CN203587757U - Hand-held digital integrated circuit parameter tester - Google Patents
Hand-held digital integrated circuit parameter tester Download PDFInfo
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- CN203587757U CN203587757U CN201320695681.9U CN201320695681U CN203587757U CN 203587757 U CN203587757 U CN 203587757U CN 201320695681 U CN201320695681 U CN 201320695681U CN 203587757 U CN203587757 U CN 203587757U
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Abstract
The utility model provides a hand-held digital integrated circuit parameter tester, and relates to an integrated circuit parameter tester, comprising a power management module, a central control module, a chip test interface, a communication module, and a man-machine interface module. An output end of the power management module is connected with a power input end of the central control module. The central control module comprises a singlechip I and a singlechip II. The singlechip I is connected with the chip test interface. The singlechip II is directly connected with the communication module and the man-machine interface module through I/O pins. The singlechip I and the singlechip II are connected directly through a SPI bus. The communication module comprises a serial communication interface chip and peripheral circuit thereof. An output end of the communication module is connected with an input end of a host computer. The parameter tester is advantaged by complete functions, stable operation, simple operation, small size, low cost, etc. and can be used as a teaching instrument or a detection instrument, and is suitable to be popularized into laboratories in schools or for amateur electrical fans.
Description
Technical field
The utility model relates to a kind of IC parameter testing instrument, particularly a kind of hand-held numerical integrated circuit parameter test instrument.
Background technology
In the development and Design or relevant practical teaching of carrying out electronic system, can use a lot of digital integrated circuit chips.Under a lot of occasions, can reuse chip, now can run into unavoidably the situation of chip failure.Used the digital integrated circuit chip damaging can greatly increase the debugging difficulty of Circuits System, and before using chip, but cannot be whether intact by the function of common instrument and meter detection chip.The professional integrated circuit tester device perfect in shape and function of using in engineering, but simultaneously have expensive, complicated operation, the shortcoming such as bulky, is difficult to extensively introduce laboratory, among numerous electrophiles colony, cannot popularize.
The utility model patent that notification number is CN202583410 provides a kind of portable Chinese interface digital integrated circuit fundamental tester, proposed to use the digital integrated circuit fundamental tester of STC89C516RD+ single-chip microcomputer as controller, by single-chip microcomputer, keyboard, serial line interface, chip testing interface, Chinese liquid crystal display and warning circuit, formed.In the circuit design of this tester, use two 7805 voltage stabilizer power supplies, can only test the chip of applicable+5V power supply, cannot test the chip of use+3.3V power supply; And this tester do not have integrated simulation/digital conversion function, accurate magnitude of voltage that cannot detection chip output level.
Conventionally existing integrated circuit fundamental tester cheaply uses button to shield and carry out man-machine interface design with single color LCD mostly, complicated operation and have less attractive.And in the chip testing Interface design of this type of tester, the power-supplying circuit of chip to be measured is a large defect.In order to take into account the chip to be measured that number of pin is different, conventionally at the 14th, 16,20 pin places, design complicated power supply switch circuit, be so just difficult to take into account the detection of corresponding numbering pin; It is chip power supply to be measured that the driving force that single-chip processor i/o pin has been ignored in other design is just directly used the I/O pin of single-chip microcomputer, makes instrument job stability not good enough.
Summary of the invention
The technical problems to be solved in the utility model is: a kind of hand-held numerical integrated circuit parameter test instrument is provided, when solving the test of current digital integrated circuit chip single, function imperfection, man-machine interface complicated operation of test parameter and easily lost efficacy, the higher shortcoming of testing cost.
The technical scheme solving the problems of the technologies described above is: a kind of hand-held numerical integrated circuit parameter test instrument, comprises power management module, central control module, chip testing interface, communication module, human-machine interface module composition.
Described power management module output terminal is connected with the power input of central control module, is used to central control module that power supply is provided;
Described central control module comprises single-chip microcomputer I, single-chip microcomputer II, and described single-chip microcomputer I is connected with chip testing interface, is responsible for chip detection specially; Described single-chip microcomputer II is directly connected with communication module, human-machine interface module by I/O pin respectively, is responsible for controlling liquid crystal display, touches input and serial communication; Between described single-chip microcomputer I, single-chip microcomputer II, directly by spi bus, connect;
Described communication module comprises serial communication interface chip and peripheral circuit thereof, and the output terminal of this communication module is connected with the input end of host computer, for by the data transmission of single-chip microcomputer II to host computer.
Further technical scheme of the present utility model is: comprise+7.2V of described power management module lithium battery, three terminal regulator U2, three terminal regulator U3, the input end of described three terminal regulator U2 is connected in series with+7.2V lithium battery, three terminal regulator U2 output terminal is connected with VCC network by single-pole double-throw switch (SPDT), for provide+5V power supply; Simultaneously three terminal regulator U2+5V power output end is connected in series with the input end of three terminal regulator U3, the output terminal of three terminal regulator U3 is connected with VCC network by single-pole double-throw switch (SPDT), for use in provide+3.3V power supply.
Further technical scheme of the present utility model is: described single-chip microcomputer I, single-chip microcomputer II adopt C8051F410 single-chip microcomputer.
Further technical scheme of the present utility model is: described chip testing interface is 20 pin chip component seats, 19 pin ground connection of this chip testing interface, and all the other pins are directly connected with the I/O pin of single-chip microcomputer I.
Further technical scheme of the present utility model is: described serial communication interface chip adopts MAX3232 chip.
Further technical scheme more of the present utility model is: described human-machine interface module comprises liquid crystal touch screen.
Further technical scheme of the present utility model is: described liquid crystal touch screen adopts resistive touch screen TFT320240 liquid crystal display.
Owing to adopting said structure, the hand-held numerical integrated circuit parameter test instrument of the utility model compared with prior art, has following beneficial effect:
1. test parameter variation:
Digital integrated circuit chip that can the following dual-in-line of compatible 20 pin due to this tester carries out functional verification and parameter detecting, the supply voltage of chip to be measured allows to be chosen as+3.3V or+5V.Using after the C8051F410 single-chip microcomputer that carries 12 ADC devices of multichannel input, detectable parameter comprises output high level voltage value Voh, output low level magnitude of voltage Vol, this instrument not only can detection chip output logic, can also detection chip the magnitude of voltage of output, whether its test parameter variation, lost efficacy complete test result be provided digital integrated circuit chip thereby realize.
2. perfect in shape and function:
The utility model has been taken into account chip power supply to be measured and parameter detecting in the circuit design of chip testing interface, its function is fairly perfect, the design that has solved power pin in chip testing interface is difficult to the problem of the different various chips of coupling encapsulation, has greatly promoted compatibility and the stability of instrument.
3. man-machine interface is simple to operate:
The man-machine interface of this hand-held numerical integrated circuit parameter test instrument adopts 320 × 240 resolution color liquid crystal touch display screen exploitations, and friendly interface is simple to operate, meets the custom that modern people's operator is held instrument.
4. cost is low:
Of the present utility model relatively simple for structure, volume is small and exquisite, with low cost, can be used as instruments used for education or measuring instrument, is applicable to being generalized among school laboratory or amateurish electrophile.
Below, the technical characterictic of the hand-held numerical integrated circuit parameter test instrument to the utility model is further described in conjunction with the accompanying drawings and embodiments.
Accompanying drawing explanation
Fig. 1: the structured flowchart of the hand-held numerical integrated circuit parameter test instrument of the utility model;
The circuit theory diagrams of power management module described in Fig. 2: embodiment mono-;
The circuit theory diagrams of single-chip microcomputer I and chip testing interface described in Fig. 3: embodiment mono-;
The circuit theory diagrams of single-chip microcomputer II, communication module and human-machine interface module described in Fig. 4: embodiment mono-.
In figure:
U2-three terminal regulator, U3-three terminal regulator, U4-single-chip microcomputer II,
U5-single-chip microcomputer I, U6-chip testing interface, U7-communication module,
LCD-TFT320240 display, Touch-resistive touch screen.
Embodiment
Embodiment mono-:
Disclosed in Fig. 1 is a kind of hand-held numerical integrated circuit parameter test instrument, comprises power management module, central control module, chip testing interface, communication module, human-machine interface module,
Described power management module output terminal is connected with the power input of central control module, is used to central control module that power supply is provided;
Described central control module comprises single-chip microcomputer I, single-chip microcomputer II, and described single-chip microcomputer I is connected with chip testing interface, is responsible for chip detection specially; Described single-chip microcomputer II is directly connected with communication module, human-machine interface module by I/O pin respectively, is responsible for controlling liquid crystal display, touches input and serial communication; Between described single-chip microcomputer I, single-chip microcomputer II, directly by spi bus, connect;
Described communication module comprises serial communication interface chip and peripheral circuit thereof, and wherein serial communication interface chip adopts MAX3232 chip, and the output terminal of this communication module is connected with the input end of host computer, for by the data transmission of single-chip microcomputer II to host computer.
Described chip testing interface is 20 pin chip component seats, 19 pin ground connection of this chip testing interface, and all the other pins are directly connected with the I/O pin of single-chip microcomputer I.
Described human-machine interface module comprises liquid crystal touch screen, and this liquid crystal touch screen adopts resistive touch screen TFT320240 liquid crystal display.
Disclosed in Fig. 2 is the power management module circuit theory diagrams of this tester, comprise+7.2V of this power management module lithium battery, three terminal regulator U2, three terminal regulator U3, wherein three terminal regulator U2 model is AMS1117-5, three terminal regulator U3 model is AMS1117-3.3, the input end of described three terminal regulator U2 is connected in series with+7.2V lithium battery, three terminal regulator U2 output terminal is connected with VCC network by single-pole double-throw switch (SPDT), for provide+5V power supply; Simultaneously three terminal regulator U2+5V power output end is connected in series with the input end of three terminal regulator U3, the output terminal of three terminal regulator U3 is connected with VCC network by single-pole double-throw switch (SPDT), for use in provide+3.3V power supply (referring to Fig. 2).
Disclosed in Fig. 3 is the single-chip microcomputer I of this tester central control module and the circuit theory diagrams of chip testing interface, U5 in this Fig. 3 is single-chip microcomputer I, its model is C8051F410, its IO mouth direct chip test interface U6 connects, 17,18,19 pin of single-chip microcomputer are designed to SPI communication port, be used for and single-chip microcomputer II swap data, the chip testing interface U6 lower left corner the 19th pin is designed to solid ground end, meets the pin configuration of all digital circuit integrated circuit; And all the other each pins all directly connect the I/O pin of C8051F410 single-chip microcomputer I, due to the driving force powerful (each I/O pin can provide separately 100mA electric current) of the I/O port of single-chip microcomputer I, and this single-chip microcomputer I is separation with I/O port independently-powered, above feature makes its I/O pin can be directly for chip to be measured provides Power supply, and the design that has solved power pin in chip testing interface is difficult to the problem of the different various chips of coupling encapsulation; And the ADC of the inner integrated 12bit of C8051F410 single-chip microcomputer, all I/O ports all can be configured to the input pin of this ADC, therefore can select according to different chip packages to be measured the function of each I/O port, so just realized all possible output pin of chip to be measured has been carried out to AD collection, thereby in the function of this chip of checking, its output high level voltage value Voh and output low level magnitude of voltage Vol are detected.In Fig. 3,1 pin of single-chip microcomputer I U5 is its I/O port feeder ear, and 1 pin is connected to VCC network, can realize by single-pole double-throw switch (SPDT) and select single-chip microcomputer pin voltage and chip power supply voltage to be measured, alternative magnitude of voltage is+5V or+3.3V.
Disclosed in Fig. 4 is the single-chip microcomputer II of this tester central control module, communication module, the circuit theory diagrams of human-machine interface module, in this Fig. 4, U4 is single-chip microcomputer II, its model is C8051F410, be responsible for controlling human-machine interface module and communication module, 17 of single-chip microcomputer II, 18, 19 pin are set to SPI communication pin equally, for carrying out exchanges data with single-chip microcomputer I, the liquid crystal touch screen that human-machine interface module adopts comprises LCD(LCD interface) with Touch(touch-screen control interface) two interface circuits, this liquid crystal touch screen adopts resistive touch screen TFT320240 liquid crystal display, described communication module U7 comprises serial communication interface chip and circuit thereof, wherein serial communication interface chip adopts MAX3232 chip, 21 pin of single-chip microcomputer II and 22 pin are the inner integrated serial communication pin of C8051F410 single-chip microcomputer, by MAX3232 serial communication level transferring chip, can realize the RS232 serial communication of single-chip microcomputer and host computer.
Referring to Fig. 3 and Fig. 4, wherein ISP and ISP1 are the DLL (dynamic link library) of C8051F410 single-chip microcomputer, its peripheral circuit configuration is simple, and the built-in oscillator of C8051F410 single-chip microcomputer, can provide the frequency of operation up to 49MHz by setup and use internal oscillator, under the frequency of operation of 49HMz, this single-chip microcomputer peak velocity can reach 49MIPS, therefore in circuit, does not use external crystal-controlled oscillation that frequency of operation is provided.
Claims (7)
1. a hand-held numerical integrated circuit parameter test instrument, is characterized in that: comprise power management module, central control module, chip testing interface, communication module, human-machine interface module composition,
Described power management module output terminal is connected with the power input of central control module, is used to central control module that power supply is provided;
Described central control module comprises single-chip microcomputer I, single-chip microcomputer II, and described single-chip microcomputer I is connected with chip testing interface, is responsible for chip detection specially; Described single-chip microcomputer II is directly connected with communication module, human-machine interface module by I/O pin respectively, is responsible for controlling liquid crystal display, touches input and serial communication; Between described single-chip microcomputer I, single-chip microcomputer II, directly by spi bus, connect;
Described communication module comprises serial communication interface chip and peripheral circuit thereof, and the output terminal of this communication module is connected with the input end of host computer, for by the data transmission of single-chip microcomputer II to host computer.
2. according to the hand-held numerical integrated circuit parameter test instrument described in claim 1, it is characterized in that: comprise+7.2V of described power management module lithium battery, three terminal regulator U2, three terminal regulator U3, the input end of described three terminal regulator U2 is connected in series with+7.2V lithium battery, three terminal regulator U2 output terminal is connected with VCC network by single-pole double-throw switch (SPDT), for provide+5V power supply; Simultaneously three terminal regulator U2+5V power output end is connected in series with the input end of three terminal regulator U3, the output terminal of three terminal regulator U3 is connected with VCC network by single-pole double-throw switch (SPDT), for use in provide+3.3V power supply.
3. according to the hand-held numerical integrated circuit parameter test instrument described in claim 1, it is characterized in that: described single-chip microcomputer I, single-chip microcomputer II adopt C8051F410 single-chip microcomputer.
4. according to the hand-held numerical integrated circuit parameter test instrument described in claim 1, it is characterized in that: described chip testing interface is 20 pin chip component seats, 19 pin ground connection of this chip testing interface, all the other pins are directly connected with the I/O pin of single-chip microcomputer I.
5. according to the hand-held numerical integrated circuit parameter test instrument described in claim 1, it is characterized in that: described serial communication interface chip adopts MAX3232 chip.
According to claim 1 to the hand-held numerical integrated circuit parameter test instrument described in the arbitrary claim of claim 5, it is characterized in that: described human-machine interface module comprises liquid crystal touch screen.
7. according to the hand-held numerical integrated circuit parameter test instrument described in claim 6, it is characterized in that: described liquid crystal touch screen adopts resistive touch screen TFT320240 liquid crystal display.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320695681.9U CN203587757U (en) | 2013-03-29 | 2013-11-05 | Hand-held digital integrated circuit parameter tester |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320150741.9 | 2013-03-29 | ||
| CN201320150741 | 2013-03-29 | ||
| CN201320695681.9U CN203587757U (en) | 2013-03-29 | 2013-11-05 | Hand-held digital integrated circuit parameter tester |
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| Publication Number | Publication Date |
|---|---|
| CN203587757U true CN203587757U (en) | 2014-05-07 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310542556.9A Expired - Fee Related CN103576078B (en) | 2013-03-29 | 2013-11-05 | Hand-held numerical integrated circuit parameter test instrument |
| CN201320695681.9U Expired - Fee Related CN203587757U (en) | 2013-03-29 | 2013-11-05 | Hand-held digital integrated circuit parameter tester |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201310542556.9A Expired - Fee Related CN103576078B (en) | 2013-03-29 | 2013-11-05 | Hand-held numerical integrated circuit parameter test instrument |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103576078A (en) * | 2013-03-29 | 2014-02-12 | 柳州铁道职业技术学院 | Handheld digital integrated circuit parameter tester |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104049199A (en) * | 2014-06-16 | 2014-09-17 | 武汉新芯集成电路制造有限公司 | Failure analysis system |
| CN111308324B (en) * | 2020-04-01 | 2022-03-25 | 北京京瀚禹电子工程技术有限公司 | Integrated circuit test equipment |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6449741B1 (en) * | 1998-10-30 | 2002-09-10 | Ltx Corporation | Single platform electronic tester |
| CN201464611U (en) * | 2009-03-27 | 2010-05-12 | 孔睿 | Integrated circuit chip test instrument |
| CN201417296Y (en) * | 2009-04-28 | 2010-03-03 | 深圳安博电子有限公司 | Indicator integrated circuit test device |
| CN202404205U (en) * | 2011-12-31 | 2012-08-29 | 成都因纳伟盛科技股份有限公司 | Low-cost and high-efficiency bad block detection tool for Flash chips |
| CN202583410U (en) * | 2012-05-31 | 2012-12-05 | 昆明理工大学 | Portable Chinese interface digital integrated circuit functional tester |
| CN103576078B (en) * | 2013-03-29 | 2016-12-07 | 柳州铁道职业技术学院 | Hand-held numerical integrated circuit parameter test instrument |
-
2013
- 2013-11-05 CN CN201310542556.9A patent/CN103576078B/en not_active Expired - Fee Related
- 2013-11-05 CN CN201320695681.9U patent/CN203587757U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103576078A (en) * | 2013-03-29 | 2014-02-12 | 柳州铁道职业技术学院 | Handheld digital integrated circuit parameter tester |
| CN103576078B (en) * | 2013-03-29 | 2016-12-07 | 柳州铁道职业技术学院 | Hand-held numerical integrated circuit parameter test instrument |
Also Published As
| Publication number | Publication date |
|---|---|
| CN103576078A (en) | 2014-02-12 |
| CN103576078B (en) | 2016-12-07 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20140507 Termination date: 20161105 |