JP4588414B2 - 内部欠陥検査方法および装置 - Google Patents
内部欠陥検査方法および装置 Download PDFInfo
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- JP4588414B2 JP4588414B2 JP2004313483A JP2004313483A JP4588414B2 JP 4588414 B2 JP4588414 B2 JP 4588414B2 JP 2004313483 A JP2004313483 A JP 2004313483A JP 2004313483 A JP2004313483 A JP 2004313483A JP 4588414 B2 JP4588414 B2 JP 4588414B2
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/60—Analysis of geometric attributes
- G06T7/66—Analysis of geometric attributes of image moments or centre of gravity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/419—Imaging computed tomograph
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30164—Workpiece; Machine component
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- Pulmonology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Geometry (AREA)
- Radiology & Medical Imaging (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Quality & Reliability (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Description
2 内部欠陥抽出手段
3 関連要素収集手段
4 特徴量計測手段
25 領域分割設定手段
26 関連要素収集手段
27 密度計測手段
Claims (2)
- 対象物のX線CT値データに基づいて前記対象物における中実部の内部欠陥を検査する内部欠陥検査方法において、
前記X線CT値データから内部欠陥抽出手段により前記内部欠陥を抽出するステップ、前記内部欠陥抽出手段で抽出された内部欠陥の部位およびその周囲に所定の広がりで設定される近傍範囲に含まれるX線CT値データを関連要素収集手段により収集するステップ、および前記内部欠陥の特徴量としての前記内部欠陥の大きさを前記関連要素収集手段で収集された前記X線CT値データに基づいて算出するステップを含み、前記内部欠陥の大きさは、内部欠陥の大きさ=内部欠陥の体積=(中実部のX線CT値×収集された全X線CT値データの数−収集された全X線CT値の合計)/(中実部のX線CT値−内部欠陥部位のX線CT値)として求めるようにされていることを特徴とする内部欠陥検査方法。 - 対象物のX線CT値データに基づいて前記対象物における中実部の内部欠陥を検査する内部欠陥検査装置において、
前記X線CT値データから前記内部欠陥を抽出する内部欠陥抽出手段、前記内部欠陥抽出手段で抽出された内部欠陥の部位およびその周囲に所定の広がりで設定される近傍範囲に含まれる前記X線CT値データを収集する関連要素収集手段、および前記内部欠陥の特徴量としての前記内部欠陥の大きさを前記関連要素収集手段で収集された前記X線CT値データに基づいて計測する特徴量計測手段を備え、前記内部欠陥の大きさは、内部欠陥の大きさ=内部欠陥の体積=(中実部のX線CT値×収集された全X線CT値データの数−収集された全X線CT値の合計)/(中実部のX線CT値−内部欠陥部位のX線CT値)として求めるようにされていることを特徴とする内部欠陥検査装置。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004313483A JP4588414B2 (ja) | 2004-10-28 | 2004-10-28 | 内部欠陥検査方法および装置 |
US11/259,251 US7933441B2 (en) | 2004-10-28 | 2005-10-27 | Method of inspection for inner defects of an object and apparatus for same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004313483A JP4588414B2 (ja) | 2004-10-28 | 2004-10-28 | 内部欠陥検査方法および装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2006125960A JP2006125960A (ja) | 2006-05-18 |
JP4588414B2 true JP4588414B2 (ja) | 2010-12-01 |
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JP2004313483A Expired - Fee Related JP4588414B2 (ja) | 2004-10-28 | 2004-10-28 | 内部欠陥検査方法および装置 |
Country Status (2)
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US (1) | US7933441B2 (ja) |
JP (1) | JP4588414B2 (ja) |
Families Citing this family (29)
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US7602963B2 (en) * | 2006-01-10 | 2009-10-13 | General Electric Company | Method and apparatus for finding anomalies in finished parts and/or assemblies |
US8280145B2 (en) | 2007-02-01 | 2012-10-02 | Kovarik James J | System for non-destructively examining degradation of an interior of a device |
US20100220910A1 (en) * | 2009-03-02 | 2010-09-02 | General Electric Company | Method and system for automated x-ray inspection of objects |
CN102023171B (zh) * | 2010-11-12 | 2012-07-25 | 航天材料及工艺研究所 | 用ct值定量表征复合材料内部夹杂缺陷类型的无损检测方法 |
US9340304B2 (en) | 2013-02-28 | 2016-05-17 | The Boeing Company | Aircraft comparison system |
US9612725B1 (en) | 2013-02-28 | 2017-04-04 | The Boeing Company | Nonconformance visualization system |
US9880694B2 (en) | 2013-05-09 | 2018-01-30 | The Boeing Company | Shop order status visualization system |
US10481768B2 (en) * | 2013-04-12 | 2019-11-19 | The Boeing Company | Nonconformance identification and visualization system and method |
US9870444B2 (en) | 2013-03-05 | 2018-01-16 | The Boeing Company | Shop order status visualization system |
US9292180B2 (en) | 2013-02-28 | 2016-03-22 | The Boeing Company | Locator system for three-dimensional visualization |
US9492900B2 (en) | 2013-03-15 | 2016-11-15 | The Boeing Company | Condition of assembly visualization system based on build cycles |
US10061481B2 (en) | 2013-02-28 | 2018-08-28 | The Boeing Company | Methods and devices for visually querying an aircraft based on an area of an image |
US10067650B2 (en) | 2013-06-20 | 2018-09-04 | The Boeing Company | Aircraft comparison system with synchronized displays |
US20140298216A1 (en) | 2013-03-28 | 2014-10-02 | The Boeing Company | Visualization of an Object Using a Visual Query System |
US10416857B2 (en) | 2013-05-09 | 2019-09-17 | The Boeing Company | Serial number control visualization system |
EP3006924B1 (en) | 2013-05-29 | 2019-09-11 | Tokyo Metropolitan Industrial Technology Research Institute | Device and method for image reconstruction at different x-ray energies |
CN105980838B (zh) | 2013-12-12 | 2019-04-16 | 通用电气公司 | 用于缺陷指示检测的方法 |
FR3015035B1 (fr) * | 2013-12-13 | 2016-01-22 | Safran | Mesure non intrusive de la densite volumique d'une phase dans une piece |
CN107076683B (zh) | 2014-09-02 | 2021-05-07 | 株式会社尼康 | 测量处理装置、测量处理方法、测量处理程序和用于制造该装置的方法 |
EP3190402B1 (en) | 2014-09-02 | 2023-10-18 | Nikon Corporation | Measurement processing device, x-ray inspection apparatus, method for manufacturing a structure, measurement processing method and measurement processing program |
CN104316546B (zh) * | 2014-10-23 | 2017-04-26 | 航天材料及工艺研究所 | 一种复合材料天线罩质量无损跟踪与评价方法 |
JP6483427B2 (ja) * | 2014-12-12 | 2019-03-13 | アンリツインフィビス株式会社 | X線検査装置 |
JP6359474B2 (ja) * | 2015-03-10 | 2018-07-18 | 株式会社東芝 | 放射線を用いたろう付け接合長さの定量評価のための装置および方法 |
JP6680470B2 (ja) | 2015-06-05 | 2020-04-15 | 地方独立行政法人東京都立産業技術研究センター | 画像取得装置及び画像取得方法並びに画像補正プログラム |
US10685147B2 (en) | 2016-02-29 | 2020-06-16 | The Boeing Company | Non-conformance mapping and visualization |
EP4328575A3 (en) * | 2016-07-29 | 2024-05-01 | Nikon Corporation | Setting method, inspection method, defect evaluation device and structure manufacturing method |
JP6885181B2 (ja) * | 2017-04-21 | 2021-06-09 | 日本精工株式会社 | 巣の評価方法 |
JP2019007972A (ja) * | 2018-08-20 | 2019-01-17 | 株式会社ニコン | 測定処理方法、測定処理装置、x線検査装置、および構造物の製造方法 |
CN109211945B (zh) * | 2018-08-22 | 2021-03-19 | 东南大学 | 一种基于离散元分析沥青混合料空隙结构的方法 |
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2005
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JP2006125960A (ja) | 2006-05-18 |
US7933441B2 (en) | 2011-04-26 |
US20060093082A1 (en) | 2006-05-04 |
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