JP2002039957A - Method for inspecting stamp and method for inspecting sheet for forming stamp - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a method whereby stamps and sheets for forming stamps can be surely and speedily inspected and an acceptable range in terms of a quality can be arbitrarily determined. SOLUTION: There is provided the method for inspecting stamps which includes steps of irradiating a laser light while scanning in a predetermined direction to the stamps with a stamping face formed, measuring a shift amount after receiving the laser light reflected by the stamp with the use of a surveying device capable of measuring a physical change of the stamping face from a change of the laser light, and checking the presence/absence of defects by comparing reference data registered beforehand to a storage means with the measured data of the stamp. There is also provided the method for inspecting sheets for forming stamps which includes steps of irradiating a laser light while scanning in a predetermined direction to the sheet for forming stamps, measuring a shift amount after receiving the laser light reflected by the sheet with the use of a surveying device capable of measuring a physical change of a stamping face from a change of the laser light, and checking the presence/absence of defects by comparing reference data registered beforehand to a storage means with the measured data of the sheet.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

[0001] 1. Field of the Invention [0002] The present invention relates to a method for inspecting a stamp on which a stamp surface such as a character, a figure, a symbol, etc. is formed, and a method for inspecting a stamp forming sheet.

[0002]

2. Description of the Related Art Conventional stamps include rubber stamps such as natural rubber and synthetic rubber, plastic stamps such as polyolefin, polystyrene and polyurethane, wooden stamps, metal stamps, ceramic stamps, and ivory carving stamps. ing. Among them, rubber stamps and plastic stamps are made by adding and kneading various additives to each raw material,
After this was processed into a sheet, a printing portion was formed by pressing with a mold engraving characters, figures, symbols, and the like, and cut into a required size to obtain a stamp. Recently, a stamp forming sheet is prepared in advance as in Japanese Patent Application Laid-Open No. 3-35890, and the stamp forming sheet is processed by using a laser beam machine such as a carbon dioxide laser or a YAG laser. After obtaining a seal, see JP-A-63-31200.
As in No. 8, ivory and the like may be engraved to form a stamped surface and obtain a stamp. Further, not only non-porous sheets having no pores but also porous sheets having continuous pores are known as the stamp forming sheets.

As a method for inspecting a stamp or a sheet for forming a stamp prepared by the above-described method, a method of attaching ink to the surface, stamping the sheet, and visually inspecting the imprint for abnormalities, and a method of inspecting the stamp. Japanese Unexamined Patent Publication No. Hei 9-61372 and
As described in Japanese Patent No. 237334, a method is known in which the surface of a stamp is photographed with a CCD camera and compared with reference data to check whether there is any abnormality.

[0004]

However, the former inspection method is unsuitable as an inspection method because once the ink is applied to the stamp, the commercial value drops. Further, the latter inspection method has a drawback that when the inspected object is dark, it is difficult to obtain a sharp image and it is not possible to acquire effective image data. Normally, scratches and defects existing on the stamp surface are different in depth, length and shape, respectively,
In the latter inspection method, the acceptable range in terms of quality cannot be arbitrarily determined, so that the judgment may be made more strictly than necessary to make a defective product, or a defective product may be judged as acceptable. The present invention has been made in view of the above, and an object of the present invention is to provide a method capable of reliably and quickly inspecting a seal stamp and arbitrarily determining an acceptable range in quality.

[0005]

Means for Solving the Problems A stamp on which a stamp surface is formed is irradiated with laser light while scanning in a predetermined direction, and the stamp is measured using a surveying instrument capable of measuring a physical change of the stamp surface by a change in the laser beam. A stamp inspection method for measuring the amount of displacement by receiving the laser beam reflected by the device, and comparing the reference data registered in advance in the storage means with the measurement data of the stamp to check for the presence or absence of a defect. In addition, the depth from the stamp surface is 0.05 mm to 1.0 mm
Is defective, the depth from the stamp surface is 0.05mm ~
A stamp inspection method in which reference data indicating that there is no defect in cases other than 1.0 mm is registered in the storage means. Further, the master data of the stamp surface is registered in the storage means, and the master data is compared with the measurement data of the stamp to calculate the position shift. When the position shift is out of the allowable error range, there is a defect and the position shift is allowable. This is a stamp inspection method in which reference data indicating that there is no defect when the error is within the error range is registered in the storage means. As another invention,
The stamp forming sheet is irradiated with laser light while scanning in a predetermined direction, and the laser beam reflected by the stamp forming sheet is received using a surveying instrument capable of measuring the physical change of the stamp surface by a change in the laser light. A stamp forming sheet inspection method for measuring the amount of displacement and comparing the reference data registered in advance in the storage means with the measured data of the stamp forming sheet to check for the presence or absence of a defect. The reference data registered in the storage means is a reference data that the defect is present when the depth from the surface of the stamp creation sheet is 0.05 mm or more, and that there is no defect when the depth from the surface of the stamp creation sheet is less than 0.05 mm. Sheet inspection method for making. In addition, the reference data for registering the stamp is registered in the storage means that there is a defect when the thickness of the stamp forming sheet is outside the allowable error range, and that there is no defect when the thickness of the stamp forming sheet is within the allowable error range. This is a sheet inspection method.

[0006]

DESCRIPTION OF THE PREFERRED EMBODIMENTS When a surface of a stamp or a stamp forming sheet is irradiated with laser light, the laser light is reflected on the surface. When scanning is performed while moving in a predetermined direction, and the height of those surfaces changes, the laser light reflected by the displacement also changes. The present invention utilizes this phenomenon, and depth information can be obtained by measuring the amount of displacement. The inspection device used in the present invention is a laser device for irradiating a laser beam on the surface of a stamp or a stamp forming sheet, and a scanning device for scanning the laser beam in a predetermined direction on the surface of the stamp or a stamp forming sheet. And a surveying instrument for receiving a laser beam reflected by the stamp or the stamp forming sheet to measure a physical change on the surface, a measurement data recording unit for recording the measured data, and storing reference data. It comprises a storage means and a judging means for comparing the measured data with the reference data and judging the quality of the stamp or the sheet for forming the stamp. When inspecting a stamp or a sheet for creating a stamp, the depth considered to be a scratch or a defect is registered in advance as reference data, and if the judgment means has a depth sufficient to function as a sheet for creating a stamp or a stamp, it is normal. Although it is a value, if it has a depth enough to cause a defect, it is determined as an abnormal value.

[0007]

FIG. 1 shows an example of the configuration of a stamp inspection apparatus according to the present invention. 1 is a laser device that emits a laser beam 2 having a predetermined spot diameter, and 3 is an XY table (or γ-θ table) for moving the stamp 4 at a constant speed. Reference numeral 4 denotes a stamp to be inspected, and reference numeral 5 denotes a stamp face formed with characters, figures, symbols, and the like on the surface of the stamp 4 and has the same shape as that of the stamp when stamping. Reference numeral 6 denotes a supporting portion that supports the stamp surface 5. 7 is a defect such as a scratch or a defect. Reference numeral 8 denotes a surveying instrument for receiving the laser beam 2 reflected by the stamp face 5 to measure a physical change of the stamp face, 9 denotes measurement data recording means for storing measurement data converted into electric signals by the survey instrument 8, 10 Is reference data storage means for storing depth information and flaw / defect information in advance, and 11 is a judgment means for comparing the measured data with the reference data to judge the quality of the product. When the seal is actually inspected, the height of the support and the value of the depth of a defect considered to be a scratch or a defect are registered in advance as reference data. A commonly used seal has a height of the support portion 6 of 1.0 m.
m, the reference data indicating that there is no defect when the depth from the stamp surface is greater than 1.0 mm is registered in the reference data storage means 10. If the measured data obtained as the depth is 0.05 mm to 1.0 mm, it is a scratch or a defect. In this case, reference data indicating that there is a defect is registered in the reference data storage unit 10. Further, if the measured data obtained as the depth is less than 0.05 mm, it is a scratch or a defect that does not affect the seal, and in this case, the reference data to be ignored is registered in the reference data storage unit 10.
Next, the stamp 4 is placed on an XY table (or γ-θ table) 3, and is irradiated with the laser beam 2 from the laser device 1 while moving at a constant speed in the XY direction (or γ-θ direction). . The laser beam 2 reflected by the stamp surface 5 is received by a surveying instrument 8, converted into an electric signal as measurement data, and recorded in a measurement data recording unit 9. Since the measuring device 8 can measure the physical change of the stamp surface by the change of the laser beam, the displacement amount of the stamp surface is also recorded as the measurement data. Next, the measurement data is compared with the reference data by the judging means 11. It is determined that there is no product, and the quality of the product is determined. In the stamp of this embodiment, since the support portion 6 is inclined, two spots (2
A defect is determined to be present when the depth falls within the range of 0.05 mm to 1.0 mm continuously. Although the detailed configuration of the judging means 11 is not shown, the comparison judgment is made reliably and quickly by the processing of the electronic circuit. According to the present invention,
Since the inspection can be terminated when a defect is found without inspecting all the stamped surfaces, quick inspection is possible. In this embodiment, the depth from the stamp surface is 0.05 mm to 1.0 mm.
In the case of 0 mm, it is determined that there is a defect, but the range of the lower limit and the upper limit of the defect can be freely changed depending on the material of the stamp.

In the inspection for the presence or absence of a stamp face defect in the above embodiment, if there is no defect, it means that all the stamp faces have been measured. Therefore, in the present invention, information on the position of a character or the like on the master stamp surface is stored in advance in the master data storage unit 12 as master data, and the master data and the measured data are compared to calculate the displacement of the position of the character or the like. Means 11 can be used to determine the quality of the product. Master stamps include relatively many names such as "Suzuki" and "Sato" and a round frame surrounding the names, words frequently used in business such as "Confidential" and "Express", and square frames surrounding the words, etc. , Which is a master sign in various fonts, such as line fonts, Gothic fonts, old stamps, etc., which are read by a computer using electronic means, and the relative distance between characters and characters, The target character position information is registered as master data. Normally, the range of error that can be accepted as a stamp product is that the relative displacement with respect to the master data is 0.5 mm.
Therefore, the reference data indicating that there is a defect when the displacement is 0.5 mm or more and that there is no defect when the displacement is less than 0.5 mm is registered in the master data storage unit 12. The determining means 11 can determine that there is a defect if any part of the stamp face exceeds the allowable range of the reference data.

According to the present invention, it is possible to judge the quality of a stamp forming sheet used for forming a stamp as well as a stamp after manufacturing. If a stamp is created using a stamp creation sheet having a defect, a stamp having a defect is naturally manufactured, and therefore, an inspection when the sheet is created is also required. FIG.
When inspecting a stamping sheet such as the one described above, if the depth from the surface of the stamping sheet is 0.05 mm or more, there is a defect, and the stamping sheet is considered to be a scratch or defect that does not affect the stamp. 0.05m from the surface of the seat
If it is less than m, reference data indicating that there is no defect is registered in the reference data storage means 30 in advance. Next, the stamp forming sheet 24 is placed on an XY table (or γ-θ table) 23, and is moved at a constant speed in the XY direction (or γ-θ direction) by a laser beam 22 from the laser device 21. Is irradiated. The laser beam 22 reflected by the stamp forming sheet 24 is received by a surveying instrument 28, converted into an electric signal as measurement data, and stored in a measurement data recording unit 29. Since the measuring device 28 can measure the physical change of the stamp surface by the change of the laser beam, the displacement of the stamp surface is also recorded as the measurement data. Next, the determination data 31 compares the measured data with the reference data. If the measured data obtained as the depth is 0.05 mm or more, it is determined that there is a defect. Determine the quality. Although the detailed configuration of the determination means is not shown, the comparison and determination can be made reliably and quickly by the processing of the electronic circuit. According to the present invention,
Since the inspection can be terminated when a defect is found without inspecting all the stamped surfaces, quick inspection is possible. In the present embodiment, when the depth from the surface of the stamp forming sheet is 0.05 mm or more, it is determined that there is a defect. However, the range of the lower limit and the upper limit of the defect can be freely changed depending on the material of the stamp.

The present invention has an advantage that not only the defect of the stamp forming sheet but also the thickness of the stamp forming sheet can be measured simultaneously with the inspection. If the reference data of the thickness of the stamp forming sheet is stored in the reference data storage means 30 in advance, the determination means 31 can compare the measured data with the reference data to determine the quality of the product. For example, when the reference value of the thickness of the stamp forming sheet is 5.0 mm, the error range of the thickness that can be generally accepted as a product is about 10% of ± 10%.
Since it is 0.5 mm, if it exceeds the allowable error range (± 0.5 mm), it is determined that there is a defect. Although the detailed configuration of the determination means is not shown, the comparison and determination can be made reliably and quickly by the processing of the electronic circuit.

[0011]

As described above, in the stamp inspection method and the stamp production sheet inspection method according to the present invention, the stamp or the stamp production sheet can be reliably and promptly produced regardless of the material of the stamp, the presence or absence of the pores, and the color. It can be inspected and the range acceptable in quality can be arbitrarily determined, and can contribute to efficient inspection of various types of stamps or stamp forming sheets. In addition, the inspection can be stopped when a defect is found without inspecting the entire stamp surface or the entire surface of the stamp forming sheet, so that quick inspection is possible.

[Brief description of the drawings]

FIG. 1 is a configuration example of a first invention.

FIG. 2 shows a configuration example of the second invention.

[Explanation of symbols]

 REFERENCE SIGNS LIST 1 laser device 2 laser light 3 XY table (or γ-θ table) 4 stamp 5 stamp face 6 support 7 defect 8 surveyor 9 measurement data recording means 10 reference data storage means 11 judgment means 12 master data storage means 21 laser Apparatus 22 Laser light 23 XY table (or γ-θ table) 24 Seal creation sheet 27 Defect 28 Surveyor 29 Measurement data recording means 30 Reference data storage means 31 Judgment means

──────────────────────────────────────────────────続 き Continued on the front page (51) Int.Cl. ⁷ Identification symbol FI Theme coat ゛ (reference) G06T 1/00 300 G06T 1/00 300 F term (reference) 2F065 AA03 AA06 AA20 AA25 AA49 BB05 CC00 CC02 DD06 FF44 FF61 FF67 GG04 JJ01 MM03 PP12 PP13 PP22 QQ23 RR06 RR09 2G051 AA32 AA90 AB02 BA10 CA02 CB01 DA07 EB01 EB02 2H084 AE07 BB05 5B057 AA20 BA02 BA19 DA03 DC30 DC33

Claims (6)

[Claims] A laser beam is applied to a stamp on which a stamp surface is formed while scanning in a predetermined direction, and the stamp is reflected by a surveying instrument capable of measuring a physical change of the stamp surface by a change in the laser beam. A stamp inspection method for measuring displacement by receiving light and comparing the reference data registered in advance in the storage means with the stamp measurement data to determine the presence or absence of a defect. 2. The depth from the stamp surface is 0.05 mm to 1.0 mm.
mm, there is a defect, and the depth from the stamp surface is 0.05 mm
2. The stamp inspection method according to claim 1, wherein reference data indicating that there is no defect in a case other than 1.0 mm is registered in the storage means. 3. Registering the master data of the stamp surface in a storage means, comparing the master data with the measurement data of the stamp, and calculating a position shift. If the position shift is out of an allowable error range, a defect is detected. 3. The stamp inspection method according to claim 1, wherein reference data indicating that there is no defect when the deviation is within the allowable error range is registered in the storage unit. 4. A stamp forming sheet is irradiated with a laser beam while scanning in a predetermined direction, and the stamp forming sheet is reflected by a surveying instrument capable of measuring a physical change of a stamp surface by a change in the laser light. A stamp forming sheet inspection method for measuring the amount of displacement by receiving the laser beam and comparing the reference data registered in advance in the storage means with the measurement data of the stamp forming sheet to check for defects. 5. The depth from the surface of the stamp forming sheet is 0.
5. The method according to claim 4, wherein reference data indicating that a defect is present when the depth is equal to or greater than 05 mm and that no defect is present when the depth from the surface of the stamp forming sheet is less than 0.05 mm is registered in the storage unit. 6. Reference data is registered in the storage means, which indicates that there is a defect when the thickness of the stamp forming sheet is outside the allowable error range and that there is no defect when the thickness of the stamp forming sheet is within the allowable error range. The stamp inspection sheet inspection method according to claim 4.