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DE602006011795D1 - Zeitkorrelation zwischen Signalleistung und Verzerrungseigenschaften - Google Patents

Zeitkorrelation zwischen Signalleistung und Verzerrungseigenschaften

Info

Publication number
DE602006011795D1
DE602006011795D1 DE602006011795T DE602006011795T DE602006011795D1 DE 602006011795 D1 DE602006011795 D1 DE 602006011795D1 DE 602006011795 T DE602006011795 T DE 602006011795T DE 602006011795 T DE602006011795 T DE 602006011795T DE 602006011795 D1 DE602006011795 D1 DE 602006011795D1
Authority
DE
Germany
Prior art keywords
signal power
time correlation
distortion characteristics
distortion
correlation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602006011795T
Other languages
English (en)
Inventor
Steven W Stanton
John F Turpin
Christopher D Larson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Publication of DE602006011795D1 publication Critical patent/DE602006011795D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16Spectrum analysis; Fourier analysis
    • G01R23/20Measurement of non-linear distortion
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16Spectrum analysis; Fourier analysis
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00Arrangements for displaying electric variables or waveforms
    • G01R13/20Cathode-ray oscilloscopes
    • G01R13/22Circuits therefor
    • G01R13/28Circuits for simultaneous or sequential presentation of more than one variable

Landscapes

  • Physics & Mathematics (AREA)
  • Mathematical Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
  • Digital Transmission Methods That Use Modulated Carrier Waves (AREA)
DE602006011795T 2005-02-07 2006-02-02 Zeitkorrelation zwischen Signalleistung und Verzerrungseigenschaften Active DE602006011795D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/053,156 US7751470B2 (en) 2005-02-07 2005-02-07 Time correlation of signal power to distortion characteristics

Publications (1)

Publication Number Publication Date
DE602006011795D1 true DE602006011795D1 (de) 2010-03-11

Family

ID=36204745

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602006011795T Active DE602006011795D1 (de) 2005-02-07 2006-02-02 Zeitkorrelation zwischen Signalleistung und Verzerrungseigenschaften

Country Status (4)

Country Link
US (1) US7751470B2 (de)
EP (1) EP1688751B1 (de)
JP (1) JP4704219B2 (de)
DE (1) DE602006011795D1 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7706250B2 (en) 2005-09-23 2010-04-27 Litepoint Corp. Apparatus and method for simultaneous testing of multiple orthogonal frequency division multiplexed transmitters with single vector signal analyzer
US7822130B2 (en) * 2005-09-23 2010-10-26 Litepoint Corporation Apparatus and method for simultaneous testing of multiple orthogonal frequency division multiplexed transmitters with single vector signal analyzer
JP5285724B2 (ja) 2011-02-17 2013-09-11 アンリツ株式会社 移動通信端末試験装置及び移動通信端末試験方法
JP5696539B2 (ja) * 2011-03-16 2015-04-08 富士通セミコンダクター株式会社 スプリアス測定装置及びそれを利用した受信装置,通信システム
US20120306886A1 (en) 2011-06-02 2012-12-06 Tektronix, Inc Continuous rf signal visualization with high resolution
JP5521073B2 (ja) * 2013-03-07 2014-06-11 アンリツ株式会社 移動通信端末試験装置及び移動通信端末試験方法
KR102189734B1 (ko) 2014-12-30 2020-12-14 주식회사 쏠리드 분산 안테나 시스템의 모니터링 장치
US11137445B1 (en) * 2019-06-28 2021-10-05 Keysight Technologies, Inc. Method and apparatus for reducing non-linear distortion
EP3933413A1 (de) 2020-06-29 2022-01-05 Rohde & Schwarz GmbH & Co. KG Verfahren und vorrichtung zur bestimmung der leckrate eines nachbarkanals auf basis einer bandbreitenbegrenzten messung

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5050107A (en) * 1981-07-24 1991-09-17 Hewlett-Packard Company Side-by-side displays for instrument having a data processing system
US4703433A (en) * 1984-01-09 1987-10-27 Hewlett-Packard Company Vector network analyzer with integral processor
US4870348A (en) * 1988-06-09 1989-09-26 Tektronix, Inc. Markers for readout and delta-parameter measurements on a quasi-3-dimensional display of a spectrum
US5103402A (en) * 1988-07-05 1992-04-07 Tektronix, Inc. Method and apparatus for identifying, saving, and analyzing continuous frequency domain data in a spectrum analyzer
JP2891497B2 (ja) * 1990-01-25 1999-05-17 アンリツ株式会社 スペクトラムアナライザ
JP3369700B2 (ja) * 1994-01-21 2003-01-20 株式会社アドバンテスト バースト波立ち上がり立ち下がり特性評価装置
JP3055085B2 (ja) * 1994-04-22 2000-06-19 株式会社アドバンテスト デジタル変調解析装置
JPH08201451A (ja) * 1995-01-24 1996-08-09 Advantest Corp スペクトラムアナライザ
JPH1054855A (ja) * 1996-08-09 1998-02-24 Advantest Corp スペクトラムアナライザ
JP3359251B2 (ja) * 1996-12-11 2002-12-24 ソニー・テクトロニクス株式会社 リアルタイム信号アナライザ
US6229536B1 (en) * 1998-03-05 2001-05-08 Agilent Technologies, Inc. System and method for displaying simultaneously a main waveform display and a magnified waveform display in a signal measurement system
JP2990507B2 (ja) * 1998-05-27 1999-12-13 アンリツ株式会社 信号発生装置および隣接・隣々接チャネル漏洩電力測定システム
US6671334B1 (en) * 1998-11-03 2003-12-30 Tektronix, Inc. Measurement receiver demodulator
US6681191B1 (en) * 1999-12-21 2004-01-20 Tektronix, Inc. Frequency domain analysis system for a time domain measurement instrument
US7142609B2 (en) * 2000-11-29 2006-11-28 Sunrise Telecom Incorporated Method and apparatus for detecting and quantifying impairments in QAM signals
JP2002296310A (ja) * 2001-03-30 2002-10-09 Anritsu Corp 電力分布表示制御装置および電力分布表示制御方法
US20030053532A1 (en) * 2001-09-19 2003-03-20 Cutler Robert T. Displaying modulation errors for OFDM signals
US6768293B2 (en) * 2001-11-30 2004-07-27 Agilent Technologies, Inc. Displaying signal measurements within multiple ranges of a parameter
US6847905B2 (en) * 2002-02-12 2005-01-25 Tektronix, Inc. Architecture providing increased information display for long acquisitions or constrained memory bandwidth
CA2472319C (en) * 2002-03-04 2012-09-25 Glowlink Communications Technology Detecting and measuring interference contained within a digital carrier
GB2394390B (en) * 2002-10-18 2005-07-06 Ipwireless Inc Arrangement and method for RF filter
EP1445906B1 (de) * 2002-12-09 2006-05-31 Rohde & Schwarz GmbH & Co. KG Verfahren und Vorrichtung zum Analysieren eines OFDM-Signals

Also Published As

Publication number Publication date
EP1688751B1 (de) 2010-01-20
US7751470B2 (en) 2010-07-06
US20060176967A1 (en) 2006-08-10
JP4704219B2 (ja) 2011-06-15
EP1688751A1 (de) 2006-08-09
JP2006217587A (ja) 2006-08-17

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