CN113176492B - POC circuit scattering parameter measurement method - Google Patents
POC circuit scattering parameter measurement method Download PDFInfo
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- CN113176492B CN113176492B CN202110260183.0A CN202110260183A CN113176492B CN 113176492 B CN113176492 B CN 113176492B CN 202110260183 A CN202110260183 A CN 202110260183A CN 113176492 B CN113176492 B CN 113176492B
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- 238000000691 measurement method Methods 0.000 title abstract description 10
- 238000000034 method Methods 0.000 claims description 12
- 238000005259 measurement Methods 0.000 claims description 9
- 239000003990 capacitor Substances 0.000 description 12
- 230000005540 biological transmission Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000006978 adaptation Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2825—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere in household appliances or professional audio/video equipment
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Abstract
The embodiment of the application provides a scattering parameter measurement method of a POC circuit, which comprises the following steps: grounding the direct current output end of the POC circuit through a load resistor R; connecting two coaxial ports of a network analyzer to a serializer interface and a deserializer interface of the POC circuit respectively; the direct current input end of the POC circuit is connected to a direct current power supply VCC, and the resistance value of the load resistor R is adapted to the output current value of the direct current power supply VCC; and measuring and obtaining the scattering parameter of the whole POC circuit by the network analyzer. In the embodiment, the direct current input end of the POC circuit is connected to the direct current power supply VCC, the direct current output end of the POC circuit is grounded through the load resistor R, two coaxial ports of the network analyzer are respectively connected to the serializer interface and the deserializer interface of the POC circuit, and the scattering parameter of the POC circuit can be accurately obtained by reading the network analyzer.
Description
Technical Field
The embodiment of the application relates to the technical field of POC circuits, in particular to a scattering parameter measurement method of a POC circuit.
Background
In a vehicle-mounted camera circuit, in order to ensure image quality and reduce delay and design cost, image data is generally transmitted between the vehicle-mounted camera and a controller by using a high-speed POC (Power-Over-Coaxial) technology, wherein the transmission of data and a Power supply is generally realized by using a POC transmission circuit.
A conventional POC circuit (as shown in fig. 1) includes: the dc input 1, the dc output 3, the first POC filter inductance L1, the second POC filter inductance L2, the first capacitor C1, the second capacitor C2, the third capacitor C3, the fourth capacitor C4, the fifth capacitor C5, the sixth capacitor C6, the coaxial line 5, the deserializer interface 7 and the serializer interface 8, wherein: the direct current input end 1 and the direct current output end 3 are respectively used for connecting the direct current power supply output end of the controller and the direct current power supply input end of the vehicle-mounted camera; the deserializer interface 7 and the serializer interface 8 are respectively used for connecting a deserializer of the controller and a serializer of the vehicle-mounted camera; opposite ends of the coaxial line 5 are respectively connected to the direct current input end 1 and the direct current output end 3 through a first POC filter inductor L1 and a second POC filter inductor L2, and opposite ends of the coaxial line 5 are also respectively connected to the deserializer interface 7 and the serializer interface 8 through a first capacitor C1 and a second capacitor C2; the circuit between the first POC filter inductor L1 and the direct current input end 1 is grounded through a third capacitor C3 and a fourth capacitor C4 respectively; the circuit between the second POC filter inductor L2 and the dc output terminal 3 is grounded through the fifth capacitor C5 and the sixth capacitor C6, respectively.
In general, a scattering parameter (Scatter parameter, S parameter for short) of a POC circuit is required to be measured to ensure that the scattering parameter meets a predetermined index, and a conventional scattering parameter measurement method is to firstly simulate scattering parameters of a first POC filter inductor L1 and a second POC filter inductor L2 by using circuit simulation software to obtain the scattering parameter of the POC filter inductor before the POC circuit is built, and in addition, two coaxial ports of a network analyzer are usually used to connect two ends of a coaxial line 5 to be connected to measure the scattering parameter of the coaxial line 5 before the coaxial line 5 is connected to the POC circuit. However, the above measurement methods can only measure the scattering parameters of part of circuit elements in the POC circuit, and the above measurement methods separately measure the scattering parameters of each circuit part, so that the scattering parameters of the whole circuit cannot be evaluated, and the accuracy is relatively poor.
Disclosure of Invention
The technical problem to be solved by the embodiment of the application is to provide a scattering parameter measuring method of a POC circuit, which can accurately measure the scattering parameter of the POC circuit.
In order to solve the technical problems, the embodiment of the application provides the following technical scheme: a scattering parameter measurement method of a POC circuit comprises the following steps:
grounding the direct current output end of the POC circuit through a load resistor R;
connecting two coaxial ports of a network analyzer to a serializer interface and a deserializer interface of the POC circuit respectively;
the direct current input end of the POC circuit is connected to a direct current power supply VCC, and the resistance value of the load resistor R is adapted to the output current value of the direct current power supply VCC; and
and measuring and obtaining the scattering parameter of the whole POC circuit by the network analyzer.
Further, the measuring, by the network analyzer, the scattering parameter of the whole POC circuit specifically includes:
the scattering parameters of the POC circuit when the whole POC circuit passes through different current values are obtained through measurement of the network analyzer; and measuring and obtaining scattering parameters of the POC circuit when the whole POC circuit is at different temperature values through the network analyzer.
Further, the temperature value of the environment where the POC circuit is located is kept unchanged, and the scattering parameters of the whole POC circuit passing through different current values are obtained through the measurement of the network analyzer by adjusting the output current value of the direct-current power supply VCC and the resistance value of the load resistor R.
Further, the dc power VCC is an adjustable dc power, and the load resistor R is an adjustable resistor.
Further, the output current value of the direct current power supply VCC and the resistance value of the load resistor R are kept unchanged, and the scattering parameters of the whole POC circuit at different temperature values are obtained by placing the POC circuit in a temperature control box and adjusting the temperature value of the temperature control box and then measuring by the network analyzer.
Further, the temperature value of the temperature control box is respectively adjusted to be the limit working temperature value of the POC circuit so as to obtain the scattering parameter when the whole POC circuit is at the limit working temperature value.
Further, the scattering parameter of the whole POC circuit is displayed through a display interface of the network analyzer and/or uploaded to an upper computer through a data interface of the network analyzer.
After the technical scheme is adopted, the embodiment of the application has at least the following beneficial effects: according to the embodiment of the application, the direct current output end of the POC circuit is grounded through the load resistor R, two coaxial ports of the network analyzer are respectively connected to the serializer interface and the deserializer interface of the POC circuit, then the direct current input end of the POC circuit is connected to the direct current power supply VCC, the power-on operation of the POC circuit is simulated, the resistance value of the load resistor R is adapted to the output current value of the direct current power supply VCC, the normal and stable operation of the POC circuit in the power-on state is ensured, and finally the scattering parameter of the POC circuit can be accurately measured through the network analyzer.
Drawings
Fig. 1 is a schematic circuit diagram of a POC circuit according to the prior art.
Fig. 2 is a schematic circuit diagram of an alternative embodiment of the scattering parameter measurement method of the POC circuit according to the present application when the POC circuit is measured.
FIG. 3 is a flowchart illustrating the steps of an alternative embodiment of a method for measuring scattering parameters of POC circuits according to the present application.
Detailed Description
The application will be described in further detail with reference to the drawings and the specific examples. It should be understood that the following exemplary embodiments and descriptions are only for the purpose of illustrating the application and are not to be construed as limiting the application, and that the embodiments and features of the embodiments of the application may be combined with one another without conflict.
As shown in fig. 2-3, an alternative embodiment of the present application provides a scattering parameter measurement method of a POC circuit, including the steps of:
s1: the direct current output end 3 of the POC circuit is grounded through a load resistor R;
s2: two coaxial ports of the network analyzer 9 are respectively connected to a serializer interface 8 and a deserializer interface 7 of the POC circuit;
s3: connecting a direct current input end 1 of a POC circuit to a direct current power supply VCC, wherein the resistance value of the load resistor R is adapted to the output current value of the direct current power supply VCC; and
s4: and measuring and obtaining the scattering parameter of the whole POC circuit by the network analyzer.
According to the embodiment of the application, the direct current output end 3 of the POC circuit is grounded through the load resistor R, two coaxial ports of the network analyzer 9 are respectively connected to the serializer interface 8 and the deserializer interface 7 of the POC circuit, then the direct current input end 1 of the POC circuit is connected to the direct current power supply VCC, the power-on operation of the POC circuit is simulated, the resistance value of the load resistor R is adapted to the output current value of the direct current power supply VCC, the normal and stable operation of the POC circuit in the power-on state is ensured, and finally the scattering parameter of the POC circuit can be accurately measured through the network analyzer 9. In specific implementation, it is understood that the adaptation of the resistance value of the load resistor R to the output current value of the dc power supply VCC refers to a resistance value and an output current value that support the normal and stable operation of the POC circuit, for example: and ohm's law is satisfied.
In an alternative embodiment of the present application, the measuring, by the network analyzer 9, the scattering parameter of the POC circuit as a whole specifically includes:
the scattering parameters of the POC circuit when the whole POC circuit passes through different current values are obtained through measurement of the network analyzer 9; and obtaining scattering parameters of the POC circuit when the whole POC circuit is at different temperature values through measurement of the network analyzer 9.
In this embodiment, scattering parameters of the POC circuit when the POC circuit passes through different current values and when the POC circuit is at different temperature values are obtained respectively, and in a normal use process of the POC circuit, the temperature and the current are the most common variable amounts, so that a principle of a controlled variable method can be adopted, and when one variable is kept constant and the other variable is changed, the scattering parameters under the two variables can be obtained respectively, so that effective data reference can be provided for actual evaluation of the scattering parameters of the POC circuit.
In yet another alternative embodiment of the present application, the temperature value of the environment where the POC circuit is located is kept unchanged, and the output current value of the dc power VCC and the resistance value of the load resistor R are adjusted, so that the scattering parameter of the POC circuit when the POC circuit as a whole passes through different current values is obtained correspondingly by measurement of the network analyzer 9. In this embodiment, by adjusting the output current value of the dc power VCC and the resistance value of the load resistor R, the current value of the POC circuit passing through different current values may be effectively changed, so that the scattering parameter of the integral POC circuit passing through different current values may be obtained very simply.
In yet another alternative embodiment of the present application, the dc power source VCC is an adjustable dc power source, and the load resistor R is an adjustable resistor. The direct current power supply VCC and the load resistor R correspondingly adopt the adjustable direct current power supply and the adjustable resistor, so that the output current of the direct current power supply VCC and the resistance value of the load resistor R can be simply and conveniently adjusted, a repeated connection circuit is not needed, and the operation is more convenient.
In another alternative embodiment of the present application, the output current value of the dc power VCC and the resistance value of the load resistor R are kept unchanged, and the POC circuit is placed in a temperature control box and the temperature value of the temperature control box is adjusted, and then the scattering parameters when the POC circuit is wholly at different temperature values are obtained by measuring through the network analyzer 9. In this embodiment, the whole POC circuit is placed in the temperature control box, and then different operating temperatures of the POC circuit are simulated by adjusting the temperature value of the temperature control box, so that scattering parameters of the POC circuit at different temperature values can be effectively measured.
In yet another alternative embodiment of the present application, the temperature values of the temperature control boxes are respectively adjusted to the limit operating temperature values of the POC circuit to obtain scattering parameters when the POC circuit as a whole is at the limit operating temperature values. In this embodiment, the temperature value of the temperature control box is set to be the limit operating temperature value of the POC circuit, for example: the upper limit working temperature and the lower limit working temperature of the POC circuit shown in fig. 1 are respectively +85 ℃ and-40 ℃, and the scattering parameters at the upper limit working temperature value and the lower limit working temperature value can be measured and obtained by setting the temperature value of the temperature control box to the temperature value.
In yet another alternative embodiment of the present application, the scattering parameter of the whole POC circuit is displayed through a display interface of the network analyzer 9 and/or uploaded to an upper computer through a data interface of the network analyzer 9. In this embodiment, the measured scattering parameters can be obtained very simply and conveniently by the display screen of the network analyzer 9 and/or uploading the scattering parameters through the data interface of the network analyzer 9, so that the measurement efficiency can be effectively improved. In the implementation, the upper computer may be a personal computer or a data processing apparatus.
The embodiments of the present application have been described above with reference to the accompanying drawings, but the present application is not limited to the above-described embodiments, which are merely illustrative and not restrictive, and many forms may be made by those having ordinary skill in the art without departing from the spirit of the present application and the scope of the claims, which are all within the scope of the present application.
Claims (7)
1. A method for measuring scattering parameters of a POC circuit, the method comprising the steps of:
grounding the direct current output end of the POC circuit through a load resistor R;
connecting two coaxial ports of a network analyzer to a serializer interface and a deserializer interface of the POC circuit respectively;
the direct current input end of the POC circuit is connected to a direct current power supply VCC, and the resistance value of the load resistor R is adapted to the output current value of the direct current power supply VCC; and
and measuring and obtaining the scattering parameter of the whole POC circuit by the network analyzer.
2. The method for measuring scattering parameters of POC circuitry as recited in claim 1, wherein said obtaining scattering parameters of the POC circuitry as a whole by said network analyzer measurement comprises:
the scattering parameters of the POC circuit when the whole POC circuit passes through different current values are obtained through measurement of the network analyzer; and
and measuring and obtaining scattering parameters of the POC circuit when the whole POC circuit is at different temperature values through the network analyzer.
3. The method for measuring scattering parameters of POC circuit according to claim 2, wherein the temperature value of the environment in which the POC circuit is located is kept unchanged, and the scattering parameters of the POC circuit when the POC circuit as a whole passes through different current values are obtained by adjusting the output current value of the dc power source VCC and the resistance value of the load resistor R in response to measurement by the network analyzer.
4. The method for measuring scattering parameters of POC circuit as recited in claim 3, wherein the dc power source VCC is an adjustable dc power source, and the load resistor R is an adjustable resistor.
5. The method for measuring scattering parameters of POC circuit according to claim 2, wherein the output current value of the dc power VCC and the resistance value of the load resistor R are kept unchanged, and the POC circuit is placed in a temperature control box and the temperature value of the temperature control box is adjusted, and the scattering parameters when the POC circuit is measured by the network analyzer and the POC circuit is at different temperature values are obtained.
6. The method of measuring scattering parameters of a POC circuit of claim 5, wherein the temperature value of the temperature control box is adjusted to a limit operating temperature value of the POC circuit, respectively, to obtain the scattering parameters when the POC circuit is entirely at the limit operating temperature value.
7. The method for measuring scattering parameters of a POC circuit according to claim 1, wherein the scattering parameters of the POC circuit are displayed through a display interface of the network analyzer and/or uploaded to an upper computer through a data interface of the network analyzer.
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| CN202110260183.0A CN113176492B (en) | 2021-03-10 | 2021-03-10 | POC circuit scattering parameter measurement method |
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| CN202110260183.0A CN113176492B (en) | 2021-03-10 | 2021-03-10 | POC circuit scattering parameter measurement method |
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| CN113176492B true CN113176492B (en) | 2023-12-12 |
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