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EP2718666A1 - Coupled multi-wavelength confocal systems for distance measurements - Google Patents

Coupled multi-wavelength confocal systems for distance measurements

Info

Publication number
EP2718666A1
EP2718666A1 EP12731211.4A EP12731211A EP2718666A1 EP 2718666 A1 EP2718666 A1 EP 2718666A1 EP 12731211 A EP12731211 A EP 12731211A EP 2718666 A1 EP2718666 A1 EP 2718666A1
Authority
EP
European Patent Office
Prior art keywords
substrate
light source
response function
light
wavelength
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP12731211.4A
Other languages
German (de)
French (fr)
Inventor
Ophir Eyal
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Eastman Kodak Co
Original Assignee
Eastman Kodak Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US13/156,574 external-priority patent/US20120314200A1/en
Priority claimed from US13/156,572 external-priority patent/US20120316830A1/en
Application filed by Eastman Kodak Co filed Critical Eastman Kodak Co
Publication of EP2718666A1 publication Critical patent/EP2718666A1/en
Withdrawn legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/14Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052Optical details of the image generation
    • G02B21/0064Optical details of the image generation multi-spectral or wavelength-selective arrangements, e.g. wavelength fan-out, chromatic profiling
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2210/00Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
    • G01B2210/50Using chromatic effects to achieve wavelength-dependent depth resolution

Definitions

  • the present invention relates to an apparatus for measuring distance between media and an imaging head for a computer-to-plate (CTP) imaging device.
  • CTP computer-to-plate
  • the confocal signal obtained in the referenced prior art is dependent on the reflectivity of the sample. Furthermore the confocal signal is also dependent on the optical transmittance of the medium in front of the sample. There is, therefore, a need for a confocal signal that will be immune or at least less dependent on the reflectivity and optical transmittance of the medium.
  • a system for measuring a distance to a substrate includes a first light source, emitting a first wavelength on a region of the substrate though a lens.
  • a second light source emits a second wavelength region of the substrate through the lens.
  • a first and second detector are configured to detect the first and second wavelength light reflected from the substrate.
  • a processor is configured to compute a first response function wherein the first response function represents reflected light intensity emitted from the first light source as a function of the distance between the imaging device and substrate.
  • a second response function represents reflected light intensity emitted from the second light source as a function of the distance between the imaging device and substrate.
  • a ratio response function represents the ratio of the first and second response function as a function of distance between the imaging device and substrate.
  • the present invention suggests a confocal system in which the sample is illuminated simultaneously by two different wavelengths.
  • the ratio of the back reflected signals from the sample is immune or less sensitive to parameters such as the reflectivity and the optical transmittance of the medium in front of the sample.
  • FIG. 1 a prior art illustration of confocal sensor used to measure the reflection from an imaged substrate
  • FIG. 2 a prior art schematic showing a response function of reflected light intensity from an imaged substrate - maximal value represents focus
  • FIG. 3 an illustration of a confocal system using two light sources with different wavelength each
  • FIG. 4A illustrates the shift between two response functions
  • FIG. 4B illustrates the ratio of two response functions.
  • FIG. 1 illustrates a common and well known structure of fiber optic confocal sensor 100.
  • the confocal sensor 100 is comprised of a light source 104 coupled to optical fiber 124 and to fiber optic coupler 116. Rays 136 emitted from optical fiber 128 via imaging lens 144 are imaged on the surface of substrate 148.
  • the back reflected light 140 is coupled to the emitting optical fiber 128 and reaches light detector 112 via coupler 116 and optical fiber 132.
  • the intensity measured by light detector 112 is a function of the distance, z, 160 to substrate 148.
  • Vd The signal measured by the detector, Vd, is proportional and is a function of few parameters:
  • Vd ,z) a Io x G ,z) x ⁇ ( ⁇ ) x ⁇ ( ⁇ , ⁇ ).
  • a represents a proportional sign.
  • Io is the intensity of the light that impinges on the sample.
  • ⁇ ( ⁇ ) is the reflectivity of the sample.
  • ⁇ ( ⁇ , ⁇ ) is the optical transmittance of the medium between the sample and the imaging lens.
  • Z is the distance to the sample.
  • G(X,z) is a function describing the overall optical response of the confocal system. It is a function of the distance, z, and of the wavelength ⁇ , and defined also by optical parameters of the confocal system such as the numerical aperture of the lens and of the diameter of the fiber's core.
  • FIG. 2 is graph describing typical and well known confocal signal where a symmetrical curve describes Vd( ,z) as a function of the distance Z.
  • Such a curve is measured by simultaneously reading ⁇ ( ⁇ , ⁇ ) and while scanning with the confocal system along the z axis and at known positions.
  • the best focus is defined at the maximum 204 of the symmetrical function.
  • the graph describes the ambiguity of a typical confocal system.
  • a single value of Vd ⁇ ,z) corresponds to two different values of the position z.
  • the scan along the z axis can be done in several techniques, for example by using an autofocus system embedded within a compound lens 336, constructed from several optical elements, where some of them can be moved and controlled in order to change and adjust the lens focal distance.
  • Vd(z) is dependent also on the reflectivity, ⁇ ( ⁇ ), of the sample and the optical transmittance, ⁇ ( ⁇ , ⁇ ), of the medium. This means that at best focus, different intensities will be measured for samples having different reflectivity.
  • the intensity measured by the detector will change if the sample reflectivity or the optical transmittance of the medium change during the measurement procedure. In such cases, therefore, one has to repeatedly scan the peak in order verify the position of the best focus.
  • FIG. 3 describes the basic principle of the present invention using a fiber optic confocal system where at least two coupled light source and detector units 344 and 348 are used.
  • Light sources 304 from unit 344) and 308 (from unit 348) each emitting different wavelengths.
  • Light source 304 is coupled via fiber optic coupler 320 to detector 312.
  • First detector 312 is constructed to be sensitive just to wavelength ⁇ , emitted by first light source 304.
  • Second light source 308 is coupled via fiber optic coupler 324 to second detector 316.
  • Second detector 316 is constructed to be sensitive just to wavelength ⁇ 2, emitted by second light source 308.
  • Units 344 and 348 are further coupled by fiber optic coupler 328 to emit combined light via a single output port 332.
  • Output optical port 332 is imaged via a dispersive optical element 336 on substrate 148. Due to the dispersion of 336 the wavelengths are focused on two different planes, shifted relative to each other by ⁇ .
  • Processor 340 forms a response function ⁇ ( ⁇ , ⁇ ), which is a function of the applied wavelength ⁇ and the distance z between the lens 336 and substrate 148.
  • processor 340 forms a response function Vd( 2,z), using a different wavelength ⁇ 2.
  • Processor 340 computes along a defined range, a ratio response function which is a division of function Yd k 1 ,z) and function Vd( 2,z). The computed ratio response function is an absolute and monotonic function of the distance z. Hence the ambiguity (related to common confocal systems) of the function Vd( ⁇ , z) where one value fits two different z positions is omitted.
  • G( ,z) describing the optical response of the confocal system is a function of optical parameters such as the numerical aperture of the lens and of the diameter of the fiber's core. By adjusting these optical parameters, the ratio Vd( l,z)/ Vd( 2,z) may be controlled, achieving for example the right dynamic range and accuracy.
  • FIG. 4A describes a lateral shift along the z axis between normalized function ⁇ ( ⁇ , ⁇ ) and normalized function G(3 ⁇ 42,z). This lateral shift is due to the dispersion of the imaging lens.
  • FIG. 4B describes the ratio between G ⁇ l,z) and G( 2,z).
  • optical detectors such as 312 and 316 can be made to be sensitive just to a single wavelength by using different types of detectors.
  • Different bandpass filters can be used, for example, filters based on thin film technology or filters made from fiber Bragg gratings.
  • Different optical fibers and fiber optic couplers can be used in order to implement the invention.
  • multi and single mode optical fibers and couplers, wavelength and polarization dependent fiber optic couplers and fiber optic elements can be used.
  • Measurement can be done simultaneously by activating the light sources and measuring detected signals at the same time. Measurements can also be done by sequentially activating the different light sources and performing measurement with their related detectors. When operating in simultaneously sequential mode, there is no need to spectrally isolate the light detectors, since measurements are done at different times.
  • the output port 332 maybe for example a pin hole aperture.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)

Abstract

A system for measuring a distance to a substrate includes a first light source, emitting a first wavelength on a region of the substrate though a lens. A second light source emits a second wavelength region of the substrate through the lens. A first and second detector are configured to detect the first and second wavelength light reflected from the substrate. A processor is configured to compute a first response function wherein the first response function represents reflected light intensity emitted from the first light source as a function of the distance between the imaging device and substrate. A second response function represents reflected light intensity emitted from the second light source as a function of the distance between the imaging device and substrate. A ratio response function represents the ratio of the first and second response function as a function of distance between the imaging device and substrate.

Description

COUPLED MULTI-WAVELENGTH CONFOCAL SYSTEMS FOR DISTANCE MEASUREMENTS FIELD OF THE INVENTION
The present invention relates to an apparatus for measuring distance between media and an imaging head for a computer-to-plate (CTP) imaging device.
BACKGROUND OF THE INVENTION
The basic confocal technique was invented by Marvin Minsky and is since well known in the literature in different forms. The fundamental principles and advantages of confocal microscopy are described in U.S. Patent No. 3,013,467 (Minsky et al.).
Shafir et al. in the article, " Expanding the realm of fiber optic confocal sensing for probing position, displacement, and velocity," Applied Optics Vol. 45, No. 30, 20 October 2006, uses different wavelengths and adjusts the fiber tips at different focal planes of the imaging lens. Shafir et al., however, does not use the ratio of signal for distance measurements.
U.S. Patent No. 6,353,216 (Oren et al.) also uses a confocal system and different wavelengths. The different signals in this patent are used in order to determine the direction of the movement. The idea of using the ratio of two signals for distance measurements is not mentioned.
The confocal signal obtained in the referenced prior art is dependent on the reflectivity of the sample. Furthermore the confocal signal is also dependent on the optical transmittance of the medium in front of the sample. There is, therefore, a need for a confocal signal that will be immune or at least less dependent on the reflectivity and optical transmittance of the medium.
SUMMARY OF THE INVENTION
Briefly, according to one aspect of the present invention a system for measuring a distance to a substrate includes a first light source, emitting a first wavelength on a region of the substrate though a lens. A second light source emits a second wavelength region of the substrate through the lens. A first and second detector are configured to detect the first and second wavelength light reflected from the substrate. A processor is configured to compute a first response function wherein the first response function represents reflected light intensity emitted from the first light source as a function of the distance between the imaging device and substrate. A second response function represents reflected light intensity emitted from the second light source as a function of the distance between the imaging device and substrate. A ratio response function represents the ratio of the first and second response function as a function of distance between the imaging device and substrate.
The present invention suggests a confocal system in which the sample is illuminated simultaneously by two different wavelengths. The ratio of the back reflected signals from the sample is immune or less sensitive to parameters such as the reflectivity and the optical transmittance of the medium in front of the sample.
These and other objects, features, and advantages of the present invention will become apparent to those skilled in the art upon a reading of the following detailed description when taken in conjunction with the drawings wherein there is shown and described an illustrative embodiment of the invention.
BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 a prior art illustration of confocal sensor used to measure the reflection from an imaged substrate;
FIG. 2 a prior art schematic showing a response function of reflected light intensity from an imaged substrate - maximal value represents focus;
FIG. 3 an illustration of a confocal system using two light sources with different wavelength each;
FIG. 4A illustrates the shift between two response functions; and
FIG. 4B illustrates the ratio of two response functions.
DETAILED DESCRIPTION OF THE INVENTION
In the following detailed description, numerous specific details are set forth in order to provide a thorough understanding of the disclosure. However, it will be understood by those skilled in the art that the teachings of the present disclosure may be practiced without these specific details. In other instances, well-known methods, procedures, components and circuits have not been described in detail so as not to obscure the teachings of the present disclosure.
While the present invention is described in connection with one of the embodiments, it will be understood that it is not intended to limit the invention to this embodiment. On the contrary, it is intended to cover alternatives, modifications, and equivalents as covered by the appended claims.
FIG. 1 illustrates a common and well known structure of fiber optic confocal sensor 100. The confocal sensor 100 is comprised of a light source 104 coupled to optical fiber 124 and to fiber optic coupler 116. Rays 136 emitted from optical fiber 128 via imaging lens 144 are imaged on the surface of substrate 148. The back reflected light 140 is coupled to the emitting optical fiber 128 and reaches light detector 112 via coupler 116 and optical fiber 132. The intensity measured by light detector 112 is a function of the distance, z, 160 to substrate 148.
The principle of this disclosure is described herein. The signal measured by the detector, Vd, is proportional and is a function of few parameters:
Vd ,z) a Io x G ,z) x ρ(λ) x Τ(λ,ζ). Where, a represents a proportional sign.
Io is the intensity of the light that impinges on the sample. ρ(λ) is the reflectivity of the sample.
Τ(λ,ζ) is the optical transmittance of the medium between the sample and the imaging lens.
Z is the distance to the sample.
G(X,z) is a function describing the overall optical response of the confocal system. It is a function of the distance, z, and of the wavelength λ, and defined also by optical parameters of the confocal system such as the numerical aperture of the lens and of the diameter of the fiber's core.
FIG. 2 is graph describing typical and well known confocal signal where a symmetrical curve describes Vd( ,z) as a function of the distance Z.
Such a curve is measured by simultaneously reading Υά(λ,ζ) and while scanning with the confocal system along the z axis and at known positions. The best focus is defined at the maximum 204 of the symmetrical function. The graph describes the ambiguity of a typical confocal system. A single value of Vd^,z) corresponds to two different values of the position z.
The scan along the z axis can be done in several techniques, for example by using an autofocus system embedded within a compound lens 336, constructed from several optical elements, where some of them can be moved and controlled in order to change and adjust the lens focal distance.
The signal, Vd(z), as can be seen from the equation, is dependent also on the reflectivity, ρ(λ), of the sample and the optical transmittance, Τ(λ,ζ), of the medium. This means that at best focus, different intensities will be measured for samples having different reflectivity.
Furthermore, for a specific sample and although positioned at best focus, the intensity measured by the detector, will change if the sample reflectivity or the optical transmittance of the medium change during the measurement procedure. In such cases, therefore, one has to repeatedly scan the peak in order verify the position of the best focus.
FIG. 3 describes the basic principle of the present invention using a fiber optic confocal system where at least two coupled light source and detector units 344 and 348 are used. Light sources 304 (from unit 344) and 308 (from unit 348) each emitting different wavelengths. Light source 304 is coupled via fiber optic coupler 320 to detector 312. First detector 312 is constructed to be sensitive just to wavelength λΐ, emitted by first light source 304. Second light source 308 is coupled via fiber optic coupler 324 to second detector 316. Second detector 316 is constructed to be sensitive just to wavelength λ2, emitted by second light source 308. Units 344 and 348 are further coupled by fiber optic coupler 328 to emit combined light via a single output port 332. Output optical port 332 is imaged via a dispersive optical element 336 on substrate 148. Due to the dispersion of 336 the wavelengths are focused on two different planes, shifted relative to each other by Δζ. Processor 340 forms a response function νά( ΐ,ζ), which is a function of the applied wavelength λΐ and the distance z between the lens 336 and substrate 148. Similarly, processor 340 forms a response function Vd( 2,z), using a different wavelength λ2. Processor 340 computes along a defined range, a ratio response function which is a division of function Yd k 1 ,z) and function Vd( 2,z). The computed ratio response function is an absolute and monotonic function of the distance z. Hence the ambiguity (related to common confocal systems) of the function Vd(^, z) where one value fits two different z positions is omitted.
Furthermore, consider the case where the reflectivity; ρλΐ ρλ2, and the and optical transmittance; Τ(λ 1 ,ζ) Τ(λ,ζ), are identical or change in the same way. In such a case the ratio signal, Vd( l,z)/ Vd( 2,z), will be
independent or less sensitive to the reflectivity, p, and to the transmittance T. G( ,z), describing the optical response of the confocal system is a function of optical parameters such as the numerical aperture of the lens and of the diameter of the fiber's core. By adjusting these optical parameters, the ratio Vd( l,z)/ Vd( 2,z) may be controlled, achieving for example the right dynamic range and accuracy.
Assuming for simplicity the case where the optical response of the confocal system is the same, both for λΐ and 2, and described by a Gussian function Θ(λ,ζ). FIG, 4A describes a lateral shift along the z axis between normalized function Ο(λΐ,ζ) and normalized function G(¾2,z). This lateral shift is due to the dispersion of the imaging lens. FIG. 4B describes the ratio between G^l,z) and G( 2,z).
Practically, optical detectors such as 312 and 316 can be made to be sensitive just to a single wavelength by using different types of detectors. One can also use identical detectors where adequate band pass filters are inserted in front of the detectors. Different bandpass filters can be used, for example, filters based on thin film technology or filters made from fiber Bragg gratings.
Different optical fibers and fiber optic couplers can be used in order to implement the invention. For example, multi and single mode optical fibers and couplers, wavelength and polarization dependent fiber optic couplers and fiber optic elements can be used.
Measurement can be done simultaneously by activating the light sources and measuring detected signals at the same time. Measurements can also be done by sequentially activating the different light sources and performing measurement with their related detectors. When operating in simultaneously sequential mode, there is no need to spectrally isolate the light detectors, since measurements are done at different times.
The basic principle of the invention was described via a fiber optic confocal system, described by FIG. 3. However, the principle can be
implemented by using free space optics or by using a hybrid system where both fiber optic elements and free space optics are used. In the case of free space optics the output port 332 maybe for example a pin hole aperture.
PARTS LIST confocal sensor
light source
light detector
fiber optic coupler
optical fiber connecting light source to coupler optical fiber emitting light on substrate optical fiber connecting coupler to detector emitted rays to substrate
back reflected rays from substrate
imaging lens
substrate
distance, z, from lens to printing plate maximal focus
first light source
second light source
first detector
second detector
coupler
coupler
coupler between first and second light sources output optical port
dispersive lens
processor
coupled light source and detector unit coupled light source and detector unit

Claims

CLAIMS:
1. A system for measuring a distance to a substrate comprising:
a first light source, emitting a first wavelength on a region of the substrate through a lens;
a second light source emitting a second wavelength on the region of the substrate through the lens;
wherein the lens is confocal and dispersive;
a first detector configured to detect first wavelength light reflected from the substrate;
a second detector configured to detect second wavelength light reflected from the substrate; and
a processor configured to compute:
a) a first response function wherein the first response function represents reflected light intensity emitted from the first light source as a function of the distance between the imaging device and substrate;
b) a second response function wherein the second response function represents reflected light intensity emitted from the second light source as a function of the distance between the imaging device and substrate; and c) a ratio response function wherein the ratio response function represents the ratio of the first response function and the second response function as a function of distance between the imaging device and substrate.
2. The system in claim 1 wherein more than two light sources and detectors are used and wherein each of the light sources emits light of a different wavelength.
3. The system of claim 1 wherein the laser sources detectors are coupled by fiber optic couplers.
4. The system of claim 1 wherein the optical port is the distal tip of a fiber.
5. The system of claim 1 wherein the laser source and detectors are coupled utilizing mirrors, reflectors, optical fibers, and fiber optic elements.
6. The system of claim 1 wherein the optical port is a pin hole.
7. The system of claim 1 wherein the optical element is composed of mirrors and lenses.
8. The system of claim 1 wherein the optical element is a telemetric lens.
9. The system of claim 1 wherein the detector is a photonic or bolometric detector.
10. A distance measurement method comprising:
imaging a first light source emitting a first wavelength, on a region of a substrate with a dispersive confocal lens;
imaging a second light source emitting a second wavelength with the dispersive confocal lens on the region of the substrate;
measuring intensity of light reflection emitted from the first light source;
measuring intensity of light reflection emitted from the second light source; and
generating a first response function wherein the first response function represents reflected light intensity emitted from the first light source as a function of the distance.
EP12731211.4A 2011-06-09 2012-05-31 Coupled multi-wavelength confocal systems for distance measurements Withdrawn EP2718666A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/156,574 US20120314200A1 (en) 2011-06-09 2011-06-09 Coupled multi-wavelength confocal systems for distance measurements
US13/156,572 US20120316830A1 (en) 2011-06-09 2011-06-09 Coupled multi-wavelength confocal systems for distance measurements
PCT/US2012/040166 WO2012170275A1 (en) 2011-06-09 2012-05-31 Coupled multi-wavelength confocal systems for distance measurements

Publications (1)

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EP2718666A1 true EP2718666A1 (en) 2014-04-16

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EP12731211.4A Withdrawn EP2718666A1 (en) 2011-06-09 2012-05-31 Coupled multi-wavelength confocal systems for distance measurements

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WO (1) WO2012170275A1 (en)

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US9134522B2 (en) 2009-10-16 2015-09-15 Thorlabs, Inc. Autofocus apparatus
CN105637400B (en) * 2013-08-22 2019-05-28 统雷有限公司 Automatic focusing mechanism
CN104991402B (en) * 2015-07-23 2018-01-09 中国科学院广州生物医药与健康研究院 A kind of device and method of auto-focusing
CN110220494B (en) * 2015-10-29 2021-11-09 原相科技股份有限公司 Double-aperture ranging system and operation method thereof
CN108871199A (en) * 2018-05-30 2018-11-23 中国工程物理研究院机械制造工艺研究所 A kind of dispersion shift sensor based on light wave Amplitude Ration
CN114001645B (en) * 2021-10-28 2024-04-12 山西大学 Three-wavelength optical fiber point differential confocal microscopic detection method and device

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