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DE69836717D1 - Elektrische Verbindungsvorrichtung - Google Patents

Elektrische Verbindungsvorrichtung

Info

Publication number
DE69836717D1
DE69836717D1 DE69836717T DE69836717T DE69836717D1 DE 69836717 D1 DE69836717 D1 DE 69836717D1 DE 69836717 T DE69836717 T DE 69836717T DE 69836717 T DE69836717 T DE 69836717T DE 69836717 D1 DE69836717 D1 DE 69836717D1
Authority
DE
Germany
Prior art keywords
electrical connection
connection device
electrical
connection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69836717T
Other languages
English (en)
Other versions
DE69836717T2 (de
Inventor
Yoshiei Hasegawa
Eichi Osato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NIHON MICRONICS MUSASHINO KK
Micronics Japan Co Ltd
Original Assignee
NIHON MICRONICS MUSASHINO KK
Micronics Japan Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP33822497A external-priority patent/JP3379897B2/ja
Application filed by NIHON MICRONICS MUSASHINO KK, Micronics Japan Co Ltd filed Critical NIHON MICRONICS MUSASHINO KK
Application granted granted Critical
Publication of DE69836717D1 publication Critical patent/DE69836717D1/de
Publication of DE69836717T2 publication Critical patent/DE69836717T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
DE69836717T 1997-11-25 1998-07-23 Elektrische Verbindungsvorrichtung Expired - Lifetime DE69836717T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP33822497A JP3379897B2 (ja) 1997-02-10 1997-11-25 被検査体試験用補助装置
JP33822497 1997-11-25

Publications (2)

Publication Number Publication Date
DE69836717D1 true DE69836717D1 (de) 2007-02-08
DE69836717T2 DE69836717T2 (de) 2007-10-04

Family

ID=18316106

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69836717T Expired - Lifetime DE69836717T2 (de) 1997-11-25 1998-07-23 Elektrische Verbindungsvorrichtung

Country Status (2)

Country Link
EP (1) EP0919816B1 (de)
DE (1) DE69836717T2 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10024165A1 (de) * 2000-05-17 2001-11-29 Vishay Semiconductor Gmbh Kontaktiersystem
DE10119122A1 (de) * 2000-06-02 2002-10-24 Sillner Georg Rudolf Verfahren sowie Vorrichtung zum Messen, insbesondere Hochfrequenzmessen von elektrischen Bauelementen
JP5134803B2 (ja) * 2006-10-05 2013-01-30 株式会社日本マイクロニクス 電気的接続装置
CN105929203A (zh) * 2016-04-25 2016-09-07 昆山瑞鸿诚自动化设备科技有限公司 一种Notebook触控按键测试治具

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2554746B2 (ja) * 1989-07-04 1996-11-13 山一電機株式会社 コンタクト
US5388996A (en) * 1991-01-09 1995-02-14 Johnson; David A. Electrical interconnect contact system
JP3265483B2 (ja) * 1992-01-23 2002-03-11 日本テキサス・インスツルメンツ株式会社 ソケット
JP2739031B2 (ja) * 1992-12-08 1998-04-08 三菱電機株式会社 半導体装置用ソケット
US5336094A (en) * 1993-06-30 1994-08-09 Johnstech International Corporation Apparatus for interconnecting electrical contacts
KR100316292B1 (ko) * 1995-11-17 2002-04-24 키타다 노리유키 전자부품용컨넥터
JP3675989B2 (ja) * 1995-11-17 2005-07-27 株式会社テセック 電子部品用コネクタ

Also Published As

Publication number Publication date
DE69836717T2 (de) 2007-10-04
EP0919816B1 (de) 2006-12-27
EP0919816A3 (de) 2000-03-22
EP0919816A2 (de) 1999-06-02

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition