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JP2018063407A - Method of processing bonded substrate - Google Patents

Method of processing bonded substrate Download PDF

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JP2018063407A
JP2018063407A JP2016203072A JP2016203072A JP2018063407A JP 2018063407 A JP2018063407 A JP 2018063407A JP 2016203072 A JP2016203072 A JP 2016203072A JP 2016203072 A JP2016203072 A JP 2016203072A JP 2018063407 A JP2018063407 A JP 2018063407A
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substrate
bonded
bonded substrate
holding table
laser beam
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ジェヨン イ
Jaeyoung Lee
ジェヨン イ
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Disco Corp
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Disco Abrasive Systems Ltd
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Priority to JP2016203072A priority Critical patent/JP2018063407A/en
Priority to KR1020170130282A priority patent/KR20180041588A/en
Priority to CN201710939218.7A priority patent/CN107953034A/en
Publication of JP2018063407A publication Critical patent/JP2018063407A/en
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/36Removing material
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/36Removing material
    • B23K26/38Removing material by boring or cutting
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/70Auxiliary operations or equipment
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/185Joining of semiconductor bodies for junction formation
    • H01L21/187Joining of semiconductor bodies for junction formation by direct bonding
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/76Making of isolation regions between components
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K2103/00Materials to be soldered, welded or cut
    • B23K2103/50Inorganic material, e.g. metals, not provided for in B23K2103/02 – B23K2103/26
    • B23K2103/56Inorganic material, e.g. metals, not provided for in B23K2103/02 – B23K2103/26 semiconducting

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Mechanical Engineering (AREA)
  • Plasma & Fusion (AREA)
  • Optics & Photonics (AREA)
  • Liquid Crystal (AREA)
  • Laser Beam Processing (AREA)
  • Dicing (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Re-Forming, After-Treatment, Cutting And Transporting Of Glass Products (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a method of efficiently processing a bonded substrate, which reduces the chances of damaging the bonded substrate.SOLUTION: A method of processing a bonded substrate includes; a mounting step for mounting a bonded substrate 11 on a support table 4 in such a way that a side of a second substrate 15 is exposed; and a laser processing step for irradiating a first laser beam L1 having a wavelength that transmits through the support table 4 and a first substrate 13 of the bonded substrate 11 mounted on the support table 4 along a planned division line from a side of the first substrate 13 through the support table 4 such that the beam is focused inside the first substrate 13, and irradiating a second laser beam L2 having a wavelength that transmits through the second substrate 15 of the bonded substrate 11 along the planned division line from the side of the second substrate 15 such that the beam is focused inside the second substrate 15.SELECTED DRAWING: Figure 1

Description

本発明は、複数の基板を貼り合わせてなる貼り合わせ基板の加工方法に関する。   The present invention relates to a method for processing a bonded substrate formed by bonding a plurality of substrates.

電子機器のモニター等に用いられる液晶表示装置は、液晶を駆動するためのTFT(Thin Film Transistor)が形成されたアレイ基板と、カラーフィルタが形成されたカラーフィルタ基板と、を貼り合わせてなる液晶パネルを備えている。アレイ基板とカラーフィルタ基板との間には、樹脂等で形成されるシール部材が設けられており、液晶は、このシール部材によって囲まれる領域に封入される。   A liquid crystal display device used for a monitor of an electronic device is a liquid crystal formed by bonding an array substrate on which TFT (Thin Film Transistor) for driving liquid crystal is formed and a color filter substrate on which a color filter is formed. Has a panel. A seal member made of resin or the like is provided between the array substrate and the color filter substrate, and the liquid crystal is sealed in a region surrounded by the seal member.

上述した液晶パネルは、例えば、複数のアレイ基板へと分割される第1マザー基板と、複数のカラーフィルタ基板へと分割される第2マザー基板と、をシール部材で貼り合わせた後に、貼り合わせ後の基板(以下、貼り合わせ基板)を所定の分割予定ラインに沿って分割することで得られる。貼り合わせ基板の分割には、通常、第1マザー基板と第2マザー基板とをスクライブ処理した後に圧力を加える方法等が採用される(例えば、特許文献1参照)。   The above-described liquid crystal panel is bonded, for example, after a first mother substrate divided into a plurality of array substrates and a second mother substrate divided into a plurality of color filter substrates are bonded together with a seal member. It is obtained by dividing the subsequent substrate (hereinafter referred to as a bonded substrate) along a predetermined division line. In order to divide the bonded substrate, a method of applying pressure after scribing the first mother substrate and the second mother substrate is generally employed (see, for example, Patent Document 1).

特開2015−114546号公報JP2015-114546A

しかしながら、上述の方法では、第1マザー基板と第2マザー基板との一方をスクライブ処理した後、他方をスクライブ処理するために、貼り合わせ基板の表裏を反転させる必要がある。そのため、作業の効率が悪く、また、反転の際に貼り合わせ基板が破損する可能性も高かった。   However, in the above-described method, it is necessary to reverse the front and back of the bonded substrate in order to scribe one of the first mother substrate and the second mother substrate and then scribe the other. For this reason, the efficiency of the work is poor, and there is a high possibility that the bonded substrate is damaged during the reversal.

本発明はかかる問題点に鑑みてなされたものであり、その目的とするところは、貼り合わせ基板が破損する可能性を低く抑えた効率の良い貼り合わせ基板の加工方法を提供することである。   The present invention has been made in view of such problems, and an object of the present invention is to provide an efficient method for processing a bonded substrate with a low possibility of the bonded substrate being damaged.

本発明の一態様によれば、第1基板と、該第1基板に貼り合わせられた第2基板と、を備え、複数の分割予定ラインが設定された貼り合わせ基板の加工方法であって、保持テーブル上に該貼り合わせ基板を載置して該第2基板側を露出させる載置ステップと、該保持テーブル上の該貼り合わせ基板が備える該第1基板と、該保持テーブルと、に対して透過性を有する波長の第1レーザービームを該第1基板の内部に集光させるように該保持テーブルを介して該第1基板側から該分割予定ラインに沿って照射するとともに、該貼り合わせ基板の該第2基板に対して透過性を有する波長の第2レーザービームを該第2基板の内部に集光させるように該第2基板側から該分割予定ラインに沿って照射するレーザー加工ステップと、を備える貼り合わせ基板の加工方法が提供される。   According to one aspect of the present invention, there is provided a processing method for a bonded substrate board including a first substrate and a second substrate bonded to the first substrate, wherein a plurality of division lines are set. A mounting step of placing the bonded substrate on a holding table to expose the second substrate side; the first substrate of the bonded substrate on the holding table; and the holding table The first laser beam having a wavelength having transparency is irradiated along the division line from the first substrate side via the holding table so as to be condensed inside the first substrate, and the bonding is performed. A laser processing step of irradiating a second laser beam having a wavelength transmissive to the second substrate along the division line from the second substrate side so that the second laser beam is condensed inside the second substrate. And laminating Method for processing a substrate is provided.

本発明の一態様において、該レーザー加工ステップを実施した後、該第1基板と該第2基板とを該分割予定ラインに沿って分割する分割ステップを更に備えることが好ましい。   In one aspect of the present invention, it is preferable that the method further includes a dividing step of dividing the first substrate and the second substrate along the planned dividing line after performing the laser processing step.

本発明の一態様に係る貼り合わせ基板の加工方法では、第2基板側が露出するように保持テーブルに貼り合わせ基板を載置した後、第1基板と保持テーブルとに対して透過性を有する波長の第1レーザービームを第1基板の内部に集光させるように保持テーブルを介して第1基板側から分割予定ラインに沿って照射し、また、第2基板に対して透過性を有する波長の第2レーザービームを第2基板の内部に集光させるように第2基板側から分割予定ラインに沿って照射するので、貼り合わせ基板の表裏を反転させることなく、第1基板と第2基板とを分割予定ラインに沿って加工できる。つまり、本発明の一態様によれば、貼り合わせ基板が破損する可能性を低く抑えた効率の良い貼り合わせ基板の加工方法を提供できる。   In the bonded substrate processing method according to one embodiment of the present invention, after the bonded substrate is placed on the holding table so that the second substrate side is exposed, the wavelength having transparency with respect to the first substrate and the holding table. The first laser beam is irradiated along the division line from the first substrate side through the holding table so as to be condensed inside the first substrate, and has a wavelength that is transmissive to the second substrate. Since the second laser beam is irradiated along the division line from the second substrate side so that the second laser beam is condensed inside the second substrate, the first substrate and the second substrate can be used without reversing the front and back of the bonded substrate. Can be processed along the division line. That is, according to one embodiment of the present invention, it is possible to provide an efficient method for processing a bonded substrate with a low possibility of the bonded substrate being damaged.

図1(A)は、載置ステップを説明するための断面図であり、図1(B)は、レーザー加工ステップを説明するための一部断面側面図であり、図1(C)は、分割ステップを説明するための断面図である。1A is a cross-sectional view for explaining the placing step, FIG. 1B is a partial cross-sectional side view for explaining the laser processing step, and FIG. It is sectional drawing for demonstrating a division | segmentation step. 図2(A)及び図2(B)は、変形例に係るレーザー加工ステップを説明するための一部断面側面図である。2A and 2B are partial cross-sectional side views for explaining a laser processing step according to a modification.

添付図面を参照して、本発明の一態様に係る実施形態について説明する。本実施形態に係る貼り合わせ基板の加工方法は、例えば、液晶パネル等の表示パネルを製造する際に用いられ、載置ステップ(図1(A)参照)、レーザー加工ステップ(図1(B)参照)、及び分割ステップ(図1(C)参照)を含む。   Embodiments according to one aspect of the present invention will be described with reference to the accompanying drawings. The bonded substrate processing method according to the present embodiment is used, for example, when manufacturing a display panel such as a liquid crystal panel, and includes a placement step (see FIG. 1A) and a laser processing step (FIG. 1B). And a dividing step (see FIG. 1C).

載置ステップでは、第1基板と、第1基板に貼り合わせられた第2基板と、を備える貼り合わせ基板の第2基板側が上方に露出するように、保持テーブルに貼り合わせ基板を載せる。すなわち、貼り合わせ基板の第1基板側を保持テーブルの上面側に向けた状態で、保持テーブルに貼り合わせ基板を載せる。   In the placing step, the bonded substrate is placed on the holding table so that the second substrate side of the bonded substrate including the first substrate and the second substrate bonded to the first substrate is exposed upward. That is, the bonded substrate is placed on the holding table with the first substrate side of the bonded substrate facing the upper surface of the holding table.

レーザー加工ステップでは、第1基板と保持テーブルとに対して透過性を有する波長の第1レーザービームを、保持テーブルを介して第1基板側から分割予定ラインに沿って照射し、第1基板の内部に集光させて、第1基板を改質する。また、第2基板に対して透過性を有する波長の第2レーザービームを、第2基板側から分割予定ラインに沿って照射し、第2基板の内部に集光させて、第2基板を改質する。   In the laser processing step, a first laser beam having a wavelength that is transmissive to the first substrate and the holding table is irradiated along the division line from the first substrate side through the holding table. The first substrate is modified by focusing the light inside. In addition, a second laser beam having a wavelength that is transmissive to the second substrate is irradiated from the second substrate side along the planned dividing line, and is condensed inside the second substrate to modify the second substrate. Quality.

分割ステップでは、第1基板と第2基板とに力を加え、改質された分割予定ラインに沿って貼り合わせ基板を分割する。以下、本実施形態に係る貼り合わせ基板の加工方法について詳述する。   In the dividing step, a force is applied to the first substrate and the second substrate, and the bonded substrate is divided along the modified dividing line. Hereinafter, the processing method of the bonded substrate board concerning this embodiment is explained in full detail.

本実施形態に係る貼り合わせ基板の加工方法では、まず、保持テーブル上に貼り合わせ基板を載せる載置ステップを行う。図1(A)は、載置ステップを説明するための断面図である。図1(A)に示すように、本実施形態で加工される貼り合わせ基板11は、第1基板(第1マザー基板)13と第2基板(第2マザー基板)15とを含んでいる。   In the bonded substrate processing method according to the present embodiment, first, a mounting step of placing the bonded substrate on the holding table is performed. FIG. 1A is a cross-sectional view for explaining the placing step. As shown in FIG. 1A, a bonded substrate 11 processed in this embodiment includes a first substrate (first mother substrate) 13 and a second substrate (second mother substrate) 15.

第1基板13は、例えば、ソーダライムガラス、無アルカリガラス、石英ガラス等の材料で平板状に形成されており、可視光に対して概ね透明である。この第1基板13の第1面(表面)13aには、液晶に電圧を加えるためのTFT(Thin Film Transistor)や画素電極、配線等を含む第1機能層17が設けられている。なお、第1機能層17の構成や形成方法等に特段の制限はない。   The 1st board | substrate 13 is formed in flat form with materials, such as soda-lime glass, an alkali free glass, quartz glass, for example, and is substantially transparent with respect to visible light. On the first surface (front surface) 13a of the first substrate 13, a first functional layer 17 including a TFT (Thin Film Transistor) for applying a voltage to the liquid crystal, a pixel electrode, wiring, and the like is provided. In addition, there is no special restriction | limiting in the structure of the 1st functional layer 17, a formation method, etc.

第2基板15も、第1基板13と同様に構成される。すなわち、第2基板15は、ソーダライムガラス、無アルカリガラス、石英ガラス等の材料で平板状に形成され、可視光に対して概ね透明である。ただし、第1基板13と第2基板15とが同じである必要はない。この第2基板15の第1面(表面)15aには、バックライト(不図示)から放射される任意の波長の光を選択的に透過させるカラーフィルタ等を含む第2機能層19が設けられている。第2機能層19の構成や形成方法等にも特段の制限はない。   The second substrate 15 is configured similarly to the first substrate 13. That is, the 2nd board | substrate 15 is formed in flat form with materials, such as soda-lime glass, an alkali free glass, and quartz glass, and is substantially transparent with respect to visible light. However, the first substrate 13 and the second substrate 15 do not have to be the same. The first surface (front surface) 15a of the second substrate 15 is provided with a second functional layer 19 including a color filter that selectively transmits light having an arbitrary wavelength emitted from a backlight (not shown). ing. There are no particular restrictions on the configuration or formation method of the second functional layer 19.

第1基板13の第1面13a側と、第2基板15の第1面15a側とは、樹脂等でなるシール部材21を介して貼り合わせられている。シール部材21は、所定の厚みを有し、第1基板13の第1面13a側と、第2基板15の第1面15a側との間には、隙間が形成されている。第1基板13、第2基板15、及びシール部材21で囲まれる隙間23には、例えば、液晶が封入される。この貼り合わせ基板11には、貼り合わせ基板11を複数の表示パネル等へと分割するための分割予定ライン11aが設定されている。   The first surface 13a side of the first substrate 13 and the first surface 15a side of the second substrate 15 are bonded together via a seal member 21 made of resin or the like. The seal member 21 has a predetermined thickness, and a gap is formed between the first surface 13 a side of the first substrate 13 and the first surface 15 a side of the second substrate 15. For example, liquid crystal is sealed in the gap 23 surrounded by the first substrate 13, the second substrate 15, and the seal member 21. In the bonded substrate 11, a division line 11 a for dividing the bonded substrate 11 into a plurality of display panels and the like is set.

載置ステップは、例えば、図1(A)に示すレーザー加工装置2で行われる。レーザー加工装置2は、貼り合わせ基板11を吸引、保持するための保持テーブル4を備えている。保持テーブル4は、例えば、第1基板13と同様の材質で、貼り合わせ基板11の全体を支持できる大きさに形成される。   The placing step is performed by, for example, the laser processing apparatus 2 shown in FIG. The laser processing apparatus 2 includes a holding table 4 for sucking and holding the bonded substrate 11. For example, the holding table 4 is formed of the same material as the first substrate 13 and has a size capable of supporting the entire bonded substrate 11.

この保持テーブル4は、例えば、モータ等の回転駆動源(不図示)に連結されており、鉛直方向に概ね平行な回転軸の周りに回転する。また、保持テーブル4の下方には、移動機構(不図示)が設けられており、保持テーブル4は、この移動機構によって水平方向に移動する。   The holding table 4 is connected to a rotation drive source (not shown) such as a motor, and rotates around a rotation axis substantially parallel to the vertical direction. Further, a moving mechanism (not shown) is provided below the holding table 4, and the holding table 4 is moved in the horizontal direction by the moving mechanism.

保持テーブル4の上面の一部は、貼り合わせ基板11を保持する保持面4aとなっている。保持面4aの一部(例えば、端の一部)には、例えば、開口(不図示)が形成されており、この開口は、保持テーブル4の内部に設けられた吸引路(不図示)等を通じて吸引源(不図示)に接続されている。貼り合わせ基板11を保持面4a載せ、吸引源の負圧を開口に作用させれば、保持テーブル4で貼り合わせ基板11を吸引、保持できる。   A part of the upper surface of the holding table 4 serves as a holding surface 4 a that holds the bonded substrate 11. For example, an opening (not shown) is formed in a part (for example, a part of the end) of the holding surface 4a, and this opening is a suction path (not shown) provided inside the holding table 4 or the like. Through a suction source (not shown). The bonded substrate 11 can be sucked and held by the holding table 4 when the bonded substrate 11 is placed on the holding surface 4a and the negative pressure of the suction source is applied to the opening.

載置ステップでは、貼り合わせ基板11を構成する第1基板13の第2面(裏面)13b側を保持テーブル4の保持面4aに接触させて、吸引源の負圧を作用させる。これにより、貼り合わせ基板11は、第2基板15の第2面(裏面)15b側が上方に露出した状態で保持テーブル4に保持される。   In the mounting step, the second surface (back surface) 13b side of the first substrate 13 constituting the bonded substrate 11 is brought into contact with the holding surface 4a of the holding table 4 to apply a negative pressure of the suction source. Thereby, the bonded substrate 11 is held by the holding table 4 with the second surface (back surface) 15b side of the second substrate 15 exposed upward.

載置ステップの後には、レーザービームを照射して貼り合わせ基板11を加工するレーザー加工ステップを行う。図1(B)は、レーザー加工ステップを説明するための一部断面側面図である。レーザー加工ステップは、引き続きレーザー加工装置2で行われる。   After the mounting step, a laser processing step for processing the bonded substrate 11 by irradiating a laser beam is performed. FIG. 1B is a partial cross-sectional side view for explaining the laser processing step. The laser processing step is subsequently performed by the laser processing apparatus 2.

図1(B)に示すように、保持テーブル4の下方には、第1レーザー照射ユニット6が配置されている。また、保持テーブル4の上方の第1レーザー照射ユニット6に対応する位置には、第2レーザー照射ユニット8が配置されている。   As shown in FIG. 1B, a first laser irradiation unit 6 is disposed below the holding table 4. A second laser irradiation unit 8 is disposed at a position corresponding to the first laser irradiation unit 6 above the holding table 4.

第1レーザー照射ユニット6は、集光用の第1レンズ(不図示)を備えており、第1レーザー発振器(不図示)でパルス発振された第1レーザービームL1を所定の位置に照射、集光する。また、第2レーザー照射ユニット8は、集光用の第2レンズ(不図示)を備えており、第2レーザー発振器(不図示)でパルス発振された第2レーザービームL2を所定の位置に照射、集光する。   The first laser irradiation unit 6 includes a first lens (not shown) for condensing, and irradiates and collects a first laser beam L1 pulsed by a first laser oscillator (not shown) at a predetermined position. Shine. The second laser irradiation unit 8 includes a second lens (not shown) for condensing, and irradiates a predetermined position with a second laser beam L2 pulsed by a second laser oscillator (not shown). Condensate.

第1レーザー発振器は、保持テーブル4及び第1基板13に対して透過性を有する波長(吸収され難い波長)の第1レーザービームL1をパルス発振できるように構成されている。また、第2レーザー発振器は、第2基板15に対して透過性を有する波長(吸収され難い波長)の第2レーザービームL2をパルス発振できるように構成されている。   The first laser oscillator is configured so as to be able to pulse-oscillate the first laser beam L1 having a wavelength that is transmissive to the holding table 4 and the first substrate 13 (wavelength that is difficult to be absorbed). Further, the second laser oscillator is configured to be able to pulse-oscillate the second laser beam L2 having a wavelength that is transmissive to the second substrate 15 (wavelength that is difficult to be absorbed).

レーザー加工ステップでは、まず、保持テーブル4を移動、回転させて、例えば、対象となる分割予定ライン11aの延長線に第1レーザー照射ユニット6及び第2レーザー照射ユニット8の位置を合わせる。そして、第1レーザー照射ユニット6及び第2レーザー照射ユニット8から第1レーザービームL1及び第2レーザービームL2を照射しながら、対象の分割予定ライン11aに対して平行な方向に保持テーブル4を移動させる。   In the laser processing step, first, the holding table 4 is moved and rotated, and the positions of the first laser irradiation unit 6 and the second laser irradiation unit 8 are aligned with, for example, an extension line of the target division planned line 11a. The holding table 4 is moved in a direction parallel to the target division line 11a while irradiating the first laser beam L1 and the second laser beam L2 from the first laser irradiation unit 6 and the second laser irradiation unit 8. Let

より詳細には、第1レーザービームL1を、保持テーブル4を介して第1基板13側から分割予定ライン11aに沿って照射し、第1基板13の内部に集光させる。第1レーザー照射ユニット6の集光用のレンズとしては、例えば、開口数(NA)が0.8前後のものを用いる。このように、第1基板13に対して透過性を有する波長の第1レーザービームL1を、第1基板13の内部に集光させることで、図1(B)に示すように、第1基板13の内部を改質して分割の起点となる第1改質層25aを形成できる。   More specifically, the first laser beam L1 is irradiated from the first substrate 13 side along the planned division line 11a via the holding table 4 and is condensed inside the first substrate 13. As the condensing lens of the first laser irradiation unit 6, for example, a lens having a numerical aperture (NA) of about 0.8 is used. In this way, by condensing the first laser beam L1 having a wavelength that is transmissive to the first substrate 13 inside the first substrate 13, as shown in FIG. The inside of 13 can be modified to form the first modified layer 25a that becomes the starting point of the division.

同様に、第2レーザービームL2を、第2基板15側から分割予定ライン11aに沿って照射し、第2基板15の内部に集光させる。第2レーザー照射ユニット8の集光用のレンズとしては、例えば、開口数(NA)が0.8前後のものを用いる。このように、第2基板15に対して透過性を有する波長の第2レーザービームL2を、第2基板15の内部に集光させることで、図1(B)に示すように、第2基板15の内部を改質して分割の起点となる第2改質層25bを形成できる。   Similarly, the second laser beam L <b> 2 is irradiated from the second substrate 15 side along the planned division line 11 a and is condensed inside the second substrate 15. As the condensing lens of the second laser irradiation unit 8, for example, a lens having a numerical aperture (NA) of about 0.8 is used. In this way, by condensing the second laser beam L2 having a wavelength transmissive to the second substrate 15 inside the second substrate 15, as shown in FIG. The inside of 15 can be modified to form the second modified layer 25b serving as the starting point of the division.

上述のような動作を繰り返し、全ての分割予定ライン11aに沿って第1改質層25a及び第2改質層25bが形成されると、レーザー加工ステップは終了する。なお、各分割予定ライン11aに対して、異なる深さの位置に複数の第1改質層25a及び第2改質層25bを形成しても良い。   When the operation as described above is repeated and the first modified layer 25a and the second modified layer 25b are formed along all the planned division lines 11a, the laser processing step ends. Note that a plurality of first modified layers 25a and second modified layers 25b may be formed at different depth positions with respect to each planned division line 11a.

レーザー加工ステップの後には、第1基板13と第2基板15とに力を加え、第1改質層25aと第2改質層25bとが形成された分割予定ライン11aに沿って貼り合わせ基板11を分割する分割ステップを行う。図1(C)は、分割ステップを説明するための断面図である。分割ステップは、任意の分割装置(不図示)を用いて行われる。   After the laser processing step, a force is applied to the first substrate 13 and the second substrate 15, and the bonded substrate is formed along the planned division line 11a in which the first modified layer 25a and the second modified layer 25b are formed. A dividing step for dividing 11 is performed. FIG. 1C is a cross-sectional view for explaining the dividing step. The dividing step is performed using an arbitrary dividing device (not shown).

例えば、ローラー等の部材で貼り合わせ基板11を加圧すれば、第1改質層25aと第2改質層25bとを分割の起点として、貼り合わせ基板11を分割予定ライン11aに沿って複数のパネル31へと分割できる。全ての分割予定ライン11aに沿って貼り合わせ基板11が分割されると、分割ステップは終了する。   For example, if the bonded substrate 11 is pressurized with a member such as a roller, a plurality of bonded substrates 11 are divided along the planned dividing line 11a using the first modified layer 25a and the second modified layer 25b as starting points for the division. The panel 31 can be divided. When the bonded substrate board 11 is divided along all the planned division lines 11a, the division step ends.

以上のように、本実施形態に係る貼り合わせ基板の加工方法では、第2基板15側が露出するように保持テーブル4に貼り合わせ基板11を載置した後、第1基板13と保持テーブル4とに対して透過性を有する波長の第1レーザービームL1を第1基板13の内部に集光させるように保持テーブル4を介して第1基板13側から分割予定ライン11aに沿って照射し、また、第2基板15に対して透過性を有する波長の第2レーザービームL2を第2基板15の内部に集光させるように第2基板15側から分割予定ライン11aに沿って照射するので、貼り合わせ基板11の表裏を反転させることなく、第1基板13と第2基板15とを分割予定ライン11aに沿って分割できる。   As described above, in the bonded substrate processing method according to the present embodiment, after the bonded substrate 11 is placed on the holding table 4 so that the second substrate 15 side is exposed, the first substrate 13, the holding table 4, The first laser beam L1 having a wavelength that is transparent to the first substrate 13 is irradiated along the planned division line 11a from the first substrate 13 side via the holding table 4 so as to be condensed inside the first substrate 13. Since the second laser beam L2 having a wavelength transmissive to the second substrate 15 is irradiated along the division line 11a from the second substrate 15 side so as to be condensed inside the second substrate 15, the pasting is performed. The first substrate 13 and the second substrate 15 can be divided along the planned division line 11a without inverting the front and back of the laminated substrate 11.

つまり、表裏の反転に起因して貼り合わせ基板11が破損してしまうことはないので、貼り合わせ基板11が破損する可能性を低く抑えられる。また、貼り合わせ基板11の表裏を反転させる必要がないので、反転が必要な場合に比べて貼り合わせ基板11を効率良く分割できる。   That is, since the bonded substrate 11 is not damaged due to the reverse of the front and back, the possibility that the bonded substrate 11 is damaged can be kept low. Moreover, since it is not necessary to reverse the front and back of the bonded substrate 11, the bonded substrate 11 can be divided | segmented efficiently compared with the case where a reverse is required.

更に、第1基板13と第2基板15とに対して、第1レーザービームL1と第2レーザービームL2とを同様のタイミングで照射することで、第1改質層25aと第2改質層25bとを同様のタイミングでまとめて形成できる。よって、第1基板13と第2基板15とを順にスクライブ処理する場合等に比べて、貼り合わせ基板11を効率良く分割できる。   Furthermore, the first modified layer 25a and the second modified layer are irradiated to the first substrate 13 and the second substrate 15 with the first laser beam L1 and the second laser beam L2 at the same timing. 25b can be formed together at the same timing. Therefore, the bonded substrate 11 can be divided more efficiently than in the case where the first substrate 13 and the second substrate 15 are sequentially scribed.

なお、本発明は、上記実施形態の記載に制限されず種々変更して実施可能である。例えば、貼り合わせ基板11には、分割予定ライン11aとは別の分割予定ラインが設定されても良い。図2(A)及び図2(B)は、変形例に係るレーザー加工ステップを説明するための一部断面側面図である。   In addition, this invention is not restrict | limited to description of the said embodiment, A various change can be implemented. For example, the bonded substrate 11 may be set with a division schedule line different from the division schedule line 11a. 2A and 2B are partial cross-sectional side views for explaining a laser processing step according to a modification.

変形例に係る貼り合わせ基板11には、図2(A)及び図2(B)に示すように、分割予定ライン11aとは別の分割予定ライン11bが設定されている。この分割予定ライン11bは、例えば、第1基板13の第1面13a側の一部の領域を露出させることができるように、第2基板15にのみ設定される。   As shown in FIGS. 2A and 2B, the bonded substrate 11 according to the modified example is set with a planned division line 11b different from the planned division line 11a. The division line 11b is set only on the second substrate 15 so that, for example, a partial region on the first surface 13a side of the first substrate 13 can be exposed.

変形例に係るレーザー加工ステップでは、例えば、図2(A)に示すように、対象の分割予定ライン11aに沿って第1レーザービームL1と第2レーザービームL2とを照射し、第1改質層25aと第2改質層25bとを形成する。第1改質層25aと第2改質層25bとを形成する手順等は、上記実施形態と同じである。   In the laser processing step according to the modification, for example, as shown in FIG. 2 (A), the first laser beam L1 and the second laser beam L2 are irradiated along the target division planned line 11a to perform the first modification. The layer 25a and the second modified layer 25b are formed. The procedure for forming the first modified layer 25a and the second modified layer 25b is the same as that in the above embodiment.

対象の分割予定ライン11aに沿って第1改質層25aと第2改質層25bとを形成した後には、保持テーブル4を移動、回転させて、例えば、対象の分割予定ライン11aに隣接する分割予定ライン11bの延長線に第1レーザー照射ユニット6及び第2レーザー照射ユニット8の位置を合わせる。そして、第2レーザー照射ユニット8から第2レーザービームL2を照射しながら、この分割予定ライン11bに対して平行な方向に保持テーブル4を移動させる。   After the first modified layer 25a and the second modified layer 25b are formed along the target division line 11a, the holding table 4 is moved and rotated, for example, adjacent to the target division line 11a. The positions of the first laser irradiation unit 6 and the second laser irradiation unit 8 are aligned with the extension line of the division line 11b. Then, the holding table 4 is moved in a direction parallel to the scheduled division line 11b while irradiating the second laser beam L2 from the second laser irradiation unit 8.

このとき、第1レーザー照射ユニット6から第1レーザービームL1を照射しない。これにより、図2(B)に示すように、分割予定ライン11bに沿って第2基板15の内部を改質し、分割の起点となる第3改質層25cを形成できる。この分割予定ライン11bに沿って第3改質層25cを形成した後には、隣接する分割予定ライン11aに沿って、更に第1改質層25aと第2改質層25bとを形成する。   At this time, the first laser beam L1 is not irradiated from the first laser irradiation unit 6. As a result, as shown in FIG. 2B, the inside of the second substrate 15 can be modified along the planned division line 11b, and the third modified layer 25c serving as the starting point of the division can be formed. After the third modified layer 25c is formed along the planned division line 11b, the first modified layer 25a and the second modified layer 25b are further formed along the adjacent planned division line 11a.

上述のような動作を繰り返し、全ての分割予定ライン11aに沿って第1改質層25a及び第2改質層25bが形成され、全ての分割予定ライン11bに沿って第3改質層25cが形成されると、レーザー加工ステップは終了する。なお、各分割予定ライン11aに対して、異なる深さの位置に複数の第1改質層25a及び第2改質層25bを形成しても良い。また、各分割予定ライン11bに対して、異なる深さの位置に複数の第3改質層25cを形成しても良い。   By repeating the above operation, the first modified layer 25a and the second modified layer 25b are formed along all the planned division lines 11a, and the third modified layer 25c is formed along all the planned division lines 11b. Once formed, the laser processing step ends. Note that a plurality of first modified layers 25a and second modified layers 25b may be formed at different depth positions with respect to each planned division line 11a. In addition, a plurality of third modified layers 25c may be formed at different depth positions with respect to each scheduled division line 11b.

また、上記変形例では、第1改質層25a及び第2改質層25bを先に形成しているが、第3改質層25cを先に形成しても良い。また、全ての分割予定ライン11aに沿って第1改質層25a及び第2改質層25bを形成した後に、各分割予定ライン11bに沿って第3改質層25cを形成しても良い。同様に、全ての分割予定ライン11bに沿って第3改質層25cを形成した後に、各分割予定ライン11aに沿って第1改質層25a及び第2改質層25bを形成しても良い。   In the modification, the first modified layer 25a and the second modified layer 25b are formed first, but the third modified layer 25c may be formed first. Alternatively, after the first modified layer 25a and the second modified layer 25b are formed along all the planned division lines 11a, the third modified layer 25c may be formed along each planned division line 11b. Similarly, the first modified layer 25a and the second modified layer 25b may be formed along each planned division line 11a after the third modified layer 25c is formed along all the planned divided lines 11b. .

また、上記実施形態等では、第2基板15側が上方に露出するように貼り合わせ基板11を保持テーブル4に載せているが、第1基板13側が上方に露出するように貼り合わせ基板11を保持テーブル4に載せても良い。第1基板13と第2基板15、第1機能層17と第1機能層19等の区別は便宜的なものに過ぎず、これらの関係は任意に入れ替えることができる。   In the above-described embodiment and the like, the bonded substrate 11 is placed on the holding table 4 so that the second substrate 15 side is exposed upward, but the bonded substrate 11 is held so that the first substrate 13 side is exposed upward. It may be placed on the table 4. The distinction between the first substrate 13 and the second substrate 15, the first functional layer 17 and the first functional layer 19 and the like is merely for convenience, and these relationships can be arbitrarily changed.

また、例えば、上記実施形態のレーザー加工ステップ等では、分割予定ライン11aに沿って第1改質層25aと第2改質層25bとを形成している(変形例では、更に、分割予定ライン11bに沿って第3改質層25cを形成している)が、細孔と、この細孔を囲む非晶質領域とで構成されるシールドトンネル等と呼ばれる構造を分割予定ライン11aに沿って形成しても良い。この場合の基本的な手順等は、上記実施形態等と同じである。   Further, for example, in the laser processing step or the like of the above embodiment, the first modified layer 25a and the second modified layer 25b are formed along the planned division line 11a (in the modified example, the further planned division line is further formed). The third modified layer 25c is formed along the line 11b), but a structure called a shield tunnel or the like composed of the pores and the amorphous region surrounding the pores is formed along the division line 11a. It may be formed. The basic procedure in this case is the same as in the above embodiment.

ただし、この場合には、第1レーザー照射ユニット6の集光用のレンズとして、開口数(NA)を第1基板13の屈折率で割った値が0.05〜0.2となるようなものを用いる。同様に、第2レーザー照射ユニット8の集光用のレンズとして、開口数(NA)を第2基板15の屈折率で割った値が0.05〜0.2となるようなものを用いる。これにより、貼り合わせ基板11の分割予定ライン11a(分割予定ライン11b)に沿ってシールドトンネル等と呼ばれる構造を形成できる。   However, in this case, as a condensing lens of the first laser irradiation unit 6, a value obtained by dividing the numerical aperture (NA) by the refractive index of the first substrate 13 is 0.05 to 0.2. Use things. Similarly, as the condensing lens of the second laser irradiation unit 8, a lens whose numerical value (NA) divided by the refractive index of the second substrate 15 is 0.05 to 0.2 is used. Thereby, a structure called a shield tunnel or the like can be formed along the planned division line 11a (division planned line 11b) of the bonded substrate 11.

また、上記実施形態等では、保持テーブル4を移動させることで貼り合わせ基板11を加工しているが、第1レーザー照射ユニット6や第2レーザー照射ユニット8等を移動させることで貼り合わせ基板11を加工しても良い。   In the above-described embodiment and the like, the bonded substrate 11 is processed by moving the holding table 4, but the bonded substrate 11 is moved by moving the first laser irradiation unit 6, the second laser irradiation unit 8, and the like. May be processed.

その他、上記実施形態に係る構造、方法等は、本発明の目的の範囲を逸脱しない限りにおいて適宜変更して実施できる。   In addition, the structure, method, and the like according to the above-described embodiment can be appropriately modified and implemented without departing from the scope of the object of the present invention.

11 貼り合わせ基板
13 第1基板(第1マザー基板)
13a 第1面(表面)
13b 第2面(裏面)
15 第2基板(第2マザー基板)
15a 第1面(表面)
15b 第2面(裏面)
17 第1機能層
19 第2機能層
21 シール部材
23 隙間
25a 第1改質層
25b 第2改質層
25c 第3改質層
L1 第1レーザービーム
L2 第2レーザービーム
2 レーザー加工装置
4 保持テーブル
4a 保持面
6 第1レーザー照射ユニット
8 第2レーザー照射ユニット
11 Bonded substrate 13 First substrate (first mother substrate)
13a 1st surface (surface)
13b Second side (back side)
15 Second substrate (second mother substrate)
15a 1st surface (surface)
15b Second side (back side)
Reference Signs List 17 first functional layer 19 second functional layer 21 seal member 23 gap 25a first modified layer 25b second modified layer 25c third modified layer L1 first laser beam L2 second laser beam 2 laser processing device 4 holding table 4a Holding surface 6 First laser irradiation unit 8 Second laser irradiation unit

Claims (2)

第1基板と、該第1基板に貼り合わせられた第2基板と、を備え、複数の分割予定ラインが設定された貼り合わせ基板の加工方法であって、
保持テーブル上に該貼り合わせ基板を載置して該第2基板側を露出させる載置ステップと、
該保持テーブル上の該貼り合わせ基板が備える該第1基板と、該保持テーブルと、に対して透過性を有する波長の第1レーザービームを該第1基板の内部に集光させるように該保持テーブルを介して該第1基板側から該分割予定ラインに沿って照射するとともに、該貼り合わせ基板の該第2基板に対して透過性を有する波長の第2レーザービームを該第2基板の内部に集光させるように該第2基板側から該分割予定ラインに沿って照射するレーザー加工ステップと、を備えることを特徴とする貼り合わせ基板の加工方法。
A bonded substrate processing method comprising a first substrate and a second substrate bonded to the first substrate, wherein a plurality of division lines are set,
A placing step of placing the bonded substrate on a holding table to expose the second substrate side;
The holding is performed so that a first laser beam having a wavelength that is transmissive to the first substrate included in the bonded substrate on the holding table and the holding table is condensed inside the first substrate. Irradiation is performed along the division line from the first substrate side through a table, and a second laser beam having a wavelength that is transparent to the second substrate of the bonded substrate is applied to the inside of the second substrate. And a laser processing step of irradiating along the division line from the second substrate side so as to collect light.
該レーザー加工ステップを実施した後、該第1基板と該第2基板とを該分割予定ラインに沿って分割する分割ステップを更に備えることを特徴とする請求項1に記載の貼り合わせ基板の加工方法。   The bonded substrate processing according to claim 1, further comprising a dividing step of dividing the first substrate and the second substrate along the scheduled dividing line after performing the laser processing step. Method.
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