EP0943572A2

EP0943572A2 - Display system for a spinning machine

Info

Publication number: EP0943572A2
Application number: EP99104290A
Authority: EP
Inventors: Tetsuya Murata Kikai Koutariryo B-310 Hori; Tomoyuki Murata Kikai Koutariryo C-210 Ikkai
Original assignee: Murata Machinery Ltd
Current assignee: Murata Machinery Ltd
Priority date: 1998-03-20
Filing date: 1999-03-03
Publication date: 1999-09-22
Also published as: EP0943572A3

Abstract

To provide a display system for a spinning machine making it possible to check whether the thickness and length of a cut yarn defect accurately corresponds to a clearing limit. The present invention relates to a display system for a spinning machine having local control units 4 and a central control unit 20, comprising a yarn defect judging means 19 provided at the local control units 4 to judge the yarn defect to be cut based on the waveform data captured from a clearer head 8a and a predetermined first criterion, and creates the first data on the thickness and length of the cut yarn defect; and a display means 5 having a thickness axis and a longitudinal axis and provided at the central control 20 displays a clearing limit in addition to the first criterion, wherein the first data for a number of the yarn defects cut by the yarn defect judging means 19 is transmitted to the central control unit 20, and the first data is displayed together with the clearing limit.

Description

Field of the Invention

The present invention relates to a spinning machine comprising a number of spinning units in which a fiber bundle to he supplied is twisted to form a yarn. More particular, the present invention relates to a display system for a spinning machine for displaying yarn data such as yarn defects.

Background of the Invention

A conventional display system for a spinning machine has a central control unit and a local control unit. The system processes waveform data detected by the local control unit on the central control unit side, and displays the data. The central control unit has a quality control part and an analysis part so as to facilitate control of yarn quality during production and help with the analysis and management of maintenance work. This quality control part controls the yarn quality during spinning. If yarn defect distribution data obtained from waveform data exceeds a predetermined reference value, the number of the spindle where a yarn defect occurs and its cause are displayed on the monitor. In addition, the analysis part manages running and operating conditions of a spinning machine, and is designed to display long-term management charts concerning operability, quality, and maintenance. Moreover, a local control unit is provided for each spinning unit so as to detect waveform data for each spindle (for each spinning unit).
However, such conventional display systems for the spinning machine sequentially process waveform data obtained by the local control unit (for each spindle) on the central control unit, and thus cannot process more than one waveform data value simultaneously. Accordingly, a plurality of yarn defect distribution data values processed by the central control unit cannot be displayed simultaneously by corresponding to a clearing limit. As a result, it is impossible to check whether the thickness and length (yarn defect distribution data) of a cut yarn defect accurately corresponds to the clearing limit.
The present invention has been achieved in view of the above problem. It is a primary object of the present invention to provide a display system for a spinning machine which makes it possible to check whether the thickness and length (yarn defect distribution data) of a cut yarn defect accurately corresponds to a clearing limit.
In addition, the conventional display system for a spinning machine sequentially processes waveform data obtained by the local control unit (for each spindle), thus making it impossible to process a plurality of waveform data values simultaneously. Accordingly, it is impossible to display yarn defect data of an arbitrary spindle (data on the thickness and length of the yarn defect) together with defect waveform data.
The present invention has been achieved in view of the above problem. It is a secondary object of the present invention to provide a display system for a spinning machine that can display yarn defect data of an arbitrary spindle together with defect waveform data.

Summary of the Invention

To achieve the primary object, the invention comprises a display system for a spinning machine that has a local control unit to control one or more spinning units and a central control unit connected to said local control unit. The system includes a yarn defect judging means provided at the local control unit, which judges the yarn defect to be cut, based on both the waveform data captured from a clearer head that defects the thickness of the spinning yarn in each spinning unit and the predetermined first criterion, and creates the first data on the thickness and length of a cut yarn defect. At the central control unit is provided a display means having a thickness axis and a longitudinal axis. The display means displays a clearing limit, which indicates, by a line, the limit of the yarn defect to be cut, in addition to said first criterion. The first data on the length and thickness of a number of yarn defects cut by said yarn defect judging means is transmitted to said central control unit so that said first data is displayed together with said clearing limit of said display means.
Thereby, waveform data can be processed for each local control unit, and a plurality of yarn defect distribution data values can be displayed simultaneously by corresponding to the clearing limit. Thus, it is possible to check whether the thickness and length (the first data) of a cut yarn defect accurately corresponds to the clearing limit. In addition, the reference value used by the yarn defect judging means can be adjusted according to the distribution of the thickness and length of a cut yarn defect, thus making it possible to reduce the number of cuttings and improve work efficiency.
The invention is characterized in that the yarn defect judging means judges a remaining, uncut yarn defect, based on the waveform data and the predetermined second criterion, and creates the second data on the thickness and length of said remaining yarn defect. Said display means displays the second data so that it can be distinguished from the first data with respect to the clearing limit.
Thereby, thickness and length (the second data) of an uncut portion of yarn in the vicinity (a non-defect portion) of a cutting level, can also be displayed, thus making it possible to more clearly know whether thickness and length (the first data) of a cut yarn defect accurately corresponds to the clearing limit. In addition, the reference value used by the yarn defect judging means can be adjusted according to the distribution of thickness and length of the yarn's defective portion or non-defective portion, thus making it possible to reduce the number of cuttings and further improve work efficiency.
The invention is characterized in that said clearing limits in said display means comprises a first limit indicating the thickness limit of a yarn defect in the positive direction with respect to the longitudinal axis and a second limit indicating the thickness limit of the yarn defect in the negative direction with respect to the longitudinal axis.
Thereby, it is possible to more clearly know whether the thickness and length of a cut yarn defect accurately corresponds to the clearing limit. In addition, the reference value used by the yarn defect judging means can be adjusted according to the distribution of the thickness and length of the yarn's defective portion or non-defective portion, thus making it possible to reduce the number of cuttings and further improve work efficiency.
The invention is characterized in that said yarn defect judging means creates the first data for the type of each yarn defect, and said display means displays the first data according to the type of each yarn defect, together with said clearing limit.
Thereby, a number of types of the first data can be displayed simultaneously, thus making it possible to more clearly know whether the thickness and length of various yarn defects that has been cut accurately corresponds to the clearing limit. In addition, the reference value used by the yarn defect judging means can be adjusted according to the distribution of the thickness and length of the yarn's defective portion or non-defective portion, thus making it possible to reduce the number of cuttings and further improve work efficiency.
The invention is characterized in that said yarn defect judging means creates the first data and the second data for the type of each yarn defect, and said display means displays the first data and the second data according to the type of each yarn defect, together with the clearing limit.
Thereby, a number of types of the first data and the second data can be displayed simultaneously, thus making it possible to more clearly know whether the thickness and length of cut yarn defects actually correspond to the clearing limit. In addition, the reference value used by the yarn defect judging means can be adjusted according to the distribution of the thickness and length of the yarn's defective portion or non-defective portion, thus making it possible to reduce the number of cuttings and further improve work efficiency.
The invention is characterized in that said display means displays the first data and the second data for each spindle according to the type of each yarn defect, together with the clearing limit.
Thereby, a number of types of the first data and the second data can be displayed according to each spindle thus making it possible to know whether the thickness and length of various cut yarn defects accurately correspond to the clearing limit. In addition, the reference value used by the yarn defect judging means can be adjusted by each local control unit, according to the distribution of the thickness and length of the yarn's defective portion or non-defective portion, thus making it possible to reduce the number of cuttings and further improve work efficiency.
The invention comprises a display system for a spinning machine having a plurality of local control units for controlling one or more spinning units and a central control unit connected to said local control units. At each local control unit is provided a yarn defect judging means that judges the yarn defect to be cut, based on the waveform data captured from a clearer head that detects the thickness of a spinning yarn in each spinning unit and the predetermined criterion, and creates defect waveform data obtained from said waveform data and yarn defect data on the thickness and length of the yarn defect. Also provided at the central control unit is a display means having a thickness axis and a longitudinal axis. The display means displays the defect waveform data and said yarn defect data. Data on a number of yarn defects that were cut by said each yarn defect judging means and said waveform data are transmitted to the central control unit, and said yarn defect data is displayed together with said defect waveform data.
Thereby, the cause of such defects can be recognized from the characteristics of the defect waveform data. In addition, the yarn defect data is displayed together with the waveform data, thereby making it possible to determine the thicknesses and lengths that correspond to the respective waveform data. Therefore, it is possible to use the waveform data to determine which thickness and length category each yarn defect falls into.
The invention is characterized in that said central control unit has a storing means for storing a predetermined number of the latest defect waveform data and yarn defect data for each spindle, and said display means displays said yarn defect data together with the defect waveform data for each spindle through a predetermined operation.
Thereby, a plurality of defect waveform data and yarn defect data records can be compared with each other for each spindle, thus making it possible to recognize trends in the waveform of the yarn defect.
The invention is characterized in that said each yarn defect judging means creates yarn defect data for the type of each yarn defect, and in that said display means displays yarn defect data together with said defect waveform data corresponding to data for yarn defect.
Thereby, several types of defect waveform data and yarn defect data can be displayed, thus making it possible to adjust detection sensitivity to match various criteria.

Brief Description of the Drawing

Figure 1 describes the entire structure of a spinning machine.
Figure 2 describes a spinning unit.
Figure 3 describes a display system for a spinning machine.
Figure 4 is a flowchart that describes the operation of the display system according to the first embodiment of the invention.
Figure 5 is a flowchart that describes the operation of the display system according to the first embodiment of the invention.
Figure 6 is a distribution graph of yarn defect distribution data and remaining yarn defect distribution data to be displayed on the monitor of the display system according to the first embodiment of the invention.
Figure 7 is a flowchart that describes the operation of an display system according to a second embodiment of the invention.
Figure 8 is a flowchart that describes the operation of the display system according to the second embodiment of the invention.
Figure 9 is an S-cut defect representation displayed on the monitor of the display system according to the second embodiment of the invention.
Figure 10 is an L-cut defect representation displayed on the monitor of the display system according to the second embodiment of the invention.

Detailed Description of the Preferred Embodiments

Hereinafter, preferred embodiments of the invention will be described with reference to the accompanying drawings.
As shown in Figure 1, a spinning machine 1 comprises a central control unit 20 and a number of spinning units U provided in a line. At the spinning units U, as shown in Figure 2, a draft part 2, an air spinning nozzle 3, a delivery roller 6, a clearing unit 8, and a winding part 9 are arranged in series from the upstream side to downstream side.
The draft part 2 comprises a back roller pair 10, a middle roller pair 11 that loads an apron belt 12, and a front roller pair 13. Of each of the draft roller pairs, the middle roller pair 11 and the front roller pair 13 are disposed on a line shaft common to each unit, and all units are driven simultaneously. However, the back roller pair 10 has its bottom roller that can be driven or stopped by each unit.
The air spinning nozzle 3 is disposed on the downstream side of the front roller pair 13, and is structured so as to eject compressed air from a pressure air ejection hole and generate whirling air flow. Thereby, a binding yarn Y (spinning yarn) is formed from a fiber bundle S drawn at the draft part 2. This binding yarn Y employs almost linearly arranged fiber groups as a core fiber, and is structured so that a winding fiber is spirally wound around that core fiber.
In addition, the air spinning nozzle 3 is connected to a pressure supply source for supplying compressed air via an air supply pipe, a mechanical valve, or the like (not shown in the drawings). The supply of compressed air is adjusted by operating the mechanical valve. The compressed air hole is inclined toward the yarn running direction, which is downstream so as to easily generate suction air flow in the vicinity of the inlet side of the air spinning nozzle 3.
At the delivery roller 6, a nip roller 7 is disposed so as to arbitrarily make contact with the delivery roller 6. This nip roller 7 is biased in the clockwise direction by means of a spring (not shown in the drawings) so as to feed a binding yarn Y (spinning yarn) while in pressure contact with the delivery roller 6.
The clearing unit 8 is designed to measure the thickness (sectional change) of the binding yarn Y and transmit analog waveform data from a clearer head 8a to a clearer evaluation board 19 (see Figure 3) described later.
The winding part 9 is designed to wind the binding yarn Y around a winding package P while the yarn Y is traversed by a traverse unit (not shown in the drawings). The winding package P is rotatably supported by a cradle arm, so as to rotate while in pressure contact with a friction roller 17.
Now, essential parts of the spinning machine 1 according to the embodiments of the present invention will be described here.
As shown in Figure 3, the display system 23 for the spinning machine comprises a central control unit (master side) 20 and a plurality of the local control units (slave side) 4 so as to digitally process waveform data of a clearer head 8a by means of the local control units 4 and display a distribution (the first data) of yarn defects on a monitor 5 constituting display means.
Each local control unit 4 has a clearer evaluation board 19 (yarn defect judging means) to which four clearer heads 8a and four unit control boards 18 are connected, so as to evaluate the yarn defects at four spinning units U.
The clearer evaluation board 19 features a ROM, a CPU, an A/D converter, a RAM, and digitally processed analog waveform data. The clearer evaluation board 19 executes a yarn defect judgment subroutine, determines the type of the yarn defect (such as weak yarn, thick yarn, or slub), and creates distribution data for display.
In the ROM, the criteria for each yarn defect is stored, and two reference values, i.e., a detection level that is a second criterion and a cutting level that is a first criterion, are stored. The yarn defects include a slub (the Defect S), the Defect L, and the Defect T in addition to a weak yarn (the Defect LL) and a thick yarn (the Defect NEP). With respect to the criterion of the Defect L (+30%, 100 cm), for example, the detection level is +20%, and the cutting level is +30%.
First, a first embodiment will be described with reference to Figures 1 to 6.
The CPU captures detected analog waveform data from the clearer head 8a, converts the data into a digital signal by means of the A/D converter, and from that digital signal calculates the moving average value for each yarn defect. Then, the moving average value is compared with a detection level. If the moving average value exceeds the detection level, it is compared with a cutting level, if it does not exceed the cutting level, the remaining defect distribution data (the second data) is calculated and is stored in the RAM. The remaining defect distribution data includes a yarn length of the portion which exceeds the detection level and the maximum possible thickness (%) at that interval (yarn length). The yarn length and the maximum thickness are measured after counting has started at a time at which a yarn exceeds the detection level.
On the other hand, in the case where the moving average value for each defect exceeds the detection level, and further exceeds the cutting level, a defect distribution data (the first data) is calculated and stored so as to transmit a yarn defect signal to the unit control board 18. The defect distribution data includes the length of a cut yarn's defective portion and the maximum thickness (%) of the yarn defect. The length and the maximum thickness are measured by beginning to count at a point where the yarn exceeds the cutting level. Thereafter, a type of the cut defect is determined, and based on that result, a distribution data is created for display. The distribution data for display includes the remaining defect distribution data (the second data) and the defect distribution data (the first data).
As described above, each local control unit 4 compares the first and second criteria for each yarn defect with moving average values for each defect calculated from the waveform data. In the case where the moving average value for each defect falls into any second criterion, the yarn defect signal (for example, the Defect LL signal or the like) corresponding to that yarn defect is output to the unit control board 18, and the distribution data for display (the first data and the second data) is created so that the distribution data for display is transmitted to the central control unit 20. The unit control board 18 permits the spinning unit U to perform predetermined processing (yarn cutting or the like) corresponding to that yarn defect signal when the unit control board 18 receives the yarn defect signal. In the case where the moving average values for each defect does not fall into any second criterion, the waveform data of the next interval is captured so that the evaluation is performed sequentially.
Each local control unit 4 is connected to the central control unit 20 via communication lines 21 and 22. When the local control unit 4 receives a command to transmit distribution data for display from the central control unit 20 via the communication line 21, 64 points of the distribution data for display with respect to the specified spindle and the type of a defect is transmitted to the central control unit 20 via the communication line 22.
The central control unit 20 stores the latest 64 points of the distribution data for display for the type of each defect. In addition, the central control unit 20 is provided with the monitor 5. As shown in Figure 6, the distribution data for display and a clearing curve (clearing limit) are displayed. The longitudinal axis of the monitor 5 indicates yarn thickness, while the transverse axis indicates yarn length. In addition, the clearing curve is a curve indicating the limit of the yarn defect to be cut. This curves comprises a first curve indicating the thickness limit of the yarn defect in the positive direction with respect to the transverse axis (longitudinal axis) and a second curve indicating the thickness limit of the yarn defect in the negative direction with respect to the transverse axis.
In the above configuration, the operation of the display system 23 for the spinning machine will be described with reference to the accompanying drawings.
As shown in Figure 2, a sliver S (fiber bundle) is coiled, sequentially drafted while the sliver S is brought into pressure contact from a case K by means of rollers 10, 11, and 13 of the draft part 2, and ejected by whirling air flow from a pressure air ejection hole.
The sliver S (fiber bundle) is changed to the binding yarn Y by means of the draft part 2 and the air spinning nozzle 3, and is drawn from the delivery roller 6 and the nip roller 7 to the downstream side. Thereafter, the binding yarn Y is bent by means of a guide rod body 16, and is wound around the winding package P while being traversed through the clearing unit 8.
During above winding process, the clearing unit 8 of each spinning unit U always measures the state of the binding yarn Y, and transmits analog waveform data to the clearer evaluation board 19. As shown in Figure 3, when the clearer evaluation board 19 receives waveform data from the clearer head 8a of each clearing unit 8, the board digitally processes the data, and evaluates the yarn defects of the binding yarn Y such as weak yarn, thick yarn, slub, or the like. Now, evaluation of the yarn defect by means of the clearer evaluation board 19 will be described.
As shown in Figure 4, when the clearer evaluation board 19 captures waveform data (S1), the board converts the data into a digital signal by means of the A/D converter (S2), and executes a yarn defect judgment subroutine (S3). As shown in Figure 5, the moving average value for the Defect NEP is calculated from that digital signal (S4), and is compared with the detection level for the Defect NEP (S5). In the case where the moving average value for the Defect NEP exceeds the detection level for the Defect NEP (S5, YES), yarn length measurement is begun, and the yarn length of a portion which exceeds the detection level for the Defect NEP is measured.
Next, the moving average value for the Defect NEP is compared with the Defect NEP cutting level (S6). In the case where the moving average value for the Defect NEP does not exceed the Defect NEP cutting level (S6, NO), a yarn length of a portion which exceeds the Defect NEP detection level and a maximum value (%) of thickness at that interval (yarn length) are stored in the RAM as remaining defect distribution data for the Defect NEP (S8).
When the remaining defect distribution data for the Defect NEP is stored, the moving average value for the Defect S is calculated from a digital signal (S9), and is compared with the Defect S detection level (S10). In the case where the moving average value for the Defect S exceeds the Defect S detection level (S10, YES), yarn length measurement is begun, and the length of the yarn portion which exceeds the detection level for the Defect S is measured.
Next, the living average value for the Defect S is compared with the cutting level for the Defect S (S11). In the case where the moving average value for the Defect S exceeds the cutting level for the Defect S (S11, YES), the distribution data for the Defect S is stored in the RAM (S12). The distribution data for the Defect S includes the length and thickness of the yarn's defective portion to be cut.
When the distribution data for the Defect S is stored in the RAM, as shown in Figure 4, the Defect S signal is transmitted to the unit control board 18 corresponding to the clearer head 8a that outputs waveform data. When the unit control board 18 receives the Defect S signal, the board outputs a cutter actuation signal to a cutter solenoid, and cuts the binding yarn Y (S29).
Thereafter, the clearer evaluation board 19 determines the type of a cut defect (S30), reads out from the RAM the remaining defect distribution data for the Defect NEP, the remaining defect distribution data for the Defect S, and the Defect S distribution data, and creates distribution data for display (S31).
The distribution data for display includes the remaining defect distribution data for the Defect NEP (yarn length at a portion which exceeds a detection level for the Defect NEP and a maximum value (%) of thickness at that interval (yarn length)), the remaining defect distribution data for the Defect S (yarn length at a portion which exceeds a detection level for the Defect S and a maximum value (%) of thickness at that interval (yarn length)), and distribution data for the Defect S (length and thickness of the cut yarn's defective portion).
As shown in Figure3, when a command to transmit distribution data for display is received from the central control unit 20 via the communication line 21, the distribution data for display specified via the communication line 22 is transmitted to the central control unit 20 (S32). When the central control unit 20 receives distribution data for display (S33), it stores the distribution data for display (S34). As shown in Figure 6, a non-cutting point (○ ) indicating the remaining defect distribution data for the Defect NEP and a cutting point () are displayed on a monitor (S35).
Thereby, an operator can know the distributions of the cutting point () indicating each defect distribution data and the non-cutting point (○ ) indicating the remaining defect distribution data for each defect. Therefore, the operator can know that the cutting point () exists in a non-cutting area (inside the first and second curves) or that the non-cutting point (○ ) exists in a cutting area (outside the first and second curves), thus making it possible to help establish some guidance when the cutting level of each yarn defect is changed.
On the other hand, in the yarn defect judgement subroutine S5, if the moving average value for the Defect NEP does not exceed the detection level for the Defect NEP (S5, NO), the moving average value for the Defect S is calculated (S9). In S10, if the moving average value for the Defect S does not exceed the detection level for the Defect S (S10, NO), the moving average value for the Defect L is calculated (S14). Thus, if the moving average value for each of the Defect NEP, S, L, and T does not exceed the detection level for each defect (S5, S10, S15, and S), a moving average value for the next defect is calculated, and the detection level for each of the defects (S, L, T, and LL) is evaluated sequentially. In S25, if a moving average value for the Defect LL does not exceed the detection level for the Defect LL (S25, NO), the subroutine proceeds to S1.
In S6, if a moving average value for the Defect NEP exceeds the cutting level for the Defect NEP (S6, YES), distribution data for the Defect NEP is stored in the RAM (S7), and the subroutine proceeds to S29. Similarly, if the moving average value for each of the Defect S, L, T, and LL exceeds the cutting level for each defect (S11, S16, S21, S26, YES), the respective defect distribution data is stored in the RAM (S12, S17, S22, and S27), and the subroutine proceeds to S29.
There are various patterns of defect waveforms. Since a clearing curve shown in Figure 6 is set assuming that a defect waveform is a rectangular slub, the cutting point () and the non-cutting point (○ ) are not always positioned in the cutting area and non-cutting area, respectively. Consequently, it is effective to display not only the cutting point () but the non-cutting point (○ ) together with such clearing curves.
Now, a second embodiment will be described with reference to Figures 1 to 3 and Figures 7 to 10. In the second embodiment, the waveform data of the clearing unit 8 is digitally processed so that a point corresponding the thickness and length of a yarn defect is displayed together with defect waveform data on a monitor 5 which constitutes a display means for the central control unit 20 .
The CPU in the clearer evaluation board 19 captures analog waveform data detected from the clearer head 8a, converts the data into a digital signal by means of the A/D) converter, and calculates a moving average value for a yarn's defect from that digital signal. Then, the CPU compares that moving average value with a cutting level, and if the cutting level is not exceeded, the CPU calculates a moving average value for another yarn defect, and compares the value with the cutting level.
On the other hand, if the moving average value for the yarn defect exceeds the cutting level, the length and thickness of a yarn' s defective portion (yarn defect data) and a moving average value group (waveform data for the defect) including a moving average value for a yarn defect exceeding the cutting level are stored in the RAM so as to transmit a yarn defect signal to the unit control board 18. Thereafter, yarn defect data is read out from the RAM, and the type of the cut yarn defect is determined so as to create waveform data for display based on that yarn defect data and waveform data for the defect. The waveform data for display includes defect waveform data and yarn defect data.
As has been described above, each local control unit 4 compares a criterion for each defect with the average value of defect movement calculated from waveform data. In the case where the average value of defect movement falls into each criterion, a yarn defect signal (for example, the Defect LL signal) according to that yarn defect is output to the unit control board 18. Then waveform data for display (yarn defect data and waveform data) is created so as to transmit waveform data for display to the central control unit 20. When the unit control board 18 receives that yarn defect signal, the board permits a spinning unit U to perform predetermined processing (yarn cutting or the like) according to that yarn defect signal. If the average value of defect movement does not fall into each criterion, the analog waveform data of the next interval is captured so as to perform the evaluation sequentially.
Each local control unit 4 is connected to the central control unit 20 via the communication lines 21 and 22. When the local control unit 4 receives a command to transmit waveform data for display from the central control unit via the communication line 21, the waveform data for display corresponding to the type of specified spindle and defect is transmitted to the central control unit 20 via the communication line 22.
The central control unit 20 stores waveform data for display with respect to the latest 10 points according to the types of each defect. The central control unit 20 is provided with a monitor 5. As shown in Figure 9, waveform data for display is displayed for each spindle. The longitudinal axis of the monitor 5 indicates yarn thickness, and the transverse axis indicates yarn length.
In the above configuration, the operation of the display system 23 for the spinning machine will be described with reference to the accompanying drawings. As shown in Figure 2, the sliver S (fiber bundle) is coiled, and is sequentially drafted while the sliver is brought into pressure contact with the case K by means of the rollers 10, 11, and 13 of the drafter part 2. Then, the sliver S is ejected by whirling air flow from the pressure air ejection hole.
The sliver S (fiber bundle) is changed to the binding yarn Y by means of the drafter part 2 and the air spinning nozzle 3, and is drawn on the downstream side by means of the delivery roller 6 and the nip roller 7. Thereafter, the binding yarn Y is bent by means of the guide rod body 16, and is wound around the winding package P while being traversed through the clearing device 8.
During the above winding process, the clearing device 8 of each spinning unit U always measures the state of the spinning yarn Y, and transmits analog waveform data to the clearer evaluation board 19. As shown in Figure 3, when the clearer evaluation board 19 receives waveform data from the clearer head 8a of each clearing unit 8, the board digitally processes the data, and evaluates each defect in the binding yarn Y such as weak yarn, thick yarn, slub, or the like. Now, evaluation of yarn defects by the clearer evaluation board 19 will be described.
As shown in Figure 7, when the clearer evaluation board 19 captures analog waveform data (S/01), the board converts the data into a digital signal by means of an A/D) converter (S/02), and executes a yarn defect judgment subroutine (S/03). As shown in Figure 8, a moving average value for the Defect NEP is calculated from that digital signal (S/04), and is compared with the cutting level for the Defect NEP (S/05). In the case where the living average value for the Defect NEP does not exceed the cutting level for the Defect NEP (S/05, NO), a living average value for the Defect S is calculated from a digital signal (S/07), and is compared with a cutting level for the Defect S (S/08). In the case where the moving average value for the Defect S exceeds the cutting level the Defect S (S/08, YES), the Defect S data on the thickness and length of the Defect portion S portion and waveform data for the Defect S are stored in the RAM (S/09). The waveform data for the Defect S is an average value group of the defect movement, including the moving average value for the Defect S that exceeds the cutting level for the Defect S.
When the Defect S data and the waveform data for the Defect S are stored in the RAM, as shown in Figure 7, a defect signal S is transmitted to the unit control board 18 corresponding to the clearer head 8a that outputs analog waveform data. When the unit control board 18 receives the Defect S signal, the board outputs a cutter actuation signal to a cutter solenoid, and cuts the binding yarn Y (S/19). Thereafter, the clearer evaluation board 19 reads the Defect S data from the RAM, and determines the type of cut defect (S/20). Waveform data for display is creates based on the Defect S data and the Defect S waveform data (S/21).
As shown in Figure 3, when a command to transmit waveform data for display from the central control unit 20 via the communication line 21 is generated, the waveform data for display specified via the communication line 22 is transmitted to the central control unit 20 (S/22). When the central control unit 20 receives waveform data for display (S/23), it stores the waveform data for display (S/24). As shown in Figure 9, a point (▪), which indicates the thickness and length of the Defect S portion, is displayed together with the Defect S waveform (the Defect S waveform data) (S/25).
Thereby, the operator can recognize the cause of the Defect S from the Defect S waveform characteristics by referring to the point (▪) that indicates the thickness and length of the Defect S waveform and the Defect S portion.
On the other hand, in S/05 of the yarn defect judgment subroutine, if the living average value for the Defect NEP does not exceed the cutting level for the Defect NEP (S/05, NO), the living average value for the Defect S is calculated (S/07). In S/08, if the moving average value for the Defect S exceeds the cutting level for the Defect S (S/08, NO), the moving average value for the Defect L is calculated (S/10). Thus, if the moving average value for each of the Defects NEP, S, L, and T does not exceed the cutting level for each defect (S/05, S/08, S/11, S/14, NO), the living average value for the next defect is calculated, and evaluation of the cutting level for each of the Defect (S, L, T, and LL) is carried out. In S/17, if the moving average value for the Defect LL does not exceed the cutting level for the Defect LL (S/17, NO), the subroutine proceeds to S/01.
In S/05, if the moving average value for the Defect NEP exceeds the cutting level for the Defect NEP (S/05, YES), numeric data (cutting point data for the Defect NEP) concerning the thickness and length of the Defect NEP portion is stored (S/06) in the RAM, and the subroutine proceeds to S/19. Similarly, if the moving average value for each of the Defects S, L, T, and LL exceeds the cutting level for each defect (S/08, S/11, S/14, S/17, YES), numeric data (respective cutting point data) concerning the thickness and length of each defect portion is stored in the RAM (S/09, S/12, S15, S/18) and the subroutine proceeds to S/19.
The invention comprises a display system for a spinning machine having local control units for controlling one or more spinning units and a central control unit connected to said local control units. A yarn defect judging means is provided at the local control units to judge the yarn defect to be cut, based on waveform data captured from a clearer head that detects the thickness of a spinning yarn in each spinning unit and a predetermined first criterion, and creates the first data on the thickness and length of the cut yarn defect. A display means is provided at the central control unit to display a clearing limit, which indicates, by a line, the limit of the yarn defect to be cut, in addition to the first criterion, wherein the first data on the length and thickness of a number of yarn defects cut by the yarn defect judging means is transmitted to said central control unit so that the first data is displayed together with the clearing limit of the display means.
Thereby, waveform data can be processed for each local control unit, and a plurality of yarn defect distribution data values corresponding to clearing limits can be displayed simultaneously. Therefore, this invention makes it possible to know whether the thickness and length (the first data) of the cut yarn defect accurately corresponds to the clearing limit. Another advantage of this invention is that the reference value used by the yarn defect judging means can be adjusted according to the distribution of the thickness and length (the first data) of the cut yarn defect, thus making it possible to reduce the number of cuttings and improve work efficiency.
The invention is characterized in that the yarn defect judging means judges a remaining, uncut yarn defect based on the waveform data and a predetermined second criterion, and creates the second data on the thickness and length of the remaining yarn defect. The display means displays the second data so that it can be distinguished from the first data. Thereby, the thickness and length (the second data) of an uncut portion of yarn in the vicinity of a cutting level (non-defective portion), can be displayed. Therefore, this second invention makes it possible to clearly know whether the thickness and length (the first data) of a cut yarn defect accurately corresponds to a clearing limit. Moreover, the reference value used by the yarn defect judging means can be adjusted according to the distribution of the thickness and length of the yarn's defective portion or the non-defective portion, thus making it possible to reduce the number of cuttings and improve work efficiency.
The invention comprises a first limit in which the clearing limit in the display means indicates a thickness limit in the positive direction with respect to the longitudinal axis and a second limit in which the clearing limit indicates the thickness limit of a yarn defect in the negative direction with respect to the longitudinal axis. As a result, it is possible to more clearly know whether the thickness and length of the cut yarn defect accurately corresponds to the clearing limit. In addition, the reference value used by the yarn defect judging means can be adjusted according to the thickness and length of the yarn's defective portion or the non-defective portion, thus making it possible to reduce the number of cuttings and further improve work efficiency.
The invention is constructed so that the yarn defect judging means creates the first data for the type of each yarn defect, and the display means displays the first data, according to the type of each yarn defect, together with the clearing limit. Thereby, a number of types of the first data values can be displayed simultaneously, thus making it possible to more clearly know whether the thickness and length of various yarn defects that have been cut accurately correspond to the clearing limit. In addition, the reference value used by the yarn defect judging means can be adjusted according to the distribution of the thickness and length of the yarn's defective portion or the non-defective portion, thus making it possible to reduce the number of cuttings and further improve work efficiency.
The invention is constructed so that the yarn defect judging means creates the first data and the second data for the type of each yarn defect, and the display means displays the first data and the second data according to the type of each yarn defect, together with the clearing limit. Thereby, a number of types of the first data and the second data can be displayed simultaneously, thus making it possible to more clearly know whether the thickness and length of yarn defects that have been cut accurately correspond to the clearing limit. In addition, the reference value used by the yarn defect judging means can be adjusted according to the distribution of the thickness and length of the yarn's defective portion or the non-defective end portion, thus making it possible to reduce the number of cuttings and further improve work efficiency.
The invention is constructed so that the display means displays the first data and the second data for each spindle according to the type of each yarn defect, together with the clearing limit. Thereby, a number of types of the first data and the second data can be displayed according to each spindle, thus making it possible to know whether the thickness and length of various cut yarn defects accurately correspond to the clearing limit. In addition, the reference value used by the yarn defect judging means can be adjusted by each local control unit according to the distribution of the thickness and length of the yarn's defective portion or the non-defective portion, thus making it possible to reduce the number of cuttings and further improve work efficiency.
The invention comprises a display system for a spinning machine having a plurality of local control units for controlling one or more spinning units and a central control unit connected to the local control units. A yarn defect judging means is provided at each of the local control units to judge the yarn defect to be cut based on waveform data captured from a clearer head that detects the thickness of a spinning yarn in each spinning unit and the predetermined criterion, and creates defect waveform data obtained from the waveform data and yarn defect data on the thickness and length of the yarn defect. A display means having a thickness axis and a longitudinal axis is provided at the central control unit to display the defect waveform data and the yarn defect data. Data on a number of yarn defects that were cut by said each yarn defect judging means and the waveform data are transmitted to the central control unit, and the yarn defect data is displayed together with the defect waveform data. Accordingly, this invention makes it possible to recognize the cause of such defect from the characteristics of defect waveform data. In addition, it is possible to know the thickness and length of the waveform data that were cut by displaying yarn defect data together with the waveform data. In other words, it is possible use the waveform data to classify the interval of the thickness and length into which the yarn's terminal end falls.
The invention is constructed so that the central control unit has a storing means for storing a predetermined number of the latest defect waveform data and yarn defect data for each spindle, and the display means that displays the yarn defect data together with the defect waveform data for each spindle through a predetermined operation. Thereby, a plurality of defect waveform data values and yarn defect data values can be compared with each other for each spindle, thus making it possible to recognize trends in the waveforms of the yarn defect.
The invention is constructed so that each yarn defect judging means creates each yarn defect data according to the type of each yarn defect, and the display means displays each yarn defect data together with the defect waveform data corresponding to data for each yarn defect. Thereby, several types of defect waveform data values and yarn defect data values can be displayed, thus making it possible to adjust detection sensitivity according to various criteria.

Claims

A display system for a spinning machine having a local control unit for controlling one or more spinning units and a central control unit connected to said local control unit, characterized in that:

a yarn defect judging means is provided at said local control unit, which judges the yarn defects to be cut, based on both the waveform data captured from a clearer head that detects the thickness of a spinning yawn in each spinning unit and the predetermined first criterion, and creates the first data on the thickness and length of a cut yarn defect; and

a display means provided at said central control unit, having a thickness axis and a longitudinal axis; said display means displays a clearing limit, which indicates, by a line, the limit of the yarn defect to be cut, in addition to said first criterion,
wherein the first data on the length and thickness of a number of yarn defects cut by said yarn defect judging means is transmitted to said central control unit so that said first data is displayed, together with said clearing limit of said display means.
A display system for a spinning machine as in claim 1, characterized in that said yarn defect judging means judges a remaining, uncut yarn defect, based on said waveform data and the predetermined second criterion, and creates the second data on the thickness and length of said remaining yarn defect; and said display means displays said second data so that it can be distinguished from said first data with respect to said clearing limit.
A display system for a spinning machine as in claim 1 or claim 2, characterized in that said clearing limits in said display means are a first limit indicating the thickness limit of a yarn defect in the positive direction with respect to said longitudinal axis and a second limit indicating the thickness limit of a yarn defect in the negative direction with respect to said longitudinal axis.
A display system for a spinning machine as in any one of claims 1 to 3, characterized in that said yarn defect judging means creates the first data for the type of each yarn defect; and said display means displays the first data according to the type of each yarn defect, together with said clearing limit.
A display system for a spinning machine as in any one of claims 1 to 3, characterized in that said display means creates the first data and the second data for the type of each yarn defect, and said display means displays the first data ad the second data according to the type of each yarn defect, together with said clearing limit.
A display system for a spinning machine as in any one of claims 1 to 3, characterized in that said display means displays the first data and the second data for each spindle according to the type of each yarn defect, together with the clearing limit.
A display system for a spinning machine having a plurality of local control units for controlling one or more spinning units and a central control unit connected to said local control unit, characterized in that it comprises:

a yarn defect waveform judging means provided at said each local control unit, which judges the yarn defects to be cut, based on both the waveform data captured from a clearer head that detects the thickness of a spinning yarn in each spinning unit and the predetermined criterion, and creates defect waveform data obtained from said waveform data and yarn defect data on the thickness and length of the yarn defect; at said central control unit, a display means having a thickness axis and a longitudinal axis is provided to display said defect waveform data and said yarn defect data; data on a number of yarn defects cut by said each yarn defect judging means and said waveform data are transmitted to said central control unit, and said yarn defect data is displayed, together with said defect waveform data.
A display system for a spinning machine as in claim 7, characterized in that said central control unit has a storing means for storing the predetermined number of said latest defect waveform data and said yarn defect data for each spindle; and in that said display means displays said yarn defect data together with said defect waveform data for each spindle through a predetermined operation.
A display system for a spinning machine as in claim 7 or claim 8, characterized in that said each yarn defect judging means creates yarn defect data for the type of each yarn defect; and in that said display means displays each yarn defect data, together with said defect waveform data corresponding to respective yarn defect data.