JP1691006S - - Google Patents
Info
- Publication number
- JP1691006S JP1691006S JPD2020-24629F JP2020024629F JP1691006S JP 1691006 S JP1691006 S JP 1691006S JP 2020024629 F JP2020024629 F JP 2020024629F JP 1691006 S JP1691006 S JP 1691006S
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPD2020-24629F JP1691006S (en) | 2020-11-16 | 2020-11-16 | |
US29/783,792 USD984288S1 (en) | 2020-11-16 | 2021-05-14 | Inspection gauge for coordinate measuring machine |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPD2020-24629F JP1691006S (en) | 2020-11-16 | 2020-11-16 |
Publications (1)
Publication Number | Publication Date |
---|---|
JP1691006S true JP1691006S (en) | 2021-07-26 |
Family
ID=76934499
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JPD2020-24629F Active JP1691006S (en) | 2020-11-16 | 2020-11-16 |
Country Status (2)
Country | Link |
---|---|
US (1) | USD984288S1 (en) |
JP (1) | JP1691006S (en) |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5667431B2 (en) * | 2010-12-24 | 2015-02-12 | 地方独立行政法人東京都立産業技術研究センター | 3D coordinate measuring machine simple inspection gauge |
JP6360448B2 (en) | 2015-02-18 | 2018-07-18 | 株式会社浅沼技研 | Right angle step gauge |
JP2019158534A (en) | 2018-03-12 | 2019-09-19 | 株式会社ミツトヨ | X-ray ct apparatus for measurement and method for generating fault image |
CN108534676B (en) * | 2018-04-20 | 2020-12-29 | 西京学院 | A method for checking the spatial error in the measurement space of a coordinate measuring machine |
US11293745B2 (en) | 2018-06-28 | 2022-04-05 | Asanuma Giken Co., Ltd. | Inspection master |
JP7201208B2 (en) | 2018-08-17 | 2023-01-10 | 地方独立行政法人東京都立産業技術研究センター | Calibration gauge and calibration method |
JP6631984B1 (en) | 2019-06-25 | 2020-01-15 | 株式会社浅沼技研 | Inspection master |
-
2020
- 2020-11-16 JP JPD2020-24629F patent/JP1691006S/ja active Active
-
2021
- 2021-05-14 US US29/783,792 patent/USD984288S1/en active Active
Also Published As
Publication number | Publication date |
---|---|
USD984288S1 (en) | 2023-04-25 |