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JP4361379B2 - Method for manufacturing electronic device package - Google Patents

Method for manufacturing electronic device package Download PDF

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JP4361379B2
JP4361379B2 JP2004013073A JP2004013073A JP4361379B2 JP 4361379 B2 JP4361379 B2 JP 4361379B2 JP 2004013073 A JP2004013073 A JP 2004013073A JP 2004013073 A JP2004013073 A JP 2004013073A JP 4361379 B2 JP4361379 B2 JP 4361379B2
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electronic device
substrate
sealing member
adhesive
particles
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JP2005209790A (en
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さやか 平船
龍夫 末益
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Fujikura Ltd
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Description

本発明は、電子デバイスを外部環境から保護するための封止部材が、接着剤層を介して所定の固定面に固定され、電子デバイスと封止部材との間に空隙が設けられてなる電子デバイスパッケージの製造方法に関するものである。 The present invention provides an electronic device in which a sealing member for protecting an electronic device from the external environment is fixed to a predetermined fixing surface via an adhesive layer, and a gap is provided between the electronic device and the sealing member. a method for manufacturing a device package.

電子デバイスは、一般的な半導体デバイスと同様に、外部環境からの保護を目的として、パッケージングされた状態で使用されている。   Similar to general semiconductor devices, electronic devices are used in a packaged state for the purpose of protection from the external environment.

電子デバイスのパッケージングでは、カバーガラスなどの封止部材が、電子デバイスを覆うように配され、接着剤を介して電子デバイスの設けられた基板に固定されている(例えば、特許文献1参照。)。
電子デバイスによっては、各種センサなどの感応部を備えているものがある。そのため、感度を劣化させることなく、電子デバイスを正常に機能させるためには、この感応部の湿気などによる機能低下を防止するために、電子デバイスのパッケージは気密性の高い構造である必要がある。
In packaging of an electronic device, a sealing member such as a cover glass is disposed so as to cover the electronic device, and is fixed to a substrate provided with the electronic device via an adhesive (see, for example, Patent Document 1). ).
Some electronic devices include sensitive parts such as various sensors. Therefore, in order to allow the electronic device to function normally without degrading the sensitivity, the package of the electronic device needs to have a highly airtight structure in order to prevent a functional deterioration due to moisture or the like of the sensitive portion. .

また、感応部の感度を劣化させることなく、電子デバイスを正常に機能させるためには、電子デバイスと封止部材との間には空隙が必要となる場合がある。この場合、感応部の感度を劣化させないためには、空隙の大きさがパッケージの全域において均一、すなわち、電子デバイスと封止部材との距離が常に一定でなければならない。   Moreover, in order to make an electronic device function normally without deteriorating the sensitivity of a sensitive part, a space | gap may be needed between an electronic device and a sealing member. In this case, in order not to deteriorate the sensitivity of the sensitive part, the size of the air gap must be uniform throughout the package, that is, the distance between the electronic device and the sealing member must always be constant.

しかしながら、半導体パッケージなどで、半導体デバイスを封止するために一般的に用いられる接着剤の中には透湿性の高いものがある。このような透湿性の高い接着剤を用いて電子デバイスのパッケージを作製すると、電子デバイスの機能が劣化するおそれがあった。   However, some adhesives commonly used for sealing semiconductor devices in semiconductor packages and the like have high moisture permeability. When an electronic device package is manufactured using such a highly moisture-permeable adhesive, the function of the electronic device may be deteriorated.

また、接着剤を介して、電子デバイスの設けられた基板と封止部材とを固定する際、接着剤の存在する領域には、熱および荷重が加えられる。すると、接着剤が変形し、そのままの状態で硬化してしまうので、電子デバイスと封止部材との距離(空隙の大きさ)を所定の大きさにすることができなかった。   Moreover, when fixing the board | substrate with which the electronic device was provided, and the sealing member via an adhesive agent, a heat | fever and a load are applied to the area | region where an adhesive agent exists. As a result, the adhesive is deformed and is cured as it is, so that the distance between the electronic device and the sealing member (the size of the gap) cannot be set to a predetermined size.

さらに、接着剤、基板、封止部材はそれぞれ材質が異なるから、これらの熱膨張係数も異なる。そのため、温度変化のある環境下では、これらの熱膨張率の格差により生じた応力により、基板、封止部材、電子デバイスなどに亀裂が生じて、使用できなくなることがあった。
特開平7−202152号公報
Furthermore, since the adhesive, the substrate, and the sealing member are different from each other, their thermal expansion coefficients are also different. For this reason, in an environment with a temperature change, the stress generated by the difference in the thermal expansion coefficient may cause cracks in the substrate, the sealing member, the electronic device, and the like, which may make it unusable.
JP-A-7-202152

本発明は、前記事情に鑑みてなされたもので、気密性が高く、接着剤層の厚みが一定で、かつ、接着剤層において、外部応力を緩和することのできる電子デバイスパッケージの製造方法を提供することを目的とする。 The present invention has been made in view of the above circumstances, high airtightness, a thickness of the adhesive layer is constant, and, in the adhesive layer, a method of manufacturing an electronic device package capable of alleviating the external stress The purpose is to provide.

本発明は、上記課題を解決するために、基板と、該基板の一方の面に設けられた電子デバイスと、該電子デバイスを覆うように配され、接着剤層を介して前記基板に固定された封止部材とを備え、前記電子デバイスと前記封止部材との間に空隙が設けられてな、前記接着剤層は、接着剤と、実質的に均一な粒径の多数の粒子とからなり、前記接着剤層における前記粒子の含有量が10体積%以上70体積%以下である電子デバイスパッケージの製造方法であって、前記電子デバイスが設けられた基板の一方の面に、粒子と接着剤との混合物を塗布した後、前記封止部材を前記基板に塗布された混合物上に載せた状態で、前記封止部材を数回摺り動かすか、または、前記封止部材に振動を加えることによって、前記封止部材と前記基板との間に前記粒子が一段に並んだ状態とする工程と、前記基板の一方の面に塗布された混合物を加熱するか、または、前記基板の一方の面に塗布された混合物に紫外線を照射することにより、前記接着剤を硬化させて、前記封止部材と前記基板との間に前記粒子が一列に並び、各粒子間が前記接着剤で埋められた接着剤層を形成するとともに、該接着剤層を介して前記基板の一方の面に、前記封止部材を接着固定する工程と、を有する電子デバイスの製造方法を提供する。 In order to solve the above problems, the present invention is arranged to cover a substrate, an electronic device provided on one surface of the substrate, and to cover the electronic device, and is fixed to the substrate via an adhesive layer. and a sealing member, the electronic device and Ri Na voids are provided between the sealing member, the adhesive layer, an adhesive, a large number of particles of substantially uniform particle size A method of manufacturing an electronic device package in which the content of the particles in the adhesive layer is 10% by volume or more and 70% by volume or less, on one surface of the substrate on which the electronic device is provided, After applying the mixture with the adhesive, the sealing member is slid several times or the vibration is applied to the sealing member while the sealing member is placed on the mixture applied to the substrate. Between the sealing member and the substrate By heating the mixture applied to one surface of the substrate, or irradiating the mixture applied to one surface of the substrate with ultraviolet rays, the step of bringing the particles in a line The adhesive is cured to form an adhesive layer in which the particles are aligned in a row between the sealing member and the substrate, and each particle is filled with the adhesive. And a step of adhering and fixing the sealing member to one surface of the substrate .

本発明の電子デバイスパッケージは、接着剤と、実質的に均一な粒径の多数の粒子とからなる接着剤層を介して、電子デバイスが設けられた基板に封止部材が固定されているから、電子デバイスパッケージの気密性が十分に確保され、湿気によって電子デバイスの機能が劣化するのを防止することができる。また、接着剤層に含まれる粒子によって、電子デバイスと封止部材との距離が一定に保たれ、両者の間に空隙が形成されるから、電子デバイスがイメージセンサなどである場合、その機能が損なわれることなく、十分に発揮される。また、接着剤と、基板および封止部材との接着面積が小さくなるので、接着剤層は、封止部材からの外部応力を電子デバイス側に直接伝えない応力緩和機能を発揮することができる。   In the electronic device package of the present invention, the sealing member is fixed to the substrate on which the electronic device is provided via an adhesive layer composed of an adhesive and a large number of particles having a substantially uniform particle size. The airtightness of the electronic device package is sufficiently ensured, and the function of the electronic device can be prevented from being deteriorated by moisture. Moreover, since the distance between the electronic device and the sealing member is kept constant by the particles contained in the adhesive layer, and a gap is formed between the two, the function of the electronic device is an image sensor or the like. It is fully demonstrated without being damaged. In addition, since the adhesive area between the adhesive, the substrate, and the sealing member is reduced, the adhesive layer can exhibit a stress relaxation function that does not directly transmit external stress from the sealing member to the electronic device side.

また、接着剤層における粒子の含有量を70体積%以下とすれば、電子デバイスパッケージの気密性を損なうことなく、電子デバイスと封止部材との距離を一定に保つことができる。   Moreover, if the content of the particles in the adhesive layer is 70% by volume or less, the distance between the electronic device and the sealing member can be kept constant without impairing the airtightness of the electronic device package.

また、接着剤層における粒子の粒子の熱膨張係数を、基板の熱膨張係数と封止部材の熱膨張係数との中間の値、または、両者のどちらか一方に近い値とすることにより、温度変化のある環境下においても、熱膨張係数の格差により生じた応力により、基板、電子デバイス、封止部材などに亀裂が生じるのを防止することができる。   In addition, by setting the thermal expansion coefficient of the particles in the adhesive layer to an intermediate value between the thermal expansion coefficient of the substrate and the thermal expansion coefficient of the sealing member, or a value close to one of the two, Even in a changing environment, it is possible to prevent the substrate, the electronic device, the sealing member, and the like from being cracked due to the stress caused by the difference in thermal expansion coefficient.

以下、本発明を実施した電子デバイスパッケージについて、図面を参照して説明する。   Hereinafter, an electronic device package embodying the present invention will be described with reference to the drawings.

図1は、本発明に係る電子デバイスパッケージの一実施形態を示す概略断面図である。図2は、図1中の符号Aで示す領域を拡大した概略断面図である。
図1、2中、符号11は基板、12は電子デバイス、20は接着剤層、21は接着剤、22は粒子、30は封止部材、40は電子デバイスパッケージ、41は空隙をそれぞれ示している。
FIG. 1 is a schematic cross-sectional view showing an embodiment of an electronic device package according to the present invention. FIG. 2 is an enlarged schematic cross-sectional view of a region indicated by a symbol A in FIG.
1 and 2, reference numeral 11 denotes a substrate, 12 denotes an electronic device, 20 denotes an adhesive layer, 21 denotes an adhesive, 22 denotes particles, 30 denotes a sealing member, 40 denotes an electronic device package, and 41 denotes a gap. Yes.

この実施形態において、電子デバイスパッケージ40は、基板11と、基板11の一方の面11aに設けられた電子デバイス12と、接着剤層20と、封止部材30とから概略構成されている。   In this embodiment, the electronic device package 40 is schematically configured from a substrate 11, an electronic device 12 provided on one surface 11 a of the substrate 11, an adhesive layer 20, and a sealing member 30.

電子デバイスパッケージ40では、電子デバイス12を覆うように配された封止部材30が、接着剤層20を介して基板11の一方の面11aにおける電子デバイス12が設けられていない部分に固定されている。また、接着剤層20には実質的に均一な粒径をなす多数の球状の粒子22が含まれており、この粒子22が基板11および封止部材30に当接するように接着剤層20を設けることにより、電子デバイス12と封止部材30との距離が一定に保たれ、両者の間に空隙41が設けられている。   In the electronic device package 40, the sealing member 30 disposed so as to cover the electronic device 12 is fixed to a portion of the one surface 11 a of the substrate 11 where the electronic device 12 is not provided via the adhesive layer 20. Yes. The adhesive layer 20 includes a large number of spherical particles 22 having a substantially uniform particle diameter, and the adhesive layer 20 is formed so that the particles 22 come into contact with the substrate 11 and the sealing member 30. By providing, the distance between the electronic device 12 and the sealing member 30 is kept constant, and a gap 41 is provided between them.

基板11としては、特に限定されず、これに設けられる電子デバイス12の機能や材質に適合させて選択され、その材質もプラスチック、金属、セラミックスなどから適宜選択される。   The substrate 11 is not particularly limited and is selected according to the function and material of the electronic device 12 provided on the substrate 11, and the material is appropriately selected from plastic, metal, ceramics, and the like.

電子デバイス12としては、MEMS(Micro Electro Mechanical System;微小電子機械システム)デバイス、一般的な半導体デバイスなどが適用される。具体的には、電子デバイス12としては、CCDイメージセンサやCMOSイメージセンサなどの固体撮像素子、半導体圧力センサ、LSI、IC、メモリ、発光素子、受光素子などの半導体素子、それらの半導体素子を搭載した電子回路、電子回路基板、固体撮像素子や半導体圧力センサ以外の各種センサと必要な検出回路を備えたセンサチップなどの各種電子デバイス、可動部を有する各種電子デバイスを適用することができる。   As the electronic device 12, a MEMS (Micro Electro Mechanical System) device, a general semiconductor device, or the like is applied. Specifically, as the electronic device 12, a solid-state imaging device such as a CCD image sensor or a CMOS image sensor, a semiconductor pressure sensor, a semiconductor device such as an LSI, an IC, a memory, a light emitting device, a light receiving device, or the like is mounted Various electronic devices such as an electronic circuit, an electronic circuit board, various sensors other than a solid-state imaging device and a semiconductor pressure sensor, and a sensor chip including a necessary detection circuit, and various electronic devices having a movable portion can be applied.

接着剤層20は、接着剤21と多数の粒子22とから構成されており、接着剤21が硬化されて形成されている。粒子22は、電子デバイス12と封止部材30との距離を一定に保つために用いられるが、接着剤21に粒子22を配合することにより、接着剤21と、基板11および封止部材30との接着面積が小さくなるので、接着剤層20は、封止部材30からの外部応力を電子デバイス12側に直接伝えない応力緩和機能を発揮することができる。   The adhesive layer 20 is composed of an adhesive 21 and a large number of particles 22, and is formed by curing the adhesive 21. The particles 22 are used to keep the distance between the electronic device 12 and the sealing member 30 constant. By blending the particles 22 with the adhesive 21, the adhesive 21, the substrate 11, and the sealing member 30 Therefore, the adhesive layer 20 can exhibit a stress relaxation function that does not directly transmit external stress from the sealing member 30 to the electronic device 12 side.

接着剤層20における粒子22の含有量は、70体積%以下であることが好ましく、10体積%以上70体積%以下であることがより好ましい。接着剤層20における粒子22の含有量が70体積%を超えると、接着剤層20における粒子22の占める割合が多くなり過ぎて、接着剤21と、基板11および封止部材30との接触面積が小さくなり過ぎる。その結果として、電子デバイスパッケージ40の気密性が損なわれる。また、接着剤層20の厚さを球状の粒子22の粒径で正確に調節するために、接着剤層20中で粒子22が多段に積層されることなく一段で存在していなければならない。したがって、接着剤層20における粒子22の含有量が70体積%を超えると、粒子22が塊を生じ易く、基板11と封止部材30との間に一段の粒子22が並んだ状態にならないおそれがある。   The content of the particles 22 in the adhesive layer 20 is preferably 70% by volume or less, and more preferably 10% by volume or more and 70% by volume or less. When the content of the particles 22 in the adhesive layer 20 exceeds 70% by volume, the proportion of the particles 22 in the adhesive layer 20 is excessive, and the contact area between the adhesive 21 and the substrate 11 and the sealing member 30 is increased. Becomes too small. As a result, the airtightness of the electronic device package 40 is impaired. Further, in order to accurately adjust the thickness of the adhesive layer 20 with the particle size of the spherical particles 22, the particles 22 must be present in a single stage without being stacked in multiple stages in the adhesive layer 20. Therefore, when the content of the particles 22 in the adhesive layer 20 exceeds 70% by volume, the particles 22 are likely to be agglomerated, and there is a possibility that the one-stage particles 22 are not arranged between the substrate 11 and the sealing member 30. There is.

接着剤21としては、電子デバイスパッケージ40の気密性を十分に確保し、湿気によって電子デバイス12の機能が劣化することを防止するために、吸水率が低い接着剤が好ましく、吸水率が1%(質量比)以下の接着剤がより好ましい。本発明では、接着剤の吸水率は、ASTM D570に準じて測定される。なお、吸水率が大きい接着剤を用いると、電子デバイスパッケージ40の気密性が損なわれ、接着剤層20を透過して空隙41内に浸入してきた湿気によって電子デバイス12の機能が劣化するおそれがある。   As the adhesive 21, an adhesive having a low water absorption rate is preferable in order to ensure sufficient airtightness of the electronic device package 40 and prevent the function of the electronic device 12 from being deteriorated by moisture, and the water absorption rate is 1%. (Mass ratio) The following adhesives are more preferable. In the present invention, the water absorption rate of the adhesive is measured according to ASTM D570. If an adhesive having a high water absorption rate is used, the airtightness of the electronic device package 40 is impaired, and the function of the electronic device 12 may be deteriorated by moisture that has permeated the adhesive layer 20 and entered the gap 41. is there.

接着剤21としては、例えば、ポリイミド樹脂接着剤、エポキシ樹脂接着剤、シアノアクリレート系接着剤、ホットメルト型接着剤などの各種の接着剤が挙げられるが、これらの中でも、吸水率が非常に低いことや取扱い易さなどの点からポリイミド樹脂接着剤が好ましい。   Examples of the adhesive 21 include various adhesives such as a polyimide resin adhesive, an epoxy resin adhesive, a cyanoacrylate adhesive, and a hot melt adhesive. Among these, the water absorption is very low. A polyimide resin adhesive is preferable from the viewpoints of handling and ease of handling.

粒子22としては、金属の粒、セラミックス、ガラスなどの無機材料ビーズ、またはポリスチレンビーズ、ポリエチレンビーズなどの合成樹脂ビーズが好適に用いられる。粒子22の形状は、球状に限定されないが、この球状粒子14と電子デバイス11側の面、および球状粒子14と固定面13とが点接触状態で接する構造を実現できることから、球状とするのが好ましい。   As the particles 22, inorganic particles such as metal particles, ceramics and glass, or synthetic resin beads such as polystyrene beads and polyethylene beads are preferably used. The shape of the particle 22 is not limited to a spherical shape, but it is possible to realize a structure in which the spherical particle 14 and the surface on the electronic device 11 side and the spherical particle 14 and the fixed surface 13 are in contact with each other in a point contact state. preferable.

この粒子22の粒径は、電子デバイス12と封止部材30との距離が一定に保たれ、両者の間に空隙41が形成されるように、また、接着剤層20が封止部材30からの外部応力を電子デバイス12側に直接伝えない応力緩和機能を発揮するために、接着剤層20が十分な厚さとなるように設定されており、通常は5μm以上、好ましくは10μm〜100μm程度とされる。  The particle size of the particles 22 is such that the distance between the electronic device 12 and the sealing member 30 is kept constant, and a gap 41 is formed between them, and the adhesive layer 20 is separated from the sealing member 30. In order to exhibit a stress relaxation function that does not directly transmit the external stress to the electronic device 12 side, the adhesive layer 20 is set to have a sufficient thickness, and is usually 5 μm or more, preferably about 10 μm to 100 μm. Is done.

また、粒子22の熱膨張係数(10−6/K)は、電子デバイス12が設けられている基板11の熱膨張係数と、封止部材30の熱膨張係数との中間の値、または、両者のどちらか一方に近い値であることが好ましい。粒子22の熱膨張係数がこのような値であれば、温度変化のある環境下においても、熱膨張係数の格差により生じた応力により、基板11、電子デバイス12、封止部材30などに亀裂が生じるのを防止することができる。 The thermal expansion coefficient (10 −6 / K) of the particles 22 is an intermediate value between the thermal expansion coefficient of the substrate 11 on which the electronic device 12 is provided and the thermal expansion coefficient of the sealing member 30, or both. It is preferable that it is a value close | similar to either one of these. If the thermal expansion coefficient of the particles 22 is such a value, cracks may occur in the substrate 11, the electronic device 12, the sealing member 30, and the like due to the stress caused by the difference in thermal expansion coefficient even in an environment with temperature changes. It can be prevented from occurring.

封止部材30としては、基板11との接合時温度における熱膨張係数が基板11に近い部材を選択することが望ましい。具体的には、パイレックス(登録商標)ガラス、あるいは、液晶基板に一般的に用いられるガラス基板などが好適である。また、電子デバイス12が、イメージセンサなどの光学特性が要求されるものである場合には、封止部材30は電子デバイス12の感度波長域、すなわち有効波長域に対して十分実用的な透過率を有する材料からなるものが用いられる。  As the sealing member 30, it is desirable to select a member having a coefficient of thermal expansion close to that of the substrate 11 at the bonding temperature with the substrate 11. Specifically, Pyrex (registered trademark) glass or a glass substrate generally used for a liquid crystal substrate is suitable. When the electronic device 12 is required to have optical characteristics such as an image sensor, the sealing member 30 has a sufficiently practical transmittance with respect to the sensitivity wavelength region of the electronic device 12, that is, the effective wavelength region. What consists of material which has is used.

また、空隙41の大きさは、電子デバイス12の機能に応じて適宜設定されるが、その大きさ(厚み)は、粒子22の大きさによって決定される。  The size of the void 41 is appropriately set according to the function of the electronic device 12, but the size (thickness) is determined by the size of the particles 22.

次に、図1および図2を用いて、本発明に係る電子デバイスパッケージの製造方法の一例について説明する。
先ず、電子デバイス12が一方の面11aに設けられた基板11を用意する。
次いで、接着剤層20を形成するための材料、すなわち接着剤21と粒子22を用意する。
Next, an example of a method for manufacturing an electronic device package according to the present invention will be described with reference to FIGS.
First, the board | substrate 11 with which the electronic device 12 was provided in the one surface 11a is prepared.
Next, a material for forming the adhesive layer 20, that is, an adhesive 21 and particles 22 are prepared.

次いで、接着剤21に、所定量の粒子22を混合する。
なお、通常、接着剤21と粒子22の混合は、基板11または封止部材30に塗布する直前になされるが、接着剤21と粒子22とが予め混合されている材料を用いてもよい。例えば、接着剤21として、反応(架橋反応)硬化型の接着剤を用いる場合、接着剤21が低粘度の時に粒子22を混合し、所定の面に塗布することが望ましい。
Next, a predetermined amount of particles 22 is mixed with the adhesive 21.
Normally, the adhesive 21 and the particles 22 are mixed immediately before being applied to the substrate 11 or the sealing member 30, but a material in which the adhesive 21 and the particles 22 are mixed in advance may be used. For example, when a reaction (crosslinking reaction) curable adhesive is used as the adhesive 21, it is desirable that the particles 22 are mixed and applied to a predetermined surface when the adhesive 21 has a low viscosity.

接着剤層20の厚さを球状の粒子22の粒径で正確に調節するため、接着剤層20中で粒子22を、多段に積層されることなく一段で存在させることが好ましい。粒子22を一段とするためには、例えば、粒子22と接着剤21との混合物を基板11の一方の面11aに塗布した後、接着固定するべき封止部材30をこの接着剤層20上に載せ、封止部材30を数回摺り動かしたり、封止部材30に振動を加えることによって、封止部材30と基板11との間に一段の粒子22が並んだ状態(図2参照)とすることができる。  In order to accurately adjust the thickness of the adhesive layer 20 with the particle size of the spherical particles 22, it is preferable that the particles 22 exist in the adhesive layer 20 in a single stage without being stacked in multiple stages. In order to make the particles 22 one stage, for example, after applying a mixture of the particles 22 and the adhesive 21 to the one surface 11 a of the substrate 11, a sealing member 30 to be bonded and fixed is placed on the adhesive layer 20. By moving the sealing member 30 several times or applying vibration to the sealing member 30, the single-stage particles 22 are arranged between the sealing member 30 and the substrate 11 (see FIG. 2). Can do.

次に、接着剤21を加熱または紫外線照射することにより、接着剤21が硬化する。接着剤21が硬化すると、図2に示すように、封止部材30と基板11との間に粒子22が一列に並び、各粒子22間が接着剤21で埋められた接着剤層20が形成され、封止部材30が接着剤層20を介して基板11の一方の面11aに接着固定され、電子デバイスパッケージ40が得られる。これにより、封止部材30と基板11との距離、すなわち、封止部材30と電子デバイス12との距離が、実質的に均一な粒径を有する多数の粒子22によって所定間隔に保たれ、封止部材30と基板11とが極めて平坦な状態で接着固定される。さらに、封止部材30と基板11との距離を一定に保つことにより、両者の間に所定の大きさの空隙41が設けられる。  Next, the adhesive 21 is cured by heating or irradiating the adhesive 21 with ultraviolet rays. When the adhesive 21 is cured, as shown in FIG. 2, particles 22 are arranged in a row between the sealing member 30 and the substrate 11, and an adhesive layer 20 in which the spaces between the particles 22 are filled with the adhesive 21 is formed. Then, the sealing member 30 is bonded and fixed to the one surface 11a of the substrate 11 through the adhesive layer 20, and the electronic device package 40 is obtained. As a result, the distance between the sealing member 30 and the substrate 11, that is, the distance between the sealing member 30 and the electronic device 12, is maintained at a predetermined interval by a large number of particles 22 having a substantially uniform particle size. The stop member 30 and the substrate 11 are bonded and fixed in an extremely flat state. Further, by keeping the distance between the sealing member 30 and the substrate 11 constant, a gap 41 having a predetermined size is provided between them.

なお、この実施形態では、チップ化した電子デバイスパッケージの製造方法について示したが、本発明はこれに限定されない。本発明にあっては、ウエハ状態の電子デバイスパッケージを作製した後、このウエハをダイシングラインに沿ってダイシング加工して、チップ化した電子デバイスパッケージを製造してもよい。ダイシング加工には、一般的なダイシング装置、あるいは、エッチング装置などが適用可能である。   In this embodiment, the method for manufacturing a chip electronic device package is shown, but the present invention is not limited to this. In the present invention, after an electronic device package in a wafer state is manufactured, the wafer may be diced along a dicing line to manufacture a chip-formed electronic device package. For dicing, a general dicing apparatus or an etching apparatus can be applied.

本発明に係る電子デバイスパッケージの一実施形態を示す概略断面図である。It is a schematic sectional drawing which shows one Embodiment of the electronic device package which concerns on this invention. 図1中の符号Aで示す領域を拡大した概略断面図である。It is the schematic sectional drawing which expanded the area | region shown with the code | symbol A in FIG.

符号の説明Explanation of symbols

11・・・基板、12・・・電子デバイス、20・・・接着剤層、21・・・接着剤、22・・・粒子、30・・・封止部材、40・・・電子デバイスパッケージ、41・・・空隙。
DESCRIPTION OF SYMBOLS 11 ... Board | substrate, 12 ... Electronic device, 20 ... Adhesive layer, 21 ... Adhesive, 22 ... Particle | grains, 30 ... Sealing member, 40 ... Electronic device package, 41 ... gap.

Claims (1)

基板と、該基板の一方の面に設けられた電子デバイスと、該電子デバイスを覆うように配され、接着剤層を介して前記基板に固定された封止部材とを備え、前記電子デバイスと前記封止部材との間に空隙が設けられてなり、前記接着剤層は、接着剤と、実質的に均一な粒径の多数の粒子とからなり、前記接着剤層における前記粒子の含有量が10体積%以上70体積%以下である電子デバイスパッケージの製造方法であって、
前記電子デバイスが設けられた基板の一方の面に、粒子と接着剤との混合物を塗布した後、前記封止部材を前記基板に塗布された混合物上に載せた状態で、前記封止部材を数回摺り動かすか、または、前記封止部材に振動を加えることによって、前記封止部材と前記基板との間に前記粒子が一段に並んだ状態とする工程と、
前記基板の一方の面に塗布された混合物を加熱するか、または、前記基板の一方の面に塗布された混合物に紫外線を照射することにより、前記接着剤を硬化させて、前記封止部材と前記基板との間に前記粒子が一列に並び、各粒子間が前記接着剤で埋められた接着剤層を形成するとともに、該接着剤層を介して前記基板の一方の面に、前記封止部材を接着固定する工程と、を有することを特徴とする電子デバイスの製造方法。
A substrate, an electronic device provided on one surface of the substrate, and a sealing member disposed to cover the electronic device and fixed to the substrate via an adhesive layer, A gap is provided between the sealing member, and the adhesive layer is composed of an adhesive and a large number of particles having a substantially uniform particle diameter, and the content of the particles in the adhesive layer Is a manufacturing method of an electronic device package that is 10 vol% or more and 70 vol% or less,
After applying a mixture of particles and an adhesive to one surface of the substrate on which the electronic device is provided, the sealing member is placed on the mixture applied to the substrate. Or by sliding the sealing member several times, or by applying vibration to the sealing member, the step of bringing the particles in a row between the sealing member and the substrate;
Heating the mixture applied to one surface of the substrate, or irradiating the mixture applied to one surface of the substrate with ultraviolet rays to cure the adhesive, and The particles are arranged in a row with the substrate, and an adhesive layer in which the particles are filled with the adhesive is formed, and the sealing is performed on one surface of the substrate via the adhesive layer. And a step of adhering and fixing the member.
JP2004013073A 2004-01-21 2004-01-21 Method for manufacturing electronic device package Expired - Fee Related JP4361379B2 (en)

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