DE69932496D1 - Trägerplatte mit einstellbarem Druck und einstellbarer Oberfläche für eine chemisch-mechanische Poliervorrichtung - Google Patents
Trägerplatte mit einstellbarem Druck und einstellbarer Oberfläche für eine chemisch-mechanische PoliervorrichtungInfo
- Publication number
- DE69932496D1 DE69932496D1 DE69932496T DE69932496T DE69932496D1 DE 69932496 D1 DE69932496 D1 DE 69932496D1 DE 69932496 T DE69932496 T DE 69932496T DE 69932496 T DE69932496 T DE 69932496T DE 69932496 D1 DE69932496 D1 DE 69932496D1
- Authority
- DE
- Germany
- Prior art keywords
- adjustable
- support plate
- mechanical polishing
- chemical mechanical
- polishing device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/30—Work carriers for single side lapping of plane surfaces
- B24B37/32—Retaining rings
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/30—Work carriers for single side lapping of plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/16—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation taking regard of the load
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US114182 | 1980-01-22 | ||
US11418298P | 1998-12-30 | 1998-12-30 | |
US09/470,820 US6422927B1 (en) | 1998-12-30 | 1999-12-23 | Carrier head with controllable pressure and loading area for chemical mechanical polishing |
US470820 | 1999-12-23 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69932496D1 true DE69932496D1 (de) | 2006-09-07 |
DE69932496T2 DE69932496T2 (de) | 2007-02-01 |
Family
ID=26811889
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69932496T Expired - Lifetime DE69932496T2 (de) | 1998-12-30 | 1999-12-30 | Trägerplatte mit einstellbarem Druck und einstellbarer Oberfläche für eine chemisch-mechanische Poliervorrichtung |
Country Status (3)
Country | Link |
---|---|
US (3) | US6422927B1 (de) |
EP (1) | EP1029633B1 (de) |
DE (1) | DE69932496T2 (de) |
Families Citing this family (83)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6422927B1 (en) * | 1998-12-30 | 2002-07-23 | Applied Materials, Inc. | Carrier head with controllable pressure and loading area for chemical mechanical polishing |
US6776692B1 (en) * | 1999-07-09 | 2004-08-17 | Applied Materials Inc. | Closed-loop control of wafer polishing in a chemical mechanical polishing system |
US6450868B1 (en) | 2000-03-27 | 2002-09-17 | Applied Materials, Inc. | Carrier head with multi-part flexible membrane |
US6361419B1 (en) * | 2000-03-27 | 2002-03-26 | Applied Materials, Inc. | Carrier head with controllable edge pressure |
AU2001259745A1 (en) * | 2000-05-12 | 2001-11-26 | Multi-Planar Technologies, Inc. | System and method for pneumatic diaphragm cmp head having separate retaining ring and multi-region wafer pressure control |
US6623343B2 (en) * | 2000-05-12 | 2003-09-23 | Multi Planar Technologies, Inc. | System and method for CMP head having multi-pressure annular zone subcarrier material removal control |
US6506105B1 (en) | 2000-05-12 | 2003-01-14 | Multi-Planar Technologies, Inc. | System and method for pneumatic diaphragm CMP head having separate retaining ring and multi-region wafer pressure control |
US6558232B1 (en) * | 2000-05-12 | 2003-05-06 | Multi-Planar Technologies, Inc. | System and method for CMP having multi-pressure zone loading for improved edge and annular zone material removal control |
US6722965B2 (en) * | 2000-07-11 | 2004-04-20 | Applied Materials Inc. | Carrier head with flexible membranes to provide controllable pressure and loading area |
US7198561B2 (en) * | 2000-07-25 | 2007-04-03 | Applied Materials, Inc. | Flexible membrane for multi-chamber carrier head |
US6857945B1 (en) * | 2000-07-25 | 2005-02-22 | Applied Materials, Inc. | Multi-chamber carrier head with a flexible membrane |
EP1177859B1 (de) * | 2000-07-31 | 2009-04-15 | Ebara Corporation | Substrathalter und Poliervorrichtung |
JP2002187060A (ja) * | 2000-10-11 | 2002-07-02 | Ebara Corp | 基板保持装置、ポリッシング装置、及び研磨方法 |
US6652362B2 (en) * | 2000-11-23 | 2003-11-25 | Samsung Electronics Co., Ltd. | Apparatus for polishing a semiconductor wafer and method therefor |
EP1405336A2 (de) * | 2000-12-04 | 2004-04-07 | Ebara Corporation | Substratverarbeitungsverfahren |
US6786809B1 (en) * | 2001-03-30 | 2004-09-07 | Cypress Semiconductor Corp. | Wafer carrier, wafer carrier components, and CMP system for polishing a semiconductor topography |
US6910949B1 (en) * | 2001-04-25 | 2005-06-28 | Lam Research Corporation | Spherical cap-shaped polishing head in a chemical mechanical polishing apparatus for semiconductor wafers |
KR100437456B1 (ko) * | 2001-05-31 | 2004-06-23 | 삼성전자주식회사 | 화학적 기계적 평탄화 기계의 폴리싱 헤드 및 그것을이용한 폴리싱방법 |
US6761619B1 (en) * | 2001-07-10 | 2004-07-13 | Cypress Semiconductor Corp. | Method and system for spatial uniform polishing |
WO2003049168A1 (fr) * | 2001-12-06 | 2003-06-12 | Ebara Corporation | Dispositif de support de substrat et dispositif de polissage |
US7024268B1 (en) | 2002-03-22 | 2006-04-04 | Applied Materials Inc. | Feedback controlled polishing processes |
US20030199112A1 (en) | 2002-03-22 | 2003-10-23 | Applied Materials, Inc. | Copper wiring module control |
WO2004048038A1 (en) * | 2002-11-22 | 2004-06-10 | Applied Materials Inc. | Methods and apparatus for polishing control |
WO2004070806A1 (en) | 2003-02-10 | 2004-08-19 | Ebara Corporation | Substrate holding apparatus and polishing apparatus |
DE10305711B4 (de) * | 2003-02-12 | 2005-09-01 | Infineon Technologies Ag | Gimpelhalter und chemisch-mechanische Polieranlage mit einem solchen Gimpelhalter |
US6945845B2 (en) * | 2003-03-04 | 2005-09-20 | Applied Materials, Inc. | Chemical mechanical polishing apparatus with non-conductive elements |
US7001245B2 (en) | 2003-03-07 | 2006-02-21 | Applied Materials Inc. | Substrate carrier with a textured membrane |
US7025658B2 (en) * | 2003-08-18 | 2006-04-11 | Applied Materials, Inc. | Platen and head rotation rates for monitoring chemical mechanical polishing |
US6991516B1 (en) | 2003-08-18 | 2006-01-31 | Applied Materials Inc. | Chemical mechanical polishing with multi-stage monitoring of metal clearing |
US7074109B1 (en) | 2003-08-18 | 2006-07-11 | Applied Materials | Chemical mechanical polishing control system and method |
US8066552B2 (en) * | 2003-10-03 | 2011-11-29 | Applied Materials, Inc. | Multi-layer polishing pad for low-pressure polishing |
US20050173259A1 (en) * | 2004-02-06 | 2005-08-11 | Applied Materials, Inc. | Endpoint system for electro-chemical mechanical polishing |
JP3889744B2 (ja) * | 2003-12-05 | 2007-03-07 | 株式会社東芝 | 研磨ヘッドおよび研磨装置 |
US7118451B2 (en) * | 2004-02-27 | 2006-10-10 | Taiwan Semiconductor Manufacturing Co., Ltd. | CMP apparatus and process sequence method |
US7255771B2 (en) * | 2004-03-26 | 2007-08-14 | Applied Materials, Inc. | Multiple zone carrier head with flexible membrane |
JP4583207B2 (ja) | 2004-03-31 | 2010-11-17 | 不二越機械工業株式会社 | 研磨装置 |
CN101022920A (zh) | 2004-05-13 | 2007-08-22 | 应用材料股份有限公司 | 具有导电部分的固定环 |
US7608173B2 (en) * | 2004-12-02 | 2009-10-27 | Applied Materials, Inc. | Biased retaining ring |
US7033257B2 (en) * | 2004-07-21 | 2006-04-25 | Agere Systems, Inc. | Carrier head for chemical mechanical polishing |
US7081042B2 (en) * | 2004-07-22 | 2006-07-25 | Applied Materials | Substrate removal from polishing tool |
US7048621B2 (en) * | 2004-10-27 | 2006-05-23 | Applied Materials Inc. | Retaining ring deflection control |
KR101011788B1 (ko) * | 2004-11-01 | 2011-02-07 | 가부시키가이샤 에바라 세이사꾸쇼 | 톱링, 폴리싱장치 및 폴리싱방법 |
KR100674923B1 (ko) * | 2004-12-03 | 2007-01-26 | 삼성전자주식회사 | 인접한 화소간에 출력회로를 공유하는 씨모스 이미지 센서 |
JP5112614B2 (ja) | 2004-12-10 | 2013-01-09 | 株式会社荏原製作所 | 基板保持装置および研磨装置 |
US7101272B2 (en) * | 2005-01-15 | 2006-09-05 | Applied Materials, Inc. | Carrier head for thermal drift compensation |
US20070082479A1 (en) * | 2005-10-06 | 2007-04-12 | Applied Materials, Inc. | Chemical mechanical polishing techniques for integrated circuit fabrication |
US7407433B2 (en) * | 2005-11-03 | 2008-08-05 | Applied Materials, Inc. | Pad characterization tool |
AU2007334744B2 (en) * | 2006-12-19 | 2012-08-30 | Cwf Hamilton & Co Limited | Waterjet unit impeller |
JP2009038232A (ja) * | 2007-08-02 | 2009-02-19 | Toshiba Corp | 半導体製造装置および半導体装置の製造方法 |
JP5042778B2 (ja) * | 2007-10-31 | 2012-10-03 | 信越半導体株式会社 | ワーク研磨用ヘッド及びこの研磨ヘッドを備えた研磨装置 |
WO2009066351A1 (ja) * | 2007-11-20 | 2009-05-28 | Shin-Etsu Handotai Co., Ltd. | 研磨ヘッド及び研磨装置 |
KR20170038113A (ko) * | 2008-03-25 | 2017-04-05 | 어플라이드 머티어리얼스, 인코포레이티드 | 캐리어 헤드 멤브레인 |
JP5390807B2 (ja) * | 2008-08-21 | 2014-01-15 | 株式会社荏原製作所 | 研磨方法および装置 |
US10160093B2 (en) * | 2008-12-12 | 2018-12-25 | Applied Materials, Inc. | Carrier head membrane roughness to control polishing rate |
DE102009030298B4 (de) | 2009-06-24 | 2012-07-12 | Siltronic Ag | Verfahren zur lokalen Politur einer Halbleiterscheibe |
CN102470506B (zh) * | 2009-07-22 | 2014-11-26 | 株式会社捷太格特 | 工件的防滑方法以及装置 |
DE102009051007B4 (de) * | 2009-10-28 | 2011-12-22 | Siltronic Ag | Verfahren zum Polieren einer Halbleiterscheibe |
KR101196652B1 (ko) * | 2011-05-31 | 2012-11-02 | 주식회사 케이씨텍 | 캐리어 헤드의 멤브레인 결합체 및 이를 구비한 캐리어 헤드 |
US9393668B2 (en) * | 2012-07-12 | 2016-07-19 | Taiwan Semiconductor Manufacturing Company Limited | Polishing head with alignment gear |
KR200465446Y1 (ko) | 2012-09-09 | 2013-02-19 | 전용준 | 캐리어 헤드 하우징과 보유 링 간의 결합 상태 점검 기능을 갖는 화학 기계적 연마 장치의 캐리어 헤드 |
KR101410358B1 (ko) | 2013-02-25 | 2014-06-20 | 삼성전자주식회사 | 화학적 기계적 연마장치용 멤브레인 및 화학적 기계적 연마장치용 연마헤드 |
SG10201606197XA (en) | 2015-08-18 | 2017-03-30 | Ebara Corp | Substrate adsorption method, substrate holding apparatus, substrate polishing apparatus, elastic film, substrate adsorption determination method for substrate holding apparatus, and pressure control method for substrate holding apparatus |
US10617968B2 (en) * | 2016-08-24 | 2020-04-14 | Joshua Davis | Building blocks |
US11597052B2 (en) | 2018-06-27 | 2023-03-07 | Applied Materials, Inc. | Temperature control of chemical mechanical polishing |
CN111266993B (zh) * | 2018-12-05 | 2023-06-30 | 凯斯科技股份有限公司 | 化学机械式研磨装置用承载头的卡环及具备其的承载头 |
KR20210126097A (ko) | 2019-02-14 | 2021-10-19 | 액서스 테크놀로지, 엘엘씨 | 기판 캐리어 헤드 및 프로세싱 시스템 |
US11633833B2 (en) | 2019-05-29 | 2023-04-25 | Applied Materials, Inc. | Use of steam for pre-heating of CMP components |
CN113874164B (zh) | 2019-05-29 | 2024-09-03 | 应用材料公司 | 用于化学机械研磨系统的蒸气处理站 |
US11628478B2 (en) | 2019-05-29 | 2023-04-18 | Applied Materials, Inc. | Steam cleaning of CMP components |
US11897079B2 (en) | 2019-08-13 | 2024-02-13 | Applied Materials, Inc. | Low-temperature metal CMP for minimizing dishing and corrosion, and improving pad asperity |
US11945073B2 (en) * | 2019-08-22 | 2024-04-02 | Applied Materials, Inc. | Dual membrane carrier head for chemical mechanical polishing |
SG10202008012WA (en) * | 2019-08-29 | 2021-03-30 | Ebara Corp | Elastic membrane and substrate holding apparatus |
CN110640627B (zh) * | 2019-09-20 | 2021-04-20 | 大连理工大学 | 一种用于金相试样磨抛机的工件夹具 |
US11541506B2 (en) * | 2019-09-27 | 2023-01-03 | Systems On Silicon Manufacturing Company Pte Ltd | Chemical mechanical polishing (CMP) polishing head with improved vacuum sealing |
CN115103738A (zh) | 2020-06-29 | 2022-09-23 | 应用材料公司 | Cmp中的温度和浆体流动速率控制 |
WO2022006008A1 (en) | 2020-06-29 | 2022-01-06 | Applied Materials, Inc. | Control of steam generation for chemical mechanical polishing |
US11577358B2 (en) | 2020-06-30 | 2023-02-14 | Applied Materials, Inc. | Gas entrainment during jetting of fluid for temperature control in chemical mechanical polishing |
JP2023530555A (ja) | 2020-06-30 | 2023-07-19 | アプライド マテリアルズ インコーポレイテッド | Cmp温度制御のための装置および方法 |
US11724355B2 (en) | 2020-09-30 | 2023-08-15 | Applied Materials, Inc. | Substrate polish edge uniformity control with secondary fluid dispense |
WO2022081398A1 (en) | 2020-10-13 | 2022-04-21 | Applied Materials, Inc. | Substrate polishing apparatus with contact extension or adjustable stop |
US11623321B2 (en) | 2020-10-14 | 2023-04-11 | Applied Materials, Inc. | Polishing head retaining ring tilting moment control |
EP4301550A1 (de) * | 2021-03-04 | 2024-01-10 | Applied Materials, Inc. | Polierträgerkopf mit steuerung der schwebenden kante |
CN113649945B (zh) | 2021-10-20 | 2022-04-15 | 杭州众硅电子科技有限公司 | 一种晶圆抛光装置 |
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JPS63300858A (ja) | 1987-05-29 | 1988-12-08 | Hitachi Ltd | 空気軸受式ワ−クホルダ |
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JPH01216768A (ja) | 1988-02-25 | 1989-08-30 | Showa Denko Kk | 半導体基板の研磨方法及びその装置 |
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JPH0569310A (ja) | 1991-04-23 | 1993-03-23 | Mitsubishi Materials Corp | ウエーハの鏡面研磨装置 |
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US6116992A (en) * | 1997-12-30 | 2000-09-12 | Applied Materials, Inc. | Substrate retaining ring |
US6080050A (en) * | 1997-12-31 | 2000-06-27 | Applied Materials, Inc. | Carrier head including a flexible membrane and a compliant backing member for a chemical mechanical polishing apparatus |
US5961169A (en) * | 1998-07-27 | 1999-10-05 | Strasbaugh | Apparatus for sensing the presence of a wafer |
US6422927B1 (en) * | 1998-12-30 | 2002-07-23 | Applied Materials, Inc. | Carrier head with controllable pressure and loading area for chemical mechanical polishing |
US6162116A (en) * | 1999-01-23 | 2000-12-19 | Applied Materials, Inc. | Carrier head for chemical mechanical polishing |
US6050882A (en) * | 1999-06-10 | 2000-04-18 | Applied Materials, Inc. | Carrier head to apply pressure to and retain a substrate |
-
1999
- 1999-12-23 US US09/470,820 patent/US6422927B1/en not_active Expired - Lifetime
- 1999-12-30 EP EP99310632A patent/EP1029633B1/de not_active Expired - Lifetime
- 1999-12-30 DE DE69932496T patent/DE69932496T2/de not_active Expired - Lifetime
-
2002
- 2002-04-10 US US10/121,143 patent/US6645044B2/en not_active Expired - Fee Related
-
2003
- 2003-09-24 US US10/670,888 patent/US6872122B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US20020151251A1 (en) | 2002-10-17 |
EP1029633A1 (de) | 2000-08-23 |
US20020061720A1 (en) | 2002-05-23 |
EP1029633B1 (de) | 2006-07-26 |
US6645044B2 (en) | 2003-11-11 |
US6422927B1 (en) | 2002-07-23 |
US6872122B2 (en) | 2005-03-29 |
US20040067719A1 (en) | 2004-04-08 |
DE69932496T2 (de) | 2007-02-01 |
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