JP3379180B2 - Photoacoustic signal detection method and device - Google Patents

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a photoacoustic signal detecting method and apparatus for detecting surface and internal information of a sample by utilizing a photoacoustic effect or a photothermal effect.

[0002]

[Prior Art] Photoacoustic Effect
1881 Tyndall, Bell,
Discovered by Rentogen et al. That is,
As shown in FIG. 13, when the intensity-modulated light (intermittent light) 19 is used as excitation light and is focused on the sample 7 by the lens 5 and irradiated, heat is generated in the light absorption region V _op 21 and the thermal diffusion length is increased. This is a phenomenon in which a thermal diffusion region V _th 23 given by μ _s 22 is diffused periodically, and an elastic wave (sound wave) is generated by this thermal strain wave. The sound wave, that is, the photoacoustic signal, is detected by using a microphone (acoustoelectric converter) or a piezoelectric element, or the cyclic thermal expansion displacement generated on the sample surface is detected by an optical interferometer, and is synchronized with the modulation frequency of the excitation light. Information on the surface and inside of the sample can be obtained by obtaining the signal component. The thermal diffusion length μ _s 22 is the thermal conductivity κ, the density ρ, and the specific heat c of the sample 7 with the modulation frequency of the excitation light being f _E.
Is given by the following equation.

[0003]

[Equation 1]

Regarding the above-mentioned photoacoustic signal detection method, for example, reference is made to "Non-destructive inspection; Vol. 36, No. 10, p. 73".
0-p. 736 (October 1987) "and" I-E-E 1986 Ultra Sonics Symposium; pp. 515-526 (1986) (IEEE 1
986 ULTRASONICS SYMPO-SIU
M; p. 515-526 (1986) ".

An example thereof will be described with reference to FIG.
The parallel light emitted from the laser 1 is converted into an acousto-optic modulator (AO
The intensity is modulated by the modulator 2 and the intermittent light, that is, the excitation light, is made into the parallel light 19 having a desired beam diameter by the beam expander 3, and then reflected by the half mirror 4, and the sample on the XY stage 6 is reflected by the lens 5. Focus on the surface of 7. A sound wave is generated by the thermal strain wave generated from the condensing part 21 on the sample 7, and at the same time, a minute periodic thermal expansion displacement is generated on the surface of the sample 7. This minute displacement is detected by the Michelson interferometer described below. After the parallel light emitted from the laser 8 is expanded to a desired beam diameter by the beam expander 9, it is split into two optical paths by the half mirror 10, one of which is the probe light 24.
As a result, the light is focused at the position 21 on the sample 7 by the lens 5. The other side irradiates the reference mirror 11. The reflected light from the sample 7 and the reflected light from the reference mirror 11 interfere with each other on the half mirror 10, and the interference light is reflected by the lens 12
Thus, the light is condensed on the photoelectric conversion element 13 such as a photodiode. The photoelectrically converted interference intensity signal is amplified by the preamplifier 14 and then sent to the lock-in amplifier 16. The lock-in amplifier 16 extracts only the modulation frequency component included in the interference intensity signal, using the modulation signal from the oscillator 15 used to drive the acousto-optic modulator 2 as a reference signal.
This frequency component has information on the surface or inside of the sample 7 according to the frequency. From the equation (1), the thermal diffusion length μ _s 21 can be changed by changing the modulation frequency, and information in the depth direction of the sample can be obtained. If there is a crack or other defect in the thermal diffusion region V _th 23, the thermal expansion displacement changes, and the amplitude of the modulation frequency component in the interference intensity signal and the phase with respect to the modulation frequency signal change. You can The movement signal of the XY stage 6 and the output signal from the lock-in amplifier 16 are processed by the computer 17, and the photoacoustic signal at each point on the sample is output to the display 18 such as a monitor television as two-dimensional image information.

The photoacoustic detection technique using the above-mentioned optical interference is an effective means for detecting a photoacoustic signal in a non-contact and non-destructive manner, but the optical path from the half mirror 10 to the sample 7 and the half mirror 10 are referred to. When a disturbance such as fluctuation or vibration of air occurs between the optical paths leading to the mirror 11, there is a problem that the interference signal greatly changes and the SN ratio of the photoacoustic signal significantly decreases.

A common optical path type interferometer shown in FIG. 14 is conceivable as an optical interferometry for reducing the influence of such disturbance. The excitation optical system part is the same as the optical system shown in FIG. In the interferometer, after collimated light emitted from the laser 8 is expanded to a desired beam diameter by the beam expander 9, it is reflected by the half mirror 39 through the lens 30 to be a birefringent element constituted by calcite 31a, 31b and the like. 31
Incident on. In the birefringent element 31, the incident light is separated into two polarization components 35 (solid line) and 36 (broken line) orthogonal to each other. The polarized components 35 are condensed by the lenses 32 and 5 at the same position 37 as the condensing point of the excitation light on the sample 7, and the polarized component 36 is condensed at a position 38 slightly apart therefrom. That is, the polarization component 35 is used as probe light, and the polarization component 36 is used as reference light. A phase change occurs in the probe light due to the thermal expansion displacement of the sample surface caused by the irradiation of the excitation light. Both reflected lights pass through the same optical path again, are combined by the birefringent element 31, pass through the half mirror 39, and then are condensed by the lens 12 on the photoelectric conversion element 13 such as a photodiode. This combined light composed of polarization components orthogonal to each other undergoes polarization interference by the polarizing plate 33 provided in the optical path. The process of the photoelectrically converted interference intensity signal is shown in FIG.
Since it is exactly the same as the optical system shown in FIG.

[0008]

In the above optical system, since the probe light and the reference light pass through almost the same optical path, they are less susceptible to disturbances such as air fluctuations and vibrations, and are higher than conventional methods. Detection accuracy can be expected, but it has the following problems.

For example, in order to obtain deeper information on the sample, the intensity modulation frequency f _E of the excitation light is lowered to
The thermal diffusion region V _th 23 given by the thermal diffusion length μ _s 22 is enlarged. At this time, depending on the modulation frequency, as shown in FIG. 15, there is a case where the thermal diffusion length μ _s , that is, the region where the thermal expansion displacement occurs, becomes larger than the interval S between the probe light 35 and the reference light 36. As a result, the actually detected displacement is h _D
Therefore, there is a problem that the detection sensitivity of the photoacoustic signal is lowered. It is possible to increase the interval S between the probe light 35 and the reference light 36 in accordance with the increase in the thermal diffusion length, but there is a new problem that the spatial resolution decreases.

On the other hand, as shown in FIG.
When 0 has a rough surface or minute unevenness, both the reflected light of the probe light 35 and the reflected light of the reference light 36 are scattered, the coherence is lowered, and the phase change due to the thermal expansion displacement can be accurately detected. It has the problem of becoming difficult.

In order to solve the above-mentioned problems of the prior art, an object of the present invention is to provide a photoacoustic signal detection method which has a simple structure and is capable of detecting the surface or internal information of a sample with high sensitivity and stability. To provide the device.

Another object of the present invention is to reduce fluctuations in the interference signal due to the effects of air fluctuations and vibrations in photoacoustic signal detection using optical interference, and to maintain high levels even for samples with rough surfaces. It is an object of the present invention to provide a photoacoustic signal detection method and an apparatus therefor capable of detecting a photoacoustic signal with high accuracy and high sensitivity.

[0013]

In order to achieve the above object, the present invention provides a method for detecting a photoacoustic signal, in which light from a light source is intensity-modulated at a desired frequency and intensity-modulated light is measured on a sample surface. Irradiate a point to generate a photoacoustic effect or a photothermal effect, and irradiate a measurement point with probe light and reference light,
The reflected light from the sample surface due to the irradiation of the probe light and the reflected light from the sample surface due to the irradiation of the reference light are optically interfered with each other, and the interference light is detected by the photoelectric conversion element. The surface or internal information of the sample was extracted from the intensity signal.

In order to achieve the above object, the present invention comprises a photoacoustic signal detecting device, which comprises a light source and an intensity modulating means for intensity-modulating the light from the light source at a desired frequency. Excitation means for generating a photoacoustic effect or a photothermal effect by irradiating the measurement point on the sample surface with the modulated light, and a probe light and a reference light at the measurement point where the photoacoustic effect or the photothermal effect is generated by this excitation means. The irradiation means for irradiating, the reflected light from the sample surface by the irradiation of the probe light applied to the measurement point by this irradiation means, and the reflected light from the sample surface by the irradiation of the reference light irradiated by the irradiation means are mutually optically Interference light detection means for causing interference with each other to be detected by the photoelectric conversion element, and information detection means for extracting the surface or internal information of the sample from the intensity signal of the interference light detected by this interference light detection means. Form was.

[0015]

[0016]

[0017]

[0018]

[0019]

[0020]

[0021]

In the photoacoustic signal detection device, the intensity-modulated light is applied to the measurement point on the sample surface, so that the photoacoustic effect or the photothermal effect can be generated at the measurement point. On the other hand, the measurement point is irradiated with probe light and reference light having an irradiation area larger than the probe light, and the reflected light from the sample surface with respect to the probe light and the DC component of the Fourier transform image with respect to the sample surface with respect to the reference light Are optically interfered with each other, and the interference light is detected by the photoelectric conversion element, and the thermal strain of the same frequency component as the intensity modulation frequency is detected as a photoacoustic signal from the detected interference intensity signal. By the interference means, the probe optical path and the reference optical path can be made completely the same optical path, and it becomes possible to reduce fluctuations of the interference signal due to the influence of minute fluctuations and vibrations of air between the optical paths. Also, by making the irradiation area of the reference light sufficiently large, it is possible to prevent the coherence of the reference light from being deteriorated due to the roughness of the sample surface and minute irregularities, and to always obtain stable interference light even for a sample with a rough surface. It becomes possible to detect a photoacoustic signal with high accuracy and high sensitivity. Further, it becomes possible to reduce the deterioration of the spatial resolution due to the minute gap between the probe light and the reference light in the conventional common optical path interferometer.

Further, by making the irradiation area of the reference light the same as or larger than the thermal diffusion area generated by the photoacoustic effect or the photothermal effect, the phase change of the reference light caused by the thermal expansion displacement can be suppressed. The influence can be reduced, and the photoacoustic signal with high accuracy and high sensitivity can be detected.

Further, by making the probe light and the reference light consist of polarization components orthogonal to each other, the probe light path and the reference light path can be made completely the same light path, and a minute air between both light paths can be formed. It is possible to reduce the fluctuation of the interference signal due to the fluctuation and the influence of vibration, and it is possible to detect the photoacoustic signal with high accuracy and high sensitivity.

Further, by using a double focus lens as means for optically interfering the reflected light from the sample surface with respect to the probe light and the DC component of the Fourier transform image with respect to the sample surface with respect to the reference light to each other, The probe optical path and the reference optical path can be completely the same optical path, and it is possible to reduce fluctuations in the interference signal due to the influence of minute fluctuations and vibrations of air between the optical paths. In addition, since the irradiation area of the reference light can be made sufficiently large, deterioration of the coherence of the reference light due to roughness of the sample surface and minute irregularities can be suppressed, and stable interference light can always be obtained even for a sample with a rough surface. It becomes possible to obtain a photoacoustic signal with high accuracy and high sensitivity. Further, it becomes possible to reduce the deterioration of the spatial resolution due to the minute interval between the probe light and the reference light in the conventional common optical path interferometer.

The bifocal lens is made of a birefringent optical material, and the focal length is changed depending on the polarization of the incident light, so that the probe optical path and the reference optical path are completely the same optical path. It is possible to reduce the fluctuation of the interference signal due to the influence of the slight air fluctuation and vibration between the both optical paths, and it is possible to detect the photoacoustic signal with high accuracy and high sensitivity.

[0026]

EXAMPLE An example of the present invention will be described with reference to FIGS.

First, a first embodiment of the present invention will be described with reference to FIGS.
It will be described based on. FIG. 1 shows a photoacoustic detection optical system according to the first embodiment. This optical system includes an excitation optical system 201, a common optical path type heterodyne interference optical system 202 using a double focus lens for detecting a photoacoustic signal, and a signal processing system 203. Ar of the excitation optical system 201
The parallel beam 144 emitted from the laser 141 (wavelength 515 nm) is intensity-modulated by the acousto-optic modulator 142 at the modulation frequency f _E , and then expanded to a desired beam diameter by the beam expander 143. The expanded light beam 19 reflects the dichroic prism 41 (reflects wavelengths of 600 nm or less,
Objective lens 4 after reflecting at 600 nm or more)
The light is focused on the position of 65 on the sample 43 by 2. At the condensing point 65, periodic thermal expansion displacement occurs on the sample surface due to the photoacoustic effect or the photothermal effect.

Next, in order to detect this thermal expansion displacement,
The configuration and function of a common optical path type heterodyne interference optical system 202 using a double focus lens will be described. In FIG. 1, the polarization direction of the linearly polarized beam 75 emitted from the He-Ne laser 45 (wavelength 633 nm) is shown in FIG.
No. 81 of No. 81 is set in the 45 ° direction with respect to the x axis and the y axis. Here, with respect to the paper surface of FIG.
The direction orthogonal to that is the x-axis. Of the incident light beam 75, 8 of FIG.
The P-polarized component 66 (solid line) indicated by 2 passes through the polarization beam splitter 46 and enters the acousto-optic modulator 47. The S-polarized light component 67 (broken line) indicated by 83 in FIG. 2A is reflected by the polarization beam splitter 46, reflected by the mirror 49, and then incident on the acousto-optic modulator 50. The frequencies f _C1 and f _C2 output from the driver 61 (f _C1 ≠
The sine wave of f _C2 ) is input to the acousto-optic modulators 47 and 50, respectively, and the optical frequencies of the P polarization component 66 and the S polarization component 67 are shifted by f _C1 and f _C2 , respectively. Both polarization components are combined by the polarization beam splitter 51. This combined light 68 is two-frequency orthogonal polarization, that is, as shown in FIG.
82 and 83 are orthogonal to each other and f _C1
The beam light having a frequency difference of −f _C2 is formed.

After the combined light 68 is expanded to a desired beam diameter by the beam expander 52, the beam splitter 5
3 is transmitted and is made incident on a double focus lens 54 configured by using a birefringent material such as calcite. As shown in FIG. 3, the double focus lens 54 has an infinite focal length for a certain polarization component 69 and a finite focal length for a polarization component 70 orthogonal to the incident light 68. It is designed to be F _P. Assuming that the polarization component 69 is the P polarization component in FIG. 1 and the polarization component 70 is the S polarization component in FIG. 1, the P polarization component 69 (solid line) emitted from the double focus lens 54 in FIG. The light enters the lens and is condensed at the same condensing position 71 as the excitation light 19 (the front focus position of the objective lens 42). On the other hand, S polarization component 7
0 (dashed line) is focused light, which is focused on the rear focus position 151 of the objective lens and then enters the surface of the sample 43 as parallel light after passing through the objective lens. This state is shown in FIG. That is,
The P-polarized component 69 (solid line) is the excitation light 1 as the probe light.
The light is condensed at the same condensing position 71 (the focal position on the front side of the objective lens 42) as 9 and undergoes a phase change due to thermal expansion displacement.

On the other hand, the S-polarized component 70 (broken line) is incident as a reference beam on a wide range 72 of the sample in the state of a cylindrical beam, that is, a plane wave. The reflected light of the P-polarized component 69 has information on the cyclic thermal expansion displacement generated on the surface of the sample 43 as a phase change due to the photoacoustic effect or the photothermal effect.

Both the P-polarized light component 69 and the S-polarized light component 70 are reflected by the double-focus lens 54 after passing through the same optical path again.
Is synthesized by. This combined light is transmitted to the beam splitter 5
It is reflected at 3. In FIG. 5, 84 is the polarization direction of the reflected light of the P polarization component 69 (probe light), and 85 is the S polarization component 70.
The polarization directions of the reflected light of (reference light) are shown respectively. Since they are orthogonal to each other, they do not interfere as they are. Therefore, by inserting the polarizing plate 56 after the imaging lens 55 and setting the polarization direction to the 45 ° direction as shown by 86 in FIG. 5, both reflected lights interfere and f _B = f _C1 -f _C2
The heterodyne interference light 74 having the beat frequency of is obtained. The heterodyne interference light 74 contains information on the thermal expansion displacement generated on the surface of the sample 43 due to the photoacoustic effect or the photothermal effect as phase information. The interference light 74 is imaged by the imaging lens 55 on the photoelectric conversion element 57 such as a photodiode. The unnecessary high-order diffracted light component contained in the interference light 74 is blocked by the pinhole 150.
The photoelectrically converted optical interference signal is amplified by the preamplifier 58.

Here, as shown in the schematic diagram of FIG. 6, an important point is that the probe light 69 (P-polarized component) is focused on the surface 43 of the sample 43 at the focusing position 71 (objective lens 4).
2 and the photoelectric conversion element 57 are conjugated, that is, in an image-forming relationship, while with respect to the reference light 70 (S-polarized component), the rear focus position 151 of the objective lens, that is, the surface of the sample 43. This is that the Fourier transform position with respect to 40 and the photoelectric conversion element 57 are in an image forming relationship. Therefore,
The probe light retains the phase change due to the periodic thermal expansion displacement generated at the condensing position 71 on the sample surface 40, while the reference light undergoes the Fourier transform of the phase distribution due to the roughness or minute unevenness of the sample surface 40. I have information about the statue. In this Fourier transform image, the high frequency component is shielded by the pinhole 150 in front of the photoelectric conversion element 57, so that only the DC component is finally referred to in the phase distribution information due to the roughness or minute irregularities of the sample surface 40. As a wavefront, it contributes to interference. Therefore, by making the irradiation range of the reference light sufficiently large, it is possible to obtain a stable reference wavefront in which the influence of the roughness of the sample surface 40 and the minute unevenness is greatly reduced.

By the way, as shown in FIG.
The region in which the cyclic thermal expansion displacement is generated by the irradiation of is generally considered to be the range of the thermal diffusion length μ _S. In order to obtain a stable reference wavefront, that is, to make the influence of the phase change of light due to thermal expansion sufficiently negligible, it is necessary to set _R >> μ _S.

Now, the wavelength of the linearly polarized beam 75 emitted from the He-Ne laser 45 is λ, and of the reflected light from the surface of the sample 43, the intensity of the reflected light of the probe light 69 (P-polarized component) is I _s . The intensity of the reflected light of the light 70 (S-polarized component) is I _r , the phase difference between the two optical paths is φ (t) including the time variation,
The amplitude of the thermal expansion displacement generated on the surface of the sample 43 is A, and the phase is θ
Then, the intensity I of the interference light detected by the photoelectric conversion element 57 is expressed by the following equation.

[0035]

[Equation 2]

Furthermore, the equation above A << λ can be approximately changed to the following equation.

[0037]

[Equation 3]

[0038] Here, a term representing thermal expansion displacement of _{A · cos (2πf E t +} θ) sample occurs based on the photoacoustic effect 43 surface. In this example, f _B = 100 kHz
z, f _E = 80 kHz.

In the following, by the signal processing system 203,
A method of obtaining the amplitude A and the phase θ of the thermal expansion displacement from the interference signal represented by the equation (3) will be described. After the photoelectrically converted interference intensity signal is amplified by the preamplifier 58,
It is sent to the detection circuit 59. In the detection circuit 59, the detected interference intensity signal is separated by the phase-holding demultiplexer 91 as shown in FIG. 8, one of which is passed through the bandpass filter 92 of the center frequency f _B , and then the phase is shifted by the phase shifter 93. Is delayed by π / 2. The output signal from the phase shifter 93 is amplified by the amplifier 94, then sent to the mixer 95, and the product with the other interference intensity signal separated by the phase holding demultiplexer 91 is output. The other interference intensity signal I _D1 is expressed by the formula (4), the output signal I _D2 from the amplifier 94 is calculated by the formula (5), and the output signal I _D from the mixer 95 is calculated by the formula (6). expressed.

[0040]

[Equation 4]

[0041]

[Equation 5]

[0042]

[Equation 6]

In the equation (6), the first term is the frequency component of f _B , the second term is the frequency component of 2f _B , and the third term is the amplitude A of the thermal expansion displacement and the frequency f _E having the phase θ. The fourth term is a frequency component of 2f _B + f _E , and the fifth term is a frequency component of 2f _B −f _E. Since f _E << f _B and f _E << 2f _B ± f _E , the output signal from the mixer 95 is, for example, 2f _E.
By passing it through a low-pass filter 96 having a cutoff frequency of the order of magnitude, the third term, that is, the amplitude A of the thermal expansion displacement,
It is possible to extract the component of the frequency f _E having the phase θ. In the actual photoacoustic method, the amplitude A of the thermal expansion displacement is very weak, in the order of sub-nanometers, and the interference signal contains various electrical noises other than the frequency component represented by the above equation (6). It is included. Therefore, in practice, the output signal from the low-pass filter 96 is input to the lock-in amplifier 62 of FIG. 1, and the intensity modulation signal (frequency f _E ) from the acousto-optic modulator 142 driving oscillator 60 is used as a reference signal, Therefore, it is possible to accurately extract only the component of the frequency f _E , that is, the amplitude A and the phase θ of the thermal expansion displacement. The amplitude A and the phase θ have thermal and elastic information in the thermal diffusion region V _th defined by the modulation frequency. Therefore, if there is an internal defect such as a crack in the thermal diffusion region V _th , the amplitude A and the phase θ change and the existence thereof can be known. The sample 43 x by the XY stage 44
While sequentially scanning in the y direction, the lock-in amplifier 62
A two-dimensional photoacoustic image of the entire surface of the sample 43 is obtained by processing the output signal from the computer 63 by the computer 63, and is output to the TV monitor 64. Further, by controlling the frequency f _{E of the} modulation signal output from the oscillator 60 by the computer 63 and setting it at various modulation frequencies, it is possible to detect internal information at various depths of the sample 44.

In the present embodiment, as shown in FIG. 6, in the Fourier transform image of the phase distribution due to the roughness or minute irregularities of the sample surface 40, the high frequency component is shielded by the pinhole 150 in front of the photoelectric conversion element 57, Only the DC component is transmitted and this is used as the reference wavefront. This light-shielding means is not limited to the pinhole 150, and for example, a pinhole is formed in the polarizing plate and is set at the rear focal position 151 of the objective lens, that is, the Fourier transform position with respect to the surface 40 of the sample 43. Then, the polarization direction is made to coincide with the polarization direction of the probe light 69 (P polarization component). As a result, the probe light can be transmitted as it is, but the reference light 70
Regarding the (S-polarized light component), only the direct current component is transmitted through the pinhole portion, and the high-frequency component that spreads wider than the pinhole diameter is shielded by the polarizing plate.

According to this embodiment, as shown in FIG. 1, the probe optical path and the reference optical path for detecting the thermal expansion displacement due to the photoacoustic effect or the photothermal effect are completely the same optical path, so that both optical paths can be detected. It is possible to reduce fluctuations in the interference signal due to the influence of minute air fluctuations and vibrations.

Further, according to the present embodiment, as shown in FIG. 6, since the DC component of the Fourier transform image of the reflected light from the wide area of the sample surface is used as the reference wavefront, the sample surface 40 is roughened. It is possible to suppress a decrease in coherence due to microscopic unevenness, and it is possible to always obtain stable interference light even for a sample having a rough surface. As described above, according to the present embodiment, it is possible to detect a photoacoustic signal with high accuracy and high sensitivity.

Further, according to the present embodiment, by making the irradiation area of the reference light sufficiently larger than the thermal diffusion length, in the conventional common optical path interferometer, the influence of the phase change which the reference light receives due to the thermal expansion displacement is affected. It is also possible to reduce the decrease in the spatial resolution due to the distance between the probe light and the reference light.

A second embodiment of the present invention will be described with reference to FIGS. FIG. 9 shows a photoacoustic detection optical system in the second embodiment. This optical system comprises an excitation optical system 204, a common optical path type heterodyne interference optical system 205 using a double focus lens for detecting a photoacoustic signal, and a signal processing system 206. In the first embodiment, the point beam is used for both the excitation beam and the probe beam, and the two-dimensional photoacoustic image is obtained by two-dimensionally scanning the sample. A major feature is that a two-dimensional photoacoustic image can be obtained at high speed by using a linear beam as a probe beam and simultaneously exciting and detecting a plurality of points on a sample.

The collimated beam 144 emitted from the Ar laser 141 (wavelength 515 nm) of the excitation optical system 204 is intensity-modulated at the modulation frequency f _E by the acousto-optic modulator 142, and then expanded to a desired beam diameter by the beam expander 143. To do. The expanded beam light 19 is converted into an elliptical beam 122 by a cylindrical lens (cylindrical lens) 100, reflected by a dichroic prism 41 (reflection at wavelengths of 600 nm or less, transmission at wavelengths of 600 nm or more), and then x at the rear focus position 151 of the objective lens 42. Focus only in the direction (perpendicular to the plane of the paper). Since the cylindrical lens 100 can be regarded as a plate glass having no curvature in the y direction, the parallel light is incident on the rear focus position 151 of the objective lens 42 as it is. As a result, as shown in FIG. 10, at the front focus position of the objective lens 42, that is, on the surface of the sample 101, a single linear beam 123 having a width in the x direction and focused in the y direction is excited as excitation light. can get. Sample 10 now
As 1, the wiring patterns 126 and 127 of Cu or the like formed by using polyimide 125 or the like as an insulator will be considered. Figure 1
1 is the internal structure of the sample 101 and the linear excitation beam 1
23 is a cross-sectional view showing a heat diffusion region generated by 23. FIG. The sample 101 has a structure in which a polyimide pattern 125 having a thickness of 20 μm is used as an insulator and Cu patterns 126 and 127 having a thickness of 20 μm are formed as a wiring pattern on a ceramic substrate 129. Internal cracks 131 in the Cu wiring pattern and peeling 132 at the interface between the underlying substrate and the Cu pattern are internal defects to be detected. Here, an important point is the difference in thermal properties between the Cu patterns 126 and 127 and the polyimide 125 around them. That is, the thermal conductivity κ of Cu is 40
3 [J · m ~ ¹ · k ~ ¹ · s ~ ¹ ] and the density ρ is 8.93 [× 1
0 ⁶ g · m ~ ³ ], specific heat c is 0.38 [J · g ~ ¹ · k ~ ¹ ]
On the other hand, the thermal conductivity κ of polyimide is 0.288.
[J · m- ¹ · k- ¹ · s- ¹ ], density ρ is 1.36 [× 10
⁶ g · m ~ ³ ], specific heat c is 1.13 [J · g ~ ¹ · k ~ ¹ ], and the thermal conductivity κ of Cu is 14 times that of polyimide.
It is 00 times. Therefore, when the intensity modulation frequency f _E of the excitation light is set to 50 kHz and the above value is substituted into the equation (1), the thermal diffusion length μ in the Cu pattern portions 126 and 127 is
_s is about 27 μm, and the thermal diffusion length in the polyimide part 125 is about 1.1 μm. As a result, as shown in FIG. 11A, the heat applied in the linear light absorption region formed by the linear excitation beam 123 is largely diffused in the Cu pattern portions 126 and 127 to be inspected. A heat diffusion region 130 is formed so as to cover the cross section of the Cu pattern including the interface with the base substrate. On the other hand, in the polyimide portion 125 which is not the inspection target, the heat is diffused in a small amount and the heat diffusion region is formed only on the surface portion. As a result, FIG.
As shown in (a), when the linear excitation beam 123 is irradiated so as to cover the plurality of Cu wiring patterns 126 and 127, the sample is generated along the linear light absorption region based on the photoacoustic effect or the photothermal effect. A periodical thermal expansion displacement distribution 133 (broken line) is generated on the surface 101. The thermal expansion displacement distribution 133 reflects the internal information of the Cu wiring patterns 126 and 127 (internal crack 131, peeling defect 132) and the internal information of the polyimide portion 125 independently without being fused. In the defective portion, the thermal conductivity is lowered, so that the thermal expansion displacement is increased. As described above, by using the linear excitation beam 123, it is possible to simultaneously excite a plurality of inspection targets having high thermal contrast and to independently detect the inspection targets, and to detect two-dimensional internal information of the sample at high speed. It will be possible.

Next, the structure and function of the common optical path type heterodyne interference optical system 205 using a double focus lens for detecting the thermal expansion displacement distribution 133 will be described. In FIG. 9, as in the first embodiment, the polarization direction of the linearly polarized beam 75 emitted from the He—Ne laser 45 (wavelength 633 nm) is set to 81 with respect to the x axis and the y axis as shown in FIG. Set in the 45 ° direction. Here, the direction perpendicular to the plane of the paper of FIG. 1 is the y-axis, and the direction orthogonal thereto is the x-axis. The polarization beam splitter 46 causes the P-polarized component 6 of the incident light beam 75 shown by 82 in FIG.
6 (solid line) passes through the polarization beam splitter 46 and enters the acousto-optic modulator 47. In addition, 83 in FIG.
The S-polarized component 67 (broken line) indicated by is reflected by the polarization beam splitter 46, reflected by the mirror 49, and then incident on the acousto-optic modulator 50. The sine waves of frequencies f _C1 and f _C2 (f _C1 ≠ f _C2 ) output from the driver 135 are input to the acousto-optic modulators 47 and 50, respectively, and the P-polarized component 66
And the optical frequencies of the S-polarized component 67 are shifted by f _C1 and f _C2 , respectively. Both polarization components are combined by the polarization beam splitter 51. This combined light 68 is a dual frequency orthogonal polarization,
That is, as shown in FIG. 2B, the light beams are orthogonal to each other in the directions 82 and 83 and have a frequency difference of f _C1 -f _{C2 from} each other.

After the combined light 68 passes through the beam splitter 102, it is expanded by the beam expander 52 to a desired beam diameter. Beam splitter 53
After being transmitted, the light is made incident on a double focus cylindrical lens 107 configured by using a birefringent material such as calcite.
The dual-focus cylindrical lens 107 has an infinite focal length with respect to the incident light 68 and a certain polarization component 69 in the direction parallel to the paper surface, as shown in FIG. 3 in the first embodiment. Therefore, it is designed to have a finite focal length F _P for the polarization component 70 orthogonal to it, that is, to have a double focus function. On the other hand, in the direction perpendicular to the paper surface (the direction viewed from the direction A in FIG. 9), the shape has no curvature, so that the structure does not have the double focus function.

Now, assuming that the polarization component 69 in FIG. 3 is the P polarization component 121 (broken line) in FIG. 9 and the polarization component 70 is the S polarization component 120 (solid line), the double focus lens 1
The S-polarized component 120 (solid line) emitted from 07 becomes focused light in the direction parallel to the paper surface (y direction), and after passing through the relay lens 108, enters the objective lens as parallel light and becomes the linear excitation beam 123. The light is condensed at the same light condensing position (focal position on the front side of the objective lens 42). On the other hand, regarding the direction perpendicular to the paper surface (the direction viewed from the x direction and the A direction), 2
Since the multifocal cylindrical lens 107 can be regarded as a plate glass having no curvature, the S-polarized component 120 (solid line) is incident on the relay lens 108 as parallel light, so that the emitted light becomes focused light and the rear side of the objective lens 42. Focus position 1
The light is focused on 51, passes through the objective lens 42, and then enters the surface of the sample 101 as parallel light. As a result, FIG. 10 and FIG.
As shown in, regarding the S-polarized component 120 (solid line),
At the front focus position of the objective lens 42, that is, on the surface of the sample 101, a single linear probe beam 128 having a width in the x direction and focused in the y direction is obtained, similarly to the excitation beam 123.

On the other hand, the P-polarized light component 121 (broken line) emitted from the double focus lens 107 is incident on the relay lens 108 as parallel light in the direction parallel to the paper surface (y direction), so the emitted light is It becomes focused light and the objective lens 4
The light is focused on the rear focal point 151 of the second light, passes through the objective lens 42, and then enters the surface of the sample 101 as parallel light. Further, with respect to the direction perpendicular to the paper surface (the direction viewed from the x direction and the A direction), since the double focus cylindrical lens 107 can be regarded as a plate glass having no curvature, the P polarization component 121 (broken line) is relayed as parallel light. Since the light is incident on the lens 108, the emitted light becomes focused light, is condensed at the rear focus position 151 of the objective lens 42, passes through the objective lens 42, and then is incident on the surface of the sample 101 as parallel light. As a result, FIG.
Further, as shown in FIG. 11, for the P-polarized component 121 (broken line), a cylindrical beam 121 that is incident on a wide range 124 of the sample in the state of a plane wave is obtained as reference light.

The linear probe beam 128 consisting of the S-polarized component 120 (solid line) undergoes a phase change due to the thermal expansion displacement distribution linearly generated by the linear excitation beam 123. S-polarized linear probe beam 12 subjected to phase change 12
The reflected light of No. 8 and the reflected light of the P-polarized cylindrical beam 121, which is the reference light, pass through the same optical path again and then are combined by the double focus cylindrical lens 107 to become parallel light.

This combined parallel light is beam splitter 53.
Is reflected by the cylindrical imaging lens 109,
Focused light in the direction parallel to the paper surface (y direction),
In the direction perpendicular to the plane of the paper (the direction viewed from the x direction and the B direction), parallel light remains as it is, that is, as a linear beam, 1
It is incident on a storage type solid-state image sensor 111 such as a three-dimensional CCD sensor. Reference numeral 84 in FIG. 5 indicates the S-polarized component 120 (probe light).
, 85 indicates the polarization direction of the reflected light of the P polarization component 121 (reference light). Since they are orthogonal to each other, they do not interfere as they are. Therefore, the polarizing plate 11 is provided after the cylindrical imaging lens 109.
0 is inserted and the polarization direction is set to 4 as shown in 86 of FIG.
By making the direction 5 °, both reflected lights interfere with each other and f _B = f
Linear heterodyne interference light 152 having a beat frequency of _C1 -f _C2 is obtained. This heterodyne interference light 15
2 includes information on the thermal expansion displacement generated on the surface of the sample 101 due to the photoacoustic effect or the photothermal effect as phase information. Unnecessary higher-order diffracted light components included in the interference light 152 are shielded by the light shielding plate 153 having a linear opening corresponding to the linear beam shape. One-dimensional CCD sensor 1
The optical interference signal photoelectrically converted by 11 is amplified by the preamplifier 112 and then sent to the input interface circuit 115.

Here, the important point is as shown in FIG.
Regarding the linear probe beam 128 (S-polarized component), the surface of the sample 101 (front focus position of the objective lens 42)
And the one-dimensional CCD sensor 111 are conjugated, that is, in an image forming relationship. On the other hand, with respect to the reference light 121 (S-polarized component), the rear focus position 151 of the objective lens 42, that is, the Fourier transform position with respect to the surface of the sample 101. And one-dimensional CCD
The point is that the sensor 111 is in an image formation relationship. Therefore, the linear probe light 128 changes the phase due to the periodic thermal expansion displacement linearly generated on the surface of the sample surface 101.
On the other hand, the reference light has the information of the Fourier transform image of the phase distribution due to the roughness of the surface of the sample 101 and the minute unevenness, while the reference light has it. In this Fourier transform image, the high frequency component is the light shielding plate 15 in front of the one-dimensional CCD sensor 111.
Since the light is shielded by 3, finally, only the DC component in the phase distribution information due to the roughness of the surface of the sample 101 or the minute unevenness contributes to the interference as the reference wavefront. Therefore, by making the irradiation range of the reference light sufficiently large, it is possible to obtain a stable reference wavefront in which the influence of the roughness of the surface of the sample 101 and the minute unevenness is greatly reduced.

Incidentally, in FIG. 10, as in the first embodiment, the region in which the cyclic thermal expansion displacement is generated by the irradiation of the linear excitation beam 123 is considered to be approximately within the range of the thermal diffusion length μ _S , so that the cylindrical beam In this state, the irradiation range (radius R) 124 of the reference light 121 incident on the surface of the sample 101 is such that a stationary and stable reference wavefront can be obtained, that is, the influence of the phase change of light due to thermal expansion can be sufficiently ignored. So that _R >> μ _S in the y direction.

In FIG. 9, the beam splitter 10
At 2, the beam light of about 10% of the combined light 68 of the dual-frequency orthogonal polarization is reflected. Both polarization components of this light beam interfere with each other by the polarizing plate 103 whose polarization direction is 45 ° as shown by 86 in FIG. 5, and f _B = f _C1 -f _C2
The beat signal of the photoelectric conversion element 104 such as a photodiode.
Detected in. This beat signal is sent to the reference signal generation circuit 106 via the amplification circuit 105 and generates a clock signal for driving the one-dimensional CCD sensor 111. The clock signal is sent to the frequency dividing circuit 113 to generate a one-dimensional CCD sensor storage time control signal, and is sent to the one-dimensional CCD sensor 111 and the sensor output signal input interface circuit 115 together with the clock signal. At the same time, the clock signal is sent to the frequency dividing circuit 114 to generate the intensity modulation signal for excitation, and the driver 119 for driving the acousto-optic modulator 142.
Send to. As described above, the clock signal for driving the one-dimensional CCD sensor, the accumulation time control signal, and the intensity modulation signal for excitation are all generated using the heterodyne beat signal obtained by the interference optical system as a reference signal, and The signal generating circuit 106 and the frequency dividing circuits 113 and 114 are all PLL (P
It has a phase-locked loop circuit to improve the stability of frequency and phase.

The output signal from the one-dimensional CCD sensor 111 sent to the input interface circuit 115 is AD-converted and then sent to the computer 116, and the amplitude A and phase θ of the thermal expansion displacement generated on the surface of the sample 101 are calculated. To be extracted. He-
The wavelength of the linearly polarized beam 75 emitted from the Ne laser 45 is λ, the intensity of the reflected light of the linear probe beam 128 (S polarization component) of the reflected light from the surface of the sample 101 is I _s , and the cylindrical reference light 121 ( The intensity of the reflected light of the P-polarized component is I _r , and the phase difference between the two optical paths is φ including the time variation.
Assuming that (t), the intensity I of the heterodyne interference light incident on one pixel of the one-dimensional CCD sensor 111 is expressed by the equation (3) as in the first embodiment.

In the following, the signal processing system 206 including the computer 116 calculates from the interference light expressed by the equation (3):
A method of obtaining the amplitude A and the phase θ of the thermal expansion displacement will be described. The detection signal I _D (n + i) output from one pixel of the one-dimensional CCD sensor 111 (n + i is the number of times of storage and output of the one-dimensional CCD sensor 111) is given by the following equation, where α / f _B is the sensor storage time. To be

[0061]

[Equation 7]

Next, regarding the equation (7), the phase shift amount of the second term associated with each integration, that is, with respect to the change of i, is π /
4. Deducing the condition that the fourth term including the components of the thermal expansion displacement amplitude A and the phase θ becomes π / 2, and the condition that the third term is eliminated, that is, the amplitude component becomes 0, The following equation is obtained.

[0063]

[Equation 8]

[0064]

[Equation 9]

Here, p and s are arbitrary integers. For example, if p = 4 and s = 0, then α = 17 from the equation (8).
/ 8, and f _B = 100 kHz, f _E = 88.235 kHz from the equation (9). The value of α is (Equation 4)
Substituting into the equation, the following equation (10) is obtained.

[0066]

[Equation 10]

The parameter f _B = 100 kHz is set by the computer 116, and the acousto-optic modulators 47 and 5 are set.
0 to the driver 135 for driving, and f _E = 88.2
The frequency of 35 kHz is set by the reference signal generating circuit 106 and the frequency dividing circuit 114 which use the heterodyne beat signal of the frequency f _B detected by the photodiode 104 as the original signal, and is sent to the driver 119 for driving the intensity modulation acousto-optic modulator 142. In addition, the method of setting the storage time α / f _B of the sensor is to generate a read shift pulse (storage time control signal) for the one-dimensional CCD sensor of frequency f _B / α by the reference signal generation circuit 106 and the frequency dividing circuit 113. This is realized by driving the one-dimensional CCD sensor 111.

[Mathematical formula-see original document] In the equation (10), the first term is the direct current component, the second term is the phase shift amount π / 4 with respect to the number of accumulation / output times i, and the probe optical path including the phase change due to the unevenness of the sample 101 surface. The modulation component related to the optical phase difference φ with the reference optical path, and the third term is the probe optical path including the phase change due to the unevenness of the surface of the sample 101 and the reference optical path with the phase shift amount π / 2 with respect to the number of storage / output times i. Optical phase difference φ between
It is a modulation component related to the amplitude A and the phase θ of the thermal expansion displacement. It can be seen that an interference signal for one cycle can be reproduced from eight pieces of integrated data for the second term and four pieces of integrated data for the third term.

Therefore, the detection signal I _D (n + i) from the one-dimensional CCD sensor 111 is amplified by the preamplifier 112,
After AD conversion by the interface circuit 115, 10 sets of data sets from i = 1 to i = 8, a total of 80 accumulated / output data, are taken into account in the formula (10) in consideration of the signal SN ratio and the like. Set the interface circuit 115
It is stored in the internal two-dimensional memory. One-dimensional CCD sensor 11
If the number of pixels of 1 is 256, 256 × 80 data will be stored. Now, the (n + i) th accumulation
If the data of the w pixel at the time of output is represented by (n + i, w), the order of storing in the two-dimensional memory is (n + 1,1), (n + 1,2), (n + 1,3), ... (n + 1,256), (n + 2,1), (n + 2,2), (n + 2,3), ..., (n + 2,256), (n + 3,1), (n + 3,2), (n + 3,3), , (N + 3,256) ,: (n + 80,1), (n + 80,2), (n + 80,3), ..., (n + 80,256). On the other hand, when reading from the two-dimensional memory, 80 accumulated / output data sets are sequentially read out for each pixel and sent to the computer 116 as follows.

(N + 1,1), (n + 2,1), (n + 3,1), ..., (n + 80,1), (n + 1,2), (n + 2,2), (n + 3,2) ,. n + 80,2), (n + 1,3), (n + 2,3), (n + 3,3), ..., (n + 80,3) ,: (n + 1,256), (n + 2,256), (n + 3,256) , (N + 80,256) In the computer 116, the following calculation processing is performed using 80 accumulated / output data sets for each pixel, and the sample 10
Reflected light intensity I _{s on} one surface (proportional to reflectance), sample 101
The optical phase difference φ between the optical path of the probe light and the reference optical path including the phase change due to the unevenness of the surface, the amplitude A of the thermal expansion displacement in which the reflectance of the sample 101 surface is corrected, and the phase change due to the unevenness of the surface of the sample 101 The phase θ of the corrected thermal expansion displacement is calculated.

[0071]

[Equation 11]

[0072]

[Equation 12]

[0073]

[Equation 13]

[0074]

[Equation 14]

While the sample 101 is sequentially scanned by the xy stage 118 in the direction orthogonal to the linear excitation beam and the linear probe beam, the one-dimensional CCD sensor 11 is
By processing the detection signal from 1 with the computer 116, a two-dimensional photoacoustic image of the entire surface of the sample 101 can be obtained, and T
It is output to the V monitor 117. As shown in FIG. 11A, in the internal crack 131 and the peeling defect 132, the amplitude A133 of the thermal expansion displacement increases. Therefore, the presence of these internal defects can be recognized from this change.

In the present embodiment, as shown in FIG. 9, the high frequency component in the Fourier transform image of the phase distribution due to the roughness or minute irregularities of the sample surface is shielded by the light shield plate 153 in front of the one-dimensional CCD sensor 111. However, only the DC component is transmitted and this is used as the reference wavefront. This light blocking means is not limited to the light blocking plate 153, and may be, for example,
A pinhole is formed on the polarizing plate, and the pinhole is placed at the rear focal position 151 of the objective lens, that is, the Fourier transform position with respect to the surface of the sample 101, and the polarization direction thereof is set to the probe light 120.
It is made to match the polarization direction of (S-polarized component). This allows
Although the probe light can be transmitted as it is, with respect to the reference light 121 (P-polarized component), only the direct-current component is transmitted through the pinhole portion, and the high-frequency component that is wider than the pinhole diameter is shielded by the polarizing plate. .

As described above, according to this embodiment, as in the first embodiment, as shown in FIG. 9, the probe optical path for detecting the thermal expansion displacement due to the photoacoustic effect or the photothermal effect is used. By making the optical path and the optical path completely the same,
It is possible to reduce the fluctuation of the interference signal due to the influence of minute air fluctuations and vibrations between both optical paths.

Furthermore, according to the present embodiment, FIGS.
As shown in Fig. 3, since the DC component of the Fourier transform image of the reflected light from the wide area of the sample surface is used as the reference wavefront, it is possible to suppress the deterioration of the coherence due to the roughness of the sample surface and the minute irregularities, and For rough samples,
It is possible to always obtain stable interference light. As described above, according to the present embodiment, it is possible to detect a photoacoustic signal with high accuracy and high sensitivity.

Further, according to the present embodiment, by making the irradiation area of the reference light sufficiently larger than the thermal diffusion length, in the conventional common optical path interferometer, the influence of the phase change which the reference light receives due to the thermal expansion displacement is affected. It is also possible to reduce the decrease in the spatial resolution due to the distance between the probe light and the reference light.

Furthermore, according to the present embodiment, a linear excitation beam is used to arrange a plurality of measurement points in parallel, instead of the so-called point scanning method in which information is detected point by point as in the first embodiment. By simultaneously exciting and utilizing optical interference to detect the thermal expansion displacement generated at each point, and simultaneously detecting the interference light in parallel, it is possible to detect the thermal expansion components of multiple measurement points of the sample in parallel at the same time. , It becomes possible to detect the two-dimensional internal information of the sample at high speed.

Further, according to this embodiment, the reflectance distribution of the sample surface, the unevenness distribution of the sample surface, the amplitude distribution of the thermal expansion displacement, and the phase distribution of the thermal expansion displacement are obtained by using only one one-dimensional CCD sensor. A total of four surfaces and internal information can be detected at the same time, enabling complex evaluation of the sample.

Furthermore, according to the present embodiment, it is possible to detect the reflectance distribution of the sample surface, the unevenness distribution of the sample surface, and the thermal expansion component in which the fluctuation of the optical path is corrected, and it is possible to detect the surface of the sample and the internal information with high sensitivity. And stable detection is possible.

Furthermore, according to this embodiment, the thermal diffusion length based on the photoacoustic effect is set to be equal to or longer than the depth of the interface between the Cu wiring pattern to be inspected and the ceramic substrate, By setting the intensity modulation frequency of the excitation beam, it is possible to inspect the internal interface.

Furthermore, according to the present embodiment, when the thermal expansion component is extracted from the optical interference signal, digital processing is used instead of analog frequency filtering processing, so that the influence of harmonic components is small and the sensitivity is high. It is possible to detect the thermal expansion component with high accuracy.

In the present embodiment, the application example of the present invention to the sample having a plurality of inspection targets with high thermal contrast was described, but the application to the sample made of a uniform material including internal cracks is also sufficiently possible. is there. Even in this case, since it is possible to simultaneously excite a plurality of measurement points on the sample, the above effect can be expected.

In the above embodiment, the accumulation type one-dimensional C is used.
Although a CD sensor is used, it is also possible to use a non-storage type photodiode array. Further, in the above two examples, the double focus lens that uses the birefringent material and depends on the polarization condition is used, but it is also possible to use the double focus lens that uses the chromatic aberration.

[0087]

[0088]

According to the present invention, since the DC component of the Fourier transform image of the reflected light from the wide area of the sample surface is used as the reference wavefront, the deterioration of the coherence due to the roughness of the sample surface and the minute unevenness is suppressed. Therefore, it is possible to always obtain stable interference light, and it is possible to realize highly accurate internal structure and internal defect measurement even for a sample having a rough surface.

Further, according to the present invention, by making the irradiation area of the reference light sufficiently larger than the thermal diffusion length, in the conventional common optical path interferometer, the influence of the phase change which the reference light receives due to the thermal expansion displacement is reduced. In addition, it is possible to reduce the decrease in spatial resolution due to the distance between the probe light and the reference light, and it is possible to realize highly stable and high-resolution sample internal structure and internal defect measurement.

According to the present invention, whether the thermal diffusion length based on the photoacoustic effect is the same as the depth of the internal interface to be inspected,
Alternatively, it is possible to inspect the internal interface by setting the intensity modulation frequency of the excitation beam so that the length becomes longer than that.

Further, according to the present invention, the influence of disturbances such as fluctuations and vibrations of air can be reduced, and the roughness of the sample surface and the reduction of the coherence due to minute irregularities can be suppressed, so that a sample with a rough surface can be obtained. Even with respect to it, it is possible to always obtain stable interference light, and it is possible to always detect highly accurate and highly sensitive photoacoustic signals, and the influence of disturbances such as air fluctuations and vibrations is reduced, In addition, it is possible to suppress the deterioration of the coherence due to the roughness of the sample surface and minute unevenness, and it is possible to always obtain a stable interference light even for a sample with a rough surface, and it is possible to obtain highly accurate and highly sensitive photoacoustic. It has an effect that a signal can be detected.

[Brief description of drawings]

FIG. 1 is a diagram showing a photoacoustic detection optical system according to a first embodiment of the present invention.

FIG. 2 is a diagram showing a polarization direction of a laser beam incident on a heterodyne interference optical system and a dual frequency orthogonal polarization state.

FIG. 3 is a diagram showing a function of a bifocal lens configured by using a birefringent material.

FIG. 4 is a perspective view showing beam shapes of probe light and reference light in the first embodiment.

FIG. 5 is a diagram showing probe reflection light from a sample, reference light, and each polarization direction of a polarizing plate.

FIG. 6 is a diagram showing an image forming relationship between probe light and reference light.

FIG. 7 is a diagram showing a relationship between an irradiation area of reference light and a thermal diffusion length.

FIG. 8 is a diagram showing a configuration of a detection circuit in the first embodiment.

FIG. 9 is a diagram showing a photoacoustic detection optical system according to a second embodiment of the present invention.

FIG. 10 is a perspective view showing a planar structure of a sample and beam shapes of an excitation beam, a probe beam, and a reference beam in a second example.

FIG. 11 is a diagram showing a cross-sectional structure of a sample in the second example and a state of occurrence of thermal diffusion and thermal expansion displacement by a linear excitation beam.

FIG. 12 is a diagram for explaining a conventional photoacoustic detection optical system.

FIG. 13 is a principle diagram of a photoacoustic effect.

FIG. 14 is a diagram for explaining a photoacoustic detection optical system using a conventional common optical path interferometer.

FIG. 15 is a diagram showing a decrease in thermal expansion displacement detection sensitivity due to an increase in thermal diffusion length in the common optical path interferometer.

FIG. 16 is a diagram showing a decrease in coherence of probe light and reference light due to roughness of the sample surface and minute unevenness.

[Explanation of symbols]

1, 8 ... Laser, 141 ... Ar laser, 45 ... He-N
e laser, 2, 47, 50, 142 ... Acousto-optic modulator, 54 ... Double focus lens, 107 ... Double focus cylindrical lens, 100 ... Cylindrical lens, 109
... Cylindrical imaging lens, 42 ... Objective lens, 5
7, 104 ... Photoelectric conversion element, 111 ... One-dimensional CCD sensor, 59 ... Detection circuit, 62 ... Lock-in amplifier, 63,
116 ... Calculator, 43, 101 ... Sample, 126, 127
... Cu wiring pattern.

─────────────────────────────────────────────────── ─── Continuation of front page (58) Fields surveyed (Int.Cl. ⁷ , DB name) G01N 29/00-29/28

Claims (10)

(57) [Claims] 1. The light from a light source is intensity-modulated at a desired frequency, and the intensity-modulated light is applied to a measurement point on a sample surface to generate a photoacoustic effect or a photothermal effect, and the probe light is applied to the measurement point. And includes the irradiation area of the probe light
A region is irradiated with a reference light, and the reflected light from the sample surface due to the irradiation of the probe light and the reflected light from the sample surface due to the irradiation of the reference light are optically interfered with each other, and the interference light is converted into a photoelectric conversion element. The method for detecting a photoacoustic signal, wherein the surface or internal information of the sample is extracted from the detected intensity signal of the interference light . 2. The photoacoustic signal detection according to claim 1, wherein the irradiation area of the reference light is the same as or larger than the thermal diffusion area generated by the photoacoustic effect or the photothermal effect. Method. 3. The photoacoustic signal detecting method according to claim 1, wherein the probe light and the reference light are composed of polarization components orthogonal to each other. 4. A method for optically interfering the reflected light from the sample surface with respect to the probe light and the direct-current component of the Fourier transform image with respect to the sample surface with respect to the reference light to each other is to use a double focus lens. The photoacoustic signal detecting method according to claim 1. 5. The method of detecting a photoacoustic signal according to claim 4, wherein the bifocal lens is made of a birefringent optical material, and the focal length changes depending on the polarization of incident light. 6. A photoacoustic effect by providing a light source and intensity modulating means for intensity modulating light from the light source at a desired frequency, and irradiating the light intensity-modulated by the intensity modulating means to a measurement point on the surface of the sample. Excitation means for generating a photothermal effect, and irradiating the probe light to the measurement point where the photoacoustic effect or the photothermal effect is generated by the excitation means, and the irradiation area of the probe light.
Irradiating means for irradiating a region including the reference light, reflected light from the sample surface by irradiation of the probe light irradiated to the measurement point by the irradiation means, and by irradiation of the reference light irradiated by the irradiation means Interference light detection means for optically interfering light reflected from the sample surface with each other and detecting by a photoelectric conversion element, and the surface of the sample or internal information from the intensity signal of the interference light detected by the interference light detection means A photoacoustic signal detection device comprising an information detection means for extracting the photoacoustic signal. 7. The irradiation area of the reference light irradiated by the irradiation means is equal to or larger than the thermal diffusion area generated by the photoacoustic effect or the photothermal effect. The photoacoustic signal detection device according to claim 6. 8. The photoacoustic signal detecting apparatus according to claim 6, wherein the probe light and the reference light emitted by said irradiating means are composed of polarization components orthogonal to each other. 9. The photoacoustic signal detecting apparatus according to claim 6, wherein the interference light detecting means includes a double focus lens. 10. The photoacoustic signal detection device according to claim 9, wherein the double-focus lens is made of a birefringent optical material so that the focal length changes depending on the polarization of incident light.