JP4046405B2 - Photosensitive composition for forming conductive pattern and conductive pattern obtained using the same - Google Patents
Photosensitive composition for forming conductive pattern and conductive pattern obtained using the same Download PDFInfo
- Publication number
- JP4046405B2 JP4046405B2 JP07121998A JP7121998A JP4046405B2 JP 4046405 B2 JP4046405 B2 JP 4046405B2 JP 07121998 A JP07121998 A JP 07121998A JP 7121998 A JP7121998 A JP 7121998A JP 4046405 B2 JP4046405 B2 JP 4046405B2
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- Prior art keywords
- acid
- weight
- carboxyl group
- photosensitive composition
- powder
- Prior art date
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- Expired - Lifetime
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- 230000000740 bleeding effect Effects 0.000 description 1
- KGBXLFKZBHKPEV-UHFFFAOYSA-N boric acid Chemical compound OB(O)O KGBXLFKZBHKPEV-UHFFFAOYSA-N 0.000 description 1
- 239000004327 boric acid Substances 0.000 description 1
- 229910052810 boron oxide Inorganic materials 0.000 description 1
- PVEOYINWKBTPIZ-UHFFFAOYSA-N but-3-enoic acid Chemical compound OC(=O)CC=C PVEOYINWKBTPIZ-UHFFFAOYSA-N 0.000 description 1
- 125000006226 butoxyethyl group Chemical group 0.000 description 1
- 239000001191 butyl (2R)-2-hydroxypropanoate Substances 0.000 description 1
- YTIVTFGABIZHHX-UHFFFAOYSA-N butynedioic acid Chemical compound OC(=O)C#CC(O)=O YTIVTFGABIZHHX-UHFFFAOYSA-N 0.000 description 1
- KVNRLNFWIYMESJ-UHFFFAOYSA-N butyronitrile Chemical compound CCCC#N KVNRLNFWIYMESJ-UHFFFAOYSA-N 0.000 description 1
- RPBPCPJJHKASGQ-UHFFFAOYSA-K chromium(3+);octanoate Chemical compound [Cr+3].CCCCCCCC([O-])=O.CCCCCCCC([O-])=O.CCCCCCCC([O-])=O RPBPCPJJHKASGQ-UHFFFAOYSA-K 0.000 description 1
- 235000013985 cinnamic acid Nutrition 0.000 description 1
- 229930016911 cinnamic acid Natural products 0.000 description 1
- 238000010668 complexation reaction Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000007334 copolymerization reaction Methods 0.000 description 1
- 238000007766 curtain coating Methods 0.000 description 1
- WZHCOOQXZCIUNC-UHFFFAOYSA-N cyclandelate Chemical compound C1C(C)(C)CC(C)CC1OC(=O)C(O)C1=CC=CC=C1 WZHCOOQXZCIUNC-UHFFFAOYSA-N 0.000 description 1
- 125000000113 cyclohexyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])C1([H])[H] 0.000 description 1
- PESYEWKSBIWTAK-UHFFFAOYSA-N cyclopenta-1,3-diene;titanium(2+) Chemical compound [Ti+2].C=1C=C[CH-]C=1.C=1C=C[CH-]C=1 PESYEWKSBIWTAK-UHFFFAOYSA-N 0.000 description 1
- 210000001787 dendrite Anatomy 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- WOWBFOBYOAGEEA-UHFFFAOYSA-N diafenthiuron Chemical compound CC(C)C1=C(NC(=S)NC(C)(C)C)C(C(C)C)=CC(OC=2C=CC=CC=2)=C1 WOWBFOBYOAGEEA-UHFFFAOYSA-N 0.000 description 1
- ZBCBWPMODOFKDW-UHFFFAOYSA-N diethanolamine Chemical compound OCCNCCO ZBCBWPMODOFKDW-UHFFFAOYSA-N 0.000 description 1
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- XXBDWLFCJWSEKW-UHFFFAOYSA-N dimethylbenzylamine Chemical compound CN(C)CC1=CC=CC=C1 XXBDWLFCJWSEKW-UHFFFAOYSA-N 0.000 description 1
- VFHVQBAGLAREND-UHFFFAOYSA-N diphenylphosphoryl-(2,4,6-trimethylphenyl)methanone Chemical compound CC1=CC(C)=CC(C)=C1C(=O)P(=O)(C=1C=CC=CC=1)C1=CC=CC=C1 VFHVQBAGLAREND-UHFFFAOYSA-N 0.000 description 1
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- 125000003438 dodecyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
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- 239000003759 ester based solvent Substances 0.000 description 1
- CCIVGXIOQKPBKL-UHFFFAOYSA-M ethanesulfonate Chemical compound CCS([O-])(=O)=O CCIVGXIOQKPBKL-UHFFFAOYSA-M 0.000 description 1
- MEGHWIAOTJPCHQ-UHFFFAOYSA-N ethenyl butanoate Chemical compound CCCC(=O)OC=C MEGHWIAOTJPCHQ-UHFFFAOYSA-N 0.000 description 1
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- ORBFAMHUKZLWSD-UHFFFAOYSA-N ethyl 2-(dimethylamino)benzoate Chemical compound CCOC(=O)C1=CC=CC=C1N(C)C ORBFAMHUKZLWSD-UHFFFAOYSA-N 0.000 description 1
- SUPCQIBBMFXVTL-UHFFFAOYSA-N ethyl 2-methylprop-2-enoate Chemical compound CCOC(=O)C(C)=C SUPCQIBBMFXVTL-UHFFFAOYSA-N 0.000 description 1
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 1
- 229940116333 ethyl lactate Drugs 0.000 description 1
- AZHPCFQBBJISDG-UHFFFAOYSA-N ethyl(oxido)phosphanium Chemical class CC[PH2]=O AZHPCFQBBJISDG-UHFFFAOYSA-N 0.000 description 1
- UKFXDFUAPNAMPJ-UHFFFAOYSA-N ethylmalonic acid Chemical compound CCC(C(O)=O)C(O)=O UKFXDFUAPNAMPJ-UHFFFAOYSA-N 0.000 description 1
- 235000019253 formic acid Nutrition 0.000 description 1
- 238000010528 free radical solution polymerization reaction Methods 0.000 description 1
- ANSXAPJVJOKRDJ-UHFFFAOYSA-N furo[3,4-f][2]benzofuran-1,3,5,7-tetrone Chemical compound C1=C2C(=O)OC(=O)C2=CC2=C1C(=O)OC2=O ANSXAPJVJOKRDJ-UHFFFAOYSA-N 0.000 description 1
- 229940074391 gallic acid Drugs 0.000 description 1
- 235000004515 gallic acid Nutrition 0.000 description 1
- 239000000499 gel Substances 0.000 description 1
- 150000002334 glycols Chemical class 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
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- 238000007602 hot air drying Methods 0.000 description 1
- WGCNASOHLSPBMP-UHFFFAOYSA-N hydroxyacetaldehyde Natural products OCC=O WGCNASOHLSPBMP-UHFFFAOYSA-N 0.000 description 1
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- 239000001023 inorganic pigment Substances 0.000 description 1
- 125000000959 isobutyl group Chemical group [H]C([H])([H])C([H])(C([H])([H])[H])C([H])([H])* 0.000 description 1
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- FPYJFEHAWHCUMM-UHFFFAOYSA-N maleic anhydride Chemical compound O=C1OC(=O)C=C1 FPYJFEHAWHCUMM-UHFFFAOYSA-N 0.000 description 1
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- 235000011090 malic acid Nutrition 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- JDSHMPZPIAZGSV-UHFFFAOYSA-N melamine Chemical compound NC1=NC(N)=NC(N)=N1 JDSHMPZPIAZGSV-UHFFFAOYSA-N 0.000 description 1
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- 229910052753 mercury Inorganic materials 0.000 description 1
- HNEGQIOMVPPMNR-NSCUHMNNSA-N mesaconic acid Chemical compound OC(=O)C(/C)=C/C(O)=O HNEGQIOMVPPMNR-NSCUHMNNSA-N 0.000 description 1
- 229910001507 metal halide Inorganic materials 0.000 description 1
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- 239000002923 metal particle Substances 0.000 description 1
- FQPSGWSUVKBHSU-UHFFFAOYSA-N methacrylamide Chemical compound CC(=C)C(N)=O FQPSGWSUVKBHSU-UHFFFAOYSA-N 0.000 description 1
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 1
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- WBYWAXJHAXSJNI-UHFFFAOYSA-N methyl p-hydroxycinnamate Natural products OC(=O)C=CC1=CC=CC=C1 WBYWAXJHAXSJNI-UHFFFAOYSA-N 0.000 description 1
- HNEGQIOMVPPMNR-UHFFFAOYSA-N methylfumaric acid Natural products OC(=O)C(C)=CC(O)=O HNEGQIOMVPPMNR-UHFFFAOYSA-N 0.000 description 1
- ZIYVHBGGAOATLY-UHFFFAOYSA-N methylmalonic acid Chemical compound OC(=O)C(C)C(O)=O ZIYVHBGGAOATLY-UHFFFAOYSA-N 0.000 description 1
- LNOPIUAQISRISI-UHFFFAOYSA-N n'-hydroxy-2-propan-2-ylsulfonylethanimidamide Chemical compound CC(C)S(=O)(=O)CC(N)=NO LNOPIUAQISRISI-UHFFFAOYSA-N 0.000 description 1
- UTSYWKJYFPPRAP-UHFFFAOYSA-N n-(butoxymethyl)prop-2-enamide Chemical compound CCCCOCNC(=O)C=C UTSYWKJYFPPRAP-UHFFFAOYSA-N 0.000 description 1
- LSWADWIFYOAQRZ-UHFFFAOYSA-N n-(ethoxymethyl)prop-2-enamide Chemical compound CCOCNC(=O)C=C LSWADWIFYOAQRZ-UHFFFAOYSA-N 0.000 description 1
- DNTMQTKDNSEIFO-UHFFFAOYSA-N n-(hydroxymethyl)-2-methylprop-2-enamide Chemical compound CC(=C)C(=O)NCO DNTMQTKDNSEIFO-UHFFFAOYSA-N 0.000 description 1
- ULYOZOPEFCQZHH-UHFFFAOYSA-N n-(methoxymethyl)prop-2-enamide Chemical compound COCNC(=O)C=C ULYOZOPEFCQZHH-UHFFFAOYSA-N 0.000 description 1
- 125000004108 n-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 125000000740 n-pentyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- PSZYNBSKGUBXEH-UHFFFAOYSA-N naphthalene-1-sulfonic acid Chemical compound C1=CC=C2C(S(=O)(=O)O)=CC=CC2=C1 PSZYNBSKGUBXEH-UHFFFAOYSA-N 0.000 description 1
- 238000006386 neutralization reaction Methods 0.000 description 1
- 229910017604 nitric acid Inorganic materials 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 239000012299 nitrogen atmosphere Substances 0.000 description 1
- 125000001400 nonyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- QIQXTHQIDYTFRH-UHFFFAOYSA-N octadecanoic acid Chemical compound CCCCCCCCCCCCCCCCCC(O)=O QIQXTHQIDYTFRH-UHFFFAOYSA-N 0.000 description 1
- OQCDKBAXFALNLD-UHFFFAOYSA-N octadecanoic acid Natural products CCCCCCCC(C)CCCCCCCCC(O)=O OQCDKBAXFALNLD-UHFFFAOYSA-N 0.000 description 1
- 125000002347 octyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 239000005416 organic matter Substances 0.000 description 1
- 150000001451 organic peroxides Chemical class 0.000 description 1
- 235000006408 oxalic acid Nutrition 0.000 description 1
- 229940116315 oxalic acid Drugs 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- MOWNZPNSYMGTMD-UHFFFAOYSA-N oxidoboron Chemical class O=[B] MOWNZPNSYMGTMD-UHFFFAOYSA-N 0.000 description 1
- LXTZRIBXKVRLOA-UHFFFAOYSA-N padimate a Chemical compound CCCCCOC(=O)C1=CC=C(N(C)C)C=C1 LXTZRIBXKVRLOA-UHFFFAOYSA-N 0.000 description 1
- 125000000913 palmityl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- FJKROLUGYXJWQN-UHFFFAOYSA-N papa-hydroxy-benzoic acid Natural products OC(=O)C1=CC=C(O)C=C1 FJKROLUGYXJWQN-UHFFFAOYSA-N 0.000 description 1
- WXZMFSXDPGVJKK-UHFFFAOYSA-N pentaerythritol Chemical compound OCC(CO)(CO)CO WXZMFSXDPGVJKK-UHFFFAOYSA-N 0.000 description 1
- 150000002978 peroxides Chemical class 0.000 description 1
- 150000002989 phenols Chemical class 0.000 description 1
- XNERWVPQCYSMLC-UHFFFAOYSA-N phenylpropiolic acid Chemical compound OC(=O)C#CC1=CC=CC=C1 XNERWVPQCYSMLC-UHFFFAOYSA-N 0.000 description 1
- ACVYVLVWPXVTIT-UHFFFAOYSA-M phosphinate Chemical compound [O-][PH2]=O ACVYVLVWPXVTIT-UHFFFAOYSA-M 0.000 description 1
- 230000036211 photosensitivity Effects 0.000 description 1
- 239000003504 photosensitizing agent Substances 0.000 description 1
- 239000002685 polymerization catalyst Substances 0.000 description 1
- 229920001451 polypropylene glycol Polymers 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 229910000027 potassium carbonate Inorganic materials 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- BDERNNFJNOPAEC-UHFFFAOYSA-N propan-1-ol Chemical compound CCCO BDERNNFJNOPAEC-UHFFFAOYSA-N 0.000 description 1
- 235000019260 propionic acid Nutrition 0.000 description 1
- 125000001436 propyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- UORVCLMRJXCDCP-UHFFFAOYSA-N propynoic acid Chemical compound OC(=O)C#C UORVCLMRJXCDCP-UHFFFAOYSA-N 0.000 description 1
- YQUVCSBJEUQKSH-UHFFFAOYSA-N protochatechuic acid Natural products OC(=O)C1=CC=C(O)C(O)=C1 YQUVCSBJEUQKSH-UHFFFAOYSA-N 0.000 description 1
- 229940079877 pyrogallol Drugs 0.000 description 1
- 229940107700 pyruvic acid Drugs 0.000 description 1
- IUVKMZGDUIUOCP-BTNSXGMBSA-N quinbolone Chemical compound O([C@H]1CC[C@H]2[C@H]3[C@@H]([C@]4(C=CC(=O)C=C4CC3)C)CC[C@@]21C)C1=CCCC1 IUVKMZGDUIUOCP-BTNSXGMBSA-N 0.000 description 1
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- 230000009467 reduction Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 239000011342 resin composition Substances 0.000 description 1
- WBHHMMIMDMUBKC-XLNAKTSKSA-N ricinelaidic acid Chemical compound CCCCCC[C@@H](O)C\C=C\CCCCCCCC(O)=O WBHHMMIMDMUBKC-XLNAKTSKSA-N 0.000 description 1
- 229960003656 ricinoleic acid Drugs 0.000 description 1
- FEUQNCSVHBHROZ-UHFFFAOYSA-N ricinoleic acid Natural products CCCCCCC(O[Si](C)(C)C)CC=CCCCCCCCC(=O)OC FEUQNCSVHBHROZ-UHFFFAOYSA-N 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 239000007965 rubber solvent Substances 0.000 description 1
- 229960004889 salicylic acid Drugs 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical class [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 229910052708 sodium Inorganic materials 0.000 description 1
- 239000011734 sodium Substances 0.000 description 1
- 229910000029 sodium carbonate Inorganic materials 0.000 description 1
- NTHWMYGWWRZVTN-UHFFFAOYSA-N sodium silicate Chemical compound [Na+].[Na+].[O-][Si]([O-])=O NTHWMYGWWRZVTN-UHFFFAOYSA-N 0.000 description 1
- 229910052911 sodium silicate Inorganic materials 0.000 description 1
- 239000004334 sorbic acid Substances 0.000 description 1
- 235000010199 sorbic acid Nutrition 0.000 description 1
- 229940075582 sorbic acid Drugs 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 239000008117 stearic acid Substances 0.000 description 1
- 125000004079 stearyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 125000001424 substituent group Chemical group 0.000 description 1
- 239000001384 succinic acid Substances 0.000 description 1
- 229950000244 sulfanilic acid Drugs 0.000 description 1
- 150000003460 sulfonic acids Chemical class 0.000 description 1
- 239000012756 surface treatment agent Substances 0.000 description 1
- 235000002906 tartaric acid Nutrition 0.000 description 1
- 239000011975 tartaric acid Substances 0.000 description 1
- 229960003080 taurine Drugs 0.000 description 1
- SJMYWORNLPSJQO-UHFFFAOYSA-N tert-butyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OC(C)(C)C SJMYWORNLPSJQO-UHFFFAOYSA-N 0.000 description 1
- 125000000999 tert-butyl group Chemical group [H]C([H])([H])C(*)(C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- 150000003512 tertiary amines Chemical class 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 238000012719 thermal polymerization Methods 0.000 description 1
- ODBLHEXUDAPZAU-UHFFFAOYSA-N threo-D-isocitric acid Natural products OC(=O)C(O)C(C(O)=O)CC(O)=O ODBLHEXUDAPZAU-UHFFFAOYSA-N 0.000 description 1
- UIERETOOQGIECD-ONEGZZNKSA-N tiglic acid Chemical compound C\C=C(/C)C(O)=O UIERETOOQGIECD-ONEGZZNKSA-N 0.000 description 1
- UAXOELSVPTZZQG-UHFFFAOYSA-N tiglic acid Natural products CC(C)=C(C)C(O)=O UAXOELSVPTZZQG-UHFFFAOYSA-N 0.000 description 1
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N titanium dioxide Inorganic materials O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 1
- NGSWKAQJJWESNS-ZZXKWVIFSA-N trans-4-coumaric acid Chemical compound OC(=O)\C=C\C1=CC=C(O)C=C1 NGSWKAQJJWESNS-ZZXKWVIFSA-N 0.000 description 1
- NIUZJTWSUGSWJI-UHFFFAOYSA-M triethyl(methyl)azanium;chloride Chemical compound [Cl-].CC[N+](C)(CC)CC NIUZJTWSUGSWJI-UHFFFAOYSA-M 0.000 description 1
- HVYVMSPIJIWUNA-UHFFFAOYSA-N triphenylstibine Chemical compound C1=CC=CC=C1[Sb](C=1C=CC=CC=1)C1=CC=CC=C1 HVYVMSPIJIWUNA-UHFFFAOYSA-N 0.000 description 1
- 238000009281 ultraviolet germicidal irradiation Methods 0.000 description 1
- 229940005605 valeric acid Drugs 0.000 description 1
- WKOLLVMJNQIZCI-UHFFFAOYSA-N vanillic acid Chemical compound COC1=CC(C(O)=O)=CC=C1O WKOLLVMJNQIZCI-UHFFFAOYSA-N 0.000 description 1
- TUUBOHWZSQXCSW-UHFFFAOYSA-N vanillic acid Natural products COC1=CC(O)=CC(C(O)=O)=C1 TUUBOHWZSQXCSW-UHFFFAOYSA-N 0.000 description 1
- KOZCZZVUFDCZGG-UHFFFAOYSA-N vinyl benzoate Chemical compound C=COC(=O)C1=CC=CC=C1 KOZCZZVUFDCZGG-UHFFFAOYSA-N 0.000 description 1
- 150000007964 xanthones Chemical class 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/09—Use of materials for the conductive, e.g. metallic pattern
- H05K1/092—Dispersed materials, e.g. conductive pastes or inks
Landscapes
- Inorganic Insulating Materials (AREA)
- Formation Of Various Coating Films On Cathode Ray Tubes And Lamps (AREA)
- Conductive Materials (AREA)
Description
【0001】
【発明の属する技術分野】
本発明は、プラズマディスプレイパネルの前面基板に形成される導体回路パターンの形成に特に有利に適用でき、また蛍光表示管及び電子部品用の導電体の形成にも適用できるアルカリ水溶液により現像可能な導体パターン形成用感光性組成物、及びそれを用いて得られる導体パターンに関する。
【0002】
【従来の技術】
従来、プラズマディスプレイパネル、蛍光表示管、電子部品などにおける導体パターンや誘電体パターンの形成には、一般に極めて多量の金属粉又はガラス粉末を含有する導電性ペースト又はガラスペーストを用いてスクリーン印刷法によってパターン形成が行われていた。
しかし、近年、電子部品等においてはパターンの高精細化が要求されてきている。従来のスクリーン印刷法によるパターン形成では、熟練を要し、また印刷時における掠れや滲み、スクリーンの伸縮に起因する位置合わせや精度等の問題があり、高精細パターンへの対応が困難になってきている。
【0003】
これに対し、無機粉体と共に、熱によって解重合し易い共重合系ポリマーを含有する感光性ペーストが高精細対応として用いられるようになってきたが、ベース樹脂に光反応性基が付加されていないものが多く、露光の際の光硬化深度が不充分で、現像後に解像性不良が起こるという問題がある。光硬化深度を向上させ、高精細パターンを形成しようとする場合、反応性希釈剤(光硬化性モノマー)を多く添加する必要があり、そのため、露光の際に反応性希釈剤の不飽和基が未反応のまま残存する割合が多くなり、反応性希釈剤の未反応物が焼成時にゲル化して焼成残渣が発生したり、ゲル化による収縮でパターンのよれや線幅収縮等の問題を招き、ひどい場合には断線を発生することもある。
【0004】
一方、セラミックス回路基板上に導体パターンを形成するための感光性導電性ペーストとしては、導電性粉末、側鎖にカルボキシル基とエチレン性不飽和基を有するアクリル系共重合体、例えばメタアクリル酸とメチルメタアクリレートとスチレンの共重合体にグリシジルアクリレートを付加反応させたポリマー、光反応性化合物及び光重合開始剤を含有するペースト組成物が、例えば特開平5−67405号や特開平5−271576号に開示されている。このような感光性導電性ペーストは、基板上に塗布した後、露光・現像により導体回路パターンを形成できるが、600〜1,000℃で焼成することが教示されており、プラズマディスプレイパネル作製時の焼成温度である600℃以下(プラズマディスプレイパネルの基板には一般にソーダガラスが用いられているため、焼成は600℃以下の温度で行う必要がある。)では焼成残渣が生じ、形成される電極回路の導電性の劣化を生ずるなどの影響があるため、プラズマディスプレイパネル用には不向きである。
【0005】
【発明が解決しようとする課題】
本発明は、前記のような従来技術の問題点に鑑みなされたものであり、その基本的な目的は、光硬化性に優れ、極めて多量に無機微粉体を含有しても優れた光硬化深度を示し、また保存安定性、アルカリ水溶液による現像性、基板に対する密着性、焼成性などに優れた導体パターン形成用感光性組成物を提供することにある。
本発明のより具体的な目的は、フォトリソグラフィー技術により作業性、生産性良く高精細な導体回路パターンを形成でき、しかも画像に悪影響を及ぼす焼成残渣を生ずることなく600℃以下での焼成工程を行うことができるアルカリ水溶液により現像可能な導体パターン形成用感光性組成物を提供することにある。
本発明の他の目的は、このような感光性組成物から選択的露光、現像、及び焼成の一連の工程により生産性良く製造した高精細な導体パターン及びその製造技術を提供することにある。
【0006】
【課題を解決するための手段】
前記目的を達成するために、本発明によれば、(A)不飽和二重結合とカルボキシル基を有する化合物(a)と不飽和二重結合を有する化合物(b)の共重合体に、グリシジル(メタ)アクリレート(c)を反応させて得られる、重量平均分子量が500〜50,000であり、不飽和基を重量平均分子量400〜4,000当り1個の割合で含有するカルボキシル基含有感光性ポリマー、(B)希釈剤、(C)光重合開始剤、(D)銀粉及びガラス粉末を含む無機粉体、及び(E)安定剤として無機酸及び酸基としてカルボキシル基又はスルホン酸基のみを有する有機酸よりなる群から選ばれた少なくとも1種の酸を含有し、上記銀粉の配合量は上記カルボキシル基含有感光性ポリマー(A)100重量部当り25〜1,000重量部となる割合であり、かつ、上記ガラス粉末の配合量は上記銀粉100重量部に対し1〜30重量部の割合であることを特徴とする導体パターン形成用感光性組成物が提供される。なお、本明細書中で用いる用語「グリシジル(メタ)アクリレート」は、グリシジルアクリレート、グリシジルメタアクリレート又はそれらの混合物を意味している。
【0007】
本発明の導体パターン形成用感光性組成物は、ペースト状形態であってもよく、また予めフィルム状に成膜したドライフィルムの形態であってもよい。
上記無機粉体としては、10ミクロン以下の粒径の粉末が好適に使用でき、銀粉及びガラス粉末、特に軟化点が300〜600℃の低融点ガラスを好適に使用できる。黒色顔料としては、Fe、Co、Cu、Cr、Mn、Alの1種又は2種類以上を主成分として含む金属酸化物からなる黒色顔料を好適に用いることができる。
【0008】
本発明によれば、前記のような導体パターン形成用感光性組成物から形成された導体パターンが得られる。例えば、前記導体パターン形成用感光性組成物がペースト状形態の場合、基板上にペースト状感光性組成物を塗布し、乾燥して成膜し、一方、ドライフィルム形態の場合には基板上にラミネートし、その後、選択的露光、現像によりパターニングした後、焼成することにより、高精細な導体パターンが得られる。
【0009】
【発明の実施の形態】
前記したように、従来の感光性ペースト組成物を用いて焼成物パターンを形成した場合、露光の際の光硬化深度が不充分で、現像後に解像性不良が生じたり、また焼成時にパターンのよれや線幅収縮等の問題も発生する。本発明者らは、このような現象について鋭意研究の結果、導体パターンの形成に用いられる感光性ペースト組成物は、粒径の極めて小さい金属微粒子等の無機粉体を極めて多量に含有しているため、露光の際に光の透過性が悪く、そのため光硬化不充分となり、また光硬化むらも生じ易くなることが大きな要因であることを見出した。このような現象は、皮膜厚さが厚くなる程、また皮膜の深部になる程顕著になる。
【0010】
そこで、本発明の感光性組成物においては、無機粉体のバインダー樹脂自体にα、β−エチレン性不飽和結合を有する基をペンダントとして付加させた特定の感光性樹脂を用いることを第一の特徴としている。すなわち、本発明で用いるカルボキシル基含有感光性ポリマー(A)は、不飽和二重結合とカルボキシル基を有する化合物(a)と不飽和二重結合を有する化合物(b)の共重合体のカルボキシル基の一部に、充分な光硬化深度が得られる程度にまで光硬化性を向上させる割合で、グリシジル(メタ)アクリレート(c)を反応させ、該グリシジル(メタ)アクリレート(c)の不飽和二重結合を側鎖に導入したことを特徴としている。また、上記共重合体の一方のモノマー成分である化合物(a)の有するカルボキシル基の一部は未反応のまま残存するため、得られるカルボキシル基含有感光性ポリマー(A)は、アルカリ水溶液に対して可溶性である。そのため、本発明の感光性組成物から形成した皮膜は、選択的露光後にアルカリ水溶液により安定した現像が可能となる。
【0011】
本発明の感光性組成物においては、ガラスペーストを組成する場合には前記無機粉体(D)として低融点ガラス粉末が用いられるが、導電性ペーストを組成する場合の金属粉など、他の無機粉体を用いる場合にも少量の低融点ガラス粉末を配合することが好ましく、それによって600℃以下の温度での焼成が可能になり、また焼成物パターンの基板への密着性が向上する。但し、このような金属粉やガラス粉末を配合した組成物においては保存安定性が低下し易く、またゲル化や流動性の低下により塗布作業性が悪くなり易いという問題がある。そこで、本発明の感光性組成物においては、カルボキシル基含有感光性ポリマー(A)、希釈剤(B)、光重合開始剤(C)、無機粉体(D)と共に安定剤としての酸(E)を配合することを第二の特徴としている。
その結果、本発明の感光性組成物は、保存安定性の悪さや、ゲル化や流動性の低下により塗布作業性が悪いといった問題もなく、フォトリソグラフィー技術により容易に大面積の基板に高精細のパターンを形成でき、しかも600℃以下での焼成工程でも充分に使用でき、歩留まりの大幅な向上を実現できる。
【0012】
以下、本発明の感光性組成物の各成分について詳細に説明する。
本発明で用いるカルボキシル基含有感光性ポリマー(A)は、分子中に不飽和二重結合とカルボキシル基を有する化合物、即ち不飽和カルボン酸(a)と不飽和二重結合を有する化合物(b)の共重合体のカルボキシル基の一部に、グリシジル(メタ)アクリレート(c)を反応させて得られる樹脂である。
このようなカルボキシル基含有感光性ポリマー(A)は、組成物全量の5〜30重量%の割合で配合することが好ましい。該感光性ポリマーの配合量が上記範囲よりも少な過ぎる場合、形成する皮膜中の上記感光性ポリマーの分布が不均一になり易く、充分な光硬化性及び光硬化深度が得られ難く、選択的露光、現像によるパターニングが困難となる。一方、上記範囲よりも多過ぎると、焼成時のパターンのよれや線幅収縮を生じ易くなるので好ましくない。
【0013】
上記カルボキシル基含有感光性ポリマー(A)としては、重量平均分子量500〜50,000、及び酸価20〜150mgKOH/g、好ましくは40〜120mgKOH/gを有するものを好適に用いることができる。カルボキシル基含有感光性ポリマー(A)の分子量が500より低い場合、現像時の皮膜の密着性に悪影響を与え、一方、50,000よりも高い場合、現像不良を生じ易くなるので好ましくない。また、酸価が20mgKOH/gより低い場合、アルカリ水溶液に対する溶解性が不充分で現像不良を生じ易くなり、一方、150mgKOH/gより高い場合、現像時に皮膜の密着性の劣化や光硬化部(露光部)の溶解が生じ易くなるので好ましくない。
【0014】
前記不飽和カルボン酸(a)の具体的な例としては、アクリル酸、メタアクリル酸、イタコン酸、クロトン酸、マレイン酸、フマル酸、ビニル酢酸、又はこれらの酸無水物、さらには、無水マレイン酸、無水イタコン酸、無水ピロメリット酸などの酸無水物と2−ヒドロキシエチル(メタ)アクリレート、2−ヒドロキシプロピル(メタ)アクリレート等のヒドロキシアルキル(メタ)アクリレート類などの水酸基を有する不飽和化合物との反応生成物等が挙げられ、これらを単独で又は2種以上を組み合わせて用いることができる。なお、本明細書中で(メタ)アクリレートとは、アクリレートとメタアクリレートを総称する用語である。
【0015】
前記不飽和二重結合を有する化合物(b)の具体例としては、スチレン、クロロスチレン、α−メチルスチレン;置換基としてメチル、エチル、プロピル、イソプロピル、n−ブチル、イソブチル、t−ブチル、アミル、2−エチルヘキシル、オクチル、カプリル、ノニル、ドデシル、ヘキサデシル、オクタデシル、シクロヘキシル、イソボルニル、メトキシエチル、ブトキシエチル、2−ヒドロキシエチル、2−ヒドロキシプロピル、3−クロロ−2−ヒドロキシプロピル等を有する(メタ)アクリレート;ポリエチレングリコールのモノ(メタ)アクリレート又はポリプロピレングリコールのモノ(メタ)アクリレート;酢酸ビニル、酪酸ビニル、安息香酸ビニル;アクリルアミド、メタクリルアミド、N−ヒドロキシメチルアクリルアミド、N−ヒドロキシメチルメタクリルアミド、N−メトキシメチルアクリルアミド、N−エトキシメチルアクリルアミド、N−ブトキシメチルアクリルアミド、アクリロニトリル、もしくはイソブチレン等が挙げられ、これらを単独で又は2種以上を組み合わせて使用することができる。これらの化合物の中でも、好ましくは、スチレン、α−メチルスチレン、低級アルキル(メタ)アクリレート、イソブチレンが用いられる。
【0016】
前記不飽和カルボン酸(a)と不飽和二重結合を有する化合物(b)との共重合反応は、例えばアゾビスイソブチロニトリル、有機過酸化物等のラジカル重合触媒の存在下で容易に進行し、常法に従って、例えば約40〜130℃での溶液重合法等によって行うことができ、ランダム共重合体が生成する。
また、得られた共重合体の側鎖のカルボキシル基への前記グリシジル(メタ)アクリレート(c)の付加反応は、反応を促進させるために触媒、例えば、トリエチルアミン、ベンジルジメチルアミン、メチルトリエチルアンモニウムクロライド、ベンジルトリメチルアンモニウムブロマイド、ベンジルトリメチルアンモニウムアイオダイド、トリフェニルフォスフィン、トリフェニルスチビン、オクタン酸クロム、オクタン酸ジルコニウム等を使用することが好ましく、該触媒の使用量は、反応原料混合物に対して好ましくは0.1〜10重量%である。また、反応中の重合を防止するために、重合禁止剤、例えば、ハイドロキノン、メチルハイドロキノン、ハイドロキノンモノメチルエーテル、カテコール、ピロガロール等を使用するのが好ましく、その使用量は反応原料混合物に対して好ましくは0.01〜1重量%である。上記付加反応の反応温度は好ましくは60〜100℃である。
【0017】
前記不飽和カルボン酸(a)と不飽和化合物(b)の共重合体のカルボキシル基に付加反応させるグリシジル(メタ)アクリレート(c)の割合は、生成するポリマーの重量平均分子量400〜4,000当り不飽和基(上記グリシジル(メタ)アクリレート(c)の不飽和基)が1個となる割合が好ましい。導入する不飽和基量が上記割合より多くなると、選択的露光による画像形成時にハレーション等の現象が発生し、シャープなパターン形成が困難になると共に、光硬化皮膜の焼成性が低下し、焼成残渣の発生が起こり易くなる。さらに、不飽和基が多いことにより、露光の際のラジカル重合時の硬化収縮やラジカル重合後に塗膜が堅くなりすぎることにより脆くなり、基板との密着不良が発生し易くなる。一方、不飽和基量が上記割合より少なすぎると、パターン形成時の露光量がより多く必要になったり、現像、水洗の工程においてパターンのかけが生じたりして、シャープなパターン形成が困難になり易い。
【0018】
本発明の感光性組成物に配合する希釈剤(B)としては、有機溶剤及び/又は不飽和基含有の反応性希釈剤を用いることができる。
有機溶剤の代表的な例としては、トルエン、キシレン、テトラメチルベンゼンや、エクソン化学(株)製ソルベッソ#100、ソルベッソ#150、ソルベッソ#200、エクソンアロマティックナフサNo.2、シェル(株)製LAWS、HAWS、VLAWS、シェルゾールD40、D70、D100、70、71、72、A、AB、R、DOSB、DOSB−8等の芳香族系溶剤;エクソン化学(株)製エクソンナフサNo.5、No.6、No.7、エクソンオーダーレスソルベント、エクソンラバーソルベント等の脂肪族系溶剤;メタノール、エタノール、プロパノール、イソプロパノール、ブタノール、ヘキサノール、セロソルブ、ブチルセロソルブ、カルビトール、ブチルカルビトール等のアルコール系溶剤;酢酸エチル、酢酸ブチル、セロソルブアセテート、カルビトールアセテート、乳酸メチル、乳酸エチル、乳酸ブチル等のエステル系溶剤を挙げることができる。これらの有機溶剤は単独で又は2種以上を混合して用いることができる。
【0019】
不飽和基含有の反応性希釈剤の代表的な例としては、2−ヒドロキシエチル(メタ)アクリレート、2−ヒドロキシプロピル(メタ)アクリレート等のヒドロキシアルキル(メタ)アクリレート類;エチレングリコール、メトキシテトラエチレングリコール、ポリエチレングリコール等のグリコールのモノ又はジ(メタ)アクリレート類;N,N−ジメチル(メタ)アクリルアミド,N−メチロール(メタ)アクリルアミド等の(メタ)アクリルアミド類;N,N−ジメチルアミノエチル(メタ)アクリレート等のアミノアルキル(メタ)アクリレート類;ヘキサンジオール、トリメチロールプロパン、ペンタエリスリトール、ジトリメチロールプロパン、ジペンタエリスリトール、トリスヒドロキシエチルイソシアヌレート等の多価アルコール又はこれらのエチレンオキサイドあるいはプロピレンオキサイド付加物の多価(メタ)アクリレート類;フェノキシエチル(メタ)アクリレート、ビスフェノールAのポリエトキシジ(メタ)アクリレート等のフェノール類のエチレンオキサイドあるいはプロピレンオキシド付加物の(メタ)アクリレート類;グリセリンジグリシジルエーテル、トリメチロールプロパントリグリシジルエーテル、トリグリシジルイソシアヌレートなどのグリシジルエーテルの(メタ)アクリレート類;及びメラミン(メタ)アクリレート等を挙げることができる。さらに、水酸基含有(メタ)アクリレートと多価カルボン酸化合物の無水物との反応物が挙げられるが、水酸基を持つ化合物が組成物の安定性に良い影響を与えるため好ましい。これらの不飽和基含有の反応性希釈剤は、単独で又は2種以上を混合して用いることができ、希釈剤として作用するだけでなく、組成物の光硬化性の促進及び現像性向上にも寄与する。
【0020】
上記有機溶剤と不飽和基含有の反応性希釈剤は単独で又は2種以上の混合物として用いられる。これらの希釈剤(B)の配合割合は、組成物の塗布方法に応じて適宜の量で配合することができるが、一般には前記カルボキシル基含有感光性ポリマー(A)100重量部当り1〜200重量部、好ましくは20〜100重量部が適当である。
【0021】
前記光重合開始剤(C)の具体例としては、ベンゾイン、ベンゾインメチルエーテル、ベンゾインエチルエーテル、ベンゾインイソプロピルエーテル等のベンゾインとベンゾインアルキルエーテル類;アセトフェノン、2,2−ジメトキシー2−フェニルアセトフェノン、2,2−ジエトキシー2−フェニルアセトフェノン、1,1−ジクロロアセトフェノン等のアセトフェノン類;2−メチル−1−[4−(メチルチオ)フェニル]−2−モルフォリノプロパン−1−オン、2−ベンジル−2−ジメチルアミノ−1−(4−モルフォリノフェニル)−ブタノン−1等のアミノアセトフェノン類;2−メチルアントラキノン、2−エチルアントラキノン、2−t−ブチルアントラキノン、1−クロロアントラキノン等のアントラキノン類;2,4−ジメチルチオキサントン、2,4−ジエチルチオキサントン、2−クロロチオキサントン、2,4−ジイソプロピルチオキサントン等のチオキサントン類;アセトフェノンジメチルケタール、ベンジルジメチルケタール等のケタール類;ベンゾフェノン等のベンゾフェノン類;又はキサントン類;(2,6−ジメトキシベンゾイル)−2,4,4−ペンチルホスフィンオキサイド、ビス(2,4,6−トリメチルベンゾイル)−フェニルフォスフィンオキサイド、2,4,6−トリメチルベンゾイルジフェニルフォスフィンオキサイド、エチル−2,4,6−トリメチルベンゾイルフェニルフォスフィネイト等のフォスフィンオキサイド類;各種パーオキサイド類などが挙げられ、これら公知慣用の光重合開始剤を単独で又は2種類以上を組み合わせて用いることができる。これらの光重合開始剤(C)の配合割合は、カルボキシル基含有感光性ポリマー(A)100重量部当り1〜20重量部が好ましい。
【0022】
また、上記のような光重合開始剤(C)は、N,N−ジメチルアミノ安息香酸エチルエステル、N,N−ジメチルアミノ安息香酸イソアミルエステル、ペンチル−4−ジメチルアミノベンゾエート、トリエチルアミン、トリエタノールアミン等の三級アミン類のような光増感剤の1種あるいは2種以上と組み合わせて用いることができる。
さらに、より深い光硬化深度を要求される場合、必要に応じて、可視領域でラジカル重合を開始するチバ・スペシャリティー・ケミカルズ社製CGI784等のチタノセン系光重合開始剤、ロイコ染料等を硬化助剤として組み合わせて用いることができる。
【0023】
本発明の感光性組成物を導電性ペーストとして処方する場合に用いる無機粉体(D)の具体例としては、金属微粒子(D−1)とガラス微粒子(D−2)の混合物が挙げられる。
金属微粒子(D−1)としては銀を好適に用いることができる。上記銀粉は、平均粒径としては解像度の点から10ミクロン以下の粒径が好適である。また、球状、ブロック状、フレーク状、デンドライト状の物を単独で又は2種類以上を組み合わせて用いることができる。
【0024】
銀粉の配合量は、前記カルボキシル基含有感光性ポリマー(A)100重量部当り25〜1,000重量部となる割合が適当である。銀粉の配合量が25重量部未満の場合、導体回路の線幅収縮や断線を生じ易くなり、一方、1,000重量部を超えて多量に配合すると、光の透過を損ない、組成物の充分な光硬化性が得られ難くなる。
さらに焼成後の皮膜の強度、基板への密着性向上のために、後述するようなガラス粉末(D−2)を銀粉100重量部に対し1〜30重量部の範囲で添加することができる。
【0025】
本発明の感光性組成物に用いるガラス粉末(D−2)としては、軟化点が300〜600℃の低融点ガラスが用いられ、酸化鉛、酸化ビスマス、又は酸化亜鉛を主成分とする10ミクロン以下の平均粒径のものが好適に使用できる。
【0026】
酸化鉛を主成分とするガラス粉末の好ましい例としては、酸化物基準の重量%で、PbOが48〜82%、B2O3が0.5〜22%、SiO2が3〜32%、Al2O3が0〜12%、BaOが0〜10%、ZnOが0〜15%、TiO2が0〜2.5%、Bi2O3が0〜25%の組成を有し、軟化点が420〜590℃である非結晶性フリットが挙げられる。
【0027】
酸化ビスマスを主成分とするガラス粉末の好ましい例としては、酸化物基準の重量%で、Bi2O3が35〜88%、B2O3が5〜30%、SiO2が0〜20%、Al2O3が0〜5%、BaOが1〜25%、ZnOが1〜20%の組成を有し、軟化点が420〜590℃である非結晶性フリットが挙げられる。
【0028】
酸化亜鉛を主成分とするガラス粉末の好ましい例としては、酸化物基準の重量%で、ZnOが25〜60%、K2Oが2〜15%、B2O3が25〜45%、SiO2が1〜7%、Al2O3が0〜10%、BaOが0〜20%、MgOが0〜10%の組成を有し、軟化点が420〜590℃である非結晶性フリットが挙げられる。
【0029】
ペーストの色調を黒にする場合、Fe、Co、Cu、Cr、Mn、Alの1種又は2種類以上を主成分として含む金属酸化物からなる黒色顔料を添加することができる。
【0030】
また、本発明で用いる無機粉体は、10ミクロン以下の粒径のものが好適に使用されるため、2次凝集防止、分散性の向上を目的として、無機粉体の性質を損わない範囲で有機酸、無機酸、シランカップリング剤、チタネート系カップリング剤、アルミニウム系カップリング剤等で予め表面処理したものを用いたり、感光性組成物をペースト化する時点で上記処理剤を添加することが好ましい。無機粉体の処理方法としては、上記のような表面処理剤を有機溶剤や水などに溶解させた後、無機粉体を添加攪拌し、溶媒を留去した後、約50〜200℃で2時間以上加熱処理を施すことが望ましい。
【0031】
本発明に係る感光性組成物では、組成物の保存安定性向上のため、金属あるいは酸化物粉末との錯体化あるいは塩形成などの効果のある化合物を、安定剤(E)として添加する。
安定剤(E)としては、無機酸、有機酸などの酸を好適に用いることができる。このような安定剤としての酸(E)は、無機粉体(D)100重量部当り0.1〜5重量部添加することが好ましい。
【0032】
無機酸としては、硝酸、硫酸、塩酸、ホウ酸等が挙げられる。
また、有機酸としては、ギ酸、酢酸、アセト酢酸、クエン酸、イソクエン酸、アニス酸、プロピオン酸、酪酸、イソ酪酸、吉草酸、イソ吉草酸、アゼライン酸、チリック酸、パレリック酸、カプロン酸、イソカプロン酸、エナント酸、カプリル酸、ペラルゴン酸、ウンデカン酸、ラウリル酸、トリデカン酸、ミリスチン酸、パルミチン酸、ステアリン酸、アラキン酸、ベヘン酸、ベヘニン酸、シュウ酸、マロン酸、エチルマロン酸、コハク酸、グルタル酸、アジピン酸、ピメリン酸、ピルビン酸、ピペロニル酸、ピロメリット酸、スベリン酸、アゼライン酸、セバシン酸、マレイン酸、フマル酸、フタル酸、イソフタル酸、テレフタル酸、酒石酸、レブリン酸、乳酸、安息香酸、イソプロピル安息香酸、サリチル酸、イソカプロン酸、クロトン酸、イソクロトン酸、アクリル酸、メタクリル酸、チグリン酸、エチルアクリル酸、エチリデンプロピオン酸、ジメチルアクリル酸、シトロネル酸、ウンデセン酸、ウンデカン酸、オレイン酸、エライジン酸、エルカ酸、ブラシジン酸、フェニル酢酸、ケイ皮酸、メチルケイ皮酸、ナフトエ酸、アビエチン酸、アセチレンジカルボン酸、アトロラクチン酸、イタコン酸、クロトン酸、ソルビン酸、バニリン酸、パルミチン酸、ヒドロキシケイ皮酸、ヒドロキシナフトエ酸、ヒドロキシ酪酸、ビフェニルジカルボン酸、フェニルケイ皮酸、フェニル酢酸、フェニルプロピオル酸、フェノキシ酢酸、プロピオル酸、ヘキサン酸、ヘプタン酸、ベラトルム酸、ペラルゴン酸、ベンジル酸、エナント酸、エライジン酸、エルカ酸、オキサロコハク酸、オキサロ酢酸、オクタン酸、カプリル酸、没食子酸、マンデル酸、ミリスチン酸、メサコン酸、メチルマロン酸、メリト酸、ラウリン酸、リシノール酸、リノール酸、リンゴ酸、等が挙げられる。
【0033】
その他の酸として、ベンゼンスルホン酸、トルエンスルホン酸、ナフタリンスルホン酸、エタンスルホン酸、ナフトールスルホン酸、タウリン、メタニル酸、スルファニル酸、ナフチルアミンスルホン酸、スルホ安息香酸、スルファミン酸等のスルホン酸系の酸も用いることができる。
以上に列挙したような安定剤としての酸は、単独で又は2種以上を組み合わせて用いることができる。
【0034】
本発明の感光性組成物は、その所望の特性を損わない範囲で、さらに必要に応じて、各種顔料、特に耐熱性無機顔料、シリコーン系、アクリル系等の消泡・レベリング剤、等の他の添加剤を配合することもできる。さらにまた、必要に応じて、導電性金属粉の酸化を防止するための公知慣用の酸化防止剤や、保存時の熱的安定性を向上させるための熱重合禁止剤、焼成時における基板との結合成分としての金属酸化物、ケイ素酸化物、ホウ素酸化物などの微粒子を添加することもできる。
【0035】
本発明の感光性樹脂組成物は、前述のように導電性ペーストとして用いることができ、これらはフィルム化して使用もできるが、ペーストをそのまま使用する場合は、スクリーン印刷法、カーテンコート法、ロールコート法、バーコート法、ブレードコート法等の適宜の方法により、ガラス板、セラミックス板等の各種基板に塗布する。塗布後、熱風循環式乾燥炉、遠赤外線乾燥炉等で例えば約60〜120℃で5〜40分間程度乾燥させてタックフリーの塗膜を得る。その後、選択的露光、現像、焼成を行って所定の導体パターンを形成する。
【0036】
露光工程としては、所定の露光パターンを有するネガマスクを用いた接触露光及び非接触露光が可能であるが、解像度の点からは接触露光が好ましい。露光光源としては、ハロゲンランプ、高圧水銀灯、レーザー光、メタルハライドランプ、ブラックランプ、無電極ランプなどが使用される。露光量としては50〜1000mJ/cm2が好ましい。
【0037】
現像工程としてはスプレー法、浸漬法等が用いられる。現像液としては、水酸化ナトリウム、水酸化カリウム、炭酸ナトリウム、炭酸カリウム、珪酸ナトリウムなどの金属アルカリ水溶液や、モノエタノールアミン、ジエタノールアミン、トリエタノールアミンなどのアミン水溶液、特に約1.5重量%以下の濃度の希アルカリ水溶液が好適に用いられるが、組成物中のカルボキシル基含有感光性ポリマーのカルボキシル基がケン化され、未硬化部(未露光部)が除去されればよく、上記のような現像液に限定されるものではない。また、現像後に不要な現像液の除去のため、水洗や酸中和を行うことが好ましい。
【0038】
焼成工程においては、現像後の基板を空気中又は窒素雰囲気下で約380〜600℃の加熱処理を行い、所望の導体パターンを形成する。またこの時、焼成工程の前段階として、約300〜500℃に加熱してその温度で所定時間保持し、有機物を除去する工程を入れることが好ましい。
【0039】
【実施例】
以下に実施例及び比較例を示して本発明について具体的に説明するが、本発明が下記実施例に限定されるものでないことはもとよりである。なお、「部」及び「%」とあるのは、特に断りがない限り全て重量基準である。
【0040】
合成例1
温度計、撹拌機、滴下ロート、及び還流冷却器を備えた三つ口フラスコに、メチルメタアクリレートを200g、メタアクリル酸を86g、ジエチレングリコールモノエチルエーテルアセテートを300g仕込み、触媒としてアゾビスイソブチロニトリルを加え、撹拌しながら80℃で15時間反応させた。その後、グリシジルメタアクリレート60g、トリフェニルホスフィン0.5g、重合禁止剤としてハイドロキノン0.2gを計り取り、滴下ロートで上記反応溶液に滴下し、80℃で8時間反応させ、カルボキシル基含有感光性ポリマー(A−1)を得た。このとき得られた樹脂の酸価は105mgKOH/gであった。
【0041】
合成例2
温度計、撹拌機、滴下ロート、及び還流冷却器を備えた三つ口フラスコに、エチルメタアクリレートを228g、メタアクリル酸を86g、ジエチレングリコールモノエチルエーテルアセテートを300g仕込み、触媒としてアゾビスイソブチロニトリルを加え、撹拌しながら80℃で15時間反応させた。その後、グリシジルメタアクリレート60g、トリフェニルホスフィン0.5g、重合禁止剤としてハイドロキノン0.2gを計り取り、滴下ロートで上記反応溶液に滴下し、80℃で8時間反応させ、カルボキシル基含有感光性ポリマー(A−2)を得た。このとき得られた樹脂の酸価は95mgKOH/gであった。
【0042】
合成例3
温度計、撹拌機、滴下ロート、及び還流冷却器を備えた三つ口フラスコに、t−ブチルメタアクリレートを284g、メタアクリル酸を86g、ジエチレングリコールモノエチルエーテルアセテートを300g仕込み、触媒としてアゾビスイソブチロニトリルを加え、撹拌しながら80℃で15時間反応させた。その後、グリシジルメタアクリレート60g、トリフェニルホスフィン0.5g、重合禁止剤としてハイドロキノン0.2gを計り取り、滴下ロートで上記反応溶液に滴下し、80℃で8時間反応させ、カルボキシル基含有感光性ポリマー(A−3)を得た。このとき得られた樹脂の酸価は80mgKOH/gであった。
【0043】
比較合成例1
温度計、撹拌機、滴下ロート、及び還流冷却器を備えた三つ口フラスコに、メチルメタアクリレートを250g、メタアクリル酸を43g、ジエチレングリコールモノエチルエーテルアセテートを300g仕込み、触媒としてアゾビスイソブチロニトリルを加え、撹拌しながら80℃で10時間反応させてカルボキシル基含有ポリマー(A’)を得た。このとき得られた樹脂(A’)の酸価は100mgKOH/gであった。
【0044】
実施例1〜3及び比較例1、2
前記合成例にて得られた各樹脂を用い、他の成分と共に下記表1に示す組成比にて配合し、攪拌機により攪拌後、3本ロールミルにより練肉してペースト化を行い、感光性組成物を調製した。
【0045】
特性試験:
前記のようにペースト化した感光性組成物を、200メッシュのステンレススクリーンを用いてガラス基板上に40ミクロンの厚みで塗布し、80℃の熱風乾燥炉で20分間乾燥させた後、ライン/スペースパターンがL/S=30/150(ミクロン)のネガフィルムを密着させ、オーク(株)製680GW露光機により紫外線を照射後、30℃の1%Na2CO3水溶液により水圧1.5kgf/cm2で1分間現像し、水洗、乾燥した。その後、焼成炉にて450℃で30分焼成し、さらに550℃まで昇温し、その温度で30分間焼成して評価基板を作成し、以下の項目について評価した。
【0046】
保存安定性:
保存安定性は、作成したペーストを20℃で保管し、3日間、1月間又は3月間経過した後の増粘率で評価した。
○:増粘率15%未満
△:増粘率15%〜30%
×:増粘率30%以上
【0047】
解像性:
紫外線照射はライン幅30μm、スペース150μmのネガフィルムを使用し、200mJ/cm2で実施した。
解像性の評価は、光学顕微鏡にて、ライン幅の再現性、形状、断線等を観察し、下記基準で行った。
○:全てにおいて良好である。
△:ライン幅再現性において±10μm以上の差が出ており、形状が不規則であるが断線はない。
×:ライン幅再現性において±15μm以上の差が出ており、形状が不規則であり、断線が見られる。
【0048】
焼成ライン形状:
焼成ライン形状は、5℃/分の昇温速度で450℃まで昇温し、450℃で30分間ホールドし、有機分を焼成した後、再度5℃/分で昇温し、550℃で30分間焼成を実施したものについて光学顕微鏡で観察した。
良好:焼成前の形状を保っている。
不良:焼成前の形状を保たず、ラインに断線、よれ等が発生している。
【0049】
比抵抗:
比抵抗値は、0.4cm×10cmのパターンにて抵抗値、膜厚を測定して算出した。
前記各種特性についての評価結果を下記表1に併せて示す。
【表1】
【0050】
【発明の効果】
以上のように、本発明のアルカリ現像型の感光性組成物によれば、露光の際の光硬化深度が大きいため、焼成後のパターンのよれや線幅収縮等の問題のない高精細な導体パターンを安定して形成することができる。また、光硬化性や解像度に優れるため、比較的に厚膜であっても高精細なパターン形成が可能であり、また同一の膜厚では同じライン/スペースパターンを形成可能な最少露光量が少なくて済み、省エネルギーの観点からも有利である。
また、フォトリソグラフィー技術により容易に大面積の基板に高精細の導体パターンを作業性良く形成でき、しかも600℃以下での焼成工程でも充分に採用でき、歩留りの大幅な向上を実現できる。[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a front substrate of a plasma display panel.On the boardConductor circuit pattern to be formedNIt can be applied particularly advantageously to the formation of conductive materials for fluorescent display tubes and electronic components.the body'sDevelopable with alkaline aqueous solution that can be applied to formingFor conductor pattern formationPhotosensitive composition and conductor pattern obtained using the sameToRelated.
[0002]
[Prior art]
Conventionally, the formation of conductor patterns and dielectric patterns in plasma display panels, fluorescent display tubes, electronic components, etc. is generally performed by screen printing using a conductive paste or glass paste containing a very large amount of metal powder or glass powder. Pattern formation was performed.
However, in recent years, high definition of patterns has been required for electronic parts and the like. Pattern formation by the conventional screen printing method requires skill, and there are problems such as alignment and accuracy due to wrinkling and bleeding during printing, and expansion and contraction of the screen, making it difficult to handle high-definition patterns. ing.
[0003]
In contrast, photosensitive pastes containing copolymer powders that are easily depolymerized by heat together with inorganic powders have come to be used for high definition, but photoreactive groups are added to the base resin. There are many that are not present, and the photocuring depth at the time of exposure is insufficient, resulting in a problem of poor resolution after development. In order to improve the photocuring depth and form a high-definition pattern, it is necessary to add a large amount of reactive diluent (photocurable monomer). Therefore, the unsaturated groups of the reactive diluent are not exposed during exposure. The proportion of unreacted remaining increases, unreacted reactive diluent gels during firing to generate firing residues, and causes shrinkage due to gelation, causing problems such as pattern distortion and line width shrinkage, In severe cases, disconnection may occur.
[0004]
On the other hand, as a photosensitive conductive paste for forming a conductor pattern on a ceramic circuit board, conductive powder, an acrylic copolymer having a carboxyl group and an ethylenically unsaturated group in the side chain, such as methacrylic acid, Paste compositions containing a polymer obtained by addition-reacting a copolymer of methyl methacrylate and styrene with glycidyl acrylate, a photoreactive compound and a photopolymerization initiator are disclosed in, for example, JP-A-5-67405 and JP-A-5-271576. Is disclosed. Such a photosensitive conductive paste can be applied to a substrate, and then a conductor circuit pattern can be formed by exposure and development. However, it is taught that baking is performed at 600 to 1,000 ° C. The firing electrode is formed at a firing temperature of 600 ° C. or lower (since glass is generally used for the substrate of the plasma display panel, so firing is required to be performed at a temperature of 600 ° C. or lower). This is not suitable for plasma display panels because of the effect of causing deterioration of circuit conductivity.
[0005]
[Problems to be solved by the invention]
The present invention has been made in view of the problems of the prior art as described above, and its basic purpose is excellent in photocurability, and excellent photocuring depth even when an extremely large amount of inorganic fine powder is contained. In addition, it has excellent storage stability, developability with an aqueous alkali solution, adhesion to the substrate, and fireability.For conductor pattern formationIt is to provide a photosensitive composition.
A more specific object of the present invention is to provide a high-definition conductor circuit pattern with good workability and productivity by photolithography technology.TheDevelopable with an aqueous alkali solution that can be formed and can be baked at 600 ° C. or lower without producing a baking residue that adversely affects the imageFor conductor pattern formationIt is to provide a photosensitive composition.
Another object of the present invention is a high-definition produced from such a photosensitive composition with high productivity by a series of steps of selective exposure, development, and baking.conductorIt is to provide a pattern and a manufacturing technique thereof.
[0006]
[Means for Solving the Problems]
In order to achieve the object, according to the present invention, a copolymer of (A) a compound (a) having an unsaturated double bond and a carboxyl group and a compound (b) having an unsaturated double bond is added to glycidyl. Carboxyl group-containing photosensitivity obtained by reacting (meth) acrylate (c), having a weight average molecular weight of 500 to 50,000 and containing one unsaturated group per weight average molecular weight of 400 to 4,000. (B) Diluent, (C) Photopolymerization initiator, (D) Inorganic powder containing silver powder and glass powder, and (E) StabilizerAt least one selected from the group consisting of inorganic acids and organic acids having only carboxyl or sulfonic acid groups as acid groupsAn acid is contained, and the compounding amount of the silver powder is 25 to 1,000 parts by weight per 100 parts by weight of the carboxyl group-containing photosensitive polymer (A), and the compounding amount of the glass powder is the silver powder 100 There is provided a photosensitive composition for forming a conductor pattern, characterized in that the ratio is 1 to 30 parts by weight with respect to parts by weight. The term “glycidyl (meth) acrylate” used in the present specification means glycidyl acrylate, glycidyl methacrylate, or a mixture thereof.
[0007]
Of the present inventionFor conductor pattern formationThe photosensitive composition may be in the form of a paste or may be in the form of a dry film previously formed into a film.
UpAs the inorganic powder, a powder having a particle size of 10 microns or less is preferably used.Silver powder and glass powder, especiallyA low melting point glass having a softening point of 300 to 600 ° C. can be suitably used. As the black pigment, a black pigment made of a metal oxide containing one or more of Fe, Co, Cu, Cr, Mn, and Al as a main component can be suitably used.
[0008]
In the present inventionAccording to the above, the conductor pattern formed from the photosensitive composition for forming a conductor pattern as described above iscan get. For example, when the conductive composition for forming a conductive pattern is in a paste-like form, the paste-like photosensitive composition is applied on a substrate and dried to form a film, whereas in the case of a dry film form, it is formed on the substrate. After laminating, patterning by selective exposure and development, and baking, a high-definition conductor pattern can be obtained.
[0009]
DETAILED DESCRIPTION OF THE INVENTION
As described above, when a fired product pattern is formed using a conventional photosensitive paste composition, the photocuring depth at the time of exposure is insufficient, resulting in poor resolution after development, and the pattern at the time of firing. Problems such as warping and line width shrinkage also occur. As a result of earnest research on such a phenomenon, the present inventors have found that the conductor patternNThe photosensitive paste composition used for forming contains a very large amount of inorganic powder such as fine metal particles having a very small particle size, so that the light transmission is poor during exposure, and therefore photocuring is insufficient. Further, it has been found that a significant factor is that non-uniformity of photocuring easily occurs. Such a phenomenon becomes more prominent as the film thickness becomes thicker and as the film becomes deeper.
[0010]
Therefore, in the photosensitive composition of the present invention, the first is to use a specific photosensitive resin in which a group having an α, β-ethylenically unsaturated bond is added as a pendant to the inorganic powder binder resin itself. It is a feature. That is, the carboxyl group-containing photosensitive polymer (A) used in the present invention is a carboxyl group of a copolymer of a compound (a) having an unsaturated double bond and a carboxyl group and a compound (b) having an unsaturated double bond. A portion of the glycidyl (meth) acrylate (c) is reacted with glycidyl (meth) acrylate (c) at such a ratio that the photocurability is improved to such an extent that a sufficient depth of photocuring can be obtained. It is characterized by introducing a double bond into the side chain. Moreover, since a part of carboxyl group which the compound (a) which is one monomer component of the said copolymer has remained unreacted, the obtained carboxyl group-containing photosensitive polymer (A) And soluble. Therefore, the film formed from the photosensitive composition of the present invention can be stably developed with an aqueous alkaline solution after selective exposure.
[0011]
In the photosensitive composition of the present invention, a low melting glass powder is used as the inorganic powder (D) when a glass paste is composed, but other inorganics such as a metal powder when composing a conductive paste are used. Even when powder is used, it is preferable to add a small amount of low-melting glass powder, whereby firing at a temperature of 600 ° C. or lower is possible, and adhesion of the fired product pattern to the substrate is improved. However, in a composition containing such metal powder or glass powder, there is a problem that the storage stability is liable to be lowered, and the coating workability is liable to be deteriorated due to gelation or fluidity. Therefore, in the photosensitive composition of the present invention, a stabilizer together with the carboxyl group-containing photosensitive polymer (A), the diluent (B), the photopolymerization initiator (C), and the inorganic powder (D).As acidMixing (E) is a second feature.
As a result, the photosensitive composition of the present invention has no problems such as poor storage stability and poor coating workability due to gelation or fluidity reduction, and can easily be applied to a large area substrate by photolithography technology. This pattern can be formed, and can be sufficiently used even in a baking process at 600 ° C. or lower, and a significant improvement in yield can be realized.
[0012]
Hereinafter, each component of the photosensitive composition of this invention is demonstrated in detail.
The carboxyl group-containing photosensitive polymer (A) used in the present invention is a compound having an unsaturated double bond and a carboxyl group in the molecule, that is, a compound (b) having an unsaturated carboxylic acid (a) and an unsaturated double bond. It is resin obtained by making glycidyl (meth) acrylate (c) react with a part of carboxyl group of this copolymer.
Such a carboxyl group-containing photosensitive polymer (A) is preferably blended in a proportion of 5 to 30% by weight of the total amount of the composition. When the blending amount of the photosensitive polymer is too smaller than the above range, the distribution of the photosensitive polymer in the film to be formed tends to be non-uniform, and it is difficult to obtain sufficient photocurability and photocuring depth. Patterning by exposure and development becomes difficult. On the other hand, if it is more than the above range, it is not preferable because the pattern during baking and the shrinkage of the line width are likely to occur.
[0013]
As the carboxyl group-containing photosensitive polymer (A), those having a weight average molecular weight of 500 to 50,000 and an acid value of 20 to 150 mgKOH / g, preferably 40 to 120 mgKOH / g can be suitably used. When the molecular weight of the carboxyl group-containing photosensitive polymer (A) is lower than 500, the adhesion of the film during development is adversely affected. On the other hand, when the molecular weight is higher than 50,000, development defects are liable to occur. On the other hand, when the acid value is lower than 20 mgKOH / g, the solubility in an alkaline aqueous solution is insufficient, and development failure tends to occur. On the other hand, when the acid value is higher than 150 mgKOH / g, the adhesion of the film is deteriorated during development and the photocured part ( This is not preferable because dissolution of the exposed portion is likely to occur.
[0014]
Specific examples of the unsaturated carboxylic acid (a) include acrylic acid, methacrylic acid, itaconic acid, crotonic acid, maleic acid, fumaric acid, vinyl acetic acid, or acid anhydrides thereof, and maleic anhydride. Unsaturated compounds having hydroxyl groups such as acid anhydrides such as acid, itaconic anhydride, pyromellitic anhydride and hydroxyalkyl (meth) acrylates such as 2-hydroxyethyl (meth) acrylate and 2-hydroxypropyl (meth) acrylate The reaction product etc. are mentioned, These can be used individually or in combination of 2 or more types. In the present specification, (meth) acrylate is a general term for acrylate and methacrylate.
[0015]
Specific examples of the compound (b) having an unsaturated double bond include styrene, chlorostyrene, α-methylstyrene; methyl, ethyl, propyl, isopropyl, n-butyl, isobutyl, t-butyl, amyl as substituents , 2-ethylhexyl, octyl, capryl, nonyl, dodecyl, hexadecyl, octadecyl, cyclohexyl, isobornyl, methoxyethyl, butoxyethyl, 2-hydroxyethyl, 2-hydroxypropyl, 3-chloro-2-hydroxypropyl, etc. (meta ) Acrylate; mono (meth) acrylate of polyethylene glycol or mono (meth) acrylate of polypropylene glycol; vinyl acetate, vinyl butyrate, vinyl benzoate; acrylamide, methacrylamide, N-hydroxymethyl acrylate , N-hydroxymethyl methacrylamide, N-methoxymethyl acrylamide, N-ethoxymethyl acrylamide, N-butoxymethyl acrylamide, acrylonitrile, isobutylene, etc., and these may be used alone or in combination of two or more. Can do. Among these compounds, styrene, α-methylstyrene, lower alkyl (meth) acrylate, and isobutylene are preferably used.
[0016]
The copolymerization reaction between the unsaturated carboxylic acid (a) and the compound (b) having an unsaturated double bond can be easily carried out in the presence of a radical polymerization catalyst such as azobisisobutyronitrile and organic peroxide. It proceeds and can be carried out according to a conventional method, for example, by a solution polymerization method at about 40 to 130 ° C., and a random copolymer is produced.
In addition, the addition reaction of the glycidyl (meth) acrylate (c) to the carboxyl group of the side chain of the obtained copolymer is a catalyst such as triethylamine, benzyldimethylamine, methyltriethylammonium chloride to accelerate the reaction. Benzyltrimethylammonium bromide, benzyltrimethylammonium iodide, triphenylphosphine, triphenylstibine, chromium octoate, zirconium octoate and the like are preferably used, and the amount of the catalyst used is preferably relative to the reaction raw material mixture. Is 0.1 to 10% by weight. In order to prevent polymerization during the reaction, it is preferable to use a polymerization inhibitor such as hydroquinone, methyl hydroquinone, hydroquinone monomethyl ether, catechol, pyrogallol, etc., and the amount used is preferably relative to the reaction raw material mixture. 0.01 to 1% by weight. The reaction temperature of the addition reaction is preferably 60 to 100 ° C.
[0017]
The ratio of the glycidyl (meth) acrylate (c) to be subjected to addition reaction with the carboxyl group of the copolymer of the unsaturated carboxylic acid (a) and the unsaturated compound (b) is the weight average molecular weight of the polymer to be produced is 400 to 4,000. A ratio of one unsaturated group (unsaturated group of the glycidyl (meth) acrylate (c)) per hit is preferred. If the amount of unsaturated groups to be introduced exceeds the above ratio, a phenomenon such as halation occurs during image formation by selective exposure, and it becomes difficult to form a sharp pattern. Is more likely to occur. Furthermore, since there are many unsaturated groups, the shrinkage | contraction at the time of radical polymerization in the case of exposure, or a coating film becomes too hard after radical polymerization will become weak, and it will become easy to generate | occur | produce poor adhesion | attachment with a board | substrate. On the other hand, if the amount of unsaturated groups is less than the above-mentioned ratio, it becomes necessary to increase the amount of exposure during pattern formation, or pattern formation occurs in the development and washing steps, making it difficult to form a sharp pattern. Easy to be.
[0018]
As a diluent (B) mix | blended with the photosensitive composition of this invention, the organic solvent and / or the reactive diluent containing an unsaturated group can be used.
Typical examples of the organic solvent include toluene, xylene, tetramethylbenzene, Exube Chemical Co., Ltd. Solvesso # 100, Solvesso # 150, Solvesso # 200, Exxon Aromatic Naphtha No. 2. Aromatic solvents such as LAWS, HAWS, VLAWS, Shellsol D40, D70, D100, 70, 71, 72, A, AB, R, DOSB, and DOSB-8 manufactured by Shell Co .; Exxon Chemical Co., Ltd. Exxon naphtha no. 5, no. 6, no. 7. Aliphatic solvents such as exon orderless solvent, exon rubber solvent; alcohol solvents such as methanol, ethanol, propanol, isopropanol, butanol, hexanol, cellosolve, butyl cellosolve, carbitol, butyl carbitol; ethyl acetate, butyl acetate And ester solvents such as cellosolve acetate, carbitol acetate, methyl lactate, ethyl lactate, and butyl lactate. These organic solvents can be used alone or in admixture of two or more.
[0019]
Representative examples of unsaturated group-containing reactive diluents include hydroxyalkyl (meth) acrylates such as 2-hydroxyethyl (meth) acrylate and 2-hydroxypropyl (meth) acrylate; ethylene glycol, methoxytetraethylene Mono- or di (meth) acrylates of glycols such as glycol and polyethylene glycol; (meth) acrylamides such as N, N-dimethyl (meth) acrylamide and N-methylol (meth) acrylamide; N, N-dimethylaminoethyl ( Aminoalkyl (meth) acrylates such as meth) acrylate; polyvalent alcohols such as hexanediol, trimethylolpropane, pentaerythritol, ditrimethylolpropane, dipentaerythritol, trishydroxyethyl isocyanurate Or polyvalent (meth) acrylates of these ethylene oxide or propylene oxide adducts; (meta) of ethylene oxide or propylene oxide adducts of phenols such as phenoxyethyl (meth) acrylate and polyethoxydi (meth) acrylate of bisphenol A ) Acrylates; (meth) acrylates of glycidyl ethers such as glycerin diglycidyl ether, trimethylolpropane triglycidyl ether, triglycidyl isocyanurate; and melamine (meth) acrylate. Furthermore, a reaction product of a hydroxyl group-containing (meth) acrylate and an anhydride of a polyvalent carboxylic acid compound can be mentioned, and a compound having a hydroxyl group is preferable because it has a good influence on the stability of the composition. These unsaturated group-containing reactive diluents can be used alone or in admixture of two or more, and not only act as a diluent, but also to promote photocurability and improve developability of the composition. Also contribute.
[0020]
The organic solvent and the reactive diluent containing an unsaturated group are used alone or as a mixture of two or more. The blending ratio of these diluents (B) can be blended in an appropriate amount depending on the coating method of the composition, but generally 1 to 200 per 100 parts by weight of the carboxyl group-containing photosensitive polymer (A). Part by weight, preferably 20 to 100 parts by weight is suitable.
[0021]
Specific examples of the photopolymerization initiator (C) include benzoin and benzoin alkyl ethers such as benzoin, benzoin methyl ether, benzoin ethyl ether, and benzoin isopropyl ether; acetophenone, 2,2-dimethoxy-2-phenylacetophenone, 2, Acetophenones such as 2-diethoxy-2-phenylacetophenone and 1,1-dichloroacetophenone; 2-methyl-1- [4- (methylthio) phenyl] -2-morpholinopropan-1-one, 2-benzyl-2- Aminoacetophenones such as dimethylamino-1- (4-morpholinophenyl) -butanone-1; anthraquinones such as 2-methylanthraquinone, 2-ethylanthraquinone, 2-t-butylanthraquinone, 1-chloroanthraquinone; 2 Thioxanthones such as 4-dimethylthioxanthone, 2,4-diethylthioxanthone, 2-chlorothioxanthone, 2,4-diisopropylthioxanthone; ketals such as acetophenone dimethyl ketal and benzyldimethyl ketal; benzophenones such as benzophenone; or xanthones; (2,6-dimethoxybenzoyl) -2,4,4-pentylphosphine oxide, bis (2,4,6-trimethylbenzoyl) -phenylphosphine oxide, 2,4,6-trimethylbenzoyldiphenylphosphine oxide, ethyl Phosphine oxides such as -2,4,6-trimethylbenzoylphenyl phosphinate; various peroxides and the like. These known and commonly used photopolymerization initiators may be used alone or in combination of two or more. It can be used in combination. The blending ratio of these photopolymerization initiators (C) is preferably 1 to 20 parts by weight per 100 parts by weight of the carboxyl group-containing photosensitive polymer (A).
[0022]
The photopolymerization initiator (C) is composed of N, N-dimethylaminobenzoic acid ethyl ester, N, N-dimethylaminobenzoic acid isoamyl ester, pentyl-4-dimethylaminobenzoate, triethylamine, triethanolamine. It can be used in combination with one or more photosensitizers such as tertiary amines.
In addition, when a deeper photocuring depth is required, a titanocene photopolymerization initiator such as CGI784 manufactured by Ciba Specialty Chemicals, which initiates radical polymerization in the visible region, and a leuco dye can be used as needed. It can be used in combination as an agent.
[0023]
Specific examples of the inorganic powder (D) used when the photosensitive composition of the present invention is formulated as a conductive paste include metal fine particles (D-1)WhenExamples thereof include a mixture of glass fine particles (D-2).
As metal fine particles (D-1)Silver is suitableCan be used. the aboveSilver powderThe average particle size is preferably a particle size of 10 microns or less from the viewpoint of resolution. Also,ball, Blocks, flakes, and dendrites can be used alone or in combination of two or more.
[0024]
SilverAn appropriate ratio of the powder is 25 to 1,000 parts by weight per 100 parts by weight of the carboxyl group-containing photosensitive polymer (A).SilverWhen the blending amount of the powder is less than 25 parts by weight, the conductor circuit line width shrinkage or disconnection tends to occur. On the other hand, when the blending amount exceeds 1,000 parts by weight, the light transmission is impaired, and the composition is sufficient. It is difficult to obtain a good photocurability.
Furthermore, in order to improve the strength of the film after firing and the adhesion to the substrate, a glass powder (D-2) as described later is used.SilverIt can add in the range of 1-30 weight part with respect to 100 weight part of powder.
[0025]
Photosensitive composition of the present inventionTo thingsAs the glass powder (D-2) to be used, a low melting point glass having a softening point of 300 to 600 ° C. is used, and an average particle diameter of 10 μm or less mainly composed of lead oxide, bismuth oxide, or zinc oxide. Can be used suitablyThe
[0026]
As a preferable example of the glass powder containing lead oxide as a main component, PbO is 48 to 82% by weight% based on oxide, B2O30.5 to 22%, SiO2Is 3 to 32%, Al2O30-12%, BaO 0-10%, ZnO 0-15%, TiO20-2.5%, Bi2O3Is a non-crystalline frit having a composition of 0 to 25% and a softening point of 420 to 590 ° C.
[0027]
Preferable examples of the glass powder containing bismuth oxide as a main component include Bi by weight based on oxide, Bi2O335-88%, B2O35-30%, SiO20-20%, Al2O3Is a non-crystalline frit having a composition of 0 to 5%, BaO of 1 to 25%, ZnO of 1 to 20%, and a softening point of 420 to 590 ° C.
[0028]
Preferable examples of the glass powder containing zinc oxide as a main component include ZnO in an amount of 25% to 60% by weight based on oxide, K2O is 2 to 15%, B2O3Is 25 to 45%, SiO21-7%, Al2O3Is a non-crystalline frit having a composition of 0-10%, BaO 0-20%, MgO 0-10%, and a softening point of 420-590 ° C.
[0029]
When the color tone of the paste is black, a black pigment made of a metal oxide containing one or more of Fe, Co, Cu, Cr, Mn, and Al as a main component can be added.
[0030]
In addition, since the inorganic powder used in the present invention preferably has a particle size of 10 microns or less, it does not impair the properties of the inorganic powder for the purpose of preventing secondary aggregation and improving dispersibility. In the case of using an organic acid, an inorganic acid, a silane coupling agent, a titanate coupling agent, an aluminum coupling agent, or the like that has been surface-treated in advance, or the above-mentioned treatment agent is added when the photosensitive composition is pasted. It is preferable. The inorganic powder is treated by dissolving the surface treatment agent as described above in an organic solvent or water, adding and stirring the inorganic powder, and distilling off the solvent. It is desirable to perform heat treatment for more than an hour.
[0031]
In the photosensitive composition according to the present invention, in order to improve the storage stability of the composition, a compound having an effect such as complexation with metal or oxide powder or salt formation is added as a stabilizer (E).
As the stabilizer (E), acids such as inorganic acids and organic acids can be suitably used. Such stabilizersAcid (E) asIs preferably added in an amount of 0.1 to 5 parts by weight per 100 parts by weight of the inorganic powder (D).
[0032]
Examples of the inorganic acid include nitric acid, sulfuric acid, hydrochloric acid, boric acid and the like.
Examples of organic acids include formic acid, acetic acid, acetoacetic acid, citric acid, isocitric acid, anisic acid, propionic acid, butyric acid, isobutyric acid, valeric acid, isovaleric acid, azelaic acid, tyric acid, pareric acid, caproic acid, Isocaproic acid, enanthic acid, caprylic acid, pelargonic acid, undecanoic acid, lauric acid, tridecanoic acid, myristic acid, palmitic acid, stearic acid, arachidic acid, behenic acid, behenic acid, oxalic acid, malonic acid, ethylmalonic acid, succinic acid Acid, glutaric acid, adipic acid, pimelic acid, pyruvic acid, piperonic acid, pyromellitic acid, suberic acid, azelaic acid, sebacic acid, maleic acid, fumaric acid, phthalic acid, isophthalic acid, terephthalic acid, tartaric acid, levulinic acid, Lactic acid, benzoic acid, isopropylbenzoic acid, salicylic acid, isocaproic acid, croto Acid, isocrotonic acid, acrylic acid, methacrylic acid, tiglic acid, ethyl acrylic acid, ethylidenepropionic acid, dimethyl acrylic acid, citronellic acid, undecenoic acid, undecanoic acid, oleic acid, elaidic acid, erucic acid, brassic acid, phenylacetic acid, Cinnamic acid, methylcinnamic acid, naphthoic acid, abietic acid, acetylenedicarboxylic acid, atrolactic acid, itaconic acid, crotonic acid, sorbic acid, vanillic acid, palmitic acid, hydroxycinnamic acid, hydroxynaphthoic acid, hydroxybutyric acid, biphenyl Dicarboxylic acid, phenylcinnamic acid, phenylacetic acid, phenylpropiolic acid, phenoxyacetic acid, propiolic acid, hexanoic acid, heptanoic acid, veratromic acid, pelargonic acid, benzylic acid, enanthic acid, elaidic acid, erucic acid, oxalosuccinic acid Oxaloacetate, octanoic acid, caprylic acid, gallic acid, mandelic, myristic acid, mesaconic acid, methylmalonic acid, mellitic acid, lauric acid, ricinoleic acid, linoleic acid, malic acid, and the like.
[0033]
Other acids include sulfonic acid acids such as benzene sulfonic acid, toluene sulfonic acid, naphthalene sulfonic acid, ethane sulfonic acid, naphthol sulfonic acid, taurine, metanilic acid, sulfanilic acid, naphthylamine sulfonic acid, sulfobenzoic acid and sulfamic acid. Can also be used.
Stabilizers as listed aboveAs acidCan be used alone or in combination of two or more.
[0034]
The photosensitive composition of the present invention is within a range that does not impair the desired properties, and if necessary, various pigments, particularly heat-resistant inorganic pigments, silicone-based, acrylic-based defoaming / leveling agents, etc. Other additives can also be blended. Furthermore, if necessary, a known and commonly used antioxidant for preventing oxidation of the conductive metal powder, a thermal polymerization inhibitor for improving the thermal stability during storage, and a substrate during firing. Fine particles such as metal oxides, silicon oxides and boron oxides can be added as a binding component.
[0035]
The photosensitive resin composition of the present invention has a conductive pace as described above.AndThese can be used in the form of a film, but when the paste is used as it is, it can be used by an appropriate method such as a screen printing method, a curtain coating method, a roll coating method, a bar coating method, or a blade coating method. It is applied to various substrates such as glass plates and ceramic plates. After the application, a tack-free coating film is obtained by drying at, for example, about 60 to 120 ° C. for about 5 to 40 minutes in a hot air circulation drying furnace, a far infrared drying furnace or the like. Thereafter, selective exposure, development, and baking are performed to obtain a predetermined conductor pattern.TheForm.
[0036]
As the exposure step, contact exposure and non-contact exposure using a negative mask having a predetermined exposure pattern are possible, but contact exposure is preferable from the viewpoint of resolution. As the exposure light source, a halogen lamp, a high-pressure mercury lamp, a laser beam, a metal halide lamp, a black lamp, an electrodeless lamp, or the like is used. The exposure amount is 50 to 1000 mJ / cm2Is preferred.
[0037]
As the development process, a spray method, an immersion method, or the like is used. Developers include aqueous alkali metal solutions such as sodium hydroxide, potassium hydroxide, sodium carbonate, potassium carbonate and sodium silicate, and aqueous amine solutions such as monoethanolamine, diethanolamine and triethanolamine, especially about 1.5% by weight or less. A dilute alkaline aqueous solution having a concentration of 2 is preferably used, as long as the carboxyl group of the carboxyl group-containing photosensitive polymer in the composition is saponified and the uncured part (unexposed part) is removed. The developer is not limited. Moreover, it is preferable to perform washing with water and acid neutralization in order to remove an unnecessary developer after development.
[0038]
In the baking step, the substrate after development is subjected to heat treatment at about 380 to 600 ° C. in air or in a nitrogen atmosphere,DesiredConductor putterTheForm. At this time, it is preferable to include a step of removing the organic matter by heating to about 300 to 500 ° C. and holding at that temperature for a predetermined time as a previous stage of the firing step.
[0039]
【Example】
EXAMPLES Hereinafter, the present invention will be described in detail with reference to examples and comparative examples, but the present invention is not limited to the following examples. “Parts” and “%” are based on weight unless otherwise specified.
[0040]
Synthesis example 1
A three-necked flask equipped with a thermometer, stirrer, dropping funnel, and reflux condenser was charged with 200 g of methyl methacrylate, 86 g of methacrylic acid, and 300 g of diethylene glycol monoethyl ether acetate, and azobisisobutyro as a catalyst. Nitrile was added and reacted at 80 ° C. for 15 hours with stirring. Thereafter, 60 g of glycidyl methacrylate, 0.5 g of triphenylphosphine, and 0.2 g of hydroquinone as a polymerization inhibitor were measured, dropped into the above reaction solution with a dropping funnel, reacted at 80 ° C. for 8 hours, and a carboxyl group-containing photosensitive polymer. (A-1) was obtained. The acid value of the resin obtained at this time was 105 mgKOH / g.
[0041]
Synthesis example 2
A three-necked flask equipped with a thermometer, stirrer, dropping funnel, and reflux condenser was charged with 228 g of ethyl methacrylate, 86 g of methacrylic acid, and 300 g of diethylene glycol monoethyl ether acetate, and azobisisobutyro as a catalyst. Nitrile was added and reacted at 80 ° C. for 15 hours with stirring. Thereafter, 60 g of glycidyl methacrylate, 0.5 g of triphenylphosphine, and 0.2 g of hydroquinone as a polymerization inhibitor were measured, dropped into the above reaction solution with a dropping funnel, reacted at 80 ° C. for 8 hours, and a carboxyl group-containing photosensitive polymer. (A-2) was obtained. The acid value of the resin obtained at this time was 95 mgKOH / g.
[0042]
Synthesis example 3
A three-necked flask equipped with a thermometer, a stirrer, a dropping funnel, and a reflux condenser was charged with 284 g of t-butyl methacrylate, 86 g of methacrylic acid, and 300 g of diethylene glycol monoethyl ether acetate, and azobisiso as a catalyst. Butyronitrile was added and reacted at 80 ° C. for 15 hours with stirring. Thereafter, 60 g of glycidyl methacrylate, 0.5 g of triphenylphosphine, and 0.2 g of hydroquinone as a polymerization inhibitor were measured, dropped into the above reaction solution with a dropping funnel, reacted at 80 ° C. for 8 hours, and a carboxyl group-containing photosensitive polymer. (A-3) was obtained. The acid value of the resin obtained at this time was 80 mgKOH / g.
[0043]
Comparative Synthesis Example 1
A three-necked flask equipped with a thermometer, stirrer, dropping funnel and reflux condenser was charged with 250 g of methyl methacrylate, 43 g of methacrylic acid and 300 g of diethylene glycol monoethyl ether acetate, and azobisisobutyro as a catalyst. Nitrile was added and reacted at 80 ° C. for 10 hours with stirring to obtain a carboxyl group-containing polymer (A ′). The acid value of the resin (A ′) obtained at this time was 100 mgKOH / g.
[0044]
Example 13And Comparative Examples 1 and 2
Each resin obtained in the above synthesis example was blended with other components at the composition ratio shown in Table 1 below, stirred with a stirrer, and then kneaded with a three-roll mill to form a paste. A product was prepared.
[0045]
Characteristic test:
The photosensitive composition pasted as described above was applied to a glass substrate with a thickness of 40 microns using a 200 mesh stainless screen, dried in a hot air drying oven at 80 ° C. for 20 minutes, and then line / space. A negative film with a pattern of L / S = 30/150 (micron) is closely attached, irradiated with ultraviolet rays by an Oak 680 GW exposure machine, and then 1% Na at 30 ° C.2CO3Water pressure 1.5kgf / cm with aqueous solution2For 1 minute, washed with water and dried. Then, it baked for 30 minutes at 450 degreeC with the baking furnace, and also heated up to 550 degreeC, baked for 30 minutes at that temperature, the evaluation board | substrate was created, and the following items were evaluated.
[0046]
Storage stability:
The storage stability was evaluated by the thickening rate after the prepared paste was stored at 20 ° C. and passed for 3 days, 1 month or 3 months.
○: Less than 15% thickening rate
Δ: Thickening rate 15% to 30%
X: 30% or more thickening rate
[0047]
Resolution:
For UV irradiation, use a negative film with a line width of 30 μm and a space of 150 μm, 200 mJ / cm2It carried out in.
The evaluation of the resolution was performed based on the following criteria by observing the reproducibility of the line width, shape, disconnection, and the like with an optical microscope.
○: Good in all cases.
Δ: A difference of ± 10 μm or more appears in the line width reproducibility, and the shape is irregular but there is no disconnection.
X: A difference of ± 15 μm or more appears in the line width reproducibility, the shape is irregular, and disconnection is observed.
[0048]
Firing line shape:
The firing line shape was heated to 450 ° C. at a temperature rising rate of 5 ° C./min, held at 450 ° C. for 30 minutes, and after firing the organic component, the temperature was increased again at 5 ° C./min and 30 ° C. at 550 ° C. What was baked for minutes was observed with the optical microscope.
Good: The shape before firing is maintained.
Defect: The shape before firing is not maintained, and the line is broken or twisted.
[0049]
Specific resistance:
The specific resistance value was calculated by measuring the resistance value and the film thickness with a pattern of 0.4 cm × 10 cm.
The evaluation results for the various characteristics are also shown in Table 1 below.
[Table 1]
[0050]
【The invention's effect】
As described above, according to the alkali-developable photosensitive composition of the present invention, since the photocuring depth during exposure is large, high-definition without problems such as distortion of the pattern after baking and shrinkage of the line width.conductorA pattern can be formed stably. In addition, because of its excellent photocurability and resolution, high-definition patterns can be formed even with a relatively thick film, and the minimum exposure that can form the same line / space pattern with the same film thickness is small. This is advantageous from the viewpoint of energy saving.
In addition, a high-definition conductor pattern can be easily formed on a large-area substrate by photolithography technology.TheIt can be formed with good workability, and can be sufficiently employed even in a baking process at 600 ° C. or lower, thereby realizing a significant improvement in yield.
Claims (3)
Priority Applications (1)
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JP07121998A JP4046405B2 (en) | 1998-03-06 | 1998-03-06 | Photosensitive composition for forming conductive pattern and conductive pattern obtained using the same |
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JP07121998A JP4046405B2 (en) | 1998-03-06 | 1998-03-06 | Photosensitive composition for forming conductive pattern and conductive pattern obtained using the same |
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JPH11249300A JPH11249300A (en) | 1999-09-17 |
JP4046405B2 true JP4046405B2 (en) | 2008-02-13 |
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JP4719332B2 (en) * | 2000-03-31 | 2011-07-06 | 太陽ホールディングス株式会社 | Photo-curable paste composition |
KR100708310B1 (en) | 2003-12-15 | 2007-04-17 | 주식회사 코오롱 | Photosensitive resin composition for column spacers of a liquid crystal display element |
KR100708311B1 (en) | 2003-12-15 | 2007-04-17 | 주식회사 코오롱 | Photosensitive resin composition for column spacers of a liquid crystal display element |
CN104204946A (en) * | 2012-03-22 | 2014-12-10 | 东丽株式会社 | Photosensitive conductive paste and method for producing conductive pattern |
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