CN113340230A - Lifting type multi-view three-dimensional profile measurement system and working method - Google Patents
Lifting type multi-view three-dimensional profile measurement system and working method Download PDFInfo
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- CN113340230A CN113340230A CN202110456000.2A CN202110456000A CN113340230A CN 113340230 A CN113340230 A CN 113340230A CN 202110456000 A CN202110456000 A CN 202110456000A CN 113340230 A CN113340230 A CN 113340230A
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- 238000000034 method Methods 0.000 title claims abstract description 15
- 238000005259 measurement Methods 0.000 title claims description 67
- 238000012805 post-processing Methods 0.000 claims abstract description 6
- 238000004458 analytical method Methods 0.000 claims abstract description 5
- 238000012545 processing Methods 0.000 claims description 19
- 239000000523 sample Substances 0.000 claims description 12
- 238000013519 translation Methods 0.000 claims description 11
- 230000007246 mechanism Effects 0.000 claims description 9
- 238000001514 detection method Methods 0.000 claims description 6
- 238000013500 data storage Methods 0.000 claims description 3
- 238000011156 evaluation Methods 0.000 claims description 3
- 230000009466 transformation Effects 0.000 claims description 3
- 239000011159 matrix material Substances 0.000 claims description 2
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- 238000010586 diagram Methods 0.000 description 9
- 238000004519 manufacturing process Methods 0.000 description 7
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/2433—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring outlines by shadow casting
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Abstract
The invention discloses a lifting multi-view three-dimensional profile measuring system and a working method thereof. The structured light measuring head measures three-dimensional profile data of the workpiece at different viewing angles. Each structured light measuring head consists of at least one camera and one projector, and the three-dimensional profile of the surface of the workpiece is obtained by projecting a structured light pattern on the workpiece, shooting the workpiece and carrying out post-processing analysis. By means of a rapid projection shooting technology and by combining with accurate calibration parameters, the surface of the workpiece can be measured at high speed and with higher precision.
Description
Technical Field
The invention belongs to the field of three-dimensional profile measurement, and particularly relates to a lifting type multi-view three-dimensional profile measurement system and a working method.
Background
With the development of manufacturing technologies, especially in aerospace and navigation, large-scale energy power equipment and other advanced manufacturing industries representing the most advanced production levels, products or key parts are continuously improved in terms of dimensions, modeling complexity, manufacturing accuracy and efficiency, surface fineness and the like, and a challenge is posed to the traditional dimension detection, which means that corresponding advanced measurement technologies must be matched with the products or key parts.
The optical three-dimensional measurement technology is used as an advanced non-contact and rapid measurement means, has wide research and application in the fields of reverse engineering, auxiliary medicine, virtual reality, cultural heritage protection and the like, integrates advanced technologies such as photoelectronic technology, precision machinery, automatic control, computer processing and the like, and represents one of the most advanced technical levels in the field and the development direction of future geometric measurement technology. In recent years, although some commercialized three-dimensional contour measuring devices appear, the time consumption is still long for workpieces with larger sizes, and the requirements of production and detection of enterprises are difficult to meet. The structured light three-dimensional measurement system has been widely researched and rapidly developed in recent years by virtue of the advantages of non-contact, full field, high speed, higher measurement precision and the like. However, the field still has a contradiction that high-speed measurement and high-precision measurement cannot be compatible, and particularly, high-speed and high-precision measurement of a large-size complex curved surface workpiece is one of the prominent and bottleneck problems existing in the field at present.
Therefore, it is necessary to research a method for realizing high-speed and high-precision full-profile measurement of various workpieces including large-sized workpieces by integrating the advantages of various measurement technologies.
Disclosure of Invention
The invention aims to overcome the defects and provides a lifting type multi-view three-dimensional profile measuring system and a working method.
In order to achieve the purpose, the lifting type multi-view three-dimensional profile measuring system comprises a structured light measuring system, a lifting system, a controller and a data processing and analyzing system, wherein the structured light measuring system and the lifting system are both connected with the controller, and the controller is connected with the data processing and analyzing system;
the structured light measuring system comprises a plurality of structured light measuring heads, all the structured light measuring heads form a ring, the lifting system is arranged in the middle of the ring and used for fixing the workpiece, and all the structured light measuring heads face the workpiece;
the controller is used for controlling the lifting of the lifting system and controlling all structured light measuring heads of the structured light measuring system;
the data processing and analyzing system is used for post-processing the data acquired by the structured light measuring system.
Structured light gauge head includes first camera, second camera and projecting apparatus, and the projecting apparatus setting is between first camera and second camera, and first camera, second camera and projecting apparatus orientation are the same.
The lifting system comprises a translation mechanism, a carrying platform is arranged on a telescopic rod of the translation mechanism, and a workpiece clamp is arranged on the carrying platform.
All structured light measuring heads of the structured light measuring system have the same height.
The data processing and analyzing system is used for three-dimensional data acquisition, coordinate system unification among all measured data, data storage and display, error analysis and evaluation and detection report output.
A working method of a lifting type multi-view three-dimensional profile measuring system comprises the following steps:
s1, calibrating the lifting system by using a standard substance, generating a rotation and translation transformation matrix of each structured light probe relative to a middle coordinate system, and unifying the measurement data under different fields of view to the same coordinate system;
s2, fixing the workpiece on the lifting system;
s3, the lifting system drives the workpiece to move up and down, and the structured light measurement system is used for collecting workpiece data of different height sections;
and S4, sending the data collected by the structured light measurement system to a data processing and analyzing system for post-processing.
In S3, during measurement, the different structured light probes divide the workpiece into different field ranges according to their respective measurement fields, and each structured light probe is responsible for measuring a corresponding portion of the workpiece covered by its respective height segment to obtain measurement data at different viewing angles.
Compared with the prior art, the structured light measuring system is based on the triangulation principle, the structured light measuring heads are distributed around the workpiece along different angles, the respective positions of each structured light measuring head relative to the whole measuring system are fixed and accurately known, the measuring system drives the workpiece to move up and down through the lifting system, and the relative displacement can be completed through the lifting of the measuring heads, so that the acquisition of the data of the workpieces with different heights is realized. The structured light measuring head measures three-dimensional profile data of the workpiece at different viewing angles. Each structured light measuring head consists of at least one camera and one projector, and the three-dimensional profile of the surface of the workpiece is obtained by projecting a structured light pattern on the workpiece, shooting the workpiece and carrying out post-processing analysis. By means of a rapid projection shooting technology and by combining with accurate calibration parameters, the surface of the workpiece can be measured at high speed and with higher precision.
Further, the structured light measurement system is not limited to six structured light probes, and may be composed of at least one or more structured light probes.
Further, the structured light measuring head is not limited to the above-described structure, and may be composed of at least one camera and one projector.
Furthermore, the measuring system can be arranged in an underground darkroom, so that the influence of ambient light on measurement is avoided, and the operation personnel can conveniently load and unload the workpiece when the workpiece rises to the ground.
Compared with the existing similar measuring method, the method of the invention unifies the coordinate systems of a plurality of measuring heads by using the standard substance, realizes the fusion of a plurality of groups of measuring data, obtains the full-profile data, and independently realizes the process. The high-precision measurement and high-efficiency cooperation of the full profile of the workpiece are ensured, the high-speed measurement of the complex curved surface is also ensured, especially for large-size complex curved surface workpieces, the measurement speed is greatly improved, the advantages of high speed, high precision, full profile measurement and the like are taken into consideration, powerful technical support can be provided for high-speed and high-precision measurement occasions such as industrial detection, product quality control and the like, and the detection and production efficiency of manufacturing enterprises is greatly improved. The invention gives consideration to the contradiction between high-precision data acquisition and high-efficiency measurement process, and is a brand-new measuring device and a measuring method which have universal applicability and can realize high-speed, high-precision and full-profile measurement of large-scale complex curved surface workpieces.
Drawings
FIG. 1 is a simplified schematic diagram of an exemplary embodiment of a measurement system of the present invention;
FIG. 2 is a simplified schematic diagram of a structured light probe in a measurement system according to the present invention;
FIG. 3 is a simplified schematic diagram of a coordinate system of each measuring head in the measuring system of the present invention unified by a standard;
FIG. 4 is a simplified schematic diagram of a clamping and lifting system of the measurement system of the present invention;
FIG. 5 is a simplified schematic diagram of a 360 degree measurement field division of a workpiece;
FIG. 6 is a simplified schematic diagram of structured light measurement system data acquisition at an initial elevation interval;
FIG. 7 is a simplified schematic diagram of a structured light measurement system data acquisition and coordinate system unification after a relative displacement x;
FIG. 8 is a simplified schematic diagram of the measurement system workpiece handling of the present invention; (a) when clamping the workpiece, (b) after disassembling the workpiece;
the measurement system includes a structured light measurement system 1, a first structured light measurement head 1a, a second structured light measurement head 1b, a third structured light measurement head 1c, a fourth structured light measurement head 1d, a fifth structured light measurement head 1e, a sixth structured light measurement head 1f, a lifting system 2, a controller 3, a data processing and analyzing system 4, a workpiece 5, a first camera 6a, a second camera 6b, a projector 7, a standard 8, a workpiece holder 9, a stage 10, and a translation mechanism 11.
Detailed Description
The invention is further described below with reference to the accompanying drawings.
As shown in fig. 1, the measuring system of the present invention includes a structured light measuring system 1, a lifting system 2, a controller 3, and a data processing and analyzing system 4.
The structured light measurement system 1 is used for realizing high-speed measurement of a complex curved surface of a workpiece 5. The structured light measurement system 1 is comprised of a first structured light gauge head 1a, a second structured light gauge head 1b, a third structured light gauge head 1c, a fourth structured light gauge head 1d, a fifth structured light gauge head 1e and a sixth structured light gauge head 1f, in this example 6 structured light gauge heads are used. Of course, other numbers of structured light probes may be used as well. All the structured light measuring heads form a ring, the lifting system 2 is arranged in the middle of the ring, the lifting system 2 is used for fixing the workpiece 5, and all the structured light measuring heads face the workpiece 5. The controller 3 is used for controlling the lifting of the lifting system 2 and for controlling all structured light measuring heads of the structured light measuring system 1.
As shown in fig. 2, each structured-light measuring head is composed of a first camera 6a, a second camera 6b, and a projector 7, the projector 7 being disposed between the first camera 6a and the second camera 6b, the first camera 6a, the second camera 6b, and the projector 7 being directed toward the same point. Fig. 2 is only an example including two cameras and one projector, and at least one or more than two cameras and at least one projector may be included, of course. The first to sixth structured light measuring heads 1a to 1f have the same structure. During measurement, a projector 7 in the structured light measuring head projects preset patterns to the workpiece 5, the camera is responsible for shooting, and the shot images are processed by the data processing and analyzing system 4 to obtain three-dimensional profile data of the workpiece. In addition, during measurement, all the structured light measuring heads work cooperatively under the control of the controller 3 to measure corresponding parts of the workpiece under different height, angle and other view fields. All the structured light measuring heads of the structured light measuring system 1 have the same height.
As shown in fig. 3, the first to sixth structured light probes 1a to 1f are fixed in position with respect to the workpiece 5, and transformation matrices such as rotation and translation of each structured light probe with respect to the middle coordinate system are generated using data provided from the standard 8 and the lifting system 2, and further, measurement data in different fields of view are unified into the same coordinate system based on these matrices.
As shown in fig. 4, the lifting system 2 includes a translation mechanism 11, a stage 10 is disposed on a telescopic rod of the translation mechanism 11, and a workpiece clamp 9 is disposed on the stage 10 and is responsible for driving a workpiece to move up and down so as to collect workpiece data of different height sections.
The controller 3 is responsible for system control of the whole measuring system, and is responsible for lifting movement of the lifting system 2, movement of the platform deck, control of the first structural optical measuring head 1a to the sixth structural optical measuring head 1f and the like in the structural optical measuring system 1 in the measuring process, and guarantee that all components of the system work cooperatively to smoothly complete a measuring task.
The data processing and analyzing system 4 generally uses a computing unit as a carrier, such as a computer, and has a core of a data processing and analyzing algorithm, including analysis and processing of images acquired by the structured light measuring system and three-dimensional profile reconstruction, coordinate unification and splicing of measured data of different fields of view, and workpiece processing quality evaluation and error evaluation according to the measured data. Meanwhile, the data processing and analyzing system 7 has other functions such as data storage, display, and report output.
The coordinate system between each measuring head is divided into a coordinate system of measuring data of different height sections and a coordinate system of measuring data in a multi-view visual field. Fig. 3 is a coordinate unification diagram of multi-view measurement data. During measurement, the first to sixth structured light measuring heads 1a to 1f divide the workpiece 5 into different view field ranges according to their respective measurement view fields, such as height sections a to height sections f in fig. 5, and each measuring head is responsible for measuring a corresponding portion of the workpiece 5 covered by its respective height section to obtain measurement data of different view angles. FIG. 6 shows data coordinates of the same viewing angle and different height viewing fields are unified. The height sections a and b are taken as examples for explanation, and the same operation is adopted among other height sections. If an initial height is selected, all subsequent displacement values are calculated with reference to that height, i.e. relative displacement. Or after selecting the initial height, it is zeroed to make the height 0. The structured light measurement system 1 measures the corresponding portion of the workpiece at an initial height. Further, the lifting system drives the workpiece to move upwards, the displacement value can be provided by the lifting mechanism, and the structured light measurement system 1 measures the corresponding part of the workpiece under the angular field again, as shown in fig. 7. According to the displacement data provided by the lifting mechanism, the coordinate conversion relation relative to the initial height can be converted, then the measurement data under the view field is subjected to translation coordinate conversion such as equal coordinate conversion, and the measurement data under the height can be spliced to the measurement data under the initial height. And repeating the operations of moving, measuring, and moving to the coordinate system of the initial height, so as to obtain the three-dimensional profile of the whole height of the workpiece and obtain the three-dimensional profile data of the whole profile of the workpiece.
As shown in fig. 8, when the lifting system drives the workpiece to rise to a certain height, the workpiece can be loaded and unloaded, the arrangement of the whole measuring device is not affected, and the measuring efficiency is high.
Claims (7)
1. A lifting type multi-view three-dimensional profile measurement system is characterized by comprising a structured light measurement system (1), a lifting system (2), a controller (3) and a data processing and analyzing system (4), wherein the structured light measurement system (1) and the lifting system (2) are both connected with the controller (3), and the controller (3) is connected with the data processing and analyzing system (4);
the structured light measuring system (1) comprises a plurality of structured light measuring heads, all the structured light measuring heads form a ring, the lifting system (2) is arranged in the middle of the ring, the lifting system (2) is used for fixing the workpiece (5), and all the structured light measuring heads face the workpiece (5);
the controller (3) is used for controlling the lifting of the lifting system (2) and controlling all structured light measuring heads of the structured light measuring system (1);
the data processing and analyzing system (4) is used for post-processing the data collected by the structured light measuring system (1).
2. An elevating multi-view three-dimensional profile measuring system according to claim 1, characterized in that the structured light measuring head comprises a first camera (6a), a second camera (6b) and a projector (7), the projector (7) is arranged between the first camera (6a) and the second camera (6b), and the first camera (6a), the second camera (6b) and the projector (7) face to the same point.
3. The lifting multi-view three-dimensional profile measuring system according to claim 1, wherein the lifting system (2) comprises a translation mechanism (11), a telescopic rod of the translation mechanism (11) is provided with a platform (10), and the platform (10) is provided with a workpiece clamp (9).
4. The lifting multi-view three-dimensional profile measuring system according to claim 1, wherein all the structured light measuring heads of the structured light measuring system (1) have the same height.
5. The lifting-type multi-view three-dimensional profile measuring system according to claim 1, wherein the data processing and analyzing system (4) is used for three-dimensional data acquisition, coordinate system unification between the measured data, data storage and display, error analysis and evaluation, and detection report output.
6. The method of operating an elevating multi-view three-dimensional profile measuring system of claim 1, comprising the steps of:
s1, calibrating the lifting system (2) by using the standard (8), generating a rotation and translation transformation matrix of each structured light probe relative to a middle coordinate system, and unifying the measurement data under different fields of view to the same coordinate system;
s2, fixing the workpiece (5) on the lifting system (2);
s3, the lifting system (2) drives the workpiece to move up and down, and the structured light measurement system (1) is used for collecting data of the workpiece (5) in different height sections;
and S4, sending the data collected by the structured light measurement system (1) to the data processing and analyzing system (4) for post-processing.
7. The working method of the lifting multi-view three-dimensional profile measuring system according to claim 1, wherein in step S3, different structured light probes divide the workpiece (5) into different view field ranges according to their respective measuring view fields, and each structured light probe is responsible for measuring the corresponding portion of the workpiece (5) covered by its respective height segment to obtain the measurement data of different view angles.
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2021
- 2021-04-26 CN CN202110456000.2A patent/CN113340230A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102288131A (en) * | 2011-05-12 | 2011-12-21 | 上海大学 | Adaptive stripe measurement device of 360-degree contour error of object and method thereof |
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| DE102015011914A1 (en) * | 2014-09-18 | 2016-03-24 | Fanuc Corporation | Contour line measuring device and robot system |
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Application publication date: 20210903 |