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EP1420281A3 - Method and apparatus for optical scanning with a large depth of field - Google Patents

Method and apparatus for optical scanning with a large depth of field Download PDF

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Publication number
EP1420281A3
EP1420281A3 EP03025215A EP03025215A EP1420281A3 EP 1420281 A3 EP1420281 A3 EP 1420281A3 EP 03025215 A EP03025215 A EP 03025215A EP 03025215 A EP03025215 A EP 03025215A EP 1420281 A3 EP1420281 A3 EP 1420281A3
Authority
EP
European Patent Office
Prior art keywords
light
sample
field
optical scanning
large depth
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP03025215A
Other languages
German (de)
French (fr)
Other versions
EP1420281A2 (en
Inventor
Ralf Wolleschensky
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Carl Zeiss Microscopy GmbH
Original Assignee
Carl Zeiss Jena GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Carl Zeiss Jena GmbH filed Critical Carl Zeiss Jena GmbH
Publication of EP1420281A2 publication Critical patent/EP1420281A2/en
Publication of EP1420281A3 publication Critical patent/EP1420281A3/en
Withdrawn legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/006—Optical details of the image generation focusing arrangements; selection of the plane to be imaged
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/50—Image enhancement or restoration using two or more images, e.g. averaging or subtraction
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/97—Determining parameters from multiple pictures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N2021/6417—Spectrofluorimetric devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N2021/6463—Optics
    • G01N2021/6478—Special lenses

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Immunology (AREA)
  • Optics & Photonics (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Pathology (AREA)
  • Theoretical Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

Beleuchtungslichtverteilung mindestens einer Wellenlänge und Detektion insbesondere des aufgrund von Wechselwirkung mit der Probe beeinflußten Lichtes, insbesondere Fluoreszenzlichtes und / oder reflektierten Lichtes und / oder Lumineszenzlichtes und / oder gestreuten und / oder transmittierten Lichtes,
wobei das Beleuchtungslicht eine Modulation in zumindest einer Raumrichtung aufweist und das wie das Beleuchtungslicht modulierte Detektionslicht in zwei Anteile, die zueinander eine Phasenverschiebung aufweisen, räumlich aufgeteilt wird,
diese getrennt vermessen werden und aus ihnen ein optisches Schnittbild der Probe und/ oder eines Probenteils berechnet wird.

Figure 00000001
Illumination light distribution of at least one wavelength and detection in particular of the light influenced by interaction with the sample, in particular fluorescent light and / or reflected light and / or luminescent light and / or scattered and / or transmitted light,
wherein the illumination light has a modulation in at least one spatial direction, and the detection light modulated as the illumination light is spatially divided into two portions which have a phase shift relative to one another,
these are measured separately and from them an optical sectional image of the sample and / or a sample part is calculated.
Figure 00000001
EP03025215A 2002-11-15 2003-11-05 Method and apparatus for optical scanning with a large depth of field Withdrawn EP1420281A3 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10254139 2002-11-15
DE10254139A DE10254139A1 (en) 2002-11-15 2002-11-15 Method and arrangement for the depth-resolved optical detection of a sample

Publications (2)

Publication Number Publication Date
EP1420281A2 EP1420281A2 (en) 2004-05-19
EP1420281A3 true EP1420281A3 (en) 2005-06-01

Family

ID=32115578

Family Applications (1)

Application Number Title Priority Date Filing Date
EP03025215A Withdrawn EP1420281A3 (en) 2002-11-15 2003-11-05 Method and apparatus for optical scanning with a large depth of field

Country Status (4)

Country Link
US (1) US7170696B2 (en)
EP (1) EP1420281A3 (en)
JP (1) JP2004170977A (en)
DE (1) DE10254139A1 (en)

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DE10300091A1 (en) * 2003-01-04 2004-07-29 Lubatschowski, Holger, Dr. microtome
DE10350918B3 (en) * 2003-10-31 2005-04-14 Evotec Technologies Gmbh Light transmission measuring device for chemical or biological sample with illumination light beam for overall illumination and stimulation light beam focused onto discrete measuring volumes
DE102004058833A1 (en) * 2004-12-06 2006-06-08 Leica Microsystems Cms Gmbh Optical arrangement for a microscope and a microscope
US7729750B2 (en) * 2005-01-20 2010-06-01 The Regents Of The University Of California Method and apparatus for high resolution spatially modulated fluorescence imaging and tomography
DE102005008925A1 (en) * 2005-02-24 2006-09-07 Leica Microsystems Cms Gmbh Laser microdissection
DE102005046755A1 (en) * 2005-09-29 2007-04-19 Carl Zeiss Jena Gmbh Apparatus and method for generating an image of an object
DE102005046754A1 (en) 2005-09-29 2007-04-05 Carl Zeiss Jena Gmbh Specimen sensing device e.g. laser scanning microscope, has control unit alternatively connecting each recording pixel to analysis channels, such that detected light is divided into two portions phased in relation to one another
WO2007043314A1 (en) * 2005-10-13 2007-04-19 Nikon Corporation Microscope
JP4844137B2 (en) * 2006-01-30 2011-12-28 株式会社ニコン Microscope equipment
DE102006047912A1 (en) * 2006-10-06 2008-04-10 Carl Zeiss Microimaging Gmbh Method and device for parallelized microscopic imaging
EP2136233B1 (en) * 2007-04-12 2013-06-12 Nikon Corporation Microscope device
DE102007018048A1 (en) 2007-04-13 2008-10-16 Michael Schwertner Method and arrangement for optical imaging with depth discrimination
CN101802675B (en) * 2007-07-06 2014-09-17 新加坡国立大学 Fluorescence focal modulation microscopy system and method
DE102007047467A1 (en) * 2007-09-28 2009-04-02 Carl Zeiss Microimaging Gmbh Arrangement for the optical detection of light radiation excited and / or backscattered in a sample
DE102007047465A1 (en) * 2007-09-28 2009-04-02 Carl Zeiss Microimaging Gmbh Method and arrangement for optically detecting an illuminated sample
FR2922658B1 (en) * 2007-10-18 2011-02-04 Centre Nat Rech Scient STRUCTURED ILLUMINATION SYSTEM OF A SAMPLE
US8280131B2 (en) * 2007-11-26 2012-10-02 Carl Zeiss Micro Imaging Gmbh Method and configuration for optically detecting an illuminated specimen
DE102008009216A1 (en) * 2008-02-13 2009-08-20 Carl Zeiss Microimaging Gmbh Apparatus and method for spatially high resolution imaging of a structure of a sample
FR2941787B1 (en) * 2009-02-04 2011-04-15 Ecole Polytech METHOD AND DEVICE FOR ACQUIRING SIGNALS IN LASER SCANNING MICROSCOPY.
US8896683B2 (en) 2009-07-08 2014-11-25 Freescale Semiconductor, Inc. Device for forming a high-resolution image, imaging system, and method for deriving a high-spatial-resolution image
EP2501288B1 (en) 2009-11-19 2016-12-21 Modulated Imaging Inc. Method and apparatus for analysis of turbid media via single-element detection using structured illumination
DE102010047237B4 (en) 2010-08-13 2021-07-01 Leica Microsystems Cms Gmbh Method for separating detection signals in the beam path of an optical device
US8717562B2 (en) * 2010-08-23 2014-05-06 Scattering Solutions, Inc. Dynamic and depolarized dynamic light scattering colloid analyzer
ES2668320T3 (en) 2012-11-07 2018-05-17 Modulated Imaging Inc. Efficiently modulated imaging
US10670510B2 (en) 2013-02-05 2020-06-02 Massachusetts Institute Of Technology 3-D holographic imaging continuous flow cytometry
DE102014016850B9 (en) * 2014-11-13 2017-07-27 Carl Zeiss Meditec Ag Optical system for fluorescence observation
KR102243079B1 (en) * 2019-06-28 2021-04-21 주식회사 스몰머신즈 Microscope apparatus and method for calibrating position of light source

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EP0076866A1 (en) * 1981-10-09 1983-04-20 Ibm Deutschland Gmbh Interpolating light section process
US5608529A (en) * 1994-01-31 1997-03-04 Nikon Corporation Optical three-dimensional shape measuring apparatus
US6376818B1 (en) * 1997-04-04 2002-04-23 Isis Innovation Limited Microscopy imaging apparatus and method
US20020018118A1 (en) * 2000-03-24 2002-02-14 Solvision Inc. System for simultaneous projections of multiple phase-shifted patterns for the three-dimensional inspection of an object
EP1251327A2 (en) * 2001-04-20 2002-10-23 Yogo, Teruaki Three-dimensional shape measuring method

Also Published As

Publication number Publication date
US7170696B2 (en) 2007-01-30
EP1420281A2 (en) 2004-05-19
JP2004170977A (en) 2004-06-17
US20040095576A1 (en) 2004-05-20
DE10254139A1 (en) 2004-05-27

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