CN112732507B - SPI signal testing method, device, control system and medium - Google Patents
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- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults
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- G06F13/38—Information transfer, e.g. on bus
- G06F13/42—Bus transfer protocol, e.g. handshake; Synchronisation
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Abstract
The invention discloses an SPI signal testing method, which deploys a testing environment to initialize an oscilloscope; setting a threshold, and setting the times of triggering the threshold and the times of sampling the threshold; executing the SPI signal time sequence test, triggering the peak value of the SPI edge signal through an oscilloscope, stopping triggering when the frequency of triggering the peak value of the SPI edge signal reaches the frequency of a triggering threshold value, counting the data distribution of the peak value, calculating the time sequence threshold value, and executing the SPI signal time sequence test through the time sequence threshold value; executing an SPI signal overshoot test, acquiring an SPI signal through an oscilloscope, and measuring the peak value of the edge voltage value of the acquired SPI signal, and recording as the voltage peak value of the SPI signal; stopping collecting when the frequency of collecting the SPI signal reaches the frequency of a sampling threshold value, calculating an overshoot threshold value, and executing an SPI signal overshoot test through the overshoot threshold value; the SPI signal testing device can improve the SPI signal testing efficiency, reduce the labor cost input and save the development cost.
Description
Technical Field
The invention relates to the field of hardware testing, in particular to a method, a device, a control system and a medium for testing an SPI signal.
Background
With the development of current network technology, there is a great leap in port rate. The current network ports have reached a rate of 100G (Gigabit), and the industry has proposed a 400G port product. The continuous increase of the port speed of network products brings the challenge that more stable and reliable hardware equipment is needed to ensure the working stability at high speed. Therefore, it is obvious to the hardware industry that the workload of hardware testing will be continuously increased, and the standard of hardware testing will be continuously severe. How to complete efficient testing in a short time under limited manpower in this situation will be a major concern for various hardware manufacturers.
In hardware testing, the SPI signal is a common critical signal, and the tests around it are very numerous. For a set of SPI signals, it is often necessary to intercept more than ten waveforms to complete a test. This requires the tester to manually set the oscilloscope, manually set the relevant trigger conditions, and distinguish the read and write waveforms of the SPI signals.
Disclosure of Invention
The invention mainly solves the problems that when the SPI signal is tested, a tester needs to manually set an oscilloscope, and read and write waveforms are distinguished by manpower to perform read-write separation, so that the testing efficiency is low and the manpower is wasted.
In order to solve the technical problems, the invention adopts a technical scheme that: the SPI signal testing method comprises the following steps:
deploying a test environment, and initializing the oscilloscope;
setting a threshold, and setting the times of triggering the threshold and the times of sampling the threshold;
executing the SPI signal time sequence test, triggering the peak value of the SPI edge signal through an oscilloscope, stopping triggering when the frequency of triggering the peak value of the SPI edge signal reaches the triggering threshold frequency, counting the data distribution of the peak value, calculating the time sequence threshold value, and executing the SPI signal time sequence test through the time sequence threshold value;
executing an SPI signal overshoot test, acquiring an SPI signal through an oscilloscope, and measuring the peak value of the edge voltage value of the acquired SPI signal, and recording as the voltage peak value of the SPI signal; and when the frequency of collecting the SPI signal reaches the frequency of a sampling threshold, stopping collecting, calculating an overshoot threshold through the voltage peak value of the SPI signal, and executing the overshoot test of the SPI signal through the overshoot threshold.
Preferably, the calculating the timing threshold includes the steps of:
sorting the peak values in a descending order;
extracting an interval where a first-ranked peak value is located and recording as a time sequence peak value interval, wherein the time sequence peak value interval is an interval where a read level signal appears;
and setting the time sequence peak interval as a time sequence threshold value.
Preferably, the step of performing the SPI signal timing test by the timing threshold further comprises: and inputting the time sequence threshold value into an oscilloscope, executing a time sequence test, acquiring a first waveform in the time sequence threshold value in the oscilloscope, and calculating the establishment time and the holding time of the first waveform.
Preferably, the step of calculating the setup time and the hold time of the first waveform comprises:
the first waveform comprises a first clock edge, data and a second clock edge;
calculating the distance between the data and the edge of the first clock, and recording as a first distance;
calculating the distance between the data and the second clock edge and recording as a second distance;
the first distance is a hold time of the first waveform; the second distance is a setup time of the first waveform.
Preferably, the step of calculating the overshoot threshold value through the voltage peak value of the SPI signal comprises the steps of:
acquiring voltage peak values of the collected SPI signals, and sequencing the voltage peak values of the SPI signals in a descending order;
obtaining SPI signal voltage peak values of first rank and the first last rank, and respectively recording the SPI signal voltage peak values as a first voltage peak value and a second voltage peak value;
and calculating an overshoot threshold value according to the first voltage peak value and the second voltage peak value.
Preferably, the step of calculating the overshoot threshold value based on the first voltage peak value and the second voltage peak value further includes:
calculating the difference value of the first voltage peak value and the second voltage peak value;
equally dividing the first voltage peak value and the second voltage peak value into a plurality of peak value intervals according to the difference value;
counting the number of the collected voltage peaks of the SPI signals falling into the peak value interval, sequencing in a descending order, obtaining a first sequencing peak value interval and a second sequencing peak value interval, and comparing the values;
the peak interval having a large value is regarded as an interval in which the overshoot of the read signal occurs, and is recorded as an overshoot threshold.
Preferably, the step of performing the SPI signal overshoot test by the overshoot threshold further includes inputting the overshoot threshold into the oscilloscope, performing the overshoot test, and acquiring a second waveform of the SPI signal edge falling within the overshoot threshold.
The invention also provides an SPI signal testing device, which comprises a tested board card, a probe, an oscilloscope and a control system;
the tested board card is connected with the probe rod, the testing end of the probe rod is in contact with the tested position in the tested board card, and the probe rod is connected with the oscilloscope through a signal wire; the oscilloscope is connected with the control system through a network cable; running a test program in the control system, and transmitting a message containing a control instruction to the oscilloscope by the control system through a network; and the oscilloscope analyzes and executes SPI signal test operation after receiving the control instruction.
The invention also provides a control system of the SPI signal testing device, which comprises an initialization module, a threshold setting module, an overshoot threshold module, a time sequence threshold module, an overshoot test module, a time sequence test module and a storage module;
the initialization module is used for initializing the oscilloscope and the tested board card;
the threshold setting module is used for setting a trigger threshold during time sequence testing and an acquisition threshold during overshoot testing;
the overshoot threshold module is used for calculating an overshoot threshold during the overshoot test according to the acquisition threshold;
the time sequence threshold module is used for calculating a time sequence threshold value during time sequence test according to the trigger threshold value;
the overshoot test module is used for performing overshoot test, acquiring a first waveform in an overshoot threshold according to the overshoot threshold and storing the first waveform in the overshoot threshold to the storage module;
the time sequence testing module is used for carrying out time sequence testing, acquiring a second waveform in a time sequence threshold value according to the time sequence threshold value, and calculating the distances between data in the second waveform and the edge of a clock, wherein the distances are a first distance and a second distance respectively; the first distance is holding time, the second distance is establishing time, and the second waveform and the establishing time and the holding time of the second waveform are stored in a storage module;
the storage module is configured to store the first and second waveforms and the setup time and the hold time of the second waveform.
The present invention further provides a computer-readable storage medium, which stores a computer program, and when the computer program is executed by a processor, the steps of the SPI signal testing method described above are implemented.
The invention has the beneficial effects that:
1. according to the automatic SPI signal testing method, the data distribution of the voltage peak value and the peak value of the voltage edge signal is counted, the waveform of the read signal to be acquired is automatically identified by utilizing the characteristic of probability distribution of the peak value of the read signal, the labor input is greatly saved, and the development cost is saved.
2. The automatic SPI signal testing device controls the oscilloscope through the control system to complete the test of the overshoot threshold value and the time sequence threshold value, performs the overshoot test and the time sequence test through the oscilloscope, automatically identifies the read signal according to the overshoot threshold value and the time sequence threshold value, and improves the testing efficiency.
3. According to the control system of the automatic SPI signal testing device, the overshoot threshold value module and the time sequence threshold value module in the control system are used for testing the overshoot threshold value and the time sequence threshold value, the overshoot test module and the time sequence test module are used for performing the overshoot test and the time sequence test, and the storage module is used for storing the test result, so that the time sequence test and the overshoot test can be automatically completed, the human resource consumption is saved, manual control by personnel is not needed, and the test efficiency is improved.
4. The computer readable storage medium provided by the invention mutually cooperates all modules in the control system, automatically completes the time sequence test and the overshoot test, and improves the efficiency of the SPI signal test.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and other drawings can be obtained by those skilled in the art without creative efforts.
Fig. 1 is a flowchart of an SPI signal testing method according to embodiment 1 of the present invention;
fig. 2 is a flowchart of a timing sequence testing method in the SPI signal testing method according to embodiment 1 of the present invention;
fig. 3 is a flowchart of an overshoot test method in the SPI signal test method according to embodiment 1 of the present invention;
fig. 4 is a schematic diagram of an SPI signal testing device according to embodiment 2 of the present invention;
fig. 5 is a schematic diagram of a control system architecture in an SPI signal testing apparatus according to embodiment 3 of the present invention.
Detailed Description
The technical solutions of the present invention will be described clearly and completely with reference to the accompanying drawings, and it should be understood that the described embodiments are some, but not all embodiments of the present invention. All other embodiments, which can be obtained by a person skilled in the art without making any creative effort based on the embodiments in the present invention, belong to the protection scope of the present invention.
In the description of the present invention, it should be noted that the terms "first" and "second" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
In the description of the present invention, it should be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; the two elements may be directly connected or indirectly connected through an intermediate medium, or may be communicated with each other inside the two elements, or may be wirelessly connected or wired connected. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
It should be noted that, in the description of the present invention, the SPI is a Serial Peripheral Interface (Serial Peripheral Interface), the probe uses a 1GHz tach passive probe, the oscilloscope uses a tach DPO7054 oscilloscope, and the signal line uses a coaxial cable.
Example 1
An embodiment of the present invention provides a method for testing an SPI signal, referring to fig. 1, including the following steps:
s100, testing environment deployment, and initializing an oscilloscope, a tested board card and a control system;
the initialization comprises the steps that the oscilloscope is started, the board card to be tested is electrified, and an automatic program is started in the control system;
s200, the control system issues a control command to execute the SPI signal time sequence test and execute the SPI signal overshoot test;
s300, referring to fig. 2, executing an SPI signal timing sequence test, setting a trigger threshold for 100 times, selecting a trigger mode of an oscilloscope according to a control instruction, triggering a peak value of an SPI edge signal for 100 times, an automation program counting data distribution of the peak value for 100 times, sorting the peak values in a descending order or an ascending order, extracting a peak value maximum interval, taking the interval as an interval in which a read level signal appears, and sending the interval to the oscilloscope, setting the interval as a timing sequence threshold of the oscilloscope, and acquiring a waveform falling within the interval; after acquiring a waveform in an oscilloscope, calculating the distance between the edge of the waveform relative to the previous clock and the edge of the next clock, wherein the waveform contains a first clock, data and a second clock, and the distance between the data and the first clock and the distance between the data and the second clock are respectively a first distance and a second distance; the waveform and the setup time and hold time of the waveform are saved with the first distance as the hold time and the second distance as the setup time.
Referring to fig. 3, performing an SPI signal overshoot test, setting an acquisition threshold value for 100 times, acquiring an SPI signal, measuring a maximum value of an edge voltage value of the acquired SPI signal, transmitting the maximum value to a control system for storage, stopping acquisition when the acquisition frequency reaches the acquisition threshold value for 100 times, acquiring a maximum value and a minimum value of stored values by ascending or descending sorting, calculating a difference value between the maximum value and the minimum value, equally dividing the maximum value and the minimum value into 100 intervals according to the difference value, counting the number of the stored values falling into the intervals, finding two intervals with the largest number, comparing values of the two intervals, reserving the interval with the larger value, taking the interval as an interval in which an overshoot of a read signal occurs, transmitting the interval to an oscilloscope, and setting the interval as an overshoot threshold value; triggering the oscilloscope, acquiring the waveform of the SPI signal edge falling in the interval, acquiring the test waveform from the oscilloscope and storing.
For example, the maximum value is 100, the minimum value is 1, the 100 and 1 are equally divided into 100 sections, if the number of the sections falling into 88-89 and the number of the sections 99-100 are two with the maximum number, the value of the section 99-100 is larger than that of the section 88-89, and the section 99-100 is used as the overshoot threshold.
And acquiring the overshoot of the read signal through an overshoot threshold in the process test of executing the SPI signal.
The operation of the oscilloscope, such as triggering the oscilloscope to sample, setting an overshoot threshold value and a time sequence threshold value, is completed through a VISA instruction.
Example 2
An embodiment of the present invention further provides an SPI signal testing device, please refer to fig. 4, including: the device comprises a board card to be tested, a probe, an oscilloscope and a control system;
the tested board card is connected with a probe rod, and the probe rod is connected with an oscilloscope through a signal wire; the oscilloscope is connected with the control system through a network cable; running a test program in the control system, and transmitting a message containing a control instruction to the oscilloscope by the control system through a network; and the oscilloscope analyzes and executes corresponding operation after receiving the control instruction.
The tested board card is a board card containing the SPI link to be tested. The probe point is measured at the corresponding position of the tested board card.
Example 3
The embodiment of the present invention further provides a control system of an SPI signal testing apparatus, please refer to fig. 5, which includes an initialization module, a threshold setting module, an overshoot threshold module, a timing threshold module, an overshoot testing module, a timing testing module, and a storage module;
the initialization module initializes the oscilloscope and the board card to be tested;
the threshold setting module sets a trigger threshold during time sequence testing and an acquisition threshold during overshoot testing;
the overshoot threshold module calculates the overshoot threshold during the overshoot test according to the acquisition threshold;
the time sequence threshold module calculates a time sequence threshold value during time sequence test according to the trigger threshold value;
the overshoot test module performs overshoot test, acquires a first waveform in the overshoot threshold according to the overshoot threshold and stores the first waveform in the storage module;
the time sequence testing module carries out time sequence testing, acquires a second waveform in the time sequence threshold according to the time sequence threshold, and calculates the distance between the edge of the previous clock and the edge of the next clock in the second waveform, wherein the distance is a first distance and a second distance respectively; taking the first distance as a holding time and the second distance as a building time, and storing the second waveform and the building time and the holding time of the second waveform to a storage module;
the storage module stores the first and second waveforms and a setup time and a hold time of the second waveform.
Based on the same inventive concept as the method in the foregoing embodiments, the embodiments of the present specification further provide a computer-readable storage medium, on which a computer program is stored, and the computer program, when executed by a processor, implements the steps of the SPI signal testing method as disclosed in the foregoing.
The numbers of the embodiments disclosed in the embodiments of the present invention are merely for description, and do not represent the merits of the embodiments.
It will be understood by those skilled in the art that all or part of the steps of implementing the above embodiments may be implemented by hardware, and a program that can be implemented by the hardware and can be instructed by the program to be executed by the relevant hardware may be stored in a computer readable storage medium, where the storage medium may be a read-only memory, a magnetic or optical disk, and the like.
The above description is only an embodiment of the present invention, and not intended to limit the scope of the present invention, and all modifications of equivalent structures and equivalent processes performed by the present specification and drawings, or directly or indirectly applied to other related technical fields, are included in the scope of the present invention.
Claims (5)
1. An SPI signal testing method is characterized by comprising the following steps:
deploying a test environment, and initializing the oscilloscope;
setting a threshold, and setting the times of triggering the threshold and the times of sampling the threshold;
executing the SPI signal time sequence test, triggering the peak value of the SPI edge signal through an oscilloscope, stopping triggering when the frequency of triggering the peak value of the SPI edge signal reaches the triggering threshold frequency, counting the data distribution of the peak value, calculating the time sequence threshold value, and executing the SPI signal time sequence test through the time sequence threshold value;
the time sequence threshold value is calculated, and the SPI signal time sequence test is executed through the time sequence threshold value, wherein the time sequence threshold value comprises the following steps: sorting the peak values in a descending order; extracting an interval where a first-ranked peak value is located and recording as a time sequence peak value interval, wherein the time sequence peak value interval is an interval where a read level signal appears; setting the time sequence peak interval as a time sequence threshold value; inputting the time sequence threshold value into the oscilloscope, executing a time sequence test, acquiring a first waveform in the oscilloscope within the time sequence threshold value, and calculating the establishment time and the holding time of the first waveform;
executing an SPI signal overshoot test, acquiring an SPI signal through an oscilloscope, and measuring the peak value of the edge voltage value of the acquired SPI signal, and recording as the voltage peak value of the SPI signal; when the frequency of collecting the SPI signal reaches the frequency of a sampling threshold, stopping collecting, calculating an overshoot threshold through the voltage peak value of the SPI signal, and executing an SPI signal overshoot test through the overshoot threshold;
the step of calculating the overshoot threshold value through the voltage peak value of the SPI signal, and the step of executing the overshoot test of the SPI signal through the overshoot threshold value comprises the following steps: acquiring voltage peak values of the collected SPI signals, and sequencing the voltage peak values of the SPI signals in a descending order; obtaining SPI signal voltage peak values of first rank and the first last rank, and respectively recording the SPI signal voltage peak values as a first voltage peak value and a second voltage peak value; calculating the difference value of the first voltage peak value and the second voltage peak value; equally dividing the first voltage peak value and the second voltage peak value into a plurality of peak value intervals according to the difference value; counting the number of the collected voltage peaks of the SPI signals falling into the peak value interval, sequencing in a descending order, obtaining a first sequencing peak value interval and a second sequencing peak value interval, and comparing the values; taking the peak value interval with a large value as the overshoot interval of the reading signal and recording the peak value interval as an overshoot threshold value; and inputting the overshoot threshold value into the oscilloscope, performing overshoot test, and acquiring a second waveform of the SPI signal edge falling within the overshoot threshold value.
2. An SPI signal testing method according to claim 1, characterized by: the step of calculating a setup time and a hold time of the first waveform comprises:
the first waveform comprises a first clock edge, data and a second clock edge;
calculating the distance between the data and the edge of the first clock, and recording as a first distance;
calculating the distance between the data and the second clock edge and recording as a second distance;
the first distance is a hold time of the first waveform; the second distance is a setup time of the first waveform.
3. An SPI signal testing device, which adopts the SPI signal testing method of claim 1, is characterized by comprising a board card to be tested, a probe, an oscilloscope and a control system;
the tested board card is connected with the probe rod, the testing end of the probe rod is in contact with the tested position in the tested board card, and the probe rod is connected with the oscilloscope through a signal wire; the oscilloscope is connected with the control system through a network cable; running a test program in the control system, and transmitting a message containing a control instruction to the oscilloscope by the control system through a network; and the oscilloscope analyzes and executes SPI signal test operation after receiving the control instruction.
4. A control system of an SPI signal testing device is characterized by comprising an initialization module, a threshold setting module, an overshoot threshold module, a time sequence threshold module, an overshoot test module, a time sequence test module and a storage module;
the initialization module is used for initializing the oscilloscope and the board card to be tested;
the threshold setting module is used for setting a trigger threshold during time sequence testing and an acquisition threshold during overshoot testing;
the overshoot threshold module is used for calculating an overshoot threshold during overshoot test according to the acquisition threshold;
the time sequence threshold module is used for calculating a time sequence threshold value during time sequence test according to the trigger threshold value;
the overshoot test module is used for performing overshoot test, acquiring a first waveform in an overshoot threshold according to the overshoot threshold and storing the first waveform in the overshoot threshold to the storage module;
the time sequence testing module is used for carrying out time sequence testing, acquiring a second waveform in a time sequence threshold value according to the time sequence threshold value, and calculating the distances between data in the second waveform and the edge of a clock, wherein the distances are a first distance and a second distance respectively; the first distance is holding time, the second distance is establishing time, and the second waveform and the establishing time and the holding time of the second waveform are stored in a storage module;
the storage module is configured to store the first and second waveforms and the setup time and the hold time of the second waveform.
5. A computer-readable storage medium, in which a computer program is stored, which, when being executed by a processor, carries out the steps of a method for testing an SPI signal according to claim 1 or 2.
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| CN102004177A (en) * | 2009-08-28 | 2011-04-06 | 鸿富锦精密工业（深圳）有限公司 | Oscilloscope and method for identifying time sequence of universal serial bus signals by using same |
| CN106771453A (en) * | 2016-11-16 | 2017-05-31 | 广州视源电子科技股份有限公司 | Testing method and device for oscilloscope |
| CN106919484A (en) * | 2017-03-06 | 2017-07-04 | 广州致远电子股份有限公司 | A kind of universal serial bus Time Series Analysis Method and device |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN102004177A (en) * | 2009-08-28 | 2011-04-06 | 鸿富锦精密工业（深圳）有限公司 | Oscilloscope and method for identifying time sequence of universal serial bus signals by using same |
| CN106771453A (en) * | 2016-11-16 | 2017-05-31 | 广州视源电子科技股份有限公司 | Testing method and device for oscilloscope |
| CN106919484A (en) * | 2017-03-06 | 2017-07-04 | 广州致远电子股份有限公司 | A kind of universal serial bus Time Series Analysis Method and device |
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