CN201601794U - Parameter measuring equipment for infrared imaging detector - Google Patents
Parameter measuring equipment for infrared imaging detector Download PDFInfo
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- CN201601794U CN201601794U CN2010201097196U CN201020109719U CN201601794U CN 201601794 U CN201601794 U CN 201601794U CN 2010201097196 U CN2010201097196 U CN 2010201097196U CN 201020109719 U CN201020109719 U CN 201020109719U CN 201601794 U CN201601794 U CN 201601794U
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Abstract
The utility model provides parameter measuring equipment for an infrared imaging detector, which includes a power supply module, a detection device, a data acquiring and sending circuit, a data analysis and central control system, a detector timing sequence generation circuit, and a data acquisition synchronizing circuit, wherein the power supply module is connected with the detection device, the detection device is connected with the data acquiring and sending circuit, the data acquiring and sending circuit is connected with the data analysis and central control system through a data wire, the detector timing sequence generation circuit is connected with the detection device, and the data acquisition synchronizing circuit is connected with the data acquiring and sending circuit. The parameter measuring equipment has simple structure and convenient operation, realizes automatic tests, reduces cost and provides the testing efficiency.
Description
Technical field
The utility model relates to image collecting device, is specially a kind of equipment that the performances of IR parameter was measured and analyzed to moving image of analyzing that utilizes.
Background technology
In actual applications, infrared imaging detector is usually by interface adapter and different target seeker equipment connections, in order to realize evaluation and test and debugging, often need gather the storage playback in real time to the view data of infrared imaging detector output to the target seeker imaging system.By the view data analysis of obtaining being measured a set of equipment of the performance parameter of Infrared Detectors since external measuring equipment not only price is too expensive, complicated operation, and have many functions use less than.Therefore, it is cheap to be badly in need of a cover price, a cover special measurement equipment easy to use, and this measuring equipment produces under this background.
The utility model content
The technical problem that the utility model solved is to provide a kind of Infrared Detectors parameter test device, to solve the shortcoming in the above-mentioned background technology.
The technical problem that the utility model solved realizes by the following technical solutions:
The Infrared Detectors parameter test device, comprise supply module, sniffer, data acquisition and transtation mission circuit, data analysis and central control system, detector timing generator circuit, data acquisition synchronous circuit, described supply module connects sniffer, sniffer connects data acquisition and transtation mission circuit, data acquisition and transtation mission circuit by the data wire linking number according to one's analysis with central control system, described detector timing generator circuit connects sniffer, and described data acquisition synchronous circuit connects data acquisition and transtation mission circuit.
In the utility model, described data acquisition and transtation mission circuit are that high-speed serial signals sends on the transmission line with the Infrared Detectors signal that collects by the LVDS module converts, are sent to follow-up data in real time analysis and central control system module.
In the utility model, described detector timing generator circuit major function is for detector provides work master clock and work schedule, controls tested Infrared Detectors by required mode of operation output corresponding signal
In the utility model, described data acquisition synchronous circuit need provide synchronizing signal to Acquisition Circuit, and control data collection and high speed transtation mission circuit are correctly gathered the output signal of Infrared Detectors according to the work schedule of Infrared Detectors.
In the utility model, described data analysis and central control system module realize human-computer interaction interface, and each module of system is carried out the setting of mode of operation; After receiving the high-speed data that the test macro front end sends here in real time, at first finish and receive at a high speed and real time record, then based on the data that write down, realization is to automatic analysis, form and the demonstration of each performance parameter of Infrared Detectors, the relevant parameter of Infrared Detectors sensitivity mainly comprises: nonuniformity correction, heterogeneity tolerance, the test of bad picture dot, the responsiveness test, noise equivalent temperature difference tolerance NETD.
Using method of the present utility model is as follows:
Be ready to tested Infrared Detectors, it is in treats operating state, the data wire of equipment and control line and detector are connected, starting device power supply then, press Test Switchboard, data acquisition circuit is gathered detector output data under the effect of detector sequence circuit, by the high speed transtation mission circuit these data are sent to data analysis and central control system, finish the test of detector performance by data analysis system then.
Beneficial effect: the utility model is simple in structure, and is easy to operate, realizes automatic test, saves cost, improved testing efficiency.
Description of drawings
Fig. 1 is a framework schematic diagram of the present utility model;
Embodiment
For technological means, creation characteristic that the utility model is realized, reach purpose and effect is easy to understand, below in conjunction with concrete diagram, further set forth the utility model.
Referring to Fig. 1 Infrared Detectors parameter test device, comprise supply module 1, sniffer 2, data acquisition and transtation mission circuit 3, data analysis and central control system 4, detector timing generator circuit 5, data acquisition synchronous circuit 6.
Be ready to tested Infrared Detectors, it is in treats operating state, the detector that opening supply module 1 will need to detect is put into sniffer 2, by detector timing generator circuit 5 and data acquisition synchronous circuit 6, acquired signal, again signal is occurred to sniffer 2 and data acquisition and transtation mission circuit 3, at last signal is passed to data analysis and central control system 4, finish the test of detector by data analysis and central control system 4.
More than show and described basic principle of the present utility model and principal character and advantage of the present utility model.The technical staff of the industry should understand; the utility model is not restricted to the described embodiments; that describes in the foregoing description and the specification just illustrates principle of the present utility model; under the prerequisite that does not break away from the utility model spirit and scope; the utility model also has various changes and modifications, and these changes and improvements all fall in claimed the utility model scope.The claimed scope of the utility model is defined by appending claims and equivalent thereof.
Claims (1)
1. infrared imaging detector parameter measuring apparatus, comprise supply module, sniffer, data acquisition and transtation mission circuit, data analysis and central control system, detector timing generator circuit, data acquisition synchronous circuit, it is characterized in that, described supply module connects sniffer, sniffer connects data acquisition and transtation mission circuit, data acquisition and transtation mission circuit by the data wire linking number according to one's analysis with central control system, described detector timing generator circuit connects sniffer, and described data acquisition synchronous circuit connects data acquisition and transtation mission circuit.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2010201097196U CN201601794U (en) | 2010-02-08 | 2010-02-08 | Parameter measuring equipment for infrared imaging detector |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2010201097196U CN201601794U (en) | 2010-02-08 | 2010-02-08 | Parameter measuring equipment for infrared imaging detector |
Publications (1)
Publication Number | Publication Date |
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CN201601794U true CN201601794U (en) | 2010-10-06 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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CN2010201097196U Expired - Fee Related CN201601794U (en) | 2010-02-08 | 2010-02-08 | Parameter measuring equipment for infrared imaging detector |
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CN (1) | CN201601794U (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106289729A (en) * | 2016-08-31 | 2017-01-04 | 电子科技大学 | A kind of Terahertz or infrared focal plane detector Auto-Test System and method |
-
2010
- 2010-02-08 CN CN2010201097196U patent/CN201601794U/en not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106289729A (en) * | 2016-08-31 | 2017-01-04 | 电子科技大学 | A kind of Terahertz or infrared focal plane detector Auto-Test System and method |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
DD01 | Delivery of document by public notice |
Addressee: Dineisi Technology and Development Co., Ltd., Changsha High-tech Development Zone Document name: Notification of Termination of Patent Right |
|
C17 | Cessation of patent right | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20101006 Termination date: 20140208 |