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JP2001053404A - Circuit board - Google Patents

Circuit board

Info

Publication number
JP2001053404A
JP2001053404A JP22532199A JP22532199A JP2001053404A JP 2001053404 A JP2001053404 A JP 2001053404A JP 22532199 A JP22532199 A JP 22532199A JP 22532199 A JP22532199 A JP 22532199A JP 2001053404 A JP2001053404 A JP 2001053404A
Authority
JP
Japan
Prior art keywords
substrate
aluminum nitride
circuit board
metal
nitride substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP22532199A
Other languages
Japanese (ja)
Inventor
Yasuto Fushii
康人 伏井
Takeshi Goto
猛 後藤
Nobuyuki Yoshino
信行 吉野
Yoshihiko Tsujimura
好彦 辻村
Katsunori Terano
寺野克典
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Denka Co Ltd
Original Assignee
Denki Kagaku Kogyo KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Denki Kagaku Kogyo KK filed Critical Denki Kagaku Kogyo KK
Priority to JP22532199A priority Critical patent/JP2001053404A/en
Publication of JP2001053404A publication Critical patent/JP2001053404A/en
Pending legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To improve the reliability of a circuit board by using metallic plates respectively composed of plural layers including Al and Cu layers for metallic circuits and metallic heat sinks, and bonding the Al layer to an aluminum nitride substrate with an Al-Si-Mg or Al-Cu-Mg bonding material. SOLUTION: A circuit board is formed in such a way that metallic plates are laid on both the front and rear surfaces of an aluminum nitride substrate and bonded to the substrate, by evenly perpendicularly pressing the metallic plates against the substrate at a temperature of 550-635 deg.C in a vacuum atmosphere by using a jig which presses the metallic plates against the substrate by thrusting carbon plates into the substrate. Then an etching resist is screen- printed and etching is performed with an FeCl3 solution. In addition, the resist is removed and electroless Ni-P plating is performed to the thickness of 3 μm. The circuit board thus formed has metallic heat sinks using metallic plates each composed of two or more layers including Al and Cu layers. The Al layer is bonded to the aluminum nitride substrate by using an Al-Si-Mg bonding material, etc.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、パワーモジュール
等に使用される回路基板に関する。
The present invention relates to a circuit board used for a power module or the like.

【0002】[0002]

【従来の技術】従来、パワーモジュール等に利用される
半導体装置においては、アルミナ、ベリリア、窒化ケイ
素、窒化アルミニウム等のセラミックス基板の表裏面
に、Cu、Al、それらの金属を成分とする合金等の回
路と放熱板とがそれぞれ形成されてなる回路基板が用い
られている。このような回路基板は、樹脂基板と金属基
板との複合基板ないしは樹脂基板よりも、高絶縁性が安
定して得られることが特長である。
2. Description of the Related Art Conventionally, in a semiconductor device used for a power module or the like, Cu, Al, alloys containing these metals as components, etc. are formed on the front and back surfaces of a ceramic substrate such as alumina, beryllia, silicon nitride, and aluminum nitride. A circuit board on which the circuit and the heat sink are formed is used. Such a circuit board is characterized in that high insulation properties can be obtained more stably than a composite board of a resin board and a metal board or a resin board.

【0003】回路及び放熱板の材質が、Cu又はCu合
金では、セラミックス基板や半田との熱膨張差に起因す
る熱応力の発生が避けられないので、長期的な信頼性が
不十分であるのに対し、Al又はAl合金は、熱応力を
受けても容易に塑性変形するので、応力が緩和され、信
頼性が飛躍的に向上する。一方、Cu又はCu合金は、
熱伝導性や電気伝導性で勝るので、パワーモジュール用
基板に求められる本質的な特性では優位である。 両者
を組み合わせて熱的、電気的特性を損なうことなく長期
信頼性を確保する技術の提案もある(例えば、特開平9
−53076号公報等)。
When the material of the circuit and the heat radiating plate is Cu or Cu alloy, the generation of thermal stress due to the difference in thermal expansion between the ceramic substrate and the solder is inevitable, so that the long-term reliability is insufficient. On the other hand, since Al or an Al alloy is easily plastically deformed even when subjected to thermal stress, the stress is relieved, and the reliability is dramatically improved. On the other hand, Cu or Cu alloy is
Since it is superior in thermal conductivity and electrical conductivity, it is superior in essential characteristics required for a power module substrate. There is also a proposal of a technique for combining them to ensure long-term reliability without impairing thermal and electrical characteristics (for example, see Japanese Patent Application Laid-Open No.
No.-53076).

【0004】[0004]

【発明が解決しようとする課題】しかしながら、Al及
びAl合金(以下、両者をあわせて「Al等」とい
う。)とCu又はCu合金(以下、両者をあわせて「C
u等」という。)を組み合わせる方法においては、Al
とCuの反応によるAl−Cu系の脆い合金の生成を避
けるため、両者の間にバリア層が必要で、実際には3層
以上の積層となる。これらの層は各々の材料毎に接合温
度が異なるため、すべての層を完全に接合するのは難し
い。特に、Al等は低融点で、接合温度が低く、セラミ
ックスとの接合が困難な材料である。又、融点に近い温
度で接合すると金属板との接合は良好になるが、Al等
に部分的な溶融が生じ、「虫喰い」と呼ばれるボイドが
生じる。逆に、低融点のろう材を用いて低温で窒化アル
ミニウム基板と接合すると金属層との接合が不十分とな
る。即ち、両者の接合を同時に満足するのは二律背反に
なるという課題があった。
However, Al and an Al alloy (hereinafter, both are collectively referred to as "Al etc.") and Cu or a Cu alloy (hereinafter, both are referred to as "C
u etc. " ), The method of combining Al
In order to avoid the formation of an Al-Cu-based brittle alloy due to the reaction between Cu and Cu, a barrier layer is required between the two, and in practice, three or more layers are stacked. Since these layers have different bonding temperatures for each material, it is difficult to completely bond all the layers. In particular, Al and the like have a low melting point, a low bonding temperature, and are materials that are difficult to bond with ceramics. Further, when the bonding is performed at a temperature close to the melting point, the bonding with the metal plate is improved, but partial melting occurs in Al and the like, and voids called “insect biting” occur. Conversely, if a low melting point brazing material is used to join the aluminum nitride substrate at a low temperature, the joining with the metal layer becomes insufficient. That is, there is a problem that satisfying the joining of the two at the same time is a trade-off.

【0005】本発明は、上記に鑑みてなされたものであ
り、比較的低温で金属板とAl等との接合を支配してい
るのは、Al等表面の酸化層であることを掴み、この影
響を取り除くため、Al等と窒化アルミニウム基板の接
合材組成の検討を鋭意進めた結果、特定組成の接合材を
用いれば、Al等と金属板の接合も十分に行うことが出
来ることを見出し、これを徹底的に追求して、本発明を
完成させたものである。
The present invention has been made in view of the above, and has grasped that it is the oxide layer on the surface of Al or the like that controls the bonding between the metal plate and Al at a relatively low temperature. As a result of intensive studies on the composition of the bonding material between Al and the like and the aluminum nitride substrate in order to remove the influence, it was found that if a bonding material with a specific composition is used, the bonding of the metal plate with Al or the like can be sufficiently performed. This has been thoroughly pursued and the present invention has been completed.

【0006】本発明の目的は、Al等と窒化アルミニウ
ム基板、Al等と銅板の接合を同時に満足することによ
って、CuとAlを組み合わせた金属板の窒化アルミニ
ウム基板への適用を可能にし、もって両者の長所を取り
入れた回路基板を提供することである。
An object of the present invention is to simultaneously apply Al or the like to an aluminum nitride substrate, or to simultaneously bond an Al or the like to a copper plate, thereby enabling a metal plate combining Cu and Al to be applied to an aluminum nitride substrate. It is to provide a circuit board incorporating the advantages of the above.

【0007】[0007]

【課題を解決するための手段】すなわち、本発明は、窒
化アルミニウム基板の一方の面に金属回路、他方の面に
金属放熱板を持ち、金属回路及び金属放熱板がAlとC
uを含む2層以上の金属板からなり、且つAl層がAl
−Si−Mg系又はAl−Cu−Mg系接合材を用いて
窒化アルミニウム基板に接合されていることを特徴とす
る回路基板である。
That is, according to the present invention, an aluminum nitride substrate has a metal circuit on one surface and a metal radiator plate on the other surface, and the metal circuit and the metal radiator plate are made of Al and C.
u is made of two or more metal plates, and the Al layer is made of Al.
A circuit board, which is bonded to an aluminum nitride substrate using a Si-Mg-based or Al-Cu-Mg-based bonding material.

【0008】[0008]

【発明の実施の形態】以下、更に詳しく本発明について
説明する。
BEST MODE FOR CARRYING OUT THE INVENTION Hereinafter, the present invention will be described in more detail.

【0009】本発明の最大の特徴は、Al等と窒化アル
ミニウム基板との接合にAl−Si−Mg系又はAl−
Cu−Mg系の接合材を用いることである。これによっ
て、Al等に局部的な溶融が生じないような比較的低温
での接合を可能にし、同時にAl等と金属板との接合も
満足する。
The most important feature of the present invention is that Al-Si-Mg or Al-
That is, a Cu—Mg based bonding material is used. This enables joining at a relatively low temperature such that local melting does not occur in Al or the like, and also satisfies the joining between Al or the like and the metal plate.

【0010】元来、Alは殆どすべての金属材料に圧着
出来る材料であり、Al−Al合金やAl−Cuを始
め、各種のクラッド材が市販されている。一方、Alと
窒化アルミニウム基板の接合は、比較的困難で、融点が
高いAgろう等は使えず、Al系の低融点接合材が使用
される。Al−SiやAl−Zn等は代表的な組成であ
る。
Originally, Al is a material which can be pressed against almost all metal materials, and various clad materials including Al-Al alloys and Al-Cu are commercially available. On the other hand, it is relatively difficult to join Al and the aluminum nitride substrate. For example, an Ag brazing material having a high melting point cannot be used, and an Al-based low melting point joining material is used. Al-Si and Al-Zn are typical compositions.

【0011】Al等と金属との接合には、Al材表面の
酸化物の除去が重要であり、フッ素系の表面清浄化剤を
用いたノコロック法はよく知られている。但し、この方
法は接合後に残さを取り除く必要がありプロセス的には
煩雑になる。一方、金属とセラミックスの接合には、接
合材と窒化アルミニウム基板の濡れ性を確保するため、
しばしばTiやZr等の活性金属を含む活性金属法が用
いられる。活性金属は、水素化物を容易に生成し、水素
化物は比較的耐酸化性があるので、水素化物の形で添加
されることも多いが、分解して水素ガスを発生するこれ
らの添加物も清浄化作用を持つ。但し、この添加は、同
時に接合材の融点を押し上げるため、Al材中に局所的
な溶融が生じ易くなる等の問題もある。
It is important to remove the oxide on the surface of the Al material for the bonding between Al and the like and the metal, and the Nocolok method using a fluorine-based surface cleaning agent is well known. However, in this method, it is necessary to remove the residue after joining, and the process becomes complicated. On the other hand, when joining metals and ceramics, we ensure the wettability between the joining material and the aluminum nitride substrate.
An active metal method including an active metal such as Ti or Zr is often used. Active metals are often added in the form of hydrides because hydrides are easily formed and hydrides are relatively resistant to oxidation.However, these additives that decompose to generate hydrogen gas are also included. Has a cleansing action. However, since this addition simultaneously raises the melting point of the joining material, there is a problem that local melting is easily generated in the Al material.

【0012】本発明においては、これらの問題を一気に
解決するため、接合材にAl−Si−Mg又はAl−C
u−Mgを用いる。Mgの添加量は0.1〜6重量%が
適当である。6重量%を越えると、接合するAl材への
拡散部の硬化が著しくなって、熱応力緩衝効果が小さく
なり、0.1重量%未満では、窒化アルミニウムや金属
への接合性が劣る。好ましくは、0.2〜3重量%であ
る。Mgの添加効果についての詳細メカニズムは明らか
ではないが、窒化アルミニウムに対しては、準安定なM
23を生成して接合材との濡れ性を向上させ、金属に
対しては、MgOを形成してAl表面の酸化物を除去す
るためではないかと推察される。
In the present invention, in order to solve these problems at once, Al-Si-Mg or Al-C
u-Mg is used. An appropriate amount of Mg to be added is 0.1 to 6% by weight. If the amount exceeds 6% by weight, the diffusion portion hardens into the Al material to be joined, and the thermal stress buffering effect is reduced. If the amount is less than 0.1% by weight, the bondability to aluminum nitride or metal is inferior. Preferably, it is 0.2 to 3% by weight. Although the detailed mechanism of the effect of the addition of Mg is not clear, the metastable M
It is supposed that g 2 N 3 is generated to improve the wettability with the bonding material, and to form MgO on the metal to remove the oxide on the Al surface.

【0013】本発明においては、窒化アルミニウム基板
と接合されるAl層は50〜200μmである。50μ
m未満では、塑性変形による熱応力の緩衝効果が不足し
て信頼性に劣り、200μmを越えるとAl層に接合さ
れる金属との接合が不充分となる。特に好ましくは70
〜150μmである。Mgは一般的には蒸気として接合
に作用すると言われているが、上記の点から、Al等の
中を拡散して反対側の端面に至り、表面の酸化膜を除去
するのではないかと考えられる。事実、Al等の層中で
のMgの拡散はSi、Cu、Zn等の金属に比べて遙か
に速い。
In the present invention, the Al layer to be bonded to the aluminum nitride substrate has a thickness of 50 to 200 μm. 50μ
If it is less than m, the effect of buffering thermal stress due to plastic deformation is insufficient and reliability is inferior. If it exceeds 200 μm, joining with the metal joined to the Al layer becomes insufficient. Particularly preferably 70
150150 μm. Although it is generally said that Mg acts on the bonding as vapor, from the above point, it is thought that it diffuses in Al or the like to reach the opposite end face, and removes the oxide film on the surface. Can be In fact, the diffusion of Mg in a layer of Al or the like is much faster than that of a metal such as Si, Cu or Zn.

【0014】Al、Mg以外の接合材成分としては、S
iやCuが挙げられる。Siは、12重量%が最も低融
点となるが、添加量が多いと脆くなる点が問題で、3〜
10重量%が好適である。3重量%以下では、接合温度
がAl等の融点に近くなってAl等の欠陥生成の原因と
なる。Cuを用いる場合は、2〜6重量%が好適であ
る。尚、SiとCuを同時に用いる場合は、Si4〜9
重量%、Cu0.5〜3重量%が好ましい。
As a bonding material component other than Al and Mg, S
i and Cu. Si has the lowest melting point at 12% by weight, but has a problem in that the Si content becomes brittle when the amount of Si is large.
10% by weight is preferred. If it is 3% by weight or less, the bonding temperature approaches the melting point of Al or the like, which causes the formation of defects such as Al. When Cu is used, 2 to 6% by weight is suitable. When Si and Cu are used simultaneously, Si 4 to 9
% By weight, and 0.5 to 3% by weight of Cu.

【0015】本発明においては、Al、Si、Cu、M
g以外に第三金属の付加は許容できる。不可避的な不純
物は勿論、JIS合金に混入している微量成分は何ら支
障はない。また、融点降下作用を有するIn、Ge、Z
n等、密着性を向上させるためのBi、Ti等は、合計
5%以内の範囲で積極的に付加することができる。
In the present invention, Al, Si, Cu, M
Addition of a third metal other than g is acceptable. Not to mention inevitable impurities, trace components mixed into the JIS alloy do not cause any problem. Also, In, Ge, Z having a melting point lowering action
Bi, Ti, etc. for improving the adhesion, such as n, can be positively added within a total range of 5% or less.

【0016】本発明においては、Al等と接合される金
属は、Cuを含む層であるが、前述したように、Alと
Cuは脆い合金を形成するので、間に両者の反応を防ぐ
バリア層を置くことが好ましい。バリア層の材質は、箔
の形成が容易で、接合温度においてCu、Alとの反応
が遅いものが好適であり、具体的に例示すると、Ni、
Ti、Cr及びこれらを主成分とする合金等である。A
l等とバリア層、Cu等は別々に積層・接合しても良い
が、予めバリア層をCu等又はAl等の表面にメッキし
ておいたり、クラッド化しておいても差し支えない。三
層以上をクラッド化して用いることも出来る。更には、
接合・回路形成後に更にメッキ等により別の表面層を設
けることも出来る。
In the present invention, the metal bonded to Al or the like is a layer containing Cu. However, as described above, since Al and Cu form a brittle alloy, a barrier layer that prevents a reaction between them is used. Is preferably placed. The material of the barrier layer is preferably a material that facilitates the formation of a foil and that reacts slowly with Cu and Al at the bonding temperature.
Ti, Cr and alloys containing these as main components. A
Although l and the like and the barrier layer, Cu and the like may be separately laminated and bonded, the barrier layer may be plated in advance on the surface of Cu or the like or Al or formed into a clad. Three or more layers may be clad and used. Furthermore,
After joining and forming the circuit, another surface layer may be further provided by plating or the like.

【0017】Cu等については、通常のセラミックス回
路基板と同様で、材質等特に制限するものではないが、
厚さは、通常0.1〜0.5mmが用いられる。この層
を設けることで、Cu等を用いた回路基板と同じ電気伝
導度を確保出来、Al単独で使用した場合に比べて、複
合体基板としての放熱性も向上する。更に、一般的には
Al等への無電解メッキは、Cu等よりも難しいとされ
ているが、本発明においては、Al等の層は接合された
Cu等の層と同電位となるので、メッキも通常のCuへ
のメッキと同様に行うことが出来る。
As for Cu and the like, there are no particular restrictions on the material and the like as in the case of a normal ceramic circuit board.
The thickness is usually 0.1 to 0.5 mm. By providing this layer, the same electrical conductivity as that of a circuit board using Cu or the like can be ensured, and the heat dissipation of the composite board is improved as compared with the case where Al is used alone. Furthermore, although it is generally considered that electroless plating on Al or the like is more difficult than Cu or the like, in the present invention, since the layer of Al or the like has the same potential as the layer of Cu or the like joined, Plating can be performed in the same manner as plating on ordinary Cu.

【0018】本発明で使用される窒化アルミニウム基板
は、パワーモジュール用回路基板としての使用を考えれ
ば、熱伝導率130W/mK以上で絶縁性の良好な窒化
アルミニウム基板が選ばれる。
As for the aluminum nitride substrate used in the present invention, an aluminum nitride substrate having a thermal conductivity of 130 W / mK or more and good insulating properties is selected in consideration of use as a circuit board for a power module.

【0019】本発明の回路基板の製造方法について説明
すると、窒化アルミニウム基板に金属回路及び金属放熱
板を形成させるには、それらのパターンを接合するか、
金属板を接合してからエッチングするか、又はその両方
を併用する方法がある。接合材の厚みは、種類にもよる
が10〜50μmである。厚みが10μm未満では、接
合が困難となり、50μmをこえると、合金成分が拡散
して生じるAl中の硬化層が拡がるので、熱履歴を受け
た際に信頼性が低下する原因となる。好ましくは15〜
35μmである。接合材は、窒化アルミニウム基板側、
Al等側のどちらに配置しても良い。
The method of manufacturing a circuit board according to the present invention will be described. In order to form a metal circuit and a metal radiator plate on an aluminum nitride substrate, the patterns must be bonded or
There is a method in which a metal plate is bonded and then etched, or both are used in combination. The thickness of the joining material is 10 to 50 μm although it depends on the type. If the thickness is less than 10 μm, joining becomes difficult. If the thickness exceeds 50 μm, the hardened layer in Al formed by the diffusion of alloy components expands, which causes a decrease in reliability when subjected to thermal history. Preferably 15 to
35 μm. The bonding material is the aluminum nitride substrate side,
It may be arranged on either side of Al or the like.

【0020】接合材は、合金箔を用いる方法もあるが、
現在の主流であるCu等の回路等を形成させた回路基板
においては、金属粉末ペーストを用いて行われているこ
とが殆どであることからも解るように、ペースト法の方
が、プロセス的に有利である。例えば、パターン印刷が
できるので、合金箔のようにハンドリングの不自由さを
なくして、大きさ・形状が選べるうえ、非接合部(わざ
と接合しないで回路を浮かせた部分)を設けやすい利点
がある。
As a joining material, there is a method using an alloy foil.
In circuit boards on which circuits such as Cu, which are the current mainstream, are formed, the paste method is more process-intensive as can be understood from the fact that it is almost always performed using a metal powder paste. It is advantageous. For example, since pattern printing can be performed, there is an advantage that handling inconvenience unlike alloy foil can be eliminated, a size and a shape can be selected, and a non-joined portion (a portion where a circuit is floated without intentionally joining) is easily provided. .

【0021】ペースト法を用いる際には、接合材金属粉
末は有機バインダーや有機溶剤と混合して用いられる。
有機バインダーとしてはアクリル系のポリマー等、溶剤
としてはイソホロンやテレピネオール等が代表的な例で
ある。
When the paste method is used, the bonding material metal powder is used by being mixed with an organic binder or an organic solvent.
Typical examples of the organic binder include acrylic polymers, and examples of the solvent include isophorone and terpineol.

【0022】金属粉末の粒度は、44μm下、平均径が
数μm〜20μm程度であることが好ましい。また、金
属粉末の混入酸素量はできるだけ低いことが好ましく、
1%以下、好ましくは0.7%以下、特に好ましくは
0.5%以下である。
The particle size of the metal powder is preferably 44 μm, and the average diameter is preferably several μm to 20 μm. Further, it is preferable that the mixed oxygen amount of the metal powder is as low as possible,
It is at most 1%, preferably at most 0.7%, particularly preferably at most 0.5%.

【0023】金属粉末は、単身金属粉末の混合粉末であ
ってもよく、また合金粉末あってもよいが、Mg単身で
は、非常に酸化され易く取り扱いが難しいので、Al及
び/又はSiとの合金として用いることが好ましい。
The metal powder may be a mixed powder of a single metal powder or an alloy powder. However, Mg alone is very easily oxidized and difficult to handle, so that an alloy with Al and / or Si may be used. It is preferable to use them.

【0024】本発明において、窒化アルミニウム基板の
両面に上記接合材を介して各金属層の板、パターン又は
その両方を配置し、それを窒化アルミニウム基板と垂直
方向に15〜100kgf/cm2の圧力を負荷するこ
とが好ましい。加圧は、積層体に重しを載せる、治具等
を用いて機械的に挟み込む等によって行うことができ
る。
In the present invention, a plate, a pattern, or both of each metal layer is disposed on both sides of an aluminum nitride substrate via the above-mentioned bonding material, and is placed in a direction perpendicular to the aluminum nitride substrate at a pressure of 15 to 100 kgf / cm 2 . Is preferably applied. Pressing can be performed by placing a weight on the laminate, mechanically sandwiching it with a jig or the like, or the like.

【0025】従来、回路基板の製造においては、金属板
とセラミックス基板の接合時に重しを載せて加圧するこ
とが行われているが、その圧力は高くてもせいぜい0.
1kgf/cm2程度である。この程度の圧力では、セ
ラミックス基板の比較的緩やかな反りやうねりにしか金
属板は追随することができない。これに対し、15〜1
00kgf/cm2の高い圧力をかけると、十分な接合
を安定して得ることができ、しかもAl等の塑性変形が
比較的均一に生じるので、高信頼性回路基板を製造する
ことができる。好ましい加圧は、20〜80kgf/c
2である。
Conventionally, in the manufacture of a circuit board, when a metal plate and a ceramics substrate are joined together, a weight is placed on them and pressurized.
It is about 1 kgf / cm 2 . With such a pressure, the metal plate can follow only a relatively gentle warpage or undulation of the ceramic substrate. In contrast, 15-1
When a high pressure of 00 kgf / cm 2 is applied, sufficient bonding can be stably obtained, and plastic deformation of Al or the like occurs relatively uniformly, so that a highly reliable circuit board can be manufactured. Preferred pressure is 20 to 80 kgf / c.
m 2 .

【0026】次いで、接合体は必要に応じてエッチング
される。回路又は放熱板のパターンを接合したときに
は、エッチングは特に必要でない。エッチングは、通常
のレジスト、エッチング工程によって行うことができ
る。
Next, the joined body is etched as necessary. Etching is not particularly necessary when the circuit or heat sink pattern is joined. The etching can be performed by a usual resist and etching process.

【0027】[0027]

【実施例】以下、実施例と比較例をあげて更に具体的に
本発明を説明する。
The present invention will be described more specifically below with reference to examples and comparative examples.

【0028】実施例1〜4 比較例1〜3 用いた窒化アルミニウム基板は市販品で、いずれも厚さ
0.635mm、大きさ2インチ角で、レーザーフラッ
シュ法による熱伝導率が180W/mK、3点曲げ強度
が430MPaである。接合材は表1に示す。各金属板
は、回路面及び放熱面に対して表2に示す各種類及び厚
みの組み合わせを用いた。
Examples 1 to 4 Comparative Examples 1 to 3 The aluminum nitride substrates used were commercial products, each having a thickness of 0.635 mm, a size of 2 inches square, and a thermal conductivity of 180 W / mK by a laser flash method. The three-point bending strength is 430 MPa. Table 1 shows the bonding materials. For each metal plate, a combination of each type and thickness shown in Table 2 was used for the circuit surface and the heat radiation surface.

【0029】窒化アルミニウム基板の表裏面に、金属板
を重ね、カーボン板をねじ込んで基板に押しつける治具
を用いて窒化アルミニウム基板に対して垂直方向に均等
に加圧した。接合は、真空雰囲気下、温度550〜63
5゜Cで加圧をしながら行った。接合条件を表1に示
す。
A metal plate was placed on the front and back surfaces of the aluminum nitride substrate, and a carbon plate was screwed on and pressed uniformly against the aluminum nitride substrate using a jig pressed against the substrate. Bonding is performed in a vacuum atmosphere at a temperature of 550 to 63
The test was performed while applying pressure at 5 ° C. Table 1 shows the joining conditions.

【0030】接合後、エッチングレジストをスクリーン
印刷してFeCl3液でエッチングした。次いで、レジ
ストを剥離した後、無電解Ni−Pメッキを3μm施し
て回路基板とした。
After bonding, the etching resist was screen-printed and etched with a FeCl 3 solution. Next, after the resist was peeled off, electroless Ni-P plating was applied at 3 μm to obtain a circuit board.

【0031】得られた回路基板は、−40℃×30分→
室温×10分→125℃×30分→室温×10分を1サ
イクルとして3000サイクルのヒートサイクル試験を
実施した。ヒートサイクル試験後、パターンの剥離等の
基板への損傷の有無を外観チェックして、金属回路及び
金属放熱板を塩酸で溶解し、窒化アルミニウム基板のク
ラックの有無を観察した。それらの結果を表3に示す。
The obtained circuit board is -40 ° C. × 30 minutes →
A heat cycle test of 3000 cycles was performed with room temperature × 10 minutes → 125 ° C. × 30 minutes → room temperature × 10 minutes as one cycle. After the heat cycle test, the appearance of the substrate such as pattern peeling was checked for damage to the substrate. The metal circuit and the metal radiator plate were dissolved with hydrochloric acid, and the aluminum nitride substrate was observed for cracks. Table 3 shows the results.

【0032】[0032]

【表1】 [Table 1]

【0033】[0033]

【表2】 [Table 2]

【0034】[0034]

【表3】 [Table 3]

【0035】表1〜3に明らかなように、本発明の実施
例は、いずれもヒートサイクル試験3000サイクル後
においても基板へのクラック発生も著しく少なかった。
これに対して、比較例では接合材組成やAl等の厚さが
本発明の範囲外にあったので、ヒートサイクル後に窒化
アルミニウム基板にクラックが多発したり、パターンの
剥離が認められ、高信頼性回路基板としては、不十分な
ものであった。
As is clear from Tables 1 to 3, in each of the examples of the present invention, the occurrence of cracks on the substrate was significantly reduced even after 3000 cycles of the heat cycle test.
In contrast, in the comparative example, since the bonding material composition and the thickness of Al and the like were out of the range of the present invention, cracks frequently occurred on the aluminum nitride substrate after heat cycling, and pattern peeling was observed. However, it was insufficient for a flexible circuit board.

【0036】[0036]

【発明の効果】本発明によれば、Cu等とAl等を組み
合わせた高信頼性の回路基板を提供することができる。
According to the present invention, it is possible to provide a highly reliable circuit board combining Cu or the like and Al or the like.

───────────────────────────────────────────────────── フロントページの続き (72)発明者 辻村 好彦 福岡県大牟田市新開町1 電気化学工業株 式会社大牟田工場内 (72)発明者 寺野克典 福岡県大牟田市新開町1 電気化学工業株 式会社大牟田工場内 Fターム(参考) 4E351 AA09 BB01 BB33 BB35 BB38 BB50 CC18 CC21 DD04 DD10 GG03 GG04  ──────────────────────────────────────────────────続 き Continuing on the front page (72) Inventor Yoshihiko Tsujimura 1 Shinkaicho, Omuta-shi, Fukuoka Prefecture Inside the Omuta Plant, Inc. Omuta factory F-term (reference) 4E351 AA09 BB01 BB33 BB35 BB38 BB50 CC18 CC21 DD04 DD10 GG03 GG04

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 窒化アルミニウム基板の一方の面に金属
回路、他方の面に金属放熱板を持ち、金属回路及び金属
放熱板がAlとCuを含む2層以上の金属板からなり、
且つAl層は厚さ50〜200μmで、Al−Si−M
g系又はAl−Cu−Mg系の接合材を用いて窒化アル
ミニウム基板に接合されていることを特徴とする回路基
板。
1. An aluminum nitride substrate having a metal circuit on one surface and a metal radiator plate on the other surface, wherein the metal circuit and the metal radiator plate comprise two or more metal plates containing Al and Cu,
And the Al layer has a thickness of 50 to 200 μm and is made of Al-Si-M
A circuit board, which is bonded to an aluminum nitride substrate using a g-based or Al-Cu-Mg-based bonding material.
JP22532199A 1999-08-09 1999-08-09 Circuit board Pending JP2001053404A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22532199A JP2001053404A (en) 1999-08-09 1999-08-09 Circuit board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22532199A JP2001053404A (en) 1999-08-09 1999-08-09 Circuit board

Publications (1)

Publication Number Publication Date
JP2001053404A true JP2001053404A (en) 2001-02-23

Family

ID=16827533

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22532199A Pending JP2001053404A (en) 1999-08-09 1999-08-09 Circuit board

Country Status (1)

Country Link
JP (1) JP2001053404A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014072364A (en) * 2012-09-28 2014-04-21 Mitsubishi Materials Corp Power module substrate and manufacturing method thereof
US9721861B2 (en) 2014-09-26 2017-08-01 Mitsubishi Electric Corporation Semiconductor device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014072364A (en) * 2012-09-28 2014-04-21 Mitsubishi Materials Corp Power module substrate and manufacturing method thereof
US9721861B2 (en) 2014-09-26 2017-08-01 Mitsubishi Electric Corporation Semiconductor device

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