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JP1691006S - - Google Patents

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Publication number
JP1691006S
JP1691006S JPD2020-24629F JP2020024629F JP1691006S JP 1691006 S JP1691006 S JP 1691006S JP 2020024629 F JP2020024629 F JP 2020024629F JP 1691006 S JP1691006 S JP 1691006S
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JPD2020-24629F
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JPD2020-24629F priority Critical patent/JP1691006S/ja
Priority to US29/783,792 priority patent/USD984288S1/en
Application granted granted Critical
Publication of JP1691006S publication Critical patent/JP1691006S/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JPD2020-24629F 2020-11-16 2020-11-16 Active JP1691006S (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JPD2020-24629F JP1691006S (en) 2020-11-16 2020-11-16
US29/783,792 USD984288S1 (en) 2020-11-16 2021-05-14 Inspection gauge for coordinate measuring machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JPD2020-24629F JP1691006S (en) 2020-11-16 2020-11-16

Publications (1)

Publication Number Publication Date
JP1691006S true JP1691006S (en) 2021-07-26

Family

ID=76934499

Family Applications (1)

Application Number Title Priority Date Filing Date
JPD2020-24629F Active JP1691006S (en) 2020-11-16 2020-11-16

Country Status (2)

Country Link
US (1) USD984288S1 (en)
JP (1) JP1691006S (en)

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5667431B2 (en) * 2010-12-24 2015-02-12 地方独立行政法人東京都立産業技術研究センター 3D coordinate measuring machine simple inspection gauge
JP6360448B2 (en) 2015-02-18 2018-07-18 株式会社浅沼技研 Right angle step gauge
JP2019158534A (en) 2018-03-12 2019-09-19 株式会社ミツトヨ X-ray ct apparatus for measurement and method for generating fault image
CN108534676B (en) * 2018-04-20 2020-12-29 西京学院 A method for checking the spatial error in the measurement space of a coordinate measuring machine
US11293745B2 (en) 2018-06-28 2022-04-05 Asanuma Giken Co., Ltd. Inspection master
JP7201208B2 (en) 2018-08-17 2023-01-10 地方独立行政法人東京都立産業技術研究センター Calibration gauge and calibration method
JP6631984B1 (en) 2019-06-25 2020-01-15 株式会社浅沼技研 Inspection master

Also Published As

Publication number Publication date
USD984288S1 (en) 2023-04-25

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