JP2012060165A - Semiconductor light emitting element, manufacturing method for semiconductor light emitting element, and semiconductor light emitting device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a semiconductor light emitting element that can be used appropriately, particularly for, a highly precise image display device by diversifying light emitting wavelength by a simple manufacturing method, and to provide a method of manufacturing the semiconductor light-emitting element and a semiconductor light emitting device.SOLUTION: A semiconductor light emitting element has a first semiconductor light emitting layer 17 which emits prescribed light, and a second semiconductor light emitting layer 11 which is constituted of a semiconductor layer composed of a different crystal system from the first semiconductor light emitting layer 17 and emits light when the layer 11 is excited by the light emitted from the semiconductor light emitting layer. The second light emitting layer 11 is stuck to a semiconductor structure section having the first semiconductor light emitting layer 17.

Description

  The present invention relates to a semiconductor light emitting element such as a semiconductor light emitting diode that generates predetermined light, a method for manufacturing the same, and a semiconductor light emitting device including a plurality of such semiconductor light emitting elements. The present invention relates to a semiconductor light emitting element to be manufactured, a manufacturing method thereof, and a semiconductor light emitting device.

  As one of methods for configuring an image display device, a diode array type display in which semiconductor light emitting diodes are two-dimensionally arranged to perform predetermined image display is known. Light-emitting elements used in such diode array type displays require device reliability and productivity, and in particular, it is necessary to keep manufacturing variations such as variations in brightness and wavelength within a predetermined range. It becomes.

  In order to perform color display, it is necessary to form light emitting elements of three primary colors for each pixel. Recently, GaN-based light-emitting diodes have attracted attention as blue light-emitting diodes, GaN-based and GaP-based light-emitting diodes are used as green light-emitting diodes, and AlGaAs-based and AlInGaP-based light-emitting diodes are used as red light-emitting diodes. The use of light emitting diodes made of these materials has been studied.

  By the way, in the semiconductor light emitting device, in addition to the first light emitting layer that emits light by direct injection of current, a second light that absorbs light from the first light emitting layer, converts the wavelength, and emits it. A light emitting device having a structure including a light emitting layer is known. For example, as described in JP-A-11-274558, light from a first light emitting layer made of a GaN-based semiconductor active layer is received. A semiconductor light emitting device including a second light emitting layer that converts the wavelength is known. Further, for example, Japanese Patent Application Laid-Open No. 2000-174346 discloses a configuration in which a GaN-based semiconductor laser is used as an excitation light source, and the laser light is incident on a phosphor to emit fluorescent light in a required visible range. There are known light-emitting devices. By using such a semiconductor light-emitting element or light-emitting device, light can be emitted in a form that converts the wavelength regardless of the primary emission wavelength, and multicolor emission from a single element is easily realized. Is done.

  In a semiconductor light emitting device (see, for example, Japanese Patent Application Laid-Open No. 11-274558) provided with a second light emitting layer that receives light from a first light emitting layer made of a GaN-based semiconductor active layer and converts its wavelength. The second light emitting layer is premised on being stacked on the first light emitting layer. In particular, the second light emitting layer is not directly injected into the second light emitting layer, and the second light emitting layer is not injected. Even when an unstable mixed crystal is used, light emission of a predetermined wavelength can be stably obtained. However, although it is described that the first light-emitting layer and the second light-emitting layer are stacked to form the same element, a specific configuration example regarding the bonding structure and multicoloring is described. There is no description thereof, and there is no suggestion about a light-emitting element for constituting a high-definition image display device.

  In addition, a light emitting device having a structure in which laser light is incident on a phosphor is basically configured for the purpose of white light emission, and is said to be effective in terms of improving the light intensity. There is no suggestion about a light emitting element for constituting a display device, particularly an image display device capable of multicolor display. Further, when a phosphor is used, color purity is lowered and luminance is easily saturated, which is disadvantageous when a high-definition image display device is configured.

  Accordingly, an object of the present invention is to provide a semiconductor light-emitting element suitable for use in a high-definition image display device, a method for manufacturing the same, and a semiconductor light-emitting device by diversifying emission wavelengths by a simple manufacturing method. .

The semiconductor light emitting device of the present invention includes a first semiconductor light emitting layer from which a substrate during crystal growth that emits predetermined light is removed, and a semiconductor layer made of a crystal system different from the first semiconductor light emitting layer. Having a second semiconductor light emitting layer that emits light when excited by light from one semiconductor light emitting layer, and the light emission wavelength from the first semiconductor light emitting layer is different from the light emission wavelength from the second semiconductor light emitting layer; It is characterized by that.

  When diversifying the emission wavelength or converting the emission wavelength to a desired wavelength, it is possible to change the wavelength significantly by using a different light emitting layer instead of the same crystalline semiconductor light emitting layer. At the same time, it is possible to select an optimum crystal structure that can emit light of the predetermined wavelength. When the crystal structure is different, it is difficult to form a stack as the same element, but by using the bonding technique, each crystal structure is maintained and the advantages of both are utilized. It can be combined into a single element.

Further, another semiconductor light emitting device of the present invention includes a first semiconductor light emitting layer formed in a resin package, from which a substrate during crystal growth that emits predetermined light is removed, and from the first semiconductor light emitting layer. It has a second semiconductor light emitting layer that emits light when excited by light, and the second semiconductor light emitting layer is formed by being bonded to the resin package.

  By disposing the first semiconductor light emitting layer in the resin package, light can be transmitted through the resin portion of the resin package and emitted to the outside. In addition, in order to perform high-definition image display, it is necessary to arrange the light emitting elements with high accuracy, and the light emitting elements can be arranged with higher accuracy by arranging the elements for each resin package. Since no current injection is required for the second semiconductor light emitting layer, even when the element is configured to be attached to a resin package, it functions reliably and can output light of various wavelengths.

The method of manufacturing a semiconductor light emitting device according to the present invention includes forming a first semiconductor light emitting layer from which a substrate during crystal growth for emitting predetermined light is removed , and comprising a crystal system different from the first semiconductor light emitting layer. A second semiconductor light emitting layer is formed which is composed of a semiconductor layer and is excited by light from the first semiconductor light emitting layer to emit light, and the second semiconductor light emitting layer is used as the first semiconductor light emitting layer. It is characterized by being bonded to a semiconductor structure having

  By using a light emitting layer of a different crystal system without using a semiconductor light emitting layer of the same crystal system, it is possible to change the wavelength significantly, and among the crystal structures that can emit light of the predetermined wavelength, it is optimal You can choose anything. When the crystal structures are different, it is generally difficult to form a stack as the same element. However, by bonding the second semiconductor light emitting layer to the semiconductor structure portion having the first semiconductor light emitting layer, the respective crystal structures can be obtained. Can be combined into a single light-emitting element.

According to another method of manufacturing a semiconductor light emitting device of the present invention, a first semiconductor light emitting layer is formed by removing a substrate formed during crystal growth that is formed in a resin package and emits predetermined light. A second semiconductor light emitting layer for emitting light when excited by light from the light emitting layer is formed, and the second semiconductor light emitting layer is bonded to a resin package.

  By disposing in the resin package, the light emitting elements can be arranged with high accuracy when the resin packages are arranged. Since no current injection is required for the second semiconductor light emitting layer, when the element is configured such that the second semiconductor light emitting layer is attached to the resin package, light of various wavelengths can be output, particularly in color. Effective for image display.

  A preferred embodiment of the present invention will be described with reference to the drawings. FIG. 1 is a side sectional view showing the semiconductor light emitting device of the present embodiment in a partially broken view.

[Example of semiconductor light emitting device]
The semiconductor light emitting device of this embodiment has an AlGaInP double hetero structure on the lower side, and a structure in which a second active layer 11 as a second semiconductor light emitting layer is provided between a pair of clad layers 10 and 12. Have Specifically, the AlGaInP-based double heterostructure is composed of a lower clad layer 10, a second active layer 11, and an upper clad layer 12. It is a sandwiched structure. Regarding the mixed crystal ratio of the active layer 11 made of an AlGaInP-based material, when the AlGaInP-based material is an (Al _X Ga _1-X ) _Y In _1- YP mixed material, the mixed crystal ratio y is Although set from the viewpoint of lattice matching, x is set according to the target emission wavelength. For example, the combination of the active layer and the clad layer may be composed of only AlGaInP, composed of AlGaInP and GaInP, or composed of AlInP and AlGaInP.

  Each layer of these AlGaInP-based double heterostructures is formed, for example, on a GaAs substrate while being lattice-matched, and each has a zinc blende crystal structure. The second active layer 11 does not emit light by direct current injection, but emits light by excitation light from a GaN-based pyramidal light emitting layer described below. Each layer of such an AlGaInP-based double heterostructure is formed by crystal growth on a GaAs substrate and then only the light emitting layer portion is peeled off from the GaAs substrate. In particular, since the AlGaInP-based double heterostructure and the GaAs substrate are separated, the portion used as an element can be configured not to contain As (arsenic), and the device is excellent in terms of environmental protection. This AlGaInP-based double heterostructure enables red high-luminance emission based on excitation light such as blue. That is, in this AlGaInP-based double heterostructure, wavelength conversion from blue to red is performed as an example.

  The structure on the first semiconductor light emitting layer side is bonded to the upper clad layer 12 having such an active layer 11 and having an AlGaInP double hetero structure via an adhesive layer 13. The first semiconductor light-emitting layer side has a structure in which, for example, a silicon-doped lower growth layer 14 formed on a sapphire substrate via a low-temperature buffer layer or the like is formed and selectively grown on the silicon-doped lower growth layer 14. The growth inhibitory film 15 is formed, and a hexagonal pyramid-shaped crystal growth part 19 is formed by selective growth from a window part where a part of the growth inhibitory film 15 is opened. The hexagonal pyramid-shaped crystal growth portion 19 has an inclined crystal plane. For example, in the case of selective growth, when the main surface of the substrate is a C plane, the S plane ({1-101} plane) or {11- Grows as facets with inclined 22} planes. The inclined facet partially overlaps the growth inhibitory film 15 for selective growth on the plane, so that the threading dislocation from the substrate is suppressed at that portion, and the emission characteristics are particularly excellent in the inclined crystal plane. The sapphire substrate is peeled off before being bonded to each layer of the AlGaInP-based double hetero structure.

  Inside the hexagonal pyramidal crystal growth portion 19, a silicon-doped GaN layer 16 is formed continuously to a window portion in which a part of the growth inhibition film 15 is opened. The silicon-doped GaN layer 16 is connected to an n-side electrode (not shown) and functions as a lower cladding layer in the light emitting region of the hexagonal pyramidal crystal growth portion 19. A first active layer 17 made of an InGaN layer or the like is formed outside the silicon-doped GaN layer 16. The first active layer 17 has a double hetero structure sandwiched between a magnesium-doped GaN layer 18 and a silicon-doped GaN layer 16 described below, and current injection from a p-side electrode and an n-side electrode (not shown) To emit light. Here, the emission wavelength from the first active layer 17 can be generally set from the band gap to ultraviolet light to blue and green emission colors. For example, the emission wavelength from the first active layer 17 is set to blue or green emission wavelength. Can be set. Even when the first active layer 17 has a single emission wavelength, wavelength conversion is possible with the second semiconductor emission layer described above, and the emission color from the first active layer 17 is blue. In addition, since red and green can be easily produced, it is possible to cope with adaptability when manufacturing a display device that displays a color image. A magnesium-doped GaN layer 18 is formed outside the first active layer 17. The magnesium-doped GaN layer 18 is connected to a p-side electrode (not shown).

  The semiconductor light emitting device of the present embodiment having such a structure has a GaN-based wurtzite type semiconductor crystal structure on the first semiconductor light emitting layer side composed of the hexagonal pyramidal crystal growth portion 19, while The configuration on the second semiconductor light emitting layer side has an AlGaInP-based zinc blende type crystal structure. In particular, the GaN-based semiconductor crystal structure has an advantage that the structure does not break even at a high current value with respect to current injection, and has a long life. Therefore, from these combinations, the object of current flow is limited to the GaN-based wurtzite semiconductor crystal structure side, which has a relatively high structural strength, so that the lifetime of the element can be easily extended. In addition, since it has a structure in which the structure on the first semiconductor light emitting layer side and the structure on the second semiconductor light emitting layer side are combined after peeling off the substrate at the time of growth, the growth substrate can be repeatedly used, In addition, a configuration that does not include As contained in a GaAs substrate or the like can be realized.

  In the semiconductor light emitting device of the present embodiment, the light excited by the first active layer 17 is wavelength-converted and output by the second active layer 11, and fluorescent light is used instead of the second active layer. Compared with a light-emitting element using a body, color purity can be increased, and at the same time, luminance saturation is suppressed and high-luminance display is possible. When a color image display device is configured using such a semiconductor light emitting element of this embodiment, excitation light from the blue first active layer 17 can be converted to red, and a GaN-based semiconductor crystal having the same configuration Since the structure can be utilized as blue or green as it is, at least the same GaN-based semiconductor crystal structure is arranged in an array as will be described later, and the second active layer 11 is formed in part to perform wavelength conversion. However, a high-definition image display device can be created. As the second semiconductor light emitting layer, a semiconductor layer selected from an AlGaInP semiconductor layer, an AlGaInAs semiconductor layer, a GaInNAs semiconductor layer, and a GaInAsP semiconductor layer may be formed.

[Example of Method for Manufacturing Semiconductor Light Emitting Element]
Next, a method for manufacturing the semiconductor light emitting device of this embodiment will be described with reference to FIGS. In this manufacturing method, a substrate capable of forming a wurtzite type compound semiconductor layer, such as a sapphire substrate, and a substrate capable of forming a zinc blende type crystalline semiconductor layer, such as a GaAs substrate, are particularly suitable for crystal growth. Although used, each grown semiconductor layer is stripped from the substrate and manufactured to form the device without the substrate. Hereinafter, it demonstrates in order of a process.

First, the substrate 20 used for manufacturing the semiconductor light emitting device is not particularly limited as long as it can form a wurtzite type compound semiconductor layer, and various substrates can be used. For example, sapphire (including Al ₂ O ₃ , A plane, R plane, and C plane), SiC (including 6H, 4H, and 3C), GaN, Si, ZnS, and the like can be used as the substrate. A substrate made of ZnO, AlN, LiMgO, LiGaO ₂ , GaAs, MgAl ₂ O ₄ , InAlGaN or the like, preferably a hexagonal substrate or a cubic substrate made of these materials, more preferably a hexagonal substrate It is a substrate. For example, in the case of using a sapphire substrate, a sapphire substrate having a C-plane as a main surface, which is often used when growing a gallium nitride (GaN) -based compound semiconductor material, can be used. In this case, the C plane as the main surface of the substrate includes a plane orientation inclined within a range of 5 to 6 degrees. It is also possible to use a silicon substrate that is widely used in the manufacture of semiconductor devices.

A buffer layer or the like may be formed on the substrate 20 for selective growth in order to obtain good crystallinity at the time of selection. Further, as shown in FIG. 2, a selectively grown lower growth layer 21 is formed on the substrate 20. A compound semiconductor layer can be selected as the lower growth layer 21, and a wurtzite type compound semiconductor is preferably selected because a facet structure is formed in a later step. Further, the compound semiconductor layer is preferably a nitride semiconductor having a wurtzite crystal structure, a BeMgZnCdS-based compound semiconductor, a BeMgZnCdO-based compound semiconductor, or the like. As the crystal layer made of a nitride semiconductor, for example, a group III compound semiconductor can be used, and further, a gallium nitride (GaN) compound semiconductor, an aluminum nitride (AlN) compound semiconductor, and an indium nitride (InN) compound semiconductor. Indium gallium nitride (InGaN) compound semiconductors and aluminum gallium nitride (AlGaN) compound semiconductors can be preferably formed, and gallium nitride compound semiconductors are particularly preferable. As an example, an undoped GaN layer may be formed on a sapphire substrate, and then a Si-doped GaN layer may be formed. In the present invention, InGaN, AlGaN, GaN and the like do not necessarily refer to a nitride semiconductor having only a ternary mixed crystal but only a binary mixed crystal. For example, in InGaN, a small amount within a range in which the action of InGaN is not changed. Needless to say, the present invention includes Al and other impurities. Further, the plane substantially equivalent to the S plane includes a plane orientation inclined in the range of 5 to 6 degrees with respect to the S plane. In this specification, nitride refers to a compound in which B, Al, Ga, In, and Ta are group III, and group V contains N, and impurities are contained within 1% of the total or 1 × 10 ²⁰ cm ³ or less. May be included.

  Examples of the growth method of the lower growth layer 21 include various vapor phase growth methods such as organic metal compound vapor phase growth method (MOCVD (MOVPE) method) and molecular beam epitaxy method (MBE method). A phase growth method or a hydride vapor phase growth method (HVPE method) can be used. Among them, the MOVPE method can quickly obtain a crystal with good crystallinity. In the MOVPE method, TMG (trimethylgallium) and TEG (triethylgallium) are used as the Ga source, TMA (trimethylaluminum) and TEA (triethylaluminum) are used as the Al source, TMI (trimethylindium) and TEI (triethylindium are used as the In source. ) And the like, and gases such as ammonia and hydrazine are used as the nitrogen source. As the impurity source, silane gas is used for Si, germane gas is used for Ge, Cp2Mg (cyclopentadienylmagnesium) is used for Mg, and DEZ (diethyl zinc) is used for Zn. In the MOVPE method, an InAlGaN-based compound semiconductor can be epitaxially grown by supplying these gases to the surface of a substrate heated to, for example, 600 ° C. or more and decomposing the gases.

  A selection mask 22 having an opening 23 opened in a hexagonal shape is formed on the surface of the lower growth layer 21 for crystal growth. As shown in FIG. 3, a semiconductor is formed by selective growth from the opening 23 opened in the hexagonal shape. Layer 24 is formed. The selection mask 22 is a growth inhibition film formed directly on the main surface of the substrate or on a buffer layer or other layer formed on the substrate. For example, a mask material made of an insulating film such as a silicon oxide film or a silicon nitride film is used. used. The shape of the mask is a hexagonal shape as an example, but may be a belt shape, a circular shape, an arc shape, or a polygonal shape such as a triangular shape or a pentagonal shape.

  When the selective growth mask 22 and the like are formed, the semiconductor layer 24 is formed by selective crystal growth. Crystal growth can be performed by the same method as that for forming the compound semiconductor layer described above. Specific examples of the growth method include various vapor phase growth methods. For example, vapor phase methods such as metal organic compound vapor phase growth method (MOCVD (MOVPE) method) and molecular beam epitaxy method (MBE method). A growth method or a hydride vapor phase growth method (HVPE method) can be used.

  In this method of manufacturing a semiconductor light emitting device, the semiconductor layer 24 is formed by selective growth. The inclined crystal plane of the semiconductor layer 24 is preferably a {1-101} plane or a {11-22} plane or these. It is desirable that the plane be selected from planes substantially equivalent to the planes of the above, and a crystal plane that appears by selective growth under required conditions. The growth layer surrounded by these inclined crystal planes has a hexagonal pyramid shape, and has a pointed shape with a substantially triangular cross section. As the inclined crystal plane, for example, the main surface of the substrate is the C + plane, so that it is substantially the S plane or a plane substantially equivalent to the S plane, or a {11-22} plane or a {11-22} plane. Therefore, an equivalent surface can be easily formed. That is, when selective growth is performed, the S plane and the {11-22} plane are inclined planes that are inclined with respect to the main surface of the substrate, and are stable planes that are seen when selectively grown on the C + plane. It is an easy-to-obtain aspect. The S + plane and the S− plane exist for the S plane in the same manner as the C + plane and the C− plane exist on the C plane. In this specification, unless otherwise specified, the S + plane is formed on the C + plane GaN. The surface is growing, and this is described as the S surface. For the S surface, the S + surface is a stable surface. The plane index of the C + plane is (0001).

  As for the S plane, when a crystal layer is formed using a gallium nitride compound semiconductor, the number of bonds from Ga to N is 2 or 3 and the largest after the C-plane on the S plane. Here, since the C-plane cannot be practically obtained on the C + plane, the number of bonds on the S-plane is the largest. For example, when nitride is grown on a sapphire substrate having a C + plane as a main surface, the surface of a wurtzite nitride is generally a C + plane, but the S plane is stably formed by utilizing selective growth. The N bond, which tends to desorb in a plane parallel to the C + plane, is bonded from Ga by a single bond, whereas the inclined S plane is bonded by at least one pound. It will be. Therefore, the V / III ratio is effectively increased, which is advantageous for improving the crystallinity of the laminated structure. Further, when growing in a different direction from the substrate, dislocations extending upward from the substrate may be bent, which is advantageous for reducing defects.

  In such a semiconductor layer 24, as shown in FIG. 4, a first conductivity type cladding layer 25, a first active layer 26, and a second conductivity type cladding layer 27 are laminated on an inclined surface. In experiments conducted on nitride semiconductors by the present inventors, when the grown facet structure was observed using cathodoluminescence, the crystal on the S-plane, which is an inclined plane, was of good quality and its luminous efficiency compared to the C + plane. Is shown to be higher. In particular, the growth temperature of the InGaN active layer is set to 700 to 800 ° C., for example. At this temperature, ammonia decomposition efficiency is low, and more N species are required. When the surface was observed with AFM, the steps were aligned and a surface suitable for InGaN uptake was observed. Furthermore, the growth surface of the Mg-doped layer generally has a poor surface state at the AFM level, but it has been found that this Mg-doped layer also grows in a good surface state due to the growth of the S-plane, and the doping conditions differ considerably. . Microscopic photoluminescence mapping can be measured with a resolution of about 0.5-1 μm, but the normal method grown on the C + plane has unevenness of about 1 μm pitch, and selective growth. Uniform results were obtained for the samples that obtained the S-plane. Further, the flatness of the slope as seen by SEM is smoother than the C + plane.

  In the first conductivity type cladding layer 25, the first active layer 26, and the second conductivity type cladding layer 27 stacked on the inclined surface, the first conductivity type is p-type or n-type, and the second conductivity type is The opposite conductivity type. For example, when the crystal layer constituting the S plane is composed of a silicon-doped gallium nitride compound semiconductor layer, the n-type cladding layer 25 is composed of a silicon-doped gallium nitride compound semiconductor layer, and the InGaN layer is activated thereon A double heterostructure can be formed by forming the layer 26 and further forming a magnesium-doped gallium nitride compound semiconductor layer as the p-type cladding layer 27 thereon.

  It is also possible to adopt a structure in which, for example, an InGaN layer that is the first active layer 26 is sandwiched between AlGaN layers, or an AlGaN layer is formed only on one side. The first active layer 26 can also be composed of a single bulk active layer. However, the first active layer 26 has a single quantum well (SQW) structure, a double quantum well (DQW) structure, and a multiple quantum well (MQW) structure. A quantum well structure such as that described above may be formed. In the quantum well structure, a barrier layer is used in combination for separating the quantum well as necessary. When the active layer 26 is an InGaN layer, the structure is easy to manufacture, especially in the manufacturing process, and the light emission characteristics of the device can be improved. Furthermore, this InGaN layer is particularly easy to crystallize in the growth on the S plane, which is a structure in which nitrogen atoms are not easily detached, and the crystallinity is improved, so that the luminous efficiency can be increased. Nitride semiconductors are non-doped and have n-type properties due to nitrogen vacancies formed in the crystal, but usually by doping a donor impurity such as Si, Ge, or Se during crystal growth, A preferred n-type can be obtained. In order to make the nitride semiconductor p-type, it can be obtained by doping the crystal with acceptor impurities such as Mg, Zn, C, Be, Ca, Ba, etc. In order to obtain a p-layer with a high carrier concentration. After doping with acceptor impurities, annealing is preferably performed at 400 ° C. or higher in an inert gas atmosphere such as nitrogen or argon. There is also a method of activation by electron beam irradiation, which is active by microwave irradiation or light irradiation. There is also a way to make it.

  Electrodes are connected directly or indirectly to the first conductivity type cladding layer 25 and the second conductivity type cladding layer 27 sandwiching the first active layer 26. Each electrode is formed for each element, but either the p-electrode or the n-electrode can be shared. In order to reduce the contact resistance, a required contact layer may be formed, and then an electrode may be formed on the contact layer. In general, each electrode is formed by depositing a multilayer metal film by vapor deposition or the like, but can be finely processed by lift-off or the like using photolithography in order to classify each element. Each electrode can be formed on one surface of the selective crystal growth layer or the substrate, or electrodes can be formed on both sides so that the electrodes are wired at a higher density. The independently driven electrodes may be formed by finely processing the same material, but it is also possible to use different electrode materials for each region. Further, since the first conductivity type cladding layer 25 is electrically connected to the lower semiconductor layer 21, the n-side electrode may be formed so as to be connected to the lower semiconductor layer 21. In particular, since the lower semiconductor layer 21 is also used as a bonding surface, it can be used as a part of the n-side electrode by providing an electrode on the bonding surface or imparting conductivity to the bonding layer.

  In particular, the semiconductor light emitting device of the present invention may have a structure in which electrodes are selectively formed only in a portion having a good crystal structure. For example, when there is a region where the crystal steps are not aligned on the crystal plane, the electrode can be formed by removing the region where the steps are not aligned. The existence of such a region where the crystal steps are not aligned can be grasped by observation using AFM, empirical rules, etc. As an example, a structure that excludes a portion on the ridgeline or a region close to the end The electrode can be formed.

  Next, as shown in FIG. 5, the substrate 20 is peeled off. Although it is possible to remove the substrate 20 by etching, polishing, or the like, when the substrate 20 is a transparent sapphire substrate, it is possible to irradiate an ultraviolet laser beam, for example, an excimer laser beam from the back surface of the substrate 20. Laser ablation occurs between the substrate 20 and the lower semiconductor layer 21 thereon. In this laser ablation, a beam in the range of ultraviolet rays is irradiated to generate nitrogen in GaN, which is the material of the lower semiconductor layer 21, from the light absorption energy of the beam at the interface between the substrate 20 and the lower semiconductor layer 21. In this technique, the substrate 20 and the lower semiconductor layer 21 are separated. When the substrate 20 is a sapphire substrate, the excimer laser beam can be irradiated through the sapphire substrate, and the substrate 20 and the lower semiconductor layer 21 can be easily separated. The separation of the substrate 20 exposes the bottom surface 28 of the lower semiconductor layer 21.

  A second semiconductor light emitting layer is formed on the GaAs substrate 30 in parallel with or before or after the manufacturing process on the first semiconductor light emitting layer side. Specifically, a structure in which an AlGaInP-based double heterostructure is provided on a GaAs substrate 30 and a second active layer 32 as a second semiconductor light emitting layer is provided between a pair of cladding layers 31 and 33. Have As the combination of the active layer 32 and the clad layers 31 and 33, those composed only of AlGaInP, those composed of AlGaInP and GaInP, those composed of AlInP and AlGaInP, and the like can be used. Each layer of these AlGaInP-based double heterostructures is, for example, a layer formed while lattice-matching on a GaAs substrate, and each has a zinc blende crystal structure.

  After providing an AlGaInP-based double heterostructure on the GaAs substrate 30, an adhesive layer 34 is formed on the entire surface as shown in FIG. The adhesive layer 34 is made of, for example, a thermoplastic or thermosetting synthetic resin, an ultraviolet curable resin, an electron beam curable resin, or the like. The adhesive layer 34 is formed by being applied to the upper surface of the AlGaInP-based compound semiconductor layers 31 to 33 on the GaAs substrate 30. For example, the adhesive substrate 34 may be configured by applying an adhesive layer to one or both sides of the support substrate. May be used as a mounting substrate.

  After the formation of the adhesive layer 34, as shown in FIG. 7, the bottom surface of the lower semiconductor layer 21 is bonded to the upper portion of the adhesive layer 34, and the first semiconductor light emitting layer side and the second semiconductor light emitting layer side are bonded. combine. By this bonding step, an AlGaInP double heterostructure is located on the light emission side of the pyramidal GaN-based semiconductor layer, and light from the first active layer 26 is used for light emission of the second active layer 32. Is done. After such bonding, the GaAs substrate 30 is peeled off from the clad layer 31 which is an AlGaInP-based compound semiconductor layer by laser ablation. By a YAG laser irradiation, for example, from the back side of the GaAs substrate 30, energy is collected at the interface between the GaAs substrate 30 and the cladding layer 31, and laser ablation occurs. If laser ablation is unlikely to occur in the cladding layer 31, a sacrificial layer may be provided at the interface between the GaAs substrate 30 and the cladding layer 31. In the case of laser ablation, the conditions of the laser wavelength, the substrate wavelength, and the sacrificial layer wavelength are such that sacrificial layer wavelength> laser wavelength> substrate wavelength, so that energy is absorbed in the sacrificial layer during laser irradiation.

  In this manufacturing method, laser ablation is used to peel off the GaAs substrate 30. However, the present invention is not limited to this, and the GaAs substrate 30 can be removed by etching or polished. When the GaAs substrate 30 is removed by etching, the GaAs substrate 30 itself can be etched, but the intermediate layer may be etched away by an epitaxial lift-off technique, and the GaAs substrate 30 may be removed.

  By removing the GaAs substrate 30 as described above, a semiconductor light emitting device as shown in FIG. 8 is formed. The configuration on the first semiconductor light emitting layer side formed of the hexagonal pyramid-shaped crystal growth portion 24 has a GaN-based wurtzite type semiconductor crystal structure, while the GaAs substrate 30 is removed from the second semiconductor light emitting layer side. The structure has an AlGaInP-based zinc blende crystal structure. From these combinations, the current can be applied only to the structurally relatively strong GaN-based wurtzite semiconductor crystal structure side, so that the lifetime of the element can be easily extended. In addition, since it has a structure in which the structure on the first semiconductor light emitting layer side and the structure on the second semiconductor light emitting layer side are combined after peeling off the substrate at the time of growth, the growth substrate can be repeatedly used, Further, a configuration that does not include As contained in the GaAs substrate 30 or the like is realized. Further, since photoexcitation occurs only on the second semiconductor light emitting layer side and no substantial current is injected, even if there are cracks or large crystal defects in the second semiconductor light emitting layer, these are directly applied to the current. Compared with the case of injecting the light, the degree of hindering the emission is low.

  Further, in the semiconductor light emitting device manufactured according to the present embodiment, the light excited by the first active layer 26 is wavelength-converted and output by the second active layer 32, and the phosphor is used. Compared to a light emitting element, the color purity can be increased, and at the same time, luminance saturation is suppressed and high luminance display is possible. When a color image display device is configured using such a semiconductor light emitting element of this embodiment, excitation light from the blue first active layer 26 can be converted to red, and a GaN-based semiconductor crystal having the same configuration Since the structure can be utilized as blue or green as it is, at least the same GaN-based semiconductor crystal structure is arranged in an array as will be described later, and the second active layer 32 is partially formed to perform wavelength conversion. Thus, a high-definition image display device can be created. The growth substrate on which the second semiconductor light emitting layer is grown is not limited to the GaAs substrate described above, and other substrates used as an epitaxial growth substrate such as an InP substrate and a sapphire substrate can be used as appropriate.

[An example of a semiconductor light emitting device using a resin package]
Next, a semiconductor light emitting element having a structure in which a light emitting diode is disposed in another resin package will be described with reference to FIG. In the semiconductor light emitting device of this embodiment, a light emitting diode 50 having a first semiconductor light emitting layer that emits predetermined light is formed in a resin package 51, and light from the first semiconductor light emitting layer is emitted from the light emitting device. A second semiconductor light emitting layer that emits light when excited is bonded to the resin package 51 and is configured.

  As shown in FIG. 9, a GaN-based light emitting diode 50 is disposed so as to be surrounded by a resin package 51 made of a resin material having relatively high heat resistance such as polyimide resin or epoxy resin. The light-emitting diode 50 has a hexagonal pyramid-shaped pointed structure 53 in which a silicon-doped GaN layer, an active layer made of an InGaN layer, and a magnesium-doped GaN layer are stacked as described above. This active layer functions as a first semiconductor light emitting layer that emits predetermined light. A lower growth layer 52 at the time of selective growth is continuous on the lower side of the hexagonal pyramidal apex structure portion 53, and a lower electrode pad 55 is formed by being electrically connected to the lower growth layer 52. An upper electrode pad 54 is formed so as to be connected to a p-electrode (not shown) on the side of the hexagonal pyramidal apex structure portion 53. A wiring layer is connected to the lower electrode pad 55 and the upper electrode pad 54 through a portion in which the resin package 51 is perforated when mounted on a display device.

  Such a resin package 51 has a structure in which an AlGaInP double heterostructure layer bonded via an adhesive layer 56 is provided on the bottom surface side, and a second semiconductor light emitting layer is interposed between the pair of clad layers 57 and 59. The second active layer 58 is provided. As the combination of the active layer and the clad layer, one composed only of AlGaInP, one composed of AlGaInP and GaInP, one composed of AlInP and AlGaInP, or the like can be used. These AlGaInP-based double heterostructure layers are wavelength conversion regions for emitting red light, and function as a second semiconductor light emitting layer that emits light when excited by light from the first semiconductor light emitting layer.

  As described above, in the semiconductor light emitting device of this embodiment, the AlGaInP-based double heterostructure layer on the side of the second semiconductor light emitting layer that emits light is bonded directly via the adhesive layer 56, not the device. Specifically, it is the bottom surface of the resin package 51. Since the light from the GaN-based light emitting diode 50 is sufficiently transmitted through the resin package 51 and the adhesive layer 56, the excitation light reaches the second active layer 58, where it is excited by the light from the first semiconductor light emitting layer. Then, wavelength conversion is performed to output red light.

  In the semiconductor light emitting device of this embodiment, the color purity can be made higher than that of a light emitting device using a phosphor, and at the same time, luminance saturation is suppressed and high luminance display is possible. In addition, since the current can be applied only to the structurally relatively strong GaN-based wurtzite semiconductor crystal structure side, the lifetime of the element can be easily increased. Also, a configuration that does not include As contained in a GaAs substrate or the like is realized.

  Further, when a color image display device is configured using such a semiconductor light emitting element of this embodiment, excitation light from the blue first active layer can be converted to red, and a GaN-based semiconductor having the same configuration Since the crystal structure can be utilized as blue or green as it is, as described later, at least the same GaN-based semiconductor crystal structure is arranged in an array, and a second active layer 58 is formed in part to perform wavelength conversion. By doing so, a high-definition image display device can be created.

[Two-stage enlargement transfer method]
The semiconductor light-emitting element using the resin package shown in FIG. 9 is suitable particularly when an image display apparatus is configured by using an enlarged transfer method as described in FIGS.

  In the method for manufacturing a semiconductor light emitting device according to this embodiment, the temporary holding member is arranged so that the device formed on the first substrate with a high degree of integration is separated from the device arranged on the first substrate. Next, two-stage enlarged transfer is performed in which the element held on the temporary holding member is further separated and transferred onto the second substrate. In this embodiment, the transfer is performed in two stages. However, the transfer can be performed in three stages or more stages depending on the degree of enlargement in which the elements are spaced apart.

  10 and 11 are diagrams showing the basic steps of the two-stage enlarged transfer method. First, elements 112 such as light emitting diodes are densely formed on the first substrate 110 shown in FIG. By forming the elements densely, the number of elements generated per substrate can be increased, and the product cost can be reduced. The first substrate 110 is a substrate capable of forming various elements such as a semiconductor wafer, a glass substrate, a quartz glass substrate, a sapphire substrate, and a plastic substrate, but each element 112 is formed directly on the first substrate 110. Alternatively, it may be an array of those formed on another substrate.

  Next, as shown in FIG. 10B, each element 112 is transferred from the first substrate 110 to a temporary holding member 111 indicated by a broken line in the figure, and each element 112 is held on the temporary holding member 111. Is done. Here, adjacent elements 112 are spaced apart and arranged in a matrix as shown. That is, the element 112 is transferred so as to extend between the elements in the x direction, but is also transferred so as to extend between the elements in the y direction perpendicular to the x direction. The distance that is separated at this time is not particularly limited, and can be a distance that takes into consideration the formation of the resin portion and the formation of the electrode pad in the subsequent process as an example. When transferring from the first substrate 110 onto the temporary holding member 111, all the elements on the first substrate 110 can be transferred separately. In this case, the size of the temporary holding member 111 may be equal to or larger than the size obtained by multiplying the number of elements 112 arranged in a matrix (each in the x direction and the y direction) by the separated distance. Further, it is possible to transfer a part of the elements on the first substrate 110 on the temporary holding member 111 while being separated.

  As will be described later, the transfer of the element 112 to the temporary holding member 111 can be performed by using mechanical means using a required suction jig or actuator, or by heat or light. After applying a resin that causes a reaction such as softening, curing, crosslinking, or deterioration, the film may be selectively transferred by locally irradiating heat or light to cause peeling or adhesion. Furthermore, the image may be transferred by a combination of heat, light and mechanical means. In general, the surfaces of the temporary holding member 111 and the first substrate 110 are transferred while facing each other. However, the elements 112 are once separated from the first substrate 110 into individual chips, and the individual elements 112 are separated. You may make it arrange in the member 111 for temporary holding anew.

  After such a first transfer step, as shown in FIG. 10 (c), the elements 112 existing on the temporary holding member 111 are separated from each other. Coating and electrode pad formation are performed. The resin coating around the element is formed to facilitate the formation of an electrode pad and facilitate the handling in the next second transfer step. As will be described later, since the electrode pad is formed after the second transfer step in which the final wiring is continued, the electrode pad is formed in a relatively large size so that no wiring defect occurs at that time. Note that the electrode pads are not shown in FIG. The resin forming chip 114 is formed by covering the periphery of each element 112 with the resin 113. The element 112 is located at the approximate center of the resin-formed chip 114 on a plane, but may be present at a position deviated toward one side or corner.

  Next, as shown in FIG. 10 (d), a second transfer process is performed. In this second transfer step, the elements 112 arranged in a matrix on the temporary holding member 111 are transferred onto the second substrate 115 so as to be further separated together with the resin forming chips 114. Similar to the first transfer step, this transfer can also be performed using mechanical means using a required jig or actuator, or softened, cured, crosslinked, or deteriorated by heat or light. After applying a resin or the like that causes a reaction such as the above, selective transfer may be performed by locally irradiating heat or light to cause peeling or adhesion. Furthermore, the image may be transferred by a combination of heat, light and mechanical means.

  Also in the second transfer step, the adjacent elements 112 are separated from each other with the resin forming chip 114 and arranged in a matrix as shown in the figure. That is, the element 112 is transferred so as to extend between the elements in the x direction, but is also transferred so as to extend between the elements in the y direction perpendicular to the x direction. If the position of the element arranged by the second transfer process is a position corresponding to the pixel of the final product such as an image display device, an approximately integer multiple of the pitch between the original elements 112 is arranged by the second transfer process. It becomes the pitch of the element 112 made. Here, assuming that the enlargement rate of the pitch from the first substrate 110 to the temporary holding member 111 is n and the enlargement rate of the pitch from the temporary holding member 111 to the second substrate 115 is m, it is substantially an integer multiple. The value E is expressed as E = nxm. The enlargement ratios n and m may be integers, and may be combinations that are not integers but E is an integer (for example, n = 2.4 and m = 5).

  Wiring is applied to each element 112 separated from the second substrate 115 together with the resin forming chip 114. At this time, wiring is performed while suppressing connection failure as much as possible by using the previously formed electrode pad or the like. For example, in the case where the element 112 is a light emitting element such as a light emitting diode, the wiring includes wiring to the p electrode and the n electrode.

  Next, FIG. 11 is a modification of the two-stage enlarged transfer method of FIG. 10, and is an embodiment in which the transfer method from the first substrate 110a to the temporary holding member 111a is different. As shown in FIG. 11A, elements 112 such as light emitting diodes are densely formed on the first substrate 110a. The plurality of elements 112 are arranged in a matrix on the first substrate 110a, and the first substrate 110a itself is, for example, a semiconductor wafer, a glass substrate, a quartz glass substrate, a sapphire substrate, a plastic, like the first substrate 10 in FIG. Although various elements such as a substrate can be formed, each element 112 may be formed directly on the first substrate 110 or may be an array of elements formed on other substrates. good.

  Thus, when the plurality of elements 112 are formed in a matrix on the first substrate 110a, the elements 112 are transferred to the temporary holding member 111a while being separated. In this case, the first substrate 110a and the temporary holding member 111a are held so as to face each other, and a plurality of elements 112 arranged in a matrix on the first substrate 110a are transferred so as to be thinned out. That is, when a certain element 112 on the first substrate 110a is transferred, the adjacent peripheral element 112 is not transferred, and the element 112 at a position separated by a required distance is formed between the first substrate 110a and the temporary holding member 111a. Transcribed while confronting. The adjacent surrounding elements 112 are left on the first substrate 110a by this thinning transfer, but by transferring them to a separate temporary holding member, the densely formed elements 112 can be effectively used without wasting them. The

  As will be described later, the transfer of the element 112 to the temporary holding member 111a can be performed by using a mechanical means using a required suction jig or actuator, or by heat or light. After applying a resin that causes a reaction such as softening, curing, crosslinking, or deterioration, the film may be selectively transferred by locally irradiating heat or light to cause peeling or adhesion. Furthermore, the image may be transferred by a combination of heat, light and mechanical means.

  After such a first transfer step, as shown in FIG. 11C, since the elements 112 existing on the temporary holding member 111a are separated, the resin 113 around the elements is provided for each element 112. And the electrode pad are formed, and then the second transfer step is performed as shown in FIG. In the second transfer step, the elements 12 arranged in a matrix on the temporary holding member 111 a are transferred onto the second substrate 115 so as to be further separated from the resin forming chip 114. The covering of the resin 113 around the elements, the formation of the electrode pads, and the second transfer process are the same as those described with reference to FIG. 10, and the same is true in that the necessary wiring is formed after the two-stage enlarged transfer. is there.

In the two-stage enlarged transfer method shown in FIGS. 10 and 11, electrode pads and resin hardening can be performed using the separated space after the first transfer, and wiring is applied after the second transfer. However, wiring is performed while using the previously formed electrode pads or the like to suppress connection failures as much as possible. Therefore, the yield of the image display device can be improved. Further, in the two-stage enlargement transfer method of this embodiment, the process of separating the distance between the elements is two processes, and the transfer is actually performed by performing such a multiple-process enlargement transfer that separates the distance between the elements. The number of times will decrease. That is, for example, the enlargement ratio of the pitches separated from the first substrates 110 and 110a by the temporary holding members 111 and 111a is 2 (n = 2), and the temporary holding members 111 and 111a and the second substrate 115 are If the enlargement rate of the separated pitch of 2 is 2 (m = 2), the final enlargement rate is 4 times 2 × 2, and the transfer of 16 times of the square is performed when transferring to the enlarged range by one transfer. That is, the first substrate needs to be aligned 16 times. However, in the two-stage enlargement transfer method of this embodiment, the number of alignments is four times the square of the enlargement ratio 2 in the first transfer step and the second transfer step. That is, a total of 8 times, which is simply the addition of 4 times the square of the enlargement factor of 2, is sufficient. That is, when the same transfer magnification is intended, since (n + m) ² = n ² +2 nm + m ² , the number of times of transfer can always be reduced by 2 nm. Therefore, the manufacturing process also saves time and money by the number of times, which is particularly useful when the enlargement rate is large.

  In the two-stage enlarged transfer method shown in FIGS. 10 and 11, the element 112 is, for example, a light emitting element or a liquid crystal control element, but is not limited thereto, and other elements such as a photoelectric conversion element, a piezoelectric element, and a thin film transistor. It may be an element selected from an element, a thin film diode element, a resistance element, a switching element, a minute magnetic element, a minute optical element, a portion thereof, a combination thereof, or the like.

[Other examples of thinning transfer]

  FIG. 12 is a diagram showing another example of the thinning transfer shown in FIGS. 11 (a) and 11 (b). Thinning transfer is performed by selectively transferring elements while facing the transfer source substrate and the transfer destination substrate (member). However, by making the transfer destination substrate (member) large, It is possible to move all of the elements on the substrate to the transfer destination substrate (member).

  FIG. 12 shows an example in the case of an enlargement ratio of 3 in the first transfer process. When the first substrate 110c is used as a unit, the temporary holding member 111c has an area 9 times the square of 3. Therefore, in order to transfer all of the elements 12 on the first substrate 110c, which is the transfer source substrate, a total of nine transfers are performed. The elements 112 arranged in a matrix on the first substrate 110c are divided into 3 × 3 matrix units, and one of the elements 112 is sequentially transferred to the temporary holding member 111c, and finally the entire element 112 is formed. Transcribed.

  FIG. 12A schematically shows a state where the first element 112 is transferred to the temporary holding member 111c for each 3 × 3 matrix unit among the elements 112 on the first substrate 110c. (B) schematically shows that the second element 112 is transferred to the temporary holding member 111c for each 3 × 3 matrix unit. In the second transfer, the alignment position of the first substrate 110c with respect to the temporary holding member 111c is shifted in the vertical direction in the figure, and the elements 12 can be arranged apart by repeating the same thinning transfer. . FIG. 3C schematically shows that the eighth element 112 is transferred to the temporary holding member 111c for each 3 × 3 matrix unit, and FIG. 3D shows a 3 × 3 matrix unit. The ninth element 112 is schematically shown as being transferred to the temporary holding member 111c. At the time when the ninth element 112 is transferred for each 3 × 3 matrix unit, the first substrate 110c has no element 112, and the temporary holding member 111c has a plurality of elements 112 separated in a matrix form. Will be held at. Thereafter, two-stage enlarged transfer is executed by the steps (c) and (d) of FIGS.

[Resin forming chip]
Next, with reference to FIG. 13 and FIG. 14, the resin-formed chip formed on the temporary holding member and transferred to the second substrate will be described. The resin-forming chip 120 is obtained by hardening the periphery of the element 121 that is spaced apart with the resin 122. The resin-forming chip 120 transfers the element 121 from the temporary holding member to the second substrate. It can be used in some cases.

  The element 121 is an example of a light emitting element as described later, but is not limited to the light emitting element, and may be another element. The resin-forming chip 120 has a substantially square shape with a main surface substantially square. The shape of the resin-forming chip 120 is a shape formed by solidifying the resin 122. Specifically, an uncured resin is applied to the entire surface so as to include the respective elements 121, and the edge portion after this is cured. Is a shape obtained by cutting the substrate by dicing or the like. Electrode pads 123 and 124 are formed on the front side and the back side of the substantially flat resin 122, respectively. The electrode pads 123 and 124 are formed by forming a conductive layer such as a metal layer or a polycrystalline silicon layer as a material for the electrode pads 123 and 124 on the entire surface, and patterning the conductive electrode into a required electrode shape by a photolithography technique. Is done. These electrode pads 123 and 124 are formed so as to be connected to the p electrode and the n electrode of the element 121 which is a light emitting element, respectively, and a via hole or the like is formed in the resin 122 when necessary.

  Here, the electrode pads 123 and 124 are formed on the front surface side and the back surface side of the resin forming chip 120, respectively, but it is also possible to form both electrode pads on one surface. The reason why the positions of the electrode pads 123 and 124 are shifted on the flat plate is to prevent the electrode pads 123 and 124 from overlapping even if contacts are made from the upper side when the final wiring is formed. The shape of the electrode pads 123 and 124 is not limited to a square, and may be other shapes.

  By configuring such a resin forming chip 120, the periphery of the element 121 is covered with the resin 122, and the electrode pads 123 and 124 can be formed with high precision by planarization, and the electrode pads 123 and 124 are formed in a wider area than the element 121. When the transfer in the next second transfer step is advanced by a suction jig, the handling becomes easy. As will be described later, since the final wiring is performed after the second transfer step, the wiring failure is prevented by performing the wiring using the electrode pads 123 and 124 having a relatively large size.

[Light Emitting Element Arranged on Resin Forming Chip]
FIG. 15 shows a structure of a light emitting element as an example of an element disposed on the resin-formed chip. FIG. 15A is an element cross-sectional view, and FIG. 15B is a plan view. This light-emitting element is a GaN-based light-emitting diode, for example, an element that is crystal-grown on a sapphire substrate. In such a GaN-based light emitting diode, as described above, laser ablation occurs due to laser irradiation that passes through the substrate, and at the interface between the sapphire substrate and the GaN-based growth layer due to the phenomenon that GaN nitrogen is vaporized. Peeling occurs and the element can be easily separated.

  First, with respect to the structure, a hexagonal pyramid-shaped GaN layer 132 selectively formed on an underlying growth layer 131 made of a GaN-based semiconductor layer is formed. Note that an insulating film (not shown) is present on the underlying growth layer 131, and the hexagonal pyramid-shaped GaN layer 132 is formed by a MOCVD method or the like in a portion where the insulating film is opened. The GaN layer 132 is a pyramidal growth layer covered with an S plane (1-101 plane) when the main surface of a sapphire substrate used during growth is a C plane, and is a region doped with silicon. is there. The inclined S-plane portion of the GaN layer 132 functions as a double heterostructure cladding. An InGaN layer 133, which is an active layer, is formed so as to cover the inclined S-plane of the GaN layer 132, and a magnesium-doped GaN layer 134 is formed outside thereof. This magnesium-doped GaN layer 134 also functions as a cladding.

  In such a light emitting diode, a p-electrode 135 and an n-electrode 136 are formed. The p-electrode 135 is formed by depositing a metal material such as Ni / Pt / Au or Ni (Pd) / Pt / Au formed on the magnesium-doped GaN layer 134. The n-electrode 136 is formed by vapor-depositing a metal material such as Ti / Al / Pt / Au at a portion where an insulating film (not shown) is opened. When the n-electrode is taken out from the back side of the base growth layer 131, the formation of the n electrode 136 is not necessary on the surface side of the base growth layer 131.

  A GaN-based light emitting diode with such a structure is an element capable of emitting blue light, and can be peeled off from a sapphire substrate relatively easily by laser ablation, and is selected by selectively irradiating a laser beam. Exfoliation is realized. The GaN-based light emitting diode may have a structure in which an active layer is formed on a flat plate or in a strip shape, or may have a pyramid structure in which a C surface is formed at the upper end. Further, other nitride-based light emitting elements, compound semiconductor elements, and the like may be used.

[Method of arranging light emitting elements]
Next, a method for arranging the light emitting elements will be described with reference to FIGS. As the light emitting element, the GaN-based light emitting diode shown in FIG. 15 is used.

  First, as shown in FIG. 16, a plurality of light emitting diodes 142 are formed in a matrix on the main surface of the first substrate 141. The size of the light emitting diode 142 may be about 20 μm. As the constituent material of the first substrate 141, a material having a high transmittance at the wavelength of the laser irradiated to the photodiode 142, such as a sapphire substrate, is used. The light-emitting diode 142 is formed up to the p-electrode and the like, but the final wiring has not yet been made, and the element-isolating groove 142g is formed, so that the individual light-emitting diodes 142 can be separated. The groove 142g is formed by reactive ion etching, for example. As shown in FIG. 16, the first substrate 141 is selectively transferred to the temporary holding member 143.

  A peeling layer 144 and an adhesive layer 145 are formed in two layers on the surface of the temporary holding member 143 facing the first substrate 141. Here, as an example of the temporary holding member 141, a glass substrate, a quartz glass substrate, a plastic substrate, or the like can be used. As an example of the peeling layer 144 on the temporary holding member 141, a fluorine coat, a silicone resin, a water-soluble material, or the like. An adhesive (for example, PVA), polyimide, or the like can be used. In addition, as the adhesive layer 145 of the temporary holding member 143, a layer made of any of an ultraviolet (UV) curable adhesive, a thermosetting adhesive, and a thermoplastic adhesive can be used. As an example, a quartz glass substrate is used as the temporary holding member 143, a polyimide film 4 μm is formed as the release layer 144, and then a UV curable adhesive as the adhesive layer 145 is applied with a thickness of about 20 μm.

  The adhesive layer 145 of the temporary holding member 143 is adjusted so that the cured region 145s and the uncured region 145y are mixed, and is aligned so that the light-emitting diode 142 for selective transfer is positioned in the uncured region 145y. . The adjustment so that the cured region 145s and the uncured region 145y are mixed is performed by, for example, selectively exposing the UV curable adhesive to 200 μm pitch with an exposure machine at a pitch of 200 μm and transferring the light emitting diode 142 uncured. Other than that, it may be cured. After such alignment, the light emitting diode 142 at that position is irradiated from the back surface of the first substrate 141 with a laser, and the light emitting diode 142 is peeled off from the first substrate 141 using laser ablation. Since the GaN-based light emitting diode 142 is decomposed into metallic Ga and nitrogen at the interface with sapphire, it can be peeled off relatively easily. As the laser to be irradiated, an excimer laser, a harmonic YAG laser, or the like is used.

  By this peeling using laser ablation, the light emitting diode 142 for selective irradiation is separated at the interface between the GaN layer and the first substrate 141, and the p electrode portion of the light emitting diode 142 is formed in the uncured region 145 y of the adhesive layer 145 on the opposite side. It is transcribed as if pierced. Regarding the light emitting diode 142 in the region where the other laser is not irradiated, the corresponding adhesive layer 145 is a cured region 145s, and since it is not irradiated with the laser, it is transferred to the temporary holding member 143 side. Absent. In FIG. 16, only one light emitting diode 142 is selectively irradiated with laser, but it is assumed that the light emitting diode 142 is also irradiated with laser in a region separated by n pitches. By such selective transfer, the light-emitting diodes 142 are arranged on the temporary holding member 143 at a distance from that when the light-emitting diodes 142 are arranged on the first substrate 141.

  Next, when the selective transfer of the light emitting diode 142 from the first substrate 141 to the temporary holding member 143 is performed, the adhesive layer 145 in the uncured region 145y is cured as shown in FIG. To fix. This curing is possible by applying energy such as heat and light. The light emitting diode 142 is held on the adhesive layer 145 of the temporary holding member 143, and the back surface of the light emitting diode 142 is on the n electrode side (cathode electrode side). Therefore, when the electrode pad 146 is formed, the electrode pad 146 is electrically connected to the back surface of the light-emitting diode 142.

  As an example of the cleaning of the adhesive layer 145, the adhesive resin is etched by oxygen plasma and cleaned by UV ozone irradiation. Further, when the GaN-based light emitting diode is peeled off from the first substrate 141 made of a sapphire substrate by laser, Ga is deposited on the peeled surface, so that it is necessary to etch the Ga, and the NaOH aqueous solution or rare Will be done with nitric acid. Thereafter, the electrode pad 146 is patterned. At this time, the electrode pad on the cathode side can be about 60 μm square. As the electrode pad 146, a transparent electrode (ITO, ZnO-based, etc.) or a material such as Ti / Al / Pt / Au is used. In the case of a transparent electrode, even if the back surface of the light emitting diode is largely covered, light emission is not interrupted, so that the patterning accuracy is rough, a large electrode can be formed, and the patterning process becomes easy.

  In FIG. 18, the light-emitting diode 142 is transferred from the temporary holding member 143 to the second temporary holding member 147 to form the anode electrode (p electrode) side via hole 150, and then the anode side electrode pad 149 is formed. A state where the adhesive layer 145 made of resin is diced is shown. As a result of this dicing, an element isolation groove 151 is formed, and the light emitting diode 142 is divided for each element. The element isolation groove 151 includes a plurality of parallel lines extending vertically and horizontally as a planar pattern in order to isolate the matrix light emitting diodes 142. The surface of the second temporary holding member 147 faces the bottom of the element isolation groove 151. A release layer 148 is formed on the second temporary holding member 147. The release layer 148 can be formed using, for example, a fluorine coat, a silicone resin, a water-soluble adhesive (for example, PVA), polyimide, or the like. The second temporary holding member 147 is a so-called dicing sheet in which a UV adhesive material is applied to a plastic substrate as an example, and a material whose adhesive strength decreases when UV is irradiated can be used. Excimer laser is irradiated from the back surface of the temporary holding member 147. Thereby, for example, when polyimide is formed as the peeling layer 144, peeling occurs due to polyimide ablation at the interface between the polyimide and the quartz substrate, and each light emitting diode 142 is transferred to the second temporary holding member 147 side. .

  As an example of this process, the surface of the second temporary holding member 147 is etched with oxygen plasma until the surface of the light emitting diode 142 is exposed. First, an excimer laser, a harmonic YAG laser, or a carbon dioxide gas laser can be used to form the via hole 150. At this time, the via hole has a diameter of about 3 to 7 μm. The anode side electrode pad is formed of Ni / Pt / Au or the like. In the dicing process, dicing using a normal blade is performed, and when cutting with a narrow width of 20 μm or less is required, processing using a laser using the laser is performed. The cut width depends on the size of the light emitting diode 142 covered with the adhesive layer 145 made of resin in the pixel of the image display device. As an example, a groove having a width of about 40 μm is formed with an excimer laser to form a chip shape.

  Next, the light emitting diode 142 is peeled from the second temporary holding member 147 using mechanical means. FIG. 19 is a view showing a state where the light-emitting diodes 142 arranged on the second temporary holding member 147 are picked up by the suction device 153. The suction holes 155 at this time are opened in a matrix at the pixel pitch of the image display device so that a large number of light emitting diodes 142 can be sucked together. The opening diameter at this time is about φ100 μm, for example, and is opened in a matrix of 600 μm pitch, and about 300 pieces can be adsorbed collectively. As the member of the suction hole 155 at this time, for example, a member produced by Ni electroforming or a metal plate 152 such as SUS formed by etching is used. A chamber 154 is formed, and the light-emitting diode 142 can be adsorbed by controlling the adsorption chamber 154 to a negative pressure. The light-emitting diode 142 is covered with an adhesive layer 145 made of resin at this stage, and the upper surface thereof is substantially flattened. Therefore, selective adsorption by the adsorption device 153 can be easily advanced.

  FIG. 20 is a view showing a state where the light emitting diode 142 is transferred to the GaAs substrate 165. When the GaAs substrate 165 is mounted, the adhesive layer 161 is applied in advance to the GaAs substrate 165, the adhesive layer 161 on the lower surface of the light emitting diode 142 is cured, and the light emitting diode 142 is fixedly arranged on the GaAs substrate 165. be able to.

  The surface of the GaAs substrate 165 to which the adhesive layer 161 is applied is provided with an AlGaInP double heterostructure layer functioning as a second semiconductor light emitting layer, and the second semiconductor is interposed between the pair of clad layers 162 and 164. The second active layer 163 as a light emitting layer is provided. As the combination of the active layer and the clad layer, one composed only of AlGaInP, one composed of AlGaInP and GaInP, one composed of AlInP and AlGaInP, or the like can be used. These AlGaInP-based double heterostructure layers are wavelength conversion regions for emitting red light, and function as a second semiconductor light emitting layer that emits light when excited by light from the first semiconductor light emitting layer.

  When this element is mounted, the adsorption chamber 154 of the adsorption device 153 is in a high pressure state, and the coupled state by adsorption between the adsorption device 153 and the light emitting diode 142 is released. The adhesive layer 161 can be composed of a UV curable adhesive, a thermosetting adhesive, a thermoplastic adhesive, or the like. At that time, it is also possible to supply from the back surface of the energy GaAs substrate 165 for curing the resin of the adhesive layer 161.

[Example of semiconductor light emitting device]
In FIG. 21, three light emitting diodes 202 are bonded to the compound semiconductor structure 201, and the three light emitting diodes 202 have the same structure, but output the light emission wavelengths of the three primary colors of red, green, and blue.

  Specifically, the three light-emitting diodes 206, 207, and 208 bonded to the compound semiconductor structure 201 are GaN-based light-emitting diodes having the same wurtzite crystal structure, and are formed on the lower growth layer 203 made of a GaN-based semiconductor layer. A hexagonal pyramid-shaped GaN layer selectively grown is formed. This GaN layer is a pyramid-type growth layer covered with an S plane (1-101 plane), and the inclined S plane portion of the GaN layer has a double heterostructure cladding, an InGaN layer as an active layer, and When a magnesium-doped GaN layer functioning as a clad is sequentially formed and current is supplied, blue light is emitted as an example. The compound semiconductor structure 201 is an AlGaInP compound semiconductor layer having a zinc blende type crystal structure formed by lattice matching on a GaAs substrate, and is obtained by removing the GaAs substrate by laser ablation or the like.

  In the compound semiconductor structure 201 below the light emitting diode 206, an AlGaInP-based second active layer 205 that emits red light using blue light as excitation light is formed. A second active layer 204 that emits green light using blue light as excitation light is formed in the compound semiconductor structure 201 below the light emitting diode 207. In the compound semiconductor structure 201 below the light emitting diode 208, the second active layer is not formed in order to output blue light as it is.

  The semiconductor light emitting device having such a structure has a structure in which three or three types of light emitting elements are formed in one module, which is advantageous when performing color image display. In particular, when a semiconductor light-emitting device is configured with a combination of three light-emitting elements, the alignment of the three light-emitting diodes 206, 207, and 208 has already been accurately performed in the device. In the case of configuring a display, a high-definition image display device can be manufactured simply by arranging these semiconductor light emitting devices with high precision. Further, the compound semiconductor structure 201 itself not only corresponds to the three light emitting diodes 206, 207, and 208, but can also be developed on the entire screen or a predetermined region. This pattern can also be a stripe pattern or a spot pattern corresponding to a plurality of light emitting diodes.

  In the semiconductor light emitting device, color purity can be increased as compared with a light emitting device using a phosphor, and at the same time, luminance saturation is suppressed and high luminance display is possible. In addition, since the current can be applied only to the structurally relatively strong GaN-based wurtzite semiconductor crystal structure side, the lifetime of the element can be easily increased. Also, a configuration that does not include As contained in a GaAs substrate or the like is realized.

  When a color image display device is configured using the semiconductor light emitting device of this embodiment, the GaN-based semiconductor having the same configuration can convert excitation light from the blue first active layer into red. Since the crystal structure can be used as blue or green as it is, as described later, at least the same GaN-based semiconductor crystal structure is arranged in an array, and a second active layer is formed in part to perform wavelength conversion. Thus, a high-definition image display device can be created.

  FIG. 22 is a process cross-sectional view for explaining a method for manufacturing a semiconductor light-emitting device. After the light-emitting diodes 210 are formed in an array form, the flash is stacked and lattice-matched on the GaAs substrate 220 via the adhesive layer 213. The light emitting diodes 210 are bonded onto the AlGaInP-based compound semiconductor layers 214, 215, and 216 having a zinc ore type crystal structure. The compound semiconductor layer 215 functions as a second active layer that is excited by light from the first semiconductor light emitting layer and emits light, and the compound semiconductor layers 214 and 216 function as cladding layers. An ablation layer 217 is formed between the AlGaInP compound semiconductor layers 214, 215, and 216 and the GaAs substrate 220. The ablation layer 217 is a sacrificial layer at the time of ablation, and is a layer for absorbing the laser energy by the ablation and destroying the GaAs substrate 220 easily.

  The pointed side of the light emitting diodes 210 arranged in an array is held on the support substrate 211 via the resin layer 212. In this way, when the whole of the light emitting diodes 210 arranged in an array is held by the support substrate 211, a laser beam such as a YAG laser and ultraviolet rays are irradiated from the back surface of the GaAs substrate 220 to sacrifice the ablation layer 217 to the GaAs substrate. 220 is peeled off. By peeling off the GaAs substrate 220, the semiconductor light emitting device can be made substantially free of As, and an image display device that is desirable in terms of environmental protection can be provided.

  As conditions for realizing such laser ablation, E (laser) is the energy of the laser, Eg (sub) is the band gap of the GaAs substrate 220, and Eg (ab) is the band gap of the ablation layer 217. The condition that the laser beam passes through the GaAs substrate 220 is that E (laser) is smaller than Eg (sub), and the condition that the ablation layer 217 absorbs the laser beam is that Eg (ab) is smaller than E (laser). Need to be done. When specific numerical values are entered, E (laser) is 1.17 eV in the fundamental wave of YAG, and Eg (sub) is 1.42 eV in the case of a GaAs substrate. It is possible to provide an ablation layer 217 that lattice matches with the GaAs substrate 220, such as GaInAs, GaInNAs, AlGaInAs, and GaInAsP that satisfy 1.17 eV from the condition from the fundamental wave of YAG.

  In the above-described embodiment, the example of the light emitting diode is mainly described as the light emitting element, but the light emitting element may be a semiconductor laser. Moreover, although the 2nd semiconductor light emitting layer bonded together to the 1st semiconductor light emitting layer side was demonstrated by the AlGaInP type compound semiconductor layer, the compound semiconductor layer which has another wavelength conversion function may be sufficient. In addition, the first semiconductor light emitting layer and the second semiconductor light emitting layer are connected via an adhesive layer, but between them, an optical member such as a lens, a mirror, a grating, a diaphragm, an opening, A space may be included, and the first semiconductor light-emitting layer and the second semiconductor light-emitting layer may be separated from each other as long as the relationship of light input and output can be maintained. In addition, the number relationship between the first semiconductor light emitting layer and the second semiconductor light emitting layer is not limited to one-to-one, and may be one-to-many, many-to-one, many-to-many, or the like. good.

  According to the semiconductor light-emitting element and the semiconductor light-emitting device of the present invention, the color purity can be made higher than that of a light-emitting element using a phosphor, and at the same time, luminance saturation is suppressed and high-luminance display is possible Become. In particular, the GaN-based semiconductor crystal structure has the advantage that the structure does not break even at high current values with respect to current injection, and has a long life. By limiting to the ore-type semiconductor crystal structure side, it is possible to easily extend the lifetime of the element. Also, a configuration that does not include As contained in a GaAs substrate or the like is realized.

  Further, when a color image display device is configured using the semiconductor light emitting element and the semiconductor light emitting device of the present invention, the excitation light from the blue first active layer can be converted into red, and the GaN-based semiconductor having the same configuration Since the crystal structure can be used as blue or green as it is, as described later, at least the same GaN-based semiconductor crystal structure is arranged in an array, and a second active layer is formed in part to perform wavelength conversion. Thus, a high-definition image display device can be created.

  Further, in the manufacturing method, the sapphire substrate on the first semiconductor light emitting layer side and the GaAs substrate on the second semiconductor light emitting layer side can be peeled off during the manufacturing process by using laser ablation. Yield can be improved.

1 is a side cross-sectional view showing a partially broken element structure of an embodiment of a semiconductor light emitting element of the present invention. It is process sectional drawing for demonstrating the manufacturing method of one Embodiment of the semiconductor light-emitting device of this invention to process order, Comprising: It is process sectional drawing until formation of a selection mask. It is process sectional drawing for demonstrating the manufacturing method of one Embodiment of the semiconductor light-emitting device of this invention to process order, Comprising: It is process sectional drawing until formation of the semiconductor layer by selective growth. It is process sectional drawing for demonstrating the manufacturing method of one Embodiment of the semiconductor light-emitting device of this invention to process order, Comprising: The 1st conductivity type clad layer, 1st active layer, and 2nd conductivity type on an inclined surface It is process sectional drawing until formation of a clad layer. It is process sectional drawing for demonstrating the manufacturing method of one Embodiment of the semiconductor light-emitting device of this invention to process order, Comprising: It is process sectional drawing until peeling of a board | substrate. It is process sectional drawing for demonstrating the manufacturing method of one Embodiment of the semiconductor light-emitting device of this invention to process order, Comprising: It is process sectional drawing until formation of the contact bonding layer by the side of a 2nd semiconductor light-emitting layer. It is process sectional drawing for demonstrating the manufacturing method of one Embodiment of the semiconductor light-emitting device of this invention to process order, Comprising: It is process sectional drawing until the removal of the board | substrate of the 2nd semiconductor light-emitting layer side. It is process sectional drawing for demonstrating the manufacturing method of one Embodiment of the semiconductor light-emitting device of this invention to process order, Comprising: It is process sectional drawing until element completion. It is sectional drawing which shows the element structure of one Embodiment of the semiconductor light-emitting device of this invention. It is a schematic diagram which shows an example of the manufacturing method of the semiconductor light-emitting device of embodiment of this invention. It is a schematic diagram which shows an example of the manufacturing method of the other semiconductor light-emitting device of embodiment of this invention. It is a schematic diagram which shows thinning-out transfer in the manufacturing method of the semiconductor light-emitting device of embodiment of this invention. It is a schematic perspective view which shows the resin formation chip | tip in the manufacturing method of the semiconductor light-emitting device of embodiment of this invention. It is a schematic plan view which shows the resin formation chip | tip in the manufacturing method of the semiconductor light-emitting device of embodiment of this invention. It is a figure which shows the example of the light emitting element used for the manufacturing method of the semiconductor light emitting element of embodiment of this invention, Comprising: It is (a) sectional drawing and (b) top view. It is process sectional drawing of the 1st transcription | transfer process in the manufacturing method of the semiconductor light-emitting device of embodiment of this invention. It is process sectional drawing of the electrode pad formation process in the manufacturing method of the semiconductor light-emitting device of embodiment of this invention. It is process sectional drawing of the other electrode pad formation process in the manufacturing method of the semiconductor light-emitting device of embodiment of this invention. It is process sectional drawing of the adsorption | suction process in the manufacturing method of the semiconductor light-emitting device of embodiment of this invention. It is process sectional drawing of the bonding process in the manufacturing method of the semiconductor light-emitting device of embodiment of this invention. 1 is a schematic cross-sectional view of an example of a semiconductor light emitting device according to an embodiment of the present invention. It is process sectional drawing of the laser ablation process in the manufacturing method of the semiconductor light-emitting device of embodiment of this invention.

10 Cladding layer 11 Second active layer 12 Cladding layer 15 Growth inhibition film 16 Silicon-doped GaN layer 17 First active layer 18 Magnesium-doped GaN layer 19 Crystal growth part 20 Substrate 21 Lower growth layer 22 Selection mask 24 Semiconductor layer 25 First conductivity type cladding layer 26 First active layer 27 Second conductivity type cladding layer 30 GaAs substrates 31 to 33 AlGaInP-based compound semiconductor layer 34 Adhesion layer 50 Light emitting diode 51 Resin package 52 Lower growth layer 53 Pointed structure portion 54 Upper electrode pad 55 Lower electrode pad 58 Second active layer 201 Compound semiconductor structure 204, 205 Second active layer 206, 207, 208 Light emitting diode

Claims (26)

A first semiconductor light emitting layer from which a substrate during crystal growth for emitting predetermined light is removed ;
A second semiconductor light-emitting layer that is composed of a semiconductor layer made of a different crystal system from the first semiconductor light-emitting layer and emits light when excited by light from the first semiconductor light-emitting layer;
The emission wavelength from the first semiconductor light emitting layer is different from the emission wavelength from the second semiconductor light emitting layer,
A semiconductor light emitting element characterized by the above.   2. The semiconductor light emitting device according to claim 1, wherein the first semiconductor light emitting layer has a wurtzite crystal structure, and the second semiconductor light emitting layer has a zinc blende crystal structure.   2. The semiconductor light emitting device according to claim 1, wherein the first semiconductor light emitting layer comprises a gallium nitride based semiconductor layer.   2. The semiconductor light emitting element according to claim 1, wherein the second semiconductor light emitting layer comprises a semiconductor layer selected from an AlGaInP semiconductor layer, an AlGaInAs semiconductor layer, a GaInNAs semiconductor layer, and a GaInAsP semiconductor layer.   2. The semiconductor light emitting device according to claim 1, wherein the first semiconductor light emitting layer is formed in the semiconductor structure portion including a pointed growth layer formed by selective growth.   2. The semiconductor light emitting device according to claim 1, wherein the first semiconductor light emitting layer and the second semiconductor light emitting layer have different emission wavelengths.   2. The semiconductor light emitting element according to claim 1, wherein the second semiconductor light emitting layer is formed on a growth substrate, and the growth substrate is peeled off by ablation or etching.   The semiconductor light emitting element according to claim 1, wherein the second semiconductor light emitting layer is attached to the first semiconductor light emitting layer through an adhesive layer. A first semiconductor light emitting layer formed in a resin package, from which a substrate for crystal growth that emits predetermined light is removed ;
A second semiconductor light-emitting layer that is composed of a semiconductor layer made of a different crystal system from the first semiconductor light-emitting layer, is excited by light from the first semiconductor light-emitting layer, and emits light;
A semiconductor light emitting element, wherein an emission wavelength from the first semiconductor light emitting layer is different from an emission wavelength from the second semiconductor light emitting layer.   10. The semiconductor light emitting device according to claim 9, wherein the first semiconductor light emitting layer and the second semiconductor light emitting layer are composed of semiconductor layers made of different crystal systems.   10. The semiconductor light emitting device according to claim 9, wherein the first semiconductor light emitting layer has a wurtzite crystal structure, and the second semiconductor light emitting layer has a zinc blende crystal structure.   The semiconductor light emitting element according to claim 9, wherein the first semiconductor light emitting layer is made of a gallium nitride based semiconductor layer.   10. The semiconductor light emitting element according to claim 9, wherein the second semiconductor light emitting layer comprises a semiconductor layer selected from an AlGaInP based semiconductor layer, an AlGaInAs based semiconductor layer, a GaInNAs based semiconductor layer, and a GaInAsP based semiconductor layer.   10. The semiconductor light emitting device according to claim 9, wherein the first semiconductor light emitting layer is formed in a pointed growth layer formed by selective growth.   The semiconductor light emitting device according to claim 9, wherein the first semiconductor light emitting layer and the second semiconductor light emitting layer have different emission wavelengths.   10. The semiconductor light emitting device according to claim 9, wherein the second semiconductor light emitting layer is formed on a growth substrate, and the growth substrate is peeled off by ablation or etching.   The semiconductor light emitting element according to claim 9, wherein the second semiconductor light emitting layer is attached to the first semiconductor light emitting layer through an adhesive layer. Forming a first semiconductor light emitting layer from which a substrate during crystal growth for emitting predetermined light is removed ;
Forming a second semiconductor light emitting layer that is composed of a semiconductor layer made of a different crystal system from the first semiconductor light emitting layer, and is excited by light from the first semiconductor light emitting layer to emit light;
A method of manufacturing a semiconductor light emitting element, wherein an emission wavelength from the first semiconductor light emitting layer and an emission wavelength from the second semiconductor light emitting layer are different.   19. The second semiconductor light emitting layer is formed by being laminated on a substrate, and the second semiconductor light emitting layer is peeled off from the substrate when bonded to the semiconductor structure. A method for manufacturing a semiconductor light emitting device.   The method of manufacturing a semiconductor light emitting element according to claim 18, wherein the second semiconductor light emitting layer is peeled off from the substrate by laser ablation.   The method of manufacturing a semiconductor light emitting element according to claim 18, wherein the second semiconductor light emitting layer is peeled off from the substrate by removing the substrate by etching. Forming a first semiconductor light emitting layer formed in a resin package, from which a substrate during crystal growth that emits predetermined light is removed ;
Forming a second semiconductor light emitting layer that is composed of a semiconductor layer made of a different crystal system from the first semiconductor light emitting layer, and is excited by light from the first semiconductor light emitting layer to emit light;
The emission wavelength from the first semiconductor light emitting layer is different from the emission wavelength from the second semiconductor light emitting layer,
A method for manufacturing a semiconductor light emitting device.   The said 2nd semiconductor light emitting layer is laminated | stacked and formed on a board | substrate, and when bonding together to the said semiconductor structure part, the said 2nd semiconductor light emitting layer is peeled from the said board | substrate. A method for manufacturing a semiconductor light emitting device.   23. The method of manufacturing a semiconductor light emitting element according to claim 22, wherein the second semiconductor light emitting layer is peeled off from the substrate by laser ablation.   The method of manufacturing a semiconductor light emitting element according to claim 21, wherein the peeling of the second semiconductor light emitting layer from the substrate is performed by removing the substrate by etching. Forming a plurality of semiconductor structures having a first semiconductor light emitting layer from which a substrate during crystal growth for emitting predetermined light is removed ;
A part of the plurality of semiconductor structure portions includes a semiconductor layer made of a crystal system different from that of the first semiconductor light emitting layer that is excited by light from the first semiconductor light emitting layer and emits light. A second semiconductor light emitting layer to be bonded,
A semiconductor light emitting device, wherein an emission wavelength from the first semiconductor light emitting layer is different from an emission wavelength from the second semiconductor light emitting layer.