JP2005326579A - Negative photosensitive polyimide precursor composition - Google Patents
Negative photosensitive polyimide precursor composition Download PDFInfo
- Publication number
- JP2005326579A JP2005326579A JP2004143989A JP2004143989A JP2005326579A JP 2005326579 A JP2005326579 A JP 2005326579A JP 2004143989 A JP2004143989 A JP 2004143989A JP 2004143989 A JP2004143989 A JP 2004143989A JP 2005326579 A JP2005326579 A JP 2005326579A
- Authority
- JP
- Japan
- Prior art keywords
- group
- polyimide precursor
- organic group
- precursor composition
- photocrosslinkable
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 229920001721 polyimide Polymers 0.000 title claims abstract description 70
- 239000002243 precursor Substances 0.000 title claims abstract description 64
- 239000004642 Polyimide Substances 0.000 title claims abstract description 56
- 239000000203 mixture Substances 0.000 title claims abstract description 23
- 125000000962 organic group Chemical group 0.000 claims abstract description 33
- 229920000642 polymer Polymers 0.000 claims abstract description 6
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims description 13
- 125000003118 aryl group Chemical group 0.000 claims description 12
- 125000004432 carbon atom Chemical group C* 0.000 claims description 10
- 125000000623 heterocyclic group Chemical group 0.000 claims description 10
- 125000000217 alkyl group Chemical group 0.000 claims description 8
- 229910052717 sulfur Inorganic materials 0.000 claims description 6
- 125000004434 sulfur atom Chemical group 0.000 claims description 6
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 claims description 3
- 239000000758 substrate Substances 0.000 abstract description 17
- 230000007423 decrease Effects 0.000 abstract description 5
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 description 38
- 230000015572 biosynthetic process Effects 0.000 description 28
- 238000003786 synthesis reaction Methods 0.000 description 26
- -1 dimethylaminopropyl ester Chemical class 0.000 description 19
- 238000000576 coating method Methods 0.000 description 13
- VLDPXPPHXDGHEW-UHFFFAOYSA-N 1-chloro-2-dichlorophosphoryloxybenzene Chemical compound ClC1=CC=CC=C1OP(Cl)(Cl)=O VLDPXPPHXDGHEW-UHFFFAOYSA-N 0.000 description 12
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 12
- HFACYLZERDEVSX-UHFFFAOYSA-N benzidine Chemical group C1=CC(N)=CC=C1C1=CC=C(N)C=C1 HFACYLZERDEVSX-UHFFFAOYSA-N 0.000 description 11
- 239000011248 coating agent Substances 0.000 description 11
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 10
- FPYJFEHAWHCUMM-UHFFFAOYSA-N maleic anhydride Chemical compound O=C1OC(=O)C=C1 FPYJFEHAWHCUMM-UHFFFAOYSA-N 0.000 description 10
- 229910052710 silicon Inorganic materials 0.000 description 10
- 239000010703 silicon Substances 0.000 description 10
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 9
- 238000010438 heat treatment Methods 0.000 description 9
- 239000002904 solvent Substances 0.000 description 9
- 239000002966 varnish Substances 0.000 description 9
- 238000000034 method Methods 0.000 description 8
- 239000011347 resin Substances 0.000 description 8
- 229920005989 resin Polymers 0.000 description 8
- 239000004970 Chain extender Substances 0.000 description 7
- GTDPSWPPOUPBNX-UHFFFAOYSA-N ac1mqpva Chemical compound CC12C(=O)OC(=O)C1(C)C1(C)C2(C)C(=O)OC1=O GTDPSWPPOUPBNX-UHFFFAOYSA-N 0.000 description 7
- 229920005575 poly(amic acid) Polymers 0.000 description 7
- 239000009719 polyimide resin Substances 0.000 description 7
- YEJRWHAVMIAJKC-UHFFFAOYSA-N 4-Butyrolactone Chemical compound O=C1CCCO1 YEJRWHAVMIAJKC-UHFFFAOYSA-N 0.000 description 6
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 6
- IAZDPXIOMUYVGZ-UHFFFAOYSA-N Dimethylsulphoxide Chemical compound CS(C)=O IAZDPXIOMUYVGZ-UHFFFAOYSA-N 0.000 description 6
- ZMANZCXQSJIPKH-UHFFFAOYSA-N Triethylamine Chemical compound CCN(CC)CC ZMANZCXQSJIPKH-UHFFFAOYSA-N 0.000 description 6
- XAFOTXWPFVZQAZ-UHFFFAOYSA-N 2-(4-aminophenyl)-3h-benzimidazol-5-amine Chemical compound C1=CC(N)=CC=C1C1=NC2=CC=C(N)C=C2N1 XAFOTXWPFVZQAZ-UHFFFAOYSA-N 0.000 description 5
- 230000035945 sensitivity Effects 0.000 description 5
- BFVIGZKFVVQUAG-UHFFFAOYSA-N 1h-benzimidazole-2,4-diamine Chemical compound C1=CC(N)=C2NC(N)=NC2=C1 BFVIGZKFVVQUAG-UHFFFAOYSA-N 0.000 description 4
- IWQSVMPGXSAKEG-UHFFFAOYSA-N 2-(4-aminophenyl)-1,3-benzothiazol-5-amine Chemical compound C1=CC(N)=CC=C1C1=NC2=CC(N)=CC=C2S1 IWQSVMPGXSAKEG-UHFFFAOYSA-N 0.000 description 4
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 4
- FXHOOIRPVKKKFG-UHFFFAOYSA-N N,N-Dimethylacetamide Chemical compound CN(C)C(C)=O FXHOOIRPVKKKFG-UHFFFAOYSA-N 0.000 description 4
- 150000001491 aromatic compounds Chemical class 0.000 description 4
- IOJUPLGTWVMSFF-UHFFFAOYSA-N benzothiazole Chemical group C1=CC=C2SC=NC2=C1 IOJUPLGTWVMSFF-UHFFFAOYSA-N 0.000 description 4
- WKDNYTOXBCRNPV-UHFFFAOYSA-N bpda Chemical compound C1=C2C(=O)OC(=O)C2=CC(C=2C=C3C(=O)OC(C3=CC=2)=O)=C1 WKDNYTOXBCRNPV-UHFFFAOYSA-N 0.000 description 4
- 150000001732 carboxylic acid derivatives Chemical group 0.000 description 4
- 150000002391 heterocyclic compounds Chemical class 0.000 description 4
- 125000000654 isopropylidene group Chemical group C(C)(C)=* 0.000 description 4
- 125000004430 oxygen atom Chemical group O* 0.000 description 4
- 125000006158 tetracarboxylic acid group Chemical group 0.000 description 4
- JHRMJWGBGBDNJE-UHFFFAOYSA-N 1,3-benzothiazole-2,4-diamine Chemical compound C1=CC=C2SC(N)=NC2=C1N JHRMJWGBGBDNJE-UHFFFAOYSA-N 0.000 description 3
- OJPDDQSCZGTACX-UHFFFAOYSA-N 2-[n-(2-hydroxyethyl)anilino]ethanol Chemical compound OCCN(CCO)C1=CC=CC=C1 OJPDDQSCZGTACX-UHFFFAOYSA-N 0.000 description 3
- 150000001412 amines Chemical class 0.000 description 3
- 239000002585 base Substances 0.000 description 3
- 235000010290 biphenyl Nutrition 0.000 description 3
- 239000004305 biphenyl Substances 0.000 description 3
- 125000006267 biphenyl group Chemical group 0.000 description 3
- 150000001768 cations Chemical class 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 3
- 150000001875 compounds Chemical class 0.000 description 3
- ANSXAPJVJOKRDJ-UHFFFAOYSA-N furo[3,4-f][2]benzofuran-1,3,5,7-tetrone Chemical compound C1=C2C(=O)OC(=O)C2=CC2=C1C(=O)OC2=O ANSXAPJVJOKRDJ-UHFFFAOYSA-N 0.000 description 3
- 229910052739 hydrogen Inorganic materials 0.000 description 3
- 239000001257 hydrogen Substances 0.000 description 3
- RAXXELZNTBOGNW-UHFFFAOYSA-N imidazole Natural products C1=CNC=N1 RAXXELZNTBOGNW-UHFFFAOYSA-N 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 3
- 229910052753 mercury Inorganic materials 0.000 description 3
- 229910052757 nitrogen Inorganic materials 0.000 description 3
- 150000002923 oximes Chemical class 0.000 description 3
- ZUOUZKKEUPVFJK-UHFFFAOYSA-N phenylbenzene Natural products C1=CC=CC=C1C1=CC=CC=C1 ZUOUZKKEUPVFJK-UHFFFAOYSA-N 0.000 description 3
- UEZVMMHDMIWARA-UHFFFAOYSA-M phosphonate Chemical compound [O-]P(=O)=O UEZVMMHDMIWARA-UHFFFAOYSA-M 0.000 description 3
- 230000005855 radiation Effects 0.000 description 3
- 229920002818 (Hydroxyethyl)methacrylate Polymers 0.000 description 2
- KMOUUZVZFBCRAM-UHFFFAOYSA-N 1,2,3,6-tetrahydrophthalic anhydride Chemical compound C1C=CCC2C(=O)OC(=O)C21 KMOUUZVZFBCRAM-UHFFFAOYSA-N 0.000 description 2
- AZUHIVLOSAPWDM-UHFFFAOYSA-N 2-(1h-imidazol-2-yl)-1h-imidazole Chemical compound C1=CNC(C=2NC=CN=2)=N1 AZUHIVLOSAPWDM-UHFFFAOYSA-N 0.000 description 2
- SJIXRGNQPBQWMK-UHFFFAOYSA-N 2-(diethylamino)ethyl 2-methylprop-2-enoate Chemical compound CCN(CC)CCOC(=O)C(C)=C SJIXRGNQPBQWMK-UHFFFAOYSA-N 0.000 description 2
- VVBLNCFGVYUYGU-UHFFFAOYSA-N 4,4'-Bis(dimethylamino)benzophenone Chemical compound C1=CC(N(C)C)=CC=C1C(=O)C1=CC=C(N(C)C)C=C1 VVBLNCFGVYUYGU-UHFFFAOYSA-N 0.000 description 2
- VVJKKWFAADXIJK-UHFFFAOYSA-N Allylamine Chemical compound NCC=C VVJKKWFAADXIJK-UHFFFAOYSA-N 0.000 description 2
- PAYRUJLWNCNPSJ-UHFFFAOYSA-N Aniline Chemical compound NC1=CC=CC=C1 PAYRUJLWNCNPSJ-UHFFFAOYSA-N 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 2
- WOBHKFSMXKNTIM-UHFFFAOYSA-N Hydroxyethyl methacrylate Chemical compound CC(=C)C(=O)OCCO WOBHKFSMXKNTIM-UHFFFAOYSA-N 0.000 description 2
- 239000002318 adhesion promoter Substances 0.000 description 2
- 229910052783 alkali metal Inorganic materials 0.000 description 2
- 125000004183 alkoxy alkyl group Chemical group 0.000 description 2
- 150000004984 aromatic diamines Chemical class 0.000 description 2
- 125000003785 benzimidazolyl group Chemical group N1=C(NC2=C1C=CC=C2)* 0.000 description 2
- 125000005605 benzo group Chemical group 0.000 description 2
- 125000001797 benzyl group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C([H])([H])* 0.000 description 2
- 239000013522 chelant Substances 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 2
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- GNOIPBMMFNIUFM-UHFFFAOYSA-N hexamethylphosphoric triamide Chemical compound CN(C)P(=O)(N(C)C)N(C)C GNOIPBMMFNIUFM-UHFFFAOYSA-N 0.000 description 2
- 229910010272 inorganic material Inorganic materials 0.000 description 2
- 239000011147 inorganic material Substances 0.000 description 2
- 125000005647 linker group Chemical group 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 239000012046 mixed solvent Substances 0.000 description 2
- 239000002798 polar solvent Substances 0.000 description 2
- CYIDZMCFTVVTJO-UHFFFAOYSA-N pyromellitic acid Chemical compound OC(=O)C1=CC(C(O)=O)=C(C(O)=O)C=C1C(O)=O CYIDZMCFTVVTJO-UHFFFAOYSA-N 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 230000002194 synthesizing effect Effects 0.000 description 2
- 230000000930 thermomechanical effect Effects 0.000 description 2
- FYSNRJHAOHDILO-UHFFFAOYSA-N thionyl chloride Chemical compound ClS(Cl)=O FYSNRJHAOHDILO-UHFFFAOYSA-N 0.000 description 2
- YRHRIQCWCFGUEQ-UHFFFAOYSA-N thioxanthen-9-one Chemical compound C1=CC=C2C(=O)C3=CC=CC=C3SC2=C1 YRHRIQCWCFGUEQ-UHFFFAOYSA-N 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- YFKBXYGUSOXJGS-UHFFFAOYSA-N 1,3-Diphenyl-2-propanone Chemical compound C=1C=CC=CC=1CC(=O)CC1=CC=CC=C1 YFKBXYGUSOXJGS-UHFFFAOYSA-N 0.000 description 1
- YLHUPYSUKYAIBW-UHFFFAOYSA-N 1-acetylpyrrolidin-2-one Chemical compound CC(=O)N1CCCC1=O YLHUPYSUKYAIBW-UHFFFAOYSA-N 0.000 description 1
- UNYPOFWEGVYMRJ-UHFFFAOYSA-N 1-azidoanthracene-9,10-dione Chemical compound O=C1C2=CC=CC=C2C(=O)C2=C1C=CC=C2N=[N+]=[N-] UNYPOFWEGVYMRJ-UHFFFAOYSA-N 0.000 description 1
- XLPJNCYCZORXHG-UHFFFAOYSA-N 1-morpholin-4-ylprop-2-en-1-one Chemical compound C=CC(=O)N1CCOCC1 XLPJNCYCZORXHG-UHFFFAOYSA-N 0.000 description 1
- ZVUAMUKZHFTJGR-UHFFFAOYSA-N 1-piperazin-1-ylprop-2-en-1-one Chemical compound C=CC(=O)N1CCNCC1 ZVUAMUKZHFTJGR-UHFFFAOYSA-N 0.000 description 1
- KNPRXQGFLOMQBY-UHFFFAOYSA-N 2-(3-aminophenyl)-1,3-benzothiazol-5-amine Chemical compound NC1=CC=CC(C=2SC3=CC=C(N)C=C3N=2)=C1 KNPRXQGFLOMQBY-UHFFFAOYSA-N 0.000 description 1
- QCILMAMLEHOLRX-UHFFFAOYSA-N 2-(3-aminophenyl)-3h-benzimidazol-5-amine Chemical compound NC1=CC=CC(C=2NC3=CC(N)=CC=C3N=2)=C1 QCILMAMLEHOLRX-UHFFFAOYSA-N 0.000 description 1
- QHVBLSNVXDSMEB-UHFFFAOYSA-N 2-(diethylamino)ethyl prop-2-enoate Chemical compound CCN(CC)CCOC(=O)C=C QHVBLSNVXDSMEB-UHFFFAOYSA-N 0.000 description 1
- OPLUOQJYYWHDOC-UHFFFAOYSA-N 2-(dimethylamino)ethyl 2-azidobenzoate Chemical compound CN(C)CCOC(=O)C1=CC=CC=C1N=[N+]=[N-] OPLUOQJYYWHDOC-UHFFFAOYSA-N 0.000 description 1
- JKNCOURZONDCGV-UHFFFAOYSA-N 2-(dimethylamino)ethyl 2-methylprop-2-enoate Chemical compound CN(C)CCOC(=O)C(C)=C JKNCOURZONDCGV-UHFFFAOYSA-N 0.000 description 1
- DPBJAVGHACCNRL-UHFFFAOYSA-N 2-(dimethylamino)ethyl prop-2-enoate Chemical compound CN(C)CCOC(=O)C=C DPBJAVGHACCNRL-UHFFFAOYSA-N 0.000 description 1
- NGNBDVOYPDDBFK-UHFFFAOYSA-N 2-[2,4-di(pentan-2-yl)phenoxy]acetyl chloride Chemical compound CCCC(C)C1=CC=C(OCC(Cl)=O)C(C(C)CCC)=C1 NGNBDVOYPDDBFK-UHFFFAOYSA-N 0.000 description 1
- LTHJXDSHSVNJKG-UHFFFAOYSA-N 2-[2-[2-[2-(2-methylprop-2-enoyloxy)ethoxy]ethoxy]ethoxy]ethyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OCCOCCOCCOCCOC(=O)C(C)=C LTHJXDSHSVNJKG-UHFFFAOYSA-N 0.000 description 1
- IDEXRHFUHNHDON-UHFFFAOYSA-N 2-[4-(5-amino-1,3-benzothiazol-2-yl)phenyl]-1,3-benzothiazol-5-amine Chemical compound C1(=CC=C(C=C1)C=1SC2=C(N1)C=C(C=C2)N)C=2SC1=C(N2)C=C(C=C1)N IDEXRHFUHNHDON-UHFFFAOYSA-N 0.000 description 1
- HUVMDVMRZUVXIK-UHFFFAOYSA-N 2-azido-1,3-diphenylprop-2-en-1-one Chemical compound C=1C=CC=CC=1C(=O)C(N=[N+]=[N-])=CC1=CC=CC=C1 HUVMDVMRZUVXIK-UHFFFAOYSA-N 0.000 description 1
- AKVUWTYSNLGBJY-UHFFFAOYSA-N 2-methyl-1-morpholin-4-ylprop-2-en-1-one Chemical compound CC(=C)C(=O)N1CCOCC1 AKVUWTYSNLGBJY-UHFFFAOYSA-N 0.000 description 1
- MYISVPVWAQRUTL-UHFFFAOYSA-N 2-methylthioxanthen-9-one Chemical compound C1=CC=C2C(=O)C3=CC(C)=CC=C3SC2=C1 MYISVPVWAQRUTL-UHFFFAOYSA-N 0.000 description 1
- KTALPKYXQZGAEG-UHFFFAOYSA-N 2-propan-2-ylthioxanthen-9-one Chemical compound C1=CC=C2C(=O)C3=CC(C(C)C)=CC=C3SC2=C1 KTALPKYXQZGAEG-UHFFFAOYSA-N 0.000 description 1
- 125000003903 2-propenyl group Chemical group [H]C([*])([H])C([H])=C([H])[H] 0.000 description 1
- KGIGUEBEKRSTEW-UHFFFAOYSA-N 2-vinylpyridine Chemical compound C=CC1=CC=CC=N1 KGIGUEBEKRSTEW-UHFFFAOYSA-N 0.000 description 1
- SMBSZJBWYCGCJP-UHFFFAOYSA-N 3-(diethylamino)chromen-2-one Chemical compound C1=CC=C2OC(=O)C(N(CC)CC)=CC2=C1 SMBSZJBWYCGCJP-UHFFFAOYSA-N 0.000 description 1
- WHLQPQGNNOYWTB-UHFFFAOYSA-N 3-[3-(2-phenylethynyl)phenoxy]aniline Chemical compound NC1=CC=CC(OC=2C=C(C=CC=2)C#CC=2C=CC=CC=2)=C1 WHLQPQGNNOYWTB-UHFFFAOYSA-N 0.000 description 1
- GPXCORHXFPYJEH-UHFFFAOYSA-N 3-[[3-aminopropyl(dimethyl)silyl]oxy-dimethylsilyl]propan-1-amine Chemical compound NCCC[Si](C)(C)O[Si](C)(C)CCCN GPXCORHXFPYJEH-UHFFFAOYSA-N 0.000 description 1
- CPVJWBWVJUAOMV-UHFFFAOYSA-N 3-benzoyl-7-(diethylamino)chromen-2-one Chemical compound O=C1OC2=CC(N(CC)CC)=CC=C2C=C1C(=O)C1=CC=CC=C1 CPVJWBWVJUAOMV-UHFFFAOYSA-N 0.000 description 1
- JJZNCUHIYJBAMS-UHFFFAOYSA-N 3-phenyl-2h-1,2-oxazol-5-one Chemical compound N1OC(=O)C=C1C1=CC=CC=C1 JJZNCUHIYJBAMS-UHFFFAOYSA-N 0.000 description 1
- YWKSINPSASCIMZ-UHFFFAOYSA-N 4,5-dimethyl-4,5-dihydro-1h-imidazole Chemical compound CC1NC=NC1C YWKSINPSASCIMZ-UHFFFAOYSA-N 0.000 description 1
- LFBALUPVVFCEPA-UHFFFAOYSA-N 4-(3,4-dicarboxyphenyl)phthalic acid Chemical compound C1=C(C(O)=O)C(C(=O)O)=CC=C1C1=CC=C(C(O)=O)C(C(O)=O)=C1 LFBALUPVVFCEPA-UHFFFAOYSA-N 0.000 description 1
- HLBLWEWZXPIGSM-UHFFFAOYSA-N 4-Aminophenyl ether Chemical compound C1=CC(N)=CC=C1OC1=CC=C(N)C=C1 HLBLWEWZXPIGSM-UHFFFAOYSA-N 0.000 description 1
- DOWVFPAIJRADGF-UHFFFAOYSA-N 4-ethenyl-2-benzofuran-1,3-dione Chemical compound C=CC1=CC=CC2=C1C(=O)OC2=O DOWVFPAIJRADGF-UHFFFAOYSA-N 0.000 description 1
- HUKPVYBUJRAUAG-UHFFFAOYSA-N 7-benzo[a]phenalenone Chemical compound C1=CC(C(=O)C=2C3=CC=CC=2)=C2C3=CC=CC2=C1 HUKPVYBUJRAUAG-UHFFFAOYSA-N 0.000 description 1
- KNDQHSIWLOJIGP-UHFFFAOYSA-N 826-62-0 Chemical compound C1C2C3C(=O)OC(=O)C3C1C=C2 KNDQHSIWLOJIGP-UHFFFAOYSA-N 0.000 description 1
- YYVYAPXYZVYDHN-UHFFFAOYSA-N 9,10-phenanthroquinone Chemical compound C1=CC=C2C(=O)C(=O)C3=CC=CC=C3C2=C1 YYVYAPXYZVYDHN-UHFFFAOYSA-N 0.000 description 1
- OLERPURNMSIRAK-UHFFFAOYSA-N CN(C)CCOC(C1=C(C=CC=C1)S(=O)(=O)N=[N+]=[N-])=O Chemical compound CN(C)CCOC(C1=C(C=CC=C1)S(=O)(=O)N=[N+]=[N-])=O OLERPURNMSIRAK-UHFFFAOYSA-N 0.000 description 1
- MQJKPEGWNLWLTK-UHFFFAOYSA-N Dapsone Chemical compound C1=CC(N)=CC=C1S(=O)(=O)C1=CC=C(N)C=C1 MQJKPEGWNLWLTK-UHFFFAOYSA-N 0.000 description 1
- KMTRUDSVKNLOMY-UHFFFAOYSA-N Ethylene carbonate Chemical compound O=C1OCCO1 KMTRUDSVKNLOMY-UHFFFAOYSA-N 0.000 description 1
- NQSMEZJWJJVYOI-UHFFFAOYSA-N Methyl 2-benzoylbenzoate Chemical compound COC(=O)C1=CC=CC=C1C(=O)C1=CC=CC=C1 NQSMEZJWJJVYOI-UHFFFAOYSA-N 0.000 description 1
- UBUCNCOMADRQHX-UHFFFAOYSA-N N-Nitrosodiphenylamine Chemical compound C=1C=CC=CC=1N(N=O)C1=CC=CC=C1 UBUCNCOMADRQHX-UHFFFAOYSA-N 0.000 description 1
- NPKSPKHJBVJUKB-UHFFFAOYSA-N N-phenylglycine Chemical compound OC(=O)CNC1=CC=CC=C1 NPKSPKHJBVJUKB-UHFFFAOYSA-N 0.000 description 1
- 206010034960 Photophobia Diseases 0.000 description 1
- 206010034972 Photosensitivity reaction Diseases 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 150000001298 alcohols Chemical class 0.000 description 1
- 125000001931 aliphatic group Chemical group 0.000 description 1
- 125000003342 alkenyl group Chemical group 0.000 description 1
- 125000000304 alkynyl group Chemical group 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 150000003863 ammonium salts Chemical class 0.000 description 1
- 150000004982 aromatic amines Chemical class 0.000 description 1
- 125000006615 aromatic heterocyclic group Chemical group 0.000 description 1
- 150000004945 aromatic hydrocarbons Chemical class 0.000 description 1
- 150000008365 aromatic ketones Chemical class 0.000 description 1
- 150000001540 azides Chemical class 0.000 description 1
- RWCCWEUUXYIKHB-UHFFFAOYSA-N benzophenone Chemical compound C=1C=CC=CC=1C(=O)C1=CC=CC=C1 RWCCWEUUXYIKHB-UHFFFAOYSA-N 0.000 description 1
- 239000012965 benzophenone Substances 0.000 description 1
- 150000008366 benzophenones Chemical class 0.000 description 1
- OVLLQUKHPTXIBH-UHFFFAOYSA-N bicyclo[4.2.0]octa-1,3,5-trien-7-amine Chemical compound C1=CC=C2C(N)CC2=C1 OVLLQUKHPTXIBH-UHFFFAOYSA-N 0.000 description 1
- 125000000484 butyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 150000004775 coumarins Chemical class 0.000 description 1
- 238000004132 cross linking Methods 0.000 description 1
- 125000001047 cyclobutenyl group Chemical group C1(=CCC1)* 0.000 description 1
- 239000012024 dehydrating agents Substances 0.000 description 1
- 150000004985 diamines Chemical class 0.000 description 1
- SBZXBUIDTXKZTM-UHFFFAOYSA-N diglyme Chemical compound COCCOCCOC SBZXBUIDTXKZTM-UHFFFAOYSA-N 0.000 description 1
- WHGNXNCOTZPEEK-UHFFFAOYSA-N dimethoxy-methyl-[3-(oxiran-2-ylmethoxy)propyl]silane Chemical compound CO[Si](C)(OC)CCCOCC1CO1 WHGNXNCOTZPEEK-UHFFFAOYSA-N 0.000 description 1
- 238000007598 dipping method Methods 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 150000002148 esters Chemical class 0.000 description 1
- RMBPEFMHABBEKP-UHFFFAOYSA-N fluorene Chemical compound C1=CC=C2C3=C[CH]C=CC3=CC2=C1 RMBPEFMHABBEKP-UHFFFAOYSA-N 0.000 description 1
- 125000000524 functional group Chemical group 0.000 description 1
- 125000001183 hydrocarbyl group Chemical group 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 239000003112 inhibitor Substances 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 239000011229 interlayer Substances 0.000 description 1
- 125000001449 isopropyl group Chemical group [H]C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 1
- 150000002576 ketones Chemical class 0.000 description 1
- 208000013469 light sensitivity Diseases 0.000 description 1
- 229910003002 lithium salt Inorganic materials 0.000 description 1
- 159000000002 lithium salts Chemical class 0.000 description 1
- 238000001459 lithography Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- FQPSGWSUVKBHSU-UHFFFAOYSA-N methacrylamide Chemical compound CC(=C)C(N)=O FQPSGWSUVKBHSU-UHFFFAOYSA-N 0.000 description 1
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 1
- PBMIETCUUSQZCG-UHFFFAOYSA-N n'-cyclohexylmethanediimine Chemical compound N=C=NC1CCCCC1 PBMIETCUUSQZCG-UHFFFAOYSA-N 0.000 description 1
- GVBMMNAPRZDGEY-UHFFFAOYSA-N n-[2-(diethylamino)ethyl]-2-methylprop-2-enamide Chemical compound CCN(CC)CCNC(=O)C(C)=C GVBMMNAPRZDGEY-UHFFFAOYSA-N 0.000 description 1
- CXSANWNPQKKNJO-UHFFFAOYSA-N n-[2-(diethylamino)ethyl]prop-2-enamide Chemical compound CCN(CC)CCNC(=O)C=C CXSANWNPQKKNJO-UHFFFAOYSA-N 0.000 description 1
- WDQKICIMIPUDBL-UHFFFAOYSA-N n-[2-(dimethylamino)ethyl]prop-2-enamide Chemical compound CN(C)CCNC(=O)C=C WDQKICIMIPUDBL-UHFFFAOYSA-N 0.000 description 1
- YPQZNZMMEBHDSC-UHFFFAOYSA-N n-[2-(dimethylamino)propyl]-2-methylprop-2-enamide Chemical compound CN(C)C(C)CNC(=O)C(C)=C YPQZNZMMEBHDSC-UHFFFAOYSA-N 0.000 description 1
- SLGDEOFMEQZRLN-UHFFFAOYSA-N n-[2-(dimethylamino)propyl]prop-2-enamide Chemical compound CN(C)C(C)CNC(=O)C=C SLGDEOFMEQZRLN-UHFFFAOYSA-N 0.000 description 1
- VMXAIJCDNKFKPO-UHFFFAOYSA-N n-ethynylaniline Chemical compound C#CNC1=CC=CC=C1 VMXAIJCDNKFKPO-UHFFFAOYSA-N 0.000 description 1
- OBKARQMATMRWQZ-UHFFFAOYSA-N naphthalene-1,2,5,6-tetracarboxylic acid Chemical compound OC(=O)C1=C(C(O)=O)C=CC2=C(C(O)=O)C(C(=O)O)=CC=C21 OBKARQMATMRWQZ-UHFFFAOYSA-N 0.000 description 1
- OLAPPGSPBNVTRF-UHFFFAOYSA-N naphthalene-1,4,5,8-tetracarboxylic acid Chemical compound C1=CC(C(O)=O)=C2C(C(=O)O)=CC=C(C(O)=O)C2=C1C(O)=O OLAPPGSPBNVTRF-UHFFFAOYSA-N 0.000 description 1
- DOBFTMLCEYUAQC-UHFFFAOYSA-N naphthalene-2,3,6,7-tetracarboxylic acid Chemical compound OC(=O)C1=C(C(O)=O)C=C2C=C(C(O)=O)C(C(=O)O)=CC2=C1 DOBFTMLCEYUAQC-UHFFFAOYSA-N 0.000 description 1
- 239000012299 nitrogen atmosphere Substances 0.000 description 1
- NIHNNTQXNPWCJQ-UHFFFAOYSA-N o-biphenylenemethane Natural products C1=CC=C2CC3=CC=CC=C3C2=C1 NIHNNTQXNPWCJQ-UHFFFAOYSA-N 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- FVDOBFPYBSDRKH-UHFFFAOYSA-N perylene-3,4,9,10-tetracarboxylic acid Chemical compound C=12C3=CC=C(C(O)=O)C2=C(C(O)=O)C=CC=1C1=CC=C(C(O)=O)C2=C1C3=CC=C2C(=O)O FVDOBFPYBSDRKH-UHFFFAOYSA-N 0.000 description 1
- 230000036211 photosensitivity Effects 0.000 description 1
- 239000004014 plasticizer Substances 0.000 description 1
- 229920002577 polybenzoxazole Polymers 0.000 description 1
- 238000006116 polymerization reaction Methods 0.000 description 1
- XAEFZNCEHLXOMS-UHFFFAOYSA-M potassium benzoate Chemical compound [K+].[O-]C(=O)C1=CC=CC=C1 XAEFZNCEHLXOMS-UHFFFAOYSA-M 0.000 description 1
- 125000002924 primary amino group Chemical group [H]N([H])* 0.000 description 1
- JKANAVGODYYCQF-UHFFFAOYSA-N prop-2-yn-1-amine Chemical compound NCC#C JKANAVGODYYCQF-UHFFFAOYSA-N 0.000 description 1
- RUOJZAUFBMNUDX-UHFFFAOYSA-N propylene carbonate Chemical compound CC1COC(=O)O1 RUOJZAUFBMNUDX-UHFFFAOYSA-N 0.000 description 1
- HNJBEVLQSNELDL-UHFFFAOYSA-N pyrrolidin-2-one Chemical compound O=C1CCCN1 HNJBEVLQSNELDL-UHFFFAOYSA-N 0.000 description 1
- 239000011342 resin composition Substances 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 150000003335 secondary amines Chemical class 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
- 229910000077 silane Inorganic materials 0.000 description 1
- 159000000000 sodium salts Chemical class 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- HXJUTPCZVOIRIF-UHFFFAOYSA-N sulfolane Chemical compound O=S1(=O)CCCC1 HXJUTPCZVOIRIF-UHFFFAOYSA-N 0.000 description 1
- 239000000725 suspension Substances 0.000 description 1
- 150000003536 tetrazoles Chemical class 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- VPYJNCGUESNPMV-UHFFFAOYSA-N triallylamine Chemical compound C=CCN(CC=C)CC=C VPYJNCGUESNPMV-UHFFFAOYSA-N 0.000 description 1
- YFNKIDBQEZZDLK-UHFFFAOYSA-N triglyme Chemical compound COCCOCCOCCOC YFNKIDBQEZZDLK-UHFFFAOYSA-N 0.000 description 1
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 1
- 230000004304 visual acuity Effects 0.000 description 1
Landscapes
- Materials For Photolithography (AREA)
- Macromolecular Compounds Obtained By Forming Nitrogen-Containing Linkages In General (AREA)
- Macromonomer-Based Addition Polymer (AREA)
Abstract
Description
本発明は、ネガ型感光性ポリイミド前駆体組成物に関する。 The present invention relates to a negative photosensitive polyimide precursor composition.
従来から、半導体素子の表面保護や層間絶縁膜の形成には、耐熱性、電気特性、機械特性に優れるポリイミド樹脂が使用されてきた。また、メモリやマイクロプロセッサーなどの主要デバイスの生産性を向上させるための半導体素子の高集積化・大型化、情報機器用デバイスの薄型パッケージングに対応した封止樹脂パッケージの薄型化・小型化、半田リフローによる表面実装化などに伴い、耐熱サイクル性、耐熱ショック性などについての大幅な性能向上がポリイミド樹脂に対して要求されている。換言すれば、より高性能なポリイミド樹脂が望まれている。
回路パターンを製造する工程の簡略化のために感光性ポリイミドが注目されている。感光性ポリイミド樹脂に代わって、耐湿性に優れる感光性ポリベンゾオキサゾール樹脂も開発されてきている(特許文献1、2)。
Conventionally, polyimide resins having excellent heat resistance, electrical characteristics, and mechanical characteristics have been used for surface protection of semiconductor elements and formation of interlayer insulating films. In addition, higher integration and larger semiconductor elements to improve the productivity of major devices such as memory and microprocessors, thinner and smaller encapsulating resin packages for thin packaging of information device devices, Accompanying surface mounting by solder reflow and the like, polyimide resin has been required to greatly improve performance in terms of heat cycle resistance and heat shock resistance. In other words, a higher performance polyimide resin is desired.
In order to simplify the process of manufacturing a circuit pattern, photosensitive polyimide has attracted attention. In place of the photosensitive polyimide resin, a photosensitive polybenzoxazole resin excellent in moisture resistance has also been developed (Patent Documents 1 and 2).
しかしながら、従来の感光性ポリイミド樹脂前駆体を金属などといった無機材料からなる基材に塗布してポリイミド膜を形成すると、ポリイミド膜にクラックが生じたり、ポリイミド膜が基材から剥離したり、基材が反ったり、パターニングのリソグラフィーにおける解像度が低下したりする問題がある。このような問題は、感光性ポリイミド樹脂前駆体を基板に厚く塗布する場合に顕著になる。
本発明は、優れた電気特性・解像性を有し、かつ、基材との密着性の低下や基材の反りなどを軽減し得る樹脂膜を与えるネガ型感光性ポリイミド前駆体組成物を提供することを目的としたものである。 The present invention provides a negative photosensitive polyimide precursor composition that provides a resin film that has excellent electrical characteristics and resolution, and that can reduce the decrease in adhesion to the substrate and the warpage of the substrate. It is intended to provide.
本発明者らは、樹脂膜と基材との密着性の低下や基材の反りなどが生じるのは、樹脂膜と基材との熱膨張係数が乖離しているためであることに着目し、さらに、基板として用いられる無機材料の熱膨張係数に近いポリイミド樹脂を与えるためのポリイミド前駆体の化学構造を鋭意検討することによって以下に記載する本発明を完成した。 The inventors of the present invention have noticed that the decrease in the adhesion between the resin film and the base material or the warpage of the base material occurs because the thermal expansion coefficients of the resin film and the base material are different. Furthermore, the present invention described below was completed by earnestly examining the chemical structure of a polyimide precursor for providing a polyimide resin having a thermal expansion coefficient close to that of an inorganic material used as a substrate.
本発明のネガ型感光性ポリイミド前駆体組成物(以下、「本発明の前駆体組成物」とも表記する)は、下記一般式(1)で示される繰り返し単位を有し、当該一般式(1)における2つのR2が各々独立に水素原子、光架橋性基を含有しない有機基または光架橋性基を含有する有機基であり、ポリマーが有する全てのR2のうちの20〜100モル%のR2が光架橋性基を含有する有機基であるポリイミド前駆体と、
光開始剤と、
を含有するネガ型感光性ポリイミド前駆体組成物である。
The negative photosensitive polyimide precursor composition of the present invention (hereinafter also referred to as “precursor composition of the present invention”) has a repeating unit represented by the following general formula (1), and the general formula (1 two R 2 are each independently a hydrogen atom in), an organic group containing an organic group or a photocrosslinking group containing no photo-crosslinkable group, 20 to 100 mol% of all R 2 having a polymer A polyimide precursor in which R 2 is an organic group containing a photocrosslinkable group;
A photoinitiator;
Is a negative photosensitive polyimide precursor composition.
(式中、
R1は2個以上の炭素原子を有する4価の有機基を示し、
R3は一般式(2)〜(5)のいずれかで示される有機基を示す。
(Where
R 1 represents a tetravalent organic group having 2 or more carbon atoms,
R 3 represents an organic group represented by any one of the general formulas (2) to (5).
(一般式(2)〜(5)中、
Xは硫黄原子またはNR8(式中、R8は水素原子、アルキル基またフェニル基を示す。)であり、
R4〜R7は各々独立して芳香族基または複素環基を示す。))
(In the general formulas (2) to (5),
X is a sulfur atom or NR 8 (wherein R 8 represents a hydrogen atom, an alkyl group or a phenyl group);
R 4 to R 7 each independently represents an aromatic group or a heterocyclic group. ))
本発明の前駆体組成物に含まれるポリイミド前駆体をイミド化すると熱膨張係数が小さいポリイミドが得られる。よって、シリコンウエハなどの低熱膨張係数の基材上に本発明のネガ型感光性ポリイミド前駆体組成物を塗布してイミド化した後にシリコンとの熱膨張係数の差が小さいポリイミド膜が得られ、そのようなポリイミド膜は、基材との密着性がよく反りなどが生じ難い。また、優れた現像性、感光性を呈して、良好なパターンが得られる。 When the polyimide precursor contained in the precursor composition of the present invention is imidized, a polyimide having a small thermal expansion coefficient is obtained. Therefore, after applying the negative photosensitive polyimide precursor composition of the present invention on a low thermal expansion coefficient substrate such as a silicon wafer and imidizing, a polyimide film having a small difference in thermal expansion coefficient with silicon is obtained, Such a polyimide film has good adhesion to the substrate and is less likely to warp. Moreover, it exhibits excellent developability and photosensitivity, and a good pattern can be obtained.
本発明のポリイミド前駆体組成物は、特定構造を有するポリイミド前駆体と、光開始剤とを含有する。上記ポリイミド前駆体は、上記一般式(1)(式中、各記号は上述のとおり。)で表される繰り返し単位を有する。上記ポリイミド前駆体は、ポリアミド酸を基本構造として、その側鎖のカルボン酸の一部または全部が塩を形成するかまたはエステル化してなる構造を有する。 The polyimide precursor composition of the present invention contains a polyimide precursor having a specific structure and a photoinitiator. The polyimide precursor has a repeating unit represented by the general formula (1) (wherein each symbol is as described above). The polyimide precursor has a structure in which a polyamic acid is a basic structure and a part or all of the side chain carboxylic acid forms a salt or is esterified.
式(1)のR1が示す2個以上の炭素原子を有する4価の有機基は、耐熱性の観点から、好ましくは芳香族環または芳香族複素環を含有し、好ましくは炭素数6〜30の有機基である。R1は典型的にはテトラカルボン酸二無水物の残基として表現することができ、前記テトラカルボン酸二無水物は特に限定されず、好ましくは、ピロメリット酸、1,2,5,6−ナフタレンテトラカルボン酸、2,3,6,7−ナフタレンテトラカルボン酸、1,4,5,8−ナフタレンテトラカルボン酸、3,3´,4,4´−ビフェニルテトラカルボン酸、3,4,9,10−ペリレンテトラカルボン酸などといった芳香族テトラカルボン酸が挙げられる。 The tetravalent organic group having two or more carbon atoms represented by R 1 in the formula (1) preferably contains an aromatic ring or an aromatic heterocyclic ring, preferably 6 to 6 carbon atoms from the viewpoint of heat resistance. 30 organic groups. R 1 can typically be expressed as a residue of tetracarboxylic dianhydride, and the tetracarboxylic dianhydride is not particularly limited, and is preferably pyromellitic acid, 1, 2, 5, 6 -Naphthalenetetracarboxylic acid, 2,3,6,7-naphthalenetetracarboxylic acid, 1,4,5,8-naphthalenetetracarboxylic acid, 3,3 ', 4,4'-biphenyltetracarboxylic acid, 3,4 , 9,10-perylenetetracarboxylic acid, and the like.
式(1)のR2が示す光架橋性基を含有する有機基における光架橋性基は、光照射により脱離、二量化または共重合する基などが挙げられ、そのような光架橋性基は、ネガ型感光性樹脂組成物の分野において従来公知のものを適宜選択し得る。式(1)のR2が示す光架橋性基を含有する有機基は、(A)ポリアミド酸のカルボン酸の対カチオンとして導入されて前記カルボン酸とのイオン結合を介してポリイミド前駆体に結合してなる有機基と、(B)ポリアミド酸のカルボキシル基とのエステルの形成を介してポリイミド前駆体に結合してなる有機基とに大別される。 Examples of the photocrosslinkable group in the organic group containing the photocrosslinkable group represented by R 2 in the formula (1) include groups that can be eliminated, dimerized, or copolymerized by light irradiation. Can be appropriately selected from those conventionally known in the field of negative photosensitive resin compositions. The organic group containing the photocrosslinkable group represented by R 2 in the formula (1) is introduced as a counter cation of (A) the carboxylic acid of the polyamic acid and bonded to the polyimide precursor via an ionic bond with the carboxylic acid. And (B) an organic group bonded to the polyimide precursor through formation of an ester with the carboxyl group of the polyamic acid.
(A)の場合のR2が示す光架橋性基を含有する有機基には、光架橋性基を含有するアミンとポリアミド酸の水素原子とが結合してなる1価のカチオンが含まれるものとする。そのようなR2を与える光架橋性基を含有するアミンの具体例としては、アクリル酸ジメチルアミノエチル、アクリル酸ジエチルアミノエチル、メタクリル酸ジメチルアミノエチル、メタクリル酸ジエチルアミノエチル、N−(2−ジメチルアミノエチル)メタクリルアミド、N−(2−ジメチルアミノプロピル)メタクリルアミド、N−(2−ジエチルアミノエチル)メタクリルアミド、N−(2−ジメチルアミノエチル)アクリルアミド、N−(2−ジメチルアミノプロピル)アクリルアミド、N−(2−ジエチルアミノエチル)アクリルアミド、アクリロイルモルホリン、メタクリロイルモルホリン、アクリロイルピペラジン、アリルアミン、トリアリルアミン、ビニルピリジン、アジド安息香酸ジメチルアミノエチルエステル、アジド安息香酸ジメチルアミノプロピルエステル、アジドスルホニル安息香酸ジメチルアミノエチルエステルなどが挙げられるが、これらに限定されない。 In the case of (A), the organic group containing a photocrosslinkable group represented by R 2 contains a monovalent cation formed by bonding a photocrosslinkable group-containing amine and a polyamic acid hydrogen atom. And Specific examples of the amine containing a photocrosslinkable group that gives R 2 include dimethylaminoethyl acrylate, diethylaminoethyl acrylate, dimethylaminoethyl methacrylate, diethylaminoethyl methacrylate, N- (2-dimethylamino). Ethyl) methacrylamide, N- (2-dimethylaminopropyl) methacrylamide, N- (2-diethylaminoethyl) methacrylamide, N- (2-dimethylaminoethyl) acrylamide, N- (2-dimethylaminopropyl) acrylamide, N- (2-diethylaminoethyl) acrylamide, acryloylmorpholine, methacryloylmorpholine, acryloylpiperazine, allylamine, triallylamine, vinylpyridine, azidobenzoic acid dimethylaminoethyl ester, azide Examples thereof include, but are not limited to, dobenzoic acid dimethylaminopropyl ester and azidosulfonylbenzoic acid dimethylaminoethyl ester.
(B)の場合のR2が示す光架橋性基を含有する有機基は、エチレン性不飽和基、ビニル基、アリル基などを有する有機基が好ましい。R2としては、メタクリロイルオキシメチル基、2−アクリロイルオキシエチル基、3−アクリロイルオキシプロピル基、3−メタクリロイルオキシプロピル基などの、アルキル基の炭素数が1〜10のアクリロイルオキシアルキル基、メタクリロイルオキシアルキル基などが好ましい。本発明の応用例として、ポリアミド酸にアミド結合を介して光架橋性基を導入することができる。換言すると、一般式(1)においてOR2がNR2´(式中、R2´は光架橋性基を含有する有機基を示す。)に置き換わっていてもよい。この場合に、R2´が示す光架橋性基を含有する有機基としては、R2が示す光架橋性基を含有する有機基として例示された有機基をとり得る。 In the case of (B), the organic group containing the photocrosslinkable group represented by R 2 is preferably an organic group having an ethylenically unsaturated group, a vinyl group, an allyl group, or the like. R 2 includes an acryloyloxyalkyl group having 1 to 10 carbon atoms in the alkyl group, such as a methacryloyloxymethyl group, a 2-acryloyloxyethyl group, a 3-acryloyloxypropyl group, and a 3-methacryloyloxypropyl group, and a methacryloyloxy group. An alkyl group and the like are preferable. As an application example of the present invention, a photocrosslinkable group can be introduced into a polyamic acid via an amide bond. In other words, OR 2 is NR 2'(wherein, R 2'is. Of an organic group containing a photocrosslinkable group) in the general formula (1) may be replaced with. In this case, the organic group containing a photo-crosslinkable group represented by R 2', may take the exemplary organic group as the organic group containing a photo-crosslinkable group represented by R 2.
(A)の場合、(B)の場合ともに、ポリマーが有する全てのR2のうちの20〜100モル%、好ましくは50〜100モル%のR2が光架橋性基を含有する有機基である。ポリマーが有する全てのR2のうちの20モル%未満のR2が光架橋性基を含有する有機基である場合には、感光性が不十分であるために多量の光エネルギーを要し、また架橋が不十分であるために解像力が低く残膜率が小さいという不都合がある。 In the case of (A), both the case of (B), 20 to 100 mol% of all R 2 with the polymer, preferably an organic group of R 2 is from 50 to 100 mol% containing photocrosslinkable groups is there. When R 2 of less than 20 mole% of all R 2 having the polymer is an organic group containing a photocrosslinkable group, requires a large amount of light energy to light sensitivity is insufficient, Further, since the crosslinking is insufficient, there is a disadvantage that the resolving power is low and the remaining film ratio is small.
式(1)のR2が示す光架橋性基を含有しない有機基は、上述の光架橋性基を有さない有機基である。当該有機基は、上記(A)の場合には、好ましくは炭素数1〜30の炭化水素基やアルコキシアルキル基などが挙げられるがこれらに限定されない。好ましい具体例としては、メチル基、エチル基、イソプロピル基、ブチル基、メトキシエチル基、フェニル基、ベンジル基などが挙げられるが、これらに限定されない。上記(B)の場合には、式(1)のR2が示す光架橋性基を含有しない有機基は、炭素数1〜10のアルキル基、炭素数2〜10のアルコキシアルキル基、ベンジル基などが挙げられる。 The organic group that does not contain the photocrosslinkable group represented by R 2 in Formula (1) is an organic group that does not have the above-described photocrosslinkable group. In the case of the above (A), the organic group is preferably a hydrocarbon group having 1 to 30 carbon atoms or an alkoxyalkyl group, but is not limited thereto. Preferred specific examples include, but are not limited to, methyl group, ethyl group, isopropyl group, butyl group, methoxyethyl group, phenyl group, benzyl group and the like. In the case of the above (B), the organic group not containing the photocrosslinkable group represented by R 2 in the formula (1) is an alkyl group having 1 to 10 carbon atoms, an alkoxyalkyl group having 2 to 10 carbon atoms, or a benzyl group. Etc.
なお、上記(A)の場合には、ポリマーが有する全てのR2のうちの50〜100モル%のR2は水素であることが好ましく、80〜100モル%であることがさらに好ましい。前記割合を算出する場合の「水素」には、光架橋性基を含有するアミンと結合して1価のカチオンを形成している水素原子を含む。水素の割合が増えるほど硬化膜中の脱離基の残存割合が少なく、ポリイミドへの転化が速やかに起こる利点がある。 In the case of (A), 50 to 100 mol% of R 2 out of all R 2 possessed by the polymer is preferably hydrogen, and more preferably 80 to 100 mol%. “Hydrogen” in calculating the ratio includes a hydrogen atom that forms a monovalent cation by bonding with an amine containing a photocrosslinkable group. As the proportion of hydrogen increases, the remaining proportion of leaving groups in the cured film decreases, and there is an advantage that conversion to polyimide occurs quickly.
R2が水素原子である場合には、一般式(1)で表される本発明の前駆体の側鎖がカルボン酸のままであってもよいし、アルカリ金属塩やアンモニウム塩を構成してもよい。上記の場合のアルカリ金属塩には、リチウム塩、ナトリウム塩、カリウム塩などが挙げられる。 When R 2 is a hydrogen atom, the side chain of the precursor of the present invention represented by the general formula (1) may be left as carboxylic acid, or an alkali metal salt or ammonium salt is formed. Also good. Examples of the alkali metal salt in the above case include lithium salt, sodium salt, potassium salt and the like.
式(1)のR3が参照する式(2)〜(5)について説明する。
式(2)〜(3)のR4が示す芳香族基または複素環基は、芳香族化合物または複素環化合物から4つの水素を除いたものに相当する4価の基である。式(2)〜(3)のR4が示す芳香族基または複素環基の具体例としては、
Formulas (2) to (5) referred to by R 3 in Formula (1) will be described.
The aromatic group or heterocyclic group represented by R 4 in the formulas (2) to (3) is a tetravalent group corresponding to an aromatic compound or heterocyclic compound obtained by removing four hydrogens. Specific examples of the aromatic group or heterocyclic group represented by R 4 in the formulas (2) to (3) include
(式中、X4は、酸素原子、硫黄原子、SO2、S=O、CH2、C=O、ヘキサフルオロイソプロピリデンまたはイソプロピリデンである。)などが挙げられる。 (Wherein X 4 is an oxygen atom, a sulfur atom, SO 2 , S═O, CH 2 , C═O, hexafluoroisopropylidene or isopropylidene).
式(2)〜(4)のR5が示す芳香族基または複素環基は、芳香族化合物または複素環化合物から2つの水素を除いたものに相当する2価の基である。式(2)〜(4)のR5が示す芳香族基または複素環基の具体例としては、 The aromatic group or heterocyclic group represented by R 5 in the formulas (2) to (4) is a divalent group corresponding to an aromatic compound or heterocyclic compound obtained by removing two hydrogens. As specific examples of the aromatic group or heterocyclic group represented by R 5 in the formulas (2) to (4),
(式中、X5は、酸素原子、硫黄原子、SO2、S=O、CH2、C=O、ヘキサフルオロイソプロピリデンまたはイソプロピリデンである。)などが挙げられる。 (Wherein, X 5 is an oxygen atom, a sulfur atom, SO 2 , S═O, CH 2 , C═O, hexafluoroisopropylidene or isopropylidene).
式(4)〜(5)のR6が示す芳香族基または複素環基は、芳香族化合物または複素環化合物から3つの水素を除いたものに相当する3価の基である。式(4)〜(5)のR6が示す芳香族基または複素環基の具体例としては、 The aromatic group or heterocyclic group represented by R 6 in formulas (4) to (5) is a trivalent group corresponding to an aromatic compound or heterocyclic compound obtained by removing three hydrogen atoms. As specific examples of the aromatic group or heterocyclic group represented by R 6 in the formulas (4) to (5),
(式中、X6は、酸素原子、硫黄原子、SO2、S=O、CH2、C=O、ヘキサフルオロイソプロピリデンまたはイソプロピリデンである。)などが挙げられる。 (Wherein X 6 is an oxygen atom, a sulfur atom, SO 2 , S═O, CH 2 , C═O, hexafluoroisopropylidene or isopropylidene).
式(5)のR7が示す芳香族基または複素環基は、芳香族化合物または複素環化合物から2つの水素を除いたものに相当する2価の基である。式(5)のR7が示す芳香族基または複素環基の具体例としては、 The aromatic group or heterocyclic group represented by R 7 in formula (5) is a divalent group corresponding to an aromatic compound or heterocyclic compound obtained by removing two hydrogen atoms. Specific examples of the aromatic group or heterocyclic group represented by R 7 in the formula (5) include
(式中、X7は、酸素原子、硫黄原子、SO2、S=O、CH2、C=O、ヘキサフルオロイソプロピリデンまたはイソプロピリデンである。)などが挙げられる。 (Wherein X 7 is an oxygen atom, a sulfur atom, SO 2 , S═O, CH 2 , C═O, hexafluoroisopropylidene or isopropylidene).
式(2)〜(5)のXが参照するNR8の、R8が示すアルキル基は、炭素数が好ましくは1〜10個、より好ましくは1〜6個のアルキル基である。 The alkyl group represented by R 8 in NR 8 referred to by X in formulas (2) to (5) is preferably an alkyl group having 1 to 10 carbon atoms, more preferably 1 to 6 carbon atoms.
式(1)のR3が示す有機基は、好ましくはベンゾチアゾール残基またはベンズイミダゾール残基である。好ましいベンゾチアゾール残基の具体例として、2,6−(4,4´−ジアミノジフェニル)ベンゾ[1,2−d:5,4−d´]ビスチアゾール、5−アミノ−2−(p−アミノフェニル)−ベンゾチアゾール、5−アミノ−2−(m−アミノフェニル)−ベンゾチアゾール、2,2´−p−フェニレンビス(5−アミノベンゾチアゾール)などのジアミノベンゾチアゾールの2価の残基が挙げられ、好ましいベンズイミダゾール残基の具体例として、2,6−(4,4´−ジアミノジフェニル)ベンゾ[1,2−d:5,4−d´]ビスイミダゾール、5−アミノ−2−(p−アミノフェニル)−ベンズイミダゾール、5−アミノ−2−(m−アミノフェニル)−ベンズイミダゾール、2,2´−p−フェニレンビス(5−アミノベンズイミダゾール)などのジアミノベンズイミダゾールの2価の残基が挙げられる。 The organic group represented by R 3 in the formula (1) is preferably a benzothiazole residue or a benzimidazole residue. Specific examples of preferred benzothiazole residues include 2,6- (4,4′-diaminodiphenyl) benzo [1,2-d: 5,4-d ′] bisthiazole, 5-amino-2- (p- Divalent benzothiazole divalent residues such as aminophenyl) -benzothiazole, 5-amino-2- (m-aminophenyl) -benzothiazole, 2,2'-p-phenylenebis (5-aminobenzothiazole) Specific examples of preferred benzimidazole residues include 2,6- (4,4′-diaminodiphenyl) benzo [1,2-d: 5,4-d ′] bisimidazole, 5-amino-2 -(P-aminophenyl) -benzimidazole, 5-amino-2- (m-aminophenyl) -benzimidazole, 2,2'-p-phenylenebis (5-aminobenzimid) Tetrazole) include divalent residues of diamino benzimidazole such.
本発明で用いるポリイミド前駆体の主鎖の少なくとも一つの末端は、結合性基を有する連鎖延長剤によって該結合性基を介して封鎖封止されていてもよい。連鎖延長剤が有する結合性基は芳香族ジアミンまたは二酸無水物と結合する官能基である。連鎖延長剤は、連結性基をさらに有する。連結性基は芳香族ジアミンと二酸無水物とからポリイミド前駆体を合成するための条件とは異なる条件下で該ポリイミド前駆体同士を該連鎖延長剤を介して連結することができる有機基である。連鎖延長剤の具体例として、アルケニル基、アルキニル基、シクロブテン環を含有する二無水物又は1級又は2級のアミンが挙げられ、より具体的には、例えば無水マレイン酸、5−ノルボルネン−2,3−ジカルボン酸無水物、ビニルフタル酸無水物、1,2−ジメチル無水マレイン酸、4−シクロヘキセンー1,2−ジカルボン酸無水物、1,2,3,6−テトラヒドロ無水フタル酸、フェニルエチニルアニリン、エチニルアニリン、3−(3−フェニルエチニルフェノキシ)アニリン、プロパルギルアミン、アミノベンゾシクロブテンなどが挙げられる。連鎖延長剤の量は、一般的に望ましい分子量および溶液の粘度を得るために選択され、量が増えると、ポリイミド前駆体の分子量が減少し、それゆえそれを含む溶液の粘度が減少する。塗布方法により最適な溶液粘度が存在するので、溶液の濃度と塗布方法を考慮して連鎖延長剤の量を決めるのが好ましい。 At least one terminal of the main chain of the polyimide precursor used in the present invention may be sealed with a chain extender having a binding group via the binding group. The binding group possessed by the chain extender is a functional group that binds to an aromatic diamine or dianhydride. The chain extender further has a linking group. The linking group is an organic group capable of linking the polyimide precursors via the chain extender under conditions different from the conditions for synthesizing the polyimide precursor from aromatic diamine and dianhydride. is there. Specific examples of the chain extender include an alkenyl group, an alkynyl group, a dianhydride containing a cyclobutene ring, or a primary or secondary amine. More specifically, for example, maleic anhydride, 5-norbornene-2 , 3-dicarboxylic anhydride, vinylphthalic anhydride, 1,2-dimethylmaleic anhydride, 4-cyclohexene-1,2-dicarboxylic anhydride, 1,2,3,6-tetrahydrophthalic anhydride, phenylethynyl Examples include aniline, ethynylaniline, 3- (3-phenylethynylphenoxy) aniline, propargylamine, aminobenzocyclobutene, and the like. The amount of chain extender is generally selected to obtain the desired molecular weight and viscosity of the solution, and increasing the amount reduces the molecular weight of the polyimide precursor and hence the viscosity of the solution containing it. Since the optimum solution viscosity exists depending on the coating method, it is preferable to determine the amount of the chain extender in consideration of the concentration of the solution and the coating method.
本発明で用いるポリイミド前駆体においては、ポリイミド膜と基板との接着性を向上させるために、耐熱性を低下させない範囲内でR1、R3にシロキサン構造を有する脂肪族の基が導入されていてもよい。換言すると、ポリアミド酸を得るための全ジアミン成分の1〜10モル%の量の、ビス(3−アミノプロピル)テトラメチルジシロキサンなどを共重合させてもよい。 In the polyimide precursor used in the present invention, in order to improve the adhesion between the polyimide film and the substrate, an aliphatic group having a siloxane structure is introduced into R 1 and R 3 within a range that does not lower the heat resistance. May be. In other words, bis (3-aminopropyl) tetramethyldisiloxane or the like in an amount of 1 to 10 mol% of the total diamine component for obtaining the polyamic acid may be copolymerized.
本発明のポリイミド前駆体は公知の方法により合成される。R2が水素原子である場合はテトラカルボン酸の二酸無水物とジアミノベンゾチアゾールやジアミノベンズイミダゾールとを選択的に組み合わせて、これらをN−メチル−2−ピロリドン、N,N−ジメチルアセトアミド、N,N−ジメチルホルムアミド、ジメチルスルホキシド、ヘキサメチルホスホロトリアミドなどを主成分とする極性溶剤やγ−ブチロラクトンを主成分とする溶媒中で反応させるなど公知の方法によって合成される。 The polyimide precursor of the present invention is synthesized by a known method. When R 2 is a hydrogen atom, a tetracarboxylic dianhydride is selectively combined with diaminobenzothiazole or diaminobenzimidazole, and these are combined with N-methyl-2-pyrrolidone, N, N-dimethylacetamide, It is synthesized by a known method such as reacting in a polar solvent mainly containing N, N-dimethylformamide, dimethyl sulfoxide, hexamethylphosphorotriamide or the like or a solvent mainly containing γ-butyrolactone.
R2がアルキル基の場合には、テトラカルボン酸二無水物とアルコール化合物を反応させた後、塩化チオニルなどを用いて酸塩化物を合成した後にジアミノベンゾチアゾールやジアミノベンズイミダゾールなどを選択的に組み合わせるか、シクロヘキシルカルボジイミドやジフェニル(2,3−ジヒドロ−チオキソ−3−ベンゾオキサゾール)ホスホナートなどの適当な脱水剤を用いてジアミノベンゾチアゾールやジアミノベンズイミダゾールなどを選択的に組み合わせ、これらをN−メチル−2−ピロリドン、N,N−ジメチルアセトアミド、N,N−ジメチルホルムアミド、ジメチルスルホキシド、ヘキサメチルホスホロトリアミドなどを主成分とする極性溶剤やγ−ブチロラクトンを主成分とする溶媒中で反応させるなど公知の方法で合成される。 When R 2 is an alkyl group, after reacting a tetracarboxylic dianhydride and an alcohol compound, synthesizing an acid chloride using thionyl chloride or the like, diaminobenzothiazole or diaminobenzimidazole is selectively used. Or using a suitable dehydrating agent such as cyclohexylcarbodiimide or diphenyl (2,3-dihydro-thioxo-3-benzoxazole) phosphonate, and selectively combining diaminobenzothiazole or diaminobenzimidazole with N-methyl Such as reacting in a polar solvent mainly composed of 2-pyrrolidone, N, N-dimethylacetamide, N, N-dimethylformamide, dimethyl sulfoxide, hexamethylphosphorotriamide or the like, or in a solvent mainly composed of γ-butyrolactone. In a known manner It is made.
本発明の前駆体組成物が含有する光開始剤としては、N−フェニルジエタノールアミン、N−フェニルグリシン、ミヒラーズケトンなどの芳香族アミン、3−フェニル−5−イソオキサゾロンなどの環状オキシム化合物、1−フェニルプロパンジオン−2−(o−エトキシカルボニル)オキシムなどの鎖状オキシム化合物、ベンゾフェノン、o−ベンゾイル安息香酸メチル、ジベンジルケトン、フルオレンなどのベンゾフェノン誘導体、チオキサントン、2−メチルチオキサントン、2−イソプロピルチオキサントンなどのチオキサントン誘導体などが挙げられるが、これらに限定されない。 Photoinitiators contained in the precursor composition of the present invention include aromatic amines such as N-phenyldiethanolamine, N-phenylglycine, and Michler's ketone, cyclic oxime compounds such as 3-phenyl-5-isoxazolone, 1-phenyl Chain oxime compounds such as propanedione-2- (o-ethoxycarbonyl) oxime, benzophenone, benzophenone derivatives such as methyl o-benzoylbenzoate, dibenzylketone, fluorene, thioxanthone, 2-methylthioxanthone, 2-isopropylthioxanthone, etc. The thioxanthone derivative is not limited to these.
光開始剤はポリイミド前駆体100重量部に対して0.01〜30重量部、好ましくは0.1〜20重量部添加される。この範囲をはずれると、感度が低下したり、機械的強度が低下したりする問題が生じる。 The photoinitiator is added in an amount of 0.01 to 30 parts by weight, preferably 0.1 to 20 parts by weight, based on 100 parts by weight of the polyimide precursor. If it is out of this range, there arises a problem that the sensitivity is lowered or the mechanical strength is lowered.
本発明の前駆体組成物は、増感剤をさらに含有していてもよく、そのような増感剤としては、アジドアントラキノン、アジドベンザルアセトフェノンなどの芳香族モノアジド、3,3´−カルボニルビス(ジエチルアミノクマリン)などのクマリン化合物、ベンゾアントロン、フェナントレンキノンなどの芳香族ケトンなど一般的な感光性樹脂に使用される化合物が挙げられる。 The precursor composition of the present invention may further contain a sensitizer. Examples of such a sensitizer include aromatic monoazides such as azidoanthraquinone and azidobenzalacetophenone, and 3,3′-carbonylbis. Examples include compounds used in general photosensitive resins such as coumarin compounds such as (diethylaminocoumarin) and aromatic ketones such as benzoanthrone and phenanthrenequinone.
本発明の前駆体組成物が増感剤を含有する場合の含有量は、ポリイミド前駆体100重量部に対して0.01〜30重量部、好ましくは0.1〜20重量部である。この範囲内であれば、感度良好になり、機械的強度の低下を抑制し得る。 Content in case the precursor composition of this invention contains a sensitizer is 0.01-30 weight part with respect to 100 weight part of polyimide precursors, Preferably it is 0.1-20 weight part. If it is in this range, the sensitivity will be good and the decrease in mechanical strength can be suppressed.
本発明の前駆体組成物は、塗膜または加熱処理後の樹脂膜と基板との接着性を向上させるために、接着促進剤を用いることができる。接着促進剤としては、有機シラン化合物、アルミニウムキレート化合物、チタニウムキレート化合物、珪素含有ポリアミド酸などが好ましく挙げられる。本発明の前駆体組成物は、基板との接着性、感度、解像度、耐熱性などを損なわない範囲で可塑剤、色素、重合禁止剤などの他の添加物をさらに含有してもよい。 The precursor composition of the present invention can use an adhesion promoter in order to improve the adhesion between the coating film or the resin film after the heat treatment and the substrate. As the adhesion promoter, an organic silane compound, an aluminum chelate compound, a titanium chelate compound, a silicon-containing polyamic acid and the like are preferably mentioned. The precursor composition of the present invention may further contain other additives such as a plasticizer, a dye, and a polymerization inhibitor as long as the adhesion to the substrate, sensitivity, resolution, heat resistance and the like are not impaired.
本発明の前駆体組成物は、溶媒に溶解して溶液状態で得ることができる。溶媒としては、N−メチル−2−ピロリドン、N−アセチル−2−ピロリドン、N,N−ジメチルアセトアミド、N,N−ジメチルホルムアミド、ジメチルスルホキシド、ヘキサメチルホスホルトリアミド、γ−ブチロラクトン、エチレンカーボネート、プロピレンカーボネート、スルホラン、ジメチルイミダゾリン、ジエチレングリコールジメチルエーテル、トリエチレングリコールジメチルエーテルなどを用いることができる。これらは単独で用いてもよいし、混合して用いてもよい。 The precursor composition of the present invention can be obtained in solution by dissolving in a solvent. Examples of the solvent include N-methyl-2-pyrrolidone, N-acetyl-2-pyrrolidone, N, N-dimethylacetamide, N, N-dimethylformamide, dimethyl sulfoxide, hexamethylphosphortriamide, γ-butyrolactone, ethylene carbonate, Propylene carbonate, sulfolane, dimethylimidazoline, diethylene glycol dimethyl ether, triethylene glycol dimethyl ether, and the like can be used. These may be used alone or in combination.
本発明の前駆体組成物は浸漬法、スプレー法、スクリーン印刷法、スピンコート法などによって、シリコンウエハ、金属基板、セラミック基板などの基材表面に塗布し、加熱して溶剤の大部分を除くことにより、基材表面に粘着性のない塗膜を与えることができる。塗膜の厚みには特に制限はないが、4〜50μmが好ましい。この塗膜に、所定のパターンを有するマスクを通して、化学線を照射して、パターン状に露光した後、膜の未露光部分を、適切な現像液で現像して除去することにより、所望のパターン化された膜を得ることができる。化学線としては、紫外線、可視光線、X線、電子線などが使用でき、化学線照射装置として、g線ステッパ、i線ステッパ、超高圧水銀灯を用いるコンタクト/プロキシミティ露光機、ミラープロジェクション露光機などが挙げられる。現像液としては、例えば、良溶媒(例えばN−メチル−2−ピロリドン、N,N−ジメチルアセトアミド、N,N−ジメチルホルムアミドなど)、前記良溶媒と貧溶媒(例えば、低級アルコール類、ケトン類、水、芳香族炭化水素など)との混合溶媒、もしくは、アルカリ現像液などが挙げられる。 The precursor composition of the present invention is applied to the surface of a substrate such as a silicon wafer, a metal substrate, or a ceramic substrate by a dipping method, a spray method, a screen printing method, a spin coating method, or the like, and heated to remove most of the solvent. By this, the coating film without adhesiveness can be given to the substrate surface. Although there is no restriction | limiting in particular in the thickness of a coating film, 4-50 micrometers is preferable. This coating film is irradiated with actinic radiation through a mask having a predetermined pattern, exposed in a pattern, and then the unexposed portion of the film is developed and removed with an appropriate developer to obtain a desired pattern. Can be obtained. Ultraviolet, visible light, X-rays, electron beams, etc. can be used as actinic radiation, and contact / proximity exposure machines and mirror projection exposure machines that use g-line steppers, i-line steppers, and ultra-high pressure mercury lamps as chemical radiation irradiation devices. Etc. As the developer, for example, a good solvent (for example, N-methyl-2-pyrrolidone, N, N-dimethylacetamide, N, N-dimethylformamide, etc.), the good solvent and a poor solvent (for example, lower alcohols, ketones) , Water, aromatic hydrocarbons, etc.) or an alkaline developer.
現像後に、必要に応じて、水または貧溶媒で塗膜を洗浄し、ついで約100℃前後で塗膜を乾燥して、パターンを安定化することが望ましい。パターンを形成させた塗膜を加熱して、優れた耐熱性、機械特性、電気特性を有するポリイミド膜を得ることができる。加熱温度は、150〜500℃が好ましく、300〜450℃がさらに好ましい。加熱時間は0.05〜10時間が好ましい。加熱処理は通常、段階的または連続的に昇温しながら行う。 After development, if necessary, it is desirable to wash the coating film with water or a poor solvent and then dry the coating film at about 100 ° C. to stabilize the pattern. By heating the coating film on which the pattern is formed, a polyimide film having excellent heat resistance, mechanical properties, and electrical properties can be obtained. The heating temperature is preferably 150 to 500 ° C, more preferably 300 to 450 ° C. The heating time is preferably 0.05 to 10 hours. The heat treatment is usually performed while raising the temperature stepwise or continuously.
以下、実施例により本発明をさらに詳細に説明するが、本発明はこれらに限定されるものではない。 EXAMPLES Hereinafter, although an Example demonstrates this invention further in detail, this invention is not limited to these.
(合成例1)
攪拌装置および冷却管を備えた300mlの三口セパラブルフラスコに100mlのN−メチル−2−ピロリドン(NMP)と22.32g(60mmol)の2,6−(4,4´−ジアミノジフェニル)−ベンゾ[1,2−d:5,4−d´]ビスチアゾールを入れて懸濁液とし、このフラスコ内を窒素で静かに30分間パージする。反応系を氷冷(5℃以下)し、12.04g(55.205mmol)のピロメリット酸二無水物(PMDA)および0.95g(9.6mmol)の無水マレイン酸を反応系に添加し、室温にて約68時間攪拌して、ポリイミド前駆体組成物1を得た。
(Synthesis Example 1)
Into a 300 ml three-necked separable flask equipped with a stirrer and a condenser, 100 ml of N-methyl-2-pyrrolidone (NMP) and 22.32 g (60 mmol) of 2,6- (4,4′-diaminodiphenyl) -benzo [1,2-d: 5,4-d '] bisthiazole is added to form a suspension, and the flask is gently purged with nitrogen for 30 minutes. The reaction system was ice-cooled (below 5 ° C.), and 12.04 g (55.205 mmol) of pyromellitic dianhydride (PMDA) and 0.95 g (9.6 mmol) of maleic anhydride were added to the reaction system. The mixture was stirred at room temperature for about 68 hours to obtain a polyimide precursor composition 1.
(合成例2)
合成例1と同様の方法によって、100mlのNMP、14.46g(60mmol)の5−アミノ−2−(p−アミノフェニル)−ベンゾチアゾール、0.95g(9.6mmol)の無水マレイン酸および12.04g(55.205mmol)のピロメリット酸二無水物(PMDA)を室温にて45時間で反応させて、ポリイミド前駆体2を得た。
(Synthesis Example 2)
In the same manner as in Synthesis Example 1, 100 ml of NMP, 14.46 g (60 mmol) of 5-amino-2- (p-aminophenyl) -benzothiazole, 0.95 g (9.6 mmol) of maleic anhydride and 12 .04 g (55.205 mmol) of pyromellitic dianhydride (PMDA) was reacted at room temperature for 45 hours to obtain polyimide precursor 2.
(合成例3)
合成例1と同様の方法によって、100mlのNMP、14.46g(60mmol)の5−アミノ−2−(p−アミノフェニル)−ベンゾチアゾール、0.95g(9.6mmol)の無水マレイン酸および16.25g(55.205mmol)の3,3´,4,4´−ビフェニルテトラカルボン酸二無水物を室温にて45時間で反応させて、ポリイミド前駆体3を得た。
(Synthesis Example 3)
In the same manner as in Synthesis Example 1, 100 ml of NMP, 14.46 g (60 mmol) of 5-amino-2- (p-aminophenyl) -benzothiazole, 0.95 g (9.6 mmol) of maleic anhydride and 16 .25 g (55.205 mmol) of 3,3 ′, 4,4′-biphenyltetracarboxylic dianhydride was reacted at room temperature for 45 hours to obtain polyimide precursor 3.
(合成例4)
窒素導入管を備えたフラスコ1に、1モルのピロメリット酸無水物、2.1モルのヒドロキシエチルメタクリレートおよび2LのN−メチル−2−ピロリドン(NMP)を加えて攪拌し、続けて2.1モルのトリエチルアミンを30分間滴下した。この状態で3時間放置した後に1モルの2,6−(4,4´−ジアミノジフェニル)−ベンゾ[1,2−d:5,4−d´]ビスチアゾールを加えた。次に2.1モルのジフェニル(2,3−ジヒドロ−チオキソ−3−ベンゾオキサゾール)ホスホナートを5回に分けて添加し、その状態で5時間縮合した。また、別の窒素導入管を備えたフラスコ2に、2モルの無水マレイン酸と2.1モルのヒドロキシエチルメタクリレートおよび1LのN−メチル−2−ピロリドン(NMP)を加えて攪拌し、続けて2.1モルのトリエチルアミンを30分間滴下した。この状態で3時間放置した後、フラスコ1にフラスコ2の溶液を入れて混合し、30分間攪拌した。次に2.1モルのジフェニル(2,3−ジヒドロ−チオキソ−3−ベンゾオキサゾール)ホスホナートを5回に分けて添加し、その状態で5時間縮合した。得られたスラリー状の混合物を大量のメタノール中に投入して洗浄し、得られた固形樹脂を真空乾燥機によって12時間乾燥して、ポリイミド前駆体4を合成した。
(Synthesis Example 4)
1. 1 mol of pyromellitic anhydride, 2.1 mol of hydroxyethyl methacrylate and 2 L of N-methyl-2-pyrrolidone (NMP) were added to the flask 1 equipped with a nitrogen inlet tube and stirred. 1 mol of triethylamine was added dropwise for 30 minutes. After standing in this state for 3 hours, 1 mol of 2,6- (4,4′-diaminodiphenyl) -benzo [1,2-d: 5,4-d ′] bisthiazole was added. Next, 2.1 mol of diphenyl (2,3-dihydro-thioxo-3-benzoxazole) phosphonate was added in 5 portions and condensed in that state for 5 hours. In addition, 2 mol of maleic anhydride, 2.1 mol of hydroxyethyl methacrylate and 1 L of N-methyl-2-pyrrolidone (NMP) were added to the flask 2 equipped with another nitrogen introduction tube, and the stirring was continued. 2.1 mol of triethylamine was added dropwise for 30 minutes. After leaving in this state for 3 hours, the solution of flask 2 was added to flask 1 and mixed, and stirred for 30 minutes. Next, 2.1 mol of diphenyl (2,3-dihydro-thioxo-3-benzoxazole) phosphonate was added in 5 portions and condensed in that state for 5 hours. The obtained slurry-like mixture was put into a large amount of methanol and washed, and the obtained solid resin was dried by a vacuum dryer for 12 hours to synthesize a polyimide precursor 4.
(合成例5)
2,6−(4,4´−ジアミノジフェニル)−ベンゾ[1,2−d:5,4−d´]ビスチアゾールの代わりに5−アミノ−2−(p−アミノフェニル)−ベンゾチアゾールを用いたことの他は合成例4と同様の操作によってポリイミド前駆体5を合成した。
(Synthesis Example 5)
Instead of 2,6- (4,4′-diaminodiphenyl) -benzo [1,2-d: 5,4-d ′] bisthiazole, 5-amino-2- (p-aminophenyl) -benzothiazole is used. A polyimide precursor 5 was synthesized by the same operation as in Synthesis Example 4 except that it was used.
(合成例6)
ピロメリット酸無水物の代わりに3,3´,4,4´−ビフェニルテトラカルボン酸二無水物を用いたことと、2,6−(4,4´−ジアミノジフェニル)−ベンゾ[1,2−d:5,4−d´]ビスチアゾールの代わりに5−アミノ−2−(p−アミノフェニル)−ベンゾチアゾールを用いたことの他は合成例4と同様の操作によってポリイミド前駆体6を合成した。
(Synthesis Example 6)
3,3 ′, 4,4′-biphenyltetracarboxylic dianhydride was used in place of pyromellitic anhydride, and 2,6- (4,4′-diaminodiphenyl) -benzo [1,2 -D: 5,4-d '] Polyimide precursor 6 was prepared in the same manner as in Synthesis Example 4 except that 5-amino-2- (p-aminophenyl) -benzothiazole was used instead of bisthiazole. Synthesized.
(合成例7)
合成例1と同様の方法によって、100mlのNMP、20.64g(60mmol)の2,6−(4,4´−ジアミノジフェニル)−ベンゾ[1,2−d:5,4−d´]ビスイミダゾール、0.95g(9.6mmol)の無水マレイン酸および12.04g(55.205mmol)のピロメリット酸二無水物(PMDA)を室温にて45時間で反応させて、ポリイミド前駆体7を合成した。
(Synthesis Example 7)
In the same manner as in Synthesis Example 1, 100 ml of NMP, 20.64 g (60 mmol) of 2,6- (4,4′-diaminodiphenyl) -benzo [1,2-d: 5,4-d ′] bis Polyimide precursor 7 was synthesized by reacting imidazole, 0.95 g (9.6 mmol) maleic anhydride and 12.04 g (55.205 mmol) pyromellitic dianhydride (PMDA) at room temperature for 45 hours. did.
(合成例8)
合成例1と同様の方法によって、100mlのNMP、13.56g(60mmol)の5−アミノ−2−(p−アミノフェニル)−ベンズイミダゾール、0.95g(9.6mmol)の無水マレイン酸および12.04g(55.205mmol)のピロメリット酸二無水物(PMDA)を室温にて45時間で反応させて、ポリイミド前駆体8を合成した。
(Synthesis Example 8)
In a manner similar to Synthesis Example 1, 100 ml NMP, 13.56 g (60 mmol) 5-amino-2- (p-aminophenyl) -benzimidazole, 0.95 g (9.6 mmol) maleic anhydride and 12 Polyimide precursor 8 was synthesized by reacting .04 g (55.205 mmol) of pyromellitic dianhydride (PMDA) at room temperature for 45 hours.
(合成例9)
合成例1と同様の方法によって、100mlのNMP、13.56g(60mmol)の5−アミノ−2−(p−アミノフェニル)−ベンズイミダゾール、0.95g(9.6mmol)の無水マレイン酸および16.25g(55.205mmol)の3,3´,4,4´−ビフェニルテトラカルボン酸二無水物を室温にて45時間で反応させて、ポリイミド前駆体9を合成した。
(Synthesis Example 9)
In the same manner as in Synthesis Example 1, 100 ml of NMP, 13.56 g (60 mmol) of 5-amino-2- (p-aminophenyl) -benzimidazole, 0.95 g (9.6 mmol) of maleic anhydride and 16 A polyimide precursor 9 was synthesized by reacting .25 g (55.205 mmol) of 3,3 ′, 4,4′-biphenyltetracarboxylic dianhydride at room temperature for 45 hours.
(合成例10)
2,6−(4,4´−ジアミノジフェニル)−ベンゾ[1,2−d:5,4−d´]ビスチアゾールの代わりに2,6−(4,4´−ジアミノジフェニル)−ベンゾ[1,2−d:5,4−d´]ビスイミダゾールを用いたことの他は合成例4と同様の操作によってポリイミド前駆体10を合成した。
(Synthesis Example 10)
Instead of 2,6- (4,4′-diaminodiphenyl) -benzo [1,2-d: 5,4-d ′] bisthiazole, 2,6- (4,4′-diaminodiphenyl) -benzo [ A polyimide precursor 10 was synthesized in the same manner as in Synthesis Example 4 except that 1,2-d: 5,4-d ′] bisimidazole was used.
(合成例11)
2,6−(4,4´−ジアミノジフェニル)−ベンゾ[1,2−d:5,4−d´]ビスチアゾールの代わりに5−アミノ−2−(p−アミノフェニル)−ベンズイミダゾールを用いたことの他は合成例4と同様の操作によってポリイミド前駆体11を合成した。
(Synthesis Example 11)
Instead of 2,6- (4,4′-diaminodiphenyl) -benzo [1,2-d: 5,4-d ′] bisthiazole, 5-amino-2- (p-aminophenyl) -benzimidazole is used. A polyimide precursor 11 was synthesized by the same operation as in Synthesis Example 4 except that it was used.
(合成例12)
ピロメリット酸無水物の代わりに3,3´,4,4´−ビフェニルテトラカルボン酸二無水物を用いたことと、2,6−(4,4´−ジアミノジフェニル)−ベンゾ[1,2−d:5,4−d´]ビスチアゾールの代わりに5−アミノ−2−(p−アミノフェニル)−ベンズイミダゾールを用いたことの他は合成例4と同様の操作によってポリイミド前駆体12を合成した。
(Synthesis Example 12)
3,3 ′, 4,4′-biphenyltetracarboxylic dianhydride was used in place of pyromellitic anhydride, and 2,6- (4,4′-diaminodiphenyl) -benzo [1,2 -D: 5,4-d '] Polyimide precursor 12 was prepared in the same manner as in Synthesis Example 4 except that 5-amino-2- (p-aminophenyl) -benzimidazole was used instead of bisthiazole. Synthesized.
(合成例13)
合成例1と同様の方法によって、100mlのNMP、12.01g(60mmol)の4,4´−ジアミノジフェニルエーテル、0.95g(9.6mmol)の無水マレイン酸および12.04g(55.205mmol)のピロメリット酸二無水物(PMDA)を室温にて45時間で反応させて、ポリイミド前駆体13を合成した。
(Synthesis Example 13)
In the same manner as in Synthesis Example 1, 100 ml of NMP, 12.01 g (60 mmol) of 4,4′-diaminodiphenyl ether, 0.95 g (9.6 mmol) of maleic anhydride and 12.04 g (55.205 mmol) of Pyromellitic dianhydride (PMDA) was reacted at room temperature for 45 hours to synthesize polyimide precursor 13.
(合成例14)
合成例1と同様の方法によって、100mlのNMP、19.90g(60mmol)の4,4´−ジアミノジフェニルスルフォン、1.58g(9.6mmol)の無水マレイン酸および12.04g(55.205mmol)のピロメリット酸二無水物(PMDA)を室温にて45時間で反応させて、ポリイミド前駆体14を合成した。
(Synthesis Example 14)
In the same manner as in Synthesis Example 1, 100 ml of NMP, 19.90 g (60 mmol) of 4,4′-diaminodiphenylsulfone, 1.58 g (9.6 mmol) of maleic anhydride and 12.04 g (55.205 mmol) Of pyromellitic dianhydride (PMDA) was reacted at room temperature for 45 hours to synthesize polyimide precursor 14.
(実施例1)
100重量部のポリイミド前駆体1に対して、N−フェニルジエタノールアミン5重量部、1−フェニルプロパンジオン−2−(o−エトキシカルボニル)オキシム1重量部、7−ジエチルアミノ−3−ベンゾイルクマリン0.5重量部を添加して、メタクリル酸ジエチルアミノエチルをポリイミド前駆体1の構造単位1モルに対して2モルの割合で添加した。さらにワニスの粘度が50ポイズ程度になるようにNMPで希釈し、感光性ワニスを得た。この感光性ワニスをスピンコーターでシリコンウェハ上に回転塗布して、ホットプレートを用いて100℃で5分間乾燥を行い、10μmの塗膜を得た。この塗膜に対してマスク(1〜50μmの残しパターンおよび抜きパターン)を介して、超高圧水銀灯を用いて紫外線を照射した。その後、ホットプレート上で80℃、2分間のプリベーク処理を行った後に、現像を行った。現像はN−メチルピロリドン(70部)とメタノール(30部)の混合溶媒を用いて行った。次に、シリコンウェハをイソプロパノールでリンスして、乾燥した。その結果、露光量450mJ/cm2の照射で良好なパターンが形成され、残膜率は90%であった。また、現像後の外観は良好であった。さらに、200℃にて30分間、次いで、400℃にて60分間の熱処理を行った。前記熱処理後の膜をシリコンウェハから剥がし、TMA(熱機械分析)法により25〜200℃の範囲で昇温速度10℃/分で測定したところ、5ppm/℃であった。
(Example 1)
100 parts by weight of polyimide precursor 1 with 5 parts by weight of N-phenyldiethanolamine, 1 part by weight of 1-phenylpropanedione-2- (o-ethoxycarbonyl) oxime, 0.5-diethylamino-3-benzoylcoumarin 0.5 A part by weight was added, and diethylaminoethyl methacrylate was added at a ratio of 2 mol to 1 mol of the structural unit of the polyimide precursor 1. Furthermore, it diluted with NMP so that the viscosity of a varnish might be set to about 50 poise, and the photosensitive varnish was obtained. This photosensitive varnish was spin-coated on a silicon wafer with a spin coater and dried at 100 ° C. for 5 minutes using a hot plate to obtain a 10 μm coating film. This coating film was irradiated with ultraviolet rays using a super high pressure mercury lamp through a mask (a 1-50 μm remaining pattern and a blank pattern). Thereafter, development was performed after pre-baking at 80 ° C. for 2 minutes on a hot plate. Development was performed using a mixed solvent of N-methylpyrrolidone (70 parts) and methanol (30 parts). Next, the silicon wafer was rinsed with isopropanol and dried. As a result, a good pattern was formed by irradiation with an exposure dose of 450 mJ / cm 2 , and the residual film ratio was 90%. Further, the appearance after development was good. Furthermore, heat treatment was performed at 200 ° C. for 30 minutes and then at 400 ° C. for 60 minutes. The film after the heat treatment was peeled off from the silicon wafer, and measured by a TMA (thermomechanical analysis) method at a temperature rising rate of 10 ° C./min in the range of 25 to 200 ° C., it was 5 ppm / ° C.
(実施例2〜3、7〜9)
ポリイミド前駆体1の代わりに、ポリイミド前駆体2〜3、7〜9を用いたこと以外は、実施例1と同様に操作して感光性ワニスを調製し、実施例1と同様にして評価した。
(Examples 2-3 and 7-9)
A photosensitive varnish was prepared in the same manner as in Example 1 except that the polyimide precursors 2 to 3 and 7 to 9 were used instead of the polyimide precursor 1 and evaluated in the same manner as in Example 1. .
(実施例4)
100重量部のポリイミド前駆体重量4に対して、N−フェニルジエタノールアミン2重量部、1−フェニルプロパンジオン−2−(o−エトキシカルボニル)オキシム4重量部、7−ジエチルアミノ−3−ベンゾイルクマリン0.5重量部、テトラエチレングリコールジメタクリレート10重量部、γ−グリシドキシプロピルメチルジメトキシシラン2重量部、N−ニトロソジフェニルアミン0.1重量部を添加した。さらにワニス粘度が50ポイズ程度になるようにNMPで希釈し、感光性ワニスを得た。この感光性ワニスをスピンコーターでシリコンウエハ上に回転塗布し、ホットプレートを用いて100℃で5分間乾燥を行い、10μmの塗膜を得た。この塗膜をマスク(1〜50μmの残しパターンおよび抜きパターン)を通して、超高圧水銀灯を用いて紫外線を照射した。その後、ホットプレート上で80℃、2分間のプリベーク処理を行った後に、現像を行った。現像はN−メチルピロリドン(70部)とメタノール(30部)の混合溶媒を用いて行った。次に、シリコンウェハをイソプロパノールでリンスし、乾燥した。その結果、露光量450mJ/cm2の照射で良好なパターンが形成され、残膜率は90%であった。また、現像後の外観も良好であった。さらに、窒素雰囲気下で、200℃にて30分間、次いで、400℃にて60分間の熱処理を行った。前記熱処理後の膜をシリコンウェハから剥がし、TMA(熱機械分析)法により25〜200℃の範囲で昇温速度10℃/分で測定したところ、熱膨張係数は5ppm/℃であった。
Example 4
100 parts by weight of polyimide precursor weight 4; 2 parts by weight of N-phenyldiethanolamine; 4 parts by weight of 1-phenylpropanedione-2- (o-ethoxycarbonyl) oxime; 7-diethylamino-3-benzoylcoumarin; 5 parts by weight, 10 parts by weight of tetraethylene glycol dimethacrylate, 2 parts by weight of γ-glycidoxypropylmethyldimethoxysilane, and 0.1 parts by weight of N-nitrosodiphenylamine were added. Furthermore, it diluted with NMP so that a varnish viscosity might be set to about 50 poise, and the photosensitive varnish was obtained. This photosensitive varnish was spin-coated on a silicon wafer with a spin coater and dried at 100 ° C. for 5 minutes using a hot plate to obtain a 10 μm coating film. This coating film was irradiated with ultraviolet rays using a super high pressure mercury lamp through a mask (a 1-50 μm remaining pattern and a removal pattern). Thereafter, development was performed after pre-baking at 80 ° C. for 2 minutes on a hot plate. Development was performed using a mixed solvent of N-methylpyrrolidone (70 parts) and methanol (30 parts). Next, the silicon wafer was rinsed with isopropanol and dried. As a result, a good pattern was formed by irradiation with an exposure dose of 450 mJ / cm 2 , and the residual film ratio was 90%. The appearance after development was also good. Further, heat treatment was performed at 200 ° C. for 30 minutes and then at 400 ° C. for 60 minutes in a nitrogen atmosphere. The film after the heat treatment was peeled off from the silicon wafer and measured by a TMA (thermomechanical analysis) method in the range of 25 to 200 ° C. at a rate of temperature increase of 10 ° C./min. The coefficient of thermal expansion was 5 ppm / ° C.
(実施例5〜6、10〜12)
ポリイミド前駆体4の代わりに、ポリイミド前駆体5〜6、10〜12を用いたこと以外は、実施例4と同様に操作して感光性ワニスを調製し、実施例4と同様にして評価した。
(Examples 5-6, 10-12)
A photosensitive varnish was prepared in the same manner as in Example 4 except that polyimide precursors 5 to 6 and 10 to 12 were used instead of the polyimide precursor 4 and evaluated in the same manner as in Example 4. .
(比較例1〜2)
ポリイミド前駆体1の代わりに、ポリイミド前駆体13〜14を用いたこと以外は、実施例1と同様に操作して感光性ワニスを調製し、実施例1と同様にして評価した。
(Comparative Examples 1-2)
A photosensitive varnish was prepared in the same manner as in Example 1 except that the polyimide precursors 13 to 14 were used instead of the polyimide precursor 1 and evaluated in the same manner as in Example 1.
各実施例、比較例についての評価結果を表1にまとめる。表1中、「感度」とは解像度10μmのパターン形成のために要する露光量であり、現像後の外観評価は、未露光部の現像残りがなく、パターンのエッジが平滑であれば「良好」と評価した。残膜率は以下の式で算出される。
残膜率(%)=(現像後の膜厚)÷(プリベーク処理後の膜厚)×100
The evaluation results for each example and comparative example are summarized in Table 1. In Table 1, “sensitivity” is the amount of exposure required to form a pattern with a resolution of 10 μm, and the appearance evaluation after development is “good” if there is no unexposed development residue and the pattern edge is smooth. It was evaluated. The remaining film rate is calculated by the following formula.
Residual film ratio (%) = (film thickness after development) / (film thickness after pre-baking treatment) × 100
表1から明らかなように、本発明のネガ型感光性ポリイミド前駆体組成物から得られるポリイミドは熱膨張係数が小さく、現像性や感度も優れている。 As is clear from Table 1, the polyimide obtained from the negative photosensitive polyimide precursor composition of the present invention has a small coefficient of thermal expansion, and is excellent in developability and sensitivity.
Claims (1)
光開始剤と、
を含有するネガ型感光性ポリイミド前駆体組成物。
R1は2個以上の炭素原子を有する4価の有機基を示し、
R3は一般式(2)〜(5)のいずれかで示される有機基を示す。
Xは硫黄原子またはNR8(式中、R8は水素原子、アルキル基またフェニル基を示す。)であり、
R4〜R7は各々独立して芳香族基または複素環基を示す。)) It has a repeating unit represented by the following general formula (1), and two R 2 in the general formula (1) each independently contain a hydrogen atom, an organic group that does not contain a photocrosslinkable group, or a photocrosslinkable group. an organic group, the polyimide precursor is an organic group of 20 to 100 mol% of R 2 of all R 2 having the polymer contains photocrosslinkable groups,
A photoinitiator;
A negative photosensitive polyimide precursor composition containing:
R 1 represents a tetravalent organic group having 2 or more carbon atoms,
R 3 represents an organic group represented by any one of the general formulas (2) to (5).
X is a sulfur atom or NR 8 (wherein R 8 represents a hydrogen atom, an alkyl group or a phenyl group);
R 4 to R 7 each independently represents an aromatic group or a heterocyclic group. ))
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004143989A JP2005326579A (en) | 2004-05-13 | 2004-05-13 | Negative photosensitive polyimide precursor composition |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004143989A JP2005326579A (en) | 2004-05-13 | 2004-05-13 | Negative photosensitive polyimide precursor composition |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2005326579A true JP2005326579A (en) | 2005-11-24 |
Family
ID=35472993
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2004143989A Pending JP2005326579A (en) | 2004-05-13 | 2004-05-13 | Negative photosensitive polyimide precursor composition |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2005326579A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012207147A (en) * | 2011-03-30 | 2012-10-25 | Ube Industries Ltd | Method for producing polyimide film, polyimide film, and polyimide metal laminate using the same |
JP2013083958A (en) * | 2011-09-26 | 2013-05-09 | Nippon Steel & Sumikin Chemical Co Ltd | Photosensitive resin composition, and cured product and semiconductor element using the same |
JP2014529632A (en) * | 2012-05-03 | 2014-11-13 | エルジー・ケム・リミテッド | Novel polyamic acid, photosensitive resin composition, dry film and circuit board |
TWI732893B (en) * | 2016-06-29 | 2021-07-11 | 日商富士軟片股份有限公司 | Negative photosensitive resin composition, cured film, cured film manufacturing method, semiconductor element, laminated body manufacturing method, semiconductor element manufacturing method, and polyimide precursor |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02153934A (en) * | 1988-08-24 | 1990-06-13 | Asahi Chem Ind Co Ltd | Low-stress polyimide precursor, photosensitive composition containing the same and polyimide composite molded body using the same |
JPH0680776A (en) * | 1992-09-02 | 1994-03-22 | Asahi Chem Ind Co Ltd | Polyimide precursor and composition |
JPH11130858A (en) * | 1997-10-31 | 1999-05-18 | Hitachi Chem Co Ltd | Polyimide, its precursor, their production and photosensitive resin composition |
JP2001254014A (en) * | 2000-01-05 | 2001-09-18 | Toray Ind Inc | Photosensitive polyimide precursor composition and metal foil-polyimide composite |
JP2002322277A (en) * | 2001-04-26 | 2002-11-08 | Nippon Steel Chem Co Ltd | Novel terminal-modified polyamic acid and photosensitive resin composition containing the same |
JP2003241371A (en) * | 2002-02-18 | 2003-08-27 | Kyocera Chemical Corp | Photosensitive resin composition and method for producing the same |
JP2004285129A (en) * | 2003-03-19 | 2004-10-14 | Nippon Zeon Co Ltd | Photosensitive polyimide precursor, photosensitive polyimide resin composition, and method of manufacturing semiconductor device using the resin composition |
-
2004
- 2004-05-13 JP JP2004143989A patent/JP2005326579A/en active Pending
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02153934A (en) * | 1988-08-24 | 1990-06-13 | Asahi Chem Ind Co Ltd | Low-stress polyimide precursor, photosensitive composition containing the same and polyimide composite molded body using the same |
JPH0680776A (en) * | 1992-09-02 | 1994-03-22 | Asahi Chem Ind Co Ltd | Polyimide precursor and composition |
JPH11130858A (en) * | 1997-10-31 | 1999-05-18 | Hitachi Chem Co Ltd | Polyimide, its precursor, their production and photosensitive resin composition |
JP2001254014A (en) * | 2000-01-05 | 2001-09-18 | Toray Ind Inc | Photosensitive polyimide precursor composition and metal foil-polyimide composite |
JP2002322277A (en) * | 2001-04-26 | 2002-11-08 | Nippon Steel Chem Co Ltd | Novel terminal-modified polyamic acid and photosensitive resin composition containing the same |
JP2003241371A (en) * | 2002-02-18 | 2003-08-27 | Kyocera Chemical Corp | Photosensitive resin composition and method for producing the same |
JP2004285129A (en) * | 2003-03-19 | 2004-10-14 | Nippon Zeon Co Ltd | Photosensitive polyimide precursor, photosensitive polyimide resin composition, and method of manufacturing semiconductor device using the resin composition |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012207147A (en) * | 2011-03-30 | 2012-10-25 | Ube Industries Ltd | Method for producing polyimide film, polyimide film, and polyimide metal laminate using the same |
JP2013083958A (en) * | 2011-09-26 | 2013-05-09 | Nippon Steel & Sumikin Chemical Co Ltd | Photosensitive resin composition, and cured product and semiconductor element using the same |
JP2014529632A (en) * | 2012-05-03 | 2014-11-13 | エルジー・ケム・リミテッド | Novel polyamic acid, photosensitive resin composition, dry film and circuit board |
US9410017B2 (en) | 2012-05-03 | 2016-08-09 | Lg Chem, Ltd. | Poly-amic acid, photo-sensitive resin composition, dry film, and circuit board |
TWI732893B (en) * | 2016-06-29 | 2021-07-11 | 日商富士軟片股份有限公司 | Negative photosensitive resin composition, cured film, cured film manufacturing method, semiconductor element, laminated body manufacturing method, semiconductor element manufacturing method, and polyimide precursor |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI644943B (en) | Photosensitive resin composition and method for producing hardened relief pattern | |
JP5312071B2 (en) | Polyimide polyamide copolymer and photosensitive resin composition | |
JP6190805B2 (en) | Negative photosensitive resin composition, method for producing cured relief pattern, and semiconductor device | |
JP5620691B2 (en) | Photosensitive resin composition, method for producing cured relief pattern, and semiconductor device | |
CN102162996A (en) | Manufacture method for negative type photosensitive resin composition and cured relief pattern | |
JPWO2006008991A1 (en) | polyamide | |
JP2001147529A (en) | Photosensitive resin composition, method for producing pattern and electronic parts | |
US6511789B2 (en) | Photosensitive polyimide precursor compositions | |
JP2016200643A (en) | Photosensitive resin composition, method for producing patterned cured film and electronic component | |
JPWO2009145227A1 (en) | Photosensitive resin composition | |
TWI753387B (en) | Negative photosensitive resin composition, method for producing polyimide, and method for producing hardened relief pattern | |
JP6427383B2 (en) | Resin composition, method of producing cured relief pattern, and semiconductor device | |
KR102492042B1 (en) | Photosensitive resin composition, dry film and cured product thereof, electronic component or optical product comprising cured product, and adhesive comprising photosensitive resin composition | |
JPS62273259A (en) | Photosensitive composition | |
JP7196121B2 (en) | Pattern forming method, photosensitive resin composition, laminate manufacturing method, and electronic device manufacturing method | |
JP4165473B2 (en) | Negative photosensitive polyimide precursor composition | |
JP5290686B2 (en) | Photosensitive resin composition | |
JP2005326579A (en) | Negative photosensitive polyimide precursor composition | |
WO2015019802A1 (en) | Photosensitive resin composition, relief pattern film thereof, method for producing relief pattern film, electronic component or optical product including relief pattern film, and adhesive including photosensitive resin composition | |
JP2005321648A (en) | Negative photosensitive polyimide precursor composition | |
JP2003121997A (en) | Negative photosensitive resin composition | |
CN112639615A (en) | Photosensitive resin composition, cured film, laminate, method for producing cured film, semiconductor element, and thermoalcogenating agent | |
WO2005116770A1 (en) | Photosensitive polyimide precursor composition | |
JP4165458B2 (en) | Positive photosensitive polyimide precursor composition | |
JP2005148633A (en) | Photosensitive polymer composition, pattern producing method and electronic component |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20070507 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20091022 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20091027 |
|
A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20100330 |