CN204761416U - AD converting circuit for test system is moved to microbit - Google Patents
AD converting circuit for test system is moved to microbit Download PDFInfo
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- CN204761416U CN204761416U CN201520292862.6U CN201520292862U CN204761416U CN 204761416 U CN204761416 U CN 204761416U CN 201520292862 U CN201520292862 U CN 201520292862U CN 204761416 U CN204761416 U CN 204761416U
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Abstract
The utility model discloses a AD converting circuit for test system is moved to microbit, including first electric capacity, reference voltage source chip, polarity electric capacity, second electric capacity, third electric capacity and AD conversion chip, wherein the reference voltage source chip includes four pins, and first to the fourth pin promptly, wherein first pin and second pin are connected with the anodal of polarity electric capacity through a capacitance connection, third pin, the negative pole of polarity electric capacity with be connected with simulating, AD conversion chip includes ten pins, the 5th to the 14 pin promptly, and wherein the 5th pin is connected with the anodal of polarity electric capacity, is connected to the 8th pin and simulation, and the 6th pin and the 8th pin pass through the 2nd capacitance connection, and the 14 pin and the 8th pin pass through the 3rd capacitance connection, the tenth to the 13 pin and upper computer connection, the 9th pin is not connected with power ground, and its technological effect is: can improve the measurement accuracy that the microbit was moved, reduce the consumption, reduce the noise, reduce the sluggish and long -term output voltage drift of output voltage.
Description
Technical field
The utility model relates to a kind of A/D convertor circuit, particularly relates to a kind of micrometric displacement test macro A/D convertor circuit.
Background technology
A/D convertor circuit is used to change analog quantity into digital quantity by certain circuit, as long as A/D convertor circuit completes the conversion of analog DC voltage to digital quantity.Generally, single-chip microcomputer all comprises A/D convertor circuit, because the conversion figure place of the A/D convertor circuit of single-chip microcomputer inside is usually not high, common single-chip microcomputer is generally 8 A/D convertor circuits, such as STC12C5630AD also has AD conversion function, and the AD conversion figure place of its A/D convertor circuit is 10, and AD conversion figure place directly determines the certainty of measurement of system, in order to realize the certainty of measurement of high micrometric displacement, independent high-resolution A/D convertor circuit must be set specially.
Utility model content
The purpose of this utility model is the defect overcoming prior art, and provide a kind of micrometric displacement test macro A/D convertor circuit, it can improve the certainty of measurement of micrometric displacement, reduces power consumption, noise decrease, reduces output voltage sluggishness and the drift of long-term output voltage.
A kind of technical scheme realizing above-mentioned purpose is: a kind of micrometric displacement test macro A/D convertor circuit, comprises the first electric capacity, reference voltage source chip, polar capacitor, the second electric capacity, the 3rd electric capacity, AD conversion chip, wherein:
Described reference voltage source chip comprises four pins, first pin, the second pin, the 3rd pin and the 4th pin, the two ends correspondence of wherein said first electric capacity is connected with described first pin and described second pin, described 3rd pin is connected with the positive pole of described polar capacitor, the negative pole of described polar capacitor be connected in analog;
Described AD conversion chip comprises ten pins, 5th pin, 6th pin, 7th pin, 8th pin, 9th pin, tenth pin, 11 pin, 12 pin, 13 pin and the 14 pin, wherein said 5th pin is connected with the positive pole of described polar capacitor, described 8th pin be connected in analog, the two ends correspondence of described second electric capacity connects described 6th pin and described 8th pin, the two ends correspondence of described 3rd electric capacity connects described 8th pin and described 14 pin, described tenth pin, described 11 pin, described 12 pin is connected with host computer with described 13 pin, be connected described 9th pin and power supply.
Further, described reference voltage source chip is the ADR4550 chip of Ya Nuode company.
Further, described AD conversion chip is the AD7988 chip of Ya Nuode company.
Have employed the technical scheme of a kind of micrometric displacement test macro A/D convertor circuit of the present utility model, comprise the first electric capacity, reference voltage source chip, polar capacitor, the second electric capacity, the 3rd electric capacity and AD conversion chip, wherein said reference voltage source chip comprises four pins, i.e. first to fourth pin, wherein said first pin is connected by the first electric capacity with described second pin, described 3rd pin is connected with the positive pole of described polar capacitor, the negative pole of described polar capacitor be connected in analog; Described AD conversion chip comprises ten pins, i.e. the 5th to the 14 pin, wherein said 5th pin is connected with the positive pole of described polar capacitor, described 8th pin be connected in analog, described 6th pin is connected by described second electric capacity with described 8th pin, described 14 pin is connected by described 3rd electric capacity with described 8th pin, and the described tenth is connected to described 13 pin with host computer, and described 9th pin is connected with power supply ground.Its technique effect is: the certainty of measurement that can improve micrometric displacement, reduces power consumption, noise decrease, reduces output voltage sluggishness and the drift of long-term output voltage.
Accompanying drawing explanation
Fig. 1 is the schematic diagram of a kind of micrometric displacement test macro of the utility model A/D convertor circuit.
Embodiment
In order to make those skilled in the art can understand the technical solution of the utility model better, below in conjunction with accompanying drawing, its embodiment is described in detail:
Refer to Fig. 1, a kind of micrometric displacement test macro A/D convertor circuit of the present utility model, comprise the first electric capacity 3, reference voltage source chip 1, polar capacitor 4, second electric capacity 5, the 3rd electric capacity 6, AD conversion chip 2, wherein:
Reference voltage source chip 1 comprises four pins, first pin 11, second pin 12, the 3rd pin 13 and the 4th pin 14, wherein, the two ends correspondence of the first electric capacity 3 is connected with the first pin 11 and the second pin 12,3rd pin 13 is connected with the positive pole of polar capacitor 4, the negative pole of polar capacitor 4 be connected in analog.
AD conversion chip 2 comprises ten pins, the 5th pin 21, the 6th pin 22, the 7th pin 23, the 8th pin 24, the 9th pin the 25, ten pin the 26, the 11 pin the 27, the 12 pin the 28, the 13 pin the 29, the 14 pin 210.
Wherein the 5th pin 21 is connected with the positive pole of polar capacitor 4, makes AD conversion chip 2 obtain reference input voltage.
8th pin 24 be connected in analog.
The two ends correspondence of the second electric capacity 5 connects the 6th pin 22 and the 8th pin the 24, six pin 22 input power as AD conversion chip 2.
The two ends correspondence of the 3rd electric capacity 6 connects the 14 pin 210 and the 8th pin 24, and the 3rd electric capacity 6 is as the input power of the input/output interface of AD conversion chip 2;
Tenth pin the 26, the 11 pin the 27, the 12 pin 28 is connected with host computer 7 with the 13 pin 29, and wherein the tenth pin 26 is AD conversion input interface; 11 pin 27 is serial output interface, and the result of AD conversion is exported by the 11 pin 27; 12 pin 28 is serial clock input interface; 13 pin 29 is serial input interface.
Be connected 9th pin 25 and power supply.
A kind of micrometric displacement test macro A/D convertor circuit of the present utility model in use, using the ADR4550 chip of Ya Nuode company as reference voltage source chip 1, ADR4550 is high accuracy, low-power consumption, low noise reference voltage source, maximum initial error is ± 0.02%, has outstanding temperature stability and low output noise.ADR4550 chip, precision, temperature stability are good, and noise robustness is good, and output voltage sluggishness is low, and long-term output voltage drift is low, improves the precision of a kind of micrometric displacement test macro of the utility model A/D convertor circuit within life-span and temperature range.First pin 11 of this reference voltage source chip 1 connects+6V power supply, the second pin 12 ground connection, and the 3rd pin 13 is connected with the 5th pin 21 of AD conversion chip 2, for AD conversion chip 2 provides precision voltage reference.
AD conversion chip 2 adopts Ya Nuode company 16 analog to digital converter AD7988, and its 5th pin 21 receives the precision voltage reference that AD conversion chip 2 provides, and the 5th pin 21 is connecting analog ground after 10 μ F polar capacitor 4 decouplings.
Its 6th pin 22 connects+2.5V DC power supply, for AD conversion chip 2 is powered.
Its 7th pin 23 is analog input pin, receives analog input signal.
Its 13 pin 29 is serial input pin, if the 13 pin 29 is low level during ten pin 26 rising edges, then selects chain pattern.Under this pattern, the 13 pin 29 inputs, and analog-digital conversion result is transferred on the 11 pin 27 in a daisy chain fashion; If the 13 pin 29 is high level during the tenth pin 26 rising edge, then select C/S mode.Under this pattern, the 11 pin the 27 or the 13 pin 29 all can make the 11 pin 27 serial output signal when low level.
In signal acquisition stage, AD conversion chip 2 gathers the analog signal of the 7th pin 23 and the input of the 8th pin 24.
When acquisition phase completes and the tenth pin 26 becomes high level, enter translate phase.Translate phase produces output code more afterwards by the comparator of AD conversion chip 2 inside.If now select chain pattern, then export digital signal to host computer 7 through the 11 pin 27; If now select C/S mode, then jointly export digital signal to host computer 7 through the 11 pin the 27 and the 13 pin 29.
In sum, a kind of micrometric displacement test macro A/D convertor circuit of the present utility model, can improve the certainty of measurement of micrometric displacement, reduces power consumption, noise decrease, reduces output voltage sluggishness and the drift of long-term output voltage.
Those of ordinary skill in the art will be appreciated that, above embodiment is only used to the utility model is described, and be not used as restriction of the present utility model, as long as in spirit of the present utility model, all will drop in Claims scope of the present utility model the change of the above embodiment, modification.
Claims (3)
1. a micrometric displacement test macro A/D convertor circuit, comprises the first electric capacity, reference voltage source chip, polar capacitor, the second electric capacity, the 3rd electric capacity, AD conversion chip, it is characterized in that:
Described reference voltage source chip comprises four pins, first pin, the second pin, the 3rd pin and the 4th pin, the two ends correspondence of wherein said first electric capacity is connected with described first pin and described second pin, described 3rd pin is connected with the positive pole of described polar capacitor, the negative pole of described polar capacitor be connected in analog;
Described AD conversion chip comprises ten pins, 5th pin, 6th pin, 7th pin, 8th pin, 9th pin, tenth pin, 11 pin, 12 pin, 13 pin and the 14 pin, wherein said 5th pin is connected with the positive pole of described polar capacitor, described 8th pin be connected in analog, the two ends correspondence of described second electric capacity connects described 6th pin and described 8th pin, the two ends correspondence of described 3rd electric capacity connects described 8th pin and described 14 pin, described tenth pin, described 11 pin, described 12 pin is connected with host computer with described 13 pin, be connected described 9th pin and power supply.
2. a kind of micrometric displacement test macro A/D convertor circuit according to claim 1, is characterized in that: described reference voltage source chip is the ADR4550 chip of Ya Nuode company.
3. a kind of micrometric displacement test macro A/D convertor circuit according to claim 1, is characterized in that: described AD conversion chip is the AD7988 chip of Ya Nuode company.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520292862.6U CN204761416U (en) | 2015-05-08 | 2015-05-08 | AD converting circuit for test system is moved to microbit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520292862.6U CN204761416U (en) | 2015-05-08 | 2015-05-08 | AD converting circuit for test system is moved to microbit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN204761416U true CN204761416U (en) | 2015-11-11 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201520292862.6U Expired - Fee Related CN204761416U (en) | 2015-05-08 | 2015-05-08 | AD converting circuit for test system is moved to microbit |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN204761416U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105487437A (en) * | 2015-11-25 | 2016-04-13 | 上海工程技术大学 | Master control system for micro displacement test data acquisition system |
| CN105486212A (en) * | 2015-11-25 | 2016-04-13 | 上海工程技术大学 | Micro displacement test system |
-
2015
- 2015-05-08 CN CN201520292862.6U patent/CN204761416U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105487437A (en) * | 2015-11-25 | 2016-04-13 | 上海工程技术大学 | Master control system for micro displacement test data acquisition system |
| CN105486212A (en) * | 2015-11-25 | 2016-04-13 | 上海工程技术大学 | Micro displacement test system |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20151111 Termination date: 20190508 |
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| CF01 | Termination of patent right due to non-payment of annual fee |