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GB1301008A - Improvements in or relating to specimen stages for electron microscopes - Google Patents

Improvements in or relating to specimen stages for electron microscopes

Info

Publication number
GB1301008A
GB1301008A GB37641/70A GB3764170A GB1301008A GB 1301008 A GB1301008 A GB 1301008A GB 37641/70 A GB37641/70 A GB 37641/70A GB 3764170 A GB3764170 A GB 3764170A GB 1301008 A GB1301008 A GB 1301008A
Authority
GB
United Kingdom
Prior art keywords
gimbal
specimen
movement
cartridge
rod
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB37641/70A
Inventor
Jeffrey Harvey Lucas
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Associated Electrical Industries Ltd
Original Assignee
Associated Electrical Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Associated Electrical Industries Ltd filed Critical Associated Electrical Industries Ltd
Priority to GB37641/70A priority Critical patent/GB1301008A/en
Priority to FR7128480A priority patent/FR2103927A5/fr
Priority to US168615A priority patent/US3702399A/en
Priority to DE19712139104 priority patent/DE2139104A1/en
Publication of GB1301008A publication Critical patent/GB1301008A/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/20Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Sampling And Sample Adjustment (AREA)

Abstract

1301008 Electron Microscopes ASSOCIATED ELECTRICAL INDUSTRIES Ltd 4 Aug 1971 [4 Aug 1970] 37641/70 Heading H1D A specimen stage for an electron microscope scanned or non-scanned, comprises first and second gimbals 54, 56, a specimen mounting 64 carried by the second gimbal so as to be tiltable about two mutually inclined intersecting axes with respect to a support, a mechanism for translating the second gimbal relative to the first in a first direction without shifting the gimbal axes relative to the support, and a mechanism for translating the specimen mounting relative to the second gimbal in a direction inclined to the first direction. The construction enables the specimen to be translationally moved without affecting the alignment with the optical axis. The gimbals are not necessarily ring shaped, e.g. the first gimbal may be tubular and the support is preferably movable in a plane transverse to the optical axis, such as in Fig. 2 (not shown) wherein blocks (38), (40) on plane surface (42) may be moved in orthogonal directions by screws (46), (49) in co-operation with return springs (not indicated). Block (40) has raised portion (50) receiving the tubular specimen cartridge (54) inserted via an airlock in housing (10), (Fig. 1, not shown). The cartridge may be rotated about its axis (Y-tilt) by gears meshing with a ring gear on portion (55), (not indicated). Within the cartridge, annular member 56 pivoted by journals 58, 60 supported in recesses (62), (Fig. 3, not shown), to be X-tilt rotatable by rack 72 on operating rod 70 engaging pushrod (73), (Fig. 3) with enlarged portion 77. Journals 58, 60, can slide axially in their bearings to allow translational movement of member 56 (X<SP>1</SP> movement), imparted by bellcrank lever 76 activated by rod 82 connected to sliding ring 83 (Fig. 3). Mounting 64 Y<SP>1</SP> movement is imparted by bellcrank lever 84, push rod 86, and bell crank lever 88, rod 106 being connected to sliding ring 107 both sliding rings being moved by fork levers to external controls. Ball 102 slides within slot 104 to accommodate X<SP>1</SP> movement.
GB37641/70A 1970-08-04 1970-08-04 Improvements in or relating to specimen stages for electron microscopes Expired GB1301008A (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
GB37641/70A GB1301008A (en) 1970-08-04 1970-08-04 Improvements in or relating to specimen stages for electron microscopes
FR7128480A FR2103927A5 (en) 1970-08-04 1971-08-03
US168615A US3702399A (en) 1970-08-04 1971-08-03 Specimen stage for an electron microscope
DE19712139104 DE2139104A1 (en) 1970-08-04 1971-08-04 Sample carrier arrangement for an electron microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB37641/70A GB1301008A (en) 1970-08-04 1970-08-04 Improvements in or relating to specimen stages for electron microscopes

Publications (1)

Publication Number Publication Date
GB1301008A true GB1301008A (en) 1972-12-29

Family

ID=10397923

Family Applications (1)

Application Number Title Priority Date Filing Date
GB37641/70A Expired GB1301008A (en) 1970-08-04 1970-08-04 Improvements in or relating to specimen stages for electron microscopes

Country Status (4)

Country Link
US (1) US3702399A (en)
DE (1) DE2139104A1 (en)
FR (1) FR2103927A5 (en)
GB (1) GB1301008A (en)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3778621A (en) * 1972-06-13 1973-12-11 Jeol Ltd Specimen tilting device for an electron optical device
US3790155A (en) * 1972-07-17 1974-02-05 Radiant Energy Systems X-y table for vacuum systems
US4488043A (en) * 1982-08-24 1984-12-11 The United States Of America As Represented By The Secretary Of The Army Tomographic marking device
DE68911330T2 (en) * 1988-02-08 1994-05-26 Toshiba Kawasaki Kk Device with an alignment frame.
NL8803153A (en) * 1988-12-23 1990-07-16 Philips Nv ELECTRON BUNDLE DEVICE WITH DYNAMIC FOCUSING.
FR2644290A1 (en) * 1989-03-10 1990-09-14 Labo Electronique Physique MICROMANIPULATOR
NL8902568A (en) * 1989-10-17 1991-05-16 Philips Nv VACUUM SYSTEM EQUIPPED WITH AN EVACUABLE HOUSING, AN OBJECT HOLDER AND A REMOVABLE OBJECT CARRIER.
US7070600B2 (en) * 2003-07-16 2006-07-04 Silverman Barry J Device for treatment of orthopedic fractures
EP2257963A2 (en) * 2008-03-15 2010-12-08 The University Of Sheffield Specimen holder assembly
DE102009026889B4 (en) * 2008-11-18 2012-03-29 Bst-Bio Sensor Technology Gmbh Analyzer, sample holder and analyzer for analysis of samples

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1539063C3 (en) * 1965-03-06 1974-07-04 Ugo Prof. Bologna Valdre (Italien) Preparation cartridge for electron microscopes with slide carrier that can be tilted in all directions

Also Published As

Publication number Publication date
US3702399A (en) 1972-11-07
FR2103927A5 (en) 1972-04-14
DE2139104A1 (en) 1972-02-10

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PCNP Patent ceased through non-payment of renewal fee