then, both end surfaces of the fired ceramic element (electronic component main body) 1 are immersed in a conductive paste for the first sintered electrode layer, and first sintered on both end surfaces of the ceramic element 1. After applying the conductive paste for the electrode layer, it is dried. In addition, the target value of the coating thickness of the conductive paste for the first sintered electrode layer after drying was set to 0.05 mm.

  (4) Then, by baking the conductive paste for the first sintered electrode layer under the conditions of oxygen concentration of 0 to 5 ppm, maximum temperature of 850 ° C., and holding time of 10 minutes, Cu which is the first sintered electrode layer Baking electrode layers 6a and 6b are formed.

  (5) Next, both end surfaces of the ceramic element (electronic component main body) 1 having the Cu-baked electrode layers (first sintered electrode layers) 6a and 6b formed on both end surfaces are connected to the second sintered electrode layers. The conductive paste is immersed in the conductive paste for application, the conductive paste for the second sintered electrode layer is applied to both end faces of the ceramic element 1, and then dried. The target thickness of the conductive paste for the second sintered electrode layer after drying was set to 0.05 mm.

  (6) Then, by baking the conductive paste for the second sintered electrode layer under the conditions of oxygen concentration of 0 to 5 ppm, maximum temperature of 700 ° C. and holding time of 25 minutes, the second sintered electrode layer, Ag, is obtained. -Pd-baked electrode layers 7a and 7b are formed.

  In the baking process of the conductive paste for the second sintered electrode layer, the second sintered electrode layers 7a and 7b are formed, and the first conductive paste (Cu burned electrode layers 6a and 6b) is formed. When the first glass contained and the second glass contained in the second conductive paste (Ag-Pd baked electrode layers 7a, 7b) are precipitated, the first sintered electrode layers 6a, 6b, Glass layers 8a and 8b covering 30 to 99% of the surface of the first sintered electrode layers 6a and 6b are formed at the interface with the second sintered electrode layers 7a and 7b. Thereby, a multilayer ceramic capacitor (sample) having a structure as shown in FIG. 1 is obtained.

Then, for the multilayer ceramic capacitor (sample) produced as described above,
(a) External electrode peel test
(b) External electrode adhesion strength measurement test
(c) Measurement of the rate of occurrence of failure of external electrode failure in the adhesion measurement test
(d) The coverage of the first sintered electrode layer with the glass layer was measured.

In addition, each test and each measurement were performed by the following methods.
[Peel test of external electrode]
FIG. 3A is a plan view for explaining a method of an external electrode peeling test, and FIG. 3B is a front view.
As shown in FIGS. 3 (a) and 3 (b), a sample (multilayer ceramic capacitor) S is placed on the adhesive tape 10, and is rotated once so that the direction parallel to the longitudinal direction is the rotational axis direction. The adhesive tape 10 in which the external electrode peeled off from the sample (multilayer ceramic capacitor) S was found to be defective.
In addition, the peeling test of the external electrode was performed on 10 samples, and the number of samples in which defects occurred was counted.

[External electrode adhesion strength measurement test]
A sample (multilayer ceramic capacitor) was bonded to an alumina substrate with a conductive adhesive, and a value obtained by applying a load in the width direction of the sample (0.5 mm / second) and rupturing was defined as a fixing force.
In addition, the adhesion strength measurement test of the external electrode was performed on 20 samples, and an average value was obtained.

[Measurement of the rate of failure of external electrode failure in the adhesive strength measurement test]
In the above adhesion force test, the case where the breakdown occurred in the external electrode was counted as a defective external electrode failure.

[Measurement of coverage ratio of first sintered electrode layer by glass layer]
Polish the surface of the sample (multilayer ceramic capacitor) in the direction parallel to the longitudinal direction and perpendicular to the main surface of the internal electrode to the center in the width direction of the sample (multilayer ceramic capacitor). SEM observation, measuring the length L2 of the glass layers 8a and 8b (total length of the portion where the glass layers 8a and 8b are formed) L1 and the first sintered electrode layers 6a and 6b, The coverage (%) of the first sintered electrode layers 6a and 6b by the glass layers 8a and 8b was obtained from the following equation.
Coverage ratio (%) = (total length of glass layer L1 / first sintered electrode layer length L2) × 100
In addition, the measurement of the coverage of the 1st sintered electrode layer by a glass layer was performed about ten samples, and the average value was calculated | required.
Table 1 shows the results of the above tests and measurements.

As shown in Table 1, in the case of Sample 1 having a glass frit content of 15% by volume in the second sintered electrode layer (sample of a comparative example outside the scope of the present invention), the second sintered electrode layer It was confirmed that the denseness of the first sintered electrode layer was low and the adhesion was small, and the coverage of the first sintered electrode layer by the glass layer at the interface between the first sintered electrode layer and the second sintered electrode layer was also low.
Moreover, in this sample 1 (comparative example outside the scope of the present invention), it was confirmed that the number of occurrences of defects in the peel test was large and the number of occurrences of external electrode failure defects in the adhesion force measurement test was large. .

In the case of Sample 2 in which the glass frit content in the second sintered electrode layer is 20% by volume , the fixing force is as large as 12N, and the glass layer at the interface between the first sintered electrode layer and the second sintered electrode layer It was confirmed that the coverage ratio of the first sintered electrode layer was as large as 30% . Further, in this sample 2 was not observed defective can have you the peel test, the occurrence of external electrodes breakdown failure in adhesive force measuring test was observed for one.

Further, in the case of Samples 3 to 7 (samples of Examples within the scope of the present invention) in which the glass frit content in the second sintered electrode layer is 23 to 50% by volume, the fixing force is as large as 19 to 23N, It was also confirmed that the coverage of the first sintered electrode layer with the glass layer at the interface was as large as 30 to 99%.
In Samples 3 to 7, the occurrence of defects in the peel test was not observed, and the occurrence of external electrode failure defects in the adhesion force measurement test was not observed.

  Further, in the case of Sample 8 (comparative example outside the scope of the present invention) in which the glass frit content in the second sintered electrode layer is 60% by volume, the adhering force is as large as 16 N, and there is no occurrence of defects in the peeling test. In addition, no failure of external electrode failure was observed in the adhesion strength measurement test, but the coverage ratio of the first sintered electrode layer by the glass layer at the interface was 100%. The case where electrical conduction of 2 sintered electrode layers was not taken was recognized.

From the above results, in the case of Samples 3 to 7 in which the glass frit content in the second sintered electrode layer is 23 to 50% by volume, an external electrode having high bonding strength with the electronic component main body is provided, and the mounting substrate is mounted. It was confirmed that a monolithic ceramic capacitor having a large adhesive strength and sufficiently high mounting reliability can be obtained.

  In the above embodiment, a multilayer ceramic capacitor has been described as an example. However, the present invention is not limited to a multilayer ceramic capacitor, but a multilayer varistor, a multilayer LC composite component, a multilayer circuit board, and other external electrodes on the surface of an electronic component body. It is possible to apply to various electronic parts provided with the same effect as in the case of the above embodiment.

Moreover, in the said Example, an external electrode is three layers of 1st sintered electrode layer 6a, 6b, 2nd sintered electrode layer 7a, 7b, and glass layer 8a, 8b located in both interface. Although and a second sintered electrode layers 7a, on 7b, for example, Ni plating layer to prevent leaching solder, Sn-plated layer and a solder plating layer to improve solder wettability, etc. It is also possible to form these layers, and the present invention includes a configuration including such an electrode layer.

  Moreover, in the said Example, it is a process for baking at 850 degreeC in the process of forming a 1st sintered electrode layer, forming a 2nd sintered electrode layer, and producing a glass layer, 2nd. In the baking process of the sintered electrode layer, the baking is performed at 700 ° C. These conditions are the kind of the conductive paste used for forming the first sintered electrode layer and the second sintered electrode layer, etc. Is determined as appropriate, and is not limited to the above embodiment.

  In addition, the present invention is not limited to the above-described embodiments in other points as well, and the thicknesses and constituent materials of the first sintered electrode layer and the second sintered electrode layer constituting the external electrode, Various types of applications and modifications can be made within the scope of the invention with respect to the types of materials constituting the electronic component main body, the specific configuration of the electronic component main body, the constituent material of the internal electrode, the presence or absence of the internal electrode, etc. is there.

As described above, in the present invention, the external electrode is composed of the first sintered electrode layer mainly composed of base metal, the second sintered electrode layer mainly composed of noble metal, and the first sintered electrode. Since it is set as the structure provided with the glass layer which covers 30 to 99% of the surface of the 1st sintered electrode layer formed in the interface of a layer and a 2nd sintered electrode layer, joining to an electronic component main body It is possible to obtain an electronic component having a high mounting reliability, including an external electrode having a high strength and a high fixing force to the mounting substrate.
Further, the first sintered electrode layer is formed at the interface between the first sintered electrode layer and the second sintered electrode layer by the glass layer covering 30 to 99% of the surface of the first sintered electrode layer. Adhesive strength between the electrode layer and the second sintered electrode layer is ensured, so that the adhering strength to the mounting substrate, which is suitable for in-vehicle use that requires an adhering force of 12 N or more, for example, is sufficient. It is possible to obtain a large and highly reliable electronic component.
Therefore, the present invention can be widely used for electronic parts used in various applications, and can be suitably used particularly for electronic parts such as multilayer ceramic capacitors that are mounted and used in automobiles.

It is sectional drawing which shows the structure of the electronic component (multilayer ceramic capacitor) manufactured by the manufacturing method of the electronic component concerning one Example (Example 1) of this invention. It is a figure which shows the principal part (polishing cross section) of the electronic component manufactured by the manufacturing method of the electronic component concerning one Example (Example 1) of this invention. (a) is a top view for demonstrating the peeling test method of an external electrode, (b) is a front view. It is sectional drawing which shows the structure of the conventional electronic component (multilayer ceramic capacitor). It is sectional drawing which shows the structure of the other conventional electronic component (multilayer ceramic capacitor).

1 Ceramic element (electronic component body)
2a, 2b Internal electrode 3 Ceramic layer 4a, 4b End face of ceramic element 5a, 5b External electrode 6a, 6b Cu baked electrode layer (first sintered electrode layer)
7a, 7b Ag-Pd baked electrode layer (second sintered electrode layer)
8a, 8b Glass layer S Sample (Multilayer ceramic capacitor)
10 Adhesive tape

Claims (4)

An electronic component comprising an electronic component body and an external electrode formed on the surface of the electronic component body,
The external electrode is
A first sintered electrode layer mainly composed of a base metal;
A second sintered electrode layer mainly composed of a noble metal, which is formed on the first sintered electrode layer so as to cover the entire surface of the first sintered electrode layer;
And a glass layer covering 30 to 99% of the surface of the first sintered electrode layer, which is formed at the interface between the first sintered electrode layer and the second sintered electrode layer. An electronic component characterized by this.   The material constituting the first sintered electrode layer is mainly composed of Cu, and the material constituting the second sintered electrode layer contains Pd in a proportion of 8% by weight or less of Ag. The electronic component according to claim 1, wherein the electronic component is mainly composed of an Ag—Pd alloy. An electronic component main body; and an external electrode formed on a surface of the electronic component main body, wherein the external electrode includes a first sintered electrode layer mainly composed of a base metal, and the first sintered electrode layer. An electron having a second sintered electrode layer mainly composed of a noble metal and a glass layer formed at an interface between the first sintered electrode layer and the second sintered electrode layer. A method of manufacturing a component,
(a) A method in which a base metal as a main component metal and a first conductive paste containing first glass are immersed on the surface of the electronic component main body in the first conductive paste. and forming the first sintered electrode layer by baking in applying to,
(b) A second conductive paste containing a noble metal as a main component metal and a second glass having a total solid content of 23 to 50% by volume so as to cover the entire surface of the first sintered electrode layer. The electronic component main body is applied and baked by a method of immersing the electronic component main body in the second conductive paste, thereby forming the second sintered electrode layer and being included in the first sintered electrode layer. By precipitating the first glass and the second glass contained in the second sintered electrode layer, at the interface between the first sintered electrode layer and the second sintered electrode layer. And a step of forming the glass layer covering 30% to 99% of the surface of the first sintered electrode layer.   The first conductive paste contains Cu powder as a main conductive component, and the second conductive paste contains Ag-Pd powder containing Pd at a ratio of 8% by weight or less of Ag as a main conductive component. The method of manufacturing an electronic component according to claim 3, wherein:

Images