CN113424262A - 一种存储校验方法及装置 - Google Patents
一种存储校验方法及装置 Download PDFInfo
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- CN113424262A CN113424262A CN201980091806.7A CN201980091806A CN113424262A CN 113424262 A CN113424262 A CN 113424262A CN 201980091806 A CN201980091806 A CN 201980091806A CN 113424262 A CN113424262 A CN 113424262A
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- 238000000034 method Methods 0.000 title claims abstract description 66
- 238000012795 verification Methods 0.000 title claims description 45
- 238000012937 correction Methods 0.000 claims abstract description 15
- 238000005192 partition Methods 0.000 claims description 53
- 238000012545 processing Methods 0.000 claims description 17
- 238000011084 recovery Methods 0.000 claims description 13
- 239000012634 fragment Substances 0.000 claims description 10
- 238000010586 diagram Methods 0.000 description 15
- 238000013461 design Methods 0.000 description 11
- 238000004590 computer program Methods 0.000 description 9
- 230000006870 function Effects 0.000 description 9
- 230000003321 amplification Effects 0.000 description 5
- 238000003199 nucleic acid amplification method Methods 0.000 description 5
- 238000013500 data storage Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 238000013467 fragmentation Methods 0.000 description 3
- 238000006062 fragmentation reaction Methods 0.000 description 3
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/38—Response verification devices
- G11C29/42—Response verification devices using error correcting codes [ECC] or parity check
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- Techniques For Improving Reliability Of Storages (AREA)
Abstract
一种存储校验方法及装置,用于存储和校验粒度比较小的用户数据。该方法包括:对用户数据进行错误检查和纠正ECC校验,获得ECC校验数据,用户数据包括m个分片数据,m为大于2的整数;对用户数据和ECC校验数据,进行独立磁盘冗余阵列RAID校验或纠删码EC校验,获得奇偶校验数据;将m个分片数据、ECC校验数据和奇偶校验数据存储到多个芯片上;其中,该多个芯片中的m个芯片中的每个芯片承载一个分片数据,不同芯片承载的分片数据不同,所述多个芯片中除所述m个芯片之外的n个第一芯片承载所述ECC校验数据,所述多个芯片中除所述m个芯片之外的p个第二芯片用于承载所述奇偶校验数据。
Description
PCT国内申请,说明书已公开。
Claims (14)
- PCT国内申请,权利要求书已公开。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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PCT/CN2019/079118 WO2020186524A1 (zh) | 2019-03-21 | 2019-03-21 | 一种存储校验方法及装置 |
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Publication Number | Publication Date |
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CN113424262A true CN113424262A (zh) | 2021-09-21 |
CN113424262B CN113424262B (zh) | 2024-01-02 |
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CN (1) | CN113424262B (zh) |
WO (1) | WO2020186524A1 (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114296992A (zh) * | 2021-12-30 | 2022-04-08 | 长江存储科技有限责任公司 | 存储器的数据校验方法、装置、计算机设备和存储介质 |
CN116662063A (zh) * | 2023-05-10 | 2023-08-29 | 珠海妙存科技有限公司 | 一种闪存的纠错配置方法、纠错方法、系统、设备及介质 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1801103A (zh) * | 2004-11-19 | 2006-07-12 | 国际商业机器公司 | 利用磁盘阵列奇偶校验的增强错误标识系统和方法 |
CN103902403A (zh) * | 2012-12-27 | 2014-07-02 | Lsi公司 | 经由冗余阵列的非易失性存储器编程故障恢复 |
CN107943609A (zh) * | 2016-10-12 | 2018-04-20 | 三星电子株式会社 | 存储器模块、存储器控制器和系统及其相应操作方法 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2856471A4 (en) * | 2012-05-31 | 2015-11-18 | Hewlett Packard Development Co | LOCAL ERROR DETECTION AND GLOBAL ERROR CORRECTION |
US9026757B2 (en) * | 2013-01-25 | 2015-05-05 | Sandisk Technologies Inc. | Non-volatile memory programming data preservation |
US9830093B2 (en) * | 2015-03-27 | 2017-11-28 | Intel Corporation | Method and apparatus for improving immunity to defects in a non-volatile memory |
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2019
- 2019-03-21 CN CN201980091806.7A patent/CN113424262B/zh active Active
- 2019-03-21 WO PCT/CN2019/079118 patent/WO2020186524A1/zh active Application Filing
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1801103A (zh) * | 2004-11-19 | 2006-07-12 | 国际商业机器公司 | 利用磁盘阵列奇偶校验的增强错误标识系统和方法 |
CN103902403A (zh) * | 2012-12-27 | 2014-07-02 | Lsi公司 | 经由冗余阵列的非易失性存储器编程故障恢复 |
CN107943609A (zh) * | 2016-10-12 | 2018-04-20 | 三星电子株式会社 | 存储器模块、存储器控制器和系统及其相应操作方法 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114296992A (zh) * | 2021-12-30 | 2022-04-08 | 长江存储科技有限责任公司 | 存储器的数据校验方法、装置、计算机设备和存储介质 |
CN116662063A (zh) * | 2023-05-10 | 2023-08-29 | 珠海妙存科技有限公司 | 一种闪存的纠错配置方法、纠错方法、系统、设备及介质 |
CN116662063B (zh) * | 2023-05-10 | 2024-02-23 | 珠海妙存科技有限公司 | 一种闪存的纠错配置方法、纠错方法、系统、设备及介质 |
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CN113424262B (zh) | 2024-01-02 |
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