JP3275631B2 - Inspection reference data setting support apparatus and method - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention determines the quality of each inspection item from inspection data for each inspection item of a component mounted on a board, and determines the quality of the mounted state of the component based on the result of the quality determination. In the board inspection apparatus to be determined, or image processing is performed on the captured image of the component, and in the board inspection apparatus that determines the quality of the mounting state of the component based on the processed image, Alternatively, the present invention relates to an inspection reference data setting support apparatus and method for supporting setting of inspection reference data used as a threshold value for image processing.

[0002]

2. Description of the Related Art A plurality of inspection items are set in advance, and light is irradiated on a component mounting board, and the inspection data of each inspection item is calculated based on light receiving data obtained by receiving the reflected light. By comparing the inspection data with a threshold value for each inspection item, the quality of each inspection item is determined,
A board inspection device of a type that determines the quality of the component mounting board based on the quality determination result, a binarization process or the like is performed on an image of the component mounting board obtained by imaging the component mounting board irradiated with light. The board inspection apparatus of the type that performs the image processing described above and determines the quality of the component mounting board based on the processed image is used to determine the quality of each of the above-described inspection items before performing the inspection. It is necessary to set a threshold value and a threshold value (hereinafter, simply referred to as inspection reference data) such as a binarization threshold value used when performing image processing to an optimum value.

The setting of the above-mentioned inspection reference data is always necessary when a new board inspection apparatus is introduced or when the mounting process is changed in the component mounting process.

Conventionally, the work of setting the inspection reference data has been performed as follows.

[0005] Initial values of the inspection reference data are set, and using the inspection reference data, a sample substrate to be determined to be good and a sample substrate to be determined to be defective are inspected by a substrate inspection apparatus.

[0006] The user looks at the pass / fail judgment result of each sample board displayed on the display section of the board inspection apparatus, and if the judgment result is not correct, corrects the corresponding portion of the test reference data and transmits the corrected test reference data. Test again using
The above-described correction of the inspection reference data is repeated until the result of the pass / fail judgment by the board inspection apparatus becomes correct.

[0007]

However, in the above-described conventional inspection reference data setting operation, if the result of the judgment of the sample substrate by the substrate inspection apparatus is not correct, what set value of the inspection reference data should be corrected and how much. Since the user has to judge by experience, there is a problem that it is not possible to set the inspection reference data as desired and it takes a considerable time to complete the setting.

An object of the present invention is to solve such a problem, and an object of the present invention is to provide an inspection reference data setting support apparatus and an inspection reference data setting support method capable of easily setting inspection reference data. It is assumed that.

[0009]

In order to achieve the above object, a first inspection reference data setting support apparatus according to the present invention calculates inspection data of a component mounted on a board for each inspection item. The test data is compared with a threshold value to determine pass / fail of each test item, and the pass / fail judgment of each test item in the board test apparatus for judging pass / fail of the component mounting state from the pass / fail judgment result. A display unit that supports setting of inspection reference data used as a threshold value and displays the inspection data and the inspection reference data in association with each inspection item; and stores the inspection reference data. It is characterized by comprising storage means, and correction means for correcting the inspection reference data stored in the storage means.

The display means of the first inspection reference data setting support device according to the present invention displays the inspection data and the inspection reference data in association with each inspection item, and displays each inspection item. It is conceivable to display a pass / fail judgment result, or to display the inspection data and the inspection reference data in a graph in association with each inspection item.

A second inspection reference data setting support apparatus according to the present invention performs image processing on a picked-up image of a component mounted on a board, and determines whether or not the mounted state of the component is good based on the processed image. And a storage unit for storing the captured image and the inspection reference data, wherein the inspection reference data of the storage unit is stored in the storage unit. Image processing means for performing image processing on the captured image of the storage means using image processing used as a threshold, and display means for displaying the captured image of the storage means, inspection reference data, and the processed image by the image processing means, Correction means for correcting the inspection reference data in the storage means.

In order to achieve the above object, a first inspection reference data setting support method according to the present invention calculates inspection data of a component mounted on a board for each inspection item, and calculates the inspection data. A pass / fail judgment is made for each inspection item by comparing with a threshold value, and is used as a threshold value for the pass / fail judgment of each inspection item in the board inspection method for judging the pass / fail of the component mounting state from the pass / fail judgment result. A test reference data setting support method for supporting the setting of test reference data, wherein the procedure stores the test reference data in a storage unit, and associates the test data with the test reference data for each test item. A display procedure to be displayed on the display means;
A correction procedure for correcting the inspection reference data stored in the storage means by a correction means.

In the display procedure of the first inspection reference data setting support method according to the present invention, the inspection data and the inspection reference data are displayed in association with each inspection item by a display means. It is conceivable to display the result of the pass / fail judgment of the inspection item, or to display the inspection data and the inspection reference data in a graph by using a display unit in association with each inspection item.

According to a second inspection reference data setting support method of the present invention, image processing is performed on a picked-up image of a component mounted on a board, and the quality of the mounted state of the component is determined based on the processed image. A method for supporting setting of inspection reference data used as a threshold value of the image processing in the substrate inspection method, wherein the storage unit stores the captured image and the inspection reference data, and the image processing unit An image processing procedure of performing image processing using the inspection reference data of the storage unit as a threshold value on the captured image of the storage unit, and a display image of the captured image of the storage unit, inspection reference data, and processing by the image processing unit A display procedure for displaying an image and a correction procedure for correcting the inspection reference data in the storage means by the correction means. It is that way.

[0015]

Therefore, according to the first inspection reference data setting support apparatus and the first inspection reference data setting support method according to the present invention, the inspection data calculated for each inspection item is displayed by the display means. By displaying the inspection reference data used as the threshold value of the inspection item pass / fail judgment in association with the inspection reference data to be corrected when there is a defect in the pass / fail judgment result of the component mounting state, Therefore, the setting work of the inspection reference data can be easily performed.

Further, according to the second inspection reference data setting support apparatus and the second inspection reference data setting support method according to the present invention, a captured image and inspection reference data are stored in a storage means, and the image processing means stores the captured image and the inspection reference data. Image processing using the inspection reference data of the storage unit as a threshold value is performed on the captured image of the storage unit, and the display unit displays the captured image of the storage unit, the inspection reference data, and the processed image of the image processing unit. By correcting the inspection reference data in the storage means by the correction means while viewing the displayed processed image, the inspection reference data to be corrected can be immediately known, and the optimum value of the inspection reference data can be set in a short time. Therefore, the work of setting the inspection reference data can be easily performed.

[0017]

FIG. 1 is a block diagram showing the configuration of a first embodiment of the present invention. The configuration of an inspection reference data setting support apparatus of the present invention, and a board inspection using the inspection reference data setting support apparatus of the present invention. 2 shows the configuration of the device.

In FIG. 1, the board inspection apparatus includes an inspection execution unit 1, a determination unit 2, a storage unit 3, an input unit 4, a display unit 5, a setting support screen creation unit 6, and a control unit 7.
Each mounted component on the board to be inspected is sequentially inspected to determine whether the mounted state of each mounted component is good.

The storage unit 3 has a RAM and the like, and includes position data and mounting direction data of components mounted on the board and component data including a component type name to which the component belongs, an inspection algorithm for each component type, an inspection item, Part type data including shape data, color data, and inspection reference data are stored. Also, in the test inspection mode and the inspection execution mode, the inspection data of each inspection item calculated by the inspection execution unit 1, the determination result of each inspection item of the component by the determination unit 2, and the determination result of the mounting state of each component are stored. I do.

Here, the component type is a name given to each component group having the same inspection content because they are the same type in shape.

The above component data is different for each board type, and the above component type data is data common to each board type.

The inspection algorithm calculates the inspection data of each inspection item of the mounted component by the inspection execution unit 1, and determines the inspection data.
Is a program showing an inspection execution procedure for judging the quality of each inspection item of the mounted component based on the inspection data, and judging the quality of the mounted state of the component based on the result of the quality judgment.

The inspection reference data is data comprising various thresholds used in the inspection algorithm.

The inspection item is data indicating an item to be inspected in inspecting a component belonging to the component type.

FIG. 2 is an explanatory diagram showing an example of the above-mentioned inspection items. In the drawing, “○” indicates an inspection item set for the component type, and “×” indicates an inspection item not set for the component type. Thus, for example, "R1
In the inspection of the components belonging to the component type of "", the inspection items other than "electrode width" and "electrode length" are inspected.

FIG. 3 is an explanatory diagram showing solder width, solder length, and copper foil area as an example of inspection data in an inspection item. FIG. 2 is a view of the component 11 mounted on the board as viewed from above, and 12 indicates a solder portion. Reference numeral 13 denotes a land portion of the copper foil of the substrate, and a hatched portion of the land portion 13 indicates an exposed portion of the copper foil.

In FIG. 3, 14 is the solder width, 15 is the solder length, and the area of the hatched portion is the copper foil area.

The inspection execution unit 1 has a board stage (not shown) and the like, and in accordance with a command from the control unit 7, based on the above-described inspection algorithm, in each of the mounted components of the board, each inspection item of the mounted component is inspected. Is calculated.

The determination unit 2 converts the inspection data of each inspection item of the component calculated by the inspection execution unit 1 based on the inspection algorithm according to the instruction of the control unit 7 into the above-described inspection standard The quality of each inspection item is determined by comparing the data with the data, and the quality of the mounted state of the component is determined based on the determination result.

The setting support screen creation unit 6 includes inspection reference data used as a threshold value for judging the quality of each inspection item,
In addition to displaying the inspection data by the inspection execution unit 1 in association with each inspection item, the result of pass / fail judgment of each inspection item is displayed, and a setting support screen for supporting setting of inspection reference data is created.

The input unit 4 has a keyboard, a mouse, and the like (not shown). The user operates the input unit 4 to set inspection reference data and execute a board inspection. Input various instructions and data.

The display unit 5 has a monitor (not shown).
In accordance with a command from the control unit 7, a setting support screen of inspection reference data created by the setting support screen creating unit 6, various messages, board inspection results, and the like are displayed.

The control unit 7 has a microprocessor or the like, controls the operations of the test execution unit 1, the determination unit 2, the storage unit 3, the display unit 5, and the setting support screen creation unit 6, and allows the user to input data into the input unit 4. In accordance with various instructions and data input from the device, the sample board is inspected in the test inspection mode in the following procedure, and the inspection reference data is set in the inspection reference data setting mode. The board inspection of the component mounting board is executed in the inspection execution mode based on the data.

FIG. 4 is a flowchart showing the procedure for setting the inspection reference data.

FIG. 5 is a subroutine of ST1 in FIG. 4, and is a flowchart showing a procedure for inputting initial values of inspection reference data. FIG. 1 shows a conventional procedure of inputting initial values and correction values of inspection reference data.

FIG. 6 is a subroutine of ST2 in FIG. 4, and is a flowchart showing a test inspection execution procedure in the board inspection apparatus.

FIG. 7 is a subroutine of ST4 in FIG. 4, and is a flowchart showing a procedure for displaying the inspection reference data setting support screen and a procedure for correcting the inspection reference data.

FIG. 8 shows an example of an initial screen displayed on the monitor screen of the display unit 5.

In FIG. 8, "1. Inspection reference data setting A" is a mode mainly used when inputting the initial value of the inspection reference data, and "2. Inspection reference data setting B" is mainly used for the inspection reference data. This mode is used when correcting data. In addition, “3. Test inspection” is a mode for executing a test inspection using a sample substrate, and “4. Inspection” is a mode in which, after the setting work of the inspection reference data is completed, a substrate inspection device is installed on an inspection line in a substrate mounting process of a factory. Is a mode in which is operated, and is a mode in which the inspection of the manufactured component mounting board is executed.

In ST1 of FIG. 4, an initial value of the inspection reference data is input.

That is, in ST11 of FIG. 5, the user operates the keyboard or the mouse of the input unit 4 shown in FIG. 1 to set “1. Inspection reference data setting A” shown in FIG.
When is selected, a component type list is displayed on the monitor screen of the display unit 5.

In ST12, the user enters the input
To select a component type for which an initial value of the inspection reference data is to be input from the above component type list.

Next, a setting screen of the inspection reference data of the selected component type is displayed on the monitor screen of the display unit 5,
At T13, the initial value of the inspection reference data is input by operating the keyboard or the mouse of the input unit 4. still,
When the inspection reference data of the selected component type has already been set, for example, when the reference data is changed due to a change in the mounting process, the value may be used as it is as the initial value.

Next, in ST14, the input inspection reference data is stored in the storage section 3. In ST15, when there is another component type for which the initial value of the inspection reference data is to be input, "NO" is input and ST12 is entered. Return to ST12-S
T14 is repeated, and when the input operation is completed for all the component types for which the initial values are to be input, "YES" is input in ST15, and the initial value input flow of the inspection reference data ends.

Returning to FIG. 4, in ST2, a test inspection of the sample substrate is performed.

That is, in ST21 of FIG. 6, the user operates the keyboard or the mouse of the input unit 4 and selects “3. Test Inspection” shown in FIG. The input screen of the substrate type name of the sample substrate to be used is displayed.

In ST22, when the user inputs the name of the substrate type of the sample substrate, the control unit 7
By associating the component type data stored with the component type data with the input component type component data, a board type mounting component layout diagram of the sample substrate is created,
Since this is displayed on the monitor screen of the display unit 5, the user designates a component to be subjected to the test inspection by clicking with the mouse of the input unit 4 among the components mounted on the sample board. The specification of the inspection component may be all components mounted on the board, or may be one or more.

Next, in ST23, the user sets the sample substrate on the substrate stage of the inspection execution unit 1 shown in FIG. 1, and inputs the substrate ID number of the sample substrate.
When a test inspection execution command is input, the control unit 7 operates the inspection execution unit 1 in ST24, and based on the component type data and the input board type component data stored in the storage unit 3, The specified parts are inspected as follows.

The inspection executing unit 1 is operated to calculate the inspection data of each inspection item of the designated component, and the judging unit 2 is operated to use this inspection data as a threshold value of each inspection item. The quality of each inspection item is compared with the inspection reference data, and the quality of the mounting state of the designated component is determined based on the quality determination. When there are a plurality of designated parts, the inspection of each designated part is sequentially performed in the manner described above.

When the inspection of all the specified components is completed, the inspection data of each inspection item, the result of the quality determination, and the result of the quality determination of the component mounting state are stored in the storage unit 3 and the quality determination of the component mounting status is performed. The result is displayed on the monitor screen of the display unit 5.

Next, in ST25, the user unloads the sample substrate set on the substrate stage of the inspection execution section 1, and inputs "NO" in ST26 if there is another sample substrate to be tested. And ST2
2 and the above-mentioned steps ST23 to ST25 are repeated.
ES ”to end the test inspection flow.

Returning to FIG. 4, in ST3, in the above-described test inspection, a component to be determined as non-defective is determined to be defective, or a component to be determined to be defective is determined to be non-defective, so that the inspection reference data setting support screen is displayed. If you want to correct the inspection reference data with reference to the above, or the result of the pass / fail judgment of the component mounting state is the desired one, the inspection reference data setting support screen is displayed in order to know the setting margin of the inspection reference data. If you want to see, go to ST4.

In ST4, the inspection reference data used as the threshold value (judgment reference value) of each inspection item and the inspection data calculated by the test inspection are displayed in association with each inspection item, and each inspection item is displayed. The inspection reference data setting support screen displaying the result of the pass / fail judgment of the item is displayed on the monitor screen of the display unit 5, and if necessary, the set value of the inspection reference data is corrected.

That is, in ST31 of FIG. 7, the user operates the keyboard or mouse of the input unit 4 to
When “2. Inspection reference data setting B” shown in FIG. 8 is selected, an input screen for a board type name, a part number, and a board ID number is displayed on the monitor screen of the display unit 5. Here, the component number is assigned to each mounted component to identify the same component mounted on the board, and the board ID number is assigned to each board to identify a board of the same board type. Is what is done.

Next, in ST32, the user operates the keyboard or the mouse of the input unit 4 to obtain information on the parts whose comparison values are to be compared with the set values of the inspection reference data and the inspection data in the test inspection. Enter the board ID number.

For example, in the above-mentioned test inspection, a sample to be determined as a non-defective product having a component number “R03” of a sample substrate having a substrate type number “B0001” and a substrate ID number “T0001”. If it is determined that the component is defective, and the user wants to compare the set value of the inspection reference data for the component with the inspection data, the user inputs the board type name, the component number, and the board ID number.

Then, in ST33, the control section 7 operates the setting support screen creation section 6 to read out the inspection reference data of the component type corresponding to the board type name and the component number inputted in ST32 from the storage section 3, and ST32 above
Board type name, part number, and board ID entered in
The inspection data of each inspection item and the pass / fail judgment result of the component corresponding to the number are read from the storage unit 3, the read inspection reference data and the inspection data are displayed in association with each inspection item, and the read quality of each inspection item is checked. An inspection reference data setting support screen on which the determination result is displayed is created and displayed on the monitor screen of the display unit 5.

FIG. 9 shows an example of the inspection reference data setting support screen. The inspection reference data shown in the drawing is the inspection reference data of the component type "R1" to which the component "R03" of the board type "B001" belongs, and the inspection data shown in the drawing is the board type "B001" and the board type "B001". This is inspection data of the component “R03” of the sample board corresponding to the ID number “T0001”.

In FIG. 9, the part "R03" is determined to be defective in the inspection item "solder width". For the inspection item determined to be defective, the display column of the inspection data of the inspection item is displayed in another data. Column. For example, the display field of the inspection data of “solder width” is colored in red. When the monitor of the display unit 5 is monochrome, the display is inverted in black and white.

Furthermore, as in the inspection item “part lateral displacement amount”, although a non-defective product is determined, if the upper limit value or lower limit value of the inspection reference data is close to the value of the inspection data, the inspection item of the inspection item is The display column of the inspection data is displayed separately from the other data display columns. For example, the display column of the inspection data of “component lateral displacement amount” is colored in yellow. The criterion for determining whether the values of the inspection data are close to each other is, for example, that if the value is within 80% of the intermediate value between the upper limit value and the lower limit value of the test reference data, it is determined that the values are not close. If so, it is assumed that they are approaching.

FIG. 10 shows an example of the inspection reference data setting support screen in which the inspection reference data and the inspection data are graphically displayed. As in the case of FIG. 9, when the value is out of the judgment reference value of the inspection reference data, the inspection item part is displayed separately from other items. For example, the column of the item of the solder width is colored red or is indicated by oblique lines.

In FIG. 10, "▽" indicates the upper limit and the lower limit of the inspection reference data, and "検 査" indicates the inspection data.

Note that a numerical display as shown in FIG.
Display with a graph as shown in FIG. 10 may be performed simultaneously.

Returning to FIG. 7, in ST35, the user looks at the inspection reference data setting support screen as shown in FIG. 9 or FIG. 10, and if there is no inspection reference data to be corrected, inputs "NO" to ST37. If there is inspection reference data to be corrected, enter "YES" and enter ST3.
Proceed to 6.

In ST36, the user operates the keyboard or mouse of the input unit 4 to correct the set value of the inspection reference data on the inspection reference data setting support screen, and inputs an instruction for updating the inspection reference data. The control unit 7 rewrites the inspection reference data stored in the storage unit 3 with the corrected one in accordance with the update instruction.

Next, in ST37, if there is any other component for which the user wishes to view the inspection reference data setting support screen, "NO" is input, the process returns to ST32, and ST32 to ST36 are repeated.
Then, the setting support screen is displayed for all the parts for which the user wants to view the inspection reference data setting support screen, and when the inspection reference data has been corrected as necessary, “YES” is input to end the flow.

If no board ID number is entered or a plurality of board IDs are entered in ST32, ST
In 33, the control unit 7 operates the setting support screen creation unit 6 to execute all the inspection data corresponding to the board type and the part number input in ST32, or the board type, the part number, and the board input in ST32. A plurality of inspection data corresponding to the ID number is read out from the storage unit 3, statistical processing is performed on the plurality of inspection data read out, and a result of the statistical processing is displayed as inspection data on an inspection reference data setting support screen.

FIG. 11 shows an example of an inspection reference data setting support screen in which a plurality of inspection data are statistically processed and displayed. In the figure, the minimum value of a plurality of inspection data,
Displays the maximum value, average value, and number of samples, and displays the minimum value,
In the case where the maximum value and the average value are determined to be defective, the display column is displayed separately from the other display columns.

The inspection reference data setting support screen as shown in FIG.
It is used when it is necessary to know the setting margin of the inspection reference data.

Returning to FIG. 4, when the inspection reference data is corrected in ST4 in ST5, the process returns to ST2, and a test inspection is performed again using the corrected inspection reference data.

If it is determined in ST3 or ST5 that the setting of the inspection reference data has been completed, the flow of setting the inspection reference data ends.

As described above, according to the first embodiment of the present invention,
Inspection reference data used by the setting support screen creation unit 6 as a threshold value for quality determination of each inspection item and inspection data by the inspection execution unit 1 are displayed in association with each inspection item, and the quality of each inspection item is displayed. Displayed the judgment result,
A setting support screen for supporting the setting of the inspection reference data is created, the inspection reference data setting support screen is displayed on the monitor screen of the display unit 5, and displayed by operating the keyboard or the mouse of the input unit 4. By adopting a configuration in which the inspection reference data can be corrected on the inspection reference data setting support screen, when there is a defect in the result of the pass / fail judgment of the component mounting state, the inspection reference data to be corrected can be immediately identified, and the inspection reference data Since the optimum value can be set in a short time, the setting work of the inspection reference data can be easily performed.

Next, a second embodiment of the present invention will be described.

FIG. 12 is a block diagram showing the configuration of the second embodiment of the present invention. The configuration of the inspection reference data setting support apparatus of the present invention, and the board inspection apparatus using the inspection reference data setting support apparatus of the present invention. It shows the configuration of FIG.

In FIG. 12, the board inspection device is red,
The three-color light of green and blue is applied to the component mounting portion of the board from different elevation angles, and the quality of the component mounting state is determined based on the color image obtained by imaging the component mounting portion. A light unit 21, an imaging unit 22, a stage unit 23, an image processing unit 24, a storage unit 25, an input unit 26,
Display unit 27, setting support screen creation unit 28, and control unit 2
9. The inspection execution data output device according to the present invention includes a storage unit 25, an input unit 26, a display unit 27, a setting support screen creation unit 28, and a control unit 29.

The light projecting section 21 has three ring-shaped light sources of a red light source, a green light source, and a blue light source, and irradiates these three-color lights to the component mounting portions of the substrate from different elevation angles. These three-color light sources have a luminescence energy distribution with respect to wavelength that allows complete white light to be obtained when mixed on the substrate surface.

FIG. 13 is a configuration diagram of the light projecting section 21. In the figure, a red light source 31, a green light source 32, and a blue light source 33
Are arranged concentrically so that the center thereof coincides with the imaging center axis 34 of the imaging unit 22, and the ring radii r1, r2, r3 are different, and the heights h1, h2 from the substrate surface 35 are different. , H3, the imaging center axis 3
It is set so that elevation angles from a point A where the substrate surface 4 intersects with the substrate surface 35 are different angles θ1, θ2, and θ3. Here, θ1>θ2> θ3.

The imaging section 22 is a color television camera such as a CCD camera, and takes an image of the reflected light from the component mounting portion of the board according to an instruction from the control section 29 and sends this color image signal to the image processing section 24. .

The table unit 23 controls the attached light projecting unit 1 and image pickup unit 2 to X in accordance with a command from the control unit 29.
An X-axis table (not shown) for moving in the direction, and a substrate stage (not shown) on which a substrate to be inspected is set.
It is constituted by a Y-axis table (not shown) for moving the substrate to be inspected in the Y direction according to a command from the control unit 29.

The image processing unit 24 A / D converts an analog color image signal input from the imaging unit 22 into digital color image data in accordance with a command from the control unit 29.
Image processing such as binarization processing is performed on the digital color image, and inspection data of each component is calculated from the processed image.

The storage unit 25 has an image memory and a data memory such as a RAM and the like. The storage unit 25 includes position data and mounting direction data of mounted components and component data including a component type name to which the component belongs, an inspection algorithm for each component type, Inspection items, shape data, color data, and component type data including inspection reference data are stored. The image processing unit 2
4 for storing digital image data, processed image data, inspection data, and the like. Also, it stores the result of the quality judgment of the mounting state of each component.

The inspection algorithm calculates the inspection data of each inspection item by performing image processing such as binarization processing on the captured image of the component mounting part, and determines the quality of each inspection item from the inspection data. 9 is a program showing an inspection execution procedure for judging the quality of a component mounting state from the quality judgment result.

The inspection reference data is data composed of various thresholds used when performing image processing and quality judgment of each inspection item in the inspection algorithm.

The display unit 27 has a monitor (not shown), and in accordance with an instruction from the control unit 29, an inspection reference data setting support screen created by the setting support screen creating unit 28, various messages, and board inspection. Display the results etc.

The setting support screen creating unit 28 displays the digital image captured by the image capturing unit 22 and the binarized image processed by the image processing unit 24 in association with each other, and checks the inspection reference data used as the binary threshold. Create an inspection reference data setting support screen displaying.

The control unit 29 has a microprocessor and the like, and operates the light projecting unit 21, the imaging unit 22, the table unit 23, the image processing unit 24, the storage unit 25, the display unit 27, and the setting support screen creation unit 28. In accordance with various commands and data input from the input unit 26 by the user in accordance with the following procedure to support setting of the inspection reference data in the inspection reference data setting mode, and the inspection set in the inspection execution mode. A board inspection of the component mounting board is executed based on the reference data.

The board inspection apparatus includes “inspection reference data setting A”, “inspection reference data setting C”, and “inspection execution”.
Operation modes are prepared. “Inspection reference data setting A” is a mode mainly used when inputting the initial value of the inspection reference data, and “Inspection reference data setting C” is mainly a binarization threshold in the binarization processing of the captured image. This is a mode used when correcting the inspection reference data used as. "Inspection execution" is a mode in which the board inspection apparatus operates on the inspection line in the board mounting process of the factory after the setting work of the inspection reference data is completed, in which the inspection of the manufactured component mounting board is executed. It is.

First, an inspection execution procedure of the present board inspection apparatus will be described.

FIG. 14 is a flowchart showing an inspection execution procedure of the present board inspection apparatus.

In ST41 of FIG. 14, the user operates the keyboard or the mouse of the input unit 26 to select the inspection execution mode on the initial screen displayed on the monitor screen of the display unit 27. The screen displays an input screen for the board type name of the board to be inspected.

In ST42, a board type name is inputted. In ST43, a board to be inspected is set on the board stage of the table section 23, and a board ID number of the board to be inspected is inputted. I do.

Then, in sample ST44, the control section 29 operates the light projecting section 21, the imaging section 22, the table section 23, and the image processing section 24 to execute the inspection of the set substrate in the following manner.

The component mounting portion of the board is moved to the image capturing position of the image capturing portion 22 by the table portion 23, and three-color light is irradiated by the light projecting portion 21. The analog color image signal is sent to the image processing unit 24.

Since the solder surface of the component mounting portion has a specular reflection characteristic and has a three-dimensional curved surface shape, each curved element inclined with respect to the substrate surface receives each colored light incident from an oblique direction. A curved surface element whose light is reflected in a direction corresponding to an angle and whose reflection direction matches the direction of the imaging center axis of the imaging unit 22 (perpendicular to the substrate) corresponds to the corresponding colored light source color in the captured image of the reflected light image. In the captured image, the curved surface element having a slope close to a flat portion is colored red, the curved surface element having a steep slope is colored blue, and the curved surface having an intermediate slope between Elements are colored green. That is, the solder surface is separated and colored into each colored light source color according to the three-dimensional curved surface shape.

Parts having irregular reflection characteristics, such as mounted parts, copper foil lands, and resist parts of the substrate, are colored in their respective colors.

FIG. 15 shows an example of a color image of a component mounting site by the imaging unit 22.

In the sectional view and the top view of FIG.
1 and 42 are solder surfaces, 43 is a mounted component, 44 is an electrode of the mounted component 43, 45 is a resist portion of the substrate, and 46 is a land portion of copper foil.

In the color image, 47, 48, and 49 indicate colored portions of the solder surface 41, 47 is a substantially flat portion colored red, 48 is a green colored portion, and 49 is a colored portion.
Is a steep slope colored blue. Reference numeral 50 denotes a part colored by the component color, and 51 denotes a part colored by the resist color. It should be noted that the coloring of the solder surface 42 is omitted in the drawings of the mounted components and the substrate resist portion.

In the image processing section 24, the analog color image signal input from the image pickup section 22 is A / D converted into digital color image data, and the digital color image is subjected to image processing such as binarization processing. Inspection data is calculated based on the image.

For example, when calculating the inspection data of the copper foil area, the red-brown data is applied to the digital color image by using the binarization threshold value of the copper foil color, that is, the red brown in the inspection reference data. A binarization process of setting a bit in a pixel whose level is equal to or greater than the threshold value is performed, and the number of standing bits in the binarized image data of the copper foil color area is counted to calculate copper foil area inspection data. .

When the inspection data relating to the solder is calculated, a red, green or blue binary threshold value in the inspection reference data is used to calculate the red, green or blue color of the digital color image. A binarization process for setting a bit to a pixel whose data level is equal to or higher than the threshold value is performed, and inspection data relating to solder is calculated based on the binarized image data in the red, green, or blue region.

The inspection data calculated by the image processing unit 24 is sent to the control unit 29, and the control unit 29 determines whether the component mounting state is good or not based on the inspection data. When the pass / fail judgment is completed for all the mounted components on the board, the pass / fail judgment result is stored in the storage unit 25 and displayed on the monitor screen of the display unit 27.

Returning to FIG. 14, in ST45, the user unloads the substrate set on the substrate stage of table section 23. In ST46, when there is another substrate to be inspected, "NO" is input. Then, returning to ST43, the above-mentioned ST43 and ST44 are repeated to perform the inspection. When the inspection is completed for all the substrates to be inspected, "Y
"ES" is input to end the inspection execution flow.

Next, a description will be given of a procedure for setting inspection reference data used as a binarization threshold when the image processing section 24 performs a binarization process on a captured image.

FIG. 16 is a flowchart showing a procedure for setting the above-described inspection reference data.

FIG. 17 is a subroutine of ST2 in FIG. 16, and is a flowchart showing a procedure for displaying the inspection reference data setting support screen and a procedure for correcting the inspection reference data.

At ST51 in FIG. 16, the user
According to the procedure shown in FIG. 5, the initial value of the inspection reference data used as the binarization threshold is input.

Next, in ST52, a captured image of a desired region of the sample substrate is captured, the captured image is subjected to a binarization process, and the captured image and the binarized image are displayed in association with each other. An inspection reference data setting support screen displaying the inspection reference data used as the threshold value is displayed on the monitor screen of the display unit 27, and if necessary, the set value of the inspection reference data is corrected.

That is, in ST61 of FIG. 17, when the user operates the keyboard or the mouse of the input unit 26 and selects the inspection reference data setting mode C on the initial screen displayed on the monitor screen of the display unit 27,
On the monitor screen of the display unit 27, an input screen for the board type name of the sample board is displayed. In ST62, the user inputs a substrate type name of the sample substrate, sets the sample substrate on the substrate stage of the table unit 23, and
At T63, an imaging command is input so that the captured image of the sample substrate by the imaging unit 22 is displayed on the monitor screen of the display unit 27, and the keyboard or mouse of the input unit 26 is operated while looking at the monitor screen. By moving the table unit 23 and changing the imaging magnification of the imaging unit 22, the image of the area including the part for which the user wants to view the binarized image is displayed on the monitor screen of the display unit 27. Enter a storage command.

Then, the control unit 29 takes in the captured image displayed on the monitor screen of the display unit 27. That is, the image signal input from the imaging unit 22 is A / D converted by the image processing unit 24, and the digitally captured image data is stored in the storage unit 25.

Next, in ST64, the user operates the keyboard or the mouse of the input unit 26 to input a component type name of the component whose binarized image is desired to be viewed.

Then, in ST65, a list of the binarization processing to be performed in the inspection of the designated component type is displayed on the monitor screen of the display unit 27. select. For example, a binarization process for the red region and a binarization process for the blue region are selected.

In ST64 and ST65 described above, when the user inputs the component name of the component whose binarized image is desired to be viewed, the component type corresponding to the component type corresponding to the board type name input in ST62 is input. A list of value processing may be displayed.

Next, in ST66, the control section 29 operates the imaging section 22 and the image processing section 24 to perform the binarization processing selected in ST65 on the image captured by the imaging section 22 in ST63. Create a binarized image for monitor display, in which the area where the bits of the binarized image data are raised is colored with a color corresponding to the binarization process,
When a plurality of binarization processes are selected, the respective binarized images are combined. The captured image and the binarized image are sent to the setting support screen creation unit 28.

Subsequently, the control unit 29 operates the setting support screen creating unit 28 to display the captured image input from the image capturing unit 22 and the binarized image in association with each other, and to set the binarized threshold value as the binary threshold value. An inspection reference data setting support screen displaying the used inspection reference data is created, and this is displayed on the display unit 2.
7 is displayed on the monitor screen.

FIG. 18 shows an example of the above-mentioned inspection reference data setting support screen.

In FIG. 18, reference numeral 61 denotes a component mounted on the board, 62 denotes an electrode of the mounted component 61, 63 denotes a solder part, and 64 denotes an image pickup area, that is, an image area taken into the storage unit 25.

An inspection reference data setting support screen 65 is provided.
Reference numeral 66 denotes a captured image, 67 denotes a binarized image, 68 denotes a red-colored area of the solder part 63, 69 denotes a green-colored area, and 70 denotes a blue-colored area. By operating the mouse of the input unit 26, operations such as enlargement or reduction of the captured image 66 and the binarized image 67 can be performed.

On the setting support screen 65, red, green, and blue binarization processes are selected.

Accordingly, in the reference data set value display area 71, the set values of the respective inspection reference data used as the red, green, and blue binarization thresholds are displayed by “Δ” marks.

In the binarized image 67, reference numeral 72 denotes a red binarized area in which bits have been set in the red area binarization processing;
Reference numeral 3 denotes a green binarized region in which a bit has been set in the green region binarization process, reference numeral 74 denotes a blue binarized region in which a bit has been set in the blue region binarization process, and reference numeral 74 denotes a red binarized region. Red, green binarization area 73 is green, and blue binarization area 7
4 are each colored blue.

The screen area 75 displays a component type of the inspection reference data, a message from the control unit 29, and various command keys. The user can perform operations such as enlargement and reduction of the captured image 66 and the binarized image 67 by using the command key.

Returning to FIG. 17, in ST67, the user looks at the inspection reference data setting support screen as shown in FIG. 18 to determine whether or not the inspection reference data needs to be corrected. Inputs "YES" and proceeds to ST68.

In ST68, the user corrects the set value of the inspection reference data on the inspection reference data setting support screen using the keyboard or the mouse of the input unit 4,
An instruction for updating the inspection reference data is input. In accordance with this update instruction, the control unit 29 rewrites the inspection reference data stored in the storage unit 3 to a corrected one.

For example, in FIG. 18, the set value is corrected by clicking and moving the mark “▽” indicating the set value of the inspection reference data with the mouse.

Then, returning to ST66, in ST66, the control section 29 displays an inspection reference data setting support screen newly created based on the corrected inspection reference data.

ST66 to ST68 are repeated, and ST67
When it is determined that there is no inspection reference data to be corrected, the user inputs "NO" and proceeds to ST69.

In ST69, if there is any other component for which the user wishes to view the inspection reference data setting support screen, "NO" is input and the process returns to ST22 to repeat ST62 to ST68.

If the user wants to see a binarized image of another color area of the captured image currently loaded in the storage unit 27, the ST
61, ST62 is not performed, and the process starts from ST63.
If the user wants to view the binarized image of the area not picked up in the picked-up image on the currently set sample substrate, the process starts from ST62 without performing ST61. When the user wants to see a binarized image of another sample substrate, the process starts from ST61.

Then, the setting support screen is displayed for all the component types or parts for which the user wishes to view the inspection reference data setting support screen, and if the inspection reference data has been corrected as required, "YES" is input to enter this flow. To end.

When the monitor of the display unit is monochrome, the red binarization area 72 and the green binarization area 7 shown in FIG.
3. Each binarized area such as the blue binarized area 74 is displayed separately from the other areas by changing its luminance.

In a board inspection apparatus in which a captured image is a monochrome image, binarization processing based on the luminance level of the image is performed, and a monochrome captured image and a bit by the binarization processing are displayed on an inspection reference data setting support screen. The binarized image showing the area where the mark is raised is displayed, and the set value of the inspection reference data used as the binarization threshold of the luminance level is displayed.

As described above, according to the second embodiment, the digital image captured by the image capturing section 22 and the inspection reference data used as the binarization threshold are stored in the storage section 25, and the image processing section 24 stores the inspection reference data. The digital captured image is subjected to a binarization process using inspection reference data as a threshold, and the setting support screen creating unit 28 associates the digital captured image with the binarized image processed by the image processing unit 24. An inspection reference data setting support screen that displays the inspection reference data used as the binarization threshold is displayed, and the inspection reference data setting support screen is displayed on the monitor screen of the display unit 27 and displayed. The user can operate the keyboard or mouse of the input unit 26 to correct the inspection reference data while viewing the inspection reference data setting support screen. By a formed, seen in the inspection reference data to be corrected immediately, since it is possible to set a short time an optimum value of the inspection reference data can be easily performed setting operation of the inspection reference data.

It is of course possible to set and correct the inspection reference data in the first embodiment by the apparatus in the second embodiment.

[0135]

According to the present invention, as is clear from the above embodiment, the quality of each inspection item is determined from inspection data for each inspection item, and the quality of the mounting state of the component is determined based on the result of the quality determination. For the inspection and board inspection, the display means displays the calculated inspection data for each inspection item in association with the inspection reference data used as the threshold value for the quality judgment of each inspection item. By,
When there is a defect in the quality determination result of the component mounting state, the inspection reference data to be corrected is immediately known, so that the inspection reference data setting operation can be easily performed.

In the case of performing image processing on a captured image, determining whether or not the mounted state of the component is good or not based on the processed image, and performing a board inspection, the captured image stored in the storage means by the display means, the inspection By displaying the reference data and the processed image by the image processing means, and correcting the inspection reference data by the correction means while watching the displayed processed image, the inspection reference data to be corrected can be immediately known, and the inspection reference data Since the optimum value can be set in a short time, the setting work of the inspection reference data can be easily performed.

[Brief description of the drawings]

FIG. 1 is a block diagram showing a configuration of a first embodiment, showing a configuration of an inspection reference data setting support device of the present invention and a configuration of a board inspection device using the inspection reference data setting support device of the present invention. It is.

FIG. 2 is an explanatory diagram illustrating an example of an inspection item.

FIG. 3 is an explanatory diagram showing solder width, solder length, and copper foil area in inspection items.

FIG. 4 is a flowchart showing a procedure for setting inspection reference data in the first embodiment.

FIG. 5 is a flowchart showing a subroutine of ST1 in FIG. 4 and showing a procedure for inputting initial values of inspection reference data.

FIG. 6 is a flowchart showing a subroutine of ST2 in FIG. 4 and showing a test inspection execution procedure by the board inspection apparatus.

FIG. 7 is a flowchart showing a subroutine of ST4 in FIG. 4, showing a procedure for displaying an inspection reference data setting support screen and a procedure for correcting inspection reference data.

FIG. 8 shows an example of an initial screen of the board inspection apparatus in the first embodiment.

FIG. 9 illustrates an example of an inspection reference data setting support screen according to the first embodiment.

FIG. 10 illustrates an example of an inspection reference data setting support screen according to the first embodiment, and illustrates an example in which inspection reference data and inspection data are displayed in a graph.

FIG. 11 illustrates an example of an inspection reference data setting support screen according to the first embodiment, and illustrates an example in which a plurality of inspection data are statistically processed and displayed.

FIG. 12 is a block diagram showing a configuration of a second embodiment;
1 shows a configuration of an inspection reference data setting support device of the present invention and a configuration of a board inspection device using the inspection reference data setting support device of the present invention.

FIG. 13 is a configuration diagram of a light projecting unit of the board inspection apparatus in the second embodiment.

FIG. 14 is a flowchart illustrating an inspection execution procedure of the substrate inspection apparatus according to the second embodiment.

FIG. 15 illustrates an example of a color image of a component mounting portion by an imaging unit of the board inspection device according to the second embodiment.

FIG. 16 is a flowchart showing a procedure for setting inspection reference data in the second embodiment.

FIG. 17 is a subroutine of ST2 in FIG. 16, and is a flowchart showing a procedure for displaying an inspection reference data setting support screen and a procedure for correcting inspection reference data.

FIG. 18 illustrates an example of an inspection reference data setting support screen according to the second embodiment.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1 Inspection execution part 2 Judgment part 3, 25 Storage part 4, 26 Input part 5, 27 Display part 6, 28 Setting support screen creation part 7, 29 Control part

Claims (8)

(57) [Claims] An inspection data of a component mounted on a board is calculated for each inspection item, and the inspection data is compared with a threshold value to judge pass / fail of each inspection item, and from the pass / fail judgment result. An inspection reference data setting support device that supports setting of inspection reference data used as a threshold value for the quality determination of each inspection item in the board inspection device that determines the quality of the mounting state of the component. Display means for displaying the test reference data in association with each test item, storage means for storing the test reference data, and correction means for correcting the test reference data stored in the storage means. An inspection reference data setting support device, comprising: 2. The display device according to claim 1, wherein the display unit displays the inspection data and the inspection reference data in association with each inspection item, and displays a result of the pass / fail determination of each inspection item. The inspection reference data setting support device according to claim 1. 3. The inspection reference data setting support apparatus according to claim 1, wherein the display unit displays the inspection data and the inspection reference data in a graph in association with each inspection item. . 4. An image processing is performed on a picked-up image of a component mounted on a board, and is used as a threshold value of the image processing in a board inspection apparatus that determines whether the mounted state of the component is good or not based on the processed image. An inspection reference data setting support device that supports setting of inspection reference data to be obtained, wherein the storage unit stores the captured image and the inspection reference data, and performs image processing using the inspection reference data of the storage unit as a threshold value. Image processing means for applying to the captured image of the storage means; display means for displaying the captured image of the storage means, inspection reference data, and the image processed by the image processing means; and correction for correcting the inspection reference data of the storage means Inspection reference data setting support apparatus comprising: 5. Inspection data of a component mounted on a board is calculated for each inspection item, and the inspection data is compared with a threshold to determine pass / fail of each inspection item. An inspection reference data setting support method for supporting setting of inspection reference data used as a threshold value for determining whether each of the inspection items is acceptable in a board inspection method for determining whether the component is in a good or bad mounting state. In the storage means, a display procedure in which the inspection data and the inspection reference data are displayed on display means in association with each inspection item, and the inspection reference data stored in the storage means is corrected. And a correction procedure for correcting by means. 6. The display procedure according to claim 1, wherein the display means displays the inspection data and the inspection reference data in association with each inspection item, and displays a pass / fail judgment result of each inspection item. The inspection reference data setting support method according to claim 5, characterized in that: 7. The inspection reference data according to claim 5, wherein the display procedure displays the inspection data and the inspection reference data in a graph in association with each inspection item by a display unit. Setting support method. 8. An image processing is performed on a picked-up image of a component mounted on a board, and is used as a threshold value of the image processing in a board inspection method for determining whether the mounted state of the component is good based on the processed image. An inspection reference data setting support method for supporting setting of inspection reference data to be set, wherein a storage procedure for storing the captured image and the inspection reference data by a storage means, and a threshold for the inspection reference data of the storage means by an image processing means. An image processing procedure of performing image processing using a value on the captured image of the storage unit, a display procedure of displaying a captured image of the storage unit, inspection reference data, and a processed image by the image processing unit on a display unit, And a correction procedure for correcting the inspection reference data of the storage means by means. Law.