JP2003340587A - Laser beam processing machine - Google Patents
Laser beam processing machineInfo
- Publication number
- JP2003340587A JP2003340587A JP2002150259A JP2002150259A JP2003340587A JP 2003340587 A JP2003340587 A JP 2003340587A JP 2002150259 A JP2002150259 A JP 2002150259A JP 2002150259 A JP2002150259 A JP 2002150259A JP 2003340587 A JP2003340587 A JP 2003340587A
- Authority
- JP
- Japan
- Prior art keywords
- processing machine
- reference mark
- laser processing
- workpiece
- reflection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Landscapes
- Laser Beam Processing (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、特にプリント基板
穴明けにおいてプリント基板の基準マークを容易に検出
するための照明装置を有するレーザ加工機に関するもの
である。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a laser beam machine having an illuminating device for easily detecting a reference mark on a printed circuit board, especially in punching a printed circuit board.
【0002】[0002]
【従来の技術】パーソナルコンピュータや携帯電話の基
板として広く用いられているプリント基板は、年々小型
・高機能化が著しく、配線パターンの微細化が進んでい
る。2. Description of the Related Art Printed circuit boards, which are widely used as substrates for personal computers and mobile phones, are remarkably miniaturized and highly functionalized year by year, and wiring patterns are becoming finer.
【0003】これに伴い、プリント基板の穴明け加工用
のレーザ加工機に対して、X−Yテーブル上に載置した
被加工用プリント基板の歪みやX−Yテーブルの座標軸
からの角度ずれを正確に測定し、補正する必要がある。
そのため、被加工プリント基板には、内層の金属層を用
いて基準とするマーク(以下、基準マークという。)を
設けてあり、それからの反射光をCCDカメラ等で読取
って測定していた。Along with this, a laser beam machine for punching a printed circuit board is subject to distortion of the printed circuit board to be machined placed on the XY table and angular deviation from the coordinate axes of the XY table. It needs to be accurately measured and corrected.
For this reason, a mark (hereinafter referred to as a reference mark) that serves as a reference is provided on the printed circuit board using the inner metal layer, and the reflected light from the reference mark is read and measured by a CCD camera or the like.
【0004】しかし、配線パターンの微細化により基準
マークが小さくなったために、基準マークからの反射光
量が少なくなり、相対的に基準マークの上にある樹脂の
表面からの反射の方が強くなるために、基準マークの測
定が困難となってきている。However, since the reference mark becomes smaller due to the miniaturization of the wiring pattern, the amount of light reflected from the reference mark decreases, and the reflection from the surface of the resin above the reference mark becomes relatively stronger. Moreover, it is becoming difficult to measure the reference mark.
【0005】この解決策として、例えば特公昭63−2
5885号公報に開示されているように、X−Yテーブ
ルに光ファイバーを導きプリント基板を裏側から照明す
る方法や、特許第3023320号公報に開示されてい
るように、X−Yテーブルに光源そのものを配置してプ
リント基板を裏側から照明し、基準マークのコントラス
トを向上させる方法が提案されている。As a solution to this, for example, Japanese Examined Patent Publication No. 63-2
As disclosed in Japanese Patent No. 5885, a method of guiding an optical fiber to an XY table to illuminate a printed circuit board from the back side, and as disclosed in Japanese Patent No. 3023320, a light source itself is attached to an XY table. A method of arranging and illuminating the printed circuit board from the back side to improve the contrast of the reference mark has been proposed.
【0006】[0006]
【発明が解決しようとする課題】X−Yテーブルに光フ
ァイバーや光源を埋め込む方法の場合、ファイバーや配
線があるために、その配線等を長めに取らねばならず、
またその収納方法や収納のためのスペース確保の点で問
題があった。In the case of a method of embedding an optical fiber or a light source in an XY table, since there are fibers and wiring, it is necessary to lengthen the wiring.
In addition, there is a problem in terms of the storage method and securing a space for storage.
【0007】そこで、本発明においては、X−Yテーブ
ルに配線等をすることなく、プリント基板の裏側から照
明でき、高精度の基準マークの測定をできる方法を提供
することにある。Therefore, the present invention is to provide a method capable of illuminating from the back side of a printed circuit board and performing highly accurate measurement of a reference mark without wiring the XY table.
【0008】[0008]
【課題を解決するための手段】本発明のレーザ加工機に
おいては、カメラ用照明光源を被加工物の上側または横
に設置し、かつX−Yテーブル内部に反射部を設けて該
照明光源から発した光を反射することにより、被加工物
を裏側から照明できる照明装置を有することを特徴とす
る。In the laser beam machine of the present invention, an illumination light source for a camera is installed above or beside a workpiece, and a reflection section is provided inside the XY table so that the illumination light source can be operated from the illumination light source. It is characterized by having an illuminating device capable of illuminating the workpiece from the back side by reflecting the emitted light.
【0009】X−Yテーブルには、光の反射部のみを設
けたので、配線する必要がなく、その収納方法やその収
納のためのスペース確保の問題を解決できる。Since only the light reflecting portion is provided on the XY table, there is no need for wiring, and it is possible to solve the problem of the storage method and the space for securing the storage.
【0010】[0010]
【発明の実施の形態】図面を使って本発明の実施の形態
を説明する。図9は本発明に係るレーザ加工機の構成を
示す。レーザ発振器1が出力したレーザビーム2を全反
射ミラー3、4、スキャナモータ5a、5bで回転する
ガルバノミラー6a、6b、fθレンズ7を介し、Yテ
ーブル9上に固定したプリント基板8に照射、加工する
光学系機構と、ベース11上にリニア軸受及びサーボモ
ータからなる駆動系を有するXテーブル10、Xテーブル
上でリニア軸受及びサーボモータからなる駆動系を有す
るYテーブル9によるX−Yテーブル駆動系機構と、Y
テーブル9上に置かれたプリント基板8の位置決めマー
クを検出するために光学系機構と一定の位置関係で取り
付けられたカメラ12から構成され、これら光学系機
構、駆動系機構、カメラをNC装置16により制御す
る。レーザ発振器1は、電源・コントローラ15により
制御される。BEST MODE FOR CARRYING OUT THE INVENTION Embodiments of the present invention will be described with reference to the drawings. FIG. 9 shows the configuration of a laser processing machine according to the present invention. The laser beam 2 output from the laser oscillator 1 is applied to the printed circuit board 8 fixed on the Y table 9 through the total reflection mirrors 3 and 4, the galvano mirrors 6a and 6b rotated by the scanner motors 5a and 5b, and the fθ lens 7. XY table drive by an X table 10 having an optical system mechanism to be processed and a drive system including a linear bearing and a servo motor on a base 11, and a Y table 9 having a drive system including a linear bearing and a servo motor on the X table. System mechanism, Y
It is composed of a camera 12 mounted in a fixed positional relationship with an optical system mechanism for detecting a positioning mark of the printed circuit board 8 placed on the table 9, and these optical system mechanism, drive system mechanism, and camera are used as an NC device 16 Controlled by. The laser oscillator 1 is controlled by the power supply / controller 15.
【0011】図1は、本発明に係るレーザ加工機の加工
ヘッド付近の斜視図である。2はレーザビーム、5はス
キャナモータ、6はガルバノミラー、7はfθレンズ、
8はプリント基板、9はYテーブル、10はXテーブ
ル、12は基準マークを検出するためのカメラ、17は
プリント基板8の姿勢及び位置決めのための基準マー
ク、22及び23は光源、24は光源からの光を反射し
てプリント基板の基準マーク17付近を背面から照明す
るための反射部である。FIG. 1 is a perspective view of the vicinity of a processing head of a laser processing machine according to the present invention. 2 is a laser beam, 5 is a scanner motor, 6 is a galvanometer mirror, 7 is an fθ lens,
8 is a printed circuit board, 9 is a Y table, 10 is an X table, 12 is a camera for detecting a reference mark, 17 is a reference mark for attitude and positioning of the printed circuit board 8, 22 and 23 are light sources, and 24 is a light source. This is a reflection part for reflecting the light from the back side and illuminating the vicinity of the reference mark 17 on the printed board from the back side.
【0012】光源22から照射した光を反射部24によ
り反射して、プリント基板8に設けた基準マーク17を
背面から照明し、その透過画像をカメラ12で検出する
ものである。Yテーブルが移動し、プリント基板8の反
対側の基準マークを検出する場合には、光源23から光
を照射し、反対側の反射部を使って照明する。このよう
に本発明によれば、2台の光源で背面からの照明ができ
る。また、光源22、23は加工中にほとんど移動しな
いレーザ加工ヘッドに取り付けるだけでよいので、テー
ブルの移動による配線の引き回し等を考慮する必要がな
い。The light emitted from the light source 22 is reflected by the reflecting portion 24 to illuminate the reference mark 17 provided on the printed circuit board 8 from the back side, and the transmitted image is detected by the camera 12. When the Y table moves and the reference mark on the opposite side of the printed circuit board 8 is detected, light is emitted from the light source 23 and illuminated by using the reflecting section on the opposite side. As described above, according to the present invention, it is possible to illuminate the rear surface with two light sources. Further, since the light sources 22 and 23 need only be attached to the laser processing head that does not move much during processing, it is not necessary to consider routing of wiring due to movement of the table.
【0013】図2は、プリント基板8の基準マーク付近
の平面図であり、図3は、A−A線断面図である。17
は基準マーク、18及び21は絶縁樹脂層、19は内層
パターン、20は絶縁基体である。基準マーク17は、
通常、電気配線を形成する内層パターン19と同じ銅箔
層である。絶縁樹脂層18、21はエポキシ樹脂、絶縁
基体20はガラス繊維補強したエポキシ樹脂で形成され
る場合が多い。ここで、いずれの材料を用いても、絶縁
基体20、絶縁樹脂層18、21は光の透過性が高く、
基準マーク17は金属製であるから光を反射する。従っ
て、プリント基板8の背面から照明すると、絶縁樹脂層
18の表面からの反射光に煩わされることなく、基準マ
ーク17のコントラストの良い画像を得ることができ
る。FIG. 2 is a plan view near the reference mark on the printed circuit board 8, and FIG. 3 is a sectional view taken along the line AA. 17
Is a reference mark, 18 and 21 are insulating resin layers, 19 is an inner layer pattern, and 20 is an insulating substrate. The reference mark 17 is
Usually, it is the same copper foil layer as the inner layer pattern 19 forming the electric wiring. In many cases, the insulating resin layers 18 and 21 are made of epoxy resin, and the insulating substrate 20 is made of glass fiber reinforced epoxy resin. Here, regardless of which material is used, the insulating substrate 20 and the insulating resin layers 18 and 21 have high light transmittance,
Since the reference mark 17 is made of metal, it reflects light. Therefore, when illuminating from the back surface of the printed circuit board 8, an image with good contrast of the reference mark 17 can be obtained without being bothered by the reflected light from the surface of the insulating resin layer 18.
【0014】[0014]
【実施例】以下、本発明に係る反射部24の具体的な実
施例を示す。
(実施例1)図4は、鏡面加工した金属板を曲げて両側
に角度を持って対向するような反射ミラー25を形成
し、それをYテーブル9に設けた空洞部に設置すること
によって反射部24を構成した例を示す。光源22から
出た光(太い矢印及びその両脇の細線)は反射ミラー2
5によって反射され、基準マーク17を裏側から照明
し、カメラ12で透過画像を撮影することによって基準
マーク17が検出される。EXAMPLES Specific examples of the reflecting portion 24 according to the present invention will be described below. (Embodiment 1) FIG. 4 shows a case where a mirror-finished metal plate is bent to form reflecting mirrors 25 on both sides which face each other at an angle, and the reflecting mirrors 25 are installed in a cavity provided in the Y table 9 to reflect light. An example of configuring the unit 24 is shown. The light emitted from the light source 22 (thick arrows and thin lines on both sides thereof) is reflected by the reflection mirror 2.
5, the reference mark 17 is illuminated from the back side, and the reference mark 17 is detected by capturing a transmission image with the camera 12.
【0015】(実施例2)図5は、2枚の反射ミラー2
6と27をYテーブル9に設けた空洞部に角度を持って
対向するように設置して反射部24を構成した例を示
す。光源22から出た光(太い矢印及びその両脇の細
線)は反射ミラー26、27によって反射され、基準マ
ーク17を裏側から照明し、カメラ12で透過画像を撮
影することによって基準マーク17が検出される。(Embodiment 2) FIG. 5 shows two reflecting mirrors 2.
An example in which 6 and 27 are installed so as to face a cavity provided in the Y table 9 at an angle to form the reflection section 24 will be described. The light emitted from the light source 22 (thick arrows and thin lines on both sides thereof) is reflected by the reflection mirrors 26 and 27, the reference mark 17 is illuminated from the back side, and the reference mark 17 is detected by capturing a transmission image with the camera 12. To be done.
【0016】(実施例3)図6は、光源22をYテーブ
ル9の側面に配置し、その光がYテーブル9に設けた空
洞部に設置した反射ミラー27に照射するように反射部
24を構成した例を示す。光源22から出た光(太い矢
印及びその両脇の細線)は反射ミラー27によって反射
され、基準マーク17を裏側から照明し、カメラ12で
透過画像を撮影することによって基準マーク17が検出
される。(Embodiment 3) In FIG. 6, the light source 22 is arranged on the side surface of the Y table 9, and the reflection portion 24 is arranged so that the light irradiates the reflection mirror 27 installed in the cavity provided in the Y table 9. A configuration example is shown. Light emitted from the light source 22 (thick arrows and thin lines on both sides thereof) is reflected by the reflection mirror 27, illuminates the reference mark 17 from the back side, and the reference mark 17 is detected by capturing a transmission image with the camera 12. .
【0017】(実施例4)図7は、反射ミラーの代りに
光拡散体28をYテーブル9に設けた空洞部に設置して
反射部24を構成した例を示す。光源22から出た光
(太い矢印及びその両脇の細線)は光拡散体28によっ
て乱反射され、Yテーブル9の空洞面で反射され、基準
マーク17を裏側から照明し、カメラ12で透過画像を
撮影することによって基準マーク17が検出される。光
拡散体28としては、ホログラフィック光学素子やフラ
イアイレンズ等、種々の市販品を使用することができ
る。(Embodiment 4) FIG. 7 shows an example in which the light diffusing body 28 is installed in the hollow portion provided in the Y table 9 instead of the reflecting mirror to form the reflecting portion 24. Light emitted from the light source 22 (thick arrows and thin lines on both sides thereof) is diffusely reflected by the light diffuser 28, reflected by the cavity surface of the Y table 9, illuminates the reference mark 17 from the back side, and the transmitted image is taken by the camera 12. The reference mark 17 is detected by photographing. As the light diffuser 28, various commercially available products such as a holographic optical element and a fly's eye lens can be used.
【0018】(実施例5)図8は、Yテーブル9に設け
た空洞部の側面形状に傾斜を付けることにより反射部2
4を構成した例を示す。空洞部の内面を鏡面研磨した場
合さらに反射効率が向上する。光源22から出た光(太
い矢印及びその両脇の細線)は空洞部の両側面の傾斜に
より反射され、基準マーク17を裏側から照明し、カメ
ラ12で透過画像を撮影することによって基準マーク1
7が検出される。この実施例の場合、他の実施例と異な
り、空洞部内に構造物を設置する必要がなく、Yテーブ
ル9に傾斜側面を持つ空洞部を加工するだけで済むとい
う利点がある。(Embodiment 5) FIG. 8 shows that the reflecting portion 2 is formed by inclining the side surface shape of the cavity provided in the Y table 9.
4 shows an example in which No. 4 is configured. When the inner surface of the cavity is mirror-polished, the reflection efficiency is further improved. Light emitted from the light source 22 (thick arrows and thin lines on both sides thereof) is reflected by the inclinations of both side surfaces of the hollow portion, illuminates the reference mark 17 from the back side, and the camera 12 captures a transmission image so that the reference mark 1
7 is detected. In the case of this embodiment, unlike the other embodiments, there is no need to install a structure in the cavity, and there is an advantage that only the cavity having the inclined side surface is processed on the Y table 9.
【0019】また、図8では両側面を傾斜面にしたが、
光源側の側面のみを角度が少しゆるい傾斜面にして実験
してみたところ、位置測定の精度が若干低下したが、従
来よりは良好な結果が得られた。In addition, in FIG. 8, both side surfaces are inclined, but
When an experiment was conducted using only the side surface on the light source side as an inclined surface with a slight angle, the accuracy of position measurement was slightly reduced, but better results than before were obtained.
【0020】[0020]
【発明の効果】本発明においては、反射部を用いてプリ
ント基板の背面から照明するため、X−Yテーブルに配
線等をすることなく、高精度の基準マークの測定をでき
る。According to the present invention, since the reflection portion is used to illuminate from the back surface of the printed circuit board, it is possible to measure the reference mark with high accuracy without wiring the XY table.
【図1】本発明に係るレーザ加工機の加工ヘッド付近の
斜視図FIG. 1 is a perspective view around a processing head of a laser processing machine according to the present invention.
【図2】プリント基板の基準マーク付近の平面図FIG. 2 is a plan view around a reference mark on a printed circuit board.
【図3】A−A線断面図FIG. 3 is a sectional view taken along line AA.
【図4】本発明に係る反射部の断面構成図(実施例1)FIG. 4 is a sectional configuration diagram of a reflecting portion according to the present invention (Example 1).
【図5】本発明に係る反射部の断面構成図(実施例2)FIG. 5 is a sectional configuration diagram of a reflecting portion according to the present invention (Example 2).
【図6】本発明に係る反射部の断面構成図(実施例3)FIG. 6 is a sectional configuration diagram of a reflecting portion according to the present invention (Example 3).
【図7】本発明に係る反射部の断面構成図(実施例4)FIG. 7 is a sectional configuration diagram of a reflecting portion according to the present invention (Example 4).
【図8】本発明に係る反射部の断面構成図(実施例5)FIG. 8 is a sectional configuration diagram of a reflecting portion according to the present invention (Example 5).
【図9】本発明に係るレーザ加工機の構成図FIG. 9 is a configuration diagram of a laser processing machine according to the present invention.
1・・・レーザ発振器 2・・・レーザビーム 3、4・・・全反射ミラー 5a、5b・・・スキャナモータ 6a、6b・・・ガルバノミラー 7・・・fθレンズ 8・・・プリント基板 9・・・Yテーブル 10・・・Xテーブル 11・・・ベース 12・・・カメラ 15・・・電源・コントローラ 16・・・NC装置 17・・・基準マーク 18・・・絶縁樹脂層 19・・・内層パターン 20・・・絶縁基体 21・・・絶縁樹脂層 22、23・・・光源 24・・・反射部 25・・・曲げた反射ミラー 26、27・・・反射ミラー 28・・・光拡散体 1 ... Laser oscillator 2 ... Laser beam 3, 4 ... Total reflection mirror 5a, 5b ... Scanner motor 6a, 6b ... Galvo mirror 7 ... fθ lens 8: Printed circuit board 9 ... Y table 10 ... X table 11 ... Base 12 ... Camera 15 ... Power supply / Controller 16 ... NC device 17 ... Standard mark 18 ... Insulating resin layer 19: Inner layer pattern 20 ... Insulating substrate 21 ... Insulating resin layer 22, 23 ... Light source 24 ... Reflector 25 ... Bent reflection mirror 26, 27 ... Reflective mirror 28 ... Light diffuser
Claims (6)
ー、焦点レンズで構成される光学系機構と、被加工物を
X−Y位置決めする駆動系機構および、被加工物の基準
マークを検出するためのカメラ及び照明装置からなるレ
ーザ加工機において、カメラ用照明光源を被加工物の上
側または横に設置し、かつX−Yテーブル内部に反射部
を設けて該照明光源から発した光を反射することによ
り、被加工物を裏側から照明できる照明装置を有するこ
とを特徴とするレーザ加工機。1. An optical system mechanism comprising a laser oscillator, a reflection mirror, a galvano mirror, and a focus lens, a drive system mechanism for XY positioning of a workpiece, and a reference mark for detecting the workpiece. In a laser processing machine composed of a camera and an illumination device, an illumination light source for a camera is installed on an upper side or a side of a workpiece, and a reflection section is provided inside an XY table to reflect light emitted from the illumination light source. Therefore, the laser processing machine is provided with an illuminating device that can illuminate the workpiece from the back side.
持って対向するように形成した反射ミラーをX又はYテ
ーブルに設けた空洞部に設置することによって反射部を
構成したことを特徴とする請求項1に記載のレーザ加工
機。2. A reflection part is constituted by bending a mirror-finished metal plate and installing reflection mirrors formed on both sides so as to face each other at an angle in a cavity provided in an X or Y table. The laser processing machine according to claim 1.
けた空洞部に角度を持って対向するように設置して反射
部を構成したことを特徴とする請求項1に記載のレーザ
加工機。3. The laser processing according to claim 1, wherein two reflecting mirrors are installed so as to face the cavity provided in the X or Y table at an angle so as to constitute a reflecting portion. Machine.
その光が該テーブルに設けた空洞部に設置した反射ミラ
ーに照射するように反射部を構成したことを特徴とする
請求項1に記載のレーザ加工機。4. A light source is arranged on a side surface of an X or Y table,
The laser processing machine according to claim 1, wherein the reflecting portion is configured so that the light irradiates a reflecting mirror installed in a cavity provided in the table.
空洞部に設置して反射部を構成したことを特徴とする請
求項1に記載のレーザ加工機。5. The laser beam machine according to claim 1, wherein the light diffuser 27 is installed in a cavity provided in the X or Y table to form a reflection portion.
状に傾斜を付けることにより反射部を構成したことを特
徴とする請求項1に記載のレーザ加工機。6. The laser processing machine according to claim 1, wherein the reflecting portion is formed by inclining the side surface shape of the hollow portion provided on the X or Y table.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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JP2002150259A JP2003340587A (en) | 2002-05-24 | 2002-05-24 | Laser beam processing machine |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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JP2002150259A JP2003340587A (en) | 2002-05-24 | 2002-05-24 | Laser beam processing machine |
Publications (1)
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JP2003340587A true JP2003340587A (en) | 2003-12-02 |
Family
ID=29768156
Family Applications (1)
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JP2002150259A Withdrawn JP2003340587A (en) | 2002-05-24 | 2002-05-24 | Laser beam processing machine |
Country Status (1)
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JP (1) | JP2003340587A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8037584B2 (en) | 2007-04-23 | 2011-10-18 | Samsung Electro-Mechanics Co., Ltd. | Printed circuit board, method of manufacturing the same, and apparatus for perforating via holes |
CN101355852B (en) * | 2007-07-25 | 2012-07-25 | 三星电机株式会社 | Printed circuit board manufacturing system and manufacturing method thereof |
US20170008223A1 (en) * | 2011-11-08 | 2017-01-12 | Picosys Incorporated | Room temperature glass-to-glass, glass-to-plastic and glass-to-ceramic/semiconductor bonding |
-
2002
- 2002-05-24 JP JP2002150259A patent/JP2003340587A/en not_active Withdrawn
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8037584B2 (en) | 2007-04-23 | 2011-10-18 | Samsung Electro-Mechanics Co., Ltd. | Printed circuit board, method of manufacturing the same, and apparatus for perforating via holes |
CN101355852B (en) * | 2007-07-25 | 2012-07-25 | 三星电机株式会社 | Printed circuit board manufacturing system and manufacturing method thereof |
US8535547B2 (en) | 2007-07-25 | 2013-09-17 | Samsung Electro-Mechanics Co., Ltd. | Printed circuit board manufacturing system and manufacturing method thereof |
US20170008223A1 (en) * | 2011-11-08 | 2017-01-12 | Picosys Incorporated | Room temperature glass-to-glass, glass-to-plastic and glass-to-ceramic/semiconductor bonding |
US10293551B2 (en) * | 2011-11-08 | 2019-05-21 | Picosys Incorporated | Room temperature glass-to-glass, glass-to-plastic and glass-to-ceramic/semiconductor bonding |
US11571860B2 (en) | 2011-11-08 | 2023-02-07 | Corning Incorporated | Room temperature glass-to-glass, glass-to-plastic and glass-to-ceramic/semiconductor bonding |
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A300 | Withdrawal of application because of no request for examination |
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