CN204347134U - Testing impedance servicing unit and system - Google Patents
Testing impedance servicing unit and system Download PDFInfo
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- CN204347134U CN204347134U CN201420838990.1U CN201420838990U CN204347134U CN 204347134 U CN204347134 U CN 204347134U CN 201420838990 U CN201420838990 U CN 201420838990U CN 204347134 U CN204347134 U CN 204347134U
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Abstract
The utility model relates to a kind of testing impedance servicing unit and system.Above-mentioned testing impedance servicing unit comprises base station, rotary switch, test probe, test bench and signal output part; Rotary switch and test probe are installed on base station, and test probe is used for being electrically connected with the test point of impedance test module; The quantity of rotary switch and test probe is multiple, and multiple moved end of rotary switch is electrically connected with at least one test probe; Test bench is arranged on base station, and test bench is for placing impedance test module; Signal output part is arranged on base station, and signal output part is electrically connected with the not moved end of at least one rotary switch; Signal output part for inserting the probe of impedometer, to realize the electrical connection of impedance test module and impedometer.Accuracy and the testing efficiency of test can be improved by testing impedance servicing unit, extend the life-span of probe and line, reduce testing cost.
Description
Technical field
The utility model relates to the technical field of wiring board testing impedance, particularly relates to a kind of testing impedance servicing unit and system.
Background technology
In the anti-measuring process of circuit plate resistance, impedometer usually adopt hand-held probe in a manual fashion in impedance test module collection signal measure, this kind of test mode, often because of manual uncertainty, the phenomenon causing probe and contact point loose contact to cause the inaccurate or resistance value of impedance value measurement to judge by accident.It is low that the mode of manual test not only measures efficiency, also easily can cause the damage of probe and line because repeating frequent mobile test, probe and line price higher, cause measuring cost increase.
Utility model content
Based on this, be necessary for manual test mode measure inaccurate, efficiency is low, probe and line hold flimsy problem, a kind of testing impedance servicing unit and system are provided.
A kind of testing impedance servicing unit, for auxiliary impedometer Impedance measurement test module, described testing impedance servicing unit comprises base station, rotary switch, test probe, test bench and signal output part;
Described rotary switch and described test probe are installed on described base station, and described test probe is used for being electrically connected with the test point of described impedance test module; The quantity of described rotary switch and described test probe is multiple, and described rotary switch comprises multiple moved end and one not moved end, and multiple moved end of described rotary switch is electrically connected with test probe described at least one;
Described test bench is arranged on described base station, and described test bench is for placing described impedance test module;
Described signal output part is arranged on described base station, and described signal output part is electrically connected with the not moved end of rotary switch described at least one; Described signal output part for inserting the probe of described impedometer, to realize the electrical connection of described impedance test module and described impedometer.
Wherein in an embodiment, described test bench comprises plurality of plates, and described plurality of plates is all arranged on the upper surface of described base station, and described plurality of plates surrounds rectangular-shaped space; Described test probe is positioned at described space, and the top in described space is for placing described impedance test module.
Wherein in an embodiment, described test bench also comprises cushion block, and described cushion block is fixedly connected with over the plates, and described cushion block is used for bearing described impedance test module; The end face of described cushion block has gradient.
Wherein in an embodiment, the edge of the close described impedance test module of at least one block of described plate, offers the breach being convenient to take out described impedance test module.
Wherein in an embodiment, also comprise Anchor plate kit, described Anchor plate kit is positioned at the top of described test bench, and described Anchor plate kit is for compressing described impedance test module.
Wherein in an embodiment, described Anchor plate kit comprises bracing frame, pressing plate and connecting rod;
Support frame as described above is fixedly connected with described test bench or described base station;
Described pressing plate is positioned at the top of described test bench, and described pressing plate is for compressing described impedance test module;
Described connecting rod is through support frame as described above, and one end of described connecting rod is connected with described pressing plate, and the other end of described connecting rod is positioned at the top of support frame as described above.
Wherein in an embodiment, described Anchor plate kit also comprises return springs and reset button;
Described return springs is set on the described connecting rod of the top being positioned at support frame as described above;
Described reset button is arranged on support frame as described above, and described reset button is positioned at the junction of support frame as described above and described connecting rod, resets for controlling described connecting rod.
Wherein in an embodiment, described pressing plate is provided with cushion for the one side contacting described impedance test module.
A kind of testing impedance backup system, for auxiliary impedometer, comprises impedance test module and described testing impedance servicing unit;
Described impedance test module comprises substrate, and arranges test point on the substrate and impedance line; Described test point is used for being electrically connected with described test probe, and the quantity of described test point is multiple, and test point described at least one is electrically connected with described impedance line; Described test point place offers the via running through described substrate.
Wherein in an embodiment, multiple described test point is divided into two groups, and wherein the described test point of a group is the first test point, and the described test point of another group is the second test point;
Multiple described test probe is divided into two groups, and wherein the described test probe of a group is the first test probe, and the described test probe of another group is the second test probe; Described first test probe is corresponding with described first test point to be electrically connected, and described second test probe is corresponding with described second test point to be electrically connected;
Described signal output part comprises the first output terminal and the second output terminal;
Described rotary switch comprises the first switch, second switch and the 3rd switch; Multiple moved ends of described first switch are electrically connected with multiple described first test probe respectively, and the not moved end of described first switch is electrically connected with described first output terminal or described second output terminal; Multiple moved ends of described second switch are electrically connected with multiple described first test probe respectively, and the not moved end of described second switch is electrically connected with described first output terminal; Multiple moved ends of described 3rd switch are electrically connected with multiple described second test probe respectively, and the not moved end of described 3rd switch is electrically connected with described second output terminal.
Above-mentioned testing impedance servicing unit and system, during test, impedance test module to be measured is placed on the test bench of testing impedance servicing unit, test probe is electrically connected with test point, again by the conducting of rotary switch control circuit, the test of the resistance of each test point to impedance test module can be realized.Can specification impedance measurement action by testing impedance servicing unit, the problem avoiding probe and contact point loose contact to cause the inaccurate or resistance value of impedance value measurement judging by accident, improves the accuracy of test.Controlled by rotary switch, shorten the time of measurement impedance, improve testing efficiency.During measurement, the probe of impedometer inserts signal output part, avoiding the damage easily causing probe and line because repeating frequent mobile test, extending the life-span of probe and line, reducing testing cost.
Accompanying drawing explanation
Fig. 1 is the schematic diagram of an embodiment testing impedance backup system;
Fig. 2 is the schematic diagram of the testing impedance servicing unit of the backup system of testing impedance shown in Fig. 1;
Fig. 3 is the schematic diagram of the impedance test module of the backup system of testing impedance shown in Fig. 1;
Fig. 4 is another schematic diagram of the impedance test module of the backup system of testing impedance shown in Fig. 1;
Fig. 5 is the circuit diagram of the backup system of testing impedance shown in Fig. 1.
Embodiment
For the ease of understanding the utility model, below with reference to relevant drawings, testing impedance servicing unit and system are described more fully.The first-selected embodiment of testing impedance servicing unit and system is given in accompanying drawing.But testing impedance servicing unit and system can realize in many different forms, are not limited to embodiment described herein.On the contrary, provide the object of these embodiments be make the disclosure of testing impedance servicing unit and system more comprehensively thorough.
Unless otherwise defined, all technology used herein and scientific terminology are identical with belonging to the implication that those skilled in the art of the present utility model understand usually.The object of the term used in the instructions of testing impedance servicing unit and system herein just in order to describe specific embodiment, is not intended to be restriction the utility model.
As shown in Figure 1, the testing impedance backup system 10 of an embodiment comprises testing impedance servicing unit 100 and impedance test module 300.Impedance test module 300 can be the wiring board that one piece of length and width size is fixed, and the thickness of impedance test module 300 changes with product, and impedance test module 300 is standard modules of all kinds of impedance reflection in analog line plate.Testing impedance backup system 10, for auxiliary impedometer, is tested impedance test module 300.
Simultaneously see Fig. 2, testing impedance servicing unit 100 comprises base station 110, rotary switch 120, test probe 130, test bench 140 and signal output part 150.Base station 110, for supporting other elements of testing impedance servicing unit 100, can adopt acrylic material to make.Rotary switch 120 and test probe 130 are installed on base station 110, test probe 130 for being electrically connected with the test point 320 of impedance test module 300, to transmit electric signal.The quantity of rotary switch 120 and test probe 130 is multiple, and rotary switch 120 comprises multiple moved end and one not moved end, and multiple moved end of rotary switch 120 is electrically connected with at least one test probe 130.
Test bench 140 is arranged on base station 110, and test bench 140 is for placing impedance test module 300, and test bench 140 can adopt acrylic material to make.Signal output part 150 is arranged on base station 110, and signal output part 150 is electrically connected with the not moved end of at least one rotary switch 120.Signal output part 150 for inserting the probe of impedometer, to realize the electrical connection of impedance test module 300 and impedometer.
Simultaneously see Fig. 3, Fig. 4, impedance test module 300 comprises substrate 310, and the test point 320 be arranged on substrate 310 and impedance line 330.Test point 320 is for being electrically connected with test probe 130, and the quantity of test point 320 is multiple, and at least one test point 320 is electrically connected with impedance line 330.Test point 320 place offers the via 340 running through substrate 310, and via 340 is for layer each inside and outside connection line plate.Impedance line 330 is the alternative line of actual track in analog line plate.In one embodiment, impedance test module 300 can also comprise auxiliary copper sheet 350, and auxiliary copper sheet 350 can play balanced electroplating current, uniform impedance line 330 coating when impedance test module 300 makes.
During test, impedance test module 300 to be measured is placed on the test bench 140 of testing impedance servicing unit 100, test probe 130 is electrically connected with test point 320, again by the conducting of rotary switch 120 control circuit, the test of the resistance of each test point 320 to impedance test module 300 can be realized.Can specification impedance measurement action by testing impedance servicing unit 100, the problem avoiding probe and contact point loose contact to cause the inaccurate or resistance value of impedance value measurement judging by accident, improves the accuracy of test.Controlled by rotary switch 120, shorten the time of measurement impedance, improve testing efficiency.During measurement, the probe of impedometer inserts signal output part 150, avoiding the damage easily causing probe and line because repeating frequent mobile test, extending the life-span of probe and line, reducing testing cost.
Simultaneously see Fig. 2, Fig. 5, wherein in an embodiment, multiple test point 320 is divided into two groups, and wherein the test point 320 of a group is the first test point 322, and the test point 320 of another group is the second test point 324.Multiple test probe 130 is divided into two groups, and wherein the test probe 130 of a group is the first test probe 132, and the test probe 130 of another group is the second test probe 134.First test probe 132 is corresponding with the first test point 322 to be electrically connected, and the second test probe 134 is corresponding with the second test point 324 to be electrically connected.
Signal output part 150 comprises the first output terminal 152 and the second output terminal 154.Rotary switch 120 comprises the first switch 122, second switch 124 and the 3rd switch 126.Multiple moved ends of the first switch 122 are electrically connected with multiple first test probe 132 respectively, and the not moved end of the first switch 122 is electrically connected with the first output terminal 152 or the second output terminal 154.Multiple moved ends of second switch 124 are electrically connected with multiple first test probe 132 respectively, and the not moved end of second switch 124 is electrically connected with the first output terminal 152.Multiple moved ends of the 3rd switch 126 are electrically connected with multiple second test probe 134 respectively, and the not moved end of the 3rd switch 126 is electrically connected with the second output terminal 154.
First test point 322 can be the contact surveyed for testing differential impedance.Second test point 324 can be ground measuring pilot 320, for the contact of test characteristic impedance.The first test point 322 1 place need be chosen when characteristic impedance is measured, then select the second test point 324 1 prescription to measure.Two places in the first test point 322 are chosen, without the need to choosing the second test point 324 when differential impedance is measured.
Wherein in an embodiment, test bench 140 can comprise plurality of plates 142, and plurality of plates 142 is all arranged on the upper surface of base station 110, and plurality of plates 142 surrounds rectangular-shaped space.Test probe 130 is positioned at space, and the top in space is for placing impedance test module 300.In one embodiment, test bench 140 can also comprise cushion block 144, and cushion block 144 is fixedly connected on plate 142, and cushion block 144 is for bearing impedance test module 300.The end face of cushion block 144 has gradient, is convenient to load impedance test module 300.Further, in one embodiment, the edge of the close impedance test module 300 of at least one block of plate 142, offer the breach 146 being convenient to take out impedance test module 300, this breach 146 can be semicircular.
Wherein in an embodiment, testing impedance servicing unit 100 also comprises Anchor plate kit 160, and Anchor plate kit 160 is positioned at the top of test bench 140, and Anchor plate kit 160 is for compressing impedance test module 300.Anchor plate kit 160 presses impedance test module 300 when testing, and test probe 130 is contacted with test point 320 well, ensures the accuracy of test further.
In one embodiment, Anchor plate kit 160 comprises bracing frame 162, pressing plate 164 and connecting rod 166, and bracing frame 162 is fixedly connected with test bench 140 or base station 110, and bracing frame 162 and pressing plate 164 all can adopt acrylic material to make.Pressing plate 164 is positioned at the top of test bench 140, and pressing plate 164 is for compressing impedance test module 300.Connecting rod 166 is through bracing frame 162, and one end of connecting rod 166 is connected with pressing plate 164, and the other end of connecting rod 166 is positioned at the top of bracing frame 162.The mechanism of fixing lock-bit is set between connecting rod 166 and bracing frame 162.
Preferably, pressing plate 164 can be provided with cushion (not shown) for the one side of contact impedance test module 300.Cushion can be thin adhesive layer or multiple thin blob of viscose, for bumper and absorbing shock, compresses impedance test module 300 when pressing plate 164 is for measuring, and when ensureing to measure, contact is good.
Wherein in an embodiment, Anchor plate kit 160 also comprises return springs 168 and reset button 169, and return springs 168 is set on the connecting rod 166 of the top being positioned at bracing frame 162.Reset button 169 is arranged on bracing frame 162, and reset button 169 is positioned at the junction of bracing frame 162 and connecting rod 166, resets for control link 166.In one embodiment, the top of connecting rod 166 can be roundlet plate-like, is convenient to hand lower platen 164.Return springs 168 can be spring, and return springs 168, after measurement, can play pressing plate 164 reset response.
During test, after impedance module to be measured is put into servicing unit, can manual depression connecting rod 166, after fixing lock-bit, the tight impedance test module 300 of pressing plate 164, according to testing impedance requirement, determines and wants test point 320, select corresponding interface by rotary switch 120 again, the resistance of each test point 320 of measurement impedance test module 300 can be realized.After having tested, by reset button 169, under the drive of return springs 168, pressing plate 164 return.
Above embodiment only have expressed several embodiment of the present utility model, and it describes comparatively concrete and detailed, but therefore can not be interpreted as the restriction to the utility model the scope of the claims.It should be pointed out that for the person of ordinary skill of the art, without departing from the concept of the premise utility, can also make some distortion and improvement, these all belong to protection domain of the present utility model.Therefore, the protection domain of the utility model patent should be as the criterion with claims.
Claims (10)
1. a testing impedance servicing unit, for auxiliary impedometer Impedance measurement test module, it is characterized in that, described testing impedance servicing unit comprises base station, rotary switch, test probe, test bench and signal output part;
Described rotary switch and described test probe are installed on described base station, and described test probe is used for being electrically connected with the test point of described impedance test module; The quantity of described rotary switch and described test probe is multiple, and described rotary switch comprises multiple moved end and one not moved end, and multiple moved end of described rotary switch is electrically connected with test probe described at least one;
Described test bench is arranged on described base station, and described test bench is for placing described impedance test module;
Described signal output part is arranged on described base station, and described signal output part is electrically connected with the not moved end of rotary switch described at least one; Described signal output part for inserting the probe of described impedometer, to realize the electrical connection of described impedance test module and described impedometer.
2. testing impedance servicing unit according to claim 1, is characterized in that, described test bench comprises plurality of plates, and described plurality of plates is all arranged on the upper surface of described base station, and described plurality of plates surrounds rectangular-shaped space; Described test probe is positioned at described space, and the top in described space is for placing described impedance test module.
3. testing impedance servicing unit according to claim 2, is characterized in that, described test bench also comprises cushion block, and described cushion block is fixedly connected with over the plates, and described cushion block is used for bearing described impedance test module; The end face of described cushion block has gradient.
4. testing impedance servicing unit according to claim 2, is characterized in that, the edge of the close described impedance test module of at least one block of described plate, offers the breach being convenient to take out described impedance test module.
5. testing impedance servicing unit according to claim 2, is characterized in that, also comprise Anchor plate kit, and described Anchor plate kit is positioned at the top of described test bench, and described Anchor plate kit is for compressing described impedance test module.
6. testing impedance servicing unit according to claim 5, is characterized in that, described Anchor plate kit comprises bracing frame, pressing plate and connecting rod;
Support frame as described above is fixedly connected with described test bench or described base station;
Described pressing plate is positioned at the top of described test bench, and described pressing plate is for compressing described impedance test module;
Described connecting rod is through support frame as described above, and one end of described connecting rod is connected with described pressing plate, and the other end of described connecting rod is positioned at the top of support frame as described above.
7. testing impedance servicing unit according to claim 6, is characterized in that, described Anchor plate kit also comprises return springs and reset button;
Described return springs is set on the described connecting rod of the top being positioned at support frame as described above;
Described reset button is arranged on support frame as described above, and described reset button is positioned at the junction of support frame as described above and described connecting rod, resets for controlling described connecting rod.
8. testing impedance servicing unit according to claim 6, is characterized in that, described pressing plate is provided with cushion for the one side contacting described impedance test module.
9. a testing impedance backup system, for auxiliary impedometer, is characterized in that, comprises impedance test module and the testing impedance servicing unit described in any one of claim 1 to 8;
Described impedance test module comprises substrate, and arranges test point on the substrate and impedance line; Described test point is used for being electrically connected with described test probe, and the quantity of described test point is multiple, and test point described at least one is electrically connected with described impedance line; Described test point place offers the via running through described substrate.
10. testing impedance backup system according to claim 9, is characterized in that, multiple described test point is divided into two groups, and wherein the described test point of a group is the first test point, and the described test point of another group is the second test point;
Multiple described test probe is divided into two groups, and wherein the described test probe of a group is the first test probe, and the described test probe of another group is the second test probe; Described first test probe is corresponding with described first test point to be electrically connected, and described second test probe is corresponding with described second test point to be electrically connected;
Described signal output part comprises the first output terminal and the second output terminal;
Described rotary switch comprises the first switch, second switch and the 3rd switch; Multiple moved ends of described first switch are electrically connected with multiple described first test probe respectively, and the not moved end of described first switch is electrically connected with described first output terminal or described second output terminal; Multiple moved ends of described second switch are electrically connected with multiple described first test probe respectively, and the not moved end of described second switch is electrically connected with described first output terminal; Multiple moved ends of described 3rd switch are electrically connected with multiple described second test probe respectively, and the not moved end of described 3rd switch is electrically connected with described second output terminal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420838990.1U CN204347134U (en) | 2014-12-22 | 2014-12-22 | Testing impedance servicing unit and system |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420838990.1U CN204347134U (en) | 2014-12-22 | 2014-12-22 | Testing impedance servicing unit and system |
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| CN204347134U true CN204347134U (en) | 2015-05-20 |
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| CN201420838990.1U Expired - Fee Related CN204347134U (en) | 2014-12-22 | 2014-12-22 | Testing impedance servicing unit and system |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107782968A (en) * | 2016-08-24 | 2018-03-09 | 神讯电脑(昆山)有限公司 | Impedance test device |
| CN109633277A (en) * | 2018-12-28 | 2019-04-16 | 大族激光科技产业集团股份有限公司 | A kind of resistance testing device and system |
| CN113866678A (en) * | 2020-06-30 | 2021-12-31 | 北京小米移动软件有限公司 | Detection jig, detection method, terminal and storage medium |
-
2014
- 2014-12-22 CN CN201420838990.1U patent/CN204347134U/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107782968A (en) * | 2016-08-24 | 2018-03-09 | 神讯电脑(昆山)有限公司 | Impedance test device |
| CN109633277A (en) * | 2018-12-28 | 2019-04-16 | 大族激光科技产业集团股份有限公司 | A kind of resistance testing device and system |
| CN109633277B (en) * | 2018-12-28 | 2022-02-11 | 大族激光科技产业集团股份有限公司 | Resistance testing device and system |
| CN113866678A (en) * | 2020-06-30 | 2021-12-31 | 北京小米移动软件有限公司 | Detection jig, detection method, terminal and storage medium |
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Legal Events
| Date | Code | Title | Description |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20150520 Termination date: 20191222 |
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| CF01 | Termination of patent right due to non-payment of annual fee |