DE602006011795D1 - Zeitkorrelation zwischen Signalleistung und Verzerrungseigenschaften - Google Patents
Zeitkorrelation zwischen Signalleistung und VerzerrungseigenschaftenInfo
- Publication number
- DE602006011795D1 DE602006011795D1 DE602006011795T DE602006011795T DE602006011795D1 DE 602006011795 D1 DE602006011795 D1 DE 602006011795D1 DE 602006011795 T DE602006011795 T DE 602006011795T DE 602006011795 T DE602006011795 T DE 602006011795T DE 602006011795 D1 DE602006011795 D1 DE 602006011795D1
- Authority
- DE
- Germany
- Prior art keywords
- signal power
- time correlation
- distortion characteristics
- distortion
- correlation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/16—Spectrum analysis; Fourier analysis
- G01R23/20—Measurement of non-linear distortion
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/16—Spectrum analysis; Fourier analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/20—Cathode-ray oscilloscopes
- G01R13/22—Circuits therefor
- G01R13/28—Circuits for simultaneous or sequential presentation of more than one variable
Landscapes
- Physics & Mathematics (AREA)
- Mathematical Physics (AREA)
- General Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Monitoring And Testing Of Transmission In General (AREA)
- Digital Transmission Methods That Use Modulated Carrier Waves (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/053,156 US7751470B2 (en) | 2005-02-07 | 2005-02-07 | Time correlation of signal power to distortion characteristics |
Publications (1)
Publication Number | Publication Date |
---|---|
DE602006011795D1 true DE602006011795D1 (de) | 2010-03-11 |
Family
ID=36204745
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE602006011795T Active DE602006011795D1 (de) | 2005-02-07 | 2006-02-02 | Zeitkorrelation zwischen Signalleistung und Verzerrungseigenschaften |
Country Status (4)
Country | Link |
---|---|
US (1) | US7751470B2 (de) |
EP (1) | EP1688751B1 (de) |
JP (1) | JP4704219B2 (de) |
DE (1) | DE602006011795D1 (de) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7706250B2 (en) | 2005-09-23 | 2010-04-27 | Litepoint Corp. | Apparatus and method for simultaneous testing of multiple orthogonal frequency division multiplexed transmitters with single vector signal analyzer |
US7822130B2 (en) * | 2005-09-23 | 2010-10-26 | Litepoint Corporation | Apparatus and method for simultaneous testing of multiple orthogonal frequency division multiplexed transmitters with single vector signal analyzer |
JP5285724B2 (ja) | 2011-02-17 | 2013-09-11 | アンリツ株式会社 | 移動通信端末試験装置及び移動通信端末試験方法 |
JP5696539B2 (ja) * | 2011-03-16 | 2015-04-08 | 富士通セミコンダクター株式会社 | スプリアス測定装置及びそれを利用した受信装置,通信システム |
US20120306886A1 (en) | 2011-06-02 | 2012-12-06 | Tektronix, Inc | Continuous rf signal visualization with high resolution |
JP5521073B2 (ja) * | 2013-03-07 | 2014-06-11 | アンリツ株式会社 | 移動通信端末試験装置及び移動通信端末試験方法 |
KR102189734B1 (ko) | 2014-12-30 | 2020-12-14 | 주식회사 쏠리드 | 분산 안테나 시스템의 모니터링 장치 |
US11137445B1 (en) * | 2019-06-28 | 2021-10-05 | Keysight Technologies, Inc. | Method and apparatus for reducing non-linear distortion |
EP3933413A1 (de) | 2020-06-29 | 2022-01-05 | Rohde & Schwarz GmbH & Co. KG | Verfahren und vorrichtung zur bestimmung der leckrate eines nachbarkanals auf basis einer bandbreitenbegrenzten messung |
Family Cites Families (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5050107A (en) * | 1981-07-24 | 1991-09-17 | Hewlett-Packard Company | Side-by-side displays for instrument having a data processing system |
US4703433A (en) * | 1984-01-09 | 1987-10-27 | Hewlett-Packard Company | Vector network analyzer with integral processor |
US4870348A (en) * | 1988-06-09 | 1989-09-26 | Tektronix, Inc. | Markers for readout and delta-parameter measurements on a quasi-3-dimensional display of a spectrum |
US5103402A (en) * | 1988-07-05 | 1992-04-07 | Tektronix, Inc. | Method and apparatus for identifying, saving, and analyzing continuous frequency domain data in a spectrum analyzer |
JP2891497B2 (ja) * | 1990-01-25 | 1999-05-17 | アンリツ株式会社 | スペクトラムアナライザ |
JP3369700B2 (ja) * | 1994-01-21 | 2003-01-20 | 株式会社アドバンテスト | バースト波立ち上がり立ち下がり特性評価装置 |
JP3055085B2 (ja) * | 1994-04-22 | 2000-06-19 | 株式会社アドバンテスト | デジタル変調解析装置 |
JPH08201451A (ja) * | 1995-01-24 | 1996-08-09 | Advantest Corp | スペクトラムアナライザ |
JPH1054855A (ja) * | 1996-08-09 | 1998-02-24 | Advantest Corp | スペクトラムアナライザ |
JP3359251B2 (ja) * | 1996-12-11 | 2002-12-24 | ソニー・テクトロニクス株式会社 | リアルタイム信号アナライザ |
US6229536B1 (en) * | 1998-03-05 | 2001-05-08 | Agilent Technologies, Inc. | System and method for displaying simultaneously a main waveform display and a magnified waveform display in a signal measurement system |
JP2990507B2 (ja) * | 1998-05-27 | 1999-12-13 | アンリツ株式会社 | 信号発生装置および隣接・隣々接チャネル漏洩電力測定システム |
US6671334B1 (en) * | 1998-11-03 | 2003-12-30 | Tektronix, Inc. | Measurement receiver demodulator |
US6681191B1 (en) * | 1999-12-21 | 2004-01-20 | Tektronix, Inc. | Frequency domain analysis system for a time domain measurement instrument |
US7142609B2 (en) * | 2000-11-29 | 2006-11-28 | Sunrise Telecom Incorporated | Method and apparatus for detecting and quantifying impairments in QAM signals |
JP2002296310A (ja) * | 2001-03-30 | 2002-10-09 | Anritsu Corp | 電力分布表示制御装置および電力分布表示制御方法 |
US20030053532A1 (en) * | 2001-09-19 | 2003-03-20 | Cutler Robert T. | Displaying modulation errors for OFDM signals |
US6768293B2 (en) * | 2001-11-30 | 2004-07-27 | Agilent Technologies, Inc. | Displaying signal measurements within multiple ranges of a parameter |
US6847905B2 (en) * | 2002-02-12 | 2005-01-25 | Tektronix, Inc. | Architecture providing increased information display for long acquisitions or constrained memory bandwidth |
CA2472319C (en) * | 2002-03-04 | 2012-09-25 | Glowlink Communications Technology | Detecting and measuring interference contained within a digital carrier |
GB2394390B (en) * | 2002-10-18 | 2005-07-06 | Ipwireless Inc | Arrangement and method for RF filter |
EP1445906B1 (de) * | 2002-12-09 | 2006-05-31 | Rohde & Schwarz GmbH & Co. KG | Verfahren und Vorrichtung zum Analysieren eines OFDM-Signals |
-
2005
- 2005-02-07 US US11/053,156 patent/US7751470B2/en not_active Expired - Fee Related
-
2006
- 2006-01-24 JP JP2006015341A patent/JP4704219B2/ja not_active Expired - Fee Related
- 2006-02-02 EP EP06250566A patent/EP1688751B1/de not_active Ceased
- 2006-02-02 DE DE602006011795T patent/DE602006011795D1/de active Active
Also Published As
Publication number | Publication date |
---|---|
EP1688751B1 (de) | 2010-01-20 |
US7751470B2 (en) | 2010-07-06 |
US20060176967A1 (en) | 2006-08-10 |
JP4704219B2 (ja) | 2011-06-15 |
EP1688751A1 (de) | 2006-08-09 |
JP2006217587A (ja) | 2006-08-17 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |