JP2006049165A - Lighting screen inspection method of plasma display panel - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a lighting screen inspection method of a plasma display panel capable of detecting a dynamic screen defect, distinguishing it from a static screen defect. <P>SOLUTION: The plasma display panel has a plurality of discharge cells between a pair of substrates and displays image by generating discharge in each discharge cell. The lighting screen inspection method of the plasma display panel comprises a step (step 1) of obtaining first image data by setting an exposure time as a long-field time and picking up an image, a step (step 2) of obtaining second image data, by setting the exposure time as a short field time and picking up the image, and steps (steps 3-11) of evaluating the image by using the first image data and the second image data. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

  The present invention relates to a lighting screen inspection method for a plasma display panel that displays a plasma display panel in a lighting manner and performs a screen inspection.

  The plasma display panel is configured such that a front substrate and a rear substrate are arranged to face each other so that a discharge space is formed therebetween, a peripheral portion is sealed, and a rare gas is sealed in the discharge space. A plurality of display electrodes composed of scan electrodes and sustain electrodes are formed on the front substrate, and a plurality of address electrodes are formed on the rear substrate in a direction orthogonal to the display electrodes. A discharge cell which is a unit light emitting region is formed in the part. In this plasma display panel, a predetermined voltage is applied to the display electrode and the address electrode to generate a discharge selectively in each discharge cell, and the phosphor layer formed in each discharge cell emits light by discharge, An image is displayed.

When inspecting a lighting image of a display panel such as this plasma display panel, for example, in Patent Document 1, the display panel is turned on, an image of the lighting display panel is captured by an imaging camera, and a pixel cell of the display panel is captured by an image processing device. It is described that the defect and the display unevenness are quantified and determined.
JP 9-218131 A

  As a non-lighting defect of a discharge cell in such a plasma display panel, there may be a discharge cell that is always unlit regardless of how it is driven. In this case, the discharge cell is unlit. Does not change over time. Therefore, such a non-lighted discharge cell is called a static screen defect.

  Further, in the plasma display panel, one field time (1/60 seconds) is divided into a plurality of subfields, and gradation display is performed by selecting a subfield for generating discharge in each discharge cell. For this reason, when a predetermined gradation is displayed, a discharge is generated in a predetermined selected subfield, but in some cases, a certain discharge cell may not be lit in a subfield that should originally be lit. It is a non-lighting defect. In this case, since the state in which the discharge cell is not lit changes with time, such a non-lighted discharge cell is called a dynamic screen defect.

  When the lighting image of the plasma display panel is inspected using the conventional method, the static screen defect can be detected, but the dynamic screen defect is difficult to detect stably. In addition, it is conceivable to inspect all discharge cells for the light emission period of the plasma display panel, that is, every field time, for such a dynamic screen defect, but such inspection takes too much time. Therefore, it was difficult to introduce into the manufacturing site.

  In view of the above, an object of the present invention is to provide a lighting screen inspection method for a plasma display panel that can detect a dynamic screen defect in distinction from a static screen defect.

  In order to achieve the above object, according to the present invention, a step of obtaining first image data by setting an exposure time to a long field time and capturing an image, and an image to be captured by setting the exposure time to a short field time. A method for inspecting a lit screen of a plasma display panel, comprising: obtaining second image data, and evaluating an image using the first image data and the second image data. .

  ADVANTAGE OF THE INVENTION According to this invention, when performing the lighting screen test | inspection of a plasma display panel, a dynamic screen fault can be detected distinguishing from a static screen fault.

  According to a first aspect of the present invention, there is provided a plasma display panel lighting screen inspection method having a plurality of discharge cells between a pair of substrates, and displaying an image by generating a discharge in each discharge cell. Obtaining the first image data by capturing an image by setting the time, obtaining the second image data by capturing the image by setting the exposure time to a short field time, and the first image data And a step of evaluating an image using the second image data, and a lighting screen inspection method for a plasma display panel.

  The invention described in claim 2 is characterized in that, in the invention described in claim 1, difference image data is obtained from the first image data and the second image data, and the image is evaluated using the difference image data. And

  According to a third aspect of the present invention, in the first aspect of the present invention, the first image data is subjected to image processing to obtain a first feature amount representing the feature, the second image data is subjected to image processing, and the first image data is processed. A second feature value representing a feature is obtained, and the image is evaluated by comparing the first feature value and the second feature value.

  According to a fourth aspect of the present invention, in the first aspect of the present invention, at least the step of obtaining the second image data by capturing an image with the exposure time set to a short field time, and the first image The step of evaluating the image using the data and the second image data is performed a plurality of times.

  According to a fifth aspect of the present invention, in the first aspect of the present invention, an image of the plasma display panel is captured in synchronization with a lighting cycle of the plasma display panel.

  Embodiments of the present invention will be described below with reference to the drawings.

(Embodiment 1)
First, the structure of the plasma display panel will be described with reference to FIG. As shown in FIG. 1, the front plate 1 is formed from a dielectric glass so as to form a plurality of display electrode pairs composed of scan electrodes 3 and sustain electrodes 4 on a glass front substrate 2 and to cover the display electrode pairs. The dielectric layer 5 is formed, and the protective layer 6 made of magnesium oxide (MgO) is formed on the dielectric layer 5.

  On the other hand, the back plate 7 disposed opposite to the front plate 1 has a plurality of address electrodes 9 formed on a glass back substrate 8, and a dielectric layer 10 is formed so as to cover the address electrodes 9. A plurality of partition walls 11 parallel to the address electrodes 9 are formed on the body layer 10, and phosphor layers that emit light of red (R), green (G), and blue (B) colors between the adjacent partition walls 11. 12 is formed. The address electrode 9 is located between the adjacent partition walls 11.

  The front substrate 2 and the rear substrate 8 which are a pair of substrates are opposed to each other so that the scan electrodes 3 and the sustain electrodes 4 and the address electrodes 9 are orthogonal to each other, and a peripheral portion of these substrates is a sealing member (not shown). It is sealed using. A discharge gas made of neon and xenon is sealed in a discharge space formed between the front substrate 2 and the rear substrate 8, and a discharge cell is formed at the three-dimensional intersection of the scan electrode 3, the sustain electrode 4 and the address electrode 9. It is formed. That is, a plurality of discharge cells are provided between a pair of substrates. This discharge cell is a unit light emitting region for displaying an image, and one pixel is formed by three adjacent discharge cells formed with phosphor layers 12 that emit light in R, G, and B colors.

  In this plasma display panel, one field time (1/60 seconds) is divided into a plurality of subfields, and gradation expression is performed by combining subfields that generate discharge in each discharge cell. In each subfield, a scan cell to be displayed is selected by sequentially applying a scan pulse to the scan electrode 3 and applying an address pulse to the address electrode 9 based on the image data, and then the scan electrode 3 and the sustain electrode 4 are selected. By alternately applying sustain pulses, a sustain discharge is generated in the selected discharge cell. As a result, ultraviolet rays are generated in the discharge cells in which the sustain discharge has occurred, and visible light of each color is emitted from the phosphor layer 12 excited by the ultraviolet rays, and image display is performed.

  Next, a method of performing a lighting screen inspection for such a plasma display panel will be described.

  FIG. 2 is an explanatory diagram of the lighting screen inspection apparatus according to Embodiment 1 of the present invention. In FIG. 2, the plasma display panel 14 installed on the panel inspection table 13 is driven by the drive circuit control means 15 and is in a lighting state. One or a plurality of the lighting images controlled by the camera imaging control means 16 are displayed. Imaging can be performed by a single camera (imaging means) 17. The exposure time of the camera 17 is arbitrarily set by the exposure time control means 18 via the camera imaging control means 16. The image data of the image captured by the camera 17 is processed by the image processing unit 19 and the result is output.

  The image processing unit 19 includes a long field time exposure image storage unit 20 that stores an image captured in an arbitrary long field time that is an integral multiple of one field time that is a display cycle of the plasma display panel 14, and one field. Short field time exposure image storage means 21 for storing images picked up in a short field time of several hours, or image brightness correction processing means 22 and 23 for performing brightness correction processing on these image data; The image difference processing means 24 that performs image difference processing of the brightness corrected image data, the defect extraction processing means 25 that performs defect extraction from the image difference processed image data, and the defect extraction processing means 25 It is constituted by a quality determination means 26 for determining quality from the feature amount of the defect. Further, the defect extraction processing means 25 is a smoothing processing means 27 for removing noise, a peripheral comparison processing means 28 for extracting a change point from the background periphery in the processed image, and a defect area 2 from the processed image. The binarization labeling means 29 and the feature quantity extraction means 30 for calculating a plurality of feature quantities such as area, average density, width, and length of the binarized and labeled area are configured.

  FIG. 3 shows an operation flow of the lighting screen inspection apparatus according to Embodiment 1 of the present invention. By performing each step from Step 1 to Step 11, the dynamic screen defect of the plasma display panel can be inspected. it can. Hereinafter, each step will be described.

  First, in step 1, an image of the plasma display panel 14 is captured using the camera 17 under the condition that the exposure time is set to the long field time by the exposure time control means 18, and the image data (first image data) is obtained. Input to the long field time exposure image storage means 20. In step 2, an image of the plasma display panel 14 is captured using the camera 17 under the condition that the exposure time is set to the short field time, and the image data (second image data) is stored in the short field time exposure image. Input to means 21. Here, as an example, the long field time is set to about 60 field times (1 second), and the short field time is set to about 1 field time (1/60 seconds).

  Next, since the first image data and the second image data obtained in step 1 and step 2 have different imaging conditions, image difference processing was performed using the first image data and the second image data as they were. It is difficult to obtain good results. Therefore, normalization of the first image data and the second image data is performed. That is, in step 3, long field time exposure image correction is performed on the first image data using the image luminance correction processing unit 22, and in step 4, the second image data is processed on the image luminance correction processing unit 23. Short field time exposure image correction.

  Here, FIG. 4 shows an example of a change in the lighting rate for each field time of a discharge cell (referred to as a flashing cell) that becomes a dynamic screen defect. As shown in FIG. 4, the lighting rate of the blinking cell is often in a state where the lighting rate is probabilistically low or high. FIG. 5 shows an example of image data of a captured image. FIG. 5A shows the first image data obtained by long field time exposure, and FIGS. 5B to 5D show short images. It is the 2nd image data obtained by field time exposure. 5B shows a case where the lighting rate of the flashing cell is low (lighting rate 0%), FIG. 5C shows a case where the lighting rate of the flashing cell is an intermediate value (lighting rate 50%), and FIG. ) Shows a case where the lighting rate of the blinking cell is high (lighting rate 100%).

  In FIG. 5, the image data changes so as to vibrate in a short cycle because there is a portion that does not contribute to light emission, such as the partition wall 11 provided in the plasma display panel 14. Data is extremely small. In addition, a blinking cell exists in the area A in FIG. In the flashing cell portion, as shown in FIGS. 5B to 5D, the image data is small when the lighting rate of the flashing cell is low, and the image data is large when the lighting rate of the flashing cell is high. The size of the data varies depending on the lighting rate of the blinking cell. Further, as shown in FIG. 5A, the value of the first image data in the blinking cell portion is a value when the lighting rate of the blinking cell is an average value. If attention is paid to this point, there is no difference between the first image data and the second image data in the portion that does not contribute to light emission, such as the partition wall 11, the portion that emits light normally, and the portion of the static screen defect. In the dynamic screen defect portion, a difference occurs between the first image data and the second image data.

  Therefore, in the next step 5, the image difference processing means 24 is used to perform image difference processing for obtaining a difference between the normalized first image data and the normalized second image data. In the image data (difference image data) obtained by performing this image difference processing, the value of the difference image data differs greatly between the dynamic screen defect part and the other part, and by specifying that part, The dynamic screen defect can be detected by distinguishing it from the static screen defect.

  Next, defect extraction is performed by performing steps 6 to 9 on the difference image data using the defect extraction processing unit 25.

  In step 6, smoothing processing is performed on the difference image data by the smoothing processing means 27. This smoothing process is a process aimed at removing and suppressing noise in the image.

  In the next step 7, the peripheral comparison processing means 28 performs peripheral comparison processing for the purpose of shading correction of image data and enhancement processing of defective portions. This peripheral comparison process is a process in which, for example, the sum of the differences between the image data of the pixel to be processed (target pixel) and the image data of the peripheral pixels is newly set as the image data of the target pixel. This is a process of extracting a change point from the background periphery in the processed image. When this peripheral comparison process is performed, the image data at the pixel corresponding to the position of the dynamic screen defect becomes a larger value than the image data at the other pixels.

  In the next step 8, the binarization labeling means 29 performs binarization labeling processing. That is, this is a process of setting a certain threshold value for the image data that has been subjected to the peripheral comparison process in step 7, and extracting pixels whose image data is equal to or greater than the threshold value. By performing this binarization labeling process, it is possible to extract a region where pixels having image data equal to or greater than a threshold value are present (referred to as a labeled region).

  In the next step 9, feature amount extraction is performed by the feature amount extraction means 30. Here, the feature amount is the area, width, length, average density, and the like of the labeled region.

  In the next step 10, the pass / fail determination unit 26 performs pass / fail determination on the extracted feature quantity based on a predetermined pass / fail determination criterion. For example, when a predetermined determination reference value is determined for each of the area, width, length, and average density of a labeled region that is a feature amount, and any one of the extracted feature amounts is larger than the determination reference value In this case, it is possible to determine whether the panel is good or bad with respect to the dynamic screen defect by using the extracted feature amount, such as determining that the panel is defective because the dynamic screen defect exists. Finally, in step 11, the determination result of pass / fail determination is output, and the inspection is terminated. As described above, the image of the plasma display panel can be evaluated by performing Steps 3 to 11 which are the steps of evaluating the image using the first image data and the second image data.

  As described above, according to the configuration of the first embodiment, image difference processing between the long field time exposure image and the short field time exposure image is performed using the image difference processing means 24, so that there is no temporal change. Differentiating from static screen defects such as non-lighting discharge cells, it becomes possible to detect dynamic screen defects such as blinking cells with temporal changes, and high-precision and high-speed inspection can be realized.

(Embodiment 2)
A lighting screen inspection method for a plasma display panel according to Embodiment 2 of the present invention will be described with reference to FIG. Steps 1 to 10 shown in FIG. 6 are the same as steps 1 to 10 described in FIG. 3. In step 11 of FIG. 6, steps 1 to 10 are repeated. I am trying to do it. If it is determined that the panel is defective while it is repeatedly performed a plurality of times, the process proceeds to step 12 to output the determination result and the inspection is terminated. If it is not determined that the panel is defective even if the steps 1 to 10 are repeated a predetermined number of times, the panel is determined to be non-defective and the inspection is terminated.

  Thereby, in the first inspection, if the lighting rate of the blinking cell becomes an intermediate value at the timing of capturing the short field time exposure image, and the difference between the short field time exposure image and the long field time exposure image is almost eliminated. Although it is difficult to extract the dynamic screen defect, it is possible to improve the probability that a difference image having a large difference due to the dynamic screen defect can be obtained by repeating Step 1 to Step 10. Become.

  According to the second embodiment, since the image difference process between the long field time exposure image and the short field time exposure image is performed a plurality of times, the difference between the long field time exposure image and the short field time exposure image is reduced. It becomes possible to improve the probability of increasing, and it becomes possible to detect a dynamic screen defect such as a blinking cell with a temporal change, distinguishing it from a static screen defect such as a non-light discharge cell without a temporal change, High-precision and high-speed inspection can be realized.

  In FIG. 6, the repeat operation of step 11 repeats the imaging of the long field time exposure image. However, when the long field time exposure image is captured once, the captured image data is used thereafter and the short field time exposure image is used. It is also possible to repeatedly perform image capturing and to perform image difference processing.

(Embodiment 3)
Next, a lighting screen inspection method for a plasma display panel according to Embodiment 3 of the present invention will be described with reference to FIGS.

  FIG. 7 is an explanatory diagram of a lighting screen inspection apparatus for a plasma display panel according to Embodiment 3 of the present invention. In FIG. 7, the same reference numerals are used for the same configurations as those in FIG. 2, and the image processing unit 31 is different from the configuration in FIG. 2. Therefore, the image processing unit 31 will be mainly described below.

  In FIG. 7, the image processing unit 31 sets the exposure time to the long field time and the short field time by the exposure time control unit 18, and the image data captured by the camera 17 under the conditions controlled by the camera imaging control unit 16. Is input, predetermined image processing is performed on the image data, and a determination result is output. The image processing unit 31 includes a long field time exposure image storage unit 20 and a short field time exposure image storage unit 21 that store images captured at the exposure time set to the long field time and the short field time, respectively. Defect extraction processing means 25 for extracting feature amounts from the image data, feature amount comparison processing means 32 for comparing the extracted feature amounts, and pass / fail determination means 33 for determining pass / fail of the panel from the result. have. Here, the feature amount is the same as the feature amount described in the first embodiment.

  Next, a lighting screen inspection method for a plasma display panel according to Embodiment 3 of the present invention will be described with reference to FIG.

  First, in step 1, an image of the plasma display panel 14 is captured using the camera 17 under the condition that the exposure time is set to the long field time by the exposure time control means 18, and the image data (first image data) is obtained. Input to the long field time exposure image storage means 20. Smoothing processing (step 2), peripheral comparison processing (step 3), binarization labeling processing (step 4), long field time feature extraction (step 5) on the first image data obtained in step 1 By performing each of these processes, a feature amount (first feature amount) is extracted from the first image data. Here, each processing in step 2 to step 5 is the same as each processing in step 6 to step 9 described in the first embodiment.

  In step 6, an image of the plasma display panel 14 is taken using the camera 17 under the condition that the exposure time is set to the short field time, and the image data (second image data) is stored in the short field time exposure image. Input to means 21. Smoothing processing (step 7), peripheral comparison processing (step 8), binarization labeling processing (step 9), short field time feature extraction (step 10) on the second image data obtained in step 6 By performing each of these processes, it is possible to extract a feature amount (second feature amount) from the second image data. Here, each processing in step 7 to step 10 is the same as each processing in step 6 to step 9 described in the first embodiment.

  In the next step 11, with respect to the first feature quantity and the second feature quantity extracted from each of the first image data and the second image data, the feature quantity comparison processing means 32 determines the presence / absence of a defect, the position of the defect, and the defect. Comparison processing is performed for the size of the.

  In the next step 12, the pass / fail determination means 33 performs pass / fail determination on the result of the comparison process based on a predetermined pass / fail determination criterion. Finally, in step 13, the pass / fail determination result is output, and the inspection is terminated. As described above, the image of the plasma display panel can be evaluated by performing Steps 2 to 5 and Steps 7 to 13 which are steps for evaluating the image using the first image data and the second image data.

  Here, in a static screen defect such as a non-light discharge cell that does not change with time, there is no significant difference between the feature amounts extracted from the first image data and the second image data.

  As a result, according to the third embodiment, the feature amount comparison processing means 32 is used to compare the feature amount extracted from each of the long field time exposure image and the short field time exposure image, thereby changing the temporal change. Differentiating from static screen defects such as non-lighting discharge cells that are not accompanied, dynamic screen defects such as blinking cells that change with time can be detected, and high-accuracy and high-speed inspection can be realized.

(Embodiment 4)
A lighting screen inspection method for a plasma display panel according to Embodiment 4 of the present invention will be described with reference to FIG. Steps 1 to 12 shown in FIG. 9 are the same as steps 1 to 12 described in FIG. 8. In step 13 of FIG. 9, steps 1 to 12 are repeated. I am trying to do it. If it is determined that the panel is defective while it is repeatedly performed a plurality of times, the process proceeds to step 14 to output the determination result and the inspection is terminated. If it is not determined that the panel is defective even if the steps 1 to 12 are repeated a predetermined number of times, the panel is determined to be non-defective and the inspection is terminated.

  Thereby, in the first inspection, if the lighting rate of the blinking cell becomes an intermediate value at the timing of capturing the short field time exposure image, and the difference between the short field time exposure image and the long field time exposure image is almost eliminated. However, it is difficult to extract a dynamic screen defect, but it is possible to improve the probability that a difference image having a large difference due to the dynamic screen defect is obtained by repeating Step 1 to Step 12. Become.

  According to the fourth embodiment, the feature amount comparison process for comparing the feature amount obtained from the long field time exposure image and the feature amount obtained from the short field time exposure image is performed a plurality of times. It is possible to improve the probability that the difference between the field time exposure image and the short field time exposure image becomes large, and it is accompanied by a time change, as distinguished from a static screen defect such as a non-light discharge cell without a time change. Dynamic screen defects such as blinking cells can be detected, and high-precision and high-speed inspection can be realized.

  In FIG. 9, the repeat operation of step 13 repeats the imaging of the long field time exposure image. However, when the long field time exposure image is captured once and the feature amount is extracted, the extracted feature amount is thereafter used. Alternatively, the feature amount comparison process may be performed by extracting only the short field time exposure image and extracting the feature amount.

(Embodiment 5)
A lighting screen inspection method for a plasma display panel according to Embodiment 5 of the present invention will be described with reference to FIGS.

  FIG. 10 is an explanatory diagram of a lighting screen inspection device for a plasma display panel in accordance with the fifth exemplary embodiment of the present invention. 10, the same components as those in FIG. 2 are denoted by the same reference numerals, and description thereof is omitted. As shown in FIG. 10, the panel vertical synchronization processing unit 34 allows the camera 17 to capture an image in accordance with the panel vertical synchronization signal output from the drive circuit control means 15. Other configurations are the same as those shown in FIG.

  FIG. 11 shows a flow of the plasma display panel lighting screen inspection method according to the fifth embodiment. First, in step 1, the panel vertical synchronization processing unit 34 matches the panel vertical synchronization with the camera synchronization. Subsequent steps 2 to 12 are the same as steps 1 to 11 shown in FIG.

  By synchronizing the panel vertical synchronization with the camera synchronization, an image is captured in synchronization with the lighting cycle of the plasma display panel. In the short field time exposure image, the flashing cell is turned on as shown in FIG. It is possible to reduce the case where the rate becomes an intermediate value.

  According to such a configuration, by combining the panel vertical synchronization and the camera synchronization, it is possible to reduce the probability that the lighting rate of the blinking cell becomes an intermediate value, and static such as a non-lighting discharge cell without a temporal change. Differentiating from screen defects, dynamic screen defects such as blinking cells with temporal changes can be inspected with high accuracy and high speed.

  In the fifth embodiment, the panel vertical synchronization processing unit 34 is provided in the first embodiment to match the panel vertical synchronization and the camera synchronization. However, in the second to fourth embodiments, the panel vertical synchronization is performed. A synchronization processing unit 34 may be provided to synchronize panel vertical synchronization and camera synchronization.

  As described above, according to the present invention, in a lighting screen inspection of a plasma display panel, a dynamic screen defect accompanying a temporal change such as a blinking cell can be detected separately from a static screen defect such as a non-light discharge cell. Therefore, it is useful for inspecting the lighting screen of the plasma display panel.

The perspective view which shows the principal part of a plasma display panel Explanatory drawing of the lighting screen inspection apparatus in Embodiment 1 of this invention Operation flow diagram of the lighting screen inspection device The figure which shows an example of the lighting rate change for every field time of a blinking cell (A)-(d) is a figure which shows an example of the image data of the imaged image Flow chart of lighting screen inspection in embodiment 2 of the present invention Explanatory drawing of the lighting screen inspection apparatus in Embodiment 3 of this invention Flow chart of lighting screen inspection in embodiment 3 of the present invention Flow chart of lighting screen inspection in embodiment 4 of the present invention Explanatory drawing of the lighting screen inspection apparatus in Embodiment 5 of this invention Flow chart of lighting screen inspection in embodiment 5 of the present invention

Explanation of symbols

DESCRIPTION OF SYMBOLS 14 Plasma display panel 16 Camera imaging control means 17 Camera 18 Exposure time control means 19, 31 Image processing part 20 Long field time exposure image storage means 21 Short field time exposure image storage means 22, 23 Image brightness correction processing means 24 Image difference processing Means 25 Defect extraction processing means 26, 33 Pass / fail judgment means 32 Feature quantity comparison processing means 34 Panel vertical synchronization processing section

Claims (5)

In a lighting screen inspection method for a plasma display panel that has a plurality of discharge cells between a pair of substrates and generates an electric discharge in each discharge cell, an image is taken with the exposure time set to a long field time. The step of obtaining the first image data, the step of obtaining the second image data by setting the exposure time to a short field time and capturing the image, and the first image data and the second image data And a method for inspecting an image by using a method for inspecting a lighting screen of a plasma display panel. 2. The method for inspecting a lighting screen of a plasma display panel according to claim 1, wherein difference image data is obtained from the first image data and the second image data, and the image is evaluated using the difference image data. The first image data is subjected to image processing to obtain a first feature amount representing the feature, the second image data is subjected to image processing to obtain a second feature amount representing the feature, and the first feature amount and the second feature amount are obtained. The method for inspecting a lighting screen of a plasma display panel according to claim 1, wherein the image is evaluated by performing a comparison process with the amount. At least the step of obtaining the second image data by capturing an image with the exposure time set to the short field time and the step of evaluating the image using the first image data and the second image data are performed a plurality of times. The lighting screen inspection method for a plasma display panel according to claim 1. The method for inspecting a lighting screen of a plasma display panel according to claim 1, wherein an image of the plasma display panel is picked up in synchronization with a lighting cycle of the plasma display panel.

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