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DE60034121D1 - Verfahren und vorrichtung zur streuparameter-kalibrierung - Google Patents

Verfahren und vorrichtung zur streuparameter-kalibrierung

Info

Publication number
DE60034121D1
DE60034121D1 DE60034121T DE60034121T DE60034121D1 DE 60034121 D1 DE60034121 D1 DE 60034121D1 DE 60034121 T DE60034121 T DE 60034121T DE 60034121 T DE60034121 T DE 60034121T DE 60034121 D1 DE60034121 D1 DE 60034121D1
Authority
DE
Germany
Prior art keywords
streuparameter
calibration
streuparameter calibration
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60034121T
Other languages
English (en)
Other versions
DE60034121T2 (de
Inventor
Robert Peach
Nicholas Svensson
Thai Vo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Singapore Holdings Pte Ltd
Agilent Technologies Inc
Original Assignee
Com Dev Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Com Dev Ltd filed Critical Com Dev Ltd
Application granted granted Critical
Publication of DE60034121D1 publication Critical patent/DE60034121D1/de
Publication of DE60034121T2 publication Critical patent/DE60034121T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
DE60034121T 1999-02-02 2000-02-01 Verfahren und vorrichtung zur streuparameter-kalibrierung Expired - Lifetime DE60034121T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/241,704 US6300775B1 (en) 1999-02-02 1999-02-02 Scattering parameter calibration system and method
US241704 1999-02-02
PCT/CA2000/000087 WO2000046605A2 (en) 1999-02-02 2000-02-01 Scattering parameter calibration system and method

Publications (2)

Publication Number Publication Date
DE60034121D1 true DE60034121D1 (de) 2007-05-10
DE60034121T2 DE60034121T2 (de) 2007-11-08

Family

ID=22911826

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60034121T Expired - Lifetime DE60034121T2 (de) 1999-02-02 2000-02-01 Verfahren und vorrichtung zur streuparameter-kalibrierung

Country Status (5)

Country Link
US (1) US6300775B1 (de)
EP (1) EP1181562B8 (de)
CA (1) CA2361666C (de)
DE (1) DE60034121T2 (de)
WO (1) WO2000046605A2 (de)

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US7068049B2 (en) * 2003-08-05 2006-06-27 Agilent Technologies, Inc. Method and apparatus for measuring a device under test using an improved through-reflect-line measurement calibration
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US20050110502A1 (en) * 2003-11-05 2005-05-26 Yong Wang System and method for determining S-parameters
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US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
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US7113891B2 (en) * 2004-05-12 2006-09-26 Agilent Technologies, Inc. Multi-port scattering parameter calibration system and method
US7088087B2 (en) * 2004-09-13 2006-08-08 Agilent Technologies, Inc. Network analyzer including automatic port extension calibration and method of operation
KR20070058522A (ko) 2004-09-13 2007-06-08 캐스케이드 마이크로테크 인코포레이티드 양측 프루빙 구조
US7248033B2 (en) * 2004-10-18 2007-07-24 Agilent Technologies, Inc. Vector network analyzer with independently tuned receivers characterizes frequency translation devices
US7019536B1 (en) * 2005-01-03 2006-03-28 Agilent Technologies, Inc. Multiport calibration simplification using the “unknown thru” method
US6995571B1 (en) * 2005-01-03 2006-02-07 Agilent Technologies, Inc. Vector network analyzer mixer calibration using the unknown thru calibration
US7124049B2 (en) * 2005-01-03 2006-10-17 Agilent Technologies, Inc. Method for implementing TRL calibration in VNA
US7030625B1 (en) 2005-01-18 2006-04-18 Agilent Technologies, Inc. Method and apparatus for performing a minimum connection multiport through-reflect-line calibration and measurement
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7148702B2 (en) * 2005-03-30 2006-12-12 Agilent Technologies, Inc. VNA and method for addressing transmission line effects in VNA measurement data
US7640477B2 (en) * 2005-05-12 2009-12-29 Agilent Technologies, Inc. Calibration system that can be utilized with a plurality of test system topologies
US7061254B1 (en) * 2005-05-12 2006-06-13 Agilent Technologies, Inc. Power calibration for multi-port vector network analyzer (VNA)
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US7723999B2 (en) 2006-06-12 2010-05-25 Cascade Microtech, Inc. Calibration structures for differential signal probing
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US7545151B2 (en) * 2007-04-20 2009-06-09 Anritsu Company Characterizing test fixtures
US7876114B2 (en) 2007-08-08 2011-01-25 Cascade Microtech, Inc. Differential waveguide probe
US7777497B2 (en) * 2008-01-17 2010-08-17 Com Dev International Ltd. Method and system for tracking scattering parameter test system calibration
DE102008014039B4 (de) * 2008-03-13 2010-02-18 Spinner Gmbh Anordnung zum Kalibrieren eines Vektornetzwerkanalysators
US7888957B2 (en) 2008-10-06 2011-02-15 Cascade Microtech, Inc. Probing apparatus with impedance optimized interface
WO2010059247A2 (en) 2008-11-21 2010-05-27 Cascade Microtech, Inc. Replaceable coupon for a probing apparatus
US8319503B2 (en) 2008-11-24 2012-11-27 Cascade Microtech, Inc. Test apparatus for measuring a characteristic of a device under test
DE102009018703B4 (de) * 2008-12-19 2018-04-05 Rohde & Schwarz Gmbh & Co. Kg Netzwerkanalysator und ein Verfahren zum Betrieb eines Netzwerkanalysators mit 9-Term Kalibrierung
US8706433B2 (en) * 2010-02-01 2014-04-22 Teledyne Lecroy, Inc. Time domain reflectometry step to S-parameter conversion
TWI470248B (zh) 2011-06-22 2015-01-21 Wistron Corp 量測待測物散射參數的方法
DE102012006314A1 (de) * 2012-03-28 2013-10-02 Rosenberger Hochfrequenztechnik Gmbh & Co. Kg Zeitbereichsmessverfahren mit Kalibrierung im Frequenzbereich
DE102014119331B4 (de) * 2014-12-22 2016-08-25 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren zum Charakterisieren von Mikrowellenbauelementen
CN107390052B (zh) * 2017-07-03 2019-12-13 北京理工雷科电子信息技术有限公司 一种基于多端口abcd参数的系统特性分析方法
US11041894B2 (en) * 2017-08-18 2021-06-22 Rohde & Schwarz Gmbh & Co. Kg Vector network analyzer with digital interface
US11353536B2 (en) * 2018-09-29 2022-06-07 Keysight Technologies, Inc. Integrated vector network analyzer
CN111257814A (zh) * 2020-03-05 2020-06-09 西北工业大学 矢量网络分析仪的直通-短路-短路校准方法
US11428770B2 (en) * 2020-03-30 2022-08-30 Rohde & Schwarz Gmbh & Co. Kg Method of calibrating a setup
EP3951405B1 (de) * 2020-08-07 2024-07-31 Rohde & Schwarz GmbH & Co. KG Messsystem und messverfahren
CN112051534B (zh) * 2020-08-31 2023-08-25 中电科思仪科技股份有限公司 一种提高微波网络测量与校准精度的外置式装置及方法

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Also Published As

Publication number Publication date
EP1181562A2 (de) 2002-02-27
EP1181562B8 (de) 2007-06-27
CA2361666A1 (en) 2000-08-10
DE60034121T2 (de) 2007-11-08
WO2000046605A2 (en) 2000-08-10
EP1181562B1 (de) 2007-03-28
CA2361666C (en) 2005-11-01
US6300775B1 (en) 2001-10-09
WO2000046605A3 (en) 2001-11-29

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