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JP2786688B2 - Cooling / heating cycle equipment - Google Patents

Cooling / heating cycle equipment

Info

Publication number
JP2786688B2
JP2786688B2 JP23543089A JP23543089A JP2786688B2 JP 2786688 B2 JP2786688 B2 JP 2786688B2 JP 23543089 A JP23543089 A JP 23543089A JP 23543089 A JP23543089 A JP 23543089A JP 2786688 B2 JP2786688 B2 JP 2786688B2
Authority
JP
Japan
Prior art keywords
tank
gas supply
temperature
test
test tank
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP23543089A
Other languages
Japanese (ja)
Other versions
JPH0396831A (en
Inventor
正男 矢坂
恵一 村野
明哉 野尻
嘉郎 辻子
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TABAI ESUPETSUKU KK
Original Assignee
TABAI ESUPETSUKU KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TABAI ESUPETSUKU KK filed Critical TABAI ESUPETSUKU KK
Priority to JP23543089A priority Critical patent/JP2786688B2/en
Publication of JPH0396831A publication Critical patent/JPH0396831A/en
Application granted granted Critical
Publication of JP2786688B2 publication Critical patent/JP2786688B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は精密機器、その材料や部品、その他各種電子
部品等の熱衝撃、温度サイクル等の熱雰囲気に対する耐
久性、強度等を調べる冷熱サイクル装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a thermal cycle for examining the durability, strength, etc. of a precision instrument, its material and parts, and various other electronic components to a thermal shock and a thermal atmosphere such as a temperature cycle. Related to the device.

〔従来の技術〕[Conventional technology]

従来、この種の装置においては、常温さらし時、装置
周辺の外気を試験槽内へ導入し、常温さらし前の高温さ
らしまたは低温さらしによる試験槽内温度を外気と熱交
換させ、試験槽内を常温に近づけていた。
Conventionally, in this type of apparatus, at the time of normal temperature exposure, outside air around the apparatus is introduced into the test chamber, and the temperature in the test chamber due to high temperature exposure or low temperature exposure before the normal temperature exposure is exchanged with the outside air, and the inside of the test chamber is exposed. It was approaching room temperature.

〔発明が解決しようとする課題〕[Problems to be solved by the invention]

しかし、このような常温さらしにおいては次の問題が
生じていた。
However, the following problem has occurred in such normal temperature exposure.

常温さらしの温度が制御されていない。すなわち、
外気を試験槽内へ導入するため、常温さらし温度が管理
(制御)されておらず、その結果、熱雰囲気試験の温度
精度を悪くしていた。例えば、高温さらし、低温さらし
では例えば±1℃の精度を有するが、常温さらしでは10
〜40℃程度の範囲でバラツキが生じていた。
Room temperature exposure is not controlled. That is,
Since the outside air is introduced into the test tank, the temperature at normal temperature is not controlled (controlled), and as a result, the temperature accuracy of the hot atmosphere test is deteriorated. For example, high-temperature exposure and low-temperature exposure have an accuracy of, for example, ± 1 ° C.
Variation occurred in the range of about 40 ° C.

低温さらし後の常温さらしにおいて試料に結露し、
試料に結露することにより試料に与えられるべき熱エネ
ルギーを水分が吸収してしまったり、試料が高湿雰囲気
にさらされる等、該結露が試験に対する外乱要因となっ
ていた。
Condensation on the sample in normal temperature exposure after low temperature exposure,
Moisture absorbs the thermal energy to be given to the sample due to the condensation on the sample, or the sample is exposed to a high-humidity atmosphere.

試験槽に外気を導入するため、試験槽内に外気中の
水分が侵入し、該侵入した水分が低温さらし時に蒸発器
または畜冷器に凝結し、蒸発器の熱交換能力の低下や風
洞抵抗の増加により風量の低下を招いていた。また、高
温気体供給槽や低温気体供給槽と試験槽との間に設けた
開閉ダンパー等における断熱を目的とするシールパッキ
ン部に該水分が付着し、これが低温さらし時に凝結する
と、該シール部に隙間ができ、気体洩れが発生したり、
ダンパーの氷結による動作不良が発生していた。
In order to introduce outside air into the test tank, moisture in the outside air enters the test tank and condenses on the evaporator or animal cooler when exposed to low temperatures, which lowers the heat exchange capacity of the evaporator and reduces wind tunnel resistance. The increase in airflow caused a decrease in airflow. Further, when the moisture adheres to a seal packing portion for the purpose of heat insulation in an opening / closing damper provided between a high-temperature gas supply tank or a low-temperature gas supply tank and a test tank, and condenses when exposed at a low temperature, the seal portion is formed. A gap is created, gas leakage occurs,
Malfunction due to freezing of the damper had occurred.

そこで本発明の目的は、常温さらしの温度を管理(制
御)することができ、それによって常温さらし試験の温
度精度を高温、低温さらし時と同等程度に向上させるこ
とができ、また、外部の水分を試験槽内に取り入れない
ようにして、結露による外乱的要因を排除し、それによ
って試験精度を向上させると同時に装置への氷結、霜付
等の悪条件を排除することができる冷熱サイクル装置を
提供することにある。
Therefore, an object of the present invention is to control (control) the temperature of normal temperature exposure, thereby improving the temperature accuracy of the normal temperature exposure test to the same degree as that at the time of high temperature and low temperature exposure. Refrigeration cycle equipment that eliminates disturbance factors due to dew condensation, thereby improving the test accuracy, and at the same time, eliminating bad conditions such as icing and frosting on the equipment. To provide.

〔課題を解決するための手段〕[Means for solving the problem]

本発明は前記目的に従い、試験槽と、高温気体供給槽
と、低温気体供給槽と、常温気体供給槽と、前記試験槽
と前記各気体供給槽とを結ぶ第1の通気孔群と、前記試
験槽と前記各気体供給槽とを結び前記第1の通気孔群と
対をなす第2の通気孔群と、前記各通気孔を開閉するた
の扉とを備えたことを特徴とする冷熱サイクル装置を提
供するものである。
According to the present invention, a test tank, a high-temperature gas supply tank, a low-temperature gas supply tank, a normal-temperature gas supply tank, a first group of vents connecting the test tank and each of the gas supply tanks, A second vent group that connects a test tank with each of the gas supply tanks and forms a pair with the first vent group; and a door that opens and closes each of the vent holes. A cycle device is provided.

試験槽内の水分を排除するために、前記試験槽には乾
燥空気、窒素ガス等の乾燥ガス導入手段を設けるととも
に該ガス導入手段による乾燥ガス導入により前記試験槽
内気体を該試験槽内が外気圧より僅かに陽圧に保たれる
ように排出するための排気手段を設けてもよい。この排
気手段には例えば開閉可能の排気ダクトが考えられる。
In order to eliminate the moisture in the test tank, the test tank is provided with a dry gas introducing means such as dry air and nitrogen gas, and the gas in the test tank is introduced into the test tank by the introduction of the dry gas by the gas introducing means. An exhaust means may be provided for exhausting the gas so as to be maintained at a positive pressure slightly higher than the external pressure. The exhaust means may be, for example, an openable / closable exhaust duct.

〔作 用〕(Operation)

本発明冷熱サイクル装置によると、試験槽内に試料が
収納され、高温さらしの時には、該試験槽と高温気体供
給槽とを結ぶ通気孔の開閉扉が開かれ、他の扉は全て閉
じられる。この状態で高温気体が高温気体供給槽から試
験槽に循環せしめられ、試験が高温雰囲気にさらされ
る。
According to the cooling / heating cycle device of the present invention, the sample is stored in the test tank, and when the sample is exposed to high temperature, the opening / closing door of the vent hole connecting the test tank and the high-temperature gas supply tank is opened, and all other doors are closed. In this state, the hot gas is circulated from the hot gas supply tank to the test tank, and the test is exposed to a high temperature atmosphere.

低温さらしの時には、試験槽と低温気体供給槽とを結
ぶ通気孔の開閉扉が開かれ、他の扉は全て閉じられる。
この状態で低温気体が低温気体供給槽から試験槽に循環
せしめられ、試料が低温雰囲気にさらされる。
At the time of low-temperature exposure, the opening / closing door of the vent connecting the test tank and the low-temperature gas supply tank is opened, and all other doors are closed.
In this state, the low-temperature gas is circulated from the low-temperature gas supply tank to the test tank, and the sample is exposed to the low-temperature atmosphere.

また、常温さらしの時には、試験槽と常温気気体供給
槽とを結ぶ通気孔の開閉扉が開かれ、他の扉は全て閉じ
られる。この状態で温度制御された常温気体が常温気体
供給槽から試験槽に循環せしめられ、試料が該常温雰囲
気にさらされる。
In addition, at the time of normal temperature exposure, the opening / closing door of the vent connecting the test tank and the normal temperature gas supply tank is opened, and all other doors are closed. In this state, the room temperature gas whose temperature is controlled is circulated from the room temperature gas supply tank to the test tank, and the sample is exposed to the room temperature atmosphere.

試験槽に前記乾燥ガス導入手段が設けられるとともに
前記排気手段が設けられている場合には、各さらし試験
において、該乾燥ガス導入手段から試験槽内に乾燥ガス
が導入されるとともに、すでに試験槽内にあった気体の
一部が前記排気ダクトから外部へ放出され、それによっ
て試験槽内が外気圧により僅かに陽圧に保たれて一層乾
燥状態に保たれる。
When the test tank is provided with the drying gas introduction means and the exhaust means, in each exposure test, the drying gas is introduced into the test tank from the drying gas introduction means, and the test tank is already A part of the gas contained therein is discharged to the outside from the exhaust duct, whereby the inside of the test chamber is kept at a slightly positive pressure by the external pressure, and is kept more dry.

なお、高温さらし時における低温気体供給槽および常
温気体供給槽、低温さらし時における高温気体供給槽お
よび常温気体供給槽、常温さらし時における高温気体供
給槽および低温気体供給槽は、それぞれ、必要に応じ、
次の使用に備えて準備運転することができる。
The low-temperature gas supply tank and normal temperature gas supply tank during high temperature exposure, the high temperature gas supply tank and normal temperature gas supply tank during low temperature exposure, and the high temperature gas supply tank and low temperature gas supply tank during normal temperature exposure, ,
Preparations can be made for the next use.

〔実 施 例〕〔Example〕

以下、本発明の実施例を図面を参照して説明する。 Hereinafter, embodiments of the present invention will be described with reference to the drawings.

図示の冷熱サイクル装置は、試験槽1、試験槽1の下
側に隣り合わせて設けられた高温気体供給槽2、試験槽
1の背後に隣合わせて設けられた低温気体供給槽3、お
よび試験槽1の上側に隣合わせて設けられた常温気体供
給槽4を備えている。
The illustrated cooling / heating cycle apparatus includes a test tank 1, a high-temperature gas supply tank 2 provided adjacently below the test tank 1, a low-temperature gas supply tank 3 provided adjacently behind the test tank 1, and a test tank 1. A normal temperature gas supply tank 4 is provided adjacent to the upper side of the tank.

試験槽1は前面に試料出し入れ用の開閉自在扉11を有
し、試験槽1と高温気体供給槽2との間には断熱壁12
が、試験槽1と低温気体供給槽3との間に断熱壁13が、
試験槽1と常温気体供給槽4との間に断熱壁14がそれぞ
れ設けられており、試験槽1の左右は断熱壁15、15によ
って塞がれている。また、気体供給槽2は断熱壁20によ
り、気体供給槽3は断熱壁30により、気体供給槽4は断
熱壁40により囲まれている。
The test tank 1 has an openable / closable door 11 on the front surface for taking in / out a sample, and a heat insulating wall 12 between the test tank 1 and the high-temperature gas supply tank 2.
However, a heat insulating wall 13 is provided between the test tank 1 and the low-temperature gas supply tank 3,
Insulating walls 14 are provided between the test tank 1 and the room temperature gas supply tank 4, and the left and right sides of the test tank 1 are closed by the insulating walls 15, 15. The gas supply tank 2 is surrounded by the heat insulating wall 20, the gas supply tank 3 is surrounded by the heat insulating wall 30, and the gas supply tank 4 is surrounded by the heat insulating wall 40.

断熱壁12、13、14のそれぞれにおいて試験槽1の一端
部(第1図上、右端部)に臨む部分には、試験槽1と高
温気体供給槽2とを結ぶ通気孔21、試験槽1と低温気体
供給槽3とを結ぶ通気孔31および試験槽1と常温気体供
給槽4とを結ぶ通気孔41が設けられており、それらには
開閉断熱扉51、61、71が設けられている。
In each of the heat insulating walls 12, 13, and 14, a portion facing one end (the right end in FIG. 1) of the test tank 1 has a ventilation hole 21 connecting the test tank 1 and the high-temperature gas supply tank 2, and the test tank 1 And a low-temperature gas supply tank 3 and a ventilation hole 41 connecting the test tank 1 and the normal temperature gas supply tank 4 are provided with openable and heat-insulating doors 51, 61 and 71. .

断熱壁12、13、14のそれぞれにおいて試験槽1の他端
部(第1図上、左端部)に臨む部分には、試験槽と高温
気体供給槽2とを結ぶ通気孔22、試験槽1と低温気体供
給槽3とを結ぶ通気孔32および試験槽1と気体供給槽4
とを結ぶ通気孔42が設けられており、それらには開閉断
熱扉52、62、72が設けられている。
In each of the heat insulating walls 12, 13 and 14, a portion facing the other end (the left end in FIG. 1) of the test tank 1 has a ventilation hole 22 connecting the test tank and the high-temperature gas supply tank 2, Vent hole 32 connecting the low temperature gas supply tank 3 to the test tank 1 and the gas supply tank 4
Are provided with open / closed heat insulating doors 52, 62, and 72.

これら扉はそれぞれ図面に実線で示す位置から二点鎖
線で示す位置まで回動できるように前記断熱壁に直接ま
たは間接的にヒンジ連結されており、それ自体すでに知
られている図示しない扉駆動手段、例えば、直接または
適当なリンク機構を介してピストン・シリンダ装置にて
駆動するようにしたもの、扉に連結した回動用シャフト
をウォームギヤ等の適当な歯車伝動装置を介してモータ
にて駆動するようにしたもの等にて開閉されるようにな
っている。
Each of these doors is hinged directly or indirectly to the heat insulating wall so as to be rotatable from a position shown by a solid line in the drawing to a position shown by a two-dot chain line. For example, one that is driven by a piston / cylinder device directly or through an appropriate link mechanism, and that a rotating shaft connected to a door is driven by a motor through an appropriate gear transmission such as a worm gear. It is designed to be opened and closed by something like

高温気体供給槽2は電気加熱ヒータ、蒸気加熱ヒータ
等の適当なヒータをアルミ等製のインゴットの内蔵した
加熱畜熱器23と、その下流側に配置された通常の電気ま
たは蒸気加熱ヒータ24と、さらに該ヒータの下流側かつ
通気孔21に臨む位置に配置された気体循環用ファン25を
備えており、ファン25はモータ26により駆動される。
The high-temperature gas supply tank 2 includes a heating heater 23 having an appropriate heater such as an electric heater or a steam heater built in an ingot made of aluminum or the like, and a normal electric or steam heater 24 disposed downstream thereof. Further, a gas circulation fan 25 is provided downstream of the heater and at a position facing the ventilation hole 21, and the fan 25 is driven by a motor 26.

また、低温気体供給槽3は例えばアルミ等製のインゴ
ットからなる畜冷器33と、その下流側に順次配置された
冷却器34、温度調節用加熱ヒータ35および気体循環用フ
ァン36を備えており、ファン36は通気孔31に臨んでお
り、モータ37により駆動される。
Further, the low-temperature gas supply tank 3 is provided with a cooler 33 made of, for example, an ingot made of aluminum or the like, a cooler 34 arranged sequentially downstream thereof, a heater 35 for temperature control, and a fan 36 for gas circulation. The fan 36 faces the ventilation hole 31 and is driven by the motor 37.

常温気体供給槽4は熱交換器43と、熱交換器の下流側
かつ通気孔41に臨む位置に気体循環用ファン43を備えて
おり、該ファンはモータ44により駆動される。
The room-temperature gas supply tank 4 includes a heat exchanger 43 and a gas circulation fan 43 downstream of the heat exchanger and facing the vent hole 41, and the fan is driven by a motor 44.

試験槽1の両端部(第1図において左右両端部)に
は、前記通気孔および扉よりも内側の位置に格子または
鋼板16、16が設けられており、これらは試験槽1内の試
料が通気孔に入り込まないように安全のため設けられて
いるものであるが、整流機能を備えていることが望まし
いものである。
Grids or steel plates 16, 16 are provided at both ends (left and right ends in FIG. 1) of the test tank 1 at positions inside the vent holes and the door, and these are used for the sample in the test tank 1. Although it is provided for safety so that it does not enter the ventilation hole, it is desirable that it has a rectifying function.

また、試験槽1の一端部(第1図上、右端部)には乾
燥ガスとして露点温度の低い(例えば−70℃)空気を導
入するためのパイプ5が設けられており、該パイプ5は
電磁弁51により開閉可能であるとともに、空気源52から
乾燥空気を試験槽1内へ導入することができる。
A pipe 5 for introducing air having a low dew point temperature (for example, -70 ° C.) as a dry gas is provided at one end (right end in FIG. 1) of the test tank 1. It can be opened and closed by an electromagnetic valve 51, and dry air can be introduced into the test tank 1 from an air source 52.

試験槽1には、さらに、他端部(第1図上、左端部)
に排気ダクト6が設けられており、該ダクト6は図示し
ないソレノイド等の駆動手段により開閉されるダンパ61
を備えている。
The test tank 1 further includes the other end (the left end in FIG. 1).
Is provided with an exhaust duct 6, and the duct 6 is provided with a damper 61 which is opened and closed by driving means such as a solenoid (not shown).
It has.

なお、図中81は制御室、82は機械室である。 In the figure, 81 is a control room, and 82 is a machine room.

この冷熱サイクル装置によると、図示しない試料を試
験槽1の扉11を開いて該槽内に収納し、扉11を閉めた
後、該試料を所望のサイクルにて高温気体、低温気体、
常温気体という異なる熱雰囲気にさらすことができ、熱
衝撃、各種熱雰囲気に対する該試料の耐久性、強度等を
調べることができる。
According to this cooling / heating cycle device, a sample (not shown) is stored in the test chamber 1 by opening the door 11 and the door 11 is closed. Then, the sample is subjected to a high-temperature gas, a low-temperature gas,
The sample can be exposed to different thermal atmospheres such as a normal temperature gas, and the thermal shock, durability, strength, and the like of the sample with respect to various thermal atmospheres can be examined.

試料を高温気体にさらす時には、高温気体供給槽2に
通じる扉51および52が第1図に二点鎖線で示す位置まで
開かれ、他の扉61、62、71、72は閉じられる。加熱畜熱
器23が後述する待機時から引き続き運転され、さらにヒ
ータ24も運転される。
When the sample is exposed to the hot gas, the doors 51 and 52 leading to the hot gas supply tank 2 are opened to the position shown by the two-dot chain line in FIG. 1, and the other doors 61, 62, 71 and 72 are closed. The heating and heating unit 23 is continuously operated from a standby state described later, and the heater 24 is also operated.

この状態でファン25が駆動され、高温気体が気体供給
槽2から通気孔21を通って試験槽1へ流入し、さらに該
試験槽から通気孔22を通って槽2へ戻り、該槽内で再び
加熱されて試験槽1へ吐き出される。かくして試験槽内
試料は所望の高温に所望時間さらされる。
In this state, the fan 25 is driven, and the high-temperature gas flows into the test tank 1 from the gas supply tank 2 through the vent hole 21 and returns to the tank 2 through the vent hole 22 from the test tank. It is heated again and is discharged into the test tank 1. Thus, the sample in the test chamber is exposed to a desired high temperature for a desired time.

この高温さらしの間、低温気体供給槽3および常温気
体供給槽4は準備運転される。すなわち低温気体供給槽
3においては、冷却器34が運転され、畜冷器33に冷熱が
蓄えられ、次の低温さらしに備えて直ちに所定の低温気
体を供給できるように準備される。また、常温気体供給
槽4においては、次の常温さらしに備えて熱交換器43が
運転される。
During the high-temperature exposure, the low-temperature gas supply tank 3 and the normal-temperature gas supply tank 4 are operated in preparation. That is, in the low-temperature gas supply tank 3, the cooler 34 is operated, the cold heat is stored in the animal cooler 33, and a preparation is made so that a predetermined low-temperature gas can be supplied immediately in preparation for the next low-temperature exposure. In the room temperature gas supply tank 4, the heat exchanger 43 is operated in preparation for the next room temperature exposure.

試料を低温気体にさらす時には、低温気体供給槽3に
通じる扉61および62が第3図に二点鎖線で示す位置まで
開かれ、他の扉51、52、71、72は全て閉じられる。冷却
器34が前記待機時から引き続き運転され、ファン36が駆
動され、低温気体が気体供給槽3から通気孔31を通って
試験槽1に流入し、さらに該試験槽から通気孔32を通っ
て槽3に戻り、該槽3内で再び冷却されて試験槽1へ吐
出される。かくして試験槽内試料は所望の低温に所望時
間さらされる。
When the sample is exposed to the low-temperature gas, the doors 61 and 62 leading to the low-temperature gas supply tank 3 are opened to the position shown by the two-dot chain line in FIG. 3, and the other doors 51, 52, 71 and 72 are all closed. The cooler 34 is continuously operated from the standby time, the fan 36 is driven, the low-temperature gas flows from the gas supply tank 3 through the vent hole 31 into the test tank 1, and further from the test tank through the vent hole 32. It returns to the tank 3, is cooled again in the tank 3, and is discharged to the test tank 1. Thus, the sample in the test chamber is exposed to a desired low temperature for a desired time.

この低温さらしの間、高温気体供給槽3では次の高温
さらしに備え直ちに所定の高温気体を供給できるように
準備運転される。また、常温気体供給槽4も準備運転さ
れる。
During this low-temperature exposure, the high-temperature gas supply tank 3 is preliminarily operated so as to immediately supply a predetermined high-temperature gas in preparation for the next high-temperature exposure. The normal temperature gas supply tank 4 is also prepared.

試料を常温気体にさらす時には、常温気体供給槽4に
通じる扉41および42が第1図に二点鎖線で示す位置まで
開かれ、他の扉51、52、61、62は閉じられる。熱交換器
43が待機時から引き続き運転され、ファン43が駆動さ
れ、常温さらしを行う所定温度の気体が通気孔41から試
験槽1へ吐出される。試験槽1内の気体は通気孔42から
槽4内へ吸い込まれ、熱交換器43によって所定温度に制
御され、再び試験槽1へ吐き出される。かくして試験槽
内試料は所望温度の常温気体に所望時間さらされる。
When the sample is exposed to the room temperature gas, the doors 41 and 42 leading to the room temperature gas supply tank 4 are opened to the position shown by the two-dot chain line in FIG. 1, and the other doors 51, 52, 61 and 62 are closed. Heat exchanger
The operation of the fan 43 is continued from the stand-by state, the fan 43 is driven, and a gas at a predetermined temperature for exposing to normal temperature is discharged from the vent 41 to the test tank 1. The gas in the test tank 1 is sucked into the tank 4 from the vent hole 42, controlled to a predetermined temperature by the heat exchanger 43, and discharged to the test tank 1 again. Thus, the sample in the test chamber is exposed to a normal temperature gas at a desired temperature for a desired time.

この常温さらしの間、高温気体供給槽2および低温気
体供給槽3は準備運転される。
During the exposure at room temperature, the high-temperature gas supply tank 2 and the low-temperature gas supply tank 3 are operated in preparation.

各さらし運転においては、空気導入パイプ5から乾燥
空気が試験槽1内へ導入されるとともに、試験槽内気体
の一部が排気ダクト6により試験槽外へ排出され、かく
して試験槽1内は外気圧より僅かに陽圧に保たれ、外気
の試験槽内への侵入が確実に防止される。この外気侵入
の防止と乾燥空気の導入によって、それだけ試験槽1内
はより水分の少ない良好な状態に保たれる。
In each exposure operation, dry air is introduced into the test tank 1 from the air introduction pipe 5, and a part of the gas in the test tank is discharged out of the test tank by the exhaust duct 6, and thus the inside of the test tank 1 is The pressure is kept slightly positive than the atmospheric pressure, and the intrusion of outside air into the test tank is reliably prevented. By preventing the invasion of the outside air and introducing the dry air, the inside of the test tank 1 is kept in a good condition with less moisture.

前記実施例によると、熱交換器43を有する常温気体供
給槽4が装備されているので、常温さらし温度の管理
(制御)が可能になり、従って、常温さらし試験状態が
外気温度に関係なく一定になり、試験状態の再現性が良
好となる。
According to the above-described embodiment, since the room temperature gas supply tank 4 having the heat exchanger 43 is provided, it is possible to manage (control) the room temperature exposure temperature, so that the room temperature exposure test state is constant regardless of the outside air temperature. And the reproducibility of the test state is improved.

また、常温さらしにおいて、試験槽1内へ外気を導入
しないため、外気中の水分が試験槽1内へ取り込まれる
ことがなく、それだけ試料の結露が少なく、温度以外の
外因が排除される。
In addition, since no outside air is introduced into the test tank 1 at the time of normal temperature exposure, moisture in the outside air is not taken into the test tank 1, so that the dew condensation of the sample is reduced accordingly, and external factors other than the temperature are eliminated.

さらに、各槽内への水分の侵入が少なく、そのため、
低温気体供給槽3内の氷結が少なくなり、連続サイクル
数が多くなる(デフロストのタイミングが長くなる)。
さらに、各通気孔の断熱扉におけるパッキン部に氷結が
少なくなり、パッキン当たりの間隙の発生による気体洩
れや、扉の動作不良が減少する。
Furthermore, the penetration of moisture into each tank is small,
Freezing in the low-temperature gas supply tank 3 is reduced, and the number of continuous cycles is increased (defrost timing is lengthened).
Furthermore, icing is reduced in the packing portion of the heat insulating door of each ventilation hole, and gas leakage due to generation of a gap per packing and malfunction of the door are reduced.

なお本発明は前記実施例に限定されるものではなく、
他にも様々の態様で実施することができる。
Note that the present invention is not limited to the above embodiment,
The present invention can be implemented in various other modes.

例えば前記実施例では各気体供給槽に気体循環用ファ
ンが設けられているが、これらのファンに代えて試験槽
1のいずれかの一端部(第1図上、右端部または左端
部)に各気体供給槽に対し共通のファン装置を設けてこ
れにより気体を試験槽1へ循環させてもよい。
For example, in the above-described embodiment, a gas circulation fan is provided in each gas supply tank, but instead of these fans, each of the test tanks 1 is provided at one end (the right end or the left end in FIG. 1). A common fan device may be provided for the gas supply tank so that the gas is circulated to the test tank 1.

また、各通気孔を開閉する扉は前記実施例のように回
動式ではなく、引戸式に直線動作するように設けられて
もよい。
Further, the door that opens and closes each of the ventilation holes may be provided so as to operate linearly in a sliding door type, instead of a rotating type as in the above embodiment.

前記実施例では高温気体供給槽2において、畜熱器23
とヒータ24は分離しているが、これを一体的な加熱畜熱
器に代えてもよい。
In the above embodiment, in the high-temperature gas supply tank 2,
Although the heater 24 and the heater 24 are separated from each other, this may be replaced with an integrated heating and heating device.

〔発明の効果〕〔The invention's effect〕

本発明冷熱サイクル装置は次の利点を有する。 The cooling / heating cycle device of the present invention has the following advantages.

常温気体供給槽を設けたので、常温さらしの温度を管
理(制御)することができ、それによって常温さらし試
験の温度精度を高温、低温さらし時と同等程度に向上さ
せることができる。
Since the normal temperature gas supply tank is provided, the temperature of the normal temperature exposure can be controlled (controlled), and thereby the temperature accuracy of the normal temperature exposure test can be improved to the same degree as the high temperature and low temperature exposure.

常温さらしにおいて、外部の水分を試験槽内に取り込
まないようにしたので、結露による外乱的要因を排除す
ることができ、それによって試験精度を向上させること
ができる。
During exposure at room temperature, external moisture is prevented from being taken into the test tank, so that disturbance factors due to dew condensation can be eliminated, thereby improving test accuracy.

常温さらしにおいて、外部の水分を試験槽内に取り込
まないようにしたので、装置への氷結、霜付等の悪条件
を排除することができ、また、それによって試験におけ
る連続サイクル数を多くできる。
Since the external moisture is prevented from being taken into the test tank during the normal temperature exposure, adverse conditions such as freezing and frosting on the apparatus can be eliminated, and the number of continuous cycles in the test can be increased.

試験槽に乾燥気体を導入する手段および排気手段を設
けるときには、試験槽内がそれだけ乾燥状態に保たれ、
水分による悪条件がそれだけ排除される。
When the means for introducing dry gas and the exhaust means are provided in the test tank, the inside of the test tank is kept so dry,
Adverse conditions due to moisture are thus eliminated.

【図面の簡単な説明】[Brief description of the drawings]

図面は本発明の一実施例を示すもので、第1図は正面側
から見た状態の全体概略断面図、第2図は第1図のX−
X線に沿う断面図、第3図は第1図のY−Y線に沿う断
面図である。 1……試験槽 2……高温気体供給槽 3……低温気体供給槽 4……常温気体供給槽 21、31、41……第1の通気孔 22、32、42……第2の通気孔 51、52、61、62、71、72……通気孔開閉扉 5……空気導入パイプ 6……排気ダクト
The drawings show an embodiment of the present invention. FIG. 1 is an overall schematic cross-sectional view as viewed from the front side, and FIG.
FIG. 3 is a sectional view taken along the line YY of FIG. 1. DESCRIPTION OF SYMBOLS 1 ... Test tank 2 ... High temperature gas supply tank 3 ... Low temperature gas supply tank 4 ... Normal temperature gas supply tank 21, 31, 41 ... First ventilation holes 22, 32, 42 ... 2nd ventilation holes 51, 52, 61, 62, 71, 72… Vent door 5… Air introduction pipe 6… Exhaust duct

───────────────────────────────────────────────────── フロントページの続き (72)発明者 辻子 嘉郎 大阪府大阪市北区天神橋3丁目5番6号 タバイエスペック株式会社内 (56)参考文献 特開 昭63−26547(JP,A) 特開 昭54−32386(JP,A) 特開 昭61−245219(JP,A) (58)調査した分野(Int.Cl.6,DB名) G01N 3/60 G01N 17/00 G01R 31/00 B01L 11/00──────────────────────────────────────────────────続 き Continuation of front page (72) Inventor Yoshiro Tsujiko 3-5-6 Tenjinbashi, Kita-ku, Osaka-shi, Osaka Inside Tabai Espec Co., Ltd. (56) References JP-A-63-26547 (JP, A) JP-A-63-26547 54-32386 (JP, A) JP-A-61-245219 (JP, A) (58) Fields investigated (Int. Cl. 6 , DB name) G01N 3/60 G01N 17/00 G01R 31/00 B01L 11 / 00

Claims (2)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】試験槽と、高温気体供給槽と、低温気体供
給槽と、常温気体供給槽と、前記試験槽と前記各気体供
給槽とを結ぶ第1の通気孔群と、前記試験槽と前記各気
体供給槽とを結び前記第1の通気孔群と対をなす第2の
通気孔群と、前記各通気孔を開閉するための扉とを備え
たことを特徴とする冷熱サイクル装置。
1. A test tank, a high-temperature gas supply tank, a low-temperature gas supply tank, a normal-temperature gas supply tank, a first group of ventilation holes connecting the test tank and each of the gas supply tanks, and the test tank And a second vent group that pairs the first vent group with the gas supply tanks, and a door for opening and closing the vents. .
【請求項2】前記試験槽に乾燥ガス導入手段を設けると
ともに該ガス導入手段による乾燥ガス導入により前記試
験槽内気体を該試験槽内が外気圧より僅かに陽圧に保た
れるように排出するための排気手段を設けたことを特徴
とする請求項1記載の冷熱サイクル装置。
2. The test tank is provided with a drying gas introducing means, and the gas in the test tank is discharged by the introduction of the drying gas by the gas introducing means so that the inside of the test tank is maintained at a slightly higher positive pressure than the outside pressure. 2. The cooling and heating cycle device according to claim 1, further comprising an exhaust means for performing the cooling operation.
JP23543089A 1989-09-11 1989-09-11 Cooling / heating cycle equipment Expired - Lifetime JP2786688B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP23543089A JP2786688B2 (en) 1989-09-11 1989-09-11 Cooling / heating cycle equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23543089A JP2786688B2 (en) 1989-09-11 1989-09-11 Cooling / heating cycle equipment

Publications (2)

Publication Number Publication Date
JPH0396831A JPH0396831A (en) 1991-04-22
JP2786688B2 true JP2786688B2 (en) 1998-08-13

Family

ID=16985993

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23543089A Expired - Lifetime JP2786688B2 (en) 1989-09-11 1989-09-11 Cooling / heating cycle equipment

Country Status (1)

Country Link
JP (1) JP2786688B2 (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010085365A (en) * 2008-10-02 2010-04-15 Espec Corp Environmental testing apparatus and coldness storage device
JP5291534B2 (en) * 2009-05-22 2013-09-18 エスペック株式会社 Environmental test equipment
JP5896555B2 (en) * 2012-02-22 2016-03-30 エスペック株式会社 Environmental test equipment
BR112014028297B1 (en) * 2012-05-15 2020-11-17 Cepheid apparatus and method of thermal cycling
JP5870339B2 (en) * 2014-04-23 2016-02-24 理想計測株式会社 Thermal shock test equipment
CN113791327B (en) * 2021-09-16 2024-08-06 广东蓝箭电子科技有限公司 Semiconductor device test equipment
JP2024010913A (en) * 2022-07-13 2024-01-25 エスペック株式会社 Environment test device
CN115307918B (en) * 2022-10-12 2023-03-24 天津航天瑞莱科技有限公司 Test run test system of pulse type engine

Also Published As

Publication number Publication date
JPH0396831A (en) 1991-04-22

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