DE2010745C3 - Method for producing a gallium arsenide single crystal with a pn junction - Google Patents
Method for producing a gallium arsenide single crystal with a pn junctionInfo
- Publication number
- DE2010745C3 DE2010745C3 DE19702010745 DE2010745A DE2010745C3 DE 2010745 C3 DE2010745 C3 DE 2010745C3 DE 19702010745 DE19702010745 DE 19702010745 DE 2010745 A DE2010745 A DE 2010745A DE 2010745 C3 DE2010745 C3 DE 2010745C3
- Authority
- DE
- Germany
- Prior art keywords
- zinc
- crystal
- gallium arsenide
- gallium
- cadmium
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000013078 crystal Substances 0.000 title claims description 19
- 229910001218 Gallium arsenide Inorganic materials 0.000 title claims 17
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 title claims 11
- 238000004519 manufacturing process Methods 0.000 title claims 7
- 239000011701 zinc Substances 0.000 claims description 14
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 claims description 13
- 229910052725 zinc Inorganic materials 0.000 claims description 13
- 238000000034 method Methods 0.000 claims description 11
- 229910052785 arsenic Inorganic materials 0.000 claims description 6
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 claims description 6
- 238000009792 diffusion process Methods 0.000 claims description 3
- 230000005855 radiation Effects 0.000 claims description 3
- FSIONULHYUVFFA-UHFFFAOYSA-N cadmium arsenide Chemical compound [Cd].[Cd]=[As].[Cd]=[As] FSIONULHYUVFFA-UHFFFAOYSA-N 0.000 claims description 2
- 239000000463 material Substances 0.000 claims description 2
- BDOSMKKIYDKNTQ-UHFFFAOYSA-N cadmium atom Chemical compound [Cd] BDOSMKKIYDKNTQ-UHFFFAOYSA-N 0.000 claims 8
- 229910052793 cadmium Inorganic materials 0.000 claims 5
- 229910052733 gallium Inorganic materials 0.000 claims 5
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 claims 4
- 239000003708 ampul Substances 0.000 claims 2
- 239000000155 melt Substances 0.000 claims 2
- 230000007704 transition Effects 0.000 claims 2
- RHKSESDHCKYTHI-UHFFFAOYSA-N 12006-40-5 Chemical compound [Zn].[As]=[Zn].[As]=[Zn] RHKSESDHCKYTHI-UHFFFAOYSA-N 0.000 claims 1
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 claims 1
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 claims 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims 1
- 238000000137 annealing Methods 0.000 claims 1
- 230000015572 biosynthetic process Effects 0.000 claims 1
- 238000000151 deposition Methods 0.000 claims 1
- NRUQNUIWEUZVLI-UHFFFAOYSA-O diethanolammonium nitrate Chemical compound [O-][N+]([O-])=O.OCC[NH2+]CCO NRUQNUIWEUZVLI-UHFFFAOYSA-O 0.000 claims 1
- 229910052732 germanium Inorganic materials 0.000 claims 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 claims 1
- 238000010438 heat treatment Methods 0.000 claims 1
- 238000004020 luminiscence type Methods 0.000 claims 1
- 108090000623 proteins and genes Proteins 0.000 claims 1
- 239000010453 quartz Substances 0.000 claims 1
- 239000012495 reaction gas Substances 0.000 claims 1
- 238000005215 recombination Methods 0.000 claims 1
- 230000006798 recombination Effects 0.000 claims 1
- 229910052711 selenium Inorganic materials 0.000 claims 1
- 239000011669 selenium Substances 0.000 claims 1
- 239000004065 semiconductor Substances 0.000 claims 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims 1
- 238000007711 solidification Methods 0.000 claims 1
- 230000008023 solidification Effects 0.000 claims 1
- 239000007858 starting material Substances 0.000 claims 1
- 239000011593 sulfur Substances 0.000 claims 1
- 229910052717 sulfur Inorganic materials 0.000 claims 1
- 229910052714 tellurium Inorganic materials 0.000 claims 1
- PORWMNRCUJJQNO-UHFFFAOYSA-N tellurium atom Chemical compound [Te] PORWMNRCUJJQNO-UHFFFAOYSA-N 0.000 claims 1
- 238000005496 tempering Methods 0.000 claims 1
- 239000012808 vapor phase Substances 0.000 claims 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B31/00—Diffusion or doping processes for single crystals or homogeneous polycrystalline material with defined structure; Apparatus therefor
- C30B31/06—Diffusion or doping processes for single crystals or homogeneous polycrystalline material with defined structure; Apparatus therefor by contacting with diffusion material in the gaseous state
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Led Devices (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Description
Menge an Zink- oder Cadmiumarsenid — vorzugsweise zusammen mit freiem Arsen etwa im Verhältnis 1:1 — von entsprechender Reinheit eingeschlossen und die Ampulle auf 850-9500C erhitzt wird. Die Diffusionsdauer beträgt etwa 4 Stunden. Der pn-übergang 3 liegt dann etwa 15-20 μπι tief. Die Dicke des Grundmaterials wird dann auf etwa 100 μιπ reduziertAmount of zinc or cadmium arsenide - preferably together with free arsenic approximately in the ratio 1: 1 - included of equivalent purity and the vial is heated to 850-950 0 C. The diffusion time is about 4 hours. The pn junction 3 is then about 15-20 μm deep. The thickness of the base material is then reduced to about 100 μm
Zur Fertigstellung der Diode wird dann sowohl die η-Zone la als auch die p-Zone 2 mit je einer Elektrode 4 bzw. 5 kontaktiert Da das zu erzeugende Licht zwar in der p-Zone 2 entsteht, den Kristall aber nur durch die n-Zonc la verläßt, ist es zweckmäßig, wenn die die η-Zone kristallisierende Elektrode 4 die Oberfläche der η-Zone möglichst frei IaEi oder in der bei Fotodioden bekannten Weise als strahlungsdurchlässige Metallschicht ausgebildet ist Die die p-Zone kontaktierende Elektrode 5 ist als Trägerelektrode ausgebildet Sie kann mit einem metallischen Gehäuseteil, z. B, einem Sockel, identisch sein. Das Gehäuse ist in bekannter Weise so ausgebildet daß zwar die Anordnung hermetisch abschließt aber die erzeugte Strahlung nach außen treten läßtTo complete the diode, both the η zone 1 a and the p zone 2 are then each provided with an electrode 4 or 5 contacted Since the light to be generated arises in p-zone 2, the crystal only through the Leaves n-zone la, it is useful if the η-zone crystallizing electrode 4 the surface of the η zone as free as possible IaEi or in the case of photodiodes known manner is formed as a radiation-permeable metal layer that makes contact with the p-zone Electrode 5 is designed as a carrier electrode. B, a base, be identical. The housing is designed in a known manner so that the arrangement is hermetically sealed completes but lets the generated radiation pass to the outside
Der Leistungsabfall, der mit den Lumineszenzdioden üblicher Herstellungsart verbunden ist läßt sich auf Grund des erfindungsgemäßen Verfahrens weitgehend vermeiden. Die für den Leistungsabfall auf die Hälfte des ursprünglichen Wertes erforderliche Betriebsdauer kann mindestens um den Faktor 3, z. B. von 3000 Betriebsstunden auf 10 000 Betriebsstunden gesteigert werden.The drop in performance that is associated with conventionally manufactured light-emitting diodes can be reduced to Avoid the reason for the method according to the invention to a large extent. The one for the drop in performance by half The required operating time of the original value can be increased by at least a factor of 3, e.g. B. from 3000 Operating hours can be increased to 10,000 operating hours.
Hierzu 1 Blatt Zeichnungen1 sheet of drawings
Claims (2)
den Schmelze bekannt (DE-OS 15 44 243), bei dem man In der DEAN S 39835 VIIIc/21g ist ein VerfahrenIt is also a method of growing a 30 continually changing. In addition, the zinc and cadmium atoms located on intermediate zinc-doped gallium arsenide monocrystals due to lattice spaces are contained in a gallium arsenide and zinc - the cause of a non-radiative recombination,
the melt known (DE-OS 15 44 243), in which DEAN S 39835 VIIIc / 21g is a process
nid epitaktisch aus einem geeigneten Reaktionsgas auf In der Zeitschrift »Electronics« (Nov. 13, 1967)For the production of n-gallium arsenide monocrystals DE-AS 12 61 831 is a method acm inward diffusion can furthermore either the crystal from a gallium 40 of zinc from the vapor phase in a semiconductor body arsenide melt using a gallium arsenide described, in the case of zinc arsenide, which thermally nide monocrystalline generated as a nucleus or the gallium arsenic is decomposed, serves as a source of zinc
nid epitaxially from a suitable reaction gas on In the journal "Electronics" (Nov. 13, 1967)
Lumineszenzdiode weiterverarbeitet Die Wellenlänge Im Folgenden wird ein die Erfindung erläuterndesBy diffusing in a corresponding amount of 3 x io t8 cm 3 is used, which is obviously due to the zinc and / or cadmium atoms, a pn junction can be generated in one of the presence of donor atoms, but not by like crystal. The 50 Ga voids are conditional. In this way, the effect that the crystal is then striving for on both sides of the pn junction of the invention is also provided with a barrier-free electrode in the known ones and is not so easily achieved with a diode
Further processing of the luminescent diode The wavelength The following is an explanation of the invention
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19702010745 DE2010745C3 (en) | 1970-03-06 | 1970-03-06 | Method for producing a gallium arsenide single crystal with a pn junction |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19702010745 DE2010745C3 (en) | 1970-03-06 | 1970-03-06 | Method for producing a gallium arsenide single crystal with a pn junction |
Publications (3)
Publication Number | Publication Date |
---|---|
DE2010745A1 DE2010745A1 (en) | 1971-09-16 |
DE2010745B2 DE2010745B2 (en) | 1977-11-03 |
DE2010745C3 true DE2010745C3 (en) | 1979-10-04 |
Family
ID=5764362
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19702010745 Expired DE2010745C3 (en) | 1970-03-06 | 1970-03-06 | Method for producing a gallium arsenide single crystal with a pn junction |
Country Status (1)
Country | Link |
---|---|
DE (1) | DE2010745C3 (en) |
-
1970
- 1970-03-06 DE DE19702010745 patent/DE2010745C3/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
DE2010745B2 (en) | 1977-11-03 |
DE2010745A1 (en) | 1971-09-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C3 | Grant after two publication steps (3rd publication) | ||
8339 | Ceased/non-payment of the annual fee |