CN111351949A - Sample testing method, sample analyzer and storage medium - Google Patents
Sample testing method, sample analyzer and storage medium Download PDFInfo
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- CN111351949A CN111351949A CN201811583856.0A CN201811583856A CN111351949A CN 111351949 A CN111351949 A CN 111351949A CN 201811583856 A CN201811583856 A CN 201811583856A CN 111351949 A CN111351949 A CN 111351949A
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- 238000012360 testing method Methods 0.000 title claims abstract description 412
- 238000003860 storage Methods 0.000 title claims abstract description 21
- 238000002360 preparation method Methods 0.000 claims abstract description 97
- 238000004140 cleaning Methods 0.000 claims description 67
- 238000000034 method Methods 0.000 claims description 47
- 239000007788 liquid Substances 0.000 claims description 46
- 239000012530 fluid Substances 0.000 claims description 7
- 230000003203 everyday effect Effects 0.000 description 9
- 238000010586 diagram Methods 0.000 description 7
- 239000003153 chemical reaction reagent Substances 0.000 description 3
- 230000008878 coupling Effects 0.000 description 3
- 238000010168 coupling process Methods 0.000 description 3
- 238000005859 coupling reaction Methods 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 108010074051 C-Reactive Protein Proteins 0.000 description 2
- 102100032752 C-reactive protein Human genes 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 239000000047 product Substances 0.000 description 2
- 238000006467 substitution reaction Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000002354 daily effect Effects 0.000 description 1
- 239000012502 diagnostic product Substances 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 230000036252 glycation Effects 0.000 description 1
- 238000000338 in vitro Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000010926 purge Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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Abstract
The embodiment of the application discloses a sample testing method, a sample analyzer and a storage medium, comprising the following steps: acquiring the current time and the current state of the sample analyzer; if the current moment is within a preset test time period and the current state indicates that the sample analyzer is in a state without a test task, controlling the sample analyzer to enter a test preparation state; after receiving a sample test instruction, the sample analyzer in the test preparation state directly tests a sample applying for testing; after receiving the sample test instruction, the sample analyzer in the idle state firstly executes the preparation flow before the sample test and then tests the sample applying the test.
Description
Technical Field
The present application relates to the medical and testing arts, and relates to, but is not limited to, a sample testing method, a sample analyzer, and a storage medium.
Background
Each sample analyzer in the sample analyzer pipeline automatically enters an idle state after analyzing a sample batch. If the operator then initiates the next sample batch, the instrument again performs a batch of pre-test procedures before the sample analysis can be initiated. For the operator, the time for receiving the test result of the second sample batch is the preparation time before the test plus the time for analyzing the sample; in view of this phenomenon, the related art has a little improved scheme in this respect, that is, an operator can set a time which is the shortest time from when the operator starts a sample batch to when the instrument enters the idle state, but after the sample analysis is completed, the instrument needs to wait until the time set by the operator arrives and then enter the idle state, and if the next sample batch arrives within the time, since the instrument does not enter the idle state, the pre-test preparation is not required to be performed, and the sample analysis is directly started. However, in this scenario, after the last sample batch of the operator is taken out every day, the instrument still waits until the time is up and then enters idle, which may cause the operator to go back to work (e.g., load reagents, consumables, routine maintenance, etc.) every day.
Disclosure of Invention
In view of the above, embodiments of the present application provide a sample testing method, a sample analyzer and a storage medium to solve at least one problem in the related art.
The technical scheme of the embodiment of the application is realized as follows:
in a first aspect, an embodiment of the present application provides a sample testing method applied to a sample analyzer, including:
acquiring the current time and the current state of the sample analyzer;
if the current moment is within a preset test time period and the current state indicates that the sample analyzer is in a state without a test task, controlling the sample analyzer to enter a test preparation state; after receiving a sample test instruction, the sample analyzer in the test preparation state directly tests a sample applying for testing; after receiving the sample test instruction, the sample analyzer in the idle state firstly executes the preparation flow before the sample test and then tests the sample applying the test.
In a second aspect, embodiments of the present application provide a sample analyzer, the sample analyzer includes a memory and a processor, the memory has stored thereon computer-executable instructions, and the processor, when executing the computer-executable instructions on the memory, can implement:
acquiring the current time and the current state of the sample analyzer;
if the current moment is within a preset test time period and the current state indicates that the sample analyzer is in a state without a test task, controlling the sample analyzer to enter a test preparation state; after receiving a sample test instruction, the sample analyzer in the test preparation state directly tests a sample applying for testing; after receiving the sample test instruction, the sample analyzer in the idle state firstly executes the preparation flow before the sample test and then tests the sample applying the test.
In a third aspect, an embodiment of the present application provides a storage medium, in which a program is stored, and the program, when executed by a processor, implements the steps of the sample testing method as described above.
The embodiment of the application provides a sample testing method, a sample analyzer and a storage medium, and the method comprises the steps of obtaining the current time and the current state of the sample analyzer; if the current moment is within a preset test time period and the current state indicates that the sample analyzer is in a state without a test task, controlling the sample analyzer to enter a test preparation state; after receiving a sample test instruction, the sample analyzer in the test preparation state directly tests a sample applying for testing; after the sample analyzer in the idle state receives the sample test instruction, the preparation process before the sample test is executed, and then the sample applying the test is tested, so that the sample analyzer is controlled to be in the test preparation state in the preset time period, and the sample analyzer is prevented from frequently entering the idle state, thereby greatly reducing the time of test preparation (such as the time for cleaning a liquid path), and saving a large amount of waiting time for operators operating the equipment.
Drawings
FIG. 1 is a schematic diagram of a sample analyzer pipeline according to an embodiment of the present disclosure;
FIG. 2 is a schematic view of the operating state of a sample analyzer over time in the related art;
FIG. 3 is another schematic view of the operating state of a sample analyzer over time in the related art;
FIG. 4A is a schematic flow chart illustrating an implementation of a sample testing method according to an embodiment of the present disclosure;
FIG. 4B is a schematic flow chart illustrating another implementation of the sample testing method according to the embodiment of the present disclosure;
FIG. 4C is a schematic flow chart illustrating another implementation of the sample testing method according to the embodiment of the present disclosure;
FIG. 4D is a schematic flow chart illustrating another implementation of the sample testing method according to the embodiment of the present disclosure;
FIG. 4E is a schematic flow chart illustrating another implementation of the sample testing method according to the embodiment of the present disclosure;
FIG. 4F is a schematic flow chart illustrating another implementation of the sample testing method according to the embodiment of the present disclosure;
FIG. 5 is a schematic flow chart illustrating an implementation of a sample testing method according to an embodiment of the present disclosure;
FIG. 6 is a schematic diagram of the operation of a sample analyzer over time according to an embodiment of the present application;
fig. 7 is a schematic diagram of the composition of a sample analyzer according to an embodiment of the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application.
For better understanding of the embodiments of the present invention, the flow of sample analysis in the related art will be described first.
Fig. 1 is a schematic structural diagram of a sample analyzer pipeline according to an embodiment of the present application, and as shown in fig. 1, the sample analyzer pipeline at least includes: an unloading platform 101, a sample analyzer 1, a sample analyzer 2, · · · a sample analyzer n, a host machine 102, and a loading platform 103; as shown in fig. 1, the sample analyzers 1 to n, in turn, are transported from the loading platform 103 to the unloading platform 101, and finally unloaded on the unloading platform 101. The host computer 104 is used for receiving test results fed back after the sample analyzers 1 to n analyze the samples in the sample tube racks; wherein each sample analyzer also comprises a processor which can be independently controlled to carry out the test and the like. Before each sample analyzer is tested, it is generally necessary to doPreparation before testing, including mechanical reset, liquid path cleaning and the like; the liquid path cleaning comprises pipeline cleaning, and cleaning of a sample needle, a reagent needle and the like. This pre-test preparation process takes a significant amount of time, and in the related art, each sample analyzer automatically goes into an idle state after analyzing a sample batch. If the operator wants to start the next sample batch at this time, the sample analyzer needs to perform a batch pre-test process, and then the sample analysis can be started. For the operator, the time of receipt of the test result of the second sample lot is the pre-test preparation time + the time of sample analysis, as shown in FIG. 2, after the sample analyzer is started, at t0At the time of applying for the test of the sample 20, the sample 20 is first subjected to a pre-test preparation process (the time required for the pre-test preparation process is (t)1-t0) And after the pre-test preparation process is completed, sample analysis is performed on the sample 20, the time required for performing the sample analysis being (t)2-t1) Then the time that the test result 201 corresponding to the test sample 20 is reported to the operator is the time of preparation before the test plus the time of sample analysis (i.e., (t)2-t0) ); the next sample batch sample 21 is at t3When applying for testing at the moment, the process of preparation before testing is also needed (the moment of completing the preparation flow before testing is t)4) After the pre-test preparation flow is completed, the sample 21 is subjected to sample analysis, and the time required for the sample analysis is (t)5-t4) Then the time that the test result 211 corresponding to the test sample 21 is reported to the operator is the time of preparation before the test plus the time of sample analysis (i.e., (t)5-t3)). In view of this phenomenon, in another related art, the operator may set a time, which is the shortest time from the time when the operator starts a sample batch to the time when the instrument enters the idle state, fig. 3 is another schematic diagram of the change of the working state of the sample analyzer with time in the related art, as shown in fig. 3, after the sample analyzer is started, the sample 30 is applied for a test at time t0, and then the preparation flow before the test is performed on the sample 30 first (the preparation flow before the test is performed)The time consumed by the preparation process is (t1-t0)), and after the preparation process is completed before the test, the sample analysis is performed on the sample 30, and the time required for the sample analysis is (t2-t1), so that the time for reporting the test result 301 corresponding to the test sample 30 to the operator is the time for the preparation process before the test plus the time for the sample analysis (i.e., (t2-t 0)); if the time reported to the operator by the test result 301 is less than the preset time 302 set by the operator, when the time reaches the preset time 302, the sample analyzer enters an idle state; if the time for testing the samples 31 in the second sample batch exceeds the predetermined time 302, the sample analyzer is prepared before testing, i.e. the time for reporting the test result 311 corresponding to the test sample 31 to the operator is the time for preparing before testing plus the time for analyzing the sample, which still consumes a lot of time.
In order to solve the above problem, an embodiment of the present application provides a sample testing method applied to a sample analyzer, and fig. 4A is a schematic flow chart of the sample testing method implemented in the embodiment of the present application, as shown in fig. 4A, the method includes the following steps:
step S401, the current time and the current state of the sample analyzer are acquired.
Here, the sample analyzer may be any of hematology analyzers or in vitro diagnostic products, such as a push slide, a C Reactive Protein (CRP) detector, a glycation analyzer, a hematology analyzer, a slide reader, or the like, and one or more sample analyzers may be provided for each type in the flow line. When the sample is detected by the sample analysis system, part of detection items of the sample can be detected by part of the sample analyzers, and all the detection items of the sample can be detected by all the sample analyzers. The current state may be an untested state in which the sample analyzer is not tasked with testing, a test state in which the sample analyzer is in, or a pre-test ready state in which the sample analyzer is in; the untested state of the sample analyzer includes a test ready state, which is a state in which the sample analyzer has no test task but can start testing at any time.
Step S402, if the current time is in a preset test time period and the current state indicates that the sample analyzer is in a state without a test task, controlling the sample analyzer to enter a test preparation state.
Here, the sample analyzer is in a state without a test task, and it can be understood that no sample is being tested in the sample analyzer, and no sample is applied for testing; the preset test time period can be set by an operator according to the sample amount to be measured on the same day, for example, the time for testing the first sample is nine am, the time for testing the last batch of samples is five pm, the preset test time period is set to nine pm to five pm, that is, the preparation process before the test (for example, mechanical reset, liquid path cleaning and the like) is required when only the first sample is tested, and when the second sample is tested, the second sample is directly tested without spending a large amount of time for the preparation before the test. In this embodiment, within the preset testing time period, the sample analyzer has two states, one is a testing state for testing the sample, and the other is a preparation state for not testing the sample, and the testing process is started after receiving the testing instruction in the preparation state. When the current moment of the sample analyzer is within a preset test time period, the default state of the sample analyzer when the sample analyzer does not perform sample test is a test preparation state, if a test task exists, the sample analyzer is switched to the test state, and after the test is finished, the sample analyzer is switched back to the test preparation state.
Step S403, after the sample analyzer in the test preparation state receives the sample test instruction, directly testing the sample to be tested.
Here, if the sample analyzer is in a test ready state, that is, the current time after the sample analyzer completes the test of one lot of samples is within a preset test period, the test is directly performed on the sample for which the test is applied.
Step S404, after the sample analyzer in the idle state receives the sample test instruction, the sample analyzer firstly executes the preparation process before the sample test and then tests the sample to be tested.
Here, if the sample analyzer is in an idle state, that is, the current time after the sample analyzer completes the test of a batch of samples is not within the preset test time period, the sample applied for the test is subjected to a preparation flow before the test, that is, mechanical reset, liquid path cleaning, and the like, and after the preparation flow before the test is completed, the sample applied for the test is tested.
In this embodiment, the sample analyzer is controlled to be in a test preparation state within a preset time period, and frequent entering into an idle state is avoided, so that the time for test preparation (for example, liquid path cleaning) is reduced, and further, a great amount of waiting time is saved for an operator operating the device.
An embodiment of the present application provides a sample testing method, and fig. 4B is a schematic flow chart of another implementation of the sample testing method in the embodiment of the present application, and as shown in fig. 4B, the method includes the following steps:
step S421, the current time and the current state of the sample analyzer are obtained.
The sample analyzer comprises two working modes, namely a first mode and a second mode, and the sample analyzer is controlled to enter the working mode corresponding to the mode selection instruction according to the mode selection instruction input by an operator; and the cleaning frequency of the liquid path corresponding to the sample analyzer in the first mode is lower than that of the liquid path corresponding to the sample analyzer in the second mode. That is, the operator can independently select the working mode of the sample analyzer, and when the operator wants to perform a rapid test, the operator can select the first mode with a small number of times of cleaning the liquid path; for example, when the current time of the sample analyzer provided by the embodiment of the present application is within the preset test period, the preparation process before the test is performed on the sample to be tested is not required. When the operator has enough time to perform the test, the second mode in which the liquid path cleaning test is normal can be selected, that is, the preset test time period is not set (or a short preset test time period is set), and a preparation flow before the test needs to be performed before each test of the sample.
Step S422, if the current time is within a preset test time period and the current state indicates that the sample analyzer is in a state without a test task, controlling the sample analyzer to enter a test preparation state.
Here, if the current time is within the preset test period and the current state indicates that the sample analyzer is performing the sample test, the sample analyzer is controlled to enter the test preparation state when the sample test is completed.
Step S423, after receiving the sample test instruction, the sample analyzer in the test preparation state switches to the test state to test the sample applying for testing.
Here, when the sample analyzer is in the pre-test ready state, if a sample test instruction is received, that is, if there is a sample for which a test is applied, the sample analyzer switches from the pre-test ready state to the non-test state, and tests the sample for which a test is applied.
Step S424, when the current test of the sample analyzer is completed and the current time is within the preset test time period, controlling the sample analyzer to switch to the test preparation state.
Here, after the sample analyzer finishes testing the sample to which the test is applied, and the current time is still within the preset test time period, when the current test of the sample analyzer is finished, the sample analyzer is switched to a test preparation state.
In the above-mentioned step S423 and step S424, a mode of "the sample analyzer in the test preparation state tests the sample to be tested" is provided, in this mode, after the sample analyzer in the test preparation state receives the sample test instruction, the sample analyzer is directly switched to the test state, and a preparation flow before testing is not required, so that the testing time is saved, and the waiting time is saved for the operator.
An embodiment of the present application provides a sample testing method, and fig. 4C is a schematic flowchart illustrating another implementation flow of the sample testing method according to the embodiment of the present application, and as shown in fig. 4C, the method includes the following steps:
step S431, obtaining a time when the sample analyzer first enters the test state in each preset time period of the I preset time periods, to obtain a first time set including the I time.
Here, I is an integer of 1 or more. The I preset time periods may be I days, e.g., seven days; each preset time period may refer to every day; the step S431 may be understood as obtaining a time when the sample analyzer first enters the test state every day within seven days, for example, the time when the sample analyzer first enters the test state every day is nine times, but a preparation process before the test is performed every day before the test is performed for the first time; to allow the test to be directly performed for the sample for the next application test, nine points per day may be set as the start time of the preset test period.
Step S432, obtaining a time when the sample analyzer finally exits from the test state in each preset time period of I preset time periods, to obtain a second time set including I times.
Here, if the time of the last exit from the test state every day is five pm, four and a half may be taken as the end time of the preset test period.
Step S433, determining the preset test time period according to the first time set and the second time set.
In the method, the time when the sample enters the test state for the first time and the time when the sample exits from the test state for the last time in each preset time period are fully considered, so that the preset test time period is determined according to the sample test amount and the sample test time, the sample analyzer is prevented from frequently entering the idle state, and the time required by the flow of the preparation before the test of the sample applying for the test in the preset test time period is saved.
Step S434, the current time and the current state of the sample analyzer are acquired.
Step S435, if the current time is within a preset test time period and the current state indicates that the sample analyzer is in a state without a test task, controlling the sample analyzer to enter a test preparation state.
In the embodiment, the preset test time period is determined by fully considering the sample amount to be tested and the starting time and the ending time of the test sample, so that the sample analyzer in the preset test time period is ensured, and a preparation flow before testing is not required to be carried out each time when the sample is tested, thereby saving the test time.
An embodiment of the present application provides a sample testing method, and fig. 4D is a schematic flowchart illustrating a further implementation process of the sample testing method according to the embodiment of the present application, and as shown in fig. 4D, the method includes the following steps:
step 441, the current time and current state of the sample analyzer are obtained.
Step 442, if the current time is not within the preset test time period and the current state of the sample analyzer is the test state, obtaining the time when the test of the sample analyzer is completed.
Here, if the current time of the sample analyzer is not within the preset test period, for example, the preset test period is nine am to four pm, and if the current time is half pm and the sample analyzer is still in the test state, the time at which the sample test is completed is determined.
Step 443, updating the preset test time period according to the time when the test of the sample analyzer is completed, and controlling the sample analyzer to enter the idle state.
Here, for example, if the sample test of the last batch of five o 'clock is completed, the end time of the preset test period is updated to five o' clock, and the sample analyzer is controlled to enter the idle state.
The above steps S442 and S443 provide a way to update the preset test time period, in which the preset test time period is updated in real time according to the test completion time of the sample analyzer, so as to ensure that the sample analyzer does not frequently enter an idle state, and save the sample test time.
An embodiment of the present application provides a sample testing method, and fig. 4E is a schematic flow chart of another implementation of the sample testing method in the embodiment of the present application, and as shown in fig. 4E, the method includes the following steps:
in step S451, the input setting information for setting the preset test period is received.
Here, the operator can set the preset test period autonomously through the operation interface of the sample analyzer according to the needs of the operator.
Step S452, determining the preset test time period according to the setting information.
In step S453, the current time and the current state of the sample analyzer are acquired.
Step S454, if the current time is not within the preset test time period and the sample analyzer does not currently have a test task, controlling the sample analyzer to enter an idle state.
Here, if the current time of the sample analyzer is not within the preset test period and there is no sample currently applying for testing, the sample analyzer enters an idle state.
In step S455, when the sample analyzer is switched from the idle state to the test state, the preparation process before the sample test is performed.
Here, after the sample analyzer in the idle state receives a test request of a sample to be tested, the length of time that the sample analyzer is in the idle state is first determined, and if the time that the sample analyzer is in the idle state is less than a preset idle period, when the sample analyzer is switched from the idle state to the test state, the sample analyzer is not subjected to fluid path cleaning. However, if the sample analyzer is in the idle state for a time longer than a preset idle period, the liquid path cleaning is performed on the sample analyzer in a first cleaning manner (i.e., a weak cleaning manner) when the sample analyzer is switched from the idle state to the test state.
In this embodiment, the preset test time period is set by the operator according to the needs of the operator, so that the sample analyzer does not need a preparation process before testing for a sample to be tested at a suitable time period according to the needs of the operator.
An embodiment of the present application provides a sample testing method, and fig. 4F is a schematic flow chart illustrating another implementation of the sample testing method according to the embodiment of the present application, and as shown in fig. 4F, the method includes the following steps:
in step S461, the current time and the current state of the sample analyzer are obtained.
Step S462, if the current time is within a preset test time period and the current state indicates that the sample analyzer is in a state without a test task, controlling the sample analyzer to enter a test preparation state.
Step S463, if the sample analyzer does not perform the liquid path cleaning for more than a preset cleaning time within the preset test time period, performing the liquid path cleaning on the sample analyzer when the sample analyzer is in a test preparation state or before the sample analyzer enters a test state.
Here, if the sample analyzer is in the preset test period for a long time and no pre-test preparation flow is performed for a sample to be tested, in order to avoid the liquid path blockage, the liquid path cleaning is performed on the sample analyzer when the sample analyzer is in the test preparation state or before the sample analyzer enters the test state. Or if the time that the sample analyzer is in the test preparation state is longer than the preset test preparation time period, performing liquid path cleaning on the sample analyzer according to a second cleaning mode. And the cleaning time of the second cleaning mode is shorter than that of the first cleaning mode. That is, if the sample analyzer has not performed the preparatory process before the test for a long time (for example, has not performed the liquid path cleaning for a long time), the liquid path cleaning is performed in a weak cleaning manner (i.e., the second cleaning manner).
In this embodiment, through detecting the time that the sample analyzer did not carry out the liquid path cleaning, in order to avoid not carrying out the liquid path jam that the liquid path cleaning caused for a long time, so when the time that the sample analyzer did not carry out the liquid path cleaning exceeded preset test preparation period, carried out weak washing to the liquid path, both can save the cleaning time and can guarantee that the liquid path is not blockked up.
An embodiment of the present application provides a sample testing method, fig. 5 is a schematic flow chart of an implementation of the sample testing method in the embodiment of the present application, and as shown in fig. 5, the method includes the following steps:
step S501, receiving input setting information for setting the preset test time period.
Step S502, according to the setting information, determining the preset test time interval.
Step S503, the current time and the current state of the sample analyzer are acquired.
Step S504, if the current time is within a preset test time period and the current state indicates that the sample analyzer is in a state without a test task, the sample analyzer is controlled to enter a test preparation state.
If the current time is not within the preset test time period and the current state of the sample analyzer is the test state, acquiring the test completion time of the sample analyzer; and updating the preset test time period according to the test completion time of the sample analyzer, and controlling the sample analyzer to enter an idle state. And if the time that the sample analyzer is in the idle state is less than the preset idle time period, when the sample analyzer is switched to the test state from the idle state, the sample analyzer is not subjected to liquid path cleaning. However, if the time that the sample analyzer is in the idle state is longer than the preset idle period, when the sample analyzer is switched from the idle state to the test state, the liquid path cleaning is performed on the sample analyzer in the first cleaning manner.
Step S505, if the sample analyzer does not perform liquid path cleaning for more than a preset cleaning time within the preset test time period, performing liquid path cleaning on the sample analyzer when the sample analyzer is in a test preparation state or before the sample analyzer enters a test state.
In this embodiment, the preset test time interval is set according to the needs of the operator, and when the sample analyzer does not perform the preparation flow before the test for a long time, the liquid path is cleaned, so that the test time can be saved, and the liquid path can be ensured not to be blocked.
In the related art, as shown in FIG. 3, after the sample analysis is completed, the instrument needs to be operatedWaiting until the time point set by the operator arrives, and then entering the idle state, if the next sample batch arrives within the time, because the idle state is not entered, the preparation before the test is not required to be executed, and the sample analysis is directly started. However, after the last sample batch of the operator is taken out every day, the instrument still waits until the time is up and then enters the idle state, and therefore the work (such as reagent loading, consumable material loading, daily maintenance and the like) of the operator every day during the off-duty period can be pushed back. Without solving the problem, an embodiment of the present application provides a sample testing method, fig. 6 is a schematic diagram of the working state of the sample analyzer of the embodiment of the present application changing with time, and as shown in fig. 6, an operator sets a fixed time point as a preset testing period according to the sample amount of each day (for example, if the time for completing the test of the last batch of samples of each day is 16:00, in order to avoid suddenly increasing the sample batch, a waiting time of ten minutes is reserved, that is, 16:10 can be set as the time for entering the idle state (i.e., the end time 60 of the preset testing period)). Upon start-up of the sample analyzer, at t for a first batch of samples 6010When a test is performed at any time, a preparatory flow before the test is required (the preparatory flow before the test takes time t1-t0) And after the preparation flow before the test is completed, sample analysis is performed on the sample 601, and the time required for performing the sample analysis is (t)2-t1) Then the time that the test result 602 corresponding to the test sample 601 is reported to the operator is the time of preparation before the test plus the time of sample analysis (i.e., (t)2-t0) ); if the time point t is2The idle state cannot be entered before the idle entering time set by the operator (namely the time point is within the preset test time period), and the idle state cannot be entered until the idle entering time is reached; then when at t3When the second batch of samples 603 is applied for testing, the sample analyzer directly tests the samples without a preparation process before testing, if at t4The time for testing the sample 603 is completed, i.e. the time required for analyzing the sample 603 is (t)4-t2) Then, thenThe time when the test result 604 corresponding to the test sample 603 is reported to the operator is the time t4. That is, the samples of the subsequent batches do not need to be prepared before the test, except for the samples of the first batch, so that the time from the arrival of the samples in the clinical laboratory to the analysis of the samples to the result is greatly shortened.
In other embodiments, an option may be added when starting each batch of samples, that is, an operator may set a time point for entering idle by himself; or after starting each batch of samples, the sample analyzer does not enter the idle state until an operator actively clicks a button to enable the sample analyzer to enter the idle state.
An embodiment of the present application provides a sample analyzer, fig. 7 is a schematic composition diagram of the sample analyzer in the embodiment of the present application, and as shown in fig. 7, the sample analyzer 700 includes a processor 701 and a memory 702, where the memory 702 stores computer-executable instructions, and when the processor 701 runs the computer-executable instructions on the memory, the implementation: acquiring the current time and the current state of the sample analyzer; if the current moment is within a preset test time period and the current state indicates that the sample analyzer is in a state without a test task, controlling the sample analyzer to enter a test preparation state; after receiving a sample test instruction, the sample analyzer in the test preparation state directly tests a sample applying for testing; after receiving the sample test instruction, the sample analyzer in the idle state firstly executes the preparation flow before the sample test and then tests the sample applying the test.
In other embodiments, the sample analyzer 700 further comprises a display module 703 for displaying a working mode display interface, the working mode display interface providing options of a first mode and a second mode, and the controller further controls the sample analyzer to enter the first mode or the second mode according to the selected working mode; the cleaning frequency of the fluid path corresponding to the sample analyzer in the first mode is lower than the cleaning frequency of the fluid path corresponding to the sample analyzer in the second mode.
In other embodiments, the sample analyzer 700 further comprises a sample analysis module 704 for testing a sample and outputting test data to the display module 703 for display.
In other embodiments, the pre-sample-testing preparation flow includes at least one of: cleaning the liquid path, mechanically resetting, or resetting the liquid path.
In other embodiments, the processor 701 is configured to switch to a test state after the sample analyzer in the test preparation state receives the sample test instruction, so as to test a sample applying for testing;
and when the current test of the sample analyzer is finished and the current moment is within a preset test time period, controlling the sample analyzer to be switched to a test preparation state.
In other embodiments, the processor 701 is further configured to obtain a time when the sample analyzer enters the test state for the first time in each of I preset time periods, so as to obtain a first time set including I times; wherein I is an integer greater than or equal to 1; acquiring the moment when the sample analyzer exits the test state for the last time in each preset time period in I preset time periods to obtain a second moment set containing I moments; and determining the preset test time period according to the first time set and the second time set.
In other embodiments, the processor 701 is further configured to, if the current time is not within a preset test time period and the current state of the sample analyzer is a test state, obtain a time when the test of the sample analyzer is completed;
and updating the preset test time period according to the test completion time of the sample analyzer, and controlling the sample analyzer to enter the idle state.
In other embodiments, the processor 701 is further configured to receive input setting information for setting the preset test period;
and determining the preset test time interval according to the setting information.
In other embodiments, the processor 701 is further configured to control the sample analyzer to enter an idle state if the current time is not within a preset test period and the sample analyzer does not currently have a test task.
In other embodiments, the processor 701 is further configured to execute a preparation procedure before the sample test when the sample analyzer switches from the idle state to a test state.
In other embodiments, the processor 701 is further configured to perform a fluid path cleaning on the sample analyzer when the sample analyzer is in a test preparation state or before the sample analyzer enters a test state if the sample analyzer does not perform the fluid path cleaning for more than a preset cleaning time period within the preset test time period.
In other embodiments, the processor 701 is further configured to not perform a liquid path purge on the sample analyzer when the sample analyzer is switched from the idle state to a test state if the time that the sample analyzer is in the idle state is less than a preset idle period; or
If the time that the sample analyzer is in the idle state is longer than the preset idle time period, when the sample analyzer is switched from the idle state to the test state, performing liquid path cleaning on the sample analyzer according to a first cleaning mode; or
If the time of the sample analyzer in the test preparation state is longer than the preset test preparation time period, performing liquid path cleaning on the sample analyzer according to a second cleaning mode; and the cleaning time of the second cleaning mode is shorter than that of the first cleaning mode.
In other embodiments, the processor 701 is further configured to control the sample analyzer to enter a working mode corresponding to a mode selection instruction according to the mode selection instruction input by an operator; and the cleaning frequency of the liquid path corresponding to the sample analyzer in the first mode is lower than that of the liquid path corresponding to the sample analyzer in the second mode.
It should be noted that, if the determination method of the substance concentration is implemented in the form of a software functional module and sold or used as a separate product, it may also be stored in a computer readable storage medium. Based on such understanding, the technical solutions of the embodiments of the present invention may be essentially implemented or a part contributing to the prior art may be embodied in the form of a software product, which is stored in a storage medium and includes several instructions for causing a computer device (which may be a personal computer or a server) to execute all or part of the methods described in the embodiments of the present invention. And the aforementioned storage medium includes: various media capable of storing program codes, such as a usb disk, a removable hard disk, a Read Only Memory (ROM), a magnetic disk, or an optical disk. Thus, embodiments of the invention are not limited to any specific combination of hardware and software.
Accordingly, an embodiment of the present invention further provides a computer storage medium, on which computer-executable instructions are stored, and when the computer-executable instructions are executed by a processor, the steps of the sample testing method provided by the above embodiment are implemented.
The above description of the sample analysis system and computer storage medium embodiments is similar to the description of the method embodiments above, with similar beneficial results as the method embodiments. For technical details not disclosed in embodiments of the sample analysis system and computer storage medium of the present invention, reference is made to the description of embodiments of the method of the present invention for understanding. It should be appreciated that reference throughout this specification to "one embodiment" or "an embodiment" means that a particular feature, structure or characteristic described in connection with the embodiment is included in at least one embodiment of the present application. Thus, the appearances of the phrases "in one embodiment" or "in an embodiment" in various places throughout this specification are not necessarily all referring to the same embodiment. Furthermore, the particular features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. It should be understood that, in the various embodiments of the present application, the sequence numbers of the above-mentioned processes do not mean the execution sequence, and the execution sequence of each process should be determined by its function and inherent logic, and should not constitute any limitation to the implementation process of the embodiments of the present application. The above-mentioned serial numbers of the embodiments of the present application are merely for description and do not represent the merits of the embodiments. It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
In the several embodiments provided in the present application, it should be understood that the disclosed apparatus and method may be implemented in other ways. The above-described device embodiments are merely illustrative, for example, the division of the unit is only a logical functional division, and there may be other division ways in actual implementation, such as: multiple units or components may be combined, or may be integrated into another system, or some features may be omitted, or not implemented. In addition, the coupling, direct coupling or communication connection between the components shown or discussed may be through some interfaces, and the indirect coupling or communication connection between the devices or units may be electrical, mechanical or other forms.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units; can be located in one place or distributed on a plurality of network units; some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiments of the present application.
In addition, all functional units in the embodiments of the present application may be integrated into one processing unit, or each unit may be separately regarded as one unit, or two or more units may be integrated into one unit; the integrated unit can be realized in a form of hardware, or in a form of hardware plus a software functional unit.
Those of ordinary skill in the art will understand that: all or part of the steps for realizing the method embodiments can be completed by hardware related to program instructions, the program can be stored in a computer readable storage medium, and the program executes the steps comprising the method embodiments when executed; and the aforementioned storage medium includes: various media that can store program codes, such as a removable Memory device, a Read Only Memory (ROM), a magnetic disk, or an optical disk.
Alternatively, the integrated units described above in the present application may be stored in a computer-readable storage medium if they are implemented in the form of software functional modules and sold or used as independent products. Based on such understanding, the technical solutions of the embodiments of the present application may be embodied in the form of a software product, which is stored in a storage medium and includes several instructions for causing a terminal to execute all or part of the methods described in the embodiments of the present application. And the aforementioned storage medium includes: a removable storage device, a ROM, a magnetic or optical disk, or other various media that can store program code.
The above description is only for the embodiments of the present application, but the scope of the present application is not limited thereto, and any person skilled in the art can easily conceive of changes or substitutions within the technical scope of the present application, and all such changes or substitutions should be covered by the present application.
Claims (15)
1. A sample testing method is applied to a sample analyzer and is characterized by comprising the following steps:
acquiring the current time and the current state of the sample analyzer;
if the current moment is within a preset test time period and the current state indicates that the sample analyzer is in a state without a test task, controlling the sample analyzer to enter a test preparation state;
after receiving a sample test instruction, the sample analyzer in the test preparation state directly tests a sample applying for testing; after receiving the sample test instruction, the sample analyzer in the idle state firstly executes the preparation flow before the sample test and then tests the sample applying the test.
2. The method of claim 1, wherein the pre-sample testing preparation process comprises at least one of: cleaning the liquid path, mechanically resetting, or resetting the liquid path.
3. The method of claim 1, further comprising:
after receiving a sample test instruction, the sample analyzer in the test preparation state is switched to the test state to test a sample applying for testing;
and when the current test of the sample analyzer is finished and the current moment is within a preset test time period, controlling the sample analyzer to be switched to a test preparation state.
4. The method of claim 1, wherein prior to the obtaining a current time and a current state of the sample analyzer, the method further comprises:
acquiring the moment when the sample analyzer firstly enters a test state in each preset time period in I preset time periods to obtain a first time set containing I moments; wherein I is an integer greater than or equal to 1;
acquiring the moment when the sample analyzer exits the test state for the last time in each preset time period in I preset time periods to obtain a second moment set containing I moments;
and determining the preset test time period according to the first time set and the second time set.
5. The method of claim 4, further comprising:
if the current time is not within a preset test time period and the current state of the sample analyzer is a test state, acquiring the time when the test of the sample analyzer is finished;
and updating the preset test time period according to the test completion time of the sample analyzer, and controlling the sample analyzer to enter the idle state.
6. The method of claim 1, wherein prior to the obtaining a current time and a current state of the sample analyzer, the method further comprises:
receiving input setting information for setting the preset test time period;
and determining the preset test time interval according to the setting information.
7. The method of claim 1, further comprising:
and if the current moment is not within the preset test time period and the sample analyzer does not have a test task at present, controlling the sample analyzer to enter an idle state.
8. The method of claim 7, further comprising:
and when the sample analyzer is switched from the idle state to the test state, executing the preparation flow before the sample test.
9. The method of claim 1, further comprising:
and if the sample analyzer does not perform liquid path cleaning within the preset testing time period after the preset cleaning time period, performing liquid path cleaning on the sample analyzer when the sample analyzer is in a testing preparation state or before the sample analyzer enters a testing state.
10. The method of claim 9, further comprising:
if the time that the sample analyzer is in the idle state is less than the preset idle time period, when the sample analyzer is switched from the idle state to the test state, the sample analyzer is not subjected to liquid path cleaning; or
If the time that the sample analyzer is in the idle state is longer than the preset idle time period, when the sample analyzer is switched from the idle state to the test state, performing liquid path cleaning on the sample analyzer according to a first cleaning mode; or
If the time of the sample analyzer in the test preparation state is longer than the preset test preparation time period, performing liquid path cleaning on the sample analyzer according to a second cleaning mode; and the cleaning time of the second cleaning mode is shorter than that of the first cleaning mode.
11. The method of claim 1, wherein the sample analyzer includes two modes of operation: a first mode and a second mode, the method further comprising:
controlling the sample analyzer to enter a working mode corresponding to a mode selection instruction according to the mode selection instruction input by an operator; and the cleaning frequency of the liquid path corresponding to the sample analyzer in the first mode is lower than that of the liquid path corresponding to the sample analyzer in the second mode.
12. A sample analyzer, comprising a memory having computer-executable instructions stored thereon and a processor that, when executed by the computer-executable instructions on the memory, implements:
acquiring the current time and the current state of the sample analyzer;
if the current moment is within a preset test time period and the current state indicates that the sample analyzer is in a state without a test task, controlling the sample analyzer to enter a test preparation state;
after receiving a sample test instruction, the sample analyzer in the test preparation state directly tests a sample applying for testing; after receiving the sample test instruction, the sample analyzer in the idle state firstly executes the preparation flow before the sample test and then tests the sample applying the test.
13. The sample analyzer of claim 12, further comprising a display module for displaying an operating mode display interface, the operating mode display interface providing options for a first mode and a second mode, the controller further controlling the sample analyzer to enter the first mode or the second mode based on the selected operating mode; the cleaning frequency of the fluid path corresponding to the sample analyzer in the first mode is lower than the cleaning frequency of the fluid path corresponding to the sample analyzer in the second mode.
14. The sample analyzer of claim 13 further comprising a sample analysis module for testing a sample and outputting test data to the display module for display.
15. A computer storage medium, characterized in that the computer storage medium has stored therein a program which, when executed by a processor, implements the method of any one of claims 1 to 11.
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