JP2016170082A - Component inspection device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a component inspection device capable of maintaining conditions for capturing good images of components.SOLUTION: An inspection device 1 is held to face a component 10 such that a penetrating direction of through-holes coincides with a direction lateral (perpendicular) to the direction of gravity. A light source for illumination 5 is provided on one side in a direction lateral to the component 10 to irradiate the through-holes with light, and the light passing through the through-holes of the component 10 is captured by a camera 6 located on the opposite side. The inspection device 1 uses captured image data to analyze area of sections where light passes through in a region with the through-holes, and determines that the component is defect-free when the area is no less than a reference value and that the component is defective when the area is less than the reference value.SELECTED DRAWING: Figure 1

Description

  The present invention relates to a component inspection apparatus, for example, to an apparatus for inspecting a through-hole processed into a component.

Conventionally, when the processing state of a workpiece is confirmed by an image, for example, the workpiece is placed on a table or an endless belt, light is irradiated from below the workpiece, and transmitted light is photographed from above the workpiece.
For example, when inspecting a machine part in which a through hole is formed as a workpiece, it is possible to detect defects such as clogging by chips, generation of burrs, and remaining broken blades by light passing through the through hole.
As a technique for irradiating light from the lower side of the workpiece and photographing from the upper side of the workpiece as described above, there is an “internal inspection device for a workpiece having a laminated structure” in Patent Document 1.
In this technique, light is irradiated from under the wafer and photographed from above the wafer to determine whether or not foreign matter inside the wafer or contamination is necessary.

JP 2014-126436 A

However, when light is irradiated from under the workpiece, there is a possibility that foreign matters such as chips and dust fall and adhere to the light irradiation portion.
If foreign matter falls or adheres to the irradiated area in this way, the amount of light emitted decreases, which may reduce the image quality of the captured image and cause false detection, and maintain a good shooting state of the parts. It was difficult to do.
In general, a cover glass is provided to protect the light of the irradiating unit. However, since the work moves on the cover glass while applying its own weight, the cover glass is easily damaged. When the cover glass is damaged, the amount of light to be irradiated is reduced, and it is difficult to maintain a good photographing state of the parts.
Accordingly, the present invention has been made in view of the above problems, and an object thereof is to provide a component inspection apparatus that maintains a good photographing state of components.

(1) In the first aspect of the present invention, the support portion that supports the component so that the through direction of the through hole processed into the component is different from the direction of gravity, and one side of the through hole An imaging unit that captures light passing through the through-hole, a determination unit that determines whether there is a defect in the through-hole based on the captured image, and an output unit that outputs a determination result by the determination unit The component inspection apparatus characterized by comprising.
(2) In the invention described in claim 2, the component inspection apparatus according to claim 1, wherein the support unit stops the component at a predetermined position when the imaging unit performs imaging. I will provide a.
(3) In the invention according to claim 3, the support portion includes an inclined path that is lowered by its own weight while maintaining the direction of the component, and the lowered component is brought into contact with a predetermined member and stopped. The component inspection apparatus according to claim 2, wherein the component inspection apparatus is stopped at a predetermined position in a predetermined direction.
(4) In the invention according to claim 4, the determination unit determines that there is no defect when the area of the portion through which the light passes is equal to or larger than a predetermined reference area, and is less than the predetermined reference area. The component inspection apparatus according to claim 1, wherein the component inspection apparatus is determined to have a defect.
(5) The invention according to claim 5, further comprising an illumination unit that illuminates the component from the other side of the through hole. A component inspection apparatus according to the claim is provided.
(6) The invention according to claim 6 is characterized in that a plurality of through holes are formed in the component, and the determination unit determines the presence or absence of a defect for each of the plurality of through holes. A component inspection apparatus according to any one of claims 1 to 5 is provided.

  According to the present invention, since the photographing system is set in a direction different from the gravity and the fall of the foreign matter from the part is avoided, the good photographing state of the part can be maintained.

It is a figure for demonstrating the structure of an inspection apparatus. And FIG. 20 is a diagram for explaining a configuration of a computer and the like. It is a flowchart for demonstrating the procedure of an inspection process.

(1) Outline of Embodiment The inspection apparatus 1 (FIG. 1) holds the component 10 so that the penetrating direction of the through-hole is in a lateral direction (perpendicular direction) with respect to the direction of gravity. And the light source by the illumination 5 is provided in one of the horizontal directions of the component 10, light is irradiated to a through-hole, and the light which passes the through-hole of the component 10 is image | photographed with the camera 6 installed in the opposing side.
The inspection apparatus 1 analyzes the area of the portion through which light passes in the region where the through-hole is formed from the captured image data. If the area is equal to or larger than a predetermined reference area, there is no defect and the area is less than the reference area. In some cases, it is determined that there is a defect.

  Thus, since the illumination 5 and the camera 6 are installed laterally with respect to the component 10, chips and dust can be prevented from falling on the illumination 5 and the camera 6, and the light irradiated to the component 10. The amount of light and the quality of the image to be taken can be maintained in a good state. Thereby, generation | occurrence | production of a misdetection can be suppressed.

(2) Details of Embodiments Each drawing of FIG. 1 is a diagram for explaining a configuration of an inspection apparatus.
As shown to Fig.1 (a), the inspection apparatus 1 is comprised from the conveyance rail 2, the illumination 5, the camera 6, the computer 7, etc.
The part 10 (workpiece) to be inspected is, for example, a disk-shaped machine part, and is formed of metal, resin, or the like. The component 10 has a plurality of through holes (through holes) formed in the thickness direction by a machining center or the like.

The transport rail 2 is a member in which a transport path for transporting the component 10 is formed in the inside longitudinal direction, and the longitudinal direction is installed with a predetermined angle with respect to a horizontal plane.
Further, the posture of the component 10 is defined by the conveyance path, and the component 10 maintains a posture in which the through direction of the through hole is horizontal (that is, in a state where the outer diameter direction of the component 10 is set up). The conveyance path in the conveyance rail 2 descends from the high side to the low side by its own weight.

In the middle of the transport path, the positioning pin 3 can be inserted in a direction blocking the transport path from a through hole formed at the bottom of the transport path, and the positioning pin 3 is placed below the transport rail 2 in the transport path. A pin driving device 4 that is inserted into or pulled out of the device is attached.
When the positioning pin 3 is inserted by the pin driving device 4, the component 10 descending the transport rail 2 comes into contact with the positioning pin 3 and stops at a predetermined inspection position defined by the positioning pin 3. When pulled out by the pin driving device 4, the component 10 further descends the transport rail 2.

  In this way, the conveyance path of the conveyance rail 2 functions as a support portion that lowers by its own weight while supporting the component 10 in a direction in which the through-hole of the component 10 is different from the direction of gravity, and is used for inspection by imaging. At this time, the component 10 is stopped at a predetermined inspection position in a predetermined direction.

An illumination 5 for irradiating the one end surface of the component 10 with light is installed on one end surface side of the component 10 at the inspection position, and the other end surface of the component 10 is disposed on the other end surface side. A camera 6 for photographing (imaging) is installed. Here, the illumination 5 functions as an illumination unit, and the camera 6 functions as an imaging unit.
Since the penetration direction of the through hole of the component 10, the irradiation direction of the light of the illumination 5, and the shooting direction of the camera 6 are all on the same straight line, the light emitted from the illumination 5 passes through the through hole and the camera 6 is taken.

The computer 7 drives the pin driving device 4 and analyzes the image of the camera 6 to determine whether there is a defect in the through hole of the component 10.
When the component 10 moves down the conveyance rail 2, the computer 7 drives the pin driving device 4 to insert the positioning pin 3 into the conveyance path, and abuts the component 10 on this to inspect the component 10. Hold in position.

Then, the computer 7 receives the image data transmitted from the camera 6, thereby analyzing the state of the light passing through the through hole and determining the presence or absence of a defect.
In the present embodiment, as an example, the computer 7 compares the area of light passing through the through hole with a reference area, and determines that there is no defect when the area is equal to or larger than the reference area. For example, it is determined that there is a defect because, for example, the through hole is clogged with chips.
The reference area is defined based on the cross-sectional area of the design of the through hole, and is set to, for example, a predetermined ratio (for example, 80%) of the cross-sectional area of the design of the through hole.
As described above, the computer 7 includes a determination unit that determines the presence or absence of a defect generated in the through hole based on the captured image.

When the computer 7 determines whether or not there is a defect, the computer 7 drives the pin driving device 4 to pull out the positioning pin 3 from the conveyance path, and unloads the component 10 by its own weight.
Although not shown, an acceptable product conveyance path for conveying acceptable products and an unacceptable product conveyance path for conveying unacceptable products are formed on the lower end side of the conveyance rail 2, and the computer 7 drives a path switching device. Then, the acceptable product is carried out to the acceptable product conveyance path, and the unacceptable product is carried out to the unacceptable product conveyance path.
As described above, the computer 7 includes an output unit that outputs the determination result to the path switching device, inspects the through hole of the component 10 and sorts the acceptable product and the rejected product.

As shown in FIG. 1B, the transport rail 2 is made of a glass camera-side cover member 21 that forms the side surface of the transport path 25 on the camera 6 side, and a metal upper end that forms the upper end surface of the transport path 25. It comprises a member 23, a metal lower end member 22 constituting the lower end surface of the transport path 25, a metal illumination side cover member 24 constituting the side surface of the transport path 25 on the illumination 5 side (the front side of the paper), and the like. Yes. The illumination-side cover member 24 is shown in the perspective view of FIG.
Thus, the conveyance path 25 is formed by being surrounded by these four members.

The width of the conveyance path 25, that is, the distance between the inner wall of the camera side cover member 21 and the inner wall of the illumination side cover member 24 is set to be slightly larger than the thickness of the component 10 within a range that does not affect the inspection.
This is to prevent the end surface of the component 10 from being pressed by both side surfaces when the component 10 descends the conveyance path 25 and preventing the descent from being hindered by friction.
Similarly, the height of the conveyance path 25, that is, the distance between the lower end surface of the upper end member 23 and the upper end surface of the lower end member 22 is set slightly larger than the outer diameter of the component 10.

In addition, a flat portion 13 is formed in a portion of the component 10 that contacts the lower end member 22, whereby the component 10 does not rotate in the circumferential direction when descending the conveyance path 25, and the direction of the component 10 The lower end member 22 is slid down while maintaining the above.
As described above, when the shape of the bottom surface of the conveyance path 25 is matched with the shape of the bottom portion of the workpiece outer diameter, the conveyance is stabilized.
In this embodiment, both sides of the transport path 25 are covered with the camera side cover member 21 and the illumination side cover member 24. However, only one of them is provided, or only the groove part where the component 10 is lowered is provided. The transport path 25 may be configured.

The component 10 is formed with a through hole of a predetermined size (for example, a hole into which a screw for screwing another component is inserted) at a predetermined position according to the specification of the component. As an example, reference through holes 11a and 11b (pilot holes) and through holes 12a and 12b are formed.
The reference through-holes 11a and 11b are through-holes to be inspected, and also function as a reference for correcting the position of the through-holes in image data, which will be described in detail later. The reference through-holes 11a and 11b are large to facilitate image recognition. It is formed by a hole.
Since there are two reference through-holes 11a and 11b at a distant position, these correct the deviation in the conveyance path direction of the component 10 and the deviation in the rotation direction in the image data captured by the camera 6 (hereinafter simply referred to as “ It can be referred to as “deviation correction”. Details of this “deviation amount correction” will be described later.

  Since the component 10 descends while sliding on the conveyance path 25 while maintaining the posture and comes into contact with the positioning pin 3 and stops, these through-holes are located at substantially the same place for each inspection. For this reason, correction becomes easy, position correction in image data can be performed stably at high speed, and programming is also facilitated.

  In addition, it can also comprise so that the components 10 may descend | fall by rolling down the conveyance path | route 25, and may stand still in arbitrary attitude | positions at an inspection position. If the through direction of the through hole is perpendicular to the transport surface of the transport path 25 (the upper end surface of the lower end member 22), the position of each through hole can be corrected by the reference through holes 11a and 11b.

Since the camera-side cover member 21 is made of glass, the internal state can be observed through this, and the camera 6 is prevented from being contaminated by cutting oil or dust adhering to the component 10.
In the inspection position of the camera side cover member 21, a cutout window 26b is formed by cutting out the cover glass so that the component 10 does not contact the cover glass.

The distance between the upper end side and the lower end side of the cutout window 26b is set so that the component 10 is held without dropping from the cutout window 26b.
The corners of the edges of the cutout window 26b are chamfered so that the component 10 is not caught.
The distance between the upper end side and the lower end side of the cutout window 26b can be arbitrarily set according to the shape of the component 10 and the position of the through hole. For example, among the through holes formed in the component 10, the component 10 Alternatively, the distance may be set so as not to overlap the upper part of the through hole formed on the outermost edge side.

  Since the cutout window 26b can prevent the cover glass and the component 10 from rubbing at the inspection position to cause scratches and the component 10 from being contaminated, the camera 6 can capture a clear image. Can do.

  The illumination side cover member 24 is made of, for example, a metal member, and similarly to the camera side cover member 21, a cutout window 26a having a chamfered edge is formed at the inspection position. The component 10 can be directly irradiated with the light of the illumination 5 by the hollow window 26a.

The movable amount of the positioning pin 3 is an amount that reaches at least the maximum outer diameter in the descending direction of the component 10 at the time of insertion (for example, a virtual point passing through the outer edge of the component 10 in the horizontal direction with respect to the conveyance rail 2 of the component 10. Among them, the amount of contact between the two virtual points facing each other and the portion where the distance is the largest).
If the protruding amount of the positioning pin 3 is smaller than the amount reaching the maximum outer diameter, the component 10 may ride on the leading end portion of the positioning pin 3 and rotate, and the rear end portion may float, resulting in a decrease in conveying efficiency and image recognition. It causes a decrease in rate.
On the other hand, such a problem can be prevented by setting the movable amount as described above.
Further, the movable amount of the positioning pin 3 can be set to the minimum amount (for example, the maximum radius of the component 10 or the like) that the component 10 does not ride on the tip portion of the positioning pin 3. By setting in this way, the movable amount of the pin for each inspection can be minimized, so that the failure rate of the apparatus and the power consumption can be reduced.

Further, as shown in FIG. 1 (d), one side of the positioning pin 3 is made into a flat portion 31 by D-cut, and the flat portion 31 comes into contact with the outer peripheral surface of the component 10.
When the positioning pin 3 has a cylindrical shape, if the thickness of the component 10 is smaller than a predetermined amount, the component 10 rides on the outer diameter (on the cylindrical surface) of the positioning pin 3 and the positioning of the component 10 varies. The part 10 may be sandwiched between the positioning pin 3 and the side surface of the conveyance path 25, but when the positioning pin 3 is D-cut, the plane portion 31 comes into contact with the outer periphery of the part 10 and rides up. Such a malfunction can be prevented.

FIG. 2A is a diagram illustrating a hardware configuration of the computer 7.
The computer 7 includes a CPU (Central Processing Unit) 71, a ROM (Read Only Memory) 72, a RAM (Random Access Memory) 73, an interface 74, an input device 75, an output device 76, a storage device 77, and the like connected by a bus line. It is configured.

The CPU 71 is a central processing unit that performs various types of information processing and control in accordance with programs stored in a storage device or the like.
In the present embodiment, control of the pin driving device 4, fetching of image data from the camera 6, position correction of the image data, pass / fail determination of the through hole, and sorting control of the accepted product and the rejected product are performed.

The ROM 72 is a read-only memory, and stores basic programs and parameters when the computer 7 operates.
The RAM 73 is a readable / writable memory and provides a working memory when the CPU 71 operates.
More specifically, the CPU 71 develops the reference value of the area of each through hole used for determination of the image data and the through hole taken by the camera 6, that is, the reference area on the RAM 73, and the part through which the light on the image has passed. The presence or absence of a defect is judged by comparing the area and the reference area.

The storage device 77 is configured using a storage medium such as a hard disk or an EEPROM (Electrically Erasable Programmable Read-Only Memory), and stores an inspection program for operating the computer 7, reference area data used for the inspection, inspection results, and the like. ing.
The reference area data is prepared for each type of part 10, and an image file (for example, a bitmap image or a vector image) showing the part 10 (part 10 processed according to the specification) as a finished product is shown. Etc.), the coordinate values of the reference through-holes 11a and 11b, the reference area, the position of these through-holes, the diameter, the tolerance of the reference area (difference between the reference value and the maximum and minimum values of the allowable range), etc. It is prescribed.
In addition, the coordinate values of the reference through holes 11a and 11b are values defined to be fixed at one point by the coordinate system in which the origin and the coordinate axis are defined. For example, the coordinate value (for example, the coordinate axis provided with the absolute origin as a reference (for example, , X axis, Y axis, Z axis) are defined as coordinate values indicating a fixed point.
That is, the positions of the reference through holes 11a and 11b are defined so as to be fixed at one point by the coordinate values (X1, Y1, Z1) from the absolute origin.
The CPU 71 executes an inspection operation by executing an inspection program, and determines the presence or absence of a defect using the reference area data.

The interface 74 is an interface that connects the computer 7 to the camera 6, the pin driving device 4, the path switching device, and the like.
The computer 7 communicates via the interface 74 to receive image data from the camera 6 and to control the pin driving device 4 and the path switching device.

The input device 75 is an input device for an operator to operate the inspection device 1 such as a keyboard and a mouse.
The output device 76 is an output device for providing the worker with various information such as a monitor screen for displaying an inspection screen, a speaker for outputting a warning sound, a printer for printing the inspection result, and the like.

FIG. 2B shows an example of an image of the part 10 taken by the camera 6.
In the image, light from the illumination 5 that has passed through the reference through-holes 11a and 11b and the through-holes 12a and 12b, that is, shadows of the through-holes illuminated by the backlight of the illumination 5 are photographed.
The captured image data defines a coordinate system in which the origin and coordinate axes are defined, and the position of each part to be imaged is defined as a single coordinate value.
That is, the positions of the reference through holes 11a and 11b as the parts to be imaged can be acquired as coordinate values.
The reason why the through-hole is photographed by the backlight method is to improve the contrast. When the through-hole can be photographed by natural light, the illumination 5 is not necessary.

Then, the computer 7 determines whether or not there is a defect in the through hole formed in the component 10 (for example, whether a through hole of a predetermined position or a predetermined size is formed according to the specification of the component 10). The judgment is made with reference to the reference area data.
In order to make such a determination, the computer 7 first performs “shift amount correction”.
The “deviation amount correction” means that the coordinate system of the reference area data is corrected according to the deviation amount in the conveyance path direction of the component 10 and the deviation amount in the rotation direction in the image data photographed by the camera 6. .
The outline of the “shift amount correction” will be described. First, the computer 7 searches the reference through holes 11a and 11b in the regions 111a and 111b in the vicinity where the reference through holes 11a and 11b are located on the image.

Here, the regions 111a and 111b refer to positions and sizes where the reference through holes 11a and 11b can be present in consideration of the tolerance defined in the reference area data, and positions of other through holes 12a and 12b described later. It is set to be larger than the areas 112a and 112b.
By setting the regions 111a and 111b to be larger than the regions 112a and 112b, the reference through holes 11a and 11b are preferentially searched over the other through holes.
Then, the computer 7 refers to the reference area data, and specifies the reference through holes 11a and 11b from the captured image data by, for example, a known pattern matching process.
Since this pattern matching process is a known technique, a detailed description thereof will be omitted. However, based on the characteristics such as the shape and arrangement of the reference through holes 11a and 11b, the reference area data and the object shown in the photographed image data are used. The process which specifies the reference | standard through-holes 11a and 11b is said.
Next, the computer 7 compares the coordinate values defined in the image data of the identified reference through holes 11a and 11b with the coordinate values of the reference through holes 11a and 11b acquired based on the reference area data, The inclination of the component 10 is detected.
Specifically, the computer 7 is calculated from the straight line calculated from the coordinate values of the reference through holes 11a and 11b shown in the image data and the coordinate value of the reference through holes 11a and 11b acquired based on the reference area data. And the degree of inclination of the component 10 indicated by the image data with respect to the component 10 indicated by the image reference area data is calculated.
Then, the computer 7 corrects the shift amount by rotating the reference area data according to the calculated inclination.
Then, the computer 7 analyzes the areas of the through holes 12a and 12b with reference to the reference area data after the deviation amount correction.
In other words, the computer 7 corrects and specifies the regions 112a and 112b in which the through holes 12a and 12b are located with reference to the positions of the reference through holes 11a and 11b searched for in this way.
In this way, even if the component 10 at the inspection position is tilted, the positions and areas of the through holes 12a and 12b can be calculated by referring to the reference area data by correcting the shift amount. .

When the areas are specified, the computer 7 analyzes the areas of the areas 111a, 111b, 112a, and 112b that are illuminated (the areas where the light that has passed through the through holes is projected onto the imaging surface of the camera 6).
More specifically, on the image, the surface of the component 10 is black, the area through which light passes is white, and the computer 7 analyzes the area of the white portion in the area.

As described above, the reference area data stored in the storage device 77 records the reference areas of these individual through-holes, and the computer 7 determines the area of the shining portion of each area. Comparing the reference areas, if the area of the shining portion is equal to or larger than the reference area, it is determined that there is no defect and if it is less than the reference area, it is determined that there is a defect and it is rejected.
In this way, the computer 7 can determine the presence or absence of defects in the plurality of through holes formed in the component 10.

FIG. 3 is a flowchart for explaining the procedure of the inspection process performed by the computer 7. The following processing is performed by the CPU 71 based on the inspection program.
First, the CPU 71 drives the pin driving device 4 while the transport path 25 is empty, and inserts the positioning pin 3 into the transport path 25 (step 5).

Next, the CPU 71 puts one component 10 into the upper end of the transport path 25 (step 10).
This loading process can be performed, for example, by stopping the component 10 with another pin on the upstream side of the conveyance path 25 and pulling out the pin.

The thrown-in component 10 is slid along the conveying path 25 and is brought into contact with the positioning pin 3 to be stopped and held at the inspection position.
The fact that the component 10 has been supplied to the inspection position may be detected by a sensor, or the time from when the component 10 is introduced until it stops at the supply position is substantially constant, so that a certain period of time has elapsed after the introduction. You may judge by doing.

When the component 10 stops at the inspection position, the camera 6 captures the component 10 (step 15), and the CPU 71 receives the image data of the component 10 captured by the camera 6.
The photographing of the component 10 may be such that the CPU 71 controls the camera 6 to photograph a still image, or the component 10 is captured from a series of images in which the camera 6 continuously photographs the inspection position by moving images. May be extracted.

The CPU 71 stores the received image data in the RAM 73. Then, the CPU 71 searches the reference through holes 11a and 11b in the areas 111a and 111b on the stored image data, and specifies these positions (step 20).
Then, the CPU 71 performs the above-described image data displacement position correction based on the identified positions of the reference through holes 11a and 11b (step 25).
Next, the CPU 71 sets a parameter i for specifying the number of the through hole in the RAM 73, and sets its initial value to 1 (step 30).

When i is set, the CPU 71 calculates the area of the part through which light passes in the region where the i-th through hole is formed in the image data (step 35).
Next, the CPU 71 compares the calculated area with the i-th reference area recorded in the reference area data, and determines whether or not the calculated area is greater than or equal to the reference area (step 40).

If it is equal to or greater than the predetermined value (step 40; Y), the CPU 71 determines that the through hole has no defect, increments i by 1, and sets the next inspection target to the i + 1 th through hole. (Step 45).
Next, the CPU 71 determines whether i is larger than the total number of through holes formed in the component 10 (step 50).

When i is equal to or smaller than the total number of through holes (step 50; N), since there are still uninspected through holes, the CPU 71 returns to step 35 and inspects the next through hole.
When i is larger than the total number of through holes (step 50; Y), since all the through holes are inspected and there are no defects, the CPU 71 determines that the component 10 is a pass product (step 55).

Next, the CPU 71 releases the positioning by the positioning pin 3 by driving the pin driving device 4 and pulling out the positioning pin 3 (step 60). As a result, the component 10 moves down the conveyance path 25.
Further, the CPU 71 drives the path switching device to guide the component 10 that is descending to the conveyance path of the acceptable product, and performs processing on the acceptable product (step 65).

  Next, the CPU 71 determines whether or not there is an uninspected part 10 (step 70). If there is an uninspected part 10 (step 70; Y), the CPU 71 returns to step 5 to return to the uninspected part 10 If there is no (step 70; N), the inspection is terminated.

  If the calculated area is smaller than the reference area in step 40 (step 40; N), the CPU 71 determines that the component 10 is a rejected product because there is a defect (step 75).

Next, the CPU 71 releases the positioning by the positioning pin 3 by driving the pin driving device 4 and pulling out the positioning pin 3 (step 80). As a result, the component 10 moves down the conveyance path 25.
Further, the CPU 71 drives the path switching device to perform the processing for the rejected product by guiding the descending component 10 to the rejected product transport path (step 85), and the process proceeds to step 70.

In addition, embodiment described above does not limit the invention which concerns on a claim. And not all the combinations described in the above embodiment are indispensable configurations for solving the problems of the invention.
In the inspection method described above, the component 10 is stopped and inspected at the inspection position. However, the component 10 is continuously lowered at a constant interval without providing the positioning pin 3, and the camera 6 captures a moving image in real time. It is also possible to configure so that the processing is performed.
Further, instead of lowering the single component 10 on the slope, a hoop material in which a plurality of components 10 are formed may be used to insert a pin into a locating hole to send a movie film. . In this case, the conveyance path 25 does not need to be inclined, and can be configured to send the component 10 horizontally while standing.
In addition, the imaging device 1 analyzes the area of the portion through which light passes in the region where the through hole is formed from the captured image data, and if the area is equal to or greater than a predetermined reference area, there is no defect and the reference area If it is less than that, it is determined that there is a defect. However, the position of the portion where light passes in the region where the through hole is formed is analyzed from the captured image data, and the through hole is set to a predetermined position. When formed, there is no defect, and when the through hole is not formed at a predetermined position, it may be determined that there is a defect.
Furthermore, the imaging device 1 analyzes the position or area of the portion where light passes in the region where the through-hole is formed from the captured image data, and the through-hole is formed at a predetermined position, and the area is predetermined. When the area is equal to or larger than the reference area, there is no defect, and the through hole is not formed at a predetermined position. When the area is less than the reference area, it may be determined that there is a defect.

According to the embodiment described above, the following effects can be obtained.
(1) Since the photographing system such as the illumination 5 and the camera 6 is installed in the lateral direction with respect to the direction of gravity, the illumination 5 and the camera 6 are not contaminated by the foreign matter dropped from the component 10.
(2) Since contamination of the imaging system is suppressed, the imaging state of the component 10 can be maintained well, and erroneous detection can be suppressed.
(3) Since the cutout windows 26a and 26b are provided at the inspection position of the transport rail 2, a clear image can be taken.
(4) Since the insertion amount of the positioning pin 3 is sufficient and the flat portion 31 is formed, the descending component 10 can be stably stopped and held.
(5) Since the component 10 is transported through the transport path 25 by its own weight, it does not require a complicated mechanism or power.

DESCRIPTION OF SYMBOLS 1 Inspection apparatus 2 Conveying rail 3 Positioning pin 4 Pin drive apparatus 5 Illumination 6 Camera 7 Computer 10 Parts 11a, 11b Reference through hole 12a, 12b Through hole 13 Flat part 21 Camera side cover member 22 Lower end member 23 Upper end member 24 Illumination side cover Member 25 Transport path 26a, 26b Cut-out window 31 Planar portion 71 CPU
72 ROM
73 RAM
74 Interface 75 Input device 76 Output device 77 Storage device 111a, 111b, 112a, 112b Area

Claims (6)

A support portion that supports the component so that the through direction of the through hole processed into the component is different from the direction of gravity;
A photographing unit that photographs light passing through the through hole from one side of the through hole;
A determination unit that determines the presence or absence of a defect generated in the through hole based on the captured image;
An output unit for outputting a determination result by the determination unit;
An apparatus for inspecting parts. The support unit stops the component at a predetermined position when the imaging unit performs imaging.
The component inspection apparatus according to claim 1. The support portion includes an inclined path that is lowered by its own weight while maintaining the direction of the component,
Stopping the descending component in a predetermined direction at a predetermined position by bringing it into contact with a predetermined member and stopping it,
The component inspection apparatus according to claim 2. The determination unit determines that there is no defect when the area of the portion through which the light passes is equal to or greater than a predetermined reference area, and determines that there is a defect when less than the predetermined reference area.
The component inspection apparatus according to claim 1, claim 2, or claim 3. Comprising an illumination part for illuminating the component from the other side of the through-hole,
The component inspection apparatus according to any one of claims 1 to 4, characterized in that: A plurality of through holes are formed in the component,
The determination unit determines the presence or absence of a defect for each of the plurality of through holes.
The component inspection apparatus according to any one of claims 1 to 5, wherein the component inspection apparatus according to any one of claims 1 to 5 is provided.

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