JP2010249760A - Sample holder - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a sample holder reliably and stably holding a columnar, cylindrical, or spherical sample to a prescribed position of the holder. <P>SOLUTION: The sample holder is equipped with: a cylindrical holder body 1; and a circular-block-like jig 3 divided into a plurality of divided parts and housed in the holder body. A holding recession part 32 having a V-shaped cross section is formed in a center part of the upper surface of the jig 3. The diameter of the jig 3 is set smaller than the inner diameter of the holder body 1. A sample is mounted to the holding recession part 32, and each divided part 31 of the jig is moved to the outside into contact with the inner circumferential surface of the holder body 1. The sample holder in this state holds the sample (s) on the upper surface of the jig 3. <P>COPYRIGHT: (C)2011,JPO&INPIT

Description

  The present invention relates to a sample holder for holding a sample when performing measurement / inspection of an optical system using fluorescent X-ray analysis or an optical microscope. More specifically, the present invention relates to a cylindrical or spherical sample at a predetermined position. The present invention relates to a sample holder that can be securely and stably held.

  Conventionally, when performing fluorescent X-ray measurement, a measurement sample is held in a predetermined holder and irradiated with X-rays. In this case, the holder shown in FIG. 4 is usually used. Generally used.

  That is, as shown in FIG. 4, a conventionally used holder is a cylindrical holder main body 1 having a bottom wall, and a circular block-shaped holding base 6 for height adjustment disposed in the holder main body 1. The lid 2 is formed with a through hole 21 for X-ray irradiation in the center, and the sample s placed on the holding table 6 is irradiated with X-rays through the through hole 21 of the lid 2. The fluorescence is measured. In addition, 5 in FIG. 4 is a spacer for height adjustment.

  However, in the case of such a holder, when the sample s has a columnar shape, a cylindrical shape, a spherical shape, or the like as shown in FIG. 4, it is not always easy to stably place and hold it on the holding base 6, and measurement is performed. It is difficult to securely hold the position in the state where the position is located at the center of the through hole 21.

  In this case, in the X-ray fluorescence measurement, the height and shape of the measurement location (measurement surface) affect the X-ray intensity, and if the measurement is not performed while the sample is accurately held at a predetermined height and position, high precision is required. Measurement cannot be performed. In particular, in the case of a cylindrical, cylindrical or spherical sample s with a curved measurement surface, it is necessary to always hold the sample securely at the same position of the holder in order to perform an accurate analysis. In the case of such a columnar, cylindrical, or spherical sample s, it is difficult to reliably hold it at the center position of the holder.

  Sample holders used for X-ray analysis and the like are also disclosed in JP-A-8-233755 (Patent Document 1) and JP-A-2003-202222 (Patent Document 2). Cylindrical and spherical samples cannot be reliably and stably held.

JP-A-8-233755 JP 2003-202222 A

  The present invention has been made in view of the above circumstances, and can securely and stably hold a columnar, cylindrical, or spherical sample at a predetermined position of a holder. It is an object of the present invention to provide a sample holder that is suitably used when performing measurement / inspection of an optical system using X-ray analysis or an optical microscope.

  In order to achieve the above object, the present invention provides a sample holder for holding a sample in a predetermined measurement / inspection position when performing measurement / inspection of an optical system using fluorescent X-ray analysis, an optical microscope, or the like, A cylindrical holder body having a circular block-like jig that is divided into a plurality of divided portions by a dividing surface passing through the center and stored in the holder body, and A holding recess having a V-shaped cross section on which the sample is placed is formed at the center of the upper surface, and the diameter of the jig in a state where the divided portions are joined is set smaller than the inner diameter of the holder body. The sample is placed in the holding recess, and each divided portion of the jig is moved outward to come into contact with the inner peripheral surface of the holder body, and in this state, the sample is held on the upper surface of the jig. Sample holder configured as To provide.

  That is, as described above, the sample holder of the present invention has a circular block shape (short axis columnar shape) divided into a plurality of divided portions by a dividing surface through which the jig on which the sample is placed passes through the center. Since a holding recess having a V-shaped cross section is formed at the center of the upper surface of the jig, the center of the holding recess is always aligned by moving each divided portion outward and contacting the inner peripheral surface of the holder body. It is located in the center of the holder body. For this reason, by placing the sample in the holding recess and bringing the divided portions into contact with the inner peripheral surface of the holder body, the sample can be reliably and stably set at the center of the sample holder. Even if the sample is cylindrical, cylindrical, spherical, etc., and the measurement / inspection surface is curved, it can be accurately set at the center of the sample holder, and high-precision measurement / inspection can be performed. It can be done.

  According to the sample holder of the present invention, when measuring / inspecting an optical system by fluorescent X-ray analysis, an optical microscope, or the like, even if the sample has an unstable shape such as a columnar shape, a cylindrical shape, a spherical shape, etc. It can be reliably and stably held in position, and highly accurate measurement and inspection can be performed reliably and easily.

It is the perspective view which made a part the cross section which shows an example of this invention sample holder. It is sectional drawing which shows the cup holder. It is sectional drawing which shows the state which set the sample to the cup holder. It is sectional drawing which shows the state which set the sample to the conventional cup holder.

  Hereinafter, the present invention will be specifically described with reference to examples.

  1 to 3 show a sample holder according to an embodiment of the present invention. A cylindrical holder body 1 having a bottom wall, a lid body 2 having a through hole for measurement at the center, and a holder body. 1, a jig 3 accommodated in 1, a spacer 4 for adjusting the height of the jig 3, and a sliding plate 5 disposed between the spacer 4 and the jig 3.

  The jig 3 is a circular block (short axis columnar) member in which a V-shaped groove-shaped holding recess 32 is formed along the diametrical direction at the center of the upper surface, and coincides with the bottom of the holding recess 32 and is cured. It is divided into two division parts 31, 31 by a division plane passing through the center of the tool. The jig 3 is set so that its diameter is smaller than the inner diameter of the holder body 1 in a state where the divided surfaces are joined.

  The jig 3 is placed on the spacer 4 via the sliding plate 5, and the height of the jig 3 is adjusted according to the size and shape of the sample s. The sliding plate 5 is provided so that each divided portion 31 of the jig 3 can smoothly slide on the spacer 4 and can be omitted if it can slide smoothly on the spacer 4 directly. can do.

  The lid 2 has a through-hole 21 for measurement / inspection formed in the center thereof, and the through-hole 21 is placed on the holder body 1 in the state of being covered with the upper portion of the holder body 1 as shown in FIG. It matches the center position of the main body. In this case, although not particularly illustrated, screws that are screwed to each other are formed on the inner peripheral surface of the cover body 2 and the upper peripheral surface of the peripheral wall upper portion of the holder body 1, and the cover body 2 is screwed on the upper portion of the holder body 1. Can be attached to the formula. Then, by firmly turning the screw-type lid 2, the sample s, the jig 3, the sliding plate 5 and the spacer 4 are pressed, and the sample holder always has a certain height by the action of the spacer 4, Since the height of the sample holder can always be set to a constant height while the sample s is securely held, the sample holder can be satisfactorily applied to an auto sampler of various measuring instruments.

  When, for example, a fluorescent X-ray measurement is performed on a columnar sample s using this sample holder, the sample s is placed on the holding recess 32 of the jig 3 as shown in FIG. Then, both the split portions 31 and 31 of the jig 3 are moved outward, and the quantity split portions 31 and 31 are brought into contact with the inner peripheral surface of the holder main body 1 as shown in FIG. At this time, when the sample s has a certain amount of weight, the two divided portions 31 and 31 are naturally moved outward due to the weight of the sample s, but the divided portion 31 does not move smoothly due to the weight of the sample s. In other words, both the split portions 31, 31 may be moved outward by manual work.

  By this operation, as shown in FIG. 3, the sample s is stably held in the holding recess 32 of the jig 3, and is securely held in the center of the sample holder. In this state, the lid 2 is put on the holder body 1, the sample holder is set at a predetermined position of the measuring device, and desired measurement / inspection is performed through the through hole 21 of the lid 2. For example, X-ray fluorescence measurement can be performed by irradiating the surface of the sample s through the through hole 21 with X-rays.

  Thus, the sample holder of this example has a circular block shape (short-axis columnar shape) divided into two divided portions 31 and 31 on a divided surface passing through the center of the jig 3 on which the sample s is placed. Since the V-shaped groove-shaped holding recess 32 is formed at the center of the upper surface of the jig, by moving the divided portions 31 and 31 to the outside and bringing them into contact with the inner peripheral surface of the holder body 1, The center of the holding recess 32 is always located at the center of the holder body 1. For this reason, by placing the sample s in the holding recess 32 and bringing the divided portions 31 and 31 into contact with the inner peripheral surface of the holder body 1, the sample s can be reliably and stably placed in the sample holder. Even if the measurement / inspection surface is curved, such as a cylindrical or cylindrical sample, it can be set accurately at the center of the sample holder, allowing high-precision measurement / It can be inspected.

  The sample holder of the present invention is preferably used when measuring and inspecting an optical system. Examples of the optical system measurement and inspection include fluorescent X-ray analysis, X-ray diffraction, and optical microscope. The inspection by etc. is illustrated.

  The sample holder of the present invention has been described in detail with reference to the examples. However, the sample holder of the present invention is not limited to the above examples, and various modifications can be made. For example, in the above embodiment, the holding recess 32 is a groove having a V-shaped cross section, and the columnar or cylindrical sample s is held, but a spherical sample is held as an inverted conical (funnel-shaped) recess. You may make it do. In this case, it is also preferable to divide the jig 3 into three or more divided parts in order to hold the sample at the center. The lid 2 can be omitted depending on the type of measurement / inspection. Furthermore, other configurations may be appropriately changed without departing from the gist of the present invention.

  The sample holder of the present invention is used as a holder for holding a sample when measuring / inspecting an optical system by fluorescent X-ray analysis, an optical microscope, or the like.

DESCRIPTION OF SYMBOLS 1 Holder main body 2 Cover body 21 Through-hole 3 Jig 31 Dividing part 4 Spacer 5 Sliding plate s Sample

Claims (4)

A sample holder for holding a sample in a predetermined measurement / inspection position when performing measurement / inspection of an optical system by fluorescent X-ray analysis or an optical microscope,
A cylindrical holder body having a bottom wall;
It is divided into a plurality of divided parts by a dividing surface passing through the center, and comprises a circular block-shaped jig stored in the holder body,
In addition, a holding concave portion having a V-shaped cross section on which the sample is placed is formed at the center of the upper surface of the jig, and the diameter of the jig in a state where the divided portions are joined is the height of the holder body. The sample is set smaller than the inner diameter, and the sample is placed in the holding recess, and each divided portion of the jig is moved outward to come into contact with the inner peripheral surface of the holder body. In this state, the sample is cured. Sample holder configured to be held on the top of the tool.   A measurement / inspection through-hole is provided in the center, and a lid is provided on the upper part of the holder body, and the sample is measured / inspected through the through-hole of the lid placed on the holder body. Item 1. The sample holder according to Item 1.   The sample holder according to claim 1 or 2, wherein the jig has a V-shaped groove formed in the diameter direction as the holding recess and is divided into two along the center line of the V-shaped groove. .   The sample holder according to any one of claims 1 to 3, further comprising a spacer for adjusting a height of the jig, wherein the jig is placed on the spacer directly or via a sliding plate.

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