GB2440253B - Equivalent time sampling system - Google Patents
Equivalent time sampling systemInfo
- Publication number
- GB2440253B GB2440253B GB0713720A GB0713720A GB2440253B GB 2440253 B GB2440253 B GB 2440253B GB 0713720 A GB0713720 A GB 0713720A GB 0713720 A GB0713720 A GB 0713720A GB 2440253 B GB2440253 B GB 2440253B
- Authority
- GB
- United Kingdom
- Prior art keywords
- sampling system
- time sampling
- equivalent time
- equivalent
- time
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
- G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
- G01M11/3109—Reflectometers detecting the back-scattered light in the time-domain, e.g. OTDR
- G01M11/3145—Details of the optoelectronics or data analysis
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optical Communication System (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US80749806P | 2006-07-16 | 2006-07-16 | |
US46278306A | 2006-08-07 | 2006-08-07 | |
US11/462,996 US7403274B2 (en) | 2006-07-16 | 2006-08-07 | Equivalent time sampling system |
Publications (3)
Publication Number | Publication Date |
---|---|
GB0713720D0 GB0713720D0 (en) | 2007-08-22 |
GB2440253A GB2440253A (en) | 2008-01-23 |
GB2440253B true GB2440253B (en) | 2011-07-13 |
Family
ID=38461602
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GBGB0713585.8A Ceased GB0713585D0 (en) | 2006-07-16 | 2007-07-12 | Equivalent |
GB0713720A Active GB2440253B (en) | 2006-07-16 | 2007-07-16 | Equivalent time sampling system |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GBGB0713585.8A Ceased GB0713585D0 (en) | 2006-07-16 | 2007-07-12 | Equivalent |
Country Status (2)
Country | Link |
---|---|
DE (1) | DE102007032791B4 (en) |
GB (2) | GB0713585D0 (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2219018B1 (en) * | 2009-02-17 | 2016-02-17 | Alcatel Lucent | Method for monitoring an optical data line, and optical transmission module therefor |
CN103454903B (en) * | 2013-09-23 | 2016-05-04 | 哈尔滨工程大学 | A kind of time interval measurement calibrating installation and calibration steps thereof based on optics times journey |
JP7257105B2 (en) * | 2018-03-02 | 2023-04-13 | 株式会社東京精密 | Absolute distance measuring device and method |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2163315A (en) * | 1984-08-18 | 1986-02-19 | Iwatsu Electric Co Ltd | Time domain reflectometer |
JP2000221248A (en) * | 1998-11-24 | 2000-08-11 | Advantest Corp | Semiconductor testing device |
US20030120443A1 (en) * | 2001-12-21 | 2003-06-26 | Yokogawa Electric Corporation | Waveform measuring instrument using equivalent time sampling |
US6594004B1 (en) * | 1999-09-10 | 2003-07-15 | Anritsu Corporation | Compact optical time domain reflectometer having enhanced accuracy |
US7173443B1 (en) * | 1998-11-24 | 2007-02-06 | Advantest Corp. | Semiconductor test system |
US20070066265A1 (en) * | 2005-09-22 | 2007-03-22 | May Michael R | Method to adjustably convert a first data signal having a first time domain to a second data signal having a second time domain |
-
2007
- 2007-07-12 GB GBGB0713585.8A patent/GB0713585D0/en not_active Ceased
- 2007-07-13 DE DE102007032791.0A patent/DE102007032791B4/en active Active
- 2007-07-16 GB GB0713720A patent/GB2440253B/en active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2163315A (en) * | 1984-08-18 | 1986-02-19 | Iwatsu Electric Co Ltd | Time domain reflectometer |
JP2000221248A (en) * | 1998-11-24 | 2000-08-11 | Advantest Corp | Semiconductor testing device |
US7173443B1 (en) * | 1998-11-24 | 2007-02-06 | Advantest Corp. | Semiconductor test system |
US6594004B1 (en) * | 1999-09-10 | 2003-07-15 | Anritsu Corporation | Compact optical time domain reflectometer having enhanced accuracy |
US20030120443A1 (en) * | 2001-12-21 | 2003-06-26 | Yokogawa Electric Corporation | Waveform measuring instrument using equivalent time sampling |
US20070066265A1 (en) * | 2005-09-22 | 2007-03-22 | May Michael R | Method to adjustably convert a first data signal having a first time domain to a second data signal having a second time domain |
Also Published As
Publication number | Publication date |
---|---|
GB2440253A (en) | 2008-01-23 |
GB0713585D0 (en) | 2007-08-22 |
DE102007032791A1 (en) | 2008-04-24 |
GB0713720D0 (en) | 2007-08-22 |
DE102007032791B4 (en) | 2020-10-01 |
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