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GB8315751D0 - Data processing system - Google Patents

Data processing system

Info

Publication number
GB8315751D0
GB8315751D0 GB838315751A GB8315751A GB8315751D0 GB 8315751 D0 GB8315751 D0 GB 8315751D0 GB 838315751 A GB838315751 A GB 838315751A GB 8315751 A GB8315751 A GB 8315751A GB 8315751 D0 GB8315751 D0 GB 8315751D0
Authority
GB
United Kingdom
Prior art keywords
data processing
processing system
data
processing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB838315751A
Other versions
GB2121997B (en
GB2121997A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Services Ltd
Original Assignee
Fujitsu Services Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Services Ltd filed Critical Fujitsu Services Ltd
Priority to GB08315751A priority Critical patent/GB2121997B/en
Publication of GB8315751D0 publication Critical patent/GB8315751D0/en
Publication of GB2121997A publication Critical patent/GB2121997A/en
Application granted granted Critical
Publication of GB2121997B publication Critical patent/GB2121997B/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318505—Test of Modular systems, e.g. Wafers, MCM's
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2294—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing by remote test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
GB08315751A 1982-06-11 1983-06-08 Testing modular data processing systems Expired GB2121997B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB08315751A GB2121997B (en) 1982-06-11 1983-06-08 Testing modular data processing systems

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB8217006 1982-06-11
GB08315751A GB2121997B (en) 1982-06-11 1983-06-08 Testing modular data processing systems

Publications (3)

Publication Number Publication Date
GB8315751D0 true GB8315751D0 (en) 1983-07-13
GB2121997A GB2121997A (en) 1984-01-04
GB2121997B GB2121997B (en) 1985-10-09

Family

ID=26283081

Family Applications (1)

Application Number Title Priority Date Filing Date
GB08315751A Expired GB2121997B (en) 1982-06-11 1983-06-08 Testing modular data processing systems

Country Status (1)

Country Link
GB (1) GB2121997B (en)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8432533D0 (en) * 1984-12-21 1985-02-06 Plessey Co Plc Integrated circuits
GB8518860D0 (en) * 1985-07-25 1985-08-29 Int Computers Ltd Digital integrated circuits
GB8518859D0 (en) * 1985-07-25 1985-08-29 Int Computers Ltd Digital integrated circuits
GB8626517D0 (en) * 1986-11-06 1986-12-10 Int Computers Ltd Testing programmable logic arrays
GB8626516D0 (en) * 1986-11-06 1986-12-10 Int Computers Ltd Testing programmable logic arrays
US4947395A (en) * 1989-02-10 1990-08-07 Ncr Corporation Bus executed scan testing method and apparatus
DE4124708A1 (en) * 1991-07-25 1993-01-28 Siemens Ag DEVICE FOR TESTING ELECTRONIC COMPONENTS OF A ASSEMBLY CONNECTED TO THE APPLICATION CASE
WO1993006657A1 (en) * 1991-09-23 1993-04-01 Digital Equipment Corporation Update synchronizer
US7249298B2 (en) * 2002-04-30 2007-07-24 Samsung Electronics Co., Ltd. Multiple scan chains with pin sharing
GB2399890B (en) * 2002-04-30 2005-06-15 Samsung Electronics Co Ltd Multiple scan chains with pin sharing
DE10241385A1 (en) 2002-09-06 2004-03-25 Infineon Technologies Ag Integrated circuit for mobile radio equipment having function blocks with individual control systems

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1536147A (en) * 1975-07-02 1978-12-20 Int Computers Ltd Data processing systems
JPS54146549A (en) * 1978-05-09 1979-11-15 Hitachi Ltd Information processor

Also Published As

Publication number Publication date
GB2121997B (en) 1985-10-09
GB2121997A (en) 1984-01-04

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Legal Events

Date Code Title Description
PE20 Patent expired after termination of 20 years