CN112003657B - Board-level radio frequency signal testing system, method and device without radio frequency testing seat - Google Patents
Board-level radio frequency signal testing system, method and device without radio frequency testing seat Download PDFInfo
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- CN112003657B CN112003657B CN202010838777.0A CN202010838777A CN112003657B CN 112003657 B CN112003657 B CN 112003657B CN 202010838777 A CN202010838777 A CN 202010838777A CN 112003657 B CN112003657 B CN 112003657B
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/10—Monitoring; Testing of transmitters
- H04B17/15—Performance testing
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
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- H04B17/20—Monitoring; Testing of receivers
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Abstract
The board-level radio frequency signal testing system, method and device without the radio frequency testing seat are used for testing the radio frequency signal of the radio frequency circuit; the radio frequency test probe comprises a radio frequency test probe, a tuning module and a test instrument module, wherein one end of the radio frequency test probe is connected with an antenna elastic sheet of a radio frequency circuit, and the other end of the radio frequency test probe is connected with the tuning module; the tuning module is connected with the test instrument module and adjusts the matching impedance according to the return loss; the matching impedance is matched with the impedance of the radio frequency circuit; the radio frequency test probe is directly electrically connected with an antenna shrapnel in a radio frequency circuit, then the size of the matching impedance is adjusted through the tuning module, and whether the matching impedance is matched in place or not can be judged through the size of the return loss until the matching impedance is matched with the impedance in the radio frequency circuit, so that the aim of directly testing radio frequency signals through the antenna shrapnel is fulfilled; the test result is precise and the structure is ingenious; the design space and the production cost of a radio frequency test seat in a radio frequency circuit are saved.
Description
Technical Field
The invention relates to the technical field of radio frequency signal testing, in particular to a board-level radio frequency signal testing system, method and device without a radio frequency testing seat.
Background
In recent years, along with the continuous development of communication technology, the popularity of wireless products is higher and higher, the number of wireless products produced globally every year is also increasing, and the production and the life of people are more and more convenient. The wireless products (represented by mobile phones) mainly refer to communication signals with a frequency range of 300 kHz-300 GHz, and the communication signals in the frequency range are also called radio frequency signals. In order to ensure the quality of the radio frequency signal on the main board of the wireless product so as to meet a series of most basic wireless communication requirements of the wireless product, a board-level radio frequency test is usually performed on a radio frequency chip on the main board.
As shown in fig. 1, in a conventional board-level radio frequency test scheme, a radio frequency test socket is added on a main board of a wireless product through a design and development stage, one end of a radio frequency test probe is buckled with the radio frequency test socket on the main board of the wireless product in a mechanical structure during testing, the other end of the radio frequency test probe is connected to a test instrument module through a radio frequency test cable, and finally whether board-level radio frequency testing of the wireless product is qualified or not is judged through a measurement result of the test instrument module, and the main board of the wireless product is a good product or a defective product is screened to ensure the quality of a radio frequency signal. Wireless products represented by mobile phones have been developed to the 5G era, the frequency range of radio frequency signals used on the main board of the wireless products is wider and wider, and in order to ensure the communication quality of the wireless products, more complete board-level radio frequency tests need to be performed before the wireless products are on the market to cover all the frequency ranges of radio frequency signals used after the wireless products are on the market. At present, more radio frequency test seats are added on a mainboard of a wireless product through a design and development stage; the number of the radio frequency test seats on the mainboard of the wireless product in the 2-4G era is calculated by single digit, and the number in the 5G era can be increased to more than 10 to meet the requirement of traditional board-level radio frequency test; for wireless products with more and more complex design, higher performance and better user experience, the design space on the mainboard is very limited, more than 10 radio frequency test seats are only used for meeting the test requirement of guaranteeing the quality of radio frequency signals before the wireless products are sold in the market, and the receiving and transmitting quality of the radio frequency signals on the wireless product board is not improved after the wireless products are sold in the market. On the contrary, more than 10 installation spaces of the board-level radio frequency test seats are reserved in the limited mainboard space in the wireless product design stage, and the material cost of the wireless product is increased. It is therefore desirable to develop a board-level rf signal testing system that does not require an rf test socket to facilitate testing of rf signals and to save costs associated with rf test sockets in upstream designs.
Disclosure of Invention
Aiming at the existing technologies such as: in board-level radio frequency signal testing, there is no testing system that does not require a radio frequency testing socket.
In particular to a board-level radio frequency signal test system without a radio frequency test seat, which is used for testing radio frequency signals of a radio frequency circuit; the radio frequency test probe comprises a radio frequency test probe, a tuning module and a test instrument module, wherein one end of the radio frequency test probe is connected with an antenna elastic sheet of a radio frequency circuit, and the other end of the radio frequency test probe is connected with the tuning module; the tuning module is connected with the test instrument module and adjusts the matching impedance; the matching impedance matches the impedance of the radio frequency circuit.
Preferably, the tuning module includes a variable capacitance inductance unit, the variable capacitance inductance unit is used for adjusting the matching impedance, one end of the variable capacitance inductance unit is connected with the test instrument module, and the other end of the variable capacitance inductance unit is connected with the radio frequency test probe.
Preferably, the tuning module further includes a return loss detection unit, where the return loss detection unit is configured to detect a real-time return loss of the variable capacitance inductance unit when the matching impedance is adjusted; the variable capacitance inductance unit adjusts the matching impedance according to the real-time return loss.
Preferably, when the return loss detection unit detects the real-time return loss, and when the real-time return loss is smaller than a first threshold, the variable capacitance inductance unit stops adjusting the matching impedance, and calibrates the current matching impedance as a target matching impedance, where the target matching impedance is matched with an impedance of a radio frequency circuit.
The board-level radio frequency signal testing method without the radio frequency testing seat is realized based on the board-level radio frequency signal testing system without the radio frequency testing seat, and comprises the following steps of:
s1, connecting a tail end connecting wire of the radio frequency test probe with the tuning module, wherein the tuning module is electrically connected with the test instrument module;
s2, electrically connecting the head end probe of the radio frequency test probe with an antenna elastic sheet of a radio frequency circuit on the PCB;
s3, adjusting the matching impedance through the tuning module to match the matching impedance with the impedance of the radio frequency circuit;
and S4, when the matching impedance is adjusted to be matched with the impedance of the radio frequency circuit, carrying out radio frequency signal test on the radio frequency chip.
Preferably, when the matching impedance is adjusted, the matching impedance is adjusted through a variable capacitance inductance unit in the tuning module; and detecting real-time return loss of the variable capacitance inductance unit when the matching impedance is adjusted through a return loss detection unit in the tuning module.
Preferably, when the matching impedance size is determined by the variable capacitance inductance unit, whether the matching impedance is appropriate is determined by:
s31, sending a first electric signal by using a test instrument, wherein the first electric signal is received by a radio frequency chip of a radio frequency circuit, and observing the return loss detected by the return loss detection unit; and deriving the insertion loss of the current signal path; when the return loss is smaller than a first threshold value and the insertion loss is smaller than a second threshold value, the matching impedance is matched with the impedance of the radio frequency circuit;
s32, a radio frequency circuit is used for emitting a second electric signal, the second electric signal is received by the test instrument module, the test instrument module displays the size of the corresponding actually received electric signal and marks the actually received electric signal as a third electric signal, and the insertion loss under the signal path is obtained through the second electric signal and the third electric signal;
and S33, verifying the mobility of the insertion loss in the step S32, and stopping adjusting the matching impedance if the mobility meets the standard.
Preferably, in S2, the rf test probe is fixedly connected to the antenna dome by a fixing clamp.
The board-level radio frequency signal testing device without the radio frequency testing seat comprises the board-level radio frequency signal testing system without the radio frequency testing seat.
The invention has the beneficial effects that: the invention provides a board-level radio frequency signal test system, a method and a device without a radio frequency test seat, which are used for testing radio frequency signals of a radio frequency circuit; the radio frequency test probe comprises a radio frequency test probe, a tuning module and a test instrument module, wherein one end of the radio frequency test probe is connected with an antenna elastic sheet of a radio frequency circuit, and the other end of the radio frequency test probe is connected with the tuning module; the tuning module is connected with the test instrument module and adjusts the matching impedance according to the return loss; the matching impedance is matched with the impedance of the radio frequency circuit; the radio frequency testing probe is directly electrically connected with an antenna shrapnel in a radio frequency circuit, then the size of the matching impedance is adjusted through the tuning module, and whether the size of the matching impedance is proper or not is judged through the size of the return loss until the matching impedance is matched with the size of the impedance in the radio frequency circuit, so that the aim of directly testing radio frequency signals through the antenna shrapnel is fulfilled; and in a board-level radio frequency signal testing method; whether the matched impedance is proper or not is judged by using the return loss and the insertion loss of the radio frequency chip in two states of signal sending and signal receiving, and the test is precise and has an ingenious structure; the radio frequency signal test can be rapidly carried out, and the design and the cost of a radio frequency signal test seat in a radio frequency circuit can be saved.
Drawings
FIG. 1 is a diagram illustrating board level detection of RF signals in the prior art;
FIG. 2 is a block diagram of a prior art system for detecting RF signals using an RF test socket;
FIG. 3 is a system block diagram of the present invention;
FIG. 4 is a flow chart of a method of the present invention;
FIG. 5 is a flow chart of a method for matching impedance verification according to the present invention;
FIG. 6 is a graph of the S-parameter of inventive verification example 1 without tuning;
FIG. 7 is a graph of the S-parameter of the invention in the validation example 1 after tuning;
FIG. 8 is a graph of the S-parameter of the present invention in the case of the non-tuned version of the verification example 2;
FIG. 9 is a graph of the S-parameter of the invention in a validation example 2 after tuning;
FIG. 10 is a circuit block diagram of an embodiment of the present invention.
Description of the reference numerals
1. A radio frequency test probe; 2. a tuning module; 21. a variable capacitance inductance unit; 22. a return loss detection unit; 3. a test instrument module; 4. a radio frequency circuit; 41. an antenna spring; A. curve S11; B. curve S21.
Detailed Description
In order to more clearly describe the present invention, the present invention will be further described with reference to the accompanying drawings.
The radio frequency test seat has the function that when the wireless product is used for board-level radio frequency performance test, the radio frequency probe and the radio frequency test seat are mechanically buckled to form electrical connection; when a radio frequency signal is sent or received by a radio frequency chip on a mainboard of the wireless product, the signal is transmitted to a test instrument through a radio frequency test seat and a radio frequency probe to test the radio frequency signal; after the test is finished, pulling out the probe; the signal receiving and transmitting path of the radio frequency chip is changed from the radio frequency chip to the antenna spring plate through the radio frequency test seat, and the antenna spring plate transmits radio frequency signals to achieve the purpose of wireless communication; referring to fig. 2, therefore, the function of the rf test socket is only to test the requirement of the rf signal quality in the rf circuit, and does not contribute to the improvement of the rf signal quality itself; however, with the coming of the 5G era, the design of the main board is more and more complex, the performance requirement is higher and higher, users need to experience better and better wireless products, the design space on the main board is very limited, and the rib design of the radio frequency test seat also becomes an elbow; and the material cost of the wireless product is increased. Moreover, since the design of the radio frequency circuit has been well established, a fixed industrial chain is formed in the production and design of the radio frequency test socket, and in the field of testing of radio frequency signals, technicians generally and directly recognize objective facts that the radio frequency test socket must exist, or the technicians cannot find a more preferable alternative; in order to improve the current design situation of the existing radio frequency circuit, save the design space and the production cost of a radio frequency test seat and ensure the simple and convenient test of radio frequency signals, the inventor designs a board-level radio frequency signal test system without the radio frequency test seat. Before this, the technical concept terms commonly used in the art are introduced:
return loss (S11), also known as reflection loss. Which is a reflection in the rf circuit due to impedance mismatch or discontinuity, can be numerically represented by the ratio of the reflected signal to the incident signal. Mismatches occur primarily at the connector and possibly also at the characteristic impedance of the rf circuit. In the radio frequency circuit adopting the radio frequency test seat, because the impedance of the radio frequency circuit is generally 50 omega impedance which is generally used in the industry, the impedance of the radio frequency test seat is set to be the impedance of the radio frequency circuit, and the probe is matched with the radio frequency test seat, so that the return loss can be ensured to carry out radio frequency test in a standard; however, after the radio frequency test socket is omitted, the general 50 Ω impedance of the radio frequency circuit is changed by the antenna matching in different states before the antenna spring in the radio frequency circuit, and the problem of how to match in the design of the radio frequency circuit with different impedances needs to be solved.
Insertion loss (S21), which refers to the loss of load power occurring somewhere in the transmission system due to the insertion of an element or device, is expressed as the ratio of the power received on the load before the element or device is inserted to the power received on the same load after insertion in decibels.
In particular to a board-level radio frequency signal testing system without a radio frequency testing socket, please refer to fig. 3-4; a radio frequency signal for testing the radio frequency circuit; the radio frequency testing device comprises a radio frequency testing probe 1, a tuning module 2 and a testing instrument module 3, wherein one end of the radio frequency testing probe 1 is connected with an antenna elastic sheet 41 of a radio frequency circuit 4, and the other end of the radio frequency testing probe is connected with the tuning module 2; the tuning module 2 is connected with the test instrument module 3, and the tuning module 2 adjusts the matching impedance according to the return loss S11; the matching impedance is matched with the impedance of the radio frequency circuit; when the radio frequency test seat is used for testing radio frequency signals originally, the probe is electrically connected with the radio frequency test seat, so that electric signals sent by a radio frequency chip flow to a test instrument from the radio frequency test seat and cannot be transmitted to the antenna elastic sheet any more, because the existing radio frequency test seat is provided with a mechanical switch structure, and the connection between the antenna elastic sheet and the radio frequency test seat can be disconnected after a contact pin is inserted; when the contact pin is pulled out, the antenna shrapnel receives the signal sent by the radio frequency chip again; in the invention, the signal of the radio frequency chip is directly sent out from the antenna elastic sheet and is finally received by the test instrument module 3 through the radio frequency test probe 1 and the tuning module 2, and the tuning module is used for adjusting the impedance of the tuning module to ensure that the matching impedance is matched with the impedance of the whole section of radio frequency circuit, so that the attenuation of the radio frequency signal transmitted to the test instrument module is reduced, the data authenticity is high, and the obtained test data is real and reliable. And after the tuning circuit tunes and matches a standard radio frequency board (gold plate), corresponding tuning data can be recorded, and then the same type of pieces to be tested can be directly used.
It is worth to be noted that the antenna spring is a connecting device between the radio frequency conducting circuit and the radio frequency radiating device in the radio frequency circuit, and the structures of the antenna spring are not necessarily the same, and the calling is not necessarily uniform; as one of ordinary skill in the art will refer to it as an antenna spring, an antenna connector, etc.; it should not be limited to the names in the present invention, but should include specific meanings of the terms in the present invention.
In this embodiment, the tuning module 2 includes a variable capacitance inductance unit 21, the variable capacitance inductance unit 21 is used to adjust the matching impedance, one end of the variable capacitance inductance unit 21 is connected to the test instrument module 3, and the other end is connected to the radio frequency test probe 1; the variable capacitance inductance unit is used for adjusting the matching impedance, so that the connection between the radio frequency test probe 1 and the antenna elastic sheet 41 does not have great influence on radio frequency signals, and the variable capacitance inductance unit is composed of a variable capacitor and/or a variable inductance and is integrated on a circuit board, so that the matching impedance is adjusted.
In an embodiment, referring to fig. 10, the variable capacitance and inductance unit is composed of the circuit shown in fig. 10, 5 control pins of the control system are respectively connected to the inductance or the capacitance in the variable capacitance and inductance unit, the antenna spring is connected to the variable capacitance and inductance circuit, the other end of the variable capacitance and inductance circuit is connected to the test instrument, and the return loss detection circuit is connected between the variable capacitance and inductance circuit and the test instrument. In practical application, a test instrument sends out a signal, and then the signal is received by a radio frequency chip, and the direction of the signal can be recorded as a forward path; the insertion loss is obtained at this time; meanwhile, the return loss is monitored at the bidirectional coupler to obtain the return loss, and when the return loss is within an acceptable range and the insertion loss is small, the tuning impedance matching degree is high; then the radio frequency chip transmits a signal, the test instrument receives the signal, the signal is recorded as a reverse path at the moment, and the insertion loss in the signal direction at the moment is obtained; but to prevent there being very few circuits with poor symmetry; the insertion loss at this time is obtained through the reverse path, then the impedance value in the variable capacitance inductance circuit is adjusted in a small amplitude, whether the insertion loss fluctuation under the reverse path is good or not is observed, and if the fluctuation is not large, the matched impedance is correct.
Meanwhile, in this embodiment, the tuning module 2 further includes a return loss detection unit 22, where the return loss detection unit 22 is configured to detect a real-time return loss of the variable capacitance inductance unit 21 when adjusting the matching impedance; the size of the return loss can correspond to whether the matched impedance meets the requirement or not to a certain extent, and the return loss is the ratio of the reflected wave to the incident wave, so that whether the matched impedance meets the requirement or not can be calibrated when the return loss is; in a specific embodiment, when the return loss detection unit detects real-time return loss, and when the real-time return loss is smaller than a first threshold, the variable capacitance inductance unit stops adjusting the size of the matching impedance, and calibrates the current matching impedance as a target matching impedance, where the target matching impedance is matched with the impedance of the radio frequency circuit. For example, when testing the radio frequency signal of the frequency band of 600MHz-2328MHz, the first threshold value is calibrated at-9.8 dB, so S11 < -9.8dB indicates that the matching impedance is matched with the impedance of the radio frequency circuit; and meanwhile, the insertion loss can be measured through the instrument testing module, when the insertion loss also meets the condition, the adjusted matching impedance can be shown to be proper, and the radio frequency signal of the radio frequency chip can be directly tested.
The board-level radio frequency signal testing method without the radio frequency testing seat is also disclosed, and is realized by the board-level radio frequency signal testing system without the radio frequency testing seat based on the foregoing, and comprises the following steps:
s1, connecting the tail end connecting wire of the radio frequency test probe with a tuning module, wherein the tuning module is electrically connected with the test instrument module;
s2, electrically connecting the head end probe of the radio frequency test probe with the antenna elastic sheet of the radio frequency circuit on the PCB;
s3, adjusting the size of the matching impedance through a tuning module to enable the matching impedance to be matched with the impedance of the radio frequency circuit;
and S4, when the matching impedance is adjusted to be matched with the impedance of the radio frequency circuit, testing the radio frequency signal of the radio frequency chip.
In this embodiment, when the magnitude of the matching impedance is adjusted, the magnitude of the matching impedance is adjusted through the variable capacitance inductance unit in the tuning module; and detecting the real-time return loss of the variable capacitance inductance unit when the matching impedance is adjusted through a return loss detection unit in the tuning module.
In this embodiment, when the matching impedance size is determined by the variable capacitance inductance unit, whether the matching impedance is appropriate is determined by:
s31, sending a first electric signal by using a test instrument, wherein the first electric signal is received by a radio frequency chip of a radio frequency circuit, and observing the return loss detected by the return loss detection unit; and deriving the insertion loss of the current signal path; when the return loss is smaller than a first threshold value and the insertion loss is smaller than a second threshold value, the matching impedance is matched with the impedance of the radio frequency circuit;
s32, a radio frequency circuit is used for emitting a second electric signal, the second electric signal is received by the test instrument module, the test instrument module displays the size of the corresponding actually received electric signal and marks the actually received electric signal as a third electric signal, and the insertion loss under the signal path is obtained through the second electric signal and the third electric signal;
and S33, verifying the mobility of the insertion loss in the step S32, and stopping adjusting the matching impedance if the mobility meets the standard.
That is, when it is determined whether the matching impedance adjusted by the variable capacitance inductance unit is appropriate, it is determined by the return loss and/or the insertion loss, because the return loss can directly reflect whether the impedance is appropriate to a certain extent in the case of good circuit symmetry; in the process of the application, the return loss corresponding to the two processes of the radio frequency chip transmitting and receiving signals can be combined to be used as a judgment standard; when the radio frequency chip sends a signal, because the size of the sent first signal is known, and the size of the second signal received on the test instrument module is also known, the insertion loss can be obtained through the second signal and the first signal; meanwhile, the return loss detection unit is used for testing the return loss under the current matching impedance in real time, and when the return loss and the insertion loss meet corresponding thresholds in the two processes of sending and receiving of the radio frequency chip, the matching impedance adjusted by the variable capacitance inductance unit can be determined to be the target matching impedance, namely, the matching impedance is matched with the impedance of the radio frequency circuit, so that the radio frequency signal quality test of the radio frequency chip can be carried out.
According to the system and the method, the matching impedance is adjusted through the variable capacitance inductance unit, and the constraints of return loss and insertion loss are added, so that the effect of adapting to different types of radio frequency circuits and chip specifications is achieved, namely, the radio frequency circuits of different types and specifications can be tested, therefore, the radio frequency test probe can be stably connected with the antenna elastic pieces of different specifications and different structures, and the radio frequency test probe is fixedly connected with the antenna elastic pieces through the fixing clamp.
The board-level radio frequency signal testing device without the radio frequency testing seat comprises a board-level radio frequency signal testing system without the radio frequency testing seat.
Verification example
Directly accessing an antenna shrapnel through radio frequency testing equipment, performing electromagnetic software simulation test of a frequency band 2.8GHz-5.2GHz on a 4.2GHz radio frequency chip to obtain an S11 curve and an S21 curve as shown in figure 6, then performing electromagnetic software simulation after performing matching impedance adjustment through a tuning module by using the system of the invention and the method of the invention, and obtaining an S11 curve and an S21 curve as shown in figure 7;
directly accessing an antenna shrapnel through radio frequency testing equipment, performing electromagnetic software simulation test on a 2GHz radio frequency chip at a frequency band of 0.8GHz-3.2GHz to obtain an S11 curve and an S21 curve as shown in figure 8, then performing electromagnetic software simulation after performing matching impedance adjustment through a tuning module by using the system of the invention and the method of the invention, and obtaining an S11 curve and an S21 curve as shown in figure 9; therefore, after the impedance matching is carried out through the tuning module, the return loss and the insertion loss which meet the conditions in the frequency band corresponding to the radio frequency chip can be ensured; therefore, the invention can be used for accurately measuring the tuned radio frequency chips and radio frequency circuits of different models, and the test data is real and reliable.
The invention has the advantages that:
1) by using the invention, a radio frequency test seat can be directly omitted, the radio frequency test probe is directly and electrically connected with the antenna elastic sheet, and the radio frequency signal test can be carried out by carrying out impedance matching through the tuning module;
2) the radio frequency chip can be directly adapted to radio frequency chips and circuits with different specifications and different models, whether the matched impedance is proper or not is judged by using the return loss and the insertion loss of the radio frequency chip in two states of signal sending and signal receiving, and the test is precise and has an ingenious structure.
The above disclosure is only for a few specific embodiments of the present invention, but the present invention is not limited thereto, and any variations that can be made by those skilled in the art are intended to fall within the scope of the present invention.
Claims (5)
1. A board-level radio frequency signal test system without a radio frequency test socket is used for testing radio frequency signals of a radio frequency circuit; the radio frequency test device is characterized by comprising a radio frequency test probe, a tuning module and a test instrument module, wherein one end of the radio frequency test probe is connected with an antenna elastic sheet of a radio frequency circuit, and the other end of the radio frequency test probe is connected with the tuning module; the tuning module is connected with the test instrument module and adjusts the size of the matched impedance; the matching impedance is matched with the impedance of the radio frequency circuit; the tuning module comprises a variable capacitance inductance unit, the variable capacitance inductance unit is used for adjusting the matching impedance, one end of the variable capacitance inductance unit is connected with the test instrument module, and the other end of the variable capacitance inductance unit is connected with the radio frequency test probe; the tuning module further comprises a return loss detection unit, and the return loss detection unit is used for detecting the real-time return loss of the variable capacitance inductance unit when the matching impedance is adjusted; the variable capacitance inductance unit adjusts the matching impedance according to the real-time return loss.
2. The board-level radio frequency signal testing system without a radio frequency test socket according to claim 1, wherein when the return loss detection unit detects the real-time return loss, when the real-time return loss is smaller than a first threshold, the variable capacitance inductance unit stops adjusting the matching impedance, and calibrates the current matching impedance to a target matching impedance, and the target matching impedance matches with an impedance of a radio frequency circuit.
3. A board-level radio frequency signal testing method without a radio frequency test socket, which is implemented based on the board-level radio frequency signal testing system without the radio frequency test socket of any one of claims 1-2, and comprises the following steps:
s1, connecting a tail end connecting wire of the radio frequency test probe with the tuning module, wherein the tuning module is electrically connected with the test instrument module;
s2, electrically connecting the head end probe of the radio frequency test probe with an antenna elastic sheet of a radio frequency circuit on the PCB;
s3, adjusting the matching impedance through the tuning module to match the matching impedance with the impedance of the radio frequency circuit;
s4, when the matching impedance is adjusted to match with the impedance of the radio frequency circuit, testing the radio frequency signal of the radio frequency chip;
when the matching impedance is adjusted, adjusting the matching impedance through a variable capacitance inductance unit in the tuning module; detecting real-time return loss of the variable capacitance inductance unit when the matching impedance is adjusted through a return loss detection unit in the tuning module;
when the matching impedance size is determined by the variable capacitance inductance unit, judging whether the matching impedance is proper or not by the following steps:
s31, sending a first electric signal by using a test instrument, wherein the first electric signal is received by a radio frequency chip of a radio frequency circuit, and observing the return loss detected by the return loss detection unit; and deriving the insertion loss of the current signal path; when the return loss is smaller than a first threshold value and the insertion loss is smaller than a second threshold value, the matching impedance is matched with the impedance of the radio frequency circuit;
s32, a radio frequency circuit is used for emitting a second electric signal, the second electric signal is received by the test instrument module, the test instrument module displays the size of the corresponding actually received electric signal and marks the actually received electric signal as a third electric signal, and the insertion loss under the signal path is obtained through the second electric signal and the third electric signal;
and S33, verifying the mobility of the insertion loss in the step S32, and stopping adjusting the matching impedance if the mobility meets the standard.
4. The method of claim 3, wherein in S2, the RF test probe is fixedly connected to the antenna dome by a fixing clamp.
5. A board-level radio frequency signal testing device without a radio frequency test socket, comprising a board-level radio frequency signal testing system without a radio frequency test socket according to any one of claims 1-2.
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| CN113267716B (en) * | 2021-05-10 | 2024-02-23 | 维沃移动通信有限公司 | Radio frequency test seat, radio frequency circuit and electronic equipment |
| CN113395123B (en) * | 2021-06-23 | 2023-05-12 | 杭州涂鸦信息技术有限公司 | Test frame for testing radio frequency performance of module and radio frequency performance test system |
| CN113640612A (en) * | 2021-10-15 | 2021-11-12 | 深圳荣耀智能机器有限公司 | Antenna test system, veneer to be tested and related equipment thereof |
| CN114217101B (en) * | 2021-10-30 | 2023-06-13 | 荣耀终端有限公司 | Radio frequency test probe structure and radio frequency test system |
| CN114839509B (en) * | 2022-04-29 | 2023-09-19 | 西安闻泰信息技术有限公司 | Radio frequency test system and radio frequency test method |
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| CN100511172C (en) * | 2006-05-08 | 2009-07-08 | 中兴通讯股份有限公司 | Inter-board transparent transmission bus test device and method thereof |
| CN201207715Y (en) * | 2008-03-07 | 2009-03-11 | 鸿富锦精密工业（深圳）有限公司 | RF test system and RF test circuit thereof |
| CN102236069B (en) * | 2010-04-27 | 2014-01-08 | 中芯国际集成电路制造(上海)有限公司 | Test system and test method |
| CN201699689U (en) * | 2010-06-22 | 2011-01-05 | 华为终端有限公司 | Radio-frequency circuit, radio-frequency test interface device and radio-frequency test system |
| US9432064B2 (en) * | 2014-02-11 | 2016-08-30 | Introbotics Corporation | System and method for automated loss testing |
| CN107368654A (en) * | 2017-07-21 | 2017-11-21 | 东南大学 | A kind of twisted-pair feeder equivalent circuit and its analogy method |
| WO2019033268A1 (en) * | 2017-08-15 | 2019-02-21 | 罗森伯格技术（昆山）有限公司 | Adjustable electromagnetic hybrid coupling filter |
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2020
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