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FR3018603B1 - Dispositif d'analyse et d'imagerie d'une surface par deflectometrie et procede correspondant - Google Patents

Dispositif d'analyse et d'imagerie d'une surface par deflectometrie et procede correspondant Download PDF

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Publication number
FR3018603B1
FR3018603B1 FR1452076A FR1452076A FR3018603B1 FR 3018603 B1 FR3018603 B1 FR 3018603B1 FR 1452076 A FR1452076 A FR 1452076A FR 1452076 A FR1452076 A FR 1452076A FR 3018603 B1 FR3018603 B1 FR 3018603B1
Authority
FR
France
Prior art keywords
deflectometry
analyzing
imaging
corresponding method
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR1452076A
Other languages
English (en)
Other versions
FR3018603A1 (fr
Inventor
Jean-Pierre Chambard
Pierre Danieau
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Holo3 Association Pour Le Dev Des Methodes Et Techniques Holographiques Optiques Et Connexes
Original Assignee
Holo3 Association Pour Le Dev Des Methodes Et Techniques Holographiques Optiques Et Connexes
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Holo3 Association Pour Le Dev Des Methodes Et Techniques Holographiques Optiques Et Connexes filed Critical Holo3 Association Pour Le Dev Des Methodes Et Techniques Holographiques Optiques Et Connexes
Priority to FR1452076A priority Critical patent/FR3018603B1/fr
Publication of FR3018603A1 publication Critical patent/FR3018603A1/fr
Application granted granted Critical
Publication of FR3018603B1 publication Critical patent/FR3018603B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8829—Shadow projection or structured background, e.g. for deflectometry

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
FR1452076A 2014-03-13 2014-03-13 Dispositif d'analyse et d'imagerie d'une surface par deflectometrie et procede correspondant Active FR3018603B1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR1452076A FR3018603B1 (fr) 2014-03-13 2014-03-13 Dispositif d'analyse et d'imagerie d'une surface par deflectometrie et procede correspondant

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1452076 2014-03-13
FR1452076A FR3018603B1 (fr) 2014-03-13 2014-03-13 Dispositif d'analyse et d'imagerie d'une surface par deflectometrie et procede correspondant

Publications (2)

Publication Number Publication Date
FR3018603A1 FR3018603A1 (fr) 2015-09-18
FR3018603B1 true FR3018603B1 (fr) 2018-03-09

Family

ID=50976851

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1452076A Active FR3018603B1 (fr) 2014-03-13 2014-03-13 Dispositif d'analyse et d'imagerie d'une surface par deflectometrie et procede correspondant

Country Status (1)

Country Link
FR (1) FR3018603B1 (fr)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102019208474A1 (de) * 2019-06-11 2020-12-17 Micro-Epsilon Messtechnik Gmbh & Co. Kg Verfahren und System zum optischen Vermessen eines Objekts mit spiegelnder und/oder teilspiegelnder Oberfläche sowie entsprechende Messanordnung
FR3138691B1 (fr) * 2022-08-04 2024-11-01 Centre National De La Recherche Scient Procédé de déflectométrie amélioré et système associé
CN115371585A (zh) * 2022-08-11 2022-11-22 中国科学院上海光学精密机械研究所 用于偏折测量的超景深镜头及其偏折测量系统与测量方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19714221A1 (de) * 1997-04-07 1998-10-08 Zeiss Carl Fa Konfokales Mikroskop mit einem motorischen Scanningtisch
US5878152A (en) * 1997-05-21 1999-03-02 Cognex Corporation Depth from focal gradient analysis using object texture removal by albedo normalization
JP3731073B2 (ja) * 2002-09-17 2006-01-05 独立行政法人理化学研究所 顕微鏡装置

Also Published As

Publication number Publication date
FR3018603A1 (fr) 2015-09-18

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