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GB2359236A - Examining the orientation of the lattice of a crystal - Google Patents

Examining the orientation of the lattice of a crystal

Info

Publication number
GB2359236A
GB2359236A GB0102117A GB0102117A GB2359236A GB 2359236 A GB2359236 A GB 2359236A GB 0102117 A GB0102117 A GB 0102117A GB 0102117 A GB0102117 A GB 0102117A GB 2359236 A GB2359236 A GB 2359236A
Authority
GB
United Kingdom
Prior art keywords
diamond
orientation
lattice
axis
diffracted rays
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB0102117A
Other versions
GB0102117D0 (en
Inventor
Michael Peter Gaukroger
Andrew David Garry Steward
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Gersan Ets
Original Assignee
Gersan Ets
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gersan Ets filed Critical Gersan Ets
Publication of GB0102117D0 publication Critical patent/GB0102117D0/en
Publication of GB2359236A publication Critical patent/GB2359236A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

To examine a diamond (3), the diamond (3) is irradiated with a broad, substantially monochromatic, slightly non-parallel X-ray beam (2), the diamond (3) is rotated on a spindle about an axis normal to the axis of the irradiating beam (2), and an annular detector (7) coaxial with the irradiating beam (2) is used to detect the number and/or spindle angular position of diffracted rays (9) emanating from the diamond (3) around a 180{ are coaxial with the irradiating beam (2). From the number of diffracted rays (9), one detects whether there is lattice misorientation and/or from the positions of the diffracted rays (9), one determines the orientation of the crystal lattice relative to the axis of rotation.
GB0102117A 1998-07-30 1999-07-30 Examining the orientation of the lattice of a crystal Withdrawn GB2359236A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB9816687.9A GB9816687D0 (en) 1998-07-30 1998-07-30 Examining the orientation of the lattice of a crystal
PCT/GB1999/002525 WO2000006999A1 (en) 1998-07-30 1999-07-30 Examining the orientation of the lattice of a crystal

Publications (2)

Publication Number Publication Date
GB0102117D0 GB0102117D0 (en) 2001-03-14
GB2359236A true GB2359236A (en) 2001-08-15

Family

ID=10836486

Family Applications (2)

Application Number Title Priority Date Filing Date
GBGB9816687.9A Ceased GB9816687D0 (en) 1998-07-30 1998-07-30 Examining the orientation of the lattice of a crystal
GB0102117A Withdrawn GB2359236A (en) 1998-07-30 1999-07-30 Examining the orientation of the lattice of a crystal

Family Applications Before (1)

Application Number Title Priority Date Filing Date
GBGB9816687.9A Ceased GB9816687D0 (en) 1998-07-30 1998-07-30 Examining the orientation of the lattice of a crystal

Country Status (7)

Country Link
AU (1) AU5181899A (en)
BE (1) BE1012511A3 (en)
CA (1) CA2339109A1 (en)
GB (2) GB9816687D0 (en)
IL (1) IL141138A0 (en)
WO (1) WO2000006999A1 (en)
ZA (1) ZA200100811B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7285168B2 (en) 2004-08-10 2007-10-23 Efg Elektrotechnische Fabrikations-Und Grosshandelsgesellschaft Mnb Method and apparatus for the measurement, orientation and fixation of at least one single crystal
CN111855585B (en) * 2020-07-07 2023-08-15 上海交通大学 A Method for Determining Spatial Distribution of Crystal Domains and Lattice Orientation of Noncentrosymmetric Crystals

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2903145A (en) * 1957-04-04 1959-09-08 Sherman Products Inc Valve control
DE1963137A1 (en) * 1969-05-05 1970-11-19 Molex Products Co Electrical plug connection
DE2539646A1 (en) * 1975-09-05 1977-03-17 Shimura Hikaru X:ray diffractometer detector mounted on frame - displaceable along centre line of ring gap in first screening plate
DE3712928A1 (en) * 1987-04-16 1988-11-03 Philips Patentverwaltung X-ray unit for determining the local variation of scattering characteristics in a layer of an area under examination
US5768335A (en) * 1997-02-10 1998-06-16 Lucent Technologies Inc. Apparatus and method for measuring the orientation of a single crystal surface

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2312507A1 (en) * 1973-03-13 1974-09-26 Max Planck Gesellschaft DEVICE FOR X-RAY DIFFICULTY MEASUREMENTS USING WHITE X-RAYS
DE19631367C1 (en) * 1996-08-02 1997-11-13 Roland Dr Diehl X-ray identification method for cut diamonds

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2903145A (en) * 1957-04-04 1959-09-08 Sherman Products Inc Valve control
DE1963137A1 (en) * 1969-05-05 1970-11-19 Molex Products Co Electrical plug connection
DE2539646A1 (en) * 1975-09-05 1977-03-17 Shimura Hikaru X:ray diffractometer detector mounted on frame - displaceable along centre line of ring gap in first screening plate
DE3712928A1 (en) * 1987-04-16 1988-11-03 Philips Patentverwaltung X-ray unit for determining the local variation of scattering characteristics in a layer of an area under examination
US5768335A (en) * 1997-02-10 1998-06-16 Lucent Technologies Inc. Apparatus and method for measuring the orientation of a single crystal surface

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
CHIKAURA Y ET AL:JOURNAL OF CRYSTAL GROWTH, vol. 103, no. 1 / 04, page 344-349. *

Also Published As

Publication number Publication date
WO2000006999A1 (en) 2000-02-10
IL141138A0 (en) 2002-02-10
BE1012511A3 (en) 2000-11-07
WO2000006999A8 (en) 2004-04-15
ZA200100811B (en) 2004-06-08
CA2339109A1 (en) 2000-02-10
AU5181899A (en) 2000-02-21
GB0102117D0 (en) 2001-03-14
GB9816687D0 (en) 1998-09-30

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)