IT1405995B1 - Sistema e metodo per la ispezione a raggi x e la identificazione della composizione chimica dei materiali - Google Patents

Sistema e metodo per la ispezione a raggi x e la identificazione della composizione chimica dei materiali

Info

Publication number: IT1405995B1
Authority: IT; Italy
Prior art keywords: identification; materials; chemical composition; ray inspection; inspection
Prior art date: 2010-07-09

Application number

ITMI2010A001269A

Other languages

English (en)

Inventor

Nunzio Alberto Borghese

Pietro Pozzi

Giuseppe Rotondo

Original Assignee

Alta Lab S R L

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2010-07-09

Filing date

2010-07-09

Publication date

2014-02-06

2010-07-09 Application filed by Alta Lab S R L filed Critical Alta Lab S R L

2010-07-09 Priority to ITMI2010A001269A priority Critical patent/IT1405995B1/it

2011-07-08 Priority to DK11173192.3T priority patent/DK2405260T3/da

2011-07-08 Priority to PL11173192T priority patent/PL2405260T3/pl

2011-07-08 Priority to ES11173192.3T priority patent/ES2487940T3/es

2011-07-08 Priority to EP11173192.3A priority patent/EP2405260B1/en

2012-01-10 Publication of ITMI20101269A1 publication Critical patent/ITMI20101269A1/it

2014-02-06 Application granted granted Critical

2014-02-06 Publication of IT1405995B1 publication Critical patent/IT1405995B1/it

Classifications

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- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20181—Stacked detectors, e.g. for measuring energy and positional information
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
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- G06T7/136—Segmentation; Edge detection involving thresholding
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- G06T7/143—Segmentation; Edge detection involving probabilistic approaches, e.g. Markov random field [MRF] modelling
- G—PHYSICS
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- G06T7/00—Image analysis
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- G06T7/174—Segmentation; Edge detection involving the use of two or more images
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- G—PHYSICS
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- G01N2223/20—Sources of radiation
- G01N2223/206—Sources of radiation sources operating at different energy levels
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/306—Accessories, mechanical or electrical features computer control
- G—PHYSICS
- G01—MEASURING; TESTING
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- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
- G01N2223/3307—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts source and detector fixed; object moves
- G—PHYSICS
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- G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
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- G—PHYSICS
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- G—PHYSICS
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- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/50—Detectors
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- G01N2223/5015—Detectors array linear array
- G—PHYSICS
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- G01N2223/639—Specific applications or type of materials material in a container
- G—PHYSICS
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- G01N2223/00—Investigating materials by wave or particle radiation
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- G01N2223/643—Specific applications or type of materials object on conveyor
- G—PHYSICS
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- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/652—Specific applications or type of materials impurities, foreign matter, trace amounts
- G—PHYSICS
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- G06T2207/10072—Tomographic images
- G06T2207/10081—Computed x-ray tomography [CT]
- G—PHYSICS
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- G06T2207/10116—X-ray image
- G—PHYSICS
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- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20112—Image segmentation details
- G06T2207/20156—Automatic seed setting
- G—PHYSICS
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- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
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- G06T2207/30—Subject of image; Context of image processing
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- G—PHYSICS
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- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30112—Baggage; Luggage; Suitcase
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
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- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30128—Food products

Landscapes

Engineering & Computer Science (AREA)
Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Computer Vision & Pattern Recognition (AREA)
Theoretical Computer Science (AREA)
High Energy & Nuclear Physics (AREA)
Life Sciences & Earth Sciences (AREA)
Health & Medical Sciences (AREA)
Molecular Biology (AREA)
Spectroscopy & Molecular Physics (AREA)
Software Systems (AREA)
Probability & Statistics with Applications (AREA)
General Life Sciences & Earth Sciences (AREA)
Geophysics (AREA)
Analysing Materials By The Use Of Radiation (AREA)

ITMI2010A001269A 2010-07-09 2010-07-09 Sistema e metodo per la ispezione a raggi x e la identificazione della composizione chimica dei materiali IT1405995B1 (it)

Priority Applications (5)

Application Number	Priority Date	Filing Date	Title
ITMI2010A001269A IT1405995B1 (it)	2010-07-09	2010-07-09	Sistema e metodo per la ispezione a raggi x e la identificazione della composizione chimica dei materiali
DK11173192.3T DK2405260T3 (da)	2010-07-09	2011-07-08	Fremgangsmåde og indretning til at udføre ikke-invasive røntgenundersøgelser af genstande
PL11173192T PL2405260T3 (pl)	2010-07-09	2011-07-08	Sposób i urządzenie do przeprowadzania nieinwazyjnego badania przedmiotów promieniami rentgenowskimi
ES11173192.3T ES2487940T3 (es)	2010-07-09	2011-07-08	Procedimiento y aparato para llevar a cabo una inspección de objetos no invasiva con rayos x
EP11173192.3A EP2405260B1 (en)	2010-07-09	2011-07-08	Method and apparatus for performing non-invasive x-ray inspections of objects

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
ITMI2010A001269A IT1405995B1 (it)	2010-07-09	2010-07-09	Sistema e metodo per la ispezione a raggi x e la identificazione della composizione chimica dei materiali

Publications (2)

Publication Number	Publication Date
ITMI20101269A1 ITMI20101269A1 (it)	2012-01-10
IT1405995B1 true IT1405995B1 (it)	2014-02-06

Family

ID=43531024

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
ITMI2010A001269A IT1405995B1 (it)	2010-07-09	2010-07-09	Sistema e metodo per la ispezione a raggi x e la identificazione della composizione chimica dei materiali

Country Status (5)

Country	Link
EP (1)	EP2405260B1 (it)
DK (1)	DK2405260T3 (it)
ES (1)	ES2487940T3 (it)
IT (1)	IT1405995B1 (it)
PL (1)	PL2405260T3 (it)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
EP2739995B1 (en)	2011-08-01	2017-05-24	Kromek Limited	Detection and/or classification of materials
GB201113224D0 (en)	2011-08-01	2011-09-14	Kromek Ltd	Method for the radiological investigation of an object
WO2013017878A1 (en) *	2011-08-01	2013-02-07	Kromek Limited	Object monitoring using multi spectral radiation
ES2855183T3 (es) *	2013-07-11	2021-09-23	Foss Analytical As	Dispositivo de procesamiento de carne que incorpora un analizador de rayos X
CN104749199B (zh) *	2013-12-30	2019-02-19	同方威视技术股份有限公司	双能/双视角的高能x射线透视成像系统
US10269146B2 (en)	2015-01-20	2019-04-23	Koninklijke Philips N.V.	Image data segmentation and display
CN104828544A (zh) *	2015-04-19	2015-08-12	成都安思科技有限公司	一种带物品推出机构的安检机
BR112018074796B1 (pt) *	2016-05-30	2023-03-28	Southern Innovation International Pty Ltd	Sistema e método de caracterização de material
WO2018032095A1 (en) *	2016-08-18	2018-02-22	Hydro-Quebec	Apparatus and method for inspecting a power line
KR102234019B1 (ko)	2017-10-31	2021-03-30	주식회사 오리온이엔씨	이동식 식자재 방사능 전수검사 시스템 및 방법
CN109254328A (zh) *	2018-02-24	2019-01-22	北京首都机场航空安保有限公司	一种行李安检系统
SK8449Y1 (sk) *	2018-05-11	2019-05-06	Fulop Marko	Zariadenie na odhaľovanie nelegálnych úkrytov v náklade železnej rudy
DE102019111567A1 (de) *	2019-05-03	2020-11-05	Wipotec Gmbh	Verfahren und Vorrichtung zur Röntgeninspektion von Produkten, insbesondere von Lebensmitteln
DE102019123479B3 (de) *	2019-09-02	2020-11-26	LuxFlux GmbH	Analyse und Qualitätskontrolle von Lebensmitteln
CN111145173B (zh) *	2019-12-31	2024-04-26	上海联影医疗科技股份有限公司	一种冠脉造影图像的斑块识别方法、装置、设备及介质
EP3954985A1 (en)	2020-08-04	2022-02-16	Biometic S.r.l.	Industrial tomography apparatus and method for checking the composition of industrial products which comprise a plurality of primary parts
CN113781426B (zh) *	2021-09-07	2024-02-13	海深智能科技(上海)有限公司	一种识别液体成分的智能安检方法
CN114419773B (zh) *	2022-03-28	2022-06-07	成都古河云科技有限公司	自助式货车报备入场值守系统及货车自助入场方法
DE102022207748A1 (de) *	2022-07-28	2024-02-08	Smiths Detection Germany Gmbh	Segmentierungsverfahren für eine abgrenzung von objekten als segmente in einem gepäckstück bei einer röntgen-diffraktionsanalyse
JP2024134194A (ja) *	2023-03-20	2024-10-03	株式会社東芝	検査システム及び検査方法
CN116327232B (zh) *	2023-03-27	2023-09-22	北京朗视仪器股份有限公司	一种头颅摄影装置参数校准方法、装置及设备
CN116934837B (zh) *	2023-09-13	2023-11-24	上海超群检测科技股份有限公司	物体检测处理方法、装置、系统、电子设备及存储介质

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US5367552A (en)	1991-10-03	1994-11-22	In Vision Technologies, Inc.	Automatic concealed object detection system having a pre-scan stage
US6018562A (en) *	1995-11-13	2000-01-25	The United States Of America As Represented By The Secretary Of The Army	Apparatus and method for automatic recognition of concealed objects using multiple energy computed tomography
US5943388A (en)	1996-07-30	1999-08-24	Nova R & D, Inc.	Radiation detector and non-destructive inspection
US6052936A (en)	1996-10-18	2000-04-25	Garcia; Juan Pablo	Line retaining device for the recovering of line in fly casting
US6118850A (en)	1997-02-28	2000-09-12	Rutgers, The State University	Analysis methods for energy dispersive X-ray diffraction patterns
US6069936A (en)	1997-08-18	2000-05-30	Eg&G Astrophysics	Material discrimination using single-energy x-ray imaging system
US6236709B1 (en)	1998-05-04	2001-05-22	Ensco, Inc.	Continuous high speed tomographic imaging system and method
DE10044357A1 (de)	2000-09-07	2002-03-21	Heimann Systems Gmbh & Co	Detektoranordnung zur Detektion von Röntgenstrahlen
WO2002082125A1 (en)	2001-04-03	2002-10-17	L-3 Communications Security & Detection Systems	X-ray inspection system
US7092485B2 (en) *	2003-05-27	2006-08-15	Control Screening, Llc	X-ray inspection system for detecting explosives and other contraband
US7002681B1 (en)	2003-06-25	2006-02-21	The United States Of America As Represented By The Secretary Of The Navy	Spectroscopy system for the detection of chemicals
US7634061B1 (en) *	2004-03-26	2009-12-15	Nova R & D, Inc.	High resolution imaging system
EP1877759A2 (en) *	2005-04-29	2008-01-16	Philips Intellectual Property & Standards GmbH	Energy-resolved photon counting for ct
US7778383B2 (en) *	2006-03-29	2010-08-17	Koninklijke Philips Electronics N.V.	Effective dual-energy x-ray attenuation measurement

2010
- 2010-07-09 IT ITMI2010A001269A patent/IT1405995B1/it active
2011
- 2011-07-08 EP EP11173192.3A patent/EP2405260B1/en active Active
- 2011-07-08 DK DK11173192.3T patent/DK2405260T3/da active
- 2011-07-08 PL PL11173192T patent/PL2405260T3/pl unknown
- 2011-07-08 ES ES11173192.3T patent/ES2487940T3/es active Active

Also Published As

Publication number	Publication date
ES2487940T3 (es)	2014-08-25
EP2405260B1 (en)	2014-05-07
PL2405260T3 (pl)	2014-10-31
ITMI20101269A1 (it)	2012-01-10
DK2405260T3 (da)	2014-08-11
EP2405260A1 (en)	2012-01-11

Publication	Publication Date	Title
IT1405995B1 (it)	2014-02-06	Sistema e metodo per la ispezione a raggi x e la identificazione della composizione chimica dei materiali
GB201007055D0 (en)	2010-06-09	Method and apparatus for the imaging of a labelled sample
BR112013008075A2 (pt)	2016-06-14	sistema automatizado de inspeção visual
DE102009020218B8 (de)	2011-05-12	Detektor und Verfahren zum Detektieren elektromagnetischer Strahlung und Computerprogramm zur Durchführung des Verfahrens
EP2613138A4 (en)	2016-03-30	PROCESS FOR DETECTION OF BIOLOGICAL SUBSTANCES
BR112013013920A2 (pt)	2016-09-13	sistema e método para medição de parâmetros ambientais distribuídos
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BR112013002894A2 (pt)	2016-05-31	''sistema apropiado para monitorar o uso de uma escova de dente e método para monitorar o uso de uma escova de dente''
BRPI1008091A2 (pt)	2016-03-15	métodos para medir a fluorescencia de um composto marcador fluorescente, e para identificar um material a granel, e, aparelho
BRPI1009432A2 (pt)	2016-09-27	aparelho e método para testar materiais de formaa ultrassôniica
HK1138379A1 (en)	2010-08-20	Equipment and method for detecting and identifying radioactive substance
FI20105645A0 (fi)	2010-06-07	Laite ja menetelmä biologisen materiaalin havaitsemiseksi
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EP2406613A4 (en)	2013-03-13	METHOD AND SYSTEM FOR MEASURING / DETECTING CHEMICAL LEAVES
EE201000095A (et)	2012-08-15	Meetod ja seade desinfektsioonivahendi saamiseks
EP2796898A4 (en)	2015-09-02	METHOD AND DEVICE FOR INSPECTION AND POSITIONING OF RADIOACTIVE SUBSTANCES
BR112013011709A2 (pt)	2017-07-25	sistema e método para sensor remoto
EE201000060A (et)	2012-02-15	Meetod ja seade sageduskarakteristiku m tmiseks
BRPI0914530A2 (pt)	2015-12-15	método de fazer a medição de um indivíduo e sistema para fazer a medição de um indivíduo
DK2619552T3 (da)	2019-10-21	Anordning og fremgangsmåde til at inspicere stof.
DE112011103236T8 (de)	2013-10-17	Fluoreszierende Substanz und Verfahren zum Bereitstellen derselben