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GB8523685D0 - Probe - Google Patents

Probe

Info

Publication number
GB8523685D0
GB8523685D0 GB858523685A GB8523685A GB8523685D0 GB 8523685 D0 GB8523685 D0 GB 8523685D0 GB 858523685 A GB858523685 A GB 858523685A GB 8523685 A GB8523685 A GB 8523685A GB 8523685 D0 GB8523685 D0 GB 8523685D0
Authority
GB
United Kingdom
Prior art keywords
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB858523685A
Other versions
GB2166913A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Publication of GB8523685D0 publication Critical patent/GB8523685D0/en
Publication of GB2166913A publication Critical patent/GB2166913A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06772—High frequency probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
    • H01R11/11—End pieces or tapping pieces for wires, supported by the wire and for facilitating electrical connection to some other wire, terminal or conductive member
    • H01R11/18—End pieces terminating in a probe
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G01R1/06738—Geometry aspects related to tip portion
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R9/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, e.g. terminal strips or terminal blocks; Terminals or binding posts mounted upon a base or in a case; Bases therefor
    • H01R9/03—Connectors arranged to contact a plurality of the conductors of a multiconductor cable, e.g. tapping connections
    • H01R9/05—Connectors arranged to contact a plurality of the conductors of a multiconductor cable, e.g. tapping connections for coaxial cables

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
GB08523685A 1984-11-13 1985-09-25 Impedance matched test probe Withdrawn GB2166913A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US67009084A 1984-11-13 1984-11-13

Publications (2)

Publication Number Publication Date
GB8523685D0 true GB8523685D0 (en) 1985-10-30
GB2166913A GB2166913A (en) 1986-05-14

Family

ID=24688947

Family Applications (1)

Application Number Title Priority Date Filing Date
GB08523685A Withdrawn GB2166913A (en) 1984-11-13 1985-09-25 Impedance matched test probe

Country Status (3)

Country Link
JP (1) JPS61120062A (en)
DE (1) DE3535926A1 (en)
GB (1) GB2166913A (en)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3801222C2 (en) * 1988-01-18 1996-11-14 Siemens Ag Contacting device for testing purposes, in particular for testing semiconductor components
DE3925552A1 (en) * 1989-08-02 1991-02-14 Licentia Gmbh Scanning head generating and picking up short electrical signals - is activated by opto-electronic switch and can contact selected points of integrated circuit paths
US5174763A (en) * 1990-06-11 1992-12-29 Itt Corporation Contact assembly
EP0462706A1 (en) * 1990-06-11 1991-12-27 ITT INDUSTRIES, INC. (a Delaware corporation) Contact assembly
US5308250A (en) * 1992-10-30 1994-05-03 Hewlett-Packard Company Pressure contact for connecting a coaxial shield to a microstrip ground plane
DE19945176B4 (en) * 1999-09-21 2005-07-28 Rosenberger Hochfrequenztechnik Gmbh & Co. Arrangement of spring contacts in a predetermined grid
US7108440B1 (en) 1999-10-08 2006-09-19 The Procter & Gamble Company Applicator for distributing a substance onto a target surface
AU8006200A (en) 1999-10-08 2001-04-23 Procter & Gamble Company, The Applicator having a temperature changing element for distributing a product ontoa target surface
US7021848B1 (en) 1999-10-08 2006-04-04 The Procter & Gamble Company Semi-enclosed applicator having a temperature changing element
GB2356983A (en) * 1999-12-03 2001-06-06 Probe Instrumentation Ltd Probe assembly for measuring surface resistance
DE20021685U1 (en) 2000-12-21 2001-03-15 Rosenberger Hochfrequenztechnik GmbH & Co, 83413 Fridolfing High frequency probe tip
US6447328B1 (en) * 2001-03-13 2002-09-10 3M Innovative Properties Company Method and apparatus for retaining a spring probe
FR2842030B1 (en) * 2002-07-02 2008-04-18 Marechal Sepm ELECTRIC CONTACT CONNECTOR FOR HIGH INTENSITY CURRENTS
DE202022101235U1 (en) 2022-03-07 2023-06-19 PTR HARTMANN GmbH spring contact pin

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2700231C3 (en) * 1977-01-05 1981-11-12 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt Adjustable coaxial microstrip transition
CA1162243A (en) * 1979-12-26 1984-02-14 Jonathon H. Katz Test pin
US4469391A (en) * 1981-10-13 1984-09-04 Thomas & Betts Corporation Coaxial cable connector
CH645730A5 (en) * 1982-01-08 1984-10-15 Technobal Sa TEST CONTACT FOR TESTING PRINTED CIRCUITS, AND REMOVABLE CONTACT HEAD FOR SUCH A TEST CONTACT.
DE3315845A1 (en) * 1983-03-05 1984-09-06 ANT Nachrichtentechnik GmbH, 7150 Backnang Test adapter for microwave circuits
US4588241A (en) * 1983-09-23 1986-05-13 Probe-Rite, Inc. Surface mating coaxial connector

Also Published As

Publication number Publication date
DE3535926A1 (en) 1986-05-22
JPS61120062A (en) 1986-06-07
GB2166913A (en) 1986-05-14

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)