DE102023106302B3 - Self-testable Hall sensor system that does not require a magnetic field in production testing - Google Patents

Abstract

The invention relates to a Hall sensor measuring system 100 with a Hall plate 110. A chopper device in the form of an analog switching mechanism 140 carries out the spinning during operation. For this purpose, the analog switching mechanism 140 firstly connects measuring current sources 153, 152 to a first pair of two connections of the Hall plate 110 depending on the spinning situation. Secondly, the analog switching mechanism 140 connects the input signals 122, 123 of a signal path with amplifier 120 and analog-to-digital converter 130 to a second pair of two connections of the Hall plate 110, which is different from the first pair, depending on the spinning situation. The special feature of the proposed solution is that the analog switching mechanism 140 can, thirdly, in test states of the Hall sensor measuring system 100, depending on the spinning situation, impress test currents Itstin on the connections of the said second pair using test current sources 151, 151 and can thus generate a test voltage Vistbetween these connections. This test voltage Vistcan emulate a Hall voltage between these connections. The Hall sensor measuring system 100 can in turn use this for a self-test during operation.

Description

Field of invention

The invention is directed to a Hall sensor measuring system 100 that can perform an associated method for checking an integrated Hall sensor measuring system 100 without using a magnetic field.

General introduction

The proposal presented here is a test aid for micro-integrated Hall sensor systems with Hall plates as sensor elements. Such Hall plates are used, for example, as sensor elements in micro-integrated control systems for motor controls. The Hall plate has the task of detecting the position of the magnetic field.

In the semiconductor production process, the test machines in the back end can typically only measure electrical properties. Handling systems that are able to generate defined magnetic fields do exist, but these are expensive to purchase and complex and expensive to maintain, calibrate and operate. For a functional measurement of a magnetic field sensor, such an expensive handling system with generation of a magnetic field including calibration effort, etc. would be necessary. In addition, the test time per micro-integrated Hall sensor system would increase significantly. The problem is the functional measurement of the Hall sensor element, the Hall plate.

From the US 2015 / 0 276 892 A1 A method for checking the operation of a Hall effect sensor without an applied magnetic field is known. The method of US 2015 / 0 276 892 A1 can It. the publication US 2015 / 0 276 892 A1 for example, applying a bias signal to a first pair of terminals of a Hall effect element and applying a Hall current signal to a second pair of terminals of the Hall effect element, measuring a Hall output voltage at the second pair of terminals and finally comparing the measured Hall output voltage with an expected Hall output voltage that would be generated by a corresponding applied magnetic field. In the case of asymmetries of the Hall plate, such as can occur due to mechanical stress or manufacturing defects, the method of US 2015 / 0 276 892 A1 However, these defects are not certain.

Task

The proposal is therefore based on the task of creating a solution which does not have the above-mentioned disadvantages of the prior art and has further advantages.

This problem is solved by the technical teaching of the independent claim. Further embodiments may be the subject of subclaims.

Solution to the task

The people who developed the proposal presented in this document realized during this development that it is advantageous not to measure the function of the Hall plate of the micro-integrated circuit in the production and self-test, but to check that it has been manufactured correctly. The core idea of the proposal presented here is not to convert the physical quantity "magnetic flux density B" in the test, but instead to determine the quality of the sensor element, i.e. the Hall plate. Since this test also generates signals at the signal inputs of the evaluation circuit within the micro-integrated circuit, the corresponding test circuit of the micro-integrated circuit can use this opportunity to simultaneously test the sensor signal processing device within the micro-integrated circuit that follows the Hall plate.

For this purpose, the test device of the micro-integrated circuit preferably operates the Hall plate in the normal way with one of the measuring current sources provided for the micro-integrated circuit. For this test, this measuring current source feeds the measuring current I _Hall into a first contact of the Hall plate of the micro-integrated circuit and takes this measuring current again from the third contact of the Hall plate, which is preferably opposite. If a magnetic flux density B were to act on the Hall plate, a Hall voltage V _Hall would build up in the Hall plate transverse to this current flow of the measuring current I _Hall . This Hall voltage During operation, the evaluation electronics of the sensor signal processing device measures the voltage V _Hall between a second contact of the Hall plate and a fourth contact of the Hall plate on the Hall plate. During one revolution around the Hall plate, the second contact of the Hall plate is preferably located between the first contact of the Hall plate and the third contact of the Hall plate and preferably opposite the fourth contact of the Hall plate. During the said revolution around the Hall plate, the fourth contact of the Hall plate is preferably located between the third contact of the Hall plate and the first contact of the Hall plate and preferably opposite the second contact of the Hall plate.

List of characters

• 1 shows a simplified schematic of a proposed device.
• The 2 shows the exemplary simplified procedure for measuring Hall plates 110 with more than four connections.
• The 3 shows a first refinement of the procedure of 2 supplemented by components 3070, 3080 and 3090, which enable testing of the recorded voltage values.
• The 4 shows a second refinement of the method of 3 supplemented by components 4110, 4130, 4140, 4150 and 4160, which enable a check of the homogeneity of the recorded voltage values.
• The 5 shows a first refinement of the procedure of 4 supplemented by components 5170 and 5180, which enable the impression of a test current I _tst to emulate a Hall voltage in the form of a test voltage V _tst and its detection.
• The 6 shows a first refinement of the procedure of 6 supplemented by components 6190 and 6200, which enable an evaluation of the recorded test voltage values.

Description of the characters

Figure 1

1 shows a simplified schematic of a proposed device.

The Hall plate control device in the form of an analog switching mechanism 140 of the Hall sensor measuring system 100 preferably permutes the use of the connections of the Hall plate 110 by means of spinning during operation of the Hall sensor measuring system 100. This permuting (chopping) of the spinning is then neutralized again in the subsequent evaluation electronics by back-permuting (back-chopping), so that these spinning-chopper methods reduce systematic errors of the Hall plate.

CHOPPER PRINCIPLE

The term “chopping” in this document refers to switching back and forth between two connection configurations. More details can be found at Wikipedia, for example, at https://de.wikipedia.org/wiki/Chopper-Verst%C3%A4rker . The application of the chopper principle for noise suppression in amplifiers is described there. When evaluating Hall plates 110, however, not only two connections should be swapped with each other, but four connections. This results in more complex swapping schemes.

A good introduction is provided by the document Lim, SM., Park, JS. A low noise offset cancellation method for improving sensitivity of CMOS Hall sensors. J. Electr. Eng. Technol. 14, 377-383 (2019). https://doi.org/10.1007/s42835-018-00031-7 and the document C. Ouffoue, L. Hebrard, V. Frick and C. Kern, “Chopper stabilized integrated Hall effect magnetometer,” 2009 International Conference on Microelectronics - ICM, Marrakech, Morocco, 2009, pp. 54-57, doi: 10.1109/ICM.2009.5418590 .

1. I. Physikalisches Grundprinzip Hall:
   • Das physikalische Grundprinzip umfasst eine Bestromung der Hall-Platte 110 mittels einer Messstromquelle 153, 154 mit einem elektrischen Hall-Messstrom I_Hall,. Der elektrischen Hall-Messstrom I_Hall, durchströmt die Hall-Platte 110 in Folge der Bestromung. Der elektrischen Hall-Messstrom I_Hall, weist eine Bestromungsrichtung dieses elektrischen Hall-Messstromes I_Hall aufweist. Diese Bestromung erfolgt über einen ersten Anschluss der Hall-Platte 110 und einen dritten Anschluss der Hall-Platte 110. Der erste Anschluss und der dritte Anschluss definieren dabei die Bestromungsrichtung mit dem Messstrom I_Hall. Das physikalische Grundprinzip umfasst das Messen der Hallspannung V_Hall mittels eines zweiten Anschlusses und eines vierten Anschlusses der Hall-Platte 110. Dabei definieren der zweite Anschluss und der vierte Anschluss eine Spannungsmessrichtung in Bezug auf die Hall-Platte 110. Bevorzugt ist die Spannungsmessrichtung um einen 90°-Winkel zur Bestromungsrichtung verdreht. Dieses Messprinzip benötigt somit zumindest 4 verschiedene und bevorzugt orthogonal zueinander angeordnete Hall-Platten-Anschlüsse der Hall-Platte 110. Bevorzugt legen der erste Anschluss der Hall-Platte 110 und der dritte Anschluss der Hall-Platte 110 eine erste Gerade fest, deren Richtung der vorgenannten Bestromungsrichtung im Wesentlichen typischerweise bei einer homogenen Hall-Platte 110 entspricht. Bevorzugt legen der zweite Anschluss der Hall-Platte 110 und der vierte Anschluss der Hallplatte 110 eine zweite Gerade fest, deren Richtung der vorgenannten Spannungsmessrichtung im Wesentlichen typischerweise bei einer homogenen Hall-Platte 110 entspricht. Bevorzugt stehen also die erste Gerade und die zweite Gerade senkrecht aufeinander.
2. II. Drehung der Bestromungsrichtung und der Spannungsmessrichtung durch Vertauschen der vier Verbindungen der Auswertevorrichtung mit den vier Anschlüssen der Hall-Platte 110 beispielsweise mittels eines analogen Schaltwerks 140. Dabei kann ein erstes Vertauschungsprinzip des analogen Schaltwerks 140 2 Phasen nutzen und die Bestromungsrichtung und der Spannungsmessrichtung synchron um 0° und/oder 90° drehen. Bevorzugt steuert eine Steuervorrichtung 124 die Vertauschung durch das analoge Schaltwerk 140. Ein zweites Vertauschungsprinzip des analogen Schaltwerks 140 kann 4 Phasen nutzen und die Bestromungsrichtung und der Spannungsmessrichtung synchron 0° und/oder 90° und/oder 180° und/oder 270° drehen. Die Rotation um kleinere Winkel erfordert typischerweise mehr Hall-Platten-Anschlüsse der Hall-Platte 110. Dies ermöglicht die Eliminierung von Effekten zweiter Ordnung. Dieses Choppern der Anschlusskonfigurationen der Anschlüsse der Hall-Platte 110 ermöglicht die Eliminierung von parasitischen Effekten der Hall-Platte 110.
3. III. Umpolung des Verstärkereingangs des Verstärkers 120 der Auswertevorrichtung des mikrointegrierten Schaltkreises IC des Hall-Sensor-Systems 100 zusätzlich bei jedem Chopper-Takt der Hall-Platte 100, unabhängig von I und II. Hierdurch eliminiert des vorschlagsgemäßen mikrointegrierten Schaltkreises IC des Hall-Sensor-Messsystems 100 parasitische Asymmetrien des Verstärkereingangs der Auswertevorrichtung der mikrointegrierten Schaltung.

The chopper principle is based on the following mechanisms:

1. I. Basic physical principle Hall:
   • The basic physical principle involves supplying the Hall plate 110 with an electrical Hall measuring current I _Hall by means of a measuring current source 153, 154. The electrical Hall measuring current I _Hall flows through the Hall plate 110 as a result of the current supply. The electrical Hall measuring current I _Hall has a current supply direction of this electrical Hall measuring current I _Hall . This current supply takes place via a first connection of the Hall plate 110 and a third connection of the Hall plate 110. The first connection and the third connection define the direction of current flow with the measuring current I _Hall . The basic physical principle includes measuring the Hall voltage V _Hall by means of a second connection and a fourth connection of the Hall plate 110. The second connection and the fourth connection define a voltage measuring direction in relation to the Hall plate 110. The voltage measuring direction is preferably rotated by a 90° angle to the direction of current flow. This measuring principle therefore requires at least 4 different and preferably orthogonal Hall plate connections of the Hall plate 110. The first connection of the Hall plate 110 and the third connection of the Hall plate 110 preferably define a first straight line, the direction of which essentially corresponds to the aforementioned direction of current flow, typically in the case of a homogeneous Hall plate 110. Preferably, the second connection of the Hall plate 110 and the fourth connection of the Hall plate 110 define a second straight line, the direction of which essentially corresponds to the aforementioned voltage measurement direction, typically in a homogeneous Hall plate 110. Preferably, the first straight line and the second straight line are therefore perpendicular to one another.
2. II. Rotation of the current supply direction and the voltage measurement direction by swapping the four connections of the evaluation device with the four connections of the Hall plate 110, for example by means of an analog switching mechanism 140. A first swapping principle of the analog switching mechanism 140 can use 2 phases and rotate the current supply direction and the voltage measurement direction synchronously by 0° and/or 90°. A control device 124 preferably controls the swapping by the analog switching mechanism 140. A second swapping principle of the analog switching mechanism 140 can use 4 phases and rotate the current supply direction and the voltage measurement direction synchronously by 0° and/or 90° and/or 180° and/or 270°. Rotation by smaller angles typically requires more Hall plate connections of the Hall plate 110. This enables the elimination of second-order effects. This chopping of the connection configurations of the terminals of the Hall plate 110 enables the elimination of parasitic effects of the Hall plate 110.
3. III. Reversal of the polarity of the amplifier input of the amplifier 120 of the evaluation device of the micro-integrated circuit IC of the Hall sensor system 100 additionally at each chopper cycle of the Hall plate 100, independently of I and II. In this way, the proposed micro-integrated circuit IC of the Hall sensor measuring system 100 eliminates parasitic asymmetries of the amplifier input of the evaluation device of the micro-integrated circuit.

Preferably, the micro-integrated circuit IC of the Hall sensor measuring system 100 thus determines at least 2, preferably 4, particularly preferably 8 measured values for the Hall voltage V _Hall per measurement. Preferably, the micro-integrated circuit IC of the Hall sensor measuring system 100 determines an average of these measured values as the measured value of the Hall voltage V _Hall .

This has the advantage that errors with a preferred direction are averaged out.

TEST POWER SOURCE

It is now essential to the invention that an additional test current source 151, 152 of the control device of the micro-integrated circuit IC of the Hall sensor measuring system 100 emulates the generation of the Hall voltage V _Hall in the Hall plate 110 during a test. This can be a production test, an analysis test, a stress test or a self-test of the micro-integrated circuit IC of the Hall sensor measuring system 100 or another test. The test current source 151, 152 can be both a test current source of the test device of the micro-integrated circuit IC of the Hall sensor measuring system 100 and a test current source of a production test system outside the Hall sensor measuring system 100. The micro-integrated circuit IC of the Hall sensor measuring system 100 preferably comprises one or more such test current sources 151, 152.

The test current source 151, 152 of the micro-integrated circuit IC of the Hall sensor measuring system 100 typically supplies a test current I _tst . The test current source 151, 152 preferably comprises a first test current source 151 and a second test current source 152. The first test current source 151 preferably feeds an additional test current I _tst into the free second connection of the Hall plate 110 via an analog switching mechanism 140 of the micro-integrated circuit IC of the Hall sensor measuring system 100. The second test current source 152 draws the test current I _tst from one of the other three contacts. The second test current source 152 preferably draws the test current I _tst from the fourth, opposite contact. At the same time, the micro-integrated circuit IC of the Hall sensor measuring system 100 feeds the measuring current I _Hall into the first terminal of the Hall plate 110 by means of a first measuring current source 153 and a second measuring current source 154. The test current source 154 takes the Hall measuring current I _Hall from the third connection of the Hall plate 110. Preferably, the first measuring current source 153 and the second measuring current source 154 form a common measuring current source 153, 154. The test current I _tst builds up a test voltage V _tst between the second connection of the Hall plate 110 and the fourth connection of the Hall plate 110. This test voltage V _tst is also referred to in this text below as the emulated Hall voltage V _tst .

This has the advantage that the generation of a test voltage V _tst enables the Hall plate 110 to be tested for correct implementation of the Hall plate 110 and, if necessary, makes a functional test by flooding the Hall plate 110 with a magnetic field with a precisely predetermined value of the magnetic flux density B using a suitable, fast and calibrated test device superfluous. The costs for the test device for generating the test magnetic field are eliminated. The functional test of the micro-integrated circuit IC, which typically includes the Hall plate 110, is significantly reduced.

HALL FUNCTIONALITY TESTING BY EQUIVALENCE TESTING

The evaluation circuit (120, 130) of the micro-integrated circuit IC of the Hall sensor measuring system 100 cannot distinguish between the emulated Hall voltage V _tst and a real Hall voltage V _Hall . Therefore, the emulated Hall voltage V _tst is suitable for checking the subsequent evaluation circuit of the micro-integrated circuit IC of the Hall sensor measuring system 100.

If the Hall plate 110 is faulty, the measured values of the emulated Hall voltage V _tst deviate from the expected measured values of the emulated Hall voltage V _tst .

Firstly, an evaluation of the absolute measured values of the emulated Hall voltage V _tst is possible. If the voltage values of the emulated Hall voltage V _tst are too high or too low, then the doping or the doping profile of the Hall plate is typically faulty.

By means of spinning, a test system that stimulates and observes the micro-integrated circuit IC of the Hall sensor measuring system 100 in a production test can also discover inhomogeneities in the Hall plate 110. Such inhomogeneities in the Hall plate 110 can arise, for example, from paint splashes etc. in the semiconductor production of the micro-integrated circuit IC of the Hall sensor measuring system 100 with the Hall plate 110.

For this purpose, it is useful to also check arrangements of connections of the Hall plate 110 in which, in contrast to the basic method described above, connections of the Hall plate 110 are not arranged opposite each other, but for example next to each other and/or lie next to each other.

This has the advantage that the equivalence test by generating a test voltage V _tst using a test current I _tst enables the Hall plate 110 to be tested for correct implementation and, if necessary, makes a functional test by passing a magnetic field with a precisely predetermined value of the magnetic flux density B through the Hall plate 110 using a suitable, fast and calibrated test device superfluous. The costs for the test device for generating the test magnetic field are eliminated. The functional test of the micro-integrated circuit IC, which typically includes the Hall plate 110, is significantly reduced.

HOMOGENEITY TEST

• • an dem ein Testsystem zur Prüfung des mikrointegrierten Schaltkreises IC des Hall-Sensor-Messsystems 100 mittels der Teststromquelle 151, 152 oder
• • an dem eine Teststromquelle 151, 152 des mikrointegrierten Schaltkreises IC des Hall-Sensor-Messsystems 100

den Teststrom I_tst einspeisen, ermitteln die von dem Testsystem durchgeführte oder dem mikrointegrierten Schaltkreis IC des Hall-Sensor-Messsystems 100 durchgeführten Tests des mikrointegrierten Schaltkreises IC des Hall-Sensor-Messsystems 100 beispielsweise vier emulierte Hall-Spannungen V_tst1, V_tst2, V_tst3 und V_tst4.Furthermore, it is useful not only to check the absolute values of the emulated Hall voltages V _tst , but also to check their relative values against each other. Depending on the connection of the Hall plate 110,

• • on which a test system for testing the micro-integrated circuit IC of the Hall sensor measuring system 100 by means of the test current source 151, 152 or
• • to which a test current source 151, 152 of the micro-integrated circuit IC of the Hall sensor measuring system 100

the test current I _tst , the tests of the micro-integrated circuit IC of the Hall sensor measuring system 100 carried out by the test system or the micro-integrated circuit IC of the Hall sensor measuring system 100 determine, for example, four emulated Hall voltages V _tst1 , V _tst2 , V _tst3 and V _tst4 .

If necessary, the test system and/or the micro-integrated circuit IC of the Hall sensor measuring system 100 can also carry out these measurements with different measuring current directions of the Hall measuring current I _Hall . The test system and/or the micro-integrated circuit IC of the Hall sensor measuring system 100 can also take the test current I _tst from the three different connections of the Hall plate, which are not identical to the connection for supplying the test current I _tst . This results in 24 possible combinations. This then results in 24 possible voltage values V _tst1 to V _tst24 of the emulated Hall voltage V _tst .

$${\text{V}}_{\text{tstmin}}=\text{Minimum}\left(\left\{{\text{V}}_{\text{tst1}}{\text{ bis V}}_{\text{tst24}}\right\}\right)$$

$${\text{V}}_{\text{tstflb}}={\text{V}}_{\text{tstmax}}-{\text{V}}_{\text{tstmin}}.$$

The micro-integrated circuit IC of the Hall sensor measuring system 100 and/or the test system that tests the micro-integrated circuit IC of the Hall sensor measuring system 100, for example in a production test, can then select the smallest emulated Hall voltage value V _tstmin and the largest Hall voltage value V _tstmax from these 24 emulated Hall voltage values V _tst1 to V _tst24 . The micro-integrated circuit IC of the Hall sensor measuring system 100 and/or the test system can use this to calculate a fluctuation width V _tstflb of the emulated Hall voltage V _tst by forming the difference between the magnitude of the largest emulated Hall voltage value V _tstmax minus the magnitude of the smallest Hall voltage value V _tstmin . Expressed as formulas: $${\text{V}}_{\text{tstmax}}=\text{maximum}\left(\left\{{\text{V}}_{\text{tst1}}{\text{to V}}_{\text{tst24}}\right\}\right)$$

$${\text{V}}_{\text{tstmin}}=\text{minimum}\left(\left\{{\text{V}}_{\text{tst1}}{\text{to V}}_{\text{tst24}}\right\}\right)$$

$${\text{V}}_{\text{tstflb}}={\text{V}}_{\text{tstmax}}-{\text{V}}_{\text{tstmin}}.$$

If the amount |V _tstflb | of this fluctuation width V _tstflb exceeds a maximum permissible fluctuation width V _tstflbmax , the micro-integrated circuit IC of the Hall sensor measuring system 100 is typically faulty. If the test system determines during a production test that the micro-integrated circuit IC of the Hall sensor measuring system 100 is faulty and/or suspected of being faulty, the test system typically rejects the relevant micro-integrated circuit IC of the Hall sensor measuring system 100.

This has the advantage that the generation of several test voltages V _tst enables the Hall plate 110 to be tested for correct and homogeneous implementation of the Hall plate 110 and, if necessary, makes a functional test by passing through the Hall plate 110 with a magnetic field with a precisely predetermined value of the magnetic flux density B using a suitable, fast and calibrated test device superfluous. The costs for the test device for generating the test magnetic field are eliminated. The functional test of the micro-integrated circuit IC, which typically includes the Hall plate 110, is significantly reduced. This measurement method also reveals any hidden errors in the Hall plate 110.

The invention is thus based on the idea of electrical equivalent stimulation of the subsequent processing chain in the micro-integrated circuit IC to be tested during the test.

PROCEDURE PRINCIPLE

The document presented here therefore proposes a method for testing an integrated Hall sensor measuring system 100 of a micro-integrated circuit IC. The proposed circuit IC typically comprises a Hall plate 110. The proposed micro-integrated circuit IC typically comprises an evaluation device. The proposed micro-integrated circuit IC typically comprises an amplifier 120, which is preferably part of the evaluation device of the micro-integrated circuit IC. The Hall plate 110 preferably has at least four connections (111, 112, 113, 114). The amplifier 120 preferably has a differential input 121 for the Hall voltage V _Hall between two connections of the at least four connections (111, 112, 113, 114) of the Hall plate 110. Preferably, the amplifier 120 has a first positive input 122 as the first terminal of the differential input 121 of the amplifier 120. Preferably, the amplifier 120 has a second negative input 123 as the second terminal of the differential input 121 of the amplifier 120.

Typically, the micro-integrated circuit IC comprises an analog switching mechanism 140. Preferably, the analog switching mechanism 140 is an analog switching mechanism with at least four inputs. The analog switching mechanism 140 preferably has a first connection 141, which is preferably electrically connected to the first connection 111 of the Hall plate 110. The analog switching mechanism 140 preferably has a second connection 142, which is preferably electrically connected to the second connection 112 of the Hall plate 110. The analog switching mechanism 140 preferably has a third connection 143, which is preferably electrically connected to the third th terminal 112 of the Hall plate 110. The analog switching mechanism 140 preferably has a fourth terminal 144 which is preferably electrically connected to the fourth terminal 114 of the Hall plate 110.

Preferably, a first test current source 151 is electrically connected to a test current input 145 of the analog switching device 140, so that the first test current source 151 can feed a test current I _tst into the test current input 145 of the analog switching device 140. Preferably, a control device 124 of the micro-integrated circuit IC controls the first test current source 151 via an internal data bus 128 or by means of suitable control signals.

Preferably, a first measuring current source 153 is electrically connected to a measuring current input 146 of the analog switching mechanism 140, so that the first measuring current source 153 can feed a measuring current I _Hall into the measuring current input 146 of the analog switching mechanism 140. Preferably, a control device 124 of the micro-integrated circuit IC controls the first measuring current source 153 via an internal data bus 128 or by means of suitable control signals.

Preferably, a second test current source 152 is electrically connected to a test current output 149 of the analog switching device 140, so that the second test current source 152 can take the test current I _tst from the test current output 149 of the analog switching device 140. Preferably, a control device 124 of the micro-integrated circuit IC controls the second test current source 152 via an internal data bus 128 or by means of suitable control signals.

Preferably, a second measuring current source 154 is electrically connected to a measuring current output 150 of the analog switching mechanism 140, so that the second measuring current source 154 can take the measuring current I _Hall from the measuring current output 150 of the analog switching mechanism 140. Preferably, a control device 124 of the micro-integrated circuit IC controls the second measuring current source 154 via an internal data bus 128 or by means of suitable control signals.

The method presented here preferably comprises, as a first step, that the control device 124 selects a first terminal of the Hall plate 110 from the four terminals (111, 112, 113, 114) of the Hall plate 110 by means of an analog switching mechanism 140.

Preferably, in a second step, the control device 124 uses the analog switching mechanism 140 to select a third connection of the Hall plate 110 from the four connections (111, 112, 113, 114) of the Hall plate 110, which is different from the first connection of the Hall plate 110. Preferably, the third connection of the Hall plate 110 is opposite the first connection of the Hall plate 110.

Preferably, the analog switching mechanism 140 electrically connects the first terminal of the Hall plate 110 to the first measuring current source 153.

Preferably, the analog switching mechanism 140 electrically connects the third terminal of the Hall plate 110 to the second measuring current source 154.

• • das Einspeisen eines elektrischen Messstromes I_Hall mit einem zumindest zeitweise konstanten Stromwert des Messstroms I_Hall in den ersten Anschluss dieser vier Anschlüsse (111, 112, 113, 114) der Hall-Platte 110 und
• • das Entnehmen dieses Messstromes I_Hall mit diesem Stromwert des Messstroms I_Hall aus dem dritten Anschluss dieser vier Anschlüsse (111, 112, 113, 114) der Hall-Platte 110.

In a third step, the control device 124 causes the first measuring current source 153 to feed the measuring current I _Hall into the first connection of the Hall plate 110 and the second measuring current source 154 to take the measuring current I _Hall from the third connection of the Hall plate 110. This step thus comprises

• • feeding an electrical measuring current I _Hall with an at least temporarily constant current value of the measuring current I _Hall into the first terminal of these four terminals (111, 112, 113, 114) of the Hall plate 110 and
• • taking this measuring current I _Hall with this current value of the measuring current I _Hall from the third terminal of these four terminals (111, 112, 113, 114) of the Hall plate 110.

The analog switching mechanism 140 can preferably assume different operating states depending on the control signal 125 of the control device 124, with which the control device 124 controls the analog switching mechanism 140.

The method described above enables the use of the above-described advantages of testing the Hall plate 110 by generating a test voltage V _tst for correct and, if necessary, homogeneous realization the Hall plate 110 and, if necessary, a functional test by passing a magnetic field with a precisely predetermined value of the magnetic flux density B through the Hall plate 110 using a suitable, fast and calibrated test device is superfluous. The costs for the test device for generating the test magnetic field are eliminated. The functional test of the micro-integrated circuit IC, which typically includes the Hall plate 110, is significantly reduced.

OPERATING CONDITIONS

Normal operating conditions not chopped

1. a. den ersten Anschluss 111 der beispielhaften Hall-Platte 110 über den ersten Eingang 141 des analogen Schaltwerks 140 und über den Messstromeingang 146 des analoges Schaltwerks 140 für die Einspeisung des Messstroms I_Hall durch die erste Messstromquelle 153 mit der ersten Messstromquelle 153 und
2. b. den zweiten Anschluss 112 der beispielhaften Hall-Platte 110 über den zweiten Eingang 142 des analogen Schaltwerks 140 und über den ersten Ausgangsanschluss 147 des analoges Schaltwerks 140 mit dem Anschluss des ersten positiven Eingangs 122 des Verstärkers 120 und
3. c. den dritten Anschluss 113 der beispielhaften Hall-Platte 110 über den dritten Eingang 143 des analogen Schaltwerks 140 und über den Messstromausgang 150 des analoges Schaltwerks 140 für die Entnahme des Messstroms I_Hall durch die zweite Messstromquelle 154 mit der zweiten Messstromquelle 154 und
4. d. den vierten Anschluss 114 der beispielhaften Hall-Platte 110 über den vierten Eingang 144 des analogen Schaltwerks 140 und über den zweiten Ausgangsanschluss 148 des analoges Schaltwerks 140 mit dem Anschluss des zweiten negativen Eingangs 123 des Verstärkers 120.

In a first operating state, the analog switching mechanism connects 140

1. a. the first connection 111 of the exemplary Hall plate 110 via the first input 141 of the analogue switching device 140 and via the measuring current input 146 of the analogue switching device 140 for the supply of the measuring current I _Hall through the first measuring current source 153 with the first measuring current source 153 and
2. b. the second terminal 112 of the exemplary Hall plate 110 via the second input 142 of the analog circuit 140 and via the first output terminal 147 of the analog circuit 140 to the terminal of the first positive input 122 of the amplifier 120 and
3. c. the third connection 113 of the exemplary Hall plate 110 via the third input 143 of the analogue switching device 140 and via the measuring current output 150 of the analogue switching device 140 for the extraction of the measuring current I _Hall by the second measuring current source 154 with the second measuring current source 154 and
4. d. the fourth terminal 114 of the exemplary Hall plate 110 via the fourth input 144 of the analog circuit 140 and via the second output terminal 148 of the analog circuit 140 to the terminal of the second negative input 123 of the amplifier 120.

1. a. den zweiten Anschluss 112 der beispielhaften Hall-Platte 110 über den zweiten Eingang 142 des analogen Schaltwerks 140 und über den Messstromeingang 146 des analoges Schaltwerks 140 für die Einspeisung des Messstroms I_Hall durch die erste Messstromquelle 153 mit der ersten Messstromquelle 153 und
2. b. den dritten Anschluss 113 der beispielhaften Hall-Platte 110 über den dritten Eingang 143 des analogen Schaltwerks 140 und über den ersten Ausgangsanschluss 147 des analoges Schaltwerks 140 mit dem Anschluss des ersten positiven Eingangs 122 des Verstärkers 120 und
3. c. den vierten Anschluss 114 der beispielhaften Hall-Platte 110 über den vierten Eingang 144 des analogen Schaltwerks 140 und über den Messstromausgang 150 des analoges Schaltwerks 140 für die Entnahme des Messstroms I_Hall durch die zweite Messstromquelle 154 mit der zweiten Messstromquelle 154 und
4. d. den ersten Anschluss 111 der beispielhaften Hall-Platte 110 über den ersten Eingang 141 des analogen Schaltwerks 140 und über den zweiten Ausgangsanschluss 148 des analoges Schaltwerks 140 mit dem Anschluss des zweiten negativen Eingangs 123 des Verstärkers 120.

In a second operating state, the analog switching mechanism 140

1. a. the second connection 112 of the exemplary Hall plate 110 via the second input 142 of the analog switching device 140 and via the measuring current input 146 of the analog switching device 140 for the supply of the measuring current I _Hall through the first measuring current source 153 to the first measuring current source 153 and
2. b. the third terminal 113 of the exemplary Hall plate 110 via the third input 143 of the analog circuit 140 and via the first output terminal 147 of the analog circuit 140 to the terminal of the first positive input 122 of the amplifier 120 and
3. c. the fourth connection 114 of the exemplary Hall plate 110 via the fourth input 144 of the analogue switching device 140 and via the measuring current output 150 of the analogue switching device 140 for the extraction of the measuring current I _Hall by the second measuring current source 154 with the second measuring current source 154 and
4. d. the first terminal 111 of the exemplary Hall plate 110 via the first input 141 of the analog circuit 140 and via the second output terminal 148 of the analog circuit 140 to the terminal of the second negative input 123 of the amplifier 120.

1. a. den dritten Anschluss 113 der beispielhaften Hall-Platte 110 über den dritten Eingang 143 des analogen Schaltwerks 140 und über den Messstromeingang 146 des analoges Schaltwerks 140 für die Einspeisung des Messstroms I_Hall durch die erste Messstromquelle 153 mit der ersten Messstromquelle 153 und
2. b. den vierten Anschluss 114 der beispielhaften Hall-Platte 110 über den vierten Eingang 144 des analogen Schaltwerks 140 und über den ersten Ausgangsanschluss 147 des analoges Schaltwerks 140 mit dem Anschluss des ersten positiven Eingangs 122 des Verstärkers 120 und
3. c. den ersten Anschluss 111 der beispielhaften Hall-Platte 110 über den ersten Eingang 141 des analogen Schaltwerks 140 und über den Messstromausgang 150 des analoges Schaltwerks 140 für die Entnahme des Messstroms I_Hall durch die zweite Messstromquelle 154 mit der zweiten Messstromquelle 154 und
4. d. den zweiten Anschluss 112 der beispielhaften Hall-Platte 110 über den ersten Eingang 142 des analogen Schaltwerks 140 und über den zweiten Ausgangsanschluss 148 des analoges Schaltwerks 140 mit dem Anschluss des zweiten negativen Eingangs 123 des Verstärkers 120.

In a third operating state, the analogue switching mechanism connects 140

1. a. the third connection 113 of the exemplary Hall plate 110 via the third input 143 of the analogue switching device 140 and via the measuring current input 146 of the analogue switching device 140 for the supply of the measuring current I _Hall through the first measuring current source 153 with the first measuring current source 153 and
2. b. the fourth terminal 114 of the exemplary Hall plate 110 via the fourth input 144 of the analog circuit 140 and via the first output terminal 147 of the analog circuit 140 to the terminal of the first positive input 122 of the amplifier 120 and
3. c. the first connection 111 of the exemplary Hall plate 110 via the first input 141 of the analogue switching device 140 and via the measuring current output 150 of the analogue switching device 140 for the extraction of the measuring current I _Hall by the second measuring current source 154 with the second measuring current source 154 and
4. d. the second terminal 112 of the exemplary Hall plate 110 via the first input 142 of the analog circuit 140 and via the second output terminal 148 of the analog circuit 140 to the terminal of the second negative input 123 of the amplifier 120.

1. a. den vierten Anschluss 114 der beispielhaften Hall-Platte 110 über den vierten Eingang 144 des analogen Schaltwerks 140 und über den Messstromeingang 146 des analoges Schaltwerks 140 für die Einspeisung des Messstroms I_Hall durch die erste Messstromquelle 153 mit der ersten Messstromquelle 153 und
2. b. den ersten Anschluss 111 der beispielhaften Hall-Platte 110 über den ersten Eingang 141 des analogen Schaltwerks 140 und über den ersten Ausgangsanschluss 147 des analoges Schaltwerks 140 mit dem Anschluss des ersten positiven Eingangs 122 des Verstärkers 120 und
3. c. den zweiten Anschluss 112 der beispielhaften Hall-Platte 110 über den zweiten Eingang 142 des analogen Schaltwerks 140 und über den Messstromausgang 150 des analoges Schaltwerks 140 für die Entnahme des Messstroms I_Hall durch die zweite Messstromquelle 154 mit der zweiten Messstromquelle 154 und
4. d. den dritten Anschluss 113 der beispielhaften Hall-Platte 110 über den dritten Eingang 143 des analogen Schaltwerks 140 und über den zweiten Ausgangsanschluss 148 des analoges Schaltwerks 140 mit dem Anschluss des zweiten negativen Eingangs 123 des Verstärkers 120.

In a fourth operating state, the analogue switching mechanism connects 140

1. a. the fourth connection 114 of the exemplary Hall plate 110 via the fourth input 144 of the analogue switching device 140 and via the measuring current input 146 of the analogue switching device 140 for the supply of the measuring current I _Hall through the first measuring current source 153 with the first measuring current source 153 and
2. b. the first terminal 111 of the exemplary Hall plate 110 via the first input 141 of the analog circuit 140 and via the first output terminal 147 of the analog circuit 140 to the terminal of the first positive input 122 of the amplifier 120 and
3. c. the second connection 112 of the exemplary Hall plate 110 via the second input 142 of the analogue switching device 140 and via the measuring current output 150 of the analogue switching device 140 for the extraction of the measuring current I _Hall by the second measuring current source 154 with the second measuring current source 154 and
4. d. the third terminal 113 of the exemplary Hall plate 110 via the third input 143 of the analog circuit 140 and via the second output terminal 148 of the analog circuit 140 to the terminal of the second negative input 123 of the amplifier 120.

First test operating conditions not chopped

• e. den ersten Anschluss 111 der beispielhaften Hall-Platte 110 über den ersten Eingang 141 des analogen Schaltwerks 140 und über den ersten Ausgangsanschluss 147 des analoges Schaltwerks 140 mit dem Anschluss des ersten positiven Eingangs 122 des Verstärkers 120 und über den Messstromeingang 146 des analoges Schaltwerks 140 für die Einspeisung des Messstroms I_Hall durch die erste Messstromquelle 153 mit der ersten Messstromquelle 153 und
• f. den dritten Anschluss 113 der beispielhaften Hall-Platte 110 über den dritten Eingang 143 des analogen Schaltwerks 140 und über den zweiten Ausgangsanschluss 148 des analoges Schaltwerks 140 mit dem Anschluss des zweiten negativen Eingangs 123 des Verstärkers 120 und über den Messstromausgang 150 des analoges Schaltwerks 140 für die Entnahme des Messstroms I_Hall durch die zweite Messstromquelle 154 mit der zweiten Messstromquelle 154.

In a fifth operating state, the analogue switching mechanism connects 140

• e. the first connection 111 of the exemplary Hall plate 110 via the first input 141 of the analogue circuit 140 and via the first output connection 147 of the analogue circuit 140 with the connection of the first positive input 122 of the amplifier 120 and via the measuring current input 146 of the analogue circuit 140 for the supply of the measuring current I _Hall through the first measuring current source 153 with the first measuring current source 153 and
• f. the third connection 113 of the exemplary Hall plate 110 via the third input 143 of the analog circuit 140 and via the second output connection 148 of the analog circuit 140 to the connection of the second negative input 123 of the amplifier 120 and via the measuring current output 150 of the analog circuit 140 for the extraction of the measuring current I _Hall by the second measuring current source 154 to the second measuring current source 154.

1. a. den zweiten Anschluss 112 der beispielhaften Hall-Platte 110 über den zweiten Eingang 142 des analogen Schaltwerks 140 und über den ersten Ausgangsanschluss 147 des analoges Schaltwerks 140 mit dem Anschluss des ersten positiven Eingangs 122 des Verstärkers 120 und über den Messstromeingang 146 des analoges Schaltwerks 140 für die Einspeisung des Messstroms I_Hall durch die erste Messstromquelle 153 mit der ersten Messstromquelle 153 und
2. b. den vierten Anschluss 114 der beispielhaften Hall-Platte 110 über den vierten Eingang 144 des analogen Schaltwerks 140 und über den zweiten Ausgangsanschluss 148 des analoges Schaltwerks 140 mit dem Anschluss des zweiten negativen Eingangs 123 des Verstärkers 120 und über den Messstromausgang 150 des analoges Schaltwerks 140 für die Entnahme des Messstroms I_Hall durch die zweite Messstromquelle 154 mit der zweiten Messstromquelle 154.

In a sixth operating state, the analogue switching mechanism connects 140

1. a. the second connection 112 of the exemplary Hall plate 110 via the second input 142 of the analogue circuit 140 and via the first output connection 147 of the analogue circuit 140 with the connection of the first positive input 122 of the amplifier 120 and via the measuring current input 146 of the analogue circuit 140 for the supply of the measuring current I _Hall through the first measuring current source 153 with the first measuring current source 153 and
2. b. the fourth connection 114 of the exemplary Hall plate 110 via the fourth input 144 of the analog circuit 140 and via the second output connection 148 of the analog circuit 140 to the connection of the second negative input 123 of the amplifier 120 and via the measuring current output 150 of the analog circuit 140 for the extraction of the measuring current I _Hall by the second measuring current source 154 to the second measuring current source 154.

1. a. den dritten Anschluss 113 der beispielhaften Hall-Platte 110 über den dritten Eingang 143 des analogen Schaltwerks 140 und über den ersten Ausgangsanschluss 147 des analoges Schaltwerks 140 mit dem Anschluss des ersten positiven Eingangs 122 des Verstärkers 120 und über den Messstromeingang 146 des analoges Schaltwerks 140 für die Einspeisung des Messstroms I_Hall durch die erste Messstromquelle 153 mit der ersten Messstromquelle 153 und
2. b. den ersten Anschluss 111 der beispielhaften Hall-Platte 110 über den ersten Eingang 141 des analogen Schaltwerks 140 und den zweiten Ausgangsanschluss 148 des analoges Schaltwerks 140 mit dem Anschluss des zweiten negativen Eingangs 123 des Verstärkers 120 und über den Messstromausgang 150 des analoges Schaltwerks 140 für die Entnahme des Messstroms I_Hall durch die zweite Messstromquelle 154 mit der zweiten Messstromquelle 154.

In a seventh operating state, the analogue switching mechanism connects 140

1. a. the third connection 113 of the exemplary Hall plate 110 via the third input 143 of the analogue circuit 140 and via the first output connection 147 of the analogue circuit 140 with the connection of the first positive input 122 of the amplifier 120 and via the measuring current input 146 of the analogue circuit 140 for the supply of the measuring current I _Hall through the first measuring current source 153 with the first measuring current source 153 and
2. b. the first terminal 111 of the exemplary Hall plate 110 via the first input 141 of the analog circuit 140 and the second output terminal 148 of the analog circuit 140 with the connection of the second negative input 123 of the amplifier 120 and via the measuring current output 150 of the analog switching mechanism 140 for the extraction of the measuring current I _Hall by the second measuring current source 154 with the second measuring current source 154.

1. a. den vierten Anschluss 114 der beispielhaften Hall-Platte 110 über den vierten Eingang 144 des analogen Schaltwerks 140 und über den ersten Ausgangsanschluss 147 des analoges Schaltwerks 140 mit dem Anschluss des ersten positiven Eingangs 122 des Verstärkers 120 und über den Messstromeingang 146 des analoges Schaltwerks 140 für die Einspeisung des Messstroms I_Hall durch die erste Messstromquelle 153 mit der ersten Messstromquelle 153 und
2. b. den zweiten Anschluss 112 der beispielhaften Hall-Platte 110 über den zweiten Eingang 142 des analogen Schaltwerks 140 und über den zweiten Ausgangsanschluss 148 des analoges Schaltwerks 140 mit dem Anschluss des zweiten negativen Eingangs 123 des Verstärkers 120 und über den Messstromausgang 150 des analoges Schaltwerks 140 für die Entnahme des Messstroms I_Hall durch die zweite Messstromquelle 154 mit der zweiten Messstromquelle 154.

In an eighth operating state, the analogue switching mechanism connects 140

1. a. the fourth connection 114 of the exemplary Hall plate 110 via the fourth input 144 of the analogue circuit 140 and via the first output connection 147 of the analogue circuit 140 to the connection of the first positive input 122 of the amplifier 120 and via the measuring current input 146 of the analogue circuit 140 for the supply of the measuring current I _Hall through the first measuring current source 153 to the first measuring current source 153 and
2. b. the second connection 112 of the exemplary Hall plate 110 via the second input 142 of the analog circuit 140 and via the second output connection 148 of the analog circuit 140 to the connection of the second negative input 123 of the amplifier 120 and via the measuring current output 150 of the analog circuit 140 for the extraction of the measuring current I _Hall by the second measuring current source 154 to the second measuring current source 154.

Second test operating conditions not chopped

1. a. den zweiten Anschluss 112 der beispielhaften Hall-Platte 110 über den zweiten Eingang 142 des analogen Schaltwerks 140 und über den ersten Ausgangsanschluss 147 des analoges Schaltwerks 140 mit dem Anschluss des ersten positiven Eingangs 122 des Verstärkers 120 und über den Messstromeingang 146 des analoges Schaltwerks 140 für die Einspeisung des Messstroms I_Hall durch die erste Messstromquelle 153 mit der ersten Messstromquelle 153 und
2. b. den vierten Anschluss 114 der beispielhaften Hall-Platte 110 über den vierten Eingang 144 des analogen Schaltwerks 140 und über den zweiten Ausgangsanschluss 148 des analoges Schaltwerks 140 mit dem Anschluss des zweiten negativen Eingangs 123 des Verstärkers 120 und über den Messstromausgang 150 des analoges Schaltwerks 140 für die Entnahme des Messstroms I_Hall durch die zweite Messstromquelle 154 mit der zweiten Messstromquelle 154;
3. c. den ersten Anschluss 111 der beispielhaften Hall-Platte 110 über den ersten Eingang 141 des analogen Schaltwerks 140 und über den Teststromeingang 145 des analoges Schaltwerks 140 für die Einspeisung des Teststroms I_tst durch die erste Teststromquelle 151 mit der ersten Teststromquelle 151 und
4. d. den dritten Anschluss 113 der beispielhaften Hall-Platte 110 über den dritten Eingang 143 des analogen Schaltwerks 140 und über den Teststromausgang 149 des analoges Schaltwerks 140 für die Entnahme des Teststroms I_tst durch die zweite Teststromquelle 152 mit der zweiten Teststromquelle 152.

In a ninth operating state, the analogue switching mechanism connects 140

1. a. the second connection 112 of the exemplary Hall plate 110 via the second input 142 of the analogue circuit 140 and via the first output connection 147 of the analogue circuit 140 with the connection of the first positive input 122 of the amplifier 120 and via the measuring current input 146 of the analogue circuit 140 for the supply of the measuring current I _Hall through the first measuring current source 153 with the first measuring current source 153 and
2. b. the fourth connection 114 of the exemplary Hall plate 110 via the fourth input 144 of the analog circuit 140 and via the second output connection 148 of the analog circuit 140 to the connection of the second negative input 123 of the amplifier 120 and via the measuring current output 150 of the analog circuit 140 for the extraction of the measuring current I _Hall by the second measuring current source 154 to the second measuring current source 154;
3. c. the first terminal 111 of the exemplary Hall plate 110 via the first input 141 of the analog switching device 140 and via the test current input 145 of the analog switching device 140 for feeding the test current I _tst through the first test current source 151 to the first test current source 151 and
4. d. the third connection 113 of the exemplary Hall plate 110 via the third input 143 of the analog switching device 140 and via the test current output 149 of the analog switching device 140 for the extraction of the test current I _tst by the second test current source 152 with the second test current source 152.

1. a. den dritten Anschluss 113 der beispielhaften Hall-Platte 110 über den dritten Eingang 143 des analogen Schaltwerks 140 und über den ersten Ausgangsanschluss 147 des analoges Schaltwerks 140 mit dem Anschluss des ersten positiven Eingangs 122 des Verstärkers 120 und über den Messstromeingang 146 des analoges Schaltwerks 140 für die Einspeisung des Messstroms I_Hall durch die erste Messstromquelle 153 mit der ersten Messstromquelle 153

und

• b. den ersten Anschluss 111 der beispielhaften Hall-Platte 110 über den ersten Eingang 141 des analogen Schaltwerks 140 und über den zweiten Ausgangsanschluss 148 des analoges Schaltwerks 140 mit dem Anschluss des zweiten negativen Eingangs 123 des Verstärkers 120 und über den Messstromausgang 150 des analoges Schaltwerks 140 für die Entnahme des Messstroms I_Hall durch die zweite Messstromquelle 154 mit der zweiten Messstromquelle 154;
• c. den zweiten Anschluss 112 der beispielhaften Hall-Platte 110 über den zweiten Eingang 142 des analogen Schaltwerks 140 und über den Teststromeingang 145 des analoges Schaltwerks 140 für die Einspeisung des Teststroms I_tst durch die erste Teststromquelle 151 mit der ersten Teststromquelle 151 und
• d. den vierten Anschluss 114 der beispielhaften Hall-Platte 110 über den vierten Eingang 144 des analogen Schaltwerks 140 und über den Teststromausgang 149 des analoges Schaltwerks 140 für die Entnahme des Teststroms I_tst durch die zweite Teststromquelle 152 mit der zweiten Teststromquelle 152.

In a tenth operating state, the analogue switching mechanism connects 140

1. a. the third connection 113 of the exemplary Hall plate 110 via the third input 143 of the analogue circuit 140 and via the first output connection 147 of the analogue circuit 140 with the connection of the first positive input 122 of the amplifier 120 and via the measuring current input 146 of the analogue circuit 140 for the supply of the measuring current I _Hall through the first measuring current source 153 with the first measuring current source 153

and

• b. the first connection 111 of the exemplary Hall plate 110 via the first input 141 of the analog circuit 140 and via the second output connection 148 of the analog circuit 140 to the connection of the second negative input 123 of the amplifier 120 and via the measuring current output 150 of the analog circuit 140 for the extraction of the measuring current I _Hall by the second measuring current source 154 to the second measuring current source 154;
• c. the second terminal 112 of the exemplary Hall plate 110 via the second input 142 of the analog switching device 140 and via the test current input 145 of the analog switching device 140 for feeding the test current I _tst through the first test current source 151 to the first test current source 151 and
• d. the fourth connection 114 of the exemplary Hall plate 110 via the fourth input 144 of the analog switching device 140 and via the test current output 149 of the analog switching device 140 for the extraction of the test current I _tst by the second test current source 152 with the second test current source 152.

1. a. den vierten Anschluss 114 der beispielhaften Hall-Platte 110 über den vierten Eingang 144 des analogen Schaltwerks 140 und über den ersten Ausgangsanschluss 147 des analoges Schaltwerks 140 mit dem Anschluss des ersten positiven Eingangs 122 des Verstärkers 120 und über den Messstromeingang 146 des analoges Schaltwerks 140 für die Einspeisung des Messstroms I_Hall durch die erste Messstromquelle 153 mit der ersten Messstromquelle 153 und
2. b. den zweiten Anschluss 112 der beispielhaften Hall-Platte 110 über den zweiten Eingang 142 des analogen Schaltwerks 140 und über den zweiten Ausgangsanschluss 148 des analoges Schaltwerks 140 mit dem Anschluss des zweiten negativen Eingangs 123 des Verstärkers 120 und über den Messstromausgang 150 des analoges Schaltwerks 140 für die Entnahme des Messstroms I_Hall durch die zweite Messstromquelle 154 mit der zweiten Messstromquelle 154;
3. c. den dritten Anschluss 113 der beispielhaften Hall-Platte 110 über den dritten Eingang 143 des analogen Schaltwerks 140 und über den Teststromeingang 145 des analoges Schaltwerks 140 für die Einspeisung des Teststroms I_tst durch die erste Teststromquelle 151 mit der ersten Teststromquelle 151 und
4. d. den ersten Anschluss 111 der beispielhaften Hall-Platte 110 über den ersten Eingang 141 des analogen Schaltwerks 140 und über den Teststromausgang 149 des analoges Schaltwerks 140 für die Entnahme des Teststroms I_tst durch die zweite Teststromquelle 152 mit der zweiten Teststromquelle 152.

In an eleventh operating state, the analogue switching mechanism connects 140

1. a. the fourth connection 114 of the exemplary Hall plate 110 via the fourth input 144 of the analogue circuit 140 and via the first output connection 147 of the analogue circuit 140 to the connection of the first positive input 122 of the amplifier 120 and via the measuring current input 146 of the analogue circuit 140 for the supply of the measuring current I _Hall through the first measuring current source 153 to the first measuring current source 153 and
2. b. the second connection 112 of the exemplary Hall plate 110 via the second input 142 of the analog circuit 140 and via the second output connection 148 of the analog circuit 140 to the connection of the second negative input 123 of the amplifier 120 and via the measuring current output 150 of the analog circuit 140 for the extraction of the measuring current I _Hall by the second measuring current source 154 to the second measuring current source 154;
3. c. the third terminal 113 of the exemplary Hall plate 110 via the third input 143 of the analog switching device 140 and via the test current input 145 of the analog switching device 140 for feeding the test current I _tst through the first test current source 151 to the first test current source 151 and
4. d. the first connection 111 of the exemplary Hall plate 110 via the first input 141 of the analog switching device 140 and via the test current output 149 of the analog switching device 140 for the extraction of the test current I _tst by the second test current source 152 with the second test current source 152.

1. a. den ersten Anschluss 111 der beispielhaften Hall-Platte 110 über den ersten Eingang 141 des analogen Schaltwerks 140 und über den ersten Ausgangsanschluss 147 des analoges Schaltwerks 140 mit dem Anschluss des ersten positiven Eingangs 122 des Verstärkers 120 und über den Messstromeingang 146 des analoges Schaltwerks 140 für die Einspeisung des Messstroms I_Hall durch die erste Messstromquelle 153 mit der ersten Messstromquelle 153 und
2. b. den dritten Anschluss 113 der beispielhaften Hall-Platte 110 über den dritten Eingang 143 des analogen Schaltwerks 140 und über den zweiten Ausgangsanschluss 148 des analoges Schaltwerks 140 mit dem Anschluss des zweiten negativen Eingangs 123 des Verstärkers 120 und über den Messstromausgang 150 des analoges Schaltwerks 140 für die Entnahme des Messstroms I_Hall durch die zweite Messstromquelle 154 mit der zweiten Messstromquelle 154;
3. c. den vierten Anschluss 114 der beispielhaften Hall-Platte 110 über den vierten Eingang 144 des analogen Schaltwerks 140 und über den Teststromeingang 145 des analoges Schaltwerks 140 für die Einspeisung des Teststroms I_tst durch die erste Teststromquelle 151 mit der ersten Teststromquelle 151 und
4. d. den zweiten Anschluss 112 der beispielhaften Hall-Platte 110 über den zweiten Eingang 142 des analogen Schaltwerks 140 und über den Teststromausgang 149 des analoges Schaltwerks 140 für die Entnahme des Teststroms I_tst durch die zweite Teststromquelle 152 mit der zweiten Teststromquelle 152 .

In a twelfth operating state, the analogue switching mechanism connects 140

1. a. the first connection 111 of the exemplary Hall plate 110 via the first input 141 of the analogue circuit 140 and via the first output connection 147 of the analogue circuit 140 with the connection of the first positive input 122 of the amplifier 120 and via the measuring current input 146 of the analogue circuit 140 for the supply of the measuring current I _Hall through the first measuring current source 153 with the first measuring current source 153 and
2. b. the third connection 113 of the exemplary Hall plate 110 via the third input 143 of the analog circuit 140 and via the second output connection 148 of the analog circuit 140 to the connection of the second negative input 123 of the amplifier 120 and via the measuring current output 150 of the analog circuit 140 for the extraction of the measuring current I _Hall by the second measuring current source 154 to the second measuring current source 154;
3. c. the fourth terminal 114 of the exemplary Hall plate 110 via the fourth input 144 of the analog switching device 140 and via the test current input 145 of the analog switching device 140 for feeding the test current I _tst through the first test current source 151 to the first test current source 151 and
4. d. the second connection 112 of the exemplary Hall plate 110 via the second input 142 of the analog switching device 140 and via the test current output 149 of the analog switching device 140 for the extraction of the test current I _tst by the second test current source 152 with the second test current source 152 .

Third test operating conditions not chopped

1. a. den zweiten Anschluss 112 der beispielhaften Hall-Platte 110 über den zweiten Eingang 142 des analogen Schaltwerks 140 und über den Messstromeingang 146 des analoges Schaltwerks 140 für die Einspeisung des Messstroms I_Hall durch die erste Messstromquelle 153 mit der ersten Messstromquelle 153 und
2. b. den vierten Anschluss 114 der beispielhaften Hall-Platte 110 über den vierten Eingang 144 des analogen Schaltwerks 140 und über den Messstromausgang 150 des analoges Schaltwerks 140 für die Entnahme des Messstroms I_Hall durch die zweite Messstromquelle 154 mit der zweiten Messstromquelle 154;
3. c. den ersten Anschluss 111 der beispielhaften Hall-Platte 110 über den ersten Eingang 141 des analogen Schaltwerks 140 und über den ersten Ausgangsanschluss 147 des analoges Schaltwerks 140 mit dem Anschluss des ersten positiven Eingangs 122 des Verstärkers 120 und über den Teststromeingang 145 des analoges Schaltwerks 140 für die Einspeisung des Teststroms I_tst durch die erste Teststromquelle 151 mit der ersten Teststromquelle 151 und
4. d. den dritten Anschluss 113 der beispielhaften Hall-Platte 110 über den dritten Eingang 143 des analogen Schaltwerks 140 und über den zweiten Ausgangsanschluss 148 des analoges Schaltwerks 140 mit dem Anschluss des zweiten negativen Eingangs 123 des Verstärkers 120 und über den Teststromausgang 149 des analoges Schaltwerks 140 für die Entnahme des Teststroms I_tst durch die zweite Teststromquelle 152 mit der zweiten Teststromquelle 152.

In a thirteenth operating state, the analogue switching mechanism connects 140

1. a. the second connection 112 of the exemplary Hall plate 110 via the second input 142 of the analog switching device 140 and via the measuring current input 146 of the analog switching device 140 for the supply of the measuring current I _Hall through the first measuring current source 153 to the first measuring current source 153 and
2. b. the fourth connection 114 of the exemplary Hall plate 110 via the fourth input 144 of the analog switching device 140 and via the measuring current output 150 of the analog switching device 140 for the extraction of the measuring current I _Hall by the second measuring current source 154 with the second measuring current source 154;
3. c. the first connection 111 of the exemplary Hall plate 110 via the first input 141 of the analog circuit 140 and via the first output connection 147 of the analog circuit 140 to the connection of the first positive input 122 of the amplifier 120 and via the test current input 145 of the analog circuit 140 for the supply of the test current I _tst through the first test current source 151 to the first test current source 151 and
4. d. the third terminal 113 of the exemplary Hall plate 110 via the third input 143 of the analog switching device 140 and via the second output terminal 148 of the analog switching device 140 with the connection of the second negative input 123 of the amplifier 120 and via the test current output 149 of the analog switching circuit 140 for the extraction of the test current I _tst by the second test current source 152 with the second test current source 152.

1. a. den dritten Anschluss 113 der beispielhaften Hall-Platte 110 über den dritten Eingang 143 des analogen Schaltwerks 140 und über den Messstromeingang 146 des analoges Schaltwerks 140 für die Einspeisung des Messstroms I_Hall durch die erste Messstromquelle 153 mit der ersten Messstromquelle 153 und
2. b. den ersten Anschluss 111 der beispielhaften Hall-Platte 110 über den ersten Eingang 141 des analogen Schaltwerks 140 und über den Messstromausgang 150 des analoges Schaltwerks 140 für die Entnahme des Messstroms I_Hall durch die zweite Messstromquelle 154 mit der zweiten Messstromquelle 154;
3. c. den zweiten Anschluss 112 der beispielhaften Hall-Platte 110 über den zweiten Eingang 142 des analogen Schaltwerks 140 und über den ersten Ausgangsanschluss 147 des analoges Schaltwerks 140 mit dem Anschluss des ersten positiven Eingangs 122 des Verstärkers 120 und über den Teststromeingang 145 des analoges Schaltwerks 140 für die Einspeisung des Teststroms I_tst durch die erste Teststromquelle 151 mit der ersten Teststromquelle 151 und
4. d. den vierten Anschluss 114 der beispielhaften Hall-Platte 110 über den vierten Eingang 144 des analogen Schaltwerks 140 und über den zweiten Ausgangsanschluss 148 des analoges Schaltwerks 140 mit dem Anschluss des zweiten negativen Eingangs 123 des Verstärkers 120 und über den Teststromausgang 149 des analoges Schaltwerks 140 für die Entnahme des Teststroms I_tst durch die zweite Teststromquelle 152 mit der zweiten Teststromquelle 152.

In a fourteenth operating state, the analogue switching mechanism connects 140

1. a. the third connection 113 of the exemplary Hall plate 110 via the third input 143 of the analogue switching device 140 and via the measuring current input 146 of the analogue switching device 140 for the supply of the measuring current I _Hall through the first measuring current source 153 with the first measuring current source 153 and
2. b. the first connection 111 of the exemplary Hall plate 110 via the first input 141 of the analog switching device 140 and via the measuring current output 150 of the analog switching device 140 for the extraction of the measuring current I _Hall by the second measuring current source 154 with the second measuring current source 154;
3. c. the second connection 112 of the exemplary Hall plate 110 via the second input 142 of the analog circuit 140 and via the first output connection 147 of the analog circuit 140 to the connection of the first positive input 122 of the amplifier 120 and via the test current input 145 of the analog circuit 140 for the supply of the test current I _tst through the first test current source 151 to the first test current source 151 and
4. d. the fourth connection 114 of the exemplary Hall plate 110 via the fourth input 144 of the analog circuit 140 and via the second output connection 148 of the analog circuit 140 to the connection of the second negative input 123 of the amplifier 120 and via the test current output 149 of the analog circuit 140 for the extraction of the test current I _tst by the second test current source 152 to the second test current source 152.

1. a. den vierten Anschluss 114 der beispielhaften Hall-Platte 110 über den vierten Eingang 144 des analogen Schaltwerks 140 und über den Messstromeingang 146 des analoges Schaltwerks 140 für die Einspeisung des Messstroms I_Hall durch die erste Messstromquelle 153 mit der ersten Messstromquelle 153 und
2. b. den zweiten Anschluss 112 der beispielhaften Hall-Platte 110 über den zweiten Eingang 142 des analogen Schaltwerks 140 und über den Messstromausgang 150 des analoges Schaltwerks 140 für die Entnahme des Messstroms I_Hall durch die zweite Messstromquelle 154 mit der zweiten Messstromquelle 154;
3. c. den dritten Anschluss 113 der beispielhaften Hall-Platte 110 über den dritten Eingang 143 des analogen Schaltwerks 140 und über den ersten Ausgangsanschluss 147 des analoges Schaltwerks 140 mit dem Anschluss des ersten positiven Eingangs 122 des Verstärkers 120 und über den Teststromeingang 145 des analoges Schaltwerks 140 für die Einspeisung des Teststroms I_tst durch die erste Teststromquelle 151 mit der ersten Teststromquelle 151 und
4. d. den ersten Anschluss 111 der beispielhaften Hall-Platte 110 über den ersten Eingang 141 des analogen Schaltwerks 140 und über den zweiten Ausgangsanschluss 148 des analoges Schaltwerks 140 mit dem Anschluss des zweiten negativen Eingangs 123 des Verstärkers 120 und über den Teststromausgang 149 des analoges Schaltwerks 140 für die Entnahme des Teststroms I_tst durch die zweite Teststromquelle 152 mit der zweiten Teststromquelle 152.

In a fifteenth operating state, the analogue switching mechanism connects 140

1. a. the fourth connection 114 of the exemplary Hall plate 110 via the fourth input 144 of the analogue switching device 140 and via the measuring current input 146 of the analogue switching device 140 for the supply of the measuring current I _Hall through the first measuring current source 153 with the first measuring current source 153 and
2. b. the second connection 112 of the exemplary Hall plate 110 via the second input 142 of the analog switching device 140 and via the measuring current output 150 of the analog switching device 140 for the extraction of the measuring current I _Hall by the second measuring current source 154 with the second measuring current source 154;
3. c. the third connection 113 of the exemplary Hall plate 110 via the third input 143 of the analog circuit 140 and via the first output connection 147 of the analog circuit 140 to the connection of the first positive input 122 of the amplifier 120 and via the test current input 145 of the analog circuit 140 for the supply of the test current I _tst through the first test current source 151 to the first test current source 151 and
4. d. the first connection 111 of the exemplary Hall plate 110 via the first input 141 of the analog circuit 140 and via the second output connection 148 of the analog circuit 140 to the connection of the second negative input 123 of the amplifier 120 and via the test current output 149 of the analog circuit 140 for the extraction of the test current I _tst by the second test current source 152 to the second test current source 152.

1. a. den ersten Anschluss 111 der beispielhaften Hall-Platte 110 über den ersten Eingang 141 des analogen Schaltwerks 140 und über den Messstromeingang 146 des analoges Schaltwerks 140 für die Einspeisung des Messstroms I_Hall durch die erste Messstromquelle 153 mit der ersten Messstromquelle 153 und
2. b. den dritten Anschluss 113 der beispielhaften Hall-Platte 110 über den dritten Eingang 143 des analogen Schaltwerks 140 und über den Messstromausgang 150 des analoges Schaltwerks 140 für die Entnahme des Messstroms I_Hall durch die zweite Messstromquelle 154 mit der zweiten Messstromquelle 154;
3. c. den vierten Anschluss 114 der beispielhaften Hall-Platte 110 über den vierten Eingang 144 des analogen Schaltwerks 140 und über den ersten Ausgangsanschluss 147 des analoges Schaltwerks 140 mit dem Anschluss des ersten positiven Eingangs 122 des Verstärkers 120 und über den Teststromeingang 145 des analoges Schaltwerks 140 für die Einspeisung des Teststroms I_tst durch die erste Teststromquelle 151 mit der ersten Teststromquelle 151 und
4. d. den zweiten Anschluss 112 der beispielhaften Hall-Platte 110 über den zweiten Eingang 142 des analogen Schaltwerks 140 und über den zweiten Ausgangsanschluss 148 des analoges Schaltwerks 140 mit dem Anschluss des zweiten negativen Eingangs 123 des Verstärkers 120 und über den Teststromausgang 149 des analoges Schaltwerks 140 für die Entnahme des Teststroms I_tst durch die zweite Teststromquelle 152 mit der zweiten Teststromquelle 152.

In a sixteenth operating state, the analogue switching mechanism connects 140

1. a. the first connection 111 of the exemplary Hall plate 110 via the first input 141 of the analogue switching device 140 and via the measuring current input 146 of the analogue switching device 140 for the supply of the measuring current I _Hall through the first measuring current source 153 with the first measuring current source 153 and
2. b. the third connection 113 of the exemplary Hall plate 110 via the third input 143 of the analog switching device 140 and via the measuring current output 150 of the analog switching device 140 for the extraction of the measuring current I _Hall by the second measuring current source 154 with the second measuring current source 154;
3. c. the fourth connection 114 of the exemplary Hall plate 110 via the fourth input 144 of the analog circuit 140 and via the first output connection 147 of the analog circuit 140 to the connection of the first positive input 122 of the amplifier 120 and via the test current input 145 of the analog circuit 140 for the supply of the test current I _tst through the first test current source 151 to the first test current source 151 and
4. d. the second connection 112 of the exemplary Hall plate 110 via the second input 142 of the analog circuit 140 and via the second output connection 148 of the analog circuit 140 to the connection of the second negative input 123 of the amplifier 120 and via the test current output 149 of the analog circuit 140 for the extraction of the test current I _tst by the second test current source 152 to the second test current source 152.

Normal operating conditions chopped

1. a. den ersten Anschluss 111 der beispielhaften Hall-Platte 110 über den ersten Eingang 141 des analogen Schaltwerks 140 und über den Messstromeingang 146 des analoges Schaltwerks 140 für die Einspeisung des Messstroms I_Hall durch die erste Messstromquelle 153 mit der ersten Messstromquelle 153 und
2. b. den zweiten Anschluss 112 der beispielhaften Hall-Platte 110 über den zweiten Eingang 142 des analogen Schaltwerks 140 und über den zweiten Ausgangsanschluss 148 des analoges Schaltwerks 140 mit dem Anschluss des zweiten negativen Eingangs 123 des Verstärkers 120 und
3. c. den dritten Anschluss 113 der beispielhaften Hall-Platte 110 über den dritten Eingang 143 des analogen Schaltwerks 140 und über den Messstromausgang 150 des analoges Schaltwerks 140 für die Entnahme des Messstroms I_Hall durch die zweite Messstromquelle 154 mit der zweiten Messstromquelle 154 und
4. d. den vierten Anschluss 114 der beispielhaften Hall-Platte 110 über den vierten Eingang 144 des analogen Schaltwerks 140 und über den ersten Ausgangsanschluss 147 des analoges Schaltwerks 140 mit dem Anschluss des ersten positiven Eingangs 124 des Verstärkers 120.

In a seventeenth operating state, the analogue switching mechanism connects 140

1. a. the first connection 111 of the exemplary Hall plate 110 via the first input 141 of the analogue switching device 140 and via the measuring current input 146 of the analogue switching device 140 for the supply of the measuring current I _Hall through the first measuring current source 153 with the first measuring current source 153 and
2. b. the second terminal 112 of the exemplary Hall plate 110 via the second input 142 of the analog circuit 140 and via the second output terminal 148 of the analog circuit 140 to the terminal of the second negative input 123 of the amplifier 120 and
3. c. the third connection 113 of the exemplary Hall plate 110 via the third input 143 of the analogue switching device 140 and via the measuring current output 150 of the analogue switching device 140 for the extraction of the measuring current I _Hall by the second measuring current source 154 with the second measuring current source 154 and
4. d. the fourth terminal 114 of the exemplary Hall plate 110 via the fourth input 144 of the analog circuit 140 and via the first output terminal 147 of the analog circuit 140 to the terminal of the first positive input 124 of the amplifier 120.

1. a. den zweiten Anschluss 112 der beispielhaften Hall-Platte 110 über den zweiten Eingang 142 des analogen Schaltwerks 140 und über den Messstromeingang 146 des analoges Schaltwerks 140 für die Einspeisung des Messstroms I_Hall durch die erste Messstromquelle 153 mit der ersten Messstromquelle 153 und
2. b. den dritten Anschluss 113 der beispielhaften Hall-Platte 110 über den dritten Eingang 143 des analogen Schaltwerks 140 und über den zweiten Ausgangsanschluss 148 des analoges Schaltwerks 140 mit dem Anschluss des zweiten negativen Eingangs 123 des Verstärkers 120 und
3. c. den vierten Anschluss 114 der beispielhaften Hall-Platte 110 über den vierten Eingang 144 des analogen Schaltwerks 140 und über den Messstromausgang 150 des analoges Schaltwerks 140 für die Entnahme des Messstroms I_Hall durch die zweite Messstromquelle 154 mit der zweiten Messstromquelle 154 und
4. d. den ersten Anschluss 111 der beispielhaften Hall-Platte 110 über den ersten Eingang 141 des analogen Schaltwerks 140 und über den ersten Ausgangsanschluss 147 des analoges Schaltwerks 140 mit dem Anschluss des ersten positiven Eingangs 122 des Verstärkers 120.

In an eighteenth operating state, the analogue switching mechanism connects 140

1. a. the second connection 112 of the exemplary Hall plate 110 via the second input 142 of the analog switching device 140 and via the measuring current input 146 of the analog switching device 140 for the supply of the measuring current I _Hall through the first measuring current source 153 to the first measuring current source 153 and
2. b. the third terminal 113 of the exemplary Hall plate 110 via the third input 143 of the analog circuit 140 and via the second output terminal 148 of the analog circuit 140 to the terminal of the second negative input 123 of the amplifier 120 and
3. c. the fourth connection 114 of the exemplary Hall plate 110 via the fourth input 144 of the analogue switching device 140 and via the measuring current output 150 of the analogue switching device 140 for the extraction of the measuring current I _Hall by the second measuring current source 154 with the second measuring current source 154 and
4. d. the first terminal 111 of the exemplary Hall plate 110 via the first input 141 of the analog circuit 140 and via the first output terminal 147 of the analog circuit 140 to the terminal of the first positive input 122 of the amplifier 120.

1. a. den dritten Anschluss 113 der beispielhaften Hall-Platte 110 über den dritten Eingang 143 des analogen Schaltwerks 140 und über den Messstromeingang 146 des analoges Schaltwerks 140 für die Einspeisung des Messstroms I_Hall durch die erste Messstromquelle 153 mit der ersten Messstromquelle 153 und
2. b. den vierten Anschluss 114 der beispielhaften Hall-Platte 110 über den vierten Eingang 144 des analogen Schaltwerks 140 und über den zweiten Ausgangsanschluss 148 des analoges Schaltwerks 140 mit dem Anschluss des zweiten negativen Eingangs 123 des Verstärkers 120 und
3. c. den ersten Anschluss 111 der beispielhaften Hall-Platte 110 über den ersten Eingang 141 des analogen Schaltwerks 140 und über den Messstromausgang 150 des analoges Schaltwerks 140 für die Entnahme des Messstroms I_Hall durch die zweite Messstromquelle 154 mit der zweiten Messstromquelle 154 und
4. d. den zweiten Anschluss 112 der beispielhaften Hall-Platte 110 über den ersten Eingang 142 des analogen Schaltwerks 140 und über den ersten Ausgangsanschluss 147 des analoges Schaltwerks 140 mit dem Anschluss des ersten positiven Eingangs 122 des Verstärkers 120.

In a nineteenth operating state, the analogue switching mechanism connects 140

1. a. the third connection 113 of the exemplary Hall plate 110 via the third input 143 of the analogue switching device 140 and via the measuring current input 146 of the analogue switching device 140 for the supply of the measuring current I _Hall through the first measuring current source 153 with the first measuring current source 153 and
2. b. the fourth terminal 114 of the exemplary Hall plate 110 via the fourth input 144 of the analog circuit 140 and via the second output terminal 148 of the analog circuit 140 to the terminal of the second negative input 123 of the amplifier 120 and
3. c. the first connection 111 of the exemplary Hall plate 110 via the first input 141 of the analogue switching device 140 and via the measuring current output 150 of the analogue switching device 140 for the extraction of the measuring current I _Hall by the second measuring current source 154 with the second measuring current source 154 and
4. d. the second terminal 112 of the exemplary Hall plate 110 via the first input 142 of the analog circuit 140 and via the first output terminal 147 of the analog circuit 140 to the terminal of the first positive input 122 of the amplifier 120.

1. a. den vierten Anschluss 114 der beispielhaften Hall-Platte 110 über den vierten Eingang 144 des analogen Schaltwerks 140 und über den Messstromeingang 146 des analoges Schaltwerks 140 für die Einspeisung des Messstroms I_Hall durch die erste Messstromquelle 153 mit der ersten Messstromquelle 153 und
2. b. den ersten Anschluss 111 der beispielhaften Hall-Platte 110 über den ersten Eingang 141 des analogen Schaltwerks 140 und über den zweiten Ausgangsanschluss 148 des analoges Schaltwerks 140 mit dem Anschluss des zweiten negativen Eingangs 123 des Verstärkers 120 und
3. c. den zweiten Anschluss 112 der beispielhaften Hall-Platte 110 über den zweiten Eingang 142 des analogen Schaltwerks 140 und über den Messstromausgang 150 des analoges Schaltwerks 140 für die Entnahme des Messstroms I_Hall durch die zweite Messstromquelle 154 mit der zweiten Messstromquelle 154 und
4. d. den dritten Anschluss 113 der beispielhaften Hall-Platte 110 über den dritten Eingang 143 des analogen Schaltwerks 140 und über den ersten Ausgangsanschluss 147 des analoges Schaltwerks 140 mit dem Anschluss des ersten positiven Eingangs 122 des Verstärkers 120.

In a twentieth operating state, the analogue switching mechanism connects 140

1. a. the fourth connection 114 of the exemplary Hall plate 110 via the fourth input 144 of the analogue switching device 140 and via the measuring current input 146 of the analogue switching device 140 for the supply of the measuring current I _Hall through the first measuring current source 153 with the first measuring current source 153 and
2. b. the first terminal 111 of the exemplary Hall plate 110 via the first input 141 of the analog circuit 140 and via the second output terminal 148 of the analog circuit 140 to the terminal of the second negative input 123 of the amplifier 120 and
3. c. the second connection 112 of the exemplary Hall plate 110 via the second input 142 of the analogue switching device 140 and via the measuring current output 150 of the analogue switching device 140 for the extraction of the measuring current I _Hall by the second measuring current source 154 with the second measuring current source 154 and
4. d. the third terminal 113 of the exemplary Hall plate 110 via the third input 143 of the analog circuit 140 and via the first output terminal 147 of the analog circuit 140 to the connection of the first positive input 122 of the amplifier 120.

First test operating conditions chopped

1. a. den ersten Anschluss 111 der beispielhaften Hall-Platte 110 über den ersten Eingang 141 des analogen Schaltwerks 140 und über den zweiten Ausgangsanschluss 148 des analoges Schaltwerks 140 mit dem Anschluss des zweiten negativen Eingangs 123 des Verstärkers 120 und über den Messstromeingang 146 des analoges Schaltwerks 140 für die Einspeisung des Messstroms I_Hall durch die erste Messstromquelle 153 mit der ersten Messstromquelle 153 und
2. b. den dritten Anschluss 113 der beispielhaften Hall-Platte 110 über den dritten Eingang 143 des analogen Schaltwerks 140 und über den ersten Ausgangsanschluss 147 des analoges Schaltwerks 140 mit dem Anschluss des ersten positiven Eingangs 122 des Verstärkers 120 und über den Messstromausgang 150 des analoges Schaltwerks 140 für die Entnahme des Messstroms I_Hall durch die zweite Messstromquelle 154 mit der zweiten Messstromquelle 154.

In a twenty-first operating state, the analogue switching mechanism connects 140

1. a. the first connection 111 of the exemplary Hall plate 110 via the first input 141 of the analogue circuit 140 and via the second output connection 148 of the analogue circuit 140 to the connection of the second negative input 123 of the amplifier 120 and via the measuring current input 146 of the analogue circuit 140 for the supply of the measuring current I _Hall through the first measuring current source 153 to the first measuring current source 153 and
2. b. the third connection 113 of the exemplary Hall plate 110 via the third input 143 of the analog circuit 140 and via the first output connection 147 of the analog circuit 140 to the connection of the first positive input 122 of the amplifier 120 and via the measuring current output 150 of the analog circuit 140 for the extraction of the measuring current I _Hall by the second measuring current source 154 to the second measuring current source 154.

1. a. den zweiten Anschluss 112 der beispielhaften Hall-Platte 110 über den zweiten Eingang 142 des analogen Schaltwerks 140 und über den zweiten Ausgangsanschluss 148 des analoges Schaltwerks 140 mit dem Anschluss des zweiten negativen Eingangs 123 des Verstärkers 120 und über den Messstromeingang 146 des analoges Schaltwerks 140 für die Einspeisung des Messstroms I_Hall durch die erste Messstromquelle 153 mit der ersten Messstromquelle 153 und
2. b. den vierten Anschluss 114 der beispielhaften Hall-Platte 110 über den vierten Eingang 144 des analogen Schaltwerks 140 und über den ersten Ausgangsanschluss 147 des analoges Schaltwerks 140 mit dem Anschluss des ersten positiven Eingangs 122 des Verstärkers 120 und über den Messstromausgang 150 des analoges Schaltwerks 140 für die Entnahme des Messstroms I_Hall durch die zweite Messstromquelle 154 mit der zweiten Messstromquelle 154.

In a twenty-second operating state, the analogue switching mechanism connects 140

1. a. the second connection 112 of the exemplary Hall plate 110 via the second input 142 of the analogue circuit 140 and via the second output connection 148 of the analogue circuit 140 to the connection of the second negative input 123 of the amplifier 120 and via the measuring current input 146 of the analogue circuit 140 for the supply of the measuring current I _Hall through the first measuring current source 153 to the first measuring current source 153 and
2. b. the fourth connection 114 of the exemplary Hall plate 110 via the fourth input 144 of the analog circuit 140 and via the first output connection 147 of the analog circuit 140 to the connection of the first positive input 122 of the amplifier 120 and via the measuring current output 150 of the analog circuit 140 for the extraction of the measuring current I _Hall by the second measuring current source 154 to the second measuring current source 154.

1. a. den dritten Anschluss 113 der beispielhaften Hall-Platte 110 über den dritten Eingang 143 des analogen Schaltwerks 140 und über den zweiten Ausgangsanschluss 148 des analoges Schaltwerks 140 mit dem Anschluss des zweiten negativen Eingangs 123 des Verstärkers 120 und über den Messstromeingang 146 des analoges Schaltwerks 140 für die Einspeisung des Messstroms I_Hall durch die erste Messstromquelle 153 mit der ersten Messstromquelle 153 und
2. b. den ersten Anschluss 111 der beispielhaften Hall-Platte 110 über den ersten Eingang 141 des analogen Schaltwerks 140 und den ersten Ausgangsanschluss 147 des analoges Schaltwerks 140 mit dem Anschluss des ersten positiven Eingangs 122 des Verstärkers 120 und über den Messstromausgang 150 des analoges Schaltwerks 140 für die Entnahme des Messstroms I_Hall durch die zweite Messstromquelle 154 mit der zweiten Messstromquelle 154.

In a twenty-third operating state, the analogue switching mechanism connects 140

1. a. the third terminal 113 of the exemplary Hall plate 110 via the third input 143 of the analog circuit 140 and via the second output terminal 148 of the analog circuit 140 with the terminal of the second negative input 123 of the amplifier 120 and via the measuring current input output 146 of the analog switching mechanism 140 for feeding the measuring current I _Hall through the first measuring current source 153 with the first measuring current source 153 and
2. b. the first connection 111 of the exemplary Hall plate 110 via the first input 141 of the analog circuit 140 and the first output connection 147 of the analog circuit 140 to the connection of the first positive input 122 of the amplifier 120 and via the measuring current output 150 of the analog circuit 140 for the extraction of the measuring current I _Hall by the second measuring current source 154 to the second measuring current source 154.

1. a. den vierten Anschluss 114 der beispielhaften Hall-Platte 110 über den vierten Eingang 144 des analogen Schaltwerks 140 und über den zweiten Ausgangsanschluss 148 des analoges Schaltwerks 140 mit dem Anschluss des zweiten negativen Eingangs 123 des Verstärkers 120 und über den Messstromeingang 146 des analoges Schaltwerks 140 für die Einspeisung des Messstroms I_Hall durch die erste Messstromquelle 153 mit der ersten Messstromquelle 153 und
2. b. den zweiten Anschluss 112 der beispielhaften Hall-Platte 110 über den zweiten Eingang 142 des analogen Schaltwerks 140 und über den ersten Ausgangsanschluss 147 des analoges Schaltwerks 140 mit dem Anschluss des ersten positiven Eingangs 122 des Verstärkers 120 und über den Messstromausgang 150 des analoges Schaltwerks 140 für die Entnahme des Messstroms I_Hall durch die zweite Messstromquelle 154 mit der zweiten Messstromquelle 154.

In a twenty-fourth operating state, the analogue switching mechanism connects 140

1. a. the fourth connection 114 of the exemplary Hall plate 110 via the fourth input 144 of the analogue circuit 140 and via the second output connection 148 of the analogue circuit 140 to the connection of the second negative input 123 of the amplifier 120 and via the measuring current input 146 of the analogue circuit 140 for the supply of the measuring current I _Hall through the first measuring current source 153 to the first measuring current source 153 and
2. b. the second connection 112 of the exemplary Hall plate 110 via the second input 142 of the analog circuit 140 and via the first output connection 147 of the analog circuit 140 to the connection of the first positive input 122 of the amplifier 120 and via the measuring current output 150 of the analog circuit 140 for the extraction of the measuring current I _Hall by the second measuring current source 154 to the second measuring current source 154.

Second test operating conditions chopped

1. a. den zweiten Anschluss 112 der beispielhaften Hall-Platte 110 über den zweiten Eingang 142 des analogen Schaltwerks 140 und über den zweiten Ausgangsanschluss 148 des analoges Schaltwerks 140 mit dem Anschluss des zweiten negativen Eingangs 123 des Verstärkers 120 und über den Messstromeingang 146 des analoges Schaltwerks 140 für die Einspeisung des Messstroms I_Hall durch die erste Messstromquelle 153 mit der ersten Messstromquelle 153 und
2. b. den vierten Anschluss 114 der beispielhaften Hall-Platte 110 über den vierten Eingang 144 des analogen Schaltwerks 140 und über den ersten Ausgangsanschluss 147 des analoges Schaltwerks 140 mit dem Anschluss des ersten positiven Eingangs 122 des Verstärkers 120 und über den Messstromausgang 150 des analoges Schaltwerks 140 für die Entnahme des Messstroms I_Hall durch die zweite Messstromquelle 154 mit der zweiten Messstromquelle 154;
3. c. den ersten Anschluss 111 der beispielhaften Hall-Platte 110 über den ersten Eingang 141 des analogen Schaltwerks 140 und über den Teststromeingang 145 des analoges Schaltwerks 140 für die Einspeisung des Teststroms I_tst durch die erste Teststromquelle 151 mit der ersten Teststromquelle 151 und
4. d. den dritten Anschluss 113 der beispielhaften Hall-Platte 110 über den dritten Eingang 143 des analogen Schaltwerks 140 und über den Teststromausgang 149 des analoges Schaltwerks 140 für die Entnahme des Teststroms I_tst durch die zweite Teststromquelle 152 mit der zweiten Teststromquelle 152.

In a twenty-fifth operating state, the analogue switching mechanism connects 140

1. a. the second connection 112 of the exemplary Hall plate 110 via the second input 142 of the analogue circuit 140 and via the second output connection 148 of the analogue circuit 140 to the connection of the second negative input 123 of the amplifier 120 and via the measuring current input 146 of the analogue circuit 140 for the supply of the measuring current I _Hall through the first measuring current source 153 to the first measuring current source 153 and
2. b. the fourth connection 114 of the exemplary Hall plate 110 via the fourth input 144 of the analog circuit 140 and via the first output connection 147 of the analog circuit 140 to the connection of the first positive input 122 of the amplifier 120 and via the measuring current output 150 of the analog circuit 140 for the extraction of the measuring current I _Hall by the second measuring current source 154 to the second measuring current source 154;
3. c. the first terminal 111 of the exemplary Hall plate 110 via the first input 141 of the analog switching device 140 and via the test current input 145 of the analog switching device 140 for feeding the test current I _tst through the first test current source 151 to the first test current source 151 and
4. d. the third connection 113 of the exemplary Hall plate 110 via the third input 143 of the analog switching device 140 and via the test current output 149 of the analog switching device 140 for the extraction of the test current I _tst by the second test current source 152 with the second test current source 152.

1. a. den dritten Anschluss 113 der beispielhaften Hall-Platte 110 über den dritten Eingang 143 des analogen Schaltwerks 140 und über den zweiten Ausgangsanschluss 148 des analoges Schaltwerks 140 mit dem Anschluss des zweiten negativen Eingangs 123 des Verstärkers 120 und über den Messstromeingang 146 des analoges Schaltwerks 140 für die Einspeisung des Messstroms I_Hall durch die erste Messstromquelle 153 mit der ersten Messstromquelle 153 und
2. b. den ersten Anschluss 111 der beispielhaften Hall-Platte 110 über den ersten Eingang 141 des analogen Schaltwerks 140 und über den ersten Ausgangsanschluss 147 des analoges Schaltwerks 140 mit dem Anschluss des ersten positiven Eingangs 122 des Verstärkers 120 und über den Messstromausgang 150 des analoges Schaltwerks 140 für die Entnahme des Messstroms I_Hall durch die zweite Messstromquelle 154 mit der zweiten Messstromquelle 154;
3. c. den zweiten Anschluss 112 der beispielhaften Hall-Platte 110 über den zweiten Eingang 142 des analogen Schaltwerks 140 und über den Teststromeingang 145 des analoges Schaltwerks 140 für die Einspeisung des Teststroms I_tst durch die erste Teststromquelle 151 mit der ersten Teststromquelle 151 und
4. d. den vierten Anschluss 114 der beispielhaften Hall-Platte 110 über den vierten Eingang 144 des analogen Schaltwerks 140 und über den Teststromausgang 149 des analoges Schaltwerks 140 für die Entnahme des Teststroms I_tst durch die zweite Teststromquelle 152 mit der zweiten Teststromquelle 152.

In a twenty-sixth operating state, the analogue switching mechanism connects 140

1. a. the third connection 113 of the exemplary Hall plate 110 via the third input 143 of the analogue circuit 140 and via the second output connection 148 of the analogue circuit 140 with the connection of the second negative input 123 of the amplifier 120 and via the measuring current input 146 of the analogue circuit 140 for the supply of the measuring current I _Hall through the first measuring current source 153 with the first measuring current source 153 and
2. b. the first connection 111 of the exemplary Hall plate 110 via the first input 141 of the analog circuit 140 and via the first output connection 147 of the analog circuit 140 to the connection of the first positive input 122 of the amplifier 120 and via the measuring current output 150 of the analog circuit 140 for the extraction of the measuring current I _Hall by the second measuring current source 154 to the second measuring current source 154;
3. c. the second terminal 112 of the exemplary Hall plate 110 via the second input 142 of the analog switching device 140 and via the test current input 145 of the analog switching device 140 for feeding the test current I _tst through the first test current source 151 to the first test current source 151 and
4. d. the fourth connection 114 of the exemplary Hall plate 110 via the fourth input 144 of the analog switching device 140 and via the test current output 149 of the analog switching device 140 for the extraction of the test current I _tst by the second test current source 152 with the second test current source 152.

1. a. den vierten Anschluss 114 der beispielhaften Hall-Platte 110 über den vierten Eingang 144 des analogen Schaltwerks 140 und über den zweiten Ausgangsanschluss 148 des analoges Schaltwerks 140 mit dem Anschluss des zweiten negativen Eingangs 123 des Verstärkers 120 und über den Messstromeingang 146 des analoges Schaltwerks 140 für die Einspeisung des Messstroms I_Hall durch die erste Messstromquelle 153 mit der ersten Messstromquelle 153

und

• b. den zweiten Anschluss 112 der beispielhaften Hall-Platte 110 über den zweiten Eingang 142 des analogen Schaltwerks 140 und über den ersten Ausgangsanschluss 147 des analoges Schaltwerks 140 mit dem Anschluss des ersten positiven Eingangs 122 des Verstärkers 120 und über den Messstromausgang 150 des analoges Schaltwerks 140 für die Entnahme des Messstroms I_Hall durch die zweite Messstromquelle 154 mit der zweiten Messstromquelle 154;
• c. den dritten Anschluss 113 der beispielhaften Hall-Platte 110 über den dritten Eingang 143 des analogen Schaltwerks 140 und über den Teststromeingang 145 des analoges Schaltwerks 140 für die Einspeisung des Teststroms I_tst durch die erste Teststromquelle 151 mit der ersten Teststromquelle 151 und
• d. den ersten Anschluss 111 der beispielhaften Hall-Platte 110 über den ersten Eingang 141 des analogen Schaltwerks 140 und über den Teststromausgang 149 des analoges Schaltwerks 140 für die Entnahme des Teststroms I_tst durch die zweite Teststromquelle 152 mit der zweiten Teststromquelle 152.

In a twenty-seventh operating state, the analogue switching mechanism connects 140

1. a. the fourth connection 114 of the exemplary Hall plate 110 via the fourth input 144 of the analogue circuit 140 and via the second output connection 148 of the analogue circuit 140 to the connection of the second negative input 123 of the amplifier 120 and via the measuring current input 146 of the analogue circuit 140 for the supply of the measuring current I _Hall through the first measuring current source 153 to the first measuring current source 153

and

• b. the second connection 112 of the exemplary Hall plate 110 via the second input 142 of the analog circuit 140 and via the first output connection 147 of the analog circuit 140 to the connection of the first positive input 122 of the amplifier 120 and via the measuring current output 150 of the analog circuit 140 for the extraction of the measuring current I _Hall by the second measuring current source 154 to the second measuring current source 154;
• c. the third terminal 113 of the exemplary Hall plate 110 via the third input 143 of the analog switching device 140 and via the test current input 145 of the analog switching device 140 for feeding the test current I _tst through the first test current source 151 to the first test current source 151 and
• d. the first connection 111 of the exemplary Hall plate 110 via the first input 141 of the analog switching device 140 and via the test current output 149 of the analog switching device 140 for the extraction of the test current I _tst by the second test current source 152 with the second test current source 152.

1. a. den ersten Anschluss 111 der beispielhaften Hall-Platte 110 über den ersten Eingang 141 des analogen Schaltwerks 140 und über den zweiten Ausgangsanschluss 148 des analoges Schaltwerks 140 mit dem Anschluss des zweiten negativen Eingangs 123 des Verstärkers 120 und über den Messstromeingang 146 des analoges Schaltwerks 140 für die Einspeisung des Messstroms I_Hall durch die erste Messstromquelle 153 mit der ersten Messstromquelle 153 und
2. b. den dritten Anschluss 113 der beispielhaften Hall-Platte 110 über den dritten Eingang 143 des analogen Schaltwerks 140 und über den ersten Ausgangsanschluss 147 des analoges Schaltwerks 140 mit dem Anschluss des ersten positiven Eingangs 122 des Verstärkers 120 und über den Messstromausgang 150 des analoges Schaltwerks 140 für die Entnahme des Messstroms I_Hall durch die zweite Messstromquelle 154 mit der zweiten Messstromquelle 154;
3. c. den vierten Anschluss 114 der beispielhaften Hall-Platte 110 über den vierten Eingang 144 des analogen Schaltwerks 140 und über den Teststromeingang 145 des analoges Schaltwerks 140 für die Einspeisung des Teststroms I_tst durch die erste Teststromquelle 151 mit der ersten Teststromquelle 151 und
4. d. den zweiten Anschluss 112 der beispielhaften Hall-Platte 110 über den zweiten Eingang 142 des analogen Schaltwerks 140 und über den Teststromausgang 149 des analoges Schaltwerks 140 für die Entnahme des Teststroms I_tst durch die zweite Teststromquelle 152 mit der zweiten Teststromquelle 152 .

In a twenty-eighth operating state, the analogue switching mechanism connects 140

1. a. the first connection 111 of the exemplary Hall plate 110 via the first input 141 of the analogue circuit 140 and via the second output connection 148 of the analogue circuit 140 to the connection of the second negative input 123 of the amplifier 120 and via the measuring current input 146 of the analogue circuit 140 for the supply of the measuring current I _Hall through the first measuring current source 153 to the first measuring current source 153 and
2. b. the third connection 113 of the exemplary Hall plate 110 via the third input 143 of the analog circuit 140 and via the first output connection 147 of the analog circuit 140 to the connection of the first positive input 122 of the amplifier 120 and via the measuring current output 150 of the analog circuit 140 for the extraction of the measuring current I _Hall by the second measuring current source 154 to the second measuring current source 154;
3. c. the fourth terminal 114 of the exemplary Hall plate 110 via the fourth input 144 of the analog switching device 140 and via the test current input 145 of the analog switching device 140 for feeding the test current I _tst through the first test current source 151 to the first test current source 151 and
4. d. the second connection 112 of the exemplary Hall plate 110 via the second input 142 of the analog switching device 140 and via the test current output 149 of the analog switching device 140 for the extraction of the test current I _tst by the second test current source 152 with the second test current source 152 .

Third test operating conditions chopped

1. a. den zweiten Anschluss 112 der beispielhaften Hall-Platte 110 über den zweiten Eingang 142 des analogen Schaltwerks 140 und über den Messstromeingang 146 des analoges Schaltwerks 140 für die Einspeisung des Messstroms I_Hall durch die erste Messstromquelle 153 mit der ersten Messstromquelle 153 und
2. b. den vierten Anschluss 114 der beispielhaften Hall-Platte 110 über den vierten Eingang 144 des analogen Schaltwerks 140 und über den Messstromausgang 150 des analoges Schaltwerks 140 für die Entnahme des Messstroms I_Hall durch die zweite Messstromquelle 154 mit der zweiten Messstromquelle 154;
3. c. den ersten Anschluss 111 der beispielhaften Hall-Platte 110 über den ersten Eingang 141 des analogen Schaltwerks 140 und über den zweiten Ausgangsanschluss 148 des analoges Schaltwerks 140 mit dem Anschluss des zweiten negativen Eingangs 123 des Verstärkers 120 und über den Teststromeingang 145 des analoges Schaltwerks 140 für die Einspeisung des Teststroms I_tst durch die erste Teststromquelle 151 mit der ersten Teststromquelle 151 und
4. d. den dritten Anschluss 113 der beispielhaften Hall-Platte 110 über den dritten Eingang 143 des analogen Schaltwerks 140 und über den ersten Ausgangsanschluss 147 des analoges Schaltwerks 140 mit dem Anschluss des ersten positiven Eingangs 122 des Verstärkers 120 und über den Teststromausgang 149 des analoges Schaltwerks 140 für die Entnahme des Teststroms I_tst durch die zweite Teststromquelle 152 mit der zweiten Teststromquelle 152.

In a twenty-ninth operating state, the analogue switching mechanism connects 140

1. a. the second connection 112 of the exemplary Hall plate 110 via the second input 142 of the analog switching device 140 and via the measuring current input 146 of the analog switching device 140 for the supply of the measuring current I _Hall through the first measuring current source 153 to the first measuring current source 153 and
2. b. the fourth connection 114 of the exemplary Hall plate 110 via the fourth input 144 of the analog switching device 140 and via the measuring current output 150 of the analog switching device 140 for the extraction of the measuring current I _Hall by the second measuring current source 154 with the second measuring current source 154;
3. c. the first connection 111 of the exemplary Hall plate 110 via the first input 141 of the analogue circuit 140 and via the second output connection 148 of the analogue circuit 140 to the connection of the second negative input 123 of the amplifier 120 and via the test current input 145 of the analogue circuit 140 for the supply of the test current I _tst through the first test current source 151 to the first test current source 151 and
4. d. the third connection 113 of the exemplary Hall plate 110 via the third input 143 of the analog circuit 140 and via the first output connection 147 of the analog circuit 140 to the connection of the first positive input 122 of the amplifier 120 and via the test current output 149 of the analog circuit 140 for the extraction of the test current I _tst by the second test current source 152 to the second test current source 152.

1. a. den dritten Anschluss 113 der beispielhaften Hall-Platte 110 über den dritten Eingang 143 des analogen Schaltwerks 140 und über den Messstromeingang 146 des analoges Schaltwerks 140 für die Einspeisung des Messstroms I_Hall durch die erste Messstromquelle 153 mit der ersten Messstromquelle 153 und
2. b. den ersten Anschluss 111 der beispielhaften Hall-Platte 110 über den ersten Eingang 141 des analogen Schaltwerks 140 und über den Messstromausgang 150 des analoges Schaltwerks 140 für die Entnahme des Messstroms I_Hall durch die zweite Messstromquelle 154 mit der zweiten Messstromquelle 154;
3. c. den zweiten Anschluss 112 der beispielhaften Hall-Platte 110 über den zweiten Eingang 142 des analogen Schaltwerks 140 und über den zweiten Ausgangsanschluss 148 des analoges Schaltwerks 140 mit dem Anschluss des zweiten negativen Eingangs 123 des Verstärkers 120 und über den Teststromeingang 145 des analoges Schaltwerks 140 für die Einspeisung des Teststroms I_tst durch die erste Teststromquelle 151 mit der ersten Teststromquelle 151 und
4. d. den vierten Anschluss 114 der beispielhaften Hall-Platte 110 über den vierten Eingang 144 des analogen Schaltwerks 140 und über den ersten Ausgangsanschluss 147 des analoges Schaltwerks 140 mit dem Anschluss des ersten positiven Eingangs 122 des Verstärkers 120 und über den Teststromausgang 149 des analoges Schaltwerks 140 für die Entnahme des Teststroms I_tst durch die zweite Teststromquelle 152 mit der zweiten Teststromquelle 152.

In a thirtieth operating state, the analogue switching mechanism connects 140

1. a. the third connection 113 of the exemplary Hall plate 110 via the third input 143 of the analogue switching device 140 and via the measuring current input 146 of the analogue switching device 140 for the supply of the measuring current I _Hall through the first measuring current source 153 with the first measuring current source 153 and
2. b. the first connection 111 of the exemplary Hall plate 110 via the first input 141 of the analog switching device 140 and via the measuring current output 150 of the analog switching device 140 for the extraction of the measuring current I _Hall by the second measuring current source 154 with the second measuring current source 154;
3. c. the second connection 112 of the exemplary Hall plate 110 via the second input 142 of the analogue circuit 140 and via the second output connection 148 of the analogue circuit 140 to the connection of the second negative input 123 of the amplifier 120 and via the test current input 145 of the analogue circuit 140 for the supply of the test current I _tst through the first test current source 151 to the first test current source 151 and
4. d. the fourth connection 114 of the exemplary Hall plate 110 via the fourth input 144 of the analog circuit 140 and via the first output connection 147 of the analog circuit 140 to the connection of the first positive input 122 of the amplifier 120 and via the test current output 149 of the analog circuit 140 for the extraction of the test current I _tst by the second test current source 152 to the second test current source 152.

1. a. den vierten Anschluss 114 der beispielhaften Hall-Platte 110 über den vierten Eingang 144 des analogen Schaltwerks 140 und über den Messstromeingang 146 des analoges Schaltwerks 140 für die Einspeisung des Messstroms I_Hall durch die erste Messstromquelle 153 mit der ersten Messstromquelle 153 und
2. b. den zweiten Anschluss 112 der beispielhaften Hall-Platte 110 über den zweiten Eingang 142 des analogen Schaltwerks 140 und über den Messstromausgang 150 des analoges Schaltwerks 140 für die Entnahme des Messstroms I_Hall durch die zweite Messstromquelle 154 mit der zweiten Messstromquelle 154;
3. c. den dritten Anschluss 113 der beispielhaften Hall-Platte 110 über den dritten Eingang 143 des analogen Schaltwerks 140 und über den zweiten Ausgangsanschluss 148 des analoges Schaltwerks 140 mit dem Anschluss des zweiten negativen Eingangs 123 des Verstärkers 120 und über den Teststromeingang 145 des analoges Schaltwerks 140 für die Einspeisung des Teststroms I_tst durch die erste Teststromquelle 151 mit der ersten Teststromquelle 151 und
4. d. den ersten Anschluss 111 der beispielhaften Hall-Platte 110 über den ersten Eingang 141 des analogen Schaltwerks 140 und über den ersten Ausgangsanschluss 147 des analoges Schaltwerks 140 mit dem Anschluss des ersten positiven Eingangs 122 des Verstärkers 120 und über den Teststromausgang 149 des analoges Schaltwerks 140 für die Entnahme des Teststroms I_tst durch die zweite Teststromquelle 152 mit der zweiten Teststromquelle 152.

In a thirty-first operating state, the analogue switching mechanism connects 140

1. a. the fourth connection 114 of the exemplary Hall plate 110 via the fourth input 144 of the analogue switching device 140 and via the measuring current input 146 of the analogue switching device 140 for the supply of the measuring current I _Hall through the first measuring current source 153 with the first measuring current source 153 and
2. b. the second connection 112 of the exemplary Hall plate 110 via the second input 142 of the analog switching device 140 and via the measuring current output 150 of the analog switching device 140 for the extraction of the measuring current I _Hall by the second measuring current source 154 with the second measuring current source 154;
3. c. the third connection 113 of the exemplary Hall plate 110 via the third input 143 of the analog circuit 140 and via the second output connection 148 of the analog circuit 140 to the connection of the second negative input 123 of the amplifier 120 and via the test current input 145 of the analog circuit 140 for the supply of the test current I _tst through the first test current source 151 to the first test current source 151 and
4. d. the first connection 111 of the exemplary Hall plate 110 via the first input 141 of the analog circuit 140 and via the first output connection 147 of the analog circuit 140 to the connection of the first positive input 122 of the amplifier 120 and via the test current output 149 of the analog circuit 140 for the extraction of the test current I _tst by the second test current source 152 to the second test current source 152.

1. a. den ersten Anschluss 111 der beispielhaften Hall-Platte 110 über den ersten Eingang 141 des analogen Schaltwerks 140 und über den Messstromeingang 146 des analoges Schaltwerks 140 für die Einspeisung des Messstroms I_Hall durch die erste Messstromquelle 153 mit der ersten Messstromquelle 153 und
2. b. den dritten Anschluss 113 der beispielhaften Hall-Platte 110 über den dritten Eingang 143 des analogen Schaltwerks 140 und über den Messstromausgang 150 des analoges Schaltwerks 140 für die Entnahme des Messstroms I_Hall durch die zweite Messstromquelle 154 mit der zweiten Messstromquelle 154;
3. c. den vierten Anschluss 114 der beispielhaften Hall-Platte 110 über den vierten Eingang 144 des analogen Schaltwerks 140 und über den zweiten Ausgangsanschluss 148 des analoges Schaltwerks 140 mit dem Anschluss des zweiten negativen Eingangs 123 des Verstärkers 120 und über den Teststromeingang 145 des analoges Schaltwerks 140 für die Einspeisung des Teststroms I_tst durch die erste Teststromquelle 151 mit der ersten Teststromquelle 151 und
4. d. den zweiten Anschluss 112 der beispielhaften Hall-Platte 110 über den zweiten Eingang 142 des analogen Schaltwerks 140 und über den ersten Ausgangsanschluss 147 des analoges Schaltwerks 140 mit dem Anschluss des ersten positiven Eingangs 122 des Verstärkers 120

und über den Teststromausgang 149 des analoges Schaltwerks 140 für die Entnahme des Teststroms I_tst durch die zweite Teststromquelle 152 mit der zweiten Teststromquelle 152.In a thirty-second operating state, the analogue switching mechanism connects 140

1. a. the first connection 111 of the exemplary Hall plate 110 via the first input 141 of the analog switching device 140 and via the measuring current input 146 of the analog switching device 140 for the input supply of the measuring current I _Hall by the first measuring current source 153 with the first measuring current source 153 and
2. b. the third connection 113 of the exemplary Hall plate 110 via the third input 143 of the analog switching device 140 and via the measuring current output 150 of the analog switching device 140 for the extraction of the measuring current I _Hall by the second measuring current source 154 with the second measuring current source 154;
3. c. the fourth connection 114 of the exemplary Hall plate 110 via the fourth input 144 of the analog circuit 140 and via the second output connection 148 of the analog circuit 140 to the connection of the second negative input 123 of the amplifier 120 and via the test current input 145 of the analog circuit 140 for the supply of the test current I _tst through the first test current source 151 to the first test current source 151 and
4. d. the second terminal 112 of the exemplary Hall plate 110 via the second input 142 of the analog circuit 140 and via the first output terminal 147 of the analog circuit 140 to the connection of the first positive input 122 of the amplifier 120

and via the test current output 149 of the analog switching circuit 140 for the extraction of the test current I _tst by the second test current source 152 with the second test current source 152.

DEFINITION OF MEASUREMENT VOLTAGES AND TEST VOLTAGES

To simplify the notation, the measurement voltage V _Hall1 should be the measurement voltage which the control device 124 detects by means of the amplifier 120 and the analog-to-digital converter 130 in the first operating state of the analog switching mechanism 140.

To simplify the notation, the measurement voltage V _Hall2 should be the measurement voltage which the control device 124 detects by means of the amplifier 120 and the analog-to-digital converter 130 in the second operating state of the analog switching mechanism 140.

To simplify the notation, the measurement voltage V _Hall3 should be the measurement voltage which the control device 124 detects by means of the amplifier 120 and the analog-to-digital converter 130 in the third operating state of the analog switching mechanism 140.

To simplify the notation, the measurement voltage V _Hall4 should be the measurement voltage which the control device 124 detects by means of the amplifier 120 and the analog-to-digital converter 130 in the fourth operating state of the analog switching mechanism 140.

To simplify the notation, the measurement voltage V _tst5 should be the test voltage which the control device 124 detects by means of the amplifier 120 and the analog-to-digital converter 130 in the fifth operating state of the analog switching device 140.

To simplify the notation, the measurement voltage V _tst6 should be the test voltage which the control device 124 detects by means of the amplifier 120 and the analog-to-digital converter 130 in the sixth operating state of the analog switching device 140.

To simplify the notation, the measurement voltage V _tst7 should be the test voltage which the control device 124 detects by means of the amplifier 120 and the analog-to-digital converter 130 in the seventh operating state of the analog circuit 140.

To simplify the notation, the measurement voltage V _tst8 should be the test voltage which the control device 124 detects by means of the amplifier 120 and the analog-to-digital converter 130 in the eighth operating state of the analog switching device 140.

To simplify the notation, the measurement voltage V _tst9 should be the test voltage which the control device 124 detects by means of the amplifier 120 and the analog-to-digital converter 130 in the ninth operating state of the analog circuit 140.

To simplify the notation, the measurement voltage V _tst10 should be the test voltage which the control device 124 detects by means of the amplifier 120 and the analog-to-digital converter 130 in the tenth operating state of the analog circuit 140.

To simplify the notation, the measurement voltage V _tst11 should be the test voltage which the control device 124 detects by means of the amplifier 120 and the analog-to-digital converter 130 in the eleventh operating state of the analog switching device 140.

To simplify the notation, the measurement voltage V _tst12 should be the test voltage which the control device 124 detects by means of the amplifier 120 and the analog-to-digital converter 130 in the twelfth operating state of the analog switching device 140.

To simplify the notation, the measurement voltage V _tst13 should be the test voltage which the control device 124 detects by means of the amplifier 120 and the analog-to-digital converter 130 in the thirteenth operating state of the analog circuit 140.

To simplify the notation, the measurement voltage V _tst14 should be the test voltage which the control device 124 detects by means of the amplifier 120 and the analog-to-digital converter 130 in the fourteenth operating state of the analog circuit 140.

To simplify the notation, the measurement voltage V _tst15 should be the test voltage which the control device 124 detects by means of the amplifier 120 and the analog-to-digital converter 130 in the fifteenth operating state of the analog circuit 140.

To simplify the notation, the measurement voltage V _tst16 should be the test voltage which the control device 124 detects by means of the amplifier 120 and the analog-to-digital converter 130 in the sixteenth operating state of the analog circuit 140.

To simplify the notation, the measurement voltage V _Hall17 should be the measurement voltage which the control device 124 detects by means of the amplifier 120 and the analog-to-digital converter 130 in the seventeenth operating state of the analog switching mechanism 140.

To simplify the notation, the measurement voltage V _Hall18 should be the measurement voltage which the control device 124 detects by means of the amplifier 120 and the analog-to-digital converter 130 in the eighteenth operating state of the analog switching device 140.

To simplify the notation, the measurement voltage V _Hall19 should be the measurement voltage which the control device 124 detects by means of the amplifier 120 and the analog-to-digital converter 130 in the nineteenth operating state of the analog switching device 140.

To simplify the notation, the measurement voltage V _Hall20 should be the measurement voltage which the control device 124 detects by means of the amplifier 120 and the analog-to-digital converter 130 in the twentieth operating state of the analog circuit 140.

To simplify the notation, the measurement voltage V _tst21 should be the test voltage which the control device 124 detects by means of the amplifier 120 and the analog-to-digital converter 130 in the twenty-first operating state of the analog circuit 140.

To simplify the notation, the measurement voltage V _tst22 should be the test voltage which the control device 124 detects by means of the amplifier 120 and the analog-to-digital converter 130 in the twenty-second operating state of the analog circuit 140.

To simplify the notation, the measurement voltage V _tst23 should be the test voltage which the control device 124 detects by means of the amplifier 120 and the analog-to-digital converter 130 in the twenty-third operating state of the analog circuit 140.

To simplify the notation, the measurement voltage V _tst24 should be the test voltage which the control device 124 detects by means of the amplifier 120 and the analog-to-digital converter 130 in the twenty-fourth operating state of the analog circuit 140.

To simplify the notation, the measurement voltage V _tst25 should be the test voltage which the control device 124 detects by means of the amplifier 120 and the analog-to-digital converter 130 in the twenty-fifth operating state of the analog circuit 140.

To simplify the notation, the measurement voltage V _tst26 should be the test voltage which the control device 124 detects by means of the amplifier 120 and the analog-to-digital converter 130 in the twenty-sixth operating state of the analog circuit 140.

To simplify the notation, the measurement voltage V _tst27 should be the test voltage which the control device 124 detects by means of the amplifier 120 and the analog-to-digital converter 130 in the twenty-seventh operating state of the analog circuit 140.

To simplify the notation, the measurement voltage V _tst23 should be the test voltage which the control device 124 detects by means of the amplifier 120 and the analog-to-digital converter 130 in the twenty-eighth operating state of the analog circuit 140.

To simplify the notation, the measurement voltage V _tst29 should be the test voltage which the control device 124 detects by means of the amplifier 120 and the analog-to-digital converter 130 in the twenty-ninth operating state of the analog circuit 140.

To simplify the notation, the measurement voltage V _tst30 should be the test voltage which the control device 124 detects by means of the amplifier 120 and the analog-to-digital converter 130 in the thirtieth operating state of the analog circuit 140.

To simplify the notation, the measurement voltage V _tst31 should be the test voltage which the control device 124 detects by means of the amplifier 120 and the analog-to-digital converter 130 in the thirty-first operating state of the analog circuit 140.

To simplify the notation, the measurement voltage V _tst32 should be the test voltage which the control device 124 detects by means of the amplifier 120 and the analog-to-digital converter 130 in the thirty-second operating state of the analog circuit 140.

These operating states can be divided into the groups normal operation (one to four and seventeen to twenty), first test operating state (five to eight and twenty-one to twenty-four), second test operating state (nine to twelve and twenty-five to twenty-eight) and third test operating state (thirteen to sixteen and twenty-nine to thirty-two).

A) NORMAL OPERATION (normal operating state)

Single-phase operation without spinning and without chopper

A measuring period initially comprises only one measuring phase in which the control device 124 sets exactly one operating state of the Hall sensor measuring system 100.

In the normal operating state without spinning and without chopping, the control device 124 sets the operating state one by means of the control signal 125. The control device 124 then preferably determines the determined Hall voltage V _Hall as $${\text{V}}_{\text{Hall}}={\text{V}}_{\text{Hall1}}$$

Einphasenbetrieb ohne Spinning und mit ChoppernA measuring period in the next operating mode initially continues to be only one measuring phase in which the control device 124 sets exactly one operating state of the Hall sensor measuring system 100. This differs by the polarity of the differential input signal 121 of the amplifier 120. The control device 124 can alternatively set the operating state seventeen in the normal operating state without spinning and without chopping using the control signal 125. The control device 124 then preferably determines the determined Hall voltage V _Hall as $${\text{V}}_{\text{Hall}}=-{\text{V}}_{\text{Hall17}}$$

Single-phase operation without spinning and with choppers

A measurement period now comprises two measurement phases in which the control device 124 sets two different, mutually complementary operating states of the Hall sensor measuring system 100 in immediate succession. These differ by the polarity of the differential input signal nals 121 of the amplifier 120. The control device 124 can alternatively set the operating states one and seventeen in the normal operating state without spinning and with choppers by means of the control signal 125 in two measuring phases that preferably follow one another immediately. The control device 124 then preferably determines the determined Hall voltage V _Hall as $${\text{V}}_{\text{Hall}}=\left({\text{V}}_{\text{Hall1}}-{\text{V}}_{\text{Hall17}}\right)/2$$

The advantage is the reduction of the 1/f noise of the amplifier 120 and the analog-to-digital converter 130.

Two-phase operation with two-phase spinning and without chopper

A measurement period now comprises two measurement phases in which the control device 124 sets different operating states of the Hall sensor measuring system 100 in immediate succession. However, these do not differ here in terms of the polarity of the differential input signal 121 of the amplifier 120.

Vorteil ist eine gewisse Eliminierung des Einflusses mechanischer Spannungen auf die Hall-Platte 110.In the normal operating state, the control device 124 sets the operating states one to two by means of the control signal 125. In the normal state, the control device 124 preferably sets one of these two operating states one after the other in two consecutive measuring phases of the measuring period. The control device 124 preferably sets these operating states until the control device 124 has preferably set all two operating states exactly once for the duration of a measuring phase and has determined the measuring voltages V _Hall1 and V _Hall2 exactly once each. The control device 124 then preferably determines the determined Hall voltage V _Hall as $${\text{V}}_{\text{Hall}}=\left({\text{V}}_{\text{Hall1}}+{\text{V}}_{\text{Hall2}}\right)/2$$

The advantage is a certain elimination of the influence of mechanical stresses on the Hall plate 110.

In the following operating mode, a measuring period also comprises two measuring phases in which the control device 124 sets different operating states of the Hall sensor measuring system 100 in immediate succession. However, these differ here from the previously described operating mode due to the polarity of the differential input signal 121 of the amplifier 120, but not from one another. In the normal operating state, the control device 124 sets the operating states seventeen to eighteen using the control signal 125. In the normal state, the control device 124 preferably sets one of these two operating states one after the other in two consecutive measuring phases of the measuring period. The control device 124 preferably sets these operating states until the control device 124 has preferably set all two operating states exactly once for the duration of a measuring phase and has determined the measuring voltages V _Hall17 and V _Hall18 exactly once each. The control device 124 then preferably determines the determined Hall voltage V _Hall as $${\text{V}}_{\text{Hall}}=-\left({\text{V}}_{\text{Hall17}}+{\text{V}}_{\text{Hall18}}\right)/2$$

The advantage is a certain elimination of the influence of mechanical stresses on the Hall plate 110.

Two-phase operation with two-phase spinning and with choppers

Vorteile sind

1. a. eine gewisse Eliminierung des Einflusses mechanischer Spannungen auf die Hall-Platte 110 und
2. b. die Reduzierung des 1/f Rauschens des Verstärkers 120 und des Analog-zu-Digital-Wandlers 130.

A measurement period now comprises two times two measurement phases, i.e. a total of four measurement phases, in which the control device 124 sets different operating states of the Hall sensor measurement system 100 and their complementary operating states with inverted differential input signal 121 of the amplifier 120 in immediate succession. In the normal operating state, the control device 124 sets the operating states one to two and seventeen to eighteen using the control signal 125. In the normal state, the control device 124 preferably sets one of these four operating states one after the other in four consecutive measurement phases of the measurement period. The control device 124 preferably sets these operating states until the control device 124 has preferably set all four operating states exactly once for the duration of a measurement phase and has determined the measurement voltages V _Hall1 , V _Hall2 , V _Hall17 and V _Hall18 exactly once each. The control device 124 then preferably determines the determined Hall voltage V _Hall as $${\text{V}}_{\text{Hall}}=\left({\text{V}}_{\text{Hall1}}+{\text{V}}_{\text{Hall2}}-{\text{V}}_{\text{Hall17}}-{\text{V}}_{\text{Hall18}}\right)/4$$

Advantages are

1. a. a certain elimination of the influence of mechanical stresses on the Hall plate 110 and
2. b. reducing the 1/f noise of the amplifier 120 and the analog-to-digital converter 130.

Four-phase operation with four-phase spinning and without chopper

A measurement period now comprises four measurement phases in which the control device 124 sets different operating states of the Hall sensor measuring system 100 in immediate succession. However, these do not differ here in terms of the polarity of the differential input signal 121 of the amplifier 120.

Vorteil ist eine weit gehende Eliminierung des Einflusses mechanischer Spannungen auf die Hall-Platte 110.In the normal operating state, the control device 124 sets the operating states one to four by means of the control signal 125. In the normal state, the control device 124 preferably sets one of these four operating states one after the other in four consecutive measuring phases of the measuring period. The control device 124 preferably sets these operating states until the control device 124 has preferably set all two operating states exactly once for the duration of a measuring phase and has determined the measuring voltages V _Hall1 , V _Hall2 , V _Hall3 , and V _Hall4 exactly once each. The control device 124 then preferably determines the determined Hall voltage V _Hall as $${\text{V}}_{\text{Hall}}=\left({\text{V}}_{\text{Hall1}}+{\text{V}}_{\text{Hall2}}+{\text{V}}_{\text{Hall3}}+{\text{V}}_{\text{Hall4}}\right)/4$$

The advantage is a largely elimination of the influence of mechanical stresses on the Hall plate 110.

Vorteile sind

1. a. eine gewisse Eliminierung des Einflusses mechanischer Spannungen auf die Hall-Platte 110 und
2. b. die Reduzierung des 1/f Rauschens des Verstärkers 120 und des Analog-zu-Digital-Wandlers 130.

In the following operating mode, a measuring period also comprises four measuring phases in which the control device 124 sets different operating states of the Hall sensor measuring system 100 in immediate succession. However, these differ here from the previously described operating mode due to the polarity of the differential input signal 121 of the amplifier 120, but not from one another. In the normal operating state, the control device 124 sets the operating states seventeen to twenty using the control signal 125. In the normal state, the control device 124 preferably sets one of these four operating states one after the other in four consecutive measuring phases of the measuring period. The control device 124 preferably sets these operating states until the control device 124 has preferably set all four operating states exactly once for the duration of a measuring phase and has determined the measuring voltages V _Hall17 , V _Hall18 , V _Hall19 and V _Hall20 exactly once each. The control device 124 then preferably determines the determined Hall voltage V _Hall as $${\text{V}}_{\text{Hall}}=-\left({\text{V}}_{\text{Hall17}}+{\text{V}}_{\text{Hall18}}+{\text{V}}_{\text{Hall19}}+{\text{V}}_{\text{Hall20}}\right)/4$$

Advantages are

1. a. a certain elimination of the influence of mechanical stresses on the Hall plate 110 and
2. b. reducing the 1/f noise of the amplifier 120 and the analog-to-digital converter 130.

Four-phase operation with four-phase spinning and with choppers

Vorteile sind

1. a. eine weit gehende Eliminierung des Einflusses mechanischer Spannungen auf die Hall-Platte 110 und
2. b. die Reduzierung des 1/f Rauschens des Verstärkers 120 und des Analog-zu-Digital-Wandlers 130.

A measuring period now comprises four times two measuring phases, i.e. a total of eight measuring phases, in which the control device 124 sets different operating states of the Hall sensor measuring system 100 and their complementary operating states with an inverted differential input signal 121 of the amplifier 120 in immediate succession. In the normal operating state, the control device 124 sets the operating states one to four and seventeen to twenty using the control signal 125. In the normal state, the control device 124 preferably sets one of these eight operating states one after the other in eight consecutive measuring phases of the measuring period. The control device 124 preferably sets the operating states until the control device 124 has preferably set all eight operating states exactly once for the duration of a measuring phase and has determined the measuring voltages V _Hall1 , V _Hall2 , V _Hall3 , V _Hall4 , V _Hall17 , V _Hall18 , V _Hall19 and V _Hall20 exactly once each. Preferably, the control device 124 then determines the determined Hall voltage V _Hall as $${\text{V}}_{\text{Hall}}=\left({\text{V}}_{\text{Hall1}}+{\text{V}}_{\text{Hall2}}+{\text{V}}_{\text{Hall3}}+{\text{V}}_{\text{Hall4}}-{\text{V}}_{\text{Hall17}}-{\text{V}}_{\text{Hall18}}-{\text{V}}_{\text{Hall19}}-{\text{V}}_{\text{Hall20}}\right)/\mathrm{8th}$$

Advantages are

1. a. a far-reaching elimination of the influence of mechanical stresses on the Hall plate 110 and
2. b. reducing the 1/f noise of the amplifier 120 and the analog-to-digital converter 130.

B) FIRST TEST OPERATING CONDITION

The first test operating state is typically used to check the resistance value of the Hall plate 110 and the homogeneity of the resistance value of the Hall plate 110.

TEST OPERATION TO DETERMINE THE ELECTRICAL RESISTANCE OF THE HALL PLATE 110

Single-phase operation without spinning and without chopper

A measuring period initially comprises only one measuring phase in which the control device 124 sets exactly one operating state of the Hall sensor measuring system 100.

In the first test operating state without spinning and without chopping, the control device 124 sets the operating state five by means of the control signal 125. The control device 124 then preferably determines the measurement voltage V _tst determined by means of the amplifier 120 and the analog-to-digital converter 130 as $${\text{V}}_{\text{tst}}={\text{V}}_{\text{tst5}}$$

In an analogous manner, the control device 124 can determine the measurement voltages V _tst6 , V _tst7 and V _tst8 for the respective operating states six to eight in the first test operating state. From these, the control device 124 can then use the set value of the measurement current I _Hall to deduce a respective electrical resistance value of the Hall plate 110. The control device 110 can then compare one or more or all of these respective electrical resistance values of the Hall plate 110 with a respective resistance tolerance range. If one or more respective electrical resistance values of the Hall plate 110 are outside the respective resistance tolerance range, the control device 124 can deduce a fault in the Hall plate 110 or other device parts (153, 154, 120, 130) of the Hall sensor measuring system 100. If one or more respective electrical resistance values of the Hall plate 110 are outside the respective resistance tolerance range, the control device 124 can signal this error, for example, to a test system via a data interface 129.

The control device 124 can, if necessary, by reconfiguring the analog switching mechanism 140, also electrically connect the differential input signal 121 of the amplifier 120 to other pairs of connections of the Hall plate 110 without changing the current feed of the measuring current I _Hall . The control device 124 can thus record further respective voltage measurement values. The control device 124 can compare the determined respective resistance values with respective tolerance resistance ranges. The control device 124 can, if necessary, conclude that there are errors in the Hall plate 110 and/or device parts of the Hall sensor measuring system 100. The control device 124 can, if necessary, signal such an error via the data interface 129.

A measurement period in the next operating mode initially continues to be only one measurement phase, in which the control device 124 sets exactly one operating state of the Hall sensor measuring system 100. This differs by the polarity of the differential input signal 121 of the amplifier 120. In the first test operating state without spinning and without chopping, the control device 124 now alternatively sets the operating state twenty-one by means of the control signal 125. The control device 124 then preferably determines the measurement voltage V _tst determined by means of the amplifier 120 and the analog-to-digital converter 130 as $${\text{V}}_{\text{tst}}=-{\text{V}}_{\text{tst21}}$$

In an analogous manner, the control device 124 can determine the measuring voltages V _tst22 , V _tst23 and V _tst24 for the respective operating states twenty-two to twenty-four in the first test operating state. From these, the control device 124 can then use the set value of the measuring current I _Hall to infer a respective electrical resistance value of the Hall plate 110. The control device 110 can then compare one or more or all of these respective electrical resistance values of the Hall plate 110 with a respective resistance tolerance range. If one or more respective electrical resistance values of the Hall plate 110 are outside the respective resistance tolerance range, the control device 124 can infer a fault in the Hall plate 110 or other device parts (153, 154, 120, 130) of the Hall sensor measuring system 100. If one or more respective electrical resistance values of the Hall plate 110 are outside the respective resistance tolerance range, the control device 124 can signal this fault, for example, to a test system via a data interface 129.

The control device 124 can, if necessary, by reconfiguring the analog switching mechanism 140, electrically connect the differential input signal 121 of the amplifier 120 to other pairs of connections of the Hall plate 110 without changing the current feed of the measuring current I _Hall . The control device 124 can thus record further respective voltage measurement values. The control device 124 can compare the determined respective resistance values with respective tolerance resistance ranges. The control device 124 can, if necessary, conclude that there are errors in the Hall plate 110 and/or device parts of the Hall sensor measuring system 100. The control device 124 can, if necessary, signal such an error via the data interface 129.

Single-phase operation without spinning and with choppers

A measurement period now comprises two measurement phases in which the control device 124 sets two different, mutually complementary operating states of the Hall sensor measuring system 100 immediately one after the other. These differ in the polarity of the differential input signal 121 of the amplifier 120. The control device 124 can alternatively set the operating states five and twenty-one in the first test operating state without spinning and with choppers using the control signal 125 in two measurement phases that preferably follow one another immediately. The control device 124 then preferably determines the determined test voltage V _tst as $${\text{V}}_{\text{tst}}=\left({\text{V}}_{\text{tst5}}-{\text{V}}_{\text{tst21}}\right)/2$$

From these, the control device 124 can then use the set value of the measuring current I _Hall to deduce a respective electrical resistance value of the Hall plate 110. The control device 110 can then compare one or more or all of these respective electrical resistance values of the Hall plate 110 with a respective resistance tolerance range. If one or more respective electrical resistance values of the Hall plate 110 are outside the respective resistance tolerance range, the control device 124 can deduce a fault in the Hall plate 110 or other device parts (153, 154, 120, 130) of the Hall sensor measuring system 100. If one or more respective electrical resistance values of the Hall plate 110 are outside the respective resistance tolerance range, the control device 124 can signal this fault, for example, to a test system via a data interface 129.

The advantage is the reduction of the 1/f noise of the amplifier 120 and the analog-to-digital converter 130.

The control device 124 can, if necessary, by reconfiguring the analog switching mechanism 140, also electrically connect the differential input signal 121 of the amplifier 120 to other pairs of connections of the Hall plate 110 without changing the current feed of the measuring current I _Hall . The control device 124 can thus record further respective voltage measurement values. The control device 124 can compare the determined respective resistance values with respective tolerance resistance ranges. The control device 124 can, if necessary, conclude that there are errors in the Hall plate 110 and/or device parts of the Hall sensor measuring system 100. The control device 124 can, if necessary, signal such an error via the data interface 129.

Two-phase operation with two-phase spinning and without chopper

A measurement period now comprises two measurement phases in which the control device 124 sets different operating states of the Hall sensor measuring system 100 in immediate succession. However, these do not differ here in terms of the polarity of the differential input signal 121 of the amplifier 120.

Vorteil ist eine gewisse Eliminierung des Einflusses mechanischer Spannungen auf die Hall-Platte 110.The control device 124 sets the operating states five to six in the first test operating state using the control signal 125. Preferably, the control device 124 sets one of these two operating states in succession in two consecutive measuring phases of the measuring period in the first test operating state. The control device 124 preferably sets these operating states until the control device 124 has preferably set all two operating states exactly once for the duration of a measuring phase and has determined the measuring voltages V _tst5 and V _tst6 exactly once each. Preferably, the control device 124 then determines the determined measuring voltage V _tst as $${\text{V}}_{\text{tst}}=\left({\text{V}}_{\text{tst5}}+{\text{V}}_{\text{tst6}}\right)/2$$

The advantage is a certain elimination of the influence of mechanical stresses on the Hall plate 110.

In the following operating mode, a measuring period also comprises two measuring phases in which the control device 124 sets different operating states of the Hall sensor measuring system 100 in immediate succession. However, these differ here from the previously described operating mode due to the polarity of the differential input signal 121 of the amplifier 120, but not from one another. In the first test operating state, the control device 124 sets the operating states twenty-one to twenty-two using the control signal 125. In the first test operating state, the control device 124 preferably sets one of these two operating states in succession in two consecutive measuring phases of the measuring period. The control device 124 preferably sets these operating states until the control device 124 has preferably set all two operating states exactly once for the duration of a measuring phase and has determined the measuring voltages V _tst21 and V _tst22 exactly once each. The control device 124 then preferably determines the determined measuring voltage V _tst as $${\text{V}}_{\text{tst}}=-\left({\text{V}}_{\text{tst21}}+{\text{V}}_{\text{tst22}}\right)/2$$

The advantage is a certain elimination of the influence of mechanical stresses on the Hall plate 110.

The control device 124 can, if necessary, by reconfiguring the analog switching mechanism 140, electrically connect the differential input signal 121 of the amplifier 120 to other pairs of connections of the Hall plate 110 without changing the current feed of the measuring current I _Hall . The control device 124 can thus record further respective voltage measurement values. The control device 124 can compare the determined respective resistance values with respective tolerance resistance ranges. The control device 124 can, if necessary, conclude that there are errors in the Hall plate 110 and/or device parts of the Hall sensor measuring system 100. The control device 124 can, if necessary, signal such an error via the data interface 129.

Two-phase operation with two-phase spinning and with choppers

A measuring period now comprises two times two measuring phases, i.e. a total of four measuring phases, in which the control device 124 sets different operating states of the Hall sensor measuring system 100 and their complementary operating states with inverted differential input signal 121 of the amplifier 120 in immediate succession. In the first test operating state, the control device 124 sets the operating states five to six and twenty-one to twenty-two using the control signal 125. In the first test operating state, the control device 124 preferably sets one of these four operating states one after the other in four consecutive measuring phases of the measuring period. The control device 124 preferably sets these operating states until the control device 124 has preferably set all four operating states exactly once for the duration of a measuring phase and has determined the measuring voltages V _tst5 , V _tst6 , V _tst17 and V _tst18 exactly once each. Preferably, the control device 124 then determines the determined measurement voltage V _tst as $${\text{V}}_{\text{tst}}=\left({\text{V}}_{\text{tst5}}+{\text{V}}_{\text{tst6}}-{\text{V}}_{\text{tst21}}-{\text{V}}_{\text{tst22}}\right)/4$$

1. a. eine gewisse Eliminierung des Einflusses mechanischer Spannungen auf die Hall-Platte 110 und
2. b. die Reduzierung des 1/f Rauschens des Verstärkers 120 und des Analog-zu-Digital-Wandlers 130.

Advantages are

1. a. a certain elimination of the influence of mechanical stresses on the Hall plate 110 and
2. b. reducing the 1/f noise of the amplifier 120 and the analog-to-digital converter 130.

The control device 124 can, if necessary, by reconfiguring the analog switching mechanism 140, also electrically connect the differential input signal 121 of the amplifier 120 to other pairs of connections of the Hall plate 110 without changing the current feed of the measuring current I _Hall . The control device 124 can thus record further respective voltage measurement values. The control device 124 can compare the determined respective resistance values with respective tolerance resistance ranges. The control device 124 can, if necessary, conclude that there are errors in the Hall plate 110 and/or device parts of the Hall sensor measuring system 100. The control device 124 can, if necessary, signal such an error via the data interface 129.

Four-phase operation with four-phase spinning and without chopper

A measurement period now comprises four measurement phases in which the control device 124 sets different operating states of the Hall sensor measuring system 100 in immediate succession. However, these do not differ here in terms of the polarity of the differential input signal 121 of the amplifier 120.

Vorteil ist eine weit gehende Eliminierung des Einflusses mechanischer Spannungen auf die Hall-Platte 110.In the first test operating state, the control device 124 sets the operating states five to eight by means of the control signal 125. In the first test operating state, the control device 124 preferably sets one of these four operating states in succession in four consecutive measuring phases of the measuring period. The control device 124 preferably sets these operating states until the control device 124 has preferably set all two operating states exactly once for the duration of a measuring phase and has determined the measuring voltages V _tst5 , V _tst6 , V _tst7 , and V _tst8 exactly once each. The control device 124 then preferably determines the determined measuring voltage V _tst as $${\text{V}}_{\text{tst}}=\left({\text{V}}_{\text{tst5}}+{\text{V}}_{\text{tst6}}+{\text{V}}_{\text{tst7}}+{\text{V}}_{\text{tst8}}\right)/4$$

The advantage is a largely elimination of the influence of mechanical stresses on the Hall plate 110.

In the following operating mode, a measuring period also comprises four measuring phases in which the control device 124 sets different operating states of the Hall sensor measuring system 100 in immediate succession. However, these differ here from the previously described operating mode due to the polarity of the differential input signal 121 of the amplifier 120, but not from one another. In the first test operating state, the control device 124 sets the operating states twenty-one to twenty-four using the control signal 125. In the first test operating state, the control device 124 preferably sets one of these four operating states one after the other in four consecutive measuring phases of the measuring period. The control device 124 preferably sets the operating states until the control device 124 has preferably set all four operating states exactly once for the duration of a measuring phase and has determined the measuring voltages V _tst21 , V _tst22 , V _tst23 and V _tst24 exactly once each. Preferably, the control device 124 then determines the determined measurement voltage V _tst as $${\text{V}}_{\text{tst}}=-\left({\text{V}}_{\text{tst21}}+{\text{V}}_{\text{tst22}}+{\text{V}}_{\text{tst23}}+{\text{V}}_{\text{tst23}}\right)/4$$

1. a. eine gewisse Eliminierung des Einflusses mechanischer Spannungen auf die Hall-Platte 110 und
2. b. die Reduzierung des 1/f Rauschens des Verstärkers 120 und des Analog-zu-Digital-Wandlers 130.

Advantages are

1. a certain elimination of the influence of mechanical stresses on the Hall plate 110 and
2. b. reducing the 1/f noise of the amplifier 120 and the analog-to-digital converter 130.

The control device 124 can, if necessary, by reconfiguring the analog switching mechanism 140, also electrically connect the differential input signal 121 of the amplifier 120 to other pairs of connections of the Hall plate 110 without changing the current feed of the measuring current I _Hall . The control device 124 can thus record further respective voltage measurement values. The control device 124 can compare the determined respective resistance values with respective tolerance resistance ranges. The control device 124 can, if necessary, conclude that there are errors in the Hall plate 110 and/or device parts of the Hall sensor measuring system 100. The control device 124 can, if necessary, signal such an error via the data interface 129.

Four-phase operation with four-phase spinning and with choppers

A measuring period now comprises four times two measuring phases, i.e. a total of eight measuring phases, in which the control device 124 performs different operating conditions immediately one after the other. states of the Hall sensor measuring system 100 and their complementary operating states with inverted differential input signal 121 of the amplifier 120. The control device 124 sets the operating states five to eight and twenty-one to twenty-four in the first test operating state by means of the control signal 125. Preferably, the control device 124 sets one of these eight operating states in each case in eight consecutive measuring phases of the measuring period in the first test operating state. The control device 124 preferably sets these operating states until the control device 124 has preferably set all eight operating states exactly once for the duration of a measuring phase and has determined the measuring voltages V _tst5 , V _tst6 , V _tst7 , V _tst8 , V _tst21 , V _tst22 , V _tst23 and V _tst24 exactly once each. Preferably, the control device 124 then determines the determined measuring voltage V _tst as $${\text{V}}_{\text{tst}}=\left({\text{V}}_{\text{tst5}}+{\text{V}}_{\text{tst6}}+{\text{V}}_{\text{tst7}}+{\text{V}}_{\text{tst8}}-{\text{V}}_{\text{tst21}}-{\text{V}}_{\text{tst22}}-{\text{V}}_{\text{tst23}}-{\text{V}}_{\text{tst24}}\right)/\mathrm{8th}$$

1. a. eine weit gehende Eliminierung des Einflusses mechanischer Spannungen auf die Hall-Platte 110 und
2. b. die Reduzierung des 1/f Rauschens des Verstärkers 120 und des Analog-zu-Digital-Wandlers 130.

Advantages are

1. a. a far-reaching elimination of the influence of mechanical stresses on the Hall plate 110 and
2. b. reducing the 1/f noise of the amplifier 120 and the analog-to-digital converter 130.

The control device 124 can, if necessary, by reconfiguring the analog switching mechanism 140, electrically connect the differential input signal 121 of the amplifier 120 to other pairs of connections of the Hall plate 110 without changing the current feed of the measuring current I _Hall . The control device 124 can thus record further respective voltage measurement values and compare the determined respective resistance values with respective tolerance resistance ranges. The control device 124 can, if necessary, conclude that there are errors in the Hall plate 110 and/or device parts of the Hall sensor measuring system 100. The control device 124 can, if necessary, signal such an error via the data interface 129.

C) SECOND TEST OPERATING CONDITION

The second test operating state is typically used to check the resistance value of the Hall plate 110 and the homogeneity of the resistance value of the Hall plate 110 while compensating for an existing magnetic field with a known flux density B. To compensate for the magnetic field with the known flux density B, a test current source 151, 152 feeds a test current I _tst into the Hall plate 110, preferably perpendicular to the measuring current I _Hall . This test current I _tst preferably compensates for the effect of the magnetic field with the flux density B on the detection of the value of the electrical resistance of the Hall plate 110.

TEST OPERATION TO DETERMINE THE ELECTRICAL RESISTANCE OF HALL PLATE 110 WITH MAGNETIC FIELD COMPENSATION

Single-phase operation without spinning and without chopper

A measuring period initially comprises only one measuring phase in which the control device 124 sets exactly one operating state of the Hall sensor measuring system 100.

In the second test operating state without spinning and without chopping, the control device 124 sets the operating state nine by means of the control signal 125. The control device 124 then preferably determines the measurement voltage V _tst determined by means of the amplifier 120 and the analog-to-digital converter 130 as $${\text{V}}_{\text{tst}}={\text{V}}_{\text{tst9}}$$

In an analogous manner, the control device 124 can determine the measurement voltages V _tst10 , V _tst11 and V _tst12 for the respective operating states ten to twelve in the second test operating state. From these, the control device 124 can then use the set value of the measurement current I _Hall and the set value of the test current I _tst to deduce a respective electrical resistance value of the Hall plate 110. The control device 114 can then compare one or more or all of these respective electrical resistance values of the Hall plate 110 with a respective resistance tolerance range. If one or more respective electrical resistance values of the Hall plate 110 are outside the respective resistance tolerance range, the control device 124 can conclude that there is a fault in the Hall plate 110 or other device parts (153, 154, 120, 130) of the Hall sensor measuring system 100 and signal this fault, for example, to a test system via a data interface 129.

The control device 124 can, if necessary by reconfiguring the analog switching mechanism 140, also electrically connect the differential input signal 121 of the amplifier 120 to other pairs of connections of the Hall plate 110 without changing the current feed of the measuring current I _Hall and/or without changing the current feed of the test current I _tst and thus record further respective voltage measurement values and compare the determined respective resistance values with respective tolerance resistance ranges and, if necessary, conclude errors in the Hall plate 110 and/or device parts of the Hall sensor measuring system 100 and, if necessary, signal such an error via the data interface 129.

A measurement period in the next operating mode initially continues to be only one measurement phase, in which the control device 124 sets exactly one operating state of the Hall sensor measuring system 100. This differs by the polarity of the differential input signal 121 of the amplifier 120. In the second test operating state without spinning and without chopping, the control device 124 now alternatively sets the operating state twenty-five by means of the control signal 125. The control device 124 then preferably determines the measurement voltage V _tst determined by means of the amplifier 120 and the analog-to-digital converter 130 as $${\text{V}}_{\text{tst}}=-{\text{V}}_{\text{tst25}}$$

In an analogous manner, the control device 124 can determine the measurement voltages V _tst26 , V _tst27 and V _tst23 for the respective operating states twenty-six to twenty-eight in the second test operating state. From these, the control device 124 can then use the set value of the measurement current I _Hall and/or the set value of the test current I _tst to infer a respective electrical resistance value of the Hall plate 110. The control device 110 can then compare one or more or all of these respective electrical resistance values of the Hall plate 110 with a respective resistance tolerance range. If one or more respective electrical resistance values of the Hall plate 110 are outside the respective resistance tolerance range, the control device 124 can infer a fault in the Hall plate 110 or other device parts (153, 154, 120, 130) of the Hall sensor measuring system 100. If one or more respective electrical resistance values of the Hall plate 110 are outside the respective resistance tolerance range, the control device 124 can signal this error, for example, to a test system via a data interface 129.

The control device 124 can, if necessary by reconfiguring the analog switching mechanism 140, also electrically connect the differential input signal 121 of the amplifier 120 to other pairs of connections of the Hall plate 110 without changing the current feed of the measuring current I _Hall and/or without changing the current feed of the test current I _tst . The control device 124 can thus record further respective voltage measurement values. The control device 124 can compare the determined respective resistance values with respective tolerance resistance ranges. The control device 124 can, if necessary, conclude that there are errors in the Hall plate 110 and/or in device parts of the Hall sensor measuring system 100. The control device 124 can, if necessary, signal such an error via the data interface 129.

Single-phase operation without spinning and with choppers

A measurement period now comprises two measurement phases in which the control device 124 sets two different, mutually complementary operating states of the Hall sensor measuring system 100 immediately one after the other. These differ in the polarity of the differential input signal 121 of the amplifier 120. The control device 124 can alternatively set the operating states nine and twenty-five in the second test operating state without spinning and with choppers using the control signal 125 in two measurement phases that preferably follow one another immediately. The control device 124 then preferably determines the determined test voltage V _tst as $${\text{V}}_{\text{tst}}=\left({\text{V}}_{\text{tst9}}-{\text{V}}_{\text{tst25}}\right)/2$$

1. a. die Reduzierung des 1/f Rauschens des Verstärkers 120 und des Analog-zu-Digital-Wandlers 130 und
2. b. ggf. die Möglichkeit der Eliminierung des Einflusses eines externen Magnetfelds, beispielsweise des Erdmagnetfelds durch die Einspeisung des Teststroms I_tst.

From these, the control device 124 can then use the set value of the measuring current I _Hall and the set value of the test current I _tst to infer a respective electrical resistance value of the Hall plate 110. The control device 110 can then compare one or more or all of these respective electrical resistance values of the Hall plate 110 with a respective resistance tolerance range. If one or more respective electrical resistance values of the Hall plate 110 are outside the respective resistance tolerance range, the control device 124 can infer a fault in the Hall plate 110 or other device parts (153, 154, 120, 130) of the Hall sensor measuring system 100. If one or more respective electrical resistance values of the Hall plate 110 outside the respective resistance tolerance range, the control device 124 can signal this error, for example, to a test system via a data interface 129. Advantages are

1. a. reducing the 1/f noise of the amplifier 120 and the analog-to-digital converter 130 and
2. b. if necessary, the possibility of eliminating the influence of an external magnetic field, for example the Earth's magnetic field, by feeding the test current I _tst .

The control device 124 can, if necessary by reconfiguring the analog switching mechanism 140, also electrically connect the differential input signal 121 of the amplifier 120 to other pairs of connections of the Hall plate 110 without changing the current feed of the measuring current I _Hall and/or without changing the current feed of the test current I _tst . The control device 124 can thus record further respective voltage measurement values. The control device 124 can compare the determined respective resistance values with respective tolerance resistance ranges. The control device 124 can, if necessary, conclude that there are errors in the Hall plate 110 and/or in device parts of the Hall sensor measuring system 100. The control device 124 can, if necessary, signal such an error via the data interface 129.

Two-phase operation with two-phase spinning and without chopper

A measurement period now comprises two measurement phases in which the control device 124 sets different operating states of the Hall sensor measuring system 100 in immediate succession. However, these do not differ here in terms of the polarity of the differential input signal 121 of the amplifier 120.

Vorteile sind

1. a. eine gewisse Eliminierung des Einflusses mechanischer Spannungen auf die Hall-Platte 110 und
2. b. ggf. die Möglichkeit der Eliminierung des Einflusses eines externen Magnetfelds, beispielsweise des Erdmagnetfelds durch die Einspeisung des Teststroms I_tst.

In the second test operating state, the control device 124 sets the operating states nine to ten by means of the control signal 125. In the second test operating state, the control device 124 preferably sets one of these two operating states in succession in two consecutive measuring phases of the measuring period. The control device 124 preferably sets these operating states until the control device 124 has preferably set all two operating states exactly once for the duration of a measuring phase and has determined the measuring voltages V _tst9 and V _tst10 exactly once each. The control device 124 then preferably determines the determined measuring voltage V _tst as $${\text{V}}_{\text{tst}}=\left({\text{V}}_{\text{tst9}}+{\text{V}}_{\text{tst10}}\right)/2$$

Advantages are

1. a certain elimination of the influence of mechanical stresses on the Hall plate 110 and
2. b. if necessary, the possibility of eliminating the influence of an external magnetic field, for example the Earth's magnetic field, by supplying the test current I _tst .

In the following operating mode, a measuring period also comprises two measuring phases in which the control device 124 sets different operating states of the Hall sensor measuring system 100 in immediate succession. However, these differ here from the previously described operating mode due to the polarity of the differential input signal 121 of the amplifier 120, but not from one another. In the second test operating state, the control device 124 sets the operating states twenty-five to twenty-six using the control signal 125. In the second test operating state, the control device 124 preferably sets one of these two operating states in succession in two consecutive measuring phases of the measuring period. The control device 124 preferably sets these operating states until the control device 124 has preferably set all two operating states exactly once for the duration of a measuring phase and has determined the measuring voltages V _tst25 and V _tst26 exactly once each. The control device 124 then preferably determines the determined measuring voltage V _tst as $${\text{V}}_{\text{tst}}=-\left({\text{V}}_{\text{tst25}}+{\text{V}}_{\text{tst26}}\right)/2$$

1. a. eine gewisse Eliminierung des Einflusses mechanischer Spannungen auf die Hall-Platte 110 und
2. b. ggf. die Möglichkeit der Eliminierung des Einflusses eines externen Magnetfelds, beispielsweise des Erdmagnetfelds durch die Einspeisung des Teststroms I_tst.

Advantages are

1. a certain elimination of the influence of mechanical stresses on the Hall plate 110 and
2. b. if necessary, the possibility of eliminating the influence of an external magnetic field, for example the Earth's magnetic field, by feeding the test current I _tst .

The control device 124 can, if necessary by reconfiguring the analog switching mechanism 140, also electrically connect the differential input signal 121 of the amplifier 120 to other pairs of connections of the Hall plate 110 without changing the current feed of the measuring current I _Hall and/or without changing the current feed of the test current I _tst . The control device 124 can thus record further respective voltage measurement values. The control device 124 can compare the determined respective resistance values with respective tolerance resistance ranges. The control device 124 can, if necessary, conclude that there are errors in the Hall plate 110 and/or in device parts of the Hall sensor measuring system 100. The control device 124 can, if necessary, signal such an error via the data interface 129.

Two-phase operation with two-phase spinning and with choppers

A measuring period now comprises two times two measuring phases, i.e. a total of four measuring phases, in which the control device 124 sets different operating states of the Hall sensor measuring system 100 and their complementary operating states with inverted differential input signal 121 of the amplifier 120 in immediate succession. In the second test operating state, the control device 124 sets the operating states nine to ten and twenty-five to twenty-six using the control signal 125. In the second test operating state, the control device 124 preferably sets one of these four operating states one after the other in four consecutive measuring phases of the measuring period. The control device 124 preferably sets the operating states until the control device 124 has preferably set all four operating states exactly once for the duration of a measuring phase and has determined the measuring voltages V _tst9 , V _tst10 , V _tst25 and V _tst26 exactly once each. Preferably, the control device 124 then determines the determined measurement voltage V _tst as $${\text{V}}_{\text{tst}}=\left({\text{V}}_{\text{tst9}}+{\text{V}}_{\text{tst10}}-{\text{V}}_{\text{tst25}}-{\text{V}}_{\text{tst26}}\right)/4$$

1. a. eine gewisse Eliminierung des Einflusses mechanischer Spannungen auf die Hall-Platte 110 und
2. b. die Reduzierung des 1/f Rauschens des Verstärkers 120 und des Analog-zu-Digital-Wandlers 130
3. c. und ggf. die Möglichkeit der Eliminierung des Einflusses eines externen Magnetfelds, beispielsweise des Erdmagnetfelds durch die Einspeisung des Teststroms I_tst.

Advantages are

1. a. a certain elimination of the influence of mechanical stresses on the Hall plate 110 and
2. b. reducing the 1/f noise of the amplifier 120 and the analog-to-digital converter 130
3. c. and, if necessary, the possibility of eliminating the influence of an external magnetic field, for example the Earth's magnetic field, by supplying the test current I _tst .

The control device 124 can, if necessary by reconfiguring the analog switching mechanism 140, also electrically connect the differential input signal 121 of the amplifier 120 to other pairs of connections of the Hall plate 110 without changing the current feed of the measuring current I _Hall and/or without changing the current feed of the test current I _tst . The control device 124 can thus record further respective voltage measurement values. The control device 124 can compare the determined respective resistance values with respective tolerance resistance ranges. The control device 124 can, if necessary, conclude that there are errors in the Hall plate 110 and/or in device parts of the Hall sensor measuring system 100. The control device 124 can, if necessary, signal such an error via the data interface 129.

Four-phase operation with four-phase spinning and without chopper

A measurement period now comprises four measurement phases in which the control device 124 sets different operating states of the Hall sensor measuring system 100 in immediate succession. However, these do not differ here in terms of the polarity of the differential input signal 121 of the amplifier 120.

In the second test operating state, the control device 124 sets the operating states nine to twelve by means of the control signal 125. In the second test operating state, the control device 124 preferably sets one of these four operating states in succession in four consecutive measuring phases of the measuring period. The control device 124 preferably sets these operating states until the control device 124 has preferably set all two operating states exactly once for the duration of a measuring phase and has determined the measuring voltages V _tst9 , V _tst10 , V _tst11 , and V _tst12 exactly once each. The control device 124 then preferably determines the determined measuring voltage V _tst as $${\text{V}}_{\text{tst}}=\left({\text{V}}_{\text{tst9}}+{\text{V}}_{\text{tst10}}+{\text{V}}_{\text{tst11}}+{\text{V}}_{\text{tst12}}\right)/4$$

1. a. eine weit gehende Eliminierung des Einflusses mechanischer Spannungen auf die Hall-Platte 110. Und
2. b. ggf. die Möglichkeit der Eliminierung des Einflusses eines externen Magnetfelds, beispielsweise des Erdmagnetfelds durch die Einspeisung des Teststroms I_tst.

Advantages are

1. a. a far-reaching elimination of the influence of mechanical stresses on the Hall plate 110. And
2. b. if necessary, the possibility of eliminating the influence of an external magnetic field, for example the Earth's magnetic field, by feeding the test current I _tst .

In the following operating mode, a measuring period also comprises four measuring phases in which the control device 124 sets different operating states of the Hall sensor measuring system 100 in immediate succession. However, these differ here from the previously described operating mode due to the polarity of the differential input signal 121 of the amplifier 120, but not from one another. In the second test operating state, the control device 124 sets the operating states twenty-five to twenty-eight using the control signal 125. In the second test operating state, the control device 124 preferably sets one of these four operating states one after the other in four consecutive measuring phases of the measuring period. The control device 124 preferably sets these operating states until the control device 124 has preferably set all four operating states exactly once for the duration of a measuring phase and has determined the measuring voltages V _tst25 , V _tst26 , V _tst27 and V _tst28 exactly once each. Preferably, the control device 124 then determines the determined measurement voltage V _tst as $${\text{V}}_{\text{tst}}=-\left({\text{V}}_{\text{tst}25}+{\text{V}}_{\text{tst}26}+{\text{V}}_{\text{tst}27}+{\text{V}}_{\text{tst}28}\right)/4$$

1. a. eine gewisse Eliminierung des Einflusses mechanischer Spannungen auf die Hall-Platte 110 und
2. b. die Reduzierung des 1/f Rauschens des Verstärkers 120 und des Analog-zu-Digital-Wandlers 130 und
3. c. ggf. die Möglichkeit der Eliminierung des Einflusses eines externen Magnetfelds, beispielsweise des Erdmagnetfelds durch die Einspeisung des Teststroms I_tst.

Advantages are

1. a. a certain elimination of the influence of mechanical stresses on the Hall plate 110 and
2. b. reducing the 1/f noise of the amplifier 120 and the analog-to-digital converter 130 and
3. c. if necessary, the possibility of eliminating the influence of an external magnetic field, for example the Earth's magnetic field, by supplying the test current I _tst .

The control device 124 can, if necessary by reconfiguring the analog switching mechanism 140, also electrically connect the differential input signal 121 of the amplifier 120 to other pairs of connections of the Hall plate 110 without changing the current feed of the measuring current I _Hall and/or the current feed of the test current I _tst . The control device 124 can thus record further respective voltage measurement values. The control device 124 can compare the determined respective resistance values with respective tolerance resistance ranges. The control device 124 can, if necessary, conclude that there are errors in the Hall plate 110 and/or device parts of the Hall sensor measuring system 100. The control device 124 can, if necessary, signal such an error via the data interface 129.

Four-phase operation with four-phase spinning and with choppers

A measuring period now comprises four times two measuring phases, i.e. a total of eight measuring phases, in which the control device 124 sets different operating states of the Hall sensor measuring system 100 and their complementary operating states with inverted differential input signal 121 of the amplifier 120 in immediate succession. In the second test operating state, the control device 124 sets the operating states nine to twelve and twenty-five to twenty-eight using the control signal 125. Preferably, in the second test operating state, the control device 124 sets one of these eight operating states in succession in eight consecutive measuring phases of the measuring period. The control device 124 preferably sets these operating states until the control device 124 has preferably set all eight operating states exactly once for the duration of a measurement phase and has determined the measurement voltages V _tst9 , V _tst10 , V _tst11 , V _tst12 , V _tst25 , V _tst26 , V _tst27 and V _tst28 each exactly once. The control device 124 then preferably determines the determined measurement voltage V _tst as $${\text{V}}_{\text{tst}}=\left({\text{V}}_{\text{tst}9}+{\text{V}}_{\text{tst}10}+{\text{V}}_{\text{tst}11}+{\text{V}}_{\text{tst}12}-{\text{V}}_{\text{tst}25}-{\text{V}}_{\text{tst}26}-{\text{V}}_{\text{tst}27}-{\text{V}}_{\text{tst}28}\right)/\mathrm{8th}$$

1. a. eine weit gehende Eliminierung des Einflusses mechanischer Spannungen auf die Hall-Platte 110 und
2. b. die Reduzierung des 1/f Rauschens des Verstärkers 120 und des Analog-zu-Digital-Wandlers 130 und
3. c. ggf. die Möglichkeit der Eliminierung des Einflusses eines externen Magnetfelds, beispielsweise des Erdmagnetfelds durch die Einspeisung des Teststroms I_tst.

Advantages are

1. a. a far-reaching elimination of the influence of mechanical stresses on the Hall plate 110 and
2. b. reducing the 1/f noise of the amplifier 120 and the analog-to-digital converter 130 and
3. c. if necessary, the possibility of eliminating the influence of an external magnetic field, for example the Earth's magnetic field, by supplying the test current I _tst .

The control device 124 can, if necessary by reconfiguring the analog switching mechanism 140, also electrically connect the differential input signal 121 of the amplifier 120 to other pairs of connections of the Hall plate 110 without changing the current feed of the measuring current I _Hall and/or without changing the current feed of the test current I _tst . The control device 124 can thus record further respective voltage measurement values. The control device 124 can compare the determined respective resistance values with respective tolerance resistance ranges. The control device 124 can, if necessary, conclude that there are errors in the Hall plate 110 and/or in device parts of the Hall sensor measuring system 100. The control device 124 can, if necessary, signal such an error via the data interface 129.

D) THIRD TEST OPERATING CONDITION

The third test operating state is typically used to simulate the generation of a Hall voltage on the Hall plate 110 by feeding in a test current I _tst perpendicular to the measuring current I _Hall . Here too, the control device 124 and/or a test system can check the homogeneity of the Hall voltage generation of the Hall plate 110. To simulate the magnetic field, a test current source 151, 152 feeds the test current I _tst into the Hall plate 110, preferably perpendicular to the measuring current I _Hall . This test current I _tst preferably simulates the effect of the magnetic field with the flux density B on the detection of the value of the electrical resistance of the Hall plate 110. This essentially makes handling systems with the calibrated generation of magnetic flux densities B perpendicular to the surface of the Hall plate 110 superfluous.

TEST OPERATION TO DETERMINE THE ELECTRICAL RESISTANCE OF HALL PLATE 110 WITH MAGNETIC FIELD COMPENSATION

Single-phase operation without spinning and without chopper

A measuring period initially comprises only one measuring phase in which the control device 124 sets exactly one operating state of the Hall sensor measuring system 100.

In the third test operating state without spinning and without chopping, the control device 124 sets the operating state thirteen by means of the control signal 125. The control device 124 then preferably determines the measurement voltage V _tst determined by means of the amplifier 120 and the analog-to-digital converter 130 as $${\text{V}}_{\text{tst}}={\text{V}}_{\text{tst}13}$$

In an analogous manner, the control device 124 can determine the measurement voltages V _tst14 , V _tst15 and V _tst16 for the respective operating states fourteen to sixteen in the third test operating state. From these, the control device 124 can then use the set value of the measurement current I _Hall and the set value of the test current I _tst to infer a respective electrical resistance value of the Hall plate 110. The control device 114 can then compare one or more or all of these respective electrical resistance values of the Hall plate 110 with a respective resistance tolerance range. If one or more respective electrical resistance values of the Hall plate 110 are outside the respective resistance tolerance range, the control device 124 can infer a fault in the Hall plate 110 or other device parts (153, 154, 120, 130) of the Hall sensor measuring system 100. If one or more respective electrical resistance values of the Hall plate 110 are outside the respective resistance tolerance range, the control device 124 can signal this error, for example, to a test system via a data interface 129.

The control device 124 can, if necessary by reconfiguring the analog switching mechanism 140, also electrically connect the differential input signal 121 of the amplifier 120 to other pairs of connections of the Hall plate 110 without changing the current feed of the measuring current I _Hall and/or without changing the current feed of the test current I _tst . The control device 124 can thus record further respective voltage measurement values. The control device 124 can compare the determined respective resistance values with respective tolerance resistance ranges. The control device 124 can, if necessary, conclude that there are errors in the Hall plate 110 and/or in device parts of the Hall sensor measuring system 100. The control device 124 can, if necessary, signal such an error via the data interface 129.

A measuring period in the next operating mode initially continues to be only one measuring phase in which the control device 124 sets exactly one operating state of the Hall sensor measuring system 100. This differs by the polarity of the differential input signal 121 of the amplifier 120. The control device 124 now alternatively sets the operating state twenty-nine in the third test operating state without spinning and without chopping by means of the control signal 125. The control device 124 then preferably determines the measurement voltage V _tst determined by means of the amplifier 120 and the analog-to-digital converter 130 as $${\text{V}}_{\text{tst}}=-{\text{V}}_{\text{tst}29}$$

In an analogous manner, the control device 124 can determine the measurement voltages V _tst30 , V _tst31 and V _tst32 for the respective operating states thirty to thirty-two in the third test operating state. From these, the control device 124 can then use the set value of the measurement current I _Hall and/or the set value of the test current I _tst to infer a respective electrical resistance value of the Hall plate 110. The control device 110 can then compare one or more or all of these respective electrical resistance values of the Hall plate 110 with a respective resistance tolerance range. If one or more respective electrical resistance values of the Hall plate 110 are outside the respective resistance tolerance range, the control device 124 can infer a fault in the Hall plate 110 or other device parts (153, 154, 120, 130) of the Hall sensor measuring system 100. If one or more respective electrical resistance values of the Hall plate 110 are outside the respective resistance tolerance range, the control device 124 can signal this error, for example, to a test system via a data interface 129.

The control device 124 can, if necessary by reconfiguring the analog switching mechanism 140, also electrically connect the differential input signal 121 of the amplifier 120 to other pairs of connections of the Hall plate 110 without changing the current feed of the measuring current I _Hall and/or without changing the current feed of the test current I _tst . The control device 124 can thus record further respective voltage measurement values. The control device 124 can compare the determined respective resistance values with respective tolerance resistance ranges. The control device 124 can, if necessary, conclude that there are errors in the Hall plate 110 and/or in device parts of the Hall sensor measuring system 100. The control device 124 can, if necessary, signal such an error via the data interface 129.

Single-phase operation without spinning and with choppers

A measurement period now comprises two measurement phases in which the control device 124 sets two different, mutually complementary operating states of the Hall sensor measuring system 100 immediately one after the other. These differ in the polarity of the differential input signal 121 of the amplifier 120. The control device 124 can alternatively set the operating states thirteen and twenty-nine in the third test operating state without spinning and with choppers using the control signal 125 in two measurement phases that preferably follow one another immediately. The control device 124 then preferably determines the determined test voltage V _tst as $${\text{V}}_{\text{tst}}=\left({\text{V}}_{\text{tst}13}-{\text{V}}_{\text{tst}29}\right)/2$$

• c. die Reduzierung des 1/f Rauschens des Verstärkers 120 und des Analog-zu-Digital-Wandlers 130 und
• d. die Möglichkeit der Simulation des Einflusses eines externen Magnetfelds, beispielsweise des Erdmagnetfelds oder eines zu vermessenden Magnetfelds, durch die Einspeisung des Teststroms I_tst.

From these, the control device 124 can then use the set value of the measuring current I _Hall and the set value of the test current I _tst to infer a respective electrical resistance value of the Hall plate 110. The control device 110 can then compare one or more or all of these respective electrical resistance values of the Hall plate 110 with a respective resistance tolerance range. If one or more respective electrical resistance values of the Hall plate 110 are outside the respective resistance tolerance range, the control device 124 can infer a fault in the Hall plate 110 or other device parts (153, 154, 120, 130) of the Hall sensor measuring system 100. If one or more respective electrical resistance values of the Hall plate 110 are outside the respective resistance tolerance range, the control device 124 can signal this fault to a test system via a data interface 129, for example. Advantages are

• c. reducing the 1/f noise of the amplifier 120 and the analog-to-digital converter 130 and
• d. the possibility of simulating the influence of an external magnetic field, for example the earth's magnetic field or a magnetic field to be measured, by feeding in the test current I _tst .

The control device 124 can, if necessary by reconfiguring the analog switching mechanism 140, also electrically connect the differential input signal 121 of the amplifier 120 to other pairs of terminals of the Hall plate 110 without the current feed of the measuring current I _Hall and/or without the current feed supply of the test current I _tst . The control device 124 can thus record further respective voltage measurement values. The control device 124 can compare the determined respective resistance values with respective tolerance resistance ranges. The control device 124 can possibly conclude that there are errors in the Hall plate 110 and/or device parts of the Hall sensor measuring system 100. The control device 124 can possibly signal such an error via the data interface 129.

Two-phase operation with two-phase spinning and without chopper

A measurement period now comprises two measurement phases in which the control device 124 sets different operating states of the Hall sensor measuring system 100 in immediate succession. However, these do not differ here in terms of the polarity of the differential input signal 121 of the amplifier 120.

In the third test operating state, the control device 124 sets the operating states thirteen to fourteen by means of the control signal 125. In the third test operating state, the control device 124 preferably sets one of these two operating states in succession in two consecutive measuring phases of the measuring period. The control device 124 preferably sets the operating states until the control device 124 has preferably set all two operating states exactly once for the duration of a measuring phase and has determined the measuring voltages V _tst13 and V _tst14 exactly once each. The control device 124 then preferably determines the determined measuring voltage V _tst as $${\text{V}}_{\text{tst}}=\left({\text{V}}_{\text{tst}13}+{\text{V}}_{\text{tst}14}\right)/2$$

1. a. eine gewisse Eliminierung des Einflusses mechanischer Spannungen auf die Hall-Platte 110 und
2. b. die Möglichkeit der Simulation des Einflusses eines externen Magnetfelds, beispielsweise des Erdmagnetfelds oder eines zu vermessenden Magnetfelds, durch die Einspeisung des Teststroms I_tst.

Advantages are

1. a. a certain elimination of the influence of mechanical stresses on the Hall plate 110 and
2. b. the possibility of simulating the influence of an external magnetic field, for example the earth's magnetic field or a magnetic field to be measured, by feeding in the test current I _tst .

In the following operating mode, a measuring period also comprises two measuring phases in which the control device 124 sets different operating states of the Hall sensor measuring system 100 in immediate succession. However, these differ here from the previously described operating mode due to the polarity of the differential input signal 121 of the amplifier 120, but not from one another. In the third test operating state, the control device 124 sets the operating states twenty-nine to thirty using the control signal 125. In the third test operating state, the control device 124 preferably sets one of these two operating states in succession in two consecutive measuring phases of the measuring period. The control device 124 preferably sets these operating states until the control device 124 has preferably set all two operating states exactly once for the duration of a measuring phase and has determined the measuring voltages V _tst29 and V _tst30 exactly once each. The control device 124 then preferably determines the determined measuring voltage V _tst as $${\text{V}}_{\text{tst}}=-\left({\text{V}}_{\text{tst}29}+{\text{V}}_{\text{tst}30}\right)/2$$

• c. eine gewisse Eliminierung des Einflusses mechanischer Spannungen auf die Hall-Platte 110 und
• d. die Möglichkeit der Simulation des Einflusses eines externen Magnetfelds, beispielsweise des Erdmagnetfelds oder eines zu vermessenden Magnetfelds, durch die Einspeisung des Teststroms I_tst.

Advantages are

• c. a certain elimination of the influence of mechanical stresses on the Hall plate 110 and
• d. the possibility of simulating the influence of an external magnetic field, for example the earth's magnetic field or a magnetic field to be measured, by feeding in the test current I _tst .

The control device 124 can, if necessary by reconfiguring the analog switching mechanism 140, also electrically connect the differential input signal 121 of the amplifier 120 to other pairs of connections of the Hall plate 110 without changing the current feed of the measuring current I _Hall and/or without changing the current feed of the test current I _tst . The control device 124 can thus record further respective voltage measurement values. The control device 124 can compare the determined respective resistance values with respective tolerance resistance ranges. The control device 124 can, if necessary, conclude that there are errors in the Hall plate 110 and/or in device parts of the Hall sensor measuring system 100. The control device 124 can, if necessary, signal such an error via the data interface 129.

Two-phase operation with two-phase spinning and with choppers

A measuring period now comprises two times two measuring phases, i.e. a total of four measuring phases, in which the control device 124 sets different operating states of the Hall sensor measuring system 100 and their complementary operating states with inverted differential input signal 121 of the amplifier 120 in immediate succession. In the third test operating state, the control device 124 sets the operating states thirteen to fourteen and twenty-nine to thirty using the control signal 125. In the third test operating state, the control device 124 preferably sets one of these four operating states one after the other in four consecutive measuring phases of the measuring period. The control device 124 preferably sets the operating states until the control device 124 has preferably set all four operating states exactly once for the duration of a measuring phase and has determined the measuring voltages V _tst13 , V _tst14 , V _tst29 and V _tst30 exactly once each. Preferably, the control device 124 then determines the determined measurement voltage V _tst as $${\text{V}}_{\text{tst}}=\left({\text{V}}_{\text{tst}13}+{\text{V}}_{\text{tst}14}-{\text{V}}_{\text{tst}29}-{\text{V}}_{\text{tst}30}\right)/4$$

1. a. eine gewisse Eliminierung des Einflusses mechanischer Spannungen auf die Hall-Platte 110 und
2. b. die Reduzierung des 1/f Rauschens des Verstärkers 120 und des Analog-zu-Digital-Wandlers 130 und
3. c. die Möglichkeit der Simulation des Einflusses eines externen Magnetfelds, beispielsweise des Erdmagnetfelds oder eines zu vermessenden Magnetfelds, durch die Einspeisung des Teststroms I_tst.

Advantages are

1. a. a certain elimination of the influence of mechanical stresses on the Hall plate 110 and
2. b. reducing the 1/f noise of the amplifier 120 and the analog-to-digital converter 130 and
3. c. the possibility of simulating the influence of an external magnetic field, for example the earth's magnetic field or a magnetic field to be measured, by injecting the test current I _tst .

The control device 124 can, if necessary by reconfiguring the analog switching mechanism 140, also electrically connect the differential input signal 121 of the amplifier 120 to other pairs of connections of the Hall plate 110 without changing the current feed of the measuring current I _Hall and/or without changing the current feed of the test current I _tst . The control device 124 can thus record further respective voltage measurement values. The control device 124 can compare the determined respective resistance values with respective tolerance resistance ranges. The control device 124 can and may conclude that there are errors in the Hall plate 110 and/or device parts of the Hall sensor measuring system 100. The control device 124 can signal such an error via the data interface 129 if necessary.

Four-phase operation with four-phase spinning and without chopper

A measurement period now comprises four measurement phases in which the control device 124 sets different operating states of the Hall sensor measuring system 100 in immediate succession. However, these do not differ here in terms of the polarity of the differential input signal 121 of the amplifier 120.

In the third test operating state, the control device 124 sets the operating states thirteen to sixteen by means of the control signal 125. In the third test operating state, the control device 124 preferably sets one of these four operating states in succession in four consecutive measuring phases of the measuring period. The control device 124 sets these operating states until the control device 124 has preferably set all two operating states exactly once for the duration of a measuring phase and has determined the measuring voltages V _tst13 , V _tst14 , V _tst15 and V _tst16 exactly once each. The control device 124 then preferably determines the determined measuring voltage V _tst as $${\text{V}}_{\text{tst}}=\left({\text{V}}_{\text{tst}13}+{\text{V}}_{\text{tst}14}+{\text{V}}_{\text{tst}15}+{\text{V}}_{\text{tst}16}\right)/4$$

1. a. eine weit gehende Eliminierung des Einflusses mechanischer Spannungen auf die Hall-Platte 110 und
2. b. die Möglichkeit der Simulation des Einflusses eines externen Magnetfelds, beispielsweise des Erdmagnetfelds oder eines zu vermessenden Magnetfelds, durch die Einspeisung des Teststroms I_tst.

Advantages are

1. a. a far-reaching elimination of the influence of mechanical stresses on the Hall plate 110 and
2. b. the possibility of simulating the influence of an external magnetic field, for example the earth's magnetic field or a magnetic field to be measured, by feeding in the test current I _tst .

In the following operating mode, a measuring period also includes four measuring phases in which the control device 124 sets different operating states of the Hall sensor measuring system 100 in immediate succession. However, these differ here from the previously described operating mode due to the polarity of the differential input signal 121 of the amplifier 120, but not in the same way. nander. In the third test operating state, the control device 124 sets the operating states twenty-nine to thirty-two by means of the control signal 125. In the third test operating state, the control device 124 preferably sets one of these four operating states in succession in four consecutive measuring phases of the measuring period. The control device 124 preferably sets the operating states until the control device 124 has preferably set all four operating states exactly once for the duration of a measuring phase and has determined the measuring voltages V _tst29 , V _tst30 , V _tst31 and V _tst32 exactly once each. The control device 124 then preferably determines the determined measuring voltage V _tst as $${\text{V}}_{\text{tst}}=-\left({\text{V}}_{\text{tst}29}+{\text{V}}_{\text{tst}30}+{\text{V}}_{\text{tst}31}+{\text{V}}_{\text{tst}32}\right)/4$$

1. a. eine gewisse Eliminierung des Einflusses mechanischer Spannungen auf die Hall-Platte 110 und
2. b. die Reduzierung des 1/f Rauschens des Verstärkers 120 und des Analog-zu-Digital-Wandlers 130 und
3. c. die Möglichkeit der Simulation des Einflusses eines externen Magnetfelds, beispielsweise des Erdmagnetfelds oder eines zu vermessenden Magnetfelds, durch die Einspeisung des Teststroms I_tst.

Advantages are

1. a certain elimination of the influence of mechanical stresses on the Hall plate 110 and
2. b. reducing the 1/f noise of the amplifier 120 and the analog-to-digital converter 130 and
3. c. the possibility of simulating the influence of an external magnetic field, for example the earth's magnetic field or a magnetic field to be measured, by injecting the test current I _tst .

The control device 124 can, if necessary by reconfiguring the analog switching mechanism 140, also electrically connect the differential input signal 121 of the amplifier 120 to other pairs of connections of the Hall plate 110 without changing the current feed of the measuring current I _Hall and/or the current feed of the test current I _tst . The control device 124 can thus record further respective voltage measurement values. The control device 124 can compare the determined respective resistance values with respective tolerance resistance ranges. The control device 124 can, if necessary, conclude that there are errors in the Hall plate 110 and/or device parts of the Hall sensor measuring system 100. The control device 124 can, if necessary, signal such an error via the data interface 129.

Four-phase operation with four-phase spinning and with choppers

A measurement period now comprises four times two measurement phases, i.e. a total of eight measurement phases, in which the control device 124 sets different operating states of the Hall sensor measurement system 100 and their complementary operating states with inverted differential input signal 121 of the amplifier 120 in immediate succession. In the third test operating state, the control device 124 sets the operating states thirteen to fourteen and twenty-nine to thirty-two using the control signal 125. Preferably, in the third test operating state, the control device 124 sets one of these eight operating states in succession in eight consecutive measurement phases of the measurement period. The control device 124 sets these operating states until the control device 124 has preferably set all eight operating states exactly once for the duration of a measurement phase and until the control device 124 has determined the measurement voltages V _tst13 , V _tst14 , V _tst15 , V _tst16 , V _tst29 , V _tst30 , V _tst31 and V _tst32 exactly once each. The control device 124 then preferably determines the determined measurement voltage V _tst as $${\text{V}}_{\text{tst}}=\left({\text{V}}_{\text{tst}13}+V_{\text{tst14}}+{\text{V}}_{\text{tst}15}+{\text{V}}_{\text{tst}16}-{\text{V}}_{\text{tst}29}-{\text{V}}_{\text{tst}30}-{\text{V}}_{\text{tst}31}-{\text{V}}_{\text{tst}32}\right)/\mathrm{8th}$$

1. a. eine weit gehende Eliminierung des Einflusses mechanischer Spannungen auf die Hall-Platte 110 und
2. b. die Reduzierung des 1/f Rauschens des Verstärkers 120 und des Analog-zu-Digital-Wandlers 130 und
3. c. die Möglichkeit der Simulation des Einflusses eines externen Magnetfelds, beispielsweise des Erdmagnetfelds oder eines zu vermessenden Magnetfelds, durch die Einspeisung des Teststroms I_tst.

Advantages are

1. a. a far-reaching elimination of the influence of mechanical stresses on the Hall plate 110 and
2. b. reducing the 1/f noise of the amplifier 120 and the analog-to-digital converter 130 and
3. c. the possibility of simulating the influence of an external magnetic field, for example the earth's magnetic field or a magnetic field to be measured, by injecting the test current I _tst .

The control device 124 can, if necessary by reconfiguring the analog switching mechanism 140, also electrically connect the differential input signal 121 of the amplifier 120 to other pairs of connections of the Hall plate 110 without changing the current feed of the measuring current I _Hall and/or without changing the current feed of the test current I _tst . The control device 124 can thus record further respective voltage measurement values. The control device 124 can compare the determined respective resistance values with respective tolerance resistance ranges. The control device 124 can, if necessary, conclude that there are errors in the Hall plate 110 and/or in device parts of the Hall sensor measuring system 100. The control device 124 can, if necessary, signal such an error via the data interface 129.

E) GENERAL INFORMATION ON OPERATING CONDITIONS

It is not absolutely necessary for a device to be able to exhibit all these operating states.

The operating states described above have the advantage that some of them enable the measurement of the value of the magnetic flux density during normal operation and all of them together enable the detection of manufacturing defects and/or aging phenomena of the Hall plate 110 including parameter deviations and inhomogeneities.

FURTHER DESCRIPTION OF THE OPERATION OF THE DEVICE

1. A) den positiven Eingang 122 des Verstärkers 120 mit dem ersten Anschluss der Hall-Platte 110 elektrisch zu verbinden und den negativen Eingang 123 des Verstärkers 120 mit dem dritten Anschluss der Hall-Platte 110 elektrisch zu verbinden oder
2. B) den positiven Eingang 122 des Verstärkers 120 mit dem dritten Anschluss der Hall-Platte 110 elektrisch zu verbinden und den negativen Eingang 123 des Verstärkers 120 mit dem ersten Anschluss der Hall-Platte 110 elektrisch zu verbinden.

Preferably, the control device 124 causes the analog switching mechanism 140 by means of its control signal 125 to either

1. A) electrically connecting the positive input 122 of the amplifier 120 to the first terminal of the Hall plate 110 and electrically connecting the negative input 123 of the amplifier 120 to the third terminal of the Hall plate 110 or
2. B) electrically connect the positive input 122 of the amplifier 120 to the third terminal of the Hall plate 110 and electrically connect the negative input 123 of the amplifier 120 to the first terminal of the Hall plate 110.

The control device 124 preferably detects the value of the output signal of the amplifier 120 via the data bus 128 using an analog-to-digital converter 130 or the like. This step therefore involves detecting the voltage value of the voltage between the first connection and the third connection. This enables the control device 124 to determine, for example, the electrical resistance of the Hall plate 110 between the first connection and the third connection of the Hall plate 110. If necessary, a test system in a production test can query the determined voltage value between the first connection of the Hall plate 110 and the third connection of the Hall plate 110 from the control device 124 or directly from the analog-to-digital converter 130 via a test interface or the data interface 129.

EVALUATION

Preferably, the control device 124 and/or the test system in the production test compare the voltage value determined by the analog-to-digital converter 130 with a first threshold value and/or a second threshold value. The first threshold value and the second threshold value preferably define a permitted tolerance range for the voltage value of the voltage between the first connection of the Hall plate 110 and the third connection of the Hall plate 110. This tolerance range applies when the Hall plate 110 is energized between the first connection of the Hall plate 110 and the third connection of the Hall plate 110 with the measuring current I _Hall .

This step is thus a comparison of the voltage value of the voltage between the first terminal of the Hall plate 110 and the third terminal of the Hall plate 110 on the one hand with an allowable tolerance range of the voltage value of the voltage between the first terminal of the Hall plate 110 and the third terminal of the Hall plate 110 on the other hand.

As a result, the control device 124 and/or the test system are able to detect manufacturing defects and/or signs of aging of the Hall plate 110, including parameter deviations, etc., in the production test or in a self-test during operation or commissioning.

REJECT

1. A) wenn der erfasste Spannungswert der Spannung zwischen dem ersten Anschluss der Hall-Platte 110 und des dritten Anschlusses der Hall-Platte 110 außerhalb dieses Toleranzbereichs des Spannungswerts der Spannung zwischen dem ersten Anschluss der Hall-Platte 110 und des dritten Anschlusses der Hall-Platte 110 liegt oder
2. B) wenn die Steuervorrichtung 124 ermittelt hat, dass der erfasste Spannungswert der Spannung zwischen dem ersten Anschluss der Hall-Platte 110 und des dritten Anschlusses der Hall-Platte 110 außerhalb dieses Toleranzbereichs des Spannungswerts der Spannung zwischen dem ersten Anschluss der Hall-Platte 110 und des dritten Anschlusses der Hall-Platte 110 liegt.

The test device typically discards the micro-integrated circuit IC of the Hall sensor measuring system 100,

1. A) if the detected voltage value of the voltage between the first terminal of the Hall plate 110 and the third terminal of the Hall plate 110 is outside this tolerance range of the voltage value of the voltage between the first terminal of the Hall plate 110 and the third terminal of the Hall plate 110 or
2. B) if the control device 124 has determined that the detected voltage value of the voltage between the first terminal of the Hall plate 110 and the third terminal of the Hall plate 110 is outside this tolerance range of the voltage value of the voltage between the first terminal of the Hall plate 110 and the third terminal of the Hall plate 110.

This allows the control device 124 and/or the test system for testing the micro-integrated circuit IC to determine that the Hall plate 110 is not in the intended state.

Signaling

1. A) wenn der erfasste Spannungswert der Spannung zwischen dem ersten Anschluss der Hall-Platte 110 und des dritten Anschlusses der Hall-Platte 110 außerhalb dieses Toleranzbereichs des Spannungswerts der Spannung zwischen dem ersten Anschluss der Hall-Platte 110 und des dritten Anschlusses der Hall-Platte 110 liegt oder
2. B) wenn die Steuervorrichtung 124 ermittelt hat, dass der erfasste Spannungswert der Spannung zwischen dem ersten Anschluss der Hall-Platte 110 und des dritten Anschlusses der Hall-Platte 110 außerhalb dieses Toleranzbereichs des Spannungswerts der Spannung zwischen dem ersten Anschluss der Hall-Platte 110 und des dritten Anschlusses der Hall-Platte 110 liegt.

The control device 124 and/or the micro-integrated circuit IC of the Hall sensor measuring system 100 preferably signal an at least partially predetermined data message to a higher-level computer system via a data bus interface 129 and an external data bus 160.

1. A) if the detected voltage value of the voltage between the first terminal of the Hall plate 110 and the third terminal of the Hall plate 110 is outside this tolerance range of the voltage value of the voltage between the first terminal of the Hall plate 110 and the third terminal of the Hall plate 110 or
2. B) if the control device 124 has determined that the detected voltage value of the voltage between the first terminal of the Hall plate 110 and the third terminal of the Hall plate 110 is outside this tolerance range of the voltage value of the voltage between the first terminal of the Hall plate 110 and the third terminal of the Hall plate 110.

The predetermined part of the data message typically indicates, among other things, the type of incident.

The optional, non-predetermined part of the data message typically indicates recorded parameters, etc.

This allows the control device 124 and/or the micro-integrated circuit IC of the Hall sensor measuring system 100 and/or the higher-level computer system to determine that the Hall plate 110 is not in the intended state.

FURTHER REFININGS

The document presented here now proposes, in a refinement, that the control device 124 and, if applicable, the test system repeat the previously described procedure. However, this repetition now takes place with a different selection of the first connection of the Hall plate 110 from the set of at least four connections (111, 112, 113, 114) of the Hall plate 110 and with a different selection of the third connection of the Hall plate 110 from the set of at least four connections (111, 112, 113, 114) of the Hall plate 110. The first connection of the Hall plate 110 and the third connection of the Hall plate 110 should be different from one another. There are a total of 12 possibilities for selecting the first connection of the Hall plate 110 from the set of at least four connections (111, 112, 113, 114) of the Hall plate 110 and for selecting the third connection of the Hall plate 110 from the set of at least four connections (111, 112, 113, 114) of the Hall plate 110. These 12 possibilities correspond to 12 possible first threshold values and 12 second threshold values, which together correspond in pairs to 12 tolerance ranges.

The document presented here therefore proposes, in this first further embodiment, energizing the first connection of the Hall plate 110 and the third connection of the Hall plate 110. In this case, there are typically the said 12 different possibilities for selecting the first connection of the Hall plate 110 and the third connection of the Hall plate 110 from the set of four connections (111, 112, 113, 114) of the Hall plate 110 by means of the analog switching mechanism 140. In this case, the said energizing preferably takes place according to these at least n different possibilities from the set of the said 12 different possibilities. The document presented here therefore proposes, in this first further embodiment, the detection of the n voltage values of the respective voltage between the respective first connection of the Hall plate 110 and the third connection of the Hall plate 110 associated with these n possibilities. The document presented here proposes that the control device 124 carries out the measurement and evaluation as previously described for each of the n possibilities. The document presented here proposes that the control device 124 and/or the test system classify the Hall plate 110 as faulty if, for at least one of the possibilities, the respective recorded voltage value is not within the expected tolerance range of the respective voltage value. Here, n is preferably a positive integer with 2≥n≥12.

The document presented here proposes that the control device 124 and/or the test system further process the n voltage values recorded in this way. For example, the control device 124 and/or the test system can form the amounts of m difference values from m different pairs of two voltage values each of the measured n voltage values. Typically, 1 ≤ m ≤ n !/2. These m different pairs of two voltage values each of the measured n voltage values are preferably m pairs of the possible n!/2 pairs of two measured voltage values each of the n measured voltage values. The control device 124 and/or the test system preferably compare the amounts of these m difference values with a homogeneity threshold value.

This has the advantage that the control device 124 and/or the test system can average out the operating state-dependent components of the measured values determined.

The document presented here proposes that the test system rejects the circuit if one or more of the magnitudes of the m difference values are above the magnitude of the homogeneity threshold.

PROCEDURE USING A TEST CURRENT I _tst

In the following, the text presented here describes a modified procedure in which a test current is fed into the Hall plate to emulate an applied magnetic field B perpendicular to the measuring current I _Hall .

Preferably, the Hall plate 110 again has four connections (111, 112, 113, 114), which are preferably arranged in the form of a quadrilateral, for example in the form of a polygon with four corners. Even more preferred is the arrangement in the form of a rectangle and most preferred in the form of a square. The preferred quadrilateral defines a quadrangular closed polygon.

The document presented here again proposes, as a first step, the selection of a first connection of the Hall plate 110 from the four connections (111, 112, 113, 114) of the Hall plate 110 of the Hall sensor measuring system 100.

The document presented here again proposes, as a second step, the selection of a second terminal of the Hall plate 110 from the four terminals (111, 112, 113, 114) of the Hall plate 110 of the Hall sensor measuring system 100, which is different from the first terminal.

However, the document presented here now proposes, as a third step, the selection of a third connection of the Hall plate 110 from the four connections (111, 112, 113, 114) of the Hall plate 110 of the Hall sensor measuring system 100, which is different from the first connection and the second connection. In this case, when circulating along the said polygon, the second connection of the Hall plate 110 and the remaining fourth connection of the Hall plate 110 should always be arranged between the first connection of the Hall plate 110 and the third connection of the Hall plate 110.

The method proposed here then provides, in a fourth step, for feeding a predetermined measuring current I _Hall into the first terminal of the Hall plate 110 and for taking this predetermined measuring current I _Hall from the third terminal of the Hall plate 110.

• • das typischerweise zeitparallele Einspeisen eines zusätzlichen elektrischen Teststroms I_tst mit einem zumindest zeitweise konstanten Stromwert in den zweiten Anschluss der Hall-Platte 110 und
• • das Entnehmen dieses zusätzlichen elektrischen Teststromes I_tst mit einem zumindest zeitweise konstanten Stromwert des Teststroms I_tst aus dem verbleibenden vierten Anschluss der Hall-Platte 110 vor.

The procedure proposed here then provides in a fifth step

• • the typically parallel feeding of an additional electrical test current I _tst with an at least temporarily constant current value into the second terminal of the Hall plate 110 and
• • taking this additional electrical test current I _tst with an at least temporarily constant current value of the test current I _tst from the remaining fourth terminal of the Hall plate 110.

Preferably, the second terminal of the Hall plate 110 is different from the first terminal of the Hall plate 110 and from the second terminal of the Hall plate 110 and from the third terminal of the Hall plate 110.

The method proposed here provides, in a sixth step, the detection of the voltage value of the test voltage V _tst between the second terminal of the Hall plate 110 and the fourth terminal of the Hall plate 110, for example by the amplifier 120.

The method proposed here provides, in a seventh step, the detection of a signal whose value depends on an output value of the amplifier 120, for example by an analog-to-digital converter 130. Preferably, the method in this step comprises the formation of a check value, for example in the form of an output value of the analog-to-digital converter 130.

The method proposed here preferably comprises, in an eighth step, the comparison of the check value with a permissible tolerance range of the check value. For example, the control device 124 and/or the test system, which possibly tests the micro-integrated circuit IC of the Hall sensor measuring system 100, can carry out this check.

The method proposed here comprises, in a ninth step, rejecting the component if the verification value is outside the tolerance range of the verification value and/or signaling an error or deviation if the verification value is outside the tolerance range of the verification value.

This allows the Hall sensor measuring system 100 to emulate the effect of an additional magnetic field with a magnetic flux density B on the Hall plate in production testing and/or in operation and to check the reaction of the system of the Hall sensor measuring system 100 to this without having to generate a magnetic field. This is a significant cost advantage. In addition, errors in the Hall sensor measuring system 100 can be separated from errors in a magnetic field generating device in this way.

This also has the advantage that the control device 124 and/or the test system can average out the operating state-dependent components of the measured values determined.

Figure 2

Method for Hall plates 110 using more than four terminals.

The 2 shows the exemplary simplified procedure for measuring Hall plates 110 with more than four connections.

The procedures described above can also be used for Hall Plates 100 with more than 4 connections.

Preferably, a test system and/or the control device 124 perform the following method using device parts of the Hall sensor measuring system 100.

In such a method for testing an integrated Hall sensor measuring system 100, the Hall sensor measuring system 100 has a Hall plate 110 and an amplifier 120. The Hall plate 110 should now have q connections (111, 112, 113, 114) with q as a positive integer with q≥3.

For q=4 we get the case described above.

The amplifier 120 should have a differential input 121 with a positive input 122 and a negative input 123 as described above.

• Ein erster Schritt des hier vorgeschlagenen Verfahrens für q Anschlüsse der Hall-Platte 110 umfasst vorschlagsgemäß das Bereitstellen 2005 des Hall-Sensor-Messsystems 100.

The method proposed here for q connections of the Hall plate 110 is proposed to include, for example, the following steps:

• A first step of the method proposed here for q connections of the Hall plate 110 comprises, as proposed, the provision 2005 of the Hall sensor measuring system 100.

A first step of the method proposed here for q connections of the Hall plate 110 comprises, according to the proposal, the definition 2007 of n connection pairs, each consisting of a first connection of the q connections (111, 112, 113, 114) of the Hall plate 110 and a second connection of the q connections (111, 112, 113, 114) of the Hall plate 110. Preferably, n is a positive integer between 1 and q*(q-1) including 1 and including q*(q-1). The first connection of the Hall plate 110 is within such a connection pair is different from the second connection of the hall plate. For clarity, it should be mentioned here that the numbering of first connection, second connection, third connection and fourth connection above was based on the circumference along the edge of the hall plate 110. With an indefinite number of connections on the hall plate 110, this is no longer appropriate. The document presented here therefore changes to numbering the connections according to how they appear in the text beginning here. The connection referred to here as the “second connection of the hall plate 110” was therefore referred to above as the “third connection of the hall plate 110”. The reader should take this into account when reading the following text. For the claims, the numbering of the connections on the hall plate 110 is also based on the order in which the connection on the hall plate 110 appears in the text of the claims. Any two connection pairs of the n connection pairs each consisting of two connections of the Hall plate 110 differ from each other by at least one connection of the Hall plate 110 which is only a member of one of these two connection pairs.

• • nummeriert die technische Lehre des hier vorgelegten Dokuments die Anschlusspaare virtuell durch und
• • ordnet jedem Anschlusspaar eine eindeutige und individuelle Anschlusspaarnummer zu.

For better clarity

• • the technical teaching of the document presented here numbers the connection pairs virtually and
• • assigns each connection pair a unique and individual connection pair number.

This connection pair number therefore uniquely represents the respective connection pair.

• Ein erster Schritt eines solchen Unterverfahrens umfasst beispielsweise die Auswahl 2010 des ersten Anschlusses der Hall-Platte 110 des j-ten Anschlusspaars aus den q Anschlüssen (111, 112, 113, 114) der Hall-Platte 110.

According to the method proposed in this text, the test system and/or the Hall sensor measuring system 100 each carry out a sub-method for preferably each or a subset of the n connection pairs. As part of this sub-method, the test system and/or the Hall sensor measuring system 100 carry out the following measurement for each j-th connection pair of the n connection pairs with j as an integer between 1 and n inclusive of 1 and inclusive of n. Preferably, each of the sub-methods carried out preferably comprises the following steps:

• A first step of such a sub-process comprises, for example, the selection 2010 of the first terminal of the Hall plate 110 of the j-th terminal pair from the q terminals (111, 112, 113, 114) of the Hall plate 110.

A second step of such a sub-method comprises, for example, the selection 2020 of a second terminal of the Hall plate 110 of the j-th terminal pair from the remaining (q-1) terminals (111, 112, 113, 114) of the Hall plate 110, for example by means of an analog switching mechanism 140. The second terminal of the Hall plate 110 is typically different from the first terminal of the Hall plate 110.

• • das Einspeisen 2030 eines elektrischen Stromes, typischerweise des Messstroms I_Hall, mit einem zumindest zeitweise konstanten Stromwert beispielsweise durch eine erste Messstromquelle 153 in den ersten Anschluss des j-ten Anschlusspaars der vier Anschlüsse (111, 112, 113, 114) der Hall-Platte 110 und
• • das Entnehmen dieses Stromes, typischerweise des Messstroms I_Hall, beispielsweise durch eine zweite Messstromquelle 154 mit diesem Stromwert aus dem zweiten Anschluss des j-ten Anschlusspaars der vier Anschlüsse (111, 112, 113, 114) der Hall-Platte 110.

A third step of such a sub-procedure includes, for example,

• • feeding 2030 an electric current, typically the measuring current I _Hall , with an at least temporarily constant current value, for example by a first measuring current source 153, into the first terminal of the j-th terminal pair of the four terminals (111, 112, 113, 114) of the Hall plate 110 and
• • taking this current, typically the measuring current I _Hall , for example by a second measuring current source 154 with this current value from the second terminal of the j-th terminal pair of the four terminals (111, 112, 113, 114) of the Hall plate 110.

As a result, a measuring voltage drops between the first terminal of the Hall plate 110 and the second terminal of the Hall plate 110.

A fourth step of such a sub-method comprises, for example, the detection 2040 of the associated j-th voltage value 2100 of the voltage, i.e. the measurement voltage, between the first connection of the j-th connection pair and the second connection of the j-th connection pair. The detection 2040 is preferably carried out, for example, by means of the analog switching mechanism 140, an amplifier 120 and an analog-to-digital converter 130.

A fifth step of such a sub-method comprises, for example, checking 2050 whether all n measurements of all n connection pairs have been performed, for example by the test system and/or the control device 124.

Preferably, the test system and/or the control device 124 of the Hall sensor measuring system 100 terminate 2060 these measurements when the control device 124 has carried out all n measurements of all n connection pairs of the connections (111, 112, 113, 114) of the Hall plate 110 by means of the other device parts of the Hall sensor measuring system 100 required for this purpose.

Preferably, 2060 the test system and/or the control device 124 of the Hall sensor measuring system 100 continue these measurements if the control device 124 has not yet carried out all n measurements of all n connection pairs of the connections (111, 112, 113, 114) of the Hall plate 110 by means of the other device parts of the Hall sensor measuring system 100 required for this purpose.

This also has the advantage that the control device 124 and/or the test system can average out the operating state-dependent components of the measured values determined.

Figure 3

First refinement (Figure 3)

The 3 shows a first refinement of the procedure of 2 supplemented by components 3070, 3080 and 3090, which enable testing of the recorded voltage values.

In a first refinement of the above method for a Hall plate with q connections, carrying out the respective measurement for each j-th connection pair of the n connection pairs of the connections (111, 112, 113, 114) of the Hall plate 110 (with 1≤j≤n) comprises the following additional steps: In a first additional step of the sub-method, the test system and/or the control device 124 of the Hall sensor measuring system 100 compare 3070 the determined j-th voltage value 2100 with a permissible tolerance range 3080 of the j-th voltage value 2100.

• • verwirft 3090 das Testsystem das Hall-Sensor-Messsystem 100, wenn der j-te Spannungswert außerhalb des Toleranzbereichs 3080 des Spannungswerts 2100 liegt, und/oder
• • die Steuervorrichtung 124 des Hall-Sensor-Messsystems 100 signalisiert einen Fehler des Hall-Sensor-Messsystems 100,
• • wenn der j-te Spannungswert außerhalb des Toleranzbereichs 3080 des Spannungswerts 2100 liegt.

In a first additional step of the sub-procedure

• • the test system rejects 3090 the Hall sensor measuring system 100 if the j-th voltage value is outside the tolerance range 3080 of the voltage value 2100, and/or
• • the control device 124 of the Hall sensor measuring system 100 signals an error of the Hall sensor measuring system 100,
• • if the j-th voltage value is outside the tolerance range 3080 of the voltage value 2100.

As a result, for example, the test system and/or the control device 124 of the Hall sensor measuring system 100 are able to detect errors in the Hall plate 110 that occur during production testing, field testing and/or operation. The control device 124 of the Hall sensor measuring system 100 is able to distinguish errors in the Hall plate 110 and/or the subsequent evaluation electronics of the Hall sensor measuring system 110 in the subsequent signal path after the Hall plate 110 from errors in a magnetic field generation system during operation.

Figure 4

Second refinement (Figure 4)

The 4 shows a second refinement of the method of 3 supplemented by components 4110, 4130, 4140, 4150 and 4160, which enable a check of the homogeneity of the recorded voltage values.

The method in this second refinement includes the following additional steps,

In a second refinement of the above method for a Hall plate 110 with q terminals, the method comprises forming 4110 m different voltage value pairs 4120 from two voltage values each of the measured n voltage values 2100. The test system and/or the control device 124 of the Hall sensor measuring system 100 preferably carry out this forming 4110.

Here n>1. The m voltage value pairs are voltage value pairs of the possible n*(n-1) pairs of two measured voltage values each of the n measured voltage values 2100.

In this second refinement of the above method for a Hall plate 110 with q terminals, the method comprises determining 4130 the m voltage difference values 4140 between the two voltage values of the respective m voltage value pairs 4120, for example by the test system and/or the control device 124 of the Hall sensor measuring system 100.

In this second refinement of the above method for a q-terminal Hall plate 110, the method includes comparing 4150 the magnitudes of these m voltage difference values with a homogeneity threshold 4160, for example by the test system and/or the controller 124 of the Hall sensor measurement system 100, where 1 ≤ m ≤ n*(n-1).

As a result, for example, the test system and/or the control device 124 of the Hall sensor measuring system 100 are able to detect inhomogeneities of the Hall plate 110 that occur during production testing, field testing and/or operation. The control device 124 of the Hall sensor measuring system 100 is able to distinguish inhomogeneities of the Hall plate 110 and/or the subsequent evaluation electronics of the Hall sensor measuring system 110 in the subsequent signal path after the Hall plate 110 from errors in a magnetic field generation system during operation.

Third refinement (Figure 4)

In a third refinement of the above method for a Hall plate 110 with q terminals, the method comprises checking 4170 whether one or more of the magnitudes of the m voltage difference values are above the magnitude of the homogeneity threshold 4160. Preferably, the test system and/or the controller 124 of the Hall sensor measuring system 100 performs this check.

Preferably, the test system rejects 3090 the micro-integrated circuit IC of the Hall sensor measuring system 100 if one or more of the amounts of the m voltage difference values are above the amount of the homogeneity threshold value 4160. Preferably, the control device 124 of the Hall sensor measuring system 100 signals 3090 an error and/or the suspicion of an error of the Hall sensor measuring system 100 if one or more of the amounts of the m voltage difference values are above the amount of the homogeneity threshold value 4160.

As a result, for example, the test system and/or the control device 124 of the Hall sensor measuring system 100 are able to detect inhomogeneities of the Hall plate 110 that occur during production testing, field testing and/or operation. The control device 124 of the Hall sensor measuring system 100 is able to distinguish inhomogeneities of the Hall plate 110 and/or the subsequent evaluation electronics of the Hall sensor measuring system 110 in the subsequent signal path after the Hall plate 110 from errors in a magnetic field generation system during operation.

Procedure with an even number of Hall plate connections

The document presented here describes a fourth refinement of the above methods for a Hall plate 110 with q connections. However, q now represents an even number greater than three. The Hall plate 110 then has q=2*p connections (111, 112, 113, 114). Here, p is a positive integer with p>1. This means that q is at least 4. The 2*p connections of the Hall plate 110 are preferably arranged in the form of a square that defines a square closed polygon. This gives the Hall plate a symmetry that must be reflected in the equality of measured values. This makes it possible to dispense with the storage of tolerance values, since the proposed method can use the other measured values as references. Inhomogeneities usually lead to problems and to a non-proportional fluctuation of all measured values of a circuit. This occurs in the same way as typically occurs in the manufacture of semiconductor circuits in CMOS technologies. This makes the process resistant to parameter fluctuations in the production process.

Procedure using additional connections

• • jeweils einem ersten Anschluss der vier Anschlüsse (111, 112, 113, 114) der Hall-Platte 110 und
• • jeweils einem zweiten Anschluss der vier Anschlüsse (111, 112, 113, 114) der Hall-Platte 110 zusätzlich das Festlegen 5008 von n komplementären Anschlusspaaren aus
• • jeweils einem dritten Anschluss der vier Anschlüsse (111, 112, 113, 114) der Hall-Platte 110 und jeweils einem vierten Anschluss der vier Anschlüsse (111, 112, 113, 114) der Hall-Platte 110.

In a fifth refinement of the previously presented methods, the definition 2007 of n connection pairs from

• • a first connection of the four connections (111, 112, 113, 114) of the Hall plate 110 and
• • for each second connection of the four connections (111, 112, 113, 114) of the Hall plate 110, additionally the determination 5008 of n complementary connection pairs from
• • a third connection of the four connections (111, 112, 113, 114) of the Hall plate 110 and a fourth connection of the four connections (111, 112, 113, 114) of the Hall plate 110.

In this fifth refinement, each complementary connection pair of the n complementary connection pairs is preferably assigned to exactly one connection pair of the n connection pairs. Typically, the third connection of a complementary connection pair of the Hall plate 110 is different from the first connection of the associated connection pair of the Hall plate 110. The fourth connection of the complementary connection pair of the Hall plate 110 is preferably different from the first connection of the associated connection pair of the Hall plate 110. The third connection of the complementary connection pair of the Hall plate 110 is preferably different from the second connection of the associated connection pair of the Hall plate 110. The third connection of the complementary connection pair of the Hall plate 110 is preferably different from the fourth connection of the complementary connection pair of the Hall plate 110. The first connection of the associated connection pair of the Hall plate 110 is preferably different from the second connection of the associated connection pair of the Hall plate 110.

Preferably, the first connection of the connection pair of the Hall plate 110 and the second connection of the connection pair of the Hall plate 110 define a first virtual straight line. Preferably, the third connection of the complementary connection pair of the Hall plate 110 and the fourth connection of the complementary connection pair of the Hall plate 110 define a second virtual straight line. Preferably, the first virtual straight line is arranged perpendicular to the second virtual straight line.

Preferably, the first virtual straight line intersects the second virtual straight line at a virtual intersection point. Preferably, the virtual intersection point divides the first virtual line from the first connection to the second connection along the first straight line in the middle of the first virtual line. Preferably, the virtual intersection point divides the second virtual line from the third connection to the fourth connection along the second straight line in the middle of the second virtual line.

Method with symmetrical Hall plate 110

In a sixth refinement of the previously presented methods, during a circuit along the polygon, the q connections are arranged in the order first connection, third connection, second connection, fourth connection or in the order second connection, third connection, first connection, fourth connection. Further connections of the Hall plate 110 can be located between these connections of the Hall plate 110 in relation to this circuit. Preferably, the number of further connections of the Hall plate 110 between the first connection and the third connection is equal to the number of connections of the Hall plate 110 between the second connection and the fourth connection. Preferably, the number of further connections of the Hall plate 110 between the first connection and the fourth connection is equal to the number of connections of the Hall plate 110 between the second connection and the third connection.

Most preferably, the number of additional connections of the Hall plate 110 between the first connection and the fourth connection is equal to the number of connections of the Hall plate 110 between the second connection and the third connection. Most preferably, the number of additional connections of the Hall plate 110 between the first connection and the fourth connection is equal to the number of additional connections of the Hall plate 110 between the first connection and the third connection. Most preferably, the number of additional connections of the Hall plate 110 between the first connection and the fourth connection is equal to the number of connections of the Hall plate 110 between the second connection and the fourth connection.

Preferably, the distances between the first connection and the third connection and between the third connection and the second connection and between the second connection and the fourth connection and between the fourth connection and the first connection are the same. The Hall plate is then particularly symmetrical. In this case, the measured values should be essentially the same when the connection diagram is rotated.

These symmetries minimize the operating state-dependent differences that occur so that the control device 124 and/or the test system can use a larger number of corresponding measured values from measurements with preferably mutually different operating states for averaging so that they can better determine mean values and scatter (variance).

Figure 5

The 5 shows a first refinement of the procedure of 4 supplemented by components 5170 and 5180, which enable the impression of a test current I _tst to emulate a Hall voltage in the form of a test voltage V _tst and its detection.

This makes it possible to dispense with expensive calibrated test devices for generating a defined magnetic flux density B that flows through the Hall plate 110 in the production test. This enables a self-test of the Hall sensor measuring system 110 during operation, which can be crucial for ASIL-C and ASIL-D applications.

Method with impression of a test current I _tst to emulate a Hall voltage (Figure 5)

• • das Einspeisen 2030 eines elektrischen Stromes, beispielsweise des Messstromes I_Hall, mit einem zumindest zeitweise konstanten Stromwert, in den ersten Anschluss des j-ten Anschlusspaars der vier verwendeten Anschlüsse (111, 112, 113, 114) der Hall-Platte 110 und
• • das Entnehmen dieses Stromes mit diesem Stromwert aus dem zweiten Anschluss des j-ten Anschlusspaars der vier Anschlüsse (111, 112, 113, 114) der Hall-Platte (110).

In a seventh refinement, the procedure further includes

• • feeding 2030 an electric current, for example the measuring current I _Hall , with an at least temporarily constant current value, into the first connection of the j-th connection pair of the four used connections (111, 112, 113, 114) of the Hall plate 110 and
• • taking this current with this current value from the second terminal of the j-th terminal pair of the four terminals (111, 112, 113, 114) of the Hall plate (110).

In addition, the method now additionally comprises feeding 5035 an additional electrical current, for example a test current I _tst , with an at least temporarily constant current value into the third terminal of the Hall plate 110 and removing this additional electrical current with an at least temporarily constant current value from the fourth terminal of the Hall plate 110.

This emulates the effect of a magnetic flux density B perpendicular to the surface of the Hall plate 110 and simulates the generation of a Hall voltage by the magnetic field. This enables a self-test of the Hall sensor measuring system 100 and simplifies the production test of the Hall sensor measuring system and/or the micro-integrated circuit IC of the Hall sensor measuring system 100 since the need to generate a calibrated magnetic field is eliminated.

This makes it possible to dispense with expensive calibrated test devices for generating a defined magnetic flux density B that flows through the Hall plate 110 in the production test. This enables a self-test of the Hall sensor measuring system 110 during operation, which can be crucial for ASIL-C and ASIL-D applications.

Procedure with detection of the test voltage V _tst after emulation of a Hall voltage (Figure 5)

In an eighth refinement, the step of detecting 2040 the associated j-th voltage value 2100 of the voltage between the first terminal of the j-th terminal pair and the second terminal of the j-th terminal pair additionally comprises detecting 5170 the simulated Hall voltage value 5180 of the voltage between the third terminal and the fourth terminal. This detection 5170 is preferably carried out in particular by the amplifier 120 and/or the analog-to-digital converter 130.

This makes it possible to dispense with expensive calibrated test devices for generating a defined magnetic flux density B that flows through the Hall plate 110 in the production test. This enables a self-test of the Hall sensor measuring system 110 during operation, which can be crucial for ASIL-C and ASIL-D applications.

Figure 6

The 6 shows a first refinement of the procedure of 6 supplemented by components 6190 and 6200, which enable an evaluation of the recorded test voltage values.

Procedure with evaluation of the test voltage V _tst after emulation of a Hall voltage (Figure 6)

In an eighth refinement, the method includes comparing the recorded Hall voltage value 5180 with an allowable tolerance range 6200 of the Hall voltage value 5180. The test system and/or the control device 124 of the Hall sensor measuring system 100 can, for example, carry out this comparison.

In an eighth refinement, the method can, for example, comprise discarding 3090 the Hall sensor measuring system 100 and/or the micro-integrated circuit IC of the Hall sensor measuring system 100. The discarding 3090 occurs when the Hall voltage value 5180 is outside the tolerance range 6200 of the Hall voltage value 5180. In the eighth refinement, the method can, for example, comprise signaling an error and/or a suspected error of the Hall sensor measuring system 100 and/or the micro-integrated circuit IC of the Hall sensor measuring system 100. This signaling preferably occurs when the Hall voltage value 5180 is outside the tolerance range 6200 of the Hall voltage value 5180.

This enables in particular the control device 124 and/or the Hall sensor measuring system 100 to take measures, such as signaling an error in the event of an unsuccessful self-test of the Hall sensor measuring system 110 during operation, which can be crucial for ASIL-C and ASIL-D applications.

Method with complementary connection pairs

In an eighth refinement, preferably the fourth terminal of the complementary terminal pair of the Hall plate 110 is different from the second terminal of the associated terminal pair of the Hall plate 110.

Process with chopper method

In a ninth refinement, the signal of the Hall plate 110 is choppered in the signal path starting with the differential input 121 of the amplifier 120 and ending with the output of an analog-to-digital converter 130 at 2*m points. The chopper is preferably choppered by multiplying the differential input signal with a chopper signal with a chopper frequency to form a chopped input signal of the amplifier 120 before the actual amplifier in the amplifier 120 amplifies this chopped input signal. For example, the control device 124 can provide the values of the value curve of the output signal of the analog-to-digital converter 130 with time stamps. The control device 124 can then generate a digitized, amplified and chopped input signal of the amplifier 120 from this. The control device 124 can then re-chopper this digitized, amplified and chopped input signal of the amplifier 120 by multiplying it with the digitized values of the chopper signal at the chopper frequency. The control device 124 can then convert this digitized, amplified and chopped input signal of the amplifier 120 back to the digitized, amplified input signal of the amplifier 120. In doing so, the control device 124 preferably uses a digital low-pass filter that suppresses the chopper frequency and the double chopper frequency. The chopper signal is preferably a PWM signal. The chopper signal is preferably a PWM signal with a 50% duty cycle. In addition to this simple application of the chopper method, additional chopper steps in the signal path come into consideration. These preferably always occur in pairs.

• • dass die der Hall-Platte 110 bezüglich der geometrischen Anordnung der Anschlüsse eine Symmetrieachse oder einen Symmetriepunkt aufweist und
• • dass jedem Anschluss bezüglich dieser Symmetrieachse oder dieses Symmetriepunkts genau ein anderer Anschluss der Anschlüsse des Hall-Platte 110 symmetrisch gegenüberliegt.

Preferably, the method presented here comprises, in a further embodiment of the provision 2005 of the Hall sensor measuring system 100, the provision of a connection-symmetrical Hall plate 110. Connection symmetry of the Hall plate 110 means in the sense of the document presented here,

• • that the Hall plate 110 has an axis of symmetry or a point of symmetry with respect to the geometric arrangement of the connections and
• • that each connection is symmetrically opposite exactly one other connection of the connections of the Hall plate 110 with respect to this axis of symmetry or this point of symmetry.

This improves the symmetry and thus reduces the design-related scatter of the measurement results when chopping, etc.

Miscellaneous

The above description is not intended to be exhaustive and does not limit this disclosure to the examples shown. Those having ordinary skill in the art may determine other variations to the disclosed examples from the drawings, the disclosure tion and the claims. The indefinite articles "a" or "an" and their inflections do not exclude a plurality, while the mention of a certain number of elements does not exclude the possibility of more or fewer elements being present. A single unit can perform the functions of several elements mentioned in the disclosure, and conversely, several elements can perform the function of a unit. Numerous alternatives, equivalents, variations and combinations are possible without departing from the scope of the present disclosure.
Unless otherwise stated, all features of the present invention can be freely combined with one another. This applies to the entire document presented here. The
The features described in the description of the figures can, unless otherwise stated, be freely combined with the other features as features of the invention. A restriction of individual features of the embodiments to the combination with other features of the embodiments is expressly not intended. In addition, material features of the device can be reformulated and used as process features, and process features can be reformulated as material features of the device. Such a reformulation is therefore automatically disclosed.

In the foregoing detailed description, reference is made to the accompanying drawings. Readers should consider the examples in the description and drawings as illustrative and should not consider them as limiting to the specific example or element described. Multiple examples may be derived from the foregoing description and/or drawings and/or the claims by modifying, combining or varying certain elements. In addition, a person skilled in the art may derive examples or elements that are not described verbatim from the description and/or drawings.

List of reference symbols

100

Hall sensor measuring system;

110

Hall plate;

111

first connection of the exemplary hall plate 110;

112

second connection of the exemplary Hall plate 110;

113

third connection of the exemplary Hall plate 110;

114

fourth connection of the exemplary Hall plate 110;

120

Amplifier;

121

differential input of amplifier 120;

122

positive input of amplifier 120;

123

negative input of amplifier 120;

124

control device of the circuit IC;

125

Control signal of the control device 124, with which the control device 124 controls the analog switching mechanism 140;

126

Configuration signal for configuring the amplifier 120 by the control device 124;

127

Amplifier output signal of amplifier 120;

128

internal data bus of the switching circuit IC;

129

data interface;

130

Analog-to-digital converter;

131

Input of the analog-to-digital converter 130;

140

analog switching mechanism;

141

first input of the analog switching circuit 140;

142

second input of the analog switching circuit 140;

143

third input of the analog switching circuit 140;

144

fourth input of the analog switching circuit 140;

145

Test current input of the analog switching device 140 for the supply of the test current I _tst through the first test current source 151;

146

Measuring current input of the analog switching circuit 140 for the supply of the measuring current I _Hall through the first measuring current source 153;

147

first output terminal of the analog circuit 140 for the connection of the first positive input 122 of the amplifier 120.

148

second output terminal of the analog circuit 140 for the connection of the second negative input 122 of the amplifier 120.

149

Test current output of the analog switching circuit 140 for the extraction of the test current I _tst by the second test current source 152;

150

Measuring current output of the analog switching circuit 140 for the extraction of the measuring current I _Hall by the second measuring current source 154;

151

first test current source for supplying the test current I _tst ;

152

second test current source for drawing the test current I _tst ;

153

Measuring current source for supplying the measuring current I _Hall ;

154

Measuring current source for the measurement current I _Hall ;

160

external data bus;

2005

Providing the Hall sensor measuring system 100 in 2005;

2007

Defining 2007 • of n respective connection pairs each comprising a respective first connection of the q connections (111, 112, 113, 114) of the Hall plate 110 and a respective second connection of the q connections (111, 112, 113, 114) of the Hall plate 110, • where n is a positive integer between 1 and q*(q-1) inclusive of 1 and inclusive of q*(q-1), and • where the respective first connection is different from the respective second connection, and • where the respective n connection pairs differ from one another, and • where each respective connection pair can be assigned a respective unique connection pair number for the sake of clarity of this claim;

2010

Selection 2010 of the respective first terminal of the j-th terminal pair from the q terminals (111, 112, 113, 114) of the Hall plate 110;

2020

-Selection 2020 of the respective second terminal of the j-th terminal pair from the remaining (q-1) terminals (111, 112, 113, 114) of the Hall plate 110, which is different from the respective first terminal of the j-th terminal pair from the q terminals (111, 112, 113, 114) of the Hall plate 110;

2030

Feeding 2030 • an electrical measuring current I _Hall with an at least temporarily constant current value into the respective first connection of the j-th connection pair of the four connections (111, 112, 113, 114) of the Hall plate 110 and • taking this measuring current (I _Hall ) with this current value from the respective second connection of the j-th connection pair of the four connections (111, 112, 113, 114) of the Hall plate 110;

2040

Detecting 2040 the associated respective j-th voltage value 2100 of the voltage between the respective first terminal of the j-th terminal pair of the four terminals (111, 112, 113, 114) of the Hall plate 110 and the respective second terminal of the j-th terminal pair of the four terminals (111, 112, 113, 114) of the Hall plate 110;

2050

Check 2050 • whether all n measurements of all n connection pairs of the four connections (111, 112, 113, 114) of the Hall plate 110 have been carried out and • continue 2050 the measurements with a connection pair of the n connection pairs of the four connections (111, 112, 113, 114) of the Hall plate 110 that has not yet been measured, • if all n measurements of all n connection pairs of the four connections (111, 112, 113, 114) of the Hall plate 110 have not yet been carried out;

2060

Terminating 2060 the measurements when all n measurements of all n terminal pairs of the four terminals (111, 112, 113, 114) of the Hall plate 110 have been performed;

2100

Memory for the respective j-th voltage values 2100 of the respective j-th voltages between • the respective first terminal of the respective j-th terminal pair of the four terminals (111, 112, 113, 114) of the Hall plate 110 and • the respective second terminal of the respective j-th terminal pair of the four terminals (111, 112, 113, 114) of the Hall plate 110;

3070

Comparison 3070 of the respective j-th voltage value 2100 with an associated, respective permissible j-th tolerance range 3080 of the respective j-th voltage value 2100 (In 3 shown in two steps.);

3080

Memory for the respective permissible j-th tolerance range 3080 of the respective j-th voltage value 2100;

3090

Discarding 3090 the Hall sensor measuring system 100 or signaling an error of the Hall sensor measuring system 100 if the respective j-th voltage value is outside the respective tolerance range 3080 of the respective j-th voltage value 2100;

4110

Forming 4110 of m different respective voltage value pairs 4120 from each two respective voltage values of the measured n respective voltage values 2100, wherein the m respective voltage value pairs are each voltage value pairs of the possible n*(n-1) pairs from each two measured voltage values of the n measured respective voltage values 2100;

4120

Storing m different respective voltage value pairs 4120 from each two respective voltage values of the measured n respective voltage values 2100, wherein the m respective voltage value pairs are respective voltage value pairs of the possible n*(n-1) pairs from each two measured respective voltage values of the n measured respective voltage values 2100;

4130

Determining 4130 the m respective voltage difference values 4140 between the two respective voltage values of the respective m voltage value pairs 4120;

4140

Storage of the m respective voltage difference values 4140 between the two respective voltage values of the respective m voltage value pairs 4120;

4150

Comparing 4150 the magnitudes of these m respective voltage difference values with a respective homogeneity threshold 4160, where 1 ≤ m ≤ n*(n-1);

4160

Storage of the respective homogeneity threshold 4160;

4170

Checking 4170 whether one or more of the amounts of the m respective voltage difference values are above the amount of the respective homogeneity threshold 4160 and rejecting 3090 the micro-integrated circuit IC of the Hall sensor measuring system 100 if one or more of the respective amounts of the m respective voltage difference values are above the amount of the respective homogeneity threshold 4160, and/or signaling 3090 an error and/or the suspicion of an error of the micro-integrated circuit IC of the Hall sensor measuring system 100 if one or more of the respective amounts of the m respective voltage difference values are above the respective amount of the respective homogeneity threshold 4160 and terminating 2060 the measurements when all n measurements of all n respective connection pairs of the four connections (111, 112, 113, 114) of the Hall plate 110 have been carried out and when all respective amounts of the m respective Voltage difference values are below the respective amount of the respective homogeneity threshold 4160;

5008

Defining 5008 n respective complementary terminal pairs from a respective third terminal of the four terminals (111, 112, 113, 114) of the Hall plate 110 and a respective fourth terminal of the four terminals (111, 112, 113, 114) of the Hall plate 110;

5030

Feeding 5030 a respective intended measuring current I _Hall into the respective first connection of the Hall plate 110 and taking this respective intended measuring current I _Hall from the respective second connection of the Hall plate 110;

5035

Feeding 5035 a respective additional electrical test current I _tst with an at least temporarily constant current value into the respective third connection of the Hall plate 110 and taking this respective additional electrical test current (I _tst ) with an at least temporarily constant current value from the respective fourth connection of the Hall plate 110;

5170

Detecting 5170 the respective simulated Hall voltage value 5180 of the respective voltage between the respective third terminal of the Hall plate 110 and the respective fourth terminal of the Hall plate 110, in particular by the Hall amplifier 120 and/or the analog-to-digital converter 130;

5180

Storing the respective detected simulated Hall voltage values 5180 of the respective voltages between the respective third terminal of the Hall plate 110 and the respective fourth terminal of the Hall plate 110;

6190

Comparison 6190 of the respective detected Hall voltage value 5180 with a respective permissible tolerance range 6200 of the respective Hall voltage value 5180;

6200

Memory for the respective permissible tolerance ranges 6200 of the respective Hall voltage values 5180;

Itst

electrical test current;

IHall

electrical measuring current;

IC

microintegrated circuit;

Claims (13)

Hall sensor measuring system (100), wherein the Hall sensor measuring system (100) has a Hall plate (110) and wherein the Hall sensor measuring system (100) has an amplifier (120) and wherein the Hall plate (110) has q connections (111, 112, 113, 114) with q as a positive integer with q≥3 and wherein the amplifier (120) has a differential input (121) with a positive input (122) and a negative input (123) and wherein the Hall sensor measuring system (100) is set up to carry out a self-test and is set up for this purpose - by means of an analog switching mechanism (140) and a control device (124) n connection pairs each consisting of a first connection of the q connections (111, 112, 113, 114) of the Hall plate (110) and a second connection of the q connections (111, 112, 113, 114) of the Hall plate (110) (2007), - where n is a positive integer between 1 and q*(q-1) inclusive of 1 and inclusive of q*(q-1) and - where the first connection and is different from the second connection and - where the n connection pairs differ from one another and - where each connection pair can be assigned a unique connection pair number for the sake of clarity of this claim, and is designed to carry out the following measurement for each j-th connection pair of the n connection pairs with j as an integer between 1 and n inclusive of 1 and inclusive of n and is designed to select the first connection of the j-th connection pair from the q connections (111, 112, 113, 114) of the Hall plate (110) (2010) as part of such a measurement by means of an analogue switching mechanism (140) and by means of a control device (124), and is designed to - as part of such a measurement by means of an analog switching mechanism (140) and by means of a control device (124) to select (2020) the second connection of the j-th connection pair from the remaining (q-1) connections (111, 112, 113, 114) of the Hall plate (110), which is different from the first connection, and is set up to - in the context of such a measurement by means of a measuring current source (153, 154) to feed (2030) an electrical current with an at least temporarily constant current value into the first connection of the j-th connection pair of the four connections (111, 112, 113, 114) of the Hall plate (110) and - to take (2030) this current with this current value from the second connection of the j-th connection pair of the four connections (111, 112, 113, 114) of the Hall plate (110), ... Amplifier (120) and/or an analog-to-digital converter (130) to detect (2040) the associated j-th voltage value (2100) of the voltage between the first terminal of the j-th terminal pair and the second terminal of the j-th terminal pair, and is designed to check (2050) within the scope of such a measurement by means of a control device (124) whether all n measurements of all n terminal pairs have been carried out, and is arranged to terminate the measurements (2060) within the scope of such a measurement when all n measurements of all n connection pairs have been carried out, and is arranged to continue the measurements within the scope of such a measurement with the measurement of a connection pair of the n connection pairs that has not yet been measured if all n measurements of all n connection pairs have not yet been carried out. Hall sensor measuring system (100) according to Claim 1 • wherein the Hall sensor measuring system (100) is set up to carry out a self-test and for this purpose is set up to compare (3070) the j-th voltage value (2100) with a permissible tolerance range (3080) of the j-th voltage value (2100) as part of such a measurement, and is set up to signal (3090) an error of the Hall sensor measuring system (100) as part of such a measurement if the j-th voltage value is outside the tolerance range (3080) of the voltage value (2100). Hall sensor measuring system (100) according to Claim 1 or 2 , comprising the following additional steps, • wherein the Hall sensor measuring system (100) is set up to carry out a self-test and for this purpose - is set up to form m different voltage value pairs (4120) from two voltage values each of the measured n voltage values (2100) (4110), - wherein the m voltage value pairs of the possible n*(n-1) pairs are each from two measured voltage values of the n measured voltage values (2100), and - is set up to determine m voltage difference values (4140) between the two voltage values of the respective m voltage value pairs (4120) (4130), and - is set up to compare (4150) amounts of these m voltage difference values with a homogeneity threshold value (4160), and • where 1 ≤ m ≤ n*(n-1) and • where n>1. Hall sensor measuring system (100) according to Claim 3 • wherein the Hall sensor measuring system (100) is configured to carry out a self-test and for this purpose is configured to check (4170) whether one or more of the amounts of the m voltage difference values are above the amount of the homogeneity threshold value (4160), and is configured to signal (3090) an error and/or the suspicion of an error in the circuit (IC) of the Hall sensor measuring system (100) if one or more of the amounts of the m voltage difference values are above the amount of the homogeneity threshold value (4160). Hall sensor measuring system (100) according to one of the Claims 1 until 4 , • wherein the Hall plate (110) has q=2*p connections (111, 112, 113, 114) with p as a positive integer with p>1 and • wherein the 2*p connections of the Hall plate (110) are arranged in the form of a quadrilateral which defines a quadrangular closed polygon. Hall sensor measuring system (100) according to Claim 5 , • wherein the Hall sensor measuring system (100) is set up to carry out a self-test and is set up for this purpose to - define n connection pairs each consisting of a first connection of the four connections (111, 112, 113, 114) of the Hall plate (110) and a second connection of the four connections (111, 112, 113, 114) of the Hall plate (110) (2007) and - define n complementary connection pairs each consisting of a third connection of the four connections (111, 112, 113, 114) of the Hall plate (110) and a fourth connection of the four connections (111, 112, 113, 114) of the Hall plate (110) (5008), and • wherein each complementary connection pair of the n complementary connection pairs is assigned exactly one connection pair of the n connection pairs and • wherein the third connection of a complementary terminal pair of the Hall plate (110) is different from the first terminal of the associated terminal pair of the Hall plate (110) and • wherein the fourth terminal of the complementary terminal pair of the Hall plate (110) is different from the first Connection of the associated connection pair of the Hall plate (110) is different and • wherein the third connection of the complementary connection pair of the Hall plate (110) is different from the second connection of the associated connection pair of the Hall plate (110) and • wherein the third connection of the complementary connection pair of the Hall plate (110) is different from the fourth connection of the complementary connection pair of the Hall plate (110) and • wherein the first connection of the associated connection pair of the Hall plate (110) is different from the second connection of the associated connection pair of the Hall plate (110). Hall sensor measuring system (100) according to Claim 6 , • where in a circuit along the polygon the four connections are arranged in the order first connection, third connection, second connection, fourth connection or in the order second connection, third connection, first connection, fourth connection. Hall sensor measuring system (100) according to Claim 6 or 7 , • wherein the Hall sensor measuring system (100) is set up to carry out a self-test and is set up for this purpose - to feed (2030) an electrical current with an at least temporarily constant current value into the first connection of the j-th connection pair of the four connections (111, 112, 113, 114) of the Hall plate (110) and - to take this current with this current value from the second connection of the j-th connection pair of the four connections (111, 112, 113, 114) of the Hall plate (110), and is set up to feed (5030) an intended operating current into the first connection of the Hall plate (110) and to take this intended operating current from the second connection (5030), and is set up to feed (5035) an additional electrical current with an at least temporarily constant current value into the third connection of the Hall plate (110) and to feed this additional electrical current with an at least temporarily constant current value into the third connection of the Hall plate (110) and to to take a temporarily constant current value from the fourth terminal of the Hall plate. Hall sensor measuring system (100) according to Claim 8 , • wherein the Hall sensor measuring system (100) is set up to carry out a self-test and is set up for this purpose to - detect (2040) the associated j-th voltage value (2100) of the voltage between the first terminal of the j-th terminal pair and the second terminal of the j-th terminal pair and - thereby detect (5170) the simulated Hall voltage value (5180) of the voltage between the third terminal and the fourth terminal, in particular by the Hall amplifier (120) and/or the analog-to-digital converter (130). Hall sensor measuring system (100) according to Claim 9 , • wherein the Hall sensor measuring system (100) is set up to carry out a self-test and for this purpose is set up to compare the Hall voltage value (5180) with a permissible tolerance range (6200) of the Hall voltage value (5180), and; is set up to signal (3090) an error of the Hall sensor measuring system (100) and/or the circuit (IC) of the Hall sensor measuring system (100) if the Hall voltage value (5180) is outside the tolerance range (6200) of the Hall voltage value (5180). Hall sensor measuring system (100) according to one of the Claims 6 until 10 , wherein the fourth terminal of the complementary terminal pair of the Hall plate (110) is different from the second terminal of the associated terminal pair of the Hall plate (110). Hall sensor measuring system (100) one of the Claims 6 until 11 , • wherein the Hall sensor measuring system (100) is configured to carry out a self-test and for this purpose is configured to chop the signal of the Hall plate (110) in a signal path starting with the differential input (121) of the amplifier (120) and ending with the output of an analog-to-digital converter (130) at 2*m points. Hall sensor measuring system (100) according to one of the Claims 6 until 12 , • wherein the Hall sensor measuring system (100) comprises a connection-symmetrical Hall plate (110) and • wherein connection symmetry means - that the Hall plate (110) has an axis of symmetry or a point of symmetry with respect to the geometric arrangement of the connections and - that each connection with respect to this axis of symmetry or this point of symmetry is symmetrically opposite exactly one other connection of the connections of the Hall plate (110), hereinafter referred to as the connection symmetrically corresponding to the aforementioned connection.

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