JP2001066351A - Circuit board-inspecting device and connector - Google Patents

Abstract

PROBLEM TO BE SOLVED: To collectively obtain the reliability of connection by providing a first electrode that conducts electricity to a probe pin corresponding to the wiring pattern of a circuit board for connecting and a second electrode corresponding to the first one, and by bringing both the electrodes into press contact. SOLUTION: On an upper surface 22 AX of a lower fixture 22A being fixed onto a substrate 21, a probe pin 25 is formed corresponding to the land pattern of a circuit board 23. On the other hand, on a lower surface 22 BX of an upper fixture 22B, a contacting pin 26 corresponding to the clearance between electronic components being mounted onto the circuit board 23 is formed. In one end of the lower fixture 22A, a pin base 28 being fixed into a connection measurement part 24 is extended, and a connector pin 29 corresponding to a probe pin 25 is formed at the upper part. In the case of an inspection, the circuit board 23 is positioned so that it is brought into contact with the probe pin 25 for retaining between the fixtures 22B and 22A. Then, at a connection part 24, the array pattern of the connector pin 29 is determined based on the probe pin 25, then a cylinder 33 is driven, and continuity connection is carried out while a probe pin 36 at a press-type connection part 34 is being brought into contact with the connector pin 29.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a circuit board inspection apparatus and a connector, and more particularly to a circuit board inspection apparatus such as an in-circuit tester (ICT).

[0002]

2. Description of the Related Art Conventionally, in a circuit board inspection apparatus of this type, a plurality of electronic components mounted on a circuit wiring board are each measured for electrical characteristic values and inspected for quality. Short circuit and open on circuit board,
It is designed to detect mounting errors of electronic components, missing mounting components, and the like.

FIG. 4 shows a conventional circuit board inspection apparatus 1 in which a fixture 5 on which a circuit board 4 is mounted is detachably attached to a fixture holding section 3 provided on a base 2. Accordingly, the connection state of each electronic component (not shown) mounted on one surface of the circuit board 4 can be determined by the control unit 6 provided in the fixture holding unit 3. In this case, the circuit board 5 to be inspected is subjected to a soldering process in advance corresponding to lands (not shown) of a predetermined pattern formed on one surface.

On the upper surface 5A of the fixture 5, probe pins (probing) 7 are formed so as to protrude in correspondence with each land pattern (not shown) formed on the one surface 4A of the circuit board 4, and are formed on the side. A plurality of cartridge substrates 8 are stacked on the edge 5B at predetermined intervals. As shown in FIG. 5, in each cartridge substrate 8, a plurality of terminals 8B are arranged in a row along the upper surface of the side end 8A, and each terminal 8B is connected to a probe pin 7 in the fixture 5. And are electrically connected.

The fixture holder 3 has a flat surface 3A for contacting the lower surface 5C of the fixture 5, and a holding member 3B is formed at one end of the flat surface 3A. A plurality of connection substrates 9 are provided on the inner end of the holding member 3B.
A connector 9 is buried in which A is sequentially laminated at the same interval as the lamination interval of the cartridge substrates 8 described above, and the side end 8A of each cartridge substrate 8 is provided on the upper surface of the side end of each connection substrate 9A. The terminals (not shown) corresponding to the respective terminals 8B formed in are provided.

From the outer end of the holding member 3B, wirings (not shown) for electrically connecting to the respective terminals formed on the respective connection boards 9 of the connector 9 are bundled and covered with an outer cover such as vinyl chloride. The cable 10 having the above configuration is drawn out, and is electrically connected to the control unit 6 built in the base 2.

The connector 9 has a structure that can be opened and closed by moving a lever (not shown) up and down. When the connector 9 is in the open state, each side end 8A of each cartridge substrate 8 of the fixture 5 is connected to the side of the corresponding connection substrate 9A. The ends are in a state in which they can be overlapped alternately at once, and when in the closed state, the side ends 8A of the respective cartridge substrates 8 are sandwiched in the stacking direction while the corresponding side ends of the corresponding connection substrates 9A overlap. , Each terminal 8B formed on the side end 8A of each cartridge substrate 8 can be electrically connected to each terminal (not shown) formed on the corresponding side end of the connection substrate 9A. It has been made like that.

[0008] The use of the openable / closable connector 9 as described above is usually such that the total number of the terminals 8B formed on each side end 8A of each cartridge substrate 8 is about 1000, and the user can manually handle it. While holding each terminal 8B, the corresponding connector 9
This is because it is very difficult in practice to reliably conduct conductive connection to each terminal of each connection board 9A.

When the circuit board inspection apparatus 1 actually inspects the circuit board 4, first, the tip of each probe pin 7 of the fixture 5 is attached to the circuit board 4.
And is placed so as to abut on a corresponding land (not shown) on one surface 4A.

Subsequently, the holding member 3 of the fixture holding section 3
B, the connector 9 is opened, and the fixture 5 on which the circuit board 4 is placed is pushed in the direction of arrow a while making contact with the flat surface 3A of the fixture holder 3. After the side end portions 8A of the cartridge substrate 8 are collectively fitted to the connector 9, the connector 9 is closed.

[0011]

However, since the connector 9 has an openable structure, the side end 8A of each cartridge board 8 provided on the fixture 5 is connected to the side end of each connection board 9A of the connector 9. When each of the cartridge substrates 8 is overlapped with each other, if dirt such as dust or dirt adheres to the side end 8A of each of the cartridge substrates 8, there is a possibility that the dirt may be sandwiched together. As a result, each terminal 8B formed on each side end 8A and each connection board 9 of the corresponding connector 9 are connected.
There is a problem that a contact failure occurs between each of the terminals A.

Therefore, the user can reliably control all the terminals 8B formed on each side end 8A without holding the side end 8A of each cartridge substrate 8 provided on the fixture 5 by a user. It is very effective if there is a mechanism for conducting connection with the unit 6, but such a mechanism has not been proposed yet.

The present invention has been made in consideration of the above points, and has as its object to propose a circuit board inspection apparatus and a connector which can collectively obtain connection reliability.

[0014]

According to the present invention, there is provided a probe holding means for collectively fixing and holding a plurality of probe pins in the same positional relationship as a plurality of inspection positions on a circuit board. A circuit board comprising: a main body portion to which a probe holding means is detachably attached and which checks whether or not a connection state of the circuit board is normal based on electrical characteristics of the circuit board which is conducted through each probe pin. In the inspection device, a plurality of first electrodes provided on the probe holding means and electrically connected to the respective probe pins, and a plurality of second electrodes provided on the main body and provided in correspondence with the respective first electrodes. And first and second electrodes corresponding to each other are provided, and one of the first and second electrodes is a pin made of a conductive material. Was Unishi.

As a result, in this circuit board inspection apparatus, a plurality of first electrodes electrically connected to the respective probe pins corresponding to the corresponding wiring patterns of the circuit board, and the plurality of first electrodes are provided corresponding to the respective first electrodes. Even when dirt such as dust or dirt adheres to the second electrode,
When the first electrode and the corresponding second electrode are pressed against each other, each first or second electrode made of a pin made of a conductive material breaks through dirt such as dust and dirt, and the corresponding second or first electrode respectively. Electrodes can be contacted at once, and thus each first
In addition, it is possible to prevent poor contact between the second electrode and the second electrode.

Further, in the present invention, a plurality of first electrodes electrically connected to a plurality of probe pins, and a plurality of second electrodes provided corresponding to the respective first electrodes are provided. One of the first and second electrodes is a pin made of a conductive material, and each of the first electrodes and the corresponding second electrode are brought into contact collectively by pressing each other.

As a result, in this connector, a plurality of first electrodes electrically connected to a plurality of probe pins, respectively, and a second electrode provided in correspondence with each of the first electrodes are provided with dust and dirt. Even when dirt is attached, when the first electrode and the corresponding second electrode are pressed against each other, the first or second electrode made of a pin made of a conductive material may be attached to dust or dirt. Can be brought into contact with each of the corresponding second or first electrodes in a lump, thereby preventing the occurrence of poor contact between each of the first and second electrodes.

[0018]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below in detail with reference to the drawings.

(1) Configuration of Circuit Board Inspection Apparatus According to the Present Embodiment In FIG. 1, reference numeral 20 denotes a circuit board inspection apparatus to which the present invention is applied as a whole.
And a connection measuring unit 23, and the fixture 22
The connection measurement unit 24 can inspect the circuit board 23 to be inspected, which is loaded in, for whether or not the connection state of the circuit board 23 is normal.

In the fixture 22, a lower fixture 22A is fixed on a base 21, and a pair of supporting members (not shown) are set up so as to sandwich the lower fixture 22A from both sides. The upper fixture 22 in which a lifting mechanism (not shown) is built in each support member.
B is provided so as to be able to move up and down in the direction of arrow a or in the direction opposite thereto.

The upper surface 22A of the lower fixture 22A
In X, probe pins (probes) 25 are formed so as to protrude in correspondence with land patterns (not shown) formed on one surface of the circuit board 23. Also, a plurality of contact pins 26 are formed on a lower surface 22BX of the upper fixture 22B via a support plate 27 corresponding to gaps between electronic components (not shown) mounted on the other surface of the circuit board 23. Have been.

At one end of the lower fixture 22A, a pin base 28 is provided extending in the direction of arrow b, and the pin base 28 is fixedly supported in the connection measuring section 24. On the upper surface of the pin base 28, connector pins 29 corresponding to the respective probe pins 25 are formed so as to be exposed in a predetermined arrangement pattern.

Usually, the plurality of connector pins 29 are detachably mounted on the pin base 28 in a state of being regularly arranged in a grid pattern, and are electrically connected to the respective probe pins 25 according to the land pattern of the circuit board 23. By removing all but the connected connector pin 29,
The arrangement pattern of the connector pins 29 as described above is always determined according to the circuit board 23 to be inspected.

In the connection measuring section 24, four support rods 30 are planted on the base 21 so as to surround the four corners of the pin base 28, and the support plates 31 supported by the respective support rods 30 are provided. A pin base 28 is fixedly supported on the upper side.

A bridge plate 32 is supported on the upper ends of these four support rods 30. A cylinder 33 is provided on the upper end side of the bridge plate 32, and a slide shaft 33A of the cylinder 33 is moved in the direction of arrow a or It slides up and down in the opposite direction. This cylinder 33
The press-type connecting part 3 is provided at the tip of the slide shaft 33A.
4 is fixedly held in a state where it is positioned at a position facing the pin base 28.

Accordingly, the cylinder 33 moves up and down in the direction of the arrow a or in the direction opposite to the direction of the arrow a integrally with the press-type connecting portion 34 under the control of the control portion 35 provided on the base 21. It can be driven to move.

From the lower end of the press-type connecting portion 34,
A plurality of probe pins 36 each having a tapered tip are formed in a protruding manner in a predetermined arrangement pattern, and are controlled by a cable 37 (FIG. 2) pulled out from a side end of the press-type connecting portion 34. 35. The cable 37 has a configuration in which wirings conductively connected to the respective probe pins 36 are bundled and covered with a sheath such as vinyl chloride.

As shown in FIG. 2, the press-type connecting portion 34 has a connector 38 and a receptacle holding plate 39. In the connector 38, a receptacle corresponding to each connector pin 29 formed on the pin base 28 is provided. One end of each of the fixed members 40 can be fixedly held.

Each of these receptacles 40 is shown in FIG.
And (B), a cylindrical body 41 made of an insulating material having a closed wall 41A formed at one end and an opening 41B formed at the other end, and is formed at a predetermined position along the longitudinal direction from the opening 41B. An annular groove 41G is formed on the peripheral surface. Each of the receptacles 40 is inserted in a state in which a disk 42 made of a conductive material and a coil spring 43 are sequentially abutted inside a closed wall 41A formed at one end of the cylindrical body, and is also formed in the closed wall 41A. The disc is electrically connected to one wiring 37P constituting the cable 37 through the perforated hole 41AH.

In each of the cylindrical bodies 41 of the receptacles 40, a probe forming portion 44 integrally provided with a probe pin 36 is detachably attached via an opening 41B. Each of the probe forming portions 44 has a cylindrical body 45 made of a conductive material having a closed wall 45A formed at one end and an opening 45B formed at the other end, and a conductive material inserted through the opening 45B. Of the coil spring 46 is fixed to the inside of the closing wall 45A, and the opening 45B
From the inner peripheral surface at a predetermined position along the longitudinal direction.
5T is formed.

The cylindrical body 4 of each probe forming section 44
5 is formed so that the outer diameter thereof is substantially equal to the inner diameter of the cylindrical body 41 of the receptacle 40, and the flange 45T formed on the outer peripheral surface is fitted with the groove 41G formed in the cylindrical body 41 of the receptacle 40. It is formed to fit.

One end of each probe pin 36 is held in contact with the other end of the coil spring 46 inserted in the cylinder 45 of the probe forming section 44. The inside of the cylinder 45 can be slid along the longitudinal direction.

Thus, the probe forming portions 44 in which the respective probe pins 36 are elastically held by the cylinder 45 can be detachably attached to the receptacles 40, respectively. To the corresponding wiring 37P in the cable 37 via the receptacle 40 and the connector 38 sequentially.
Can always be electrically connected.

The lower surface 39A of the receptacle holding plate 39
A positioning guide pin 52 having a tapered tip is formed so as to protrude downward in correspondence with a positioning hole 51 formed at a predetermined position on the pin base 28. When the press-type connecting portion 34 is moved downward in the direction opposite to the direction of the arrow a in response to the driving of the cylinder 33, the positioning guide pin 52 is fitted into the positioning hole 51 so that the receptacle holding plate 39 is moved to the pin base. 2
8 so as to be positionable.

More specifically, as shown in FIG.
Reference numeral 5 denotes a switch probe (not shown) provided at the end of the positioning guide pin 52 when the press-type connecting portion 34 moves downward, and the switch probe (not shown) is brought into contact with the bottom end (not shown) of the corresponding positioning hole 51. When the contact is made, the cylinder 33 is driven and controlled so that the press-type connecting portion 34 is moved down as it is, and when not, the cylinder 33 is driven and controlled so that the press-type connecting portion 34 is moved up. I do.

Further, when the press-type connecting portion 34 is moving downward, each probe pin 36 projecting from the lower end of the press-type connecting portion 34 has its rear end connected to the corresponding connector pin 29 while its front end abuts. Each receptacle 4
By pressing a coil spring (not shown) by a length corresponding to the amount of downward movement of the press-type connecting portion 34 while compressing it, each probe pin 36 is collectively connected to the corresponding connector pin 29. Can be done.

If the connector pin 29 does not exist at the corresponding position among the probe pins 36, the probe pin 36 will not move when the press-type connecting portion 34 moves down.
By inserting the probe pins 36 into holes (not shown) for mounting the probe pins 36, it is possible to prevent an obstacle when the probe pins 36 are brought into contact with the corresponding connector pins 29 at once. ing.

(2) Operation and Effect of the Present Embodiment In the above configuration, the circuit board inspection apparatus 20
When actually inspecting the circuit board 23 to be inspected, the circuit board 23 is first placed such that the tips of the probe pins 25 of the lower fixture 22A abut on the corresponding lands (not shown) of the circuit board 23. After the positioning and placement, the upper fixture 22B is moved downward in the direction opposite to the arrow a to move the circuit board 23 to the upper fixture 2.
2B and the lower fixture 22A.

Subsequently, in the connection measuring section 24, the arrangement pattern of the connector pins 29 on the pin base 28 is determined based on the respective probe pins 25 corresponding to the land pattern of the circuit board 23. By moving the press-type connecting portion 34 downward in the direction opposite to the direction of the arrow a, the probe pins 36 formed on the press-type connecting portion 34 can be electrically connected while making contact with the corresponding connector pins 29. it can.

As a result, even when dirt such as dust or dirt adheres to each of the probe pins 36 and the corresponding connector pins 29, the tip of each of the probe pins 36 is moved when the press-type connecting portion 34 is moved downward. By breaking through dirt such as dust and dirt, it is possible to always make contact between the respective probe pins 36 and the corresponding connector pins 29, thus causing poor contact between the respective probe pins 36 and the corresponding connector pins 29. Can be prevented.

At this time, each probe pin 36 is connected to the probe forming section 4 attached to the receptacle 40, respectively.
4, even if the projecting lengths are relatively different, the corresponding connector pins 29 are collectively provided within the range of the compression length of the coil spring 46 in each probe forming portion 44. Can be electrically connected.

Further, the probe forming portion 44 having the probe pins 36 held elastically can be detachably attached to the other end of each of the receptacles 40, one end of which is fixedly held by the receptacle holding plate 39. Of the probe pins 36, only the probe forming portion 44 holding the failed or deteriorated probe pin 36 can be easily replaced, and as a result, compared with the case where all the probe pins 36 must be replaced at a time. Work efficiency can be significantly improved.

According to the above configuration, in the circuit board inspection apparatus 20, the probe pins 25 corresponding to the lands of the circuit board 23 are connected to the fixtures 22 on which the probe pins 25 are formed, respectively. By providing a pin base 28 on which a plurality of connector pins 29 are formed, and by providing a press-type connecting portion 34 on which a probe pin 36 corresponding to each of the connector pins 29 is formed so as to be able to move up and down. When inspecting the connection state of the circuit board 23 positioned and held at the position 22, each probe pin 36 and the corresponding connector pin 29
Even when dirt such as dust or dirt is adhered to the probe pins 36, the probe pins 36 pierce the dirt such as dust or dirt and collectively contact the corresponding connector pins 29 in accordance with the downward movement of the press-type connecting portion 34. Thus, it is possible to realize the circuit board inspection apparatus 20 that can secure the reliability of the connection in a lump.

(3) Other Embodiments In the above-described embodiment, the circuit board inspection apparatus according to the present invention uses the circuit based on the electrical characteristics of the circuit board that is conducted through a plurality of probe pins. Substrate 23
Although the description has been given of the case where the circuit board inspection device 20 for inspecting whether or not the connection state is normal is applied, the present invention is not limited to this, and the number of meter readings (ie, the number of probe pins) is relatively large. It can be widely applied to various circuit board inspection devices.

Further, in the above-described embodiment, the connector according to the present invention is connected to each connector pin (first electrode) 29 formed on the pin base 28 and the press-type connecting portion 34.
Although the description has been made of the case where the connector is formed from the connector 38 and the probe forming portion 44 (probe pin 36, that is, the second electrode) attached to each receptacle 40 fixedly held by the receptacle holding plate 39, the present invention is not limited thereto. The present invention is not limited to this, and if a plurality of connector pins and probe pins (that is, the first and second electrodes) 29 and 36 can be electrically connected collectively by being pressed against each other, they can be widely applied to various other connectors. it can.

Further, in the above-described embodiment, a plurality of probe pins which come into contact collectively in the same positional relationship as each predetermined position (ie, inspection position) in the wiring pattern formed on one surface of the positioned circuit board 23 are used. A case has been described in which a plurality of probe pins 25 protrudingly formed on the lower fixture 22A of the fixture 22 are applied. However, the present invention is not limited to this, and can be widely applied to various other probe pins. it can.

Further, in the above-described embodiment, a plurality of connector pins 29 formed so as to be exposed on the upper surface of the pin base 28 are applied as the plurality of first electrodes electrically connected to the respective probe pins 25. However, the present invention is not limited to this, and various other first
Can be widely applied to the electrodes.

Further, in the above-described embodiment, a plurality of second electrodes provided corresponding to the respective connector pins (first electrodes) 29 are used as the press-type connecting portions 34.
Forming portions 44 detachably attached to a plurality of receptacles 40 fixedly held at the lower end of the probe.
(Including the probe pin 36 as a conductive pin) has been described, but the present invention is not limited to this.
The structure can be widely applied to various second electrodes as long as it is urged in the pressure contact direction when it comes into contact with the connector pin (first electrode) 29 to be contacted.

Further, in this case, the connector pins 29 made of the first electrode are provided with the structure having the conductive pins for urging in the pressing direction as described above, while the probe pins 36 made of the second electrode are fixed. You may make it hold | maintain.

Further, in the above-described embodiment, a case has been described in which the control section 35 in the connection measuring section 24 as the main body section inspects the electrical characteristics of the circuit board 23. The main point is that the circuit board 2
If it is possible to inspect whether or not the connection state of No. 3 is normal, that is, the conduction state between the wiring patterns and the electrical characteristics of various electronic components mounted on the circuit board 23, various other methods are used. May be.

Further, in the above-described embodiment, the case where the fixture 22 as the probe holding means is detachably attached to the connection measuring section 24 as the main body has been described. The present invention is not limited to this. If the plurality of first electrodes provided on the probe holding means and the plurality of second electrodes provided on the main body can be brought into contact collectively by pressing them together, Various other structures can be widely applied as a structure for detachably attaching the fixture.

Further, in the above-described embodiment, a positioning guide pin (projection for positioning) 52 provided integrally with each connector pin (first electrode) 29 and each connector pin (second electrode) are provided. ) 29 are provided with positioning holes (positioning holes) 51 corresponding to the positioning guide pins 52 provided integrally with each other. When the connector pins 29 and the probe pins 36 are pressed against each other, the positioning guide pins 52 are provided.
Although the description has been made of the case where the connector pins 29 and the probe pins 36 are positioned relative to each other in accordance with the fitting operation of the positioning holes 51, the present invention is not limited to this. (The second electrode) 36 may be provided integrally, and a positioning hole 51 corresponding to the positioning guide pin 52 may be provided integrally with each connector pin (first electrode) 29.

Further, in the above-described embodiment, the press-contact means for pressing the plurality of connector pins and the corresponding probe pins (that is, the first and second electrodes) 29 and 36 respectively is provided by the control unit 35 in the connection measuring unit 24. , The cylinder 33 and the press-type connecting portion 34 are described, but the present invention is not limited to this.
If a plurality of connector pins and corresponding probe pins (that is, first and second electrodes) 29 and 36 can be brought into collective contact by being brought into pressure contact with each other, it can be widely applied to various other pressure contact means. .

In this case, based on the fitting state of the positioning guide pins (projections) 52 and the positioning holes (holes) 51, the press-contact means includes the respective connector pins and probe pins (ie, the first and second electrodes) 29. , 36 are controlled, but the pressing means may be of a manual type so that the user is notified of the fitted state.

[0055]

As described above, according to the present invention, in this circuit board inspection apparatus, a plurality of first electrodes which are respectively electrically connected to each probe pin corresponding to the corresponding wiring pattern of the circuit board, and A plurality of second electrodes respectively corresponding to the one electrode are provided, and each first electrode and the corresponding second electrode are pressed against each other, so that the first and / or second electrodes are attached to dust or dirt. Even when dirt is adhered, the first or second pins made of conductive material
A circuit board inspection apparatus that can break through dirt such as dust and dirt, and collectively contact the corresponding second or first electrode, thus ensuring collective connection reliability. it can.

According to the present invention, in the connector,
A plurality of first electrodes electrically connected to the plurality of probe pins, and a plurality of second electrodes respectively corresponding to the first electrodes are provided, and one of the first and second electrodes is conductive. The first electrodes and the corresponding second electrodes are brought into contact collectively by press-contacting each of the first electrodes and the corresponding second electrodes. Even when dirt such as is adhered, each first or second electrode made of a pin made of a conductive material is pierced by dirt such as dust or dust and collectively with each corresponding second or first electrode. A connector that can be brought into contact with each other and thus can collectively ensure the reliability of connection can be realized.

[Brief description of the drawings]

FIG. 1 is a side view showing a configuration of a circuit board inspection device according to the present embodiment.

FIG. 2 is a schematic partial side view showing the configuration of the circuit board inspection device shown in FIG.

FIG. 3 is a sectional view showing a configuration of a receptacle and a probe forming unit shown in FIG. 2;

FIG. 4 is a schematic side view showing a configuration of a conventional circuit board inspection apparatus.

FIG. 5 is a schematic diagram for explaining a connection state between each cartridge board and a connector shown in FIG. 4;

[Explanation of symbols]

1, 20 ... circuit board inspection device, 2, 21 ... base,
4, 23 ... circuit board, 5, 22 ... fixture,
6, 35 control section, 7, 25, 36 probe pin, 9, 38 connector, 1, 37 cable, 2
4 Connection measuring section, 28 Pin base, 29 Connector pin, 33 Cylinder, 34 Press-type connecting section, 39 Receptacle holding plate, 40 Receptacle, 44 Probe forming section , 51 ... Positioning hole, 5
2. Positioning guide pins.

Claims (7)

[Claims] 1. A probe holding means for collectively fixing and holding a plurality of probe pins in the same positional relationship as a plurality of inspection positions on a circuit board, and said probe holding means being removably mounted to connect said circuit board. A circuit board inspection device comprising: a main body for inspecting whether or not the state is normal based on the electrical characteristics of the circuit board conducted through each of the probe pins; provided in the probe holding means; A plurality of first electrodes electrically connected to each of the probe pins; a plurality of second electrodes provided on the main body and provided in correspondence with the respective first electrodes; And a press-contact means for press-contacting the corresponding second electrode, and one of the first and second electrodes is a pin made of a conductive material. Circuit board inspection equipment. 2. When each of the first or second electrodes is pressed by a corresponding one of the second or first electrodes, the first or second electrode is urged in the pressed direction. The circuit board inspection device according to claim 1. 3. A positioning projection provided integrally with each of said first or second electrodes, and a positioning projection corresponding to said projection provided integrally with each of said second or first electrodes. When the first electrode and the corresponding second electrode are respectively pressed against each other, the first and second pressure-contacting means are attached to the first and second electrodes in accordance with the fitting operation of the projection and the hole. The circuit board inspection apparatus according to claim 1, wherein the electrodes are positioned relative to each other. 4. The pressure-contact means controls the pressure-contact operation of each of the first electrodes and the corresponding second electrode based on the fitting state of the projection and the hole. The circuit board inspection apparatus according to claim 1. 5. A semiconductor device comprising: a plurality of first electrodes electrically connected to a plurality of probe pins; and a plurality of second electrodes provided in correspondence with the first electrodes, respectively. Alternatively, one of the second electrodes is a pin made of a conductive material, and the first electrodes and the corresponding second electrodes are brought into contact at once by bringing them into pressure contact with each other. 6. When each said first or second electrode is pressed against a corresponding said second or first electrode by said pressing means, said first or second electrode is urged in the pressed direction. The connector according to claim 5, wherein 7. A positioning projection provided integrally with each of said first or second electrodes, and a positioning projection corresponding to said projection provided integrally with each of said second or first electrodes. When each of the first electrodes and the corresponding second electrodes are pressed into contact with each other, the first and second electrodes are positioned with each other with the fitting operation of the projections and the holes. The connector according to claim 6, wherein